JPH0583880B2 - - Google Patents

Info

Publication number
JPH0583880B2
JPH0583880B2 JP9832886A JP9832886A JPH0583880B2 JP H0583880 B2 JPH0583880 B2 JP H0583880B2 JP 9832886 A JP9832886 A JP 9832886A JP 9832886 A JP9832886 A JP 9832886A JP H0583880 B2 JPH0583880 B2 JP H0583880B2
Authority
JP
Japan
Prior art keywords
sample
rays
anticathode
ray
spectroscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9832886A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62255900A (ja
Inventor
Tadashi Uko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP9832886A priority Critical patent/JPS62255900A/ja
Publication of JPS62255900A publication Critical patent/JPS62255900A/ja
Publication of JPH0583880B2 publication Critical patent/JPH0583880B2/ja
Granted legal-status Critical Current

Links

JP9832886A 1986-04-30 1986-04-30 X線光電子分光装置の試料励起用x線源 Granted JPS62255900A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9832886A JPS62255900A (ja) 1986-04-30 1986-04-30 X線光電子分光装置の試料励起用x線源

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9832886A JPS62255900A (ja) 1986-04-30 1986-04-30 X線光電子分光装置の試料励起用x線源

Publications (2)

Publication Number Publication Date
JPS62255900A JPS62255900A (ja) 1987-11-07
JPH0583880B2 true JPH0583880B2 (enrdf_load_stackoverflow) 1993-11-29

Family

ID=14216837

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9832886A Granted JPS62255900A (ja) 1986-04-30 1986-04-30 X線光電子分光装置の試料励起用x線源

Country Status (1)

Country Link
JP (1) JPS62255900A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2500685Y2 (ja) * 1989-01-27 1996-06-12 株式会社島津製作所 X線照射型分析装置
JPH0750594B2 (ja) * 1989-02-20 1995-05-31 浜松ホトニクス株式会社 X線発生管用ターゲットおよびx線発生管
JPH0589809A (ja) * 1992-03-04 1993-04-09 Rigaku Corp 回転対陰極x線発生装置

Also Published As

Publication number Publication date
JPS62255900A (ja) 1987-11-07

Similar Documents

Publication Publication Date Title
US3753020A (en) Multi-anode x-ray tube
US5892809A (en) Simplified system for local excitation by monochromatic x-rays
Nordgren et al. Soft x‐ray emission spectroscopy using monochromatized synchrotron radiation
CN106605140B (zh) X射线吸收测量系统
US20220291155A1 (en) Hard x-ray photoelectron spectroscopy apparatus
Falkenberg et al. Upgrade of the x‐ray fluorescence beamline at HASYLAB/DESY
JP6501357B2 (ja) 硬x線光電子分光装置
US11002693B2 (en) Hard X-ray photoelectron spectroscopy system
Bjeoumikhov et al. A modular system for XRF and XRD applications consisting of a microfocus X‐ray source and different capillary optics
Wobrauschek et al. Total-reflection X-ray fluorescence analysis using special X-ray sources
JPH0583880B2 (enrdf_load_stackoverflow)
US3920984A (en) X-ray energy analyzer
US12106927B2 (en) X-ray generation apparatus, x-ray imaging apparatus, and adjustment method of x-ray generation apparatus
Janssens et al. Synchrotron radiation-induced X-ray microanalysis
JP3812165B2 (ja) X線管
US3934164A (en) X-ray tube having composite target
Wittry et al. X-ray crystal spectrometers and monochromators in microanalysis
JPS6249929B2 (enrdf_load_stackoverflow)
JP7587346B2 (ja) 硬x線光電子分光システム
Wobrauschek Total reflection X-ray fluorescencespectrometric determination of trace elementsin the femtogram region: a survey
KR102790660B1 (ko) 하드 x-선 광전자 분광 시스템
Martin et al. Imaging x‐ray fluorescence spectroscopy using microchannel plate relay optics
JP2877534B2 (ja) 全反射型蛍光x線分析方法及び分析装置
Suga et al. Performance of a new plane-grating grazing-incidence UHV monochromator
EP0262834A2 (en) X-Ray focusing/electron gun combination