JPH0562959A - Cleaning tank - Google Patents

Cleaning tank

Info

Publication number
JPH0562959A
JPH0562959A JP21945891A JP21945891A JPH0562959A JP H0562959 A JPH0562959 A JP H0562959A JP 21945891 A JP21945891 A JP 21945891A JP 21945891 A JP21945891 A JP 21945891A JP H0562959 A JPH0562959 A JP H0562959A
Authority
JP
Japan
Prior art keywords
cleaning tank
tank
cleaning
ultrapure water
ultra
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21945891A
Other languages
Japanese (ja)
Inventor
Yoshihisa Goto
善久 後藤
Shuichi Morikawa
修一 森川
Yoshio Shizukuishi
芳男 雫石
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui Toatsu Chemicals Inc
Original Assignee
Mitsui Toatsu Chemicals Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Toatsu Chemicals Inc filed Critical Mitsui Toatsu Chemicals Inc
Priority to JP21945891A priority Critical patent/JPH0562959A/en
Publication of JPH0562959A publication Critical patent/JPH0562959A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enhance a cleaning tank in mechanical strength, to make its surface smooth, and to lessen substance dissolved from the tank into ultra-pure water by a method wherein the cleaning tank is formed of aromatic polyether ketone resin. CONSTITUTION:Aromatic polyether ketone resin is formed into sheets through an injection molding method or an extrusion molding method, and the sheet concerned is molded into a cleaning tank through a thermoforming method or the like. No limitation is imposed on the cleaning tank in shape, but the cleaning tank is required to be large enough to house a wafer carrier or more or a liquid crystal glass substrate carrier or more. The cleaning tank is high in surface smoothness, small in substance dissolved into ultra-pure water, and excellent in characteristics as a cleaning tank.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体ウエハ、フォト
マスク用ガラスあるいは液晶用ガラス基板等の薄板状物
品の洗浄に用いられる洗浄槽に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning tank used for cleaning thin plate articles such as semiconductor wafers, glass for photomasks or glass substrates for liquid crystals.

【0002】[0002]

【従来の技術】半導体ウエハ、フォトマスク用ガラス等
の薄板状物品では、その表面上の汚れは、製品の歩留り
や性能に大きな影響を与える。汚れとしては、微粒子、
イオン性物質、有機物等がある。この汚れを除去するた
めに、例えば、半導体ウエハの洗浄は次のように行われ
る。まず、清浄度の向上の目的で保持容器に25枚程度
入れたウエハを、種々薬液を入れた洗浄槽内で洗浄を行
う。つぎに、流水洗浄槽に移し替え超純水によりウエハ
および保持容器に付着している薬液を洗い落とす。さら
に、遠心乾燥機等によりウエハの乾燥を行っている。従
来、前記流水洗浄槽としては、石英ガラス製、フッ素樹
脂製のものが知られてる。しかし、石英ガラス製の洗浄
槽は、破損し易い、製作上の制約が多い等の問題点を有
しており且つ高価である。この為、破損しにくいフッ素
樹脂製のものも多く使用されている。フッ素樹脂として
は、四フッ化エチレン樹脂(以下PTFEという)、四
フッ化エチレン−パーフロロアルルビニルエーテル共重
合樹脂(以下PFAという)が用いられている。PTF
Eは一般の熱成形法では成形できず、熱圧縮法により製
品化され、PFAは一般の熱成形法で成形できるため各
種寸法の洗浄槽が製品化されている。PTFE,PFA
製の洗浄槽は、大型形状の場合には、機械強度が低いた
め肉厚にする必要があり、製品デザインの上で制約とな
っている。またPTFE製、PFA製の洗浄槽では超純
水への溶出物が多いと言う問題もある。さらに、PTF
E製の洗浄槽は表面が粗いため超純水での洗浄時に微粒
子が超純水中に残りやすいと言う問題点もある。
2. Description of the Related Art In thin plate-shaped articles such as semiconductor wafers and glass for photomasks, stains on the surface thereof have a great influence on the yield and performance of the products. As dirt, fine particles,
There are ionic substances and organic substances. In order to remove this dirt, for example, the cleaning of the semiconductor wafer is performed as follows. First, about 25 wafers placed in a holding container for the purpose of improving cleanliness are washed in a washing tank containing various chemicals. Next, it is transferred to a running water cleaning tank and the chemical liquid adhering to the wafer and the holding container is washed off with ultrapure water. Further, the wafer is dried by a centrifugal dryer or the like. Conventionally, as the running water washing tank, those made of quartz glass and fluororesin are known. However, the cleaning tank made of quartz glass is problematic in that it is easily damaged, has many restrictions in production, and is expensive. For this reason, many fluororesin materials that are not easily damaged are also used. As the fluororesin, a tetrafluoroethylene resin (hereinafter referred to as PTFE) or a tetrafluoroethylene-perfluoroarvinyl ether copolymer resin (hereinafter referred to as PFA) is used. PTF
Since E cannot be molded by a general thermoforming method and is commercialized by a thermal compression method, and PFA can be molded by a general thermoforming method, cleaning tanks of various sizes have been commercialized. PTFE, PFA
In the case of a large-sized cleaning tank, the mechanical strength is low, so that the cleaning tank needs to be thick, which is a constraint on the product design. In addition, there is a problem in that a cleaning tank made of PTFE or PFA has a large amount of eluate in ultrapure water. Furthermore, PTF
Since the cleaning tank made of E has a rough surface, there is also a problem that fine particles tend to remain in the ultrapure water during cleaning with ultrapure water.

【0003】[0003]

【発明が解決しようとする課題】本発明の目的は、機械
強度に優れ、表面が平滑で超純水への溶出物が少ない洗
浄槽を提供することである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a cleaning tank which is excellent in mechanical strength, has a smooth surface, and has little eluate in ultrapure water.

【0004】[0004]

【課題を解決するための手段】本発明者等は、前記の目
的を達成するために鋭意検討した結果、芳香族ポリエー
テルケトン樹脂により洗浄槽を成形することにより、本
発明を完成するに到った。すなわち本発明は、芳香族ポ
リエーテルケトン樹脂を成形してなる洗浄槽である。本
発明において使用される芳香族ポリエーテルケトン樹脂
は、代表的な例として式(I)(化1)または(II)
(化2)で表される反復単位を有する熱可塑性結晶樹脂
である。
Means for Solving the Problems As a result of intensive studies for achieving the above-mentioned object, the present inventors have completed the present invention by molding a cleaning tank with an aromatic polyetherketone resin. It was. That is, the present invention is a cleaning tank formed by molding an aromatic polyether ketone resin. The aromatic polyether ketone resin used in the present invention is represented by the formula (I) (formula 1) or (II) as a typical example.
It is a thermoplastic crystalline resin having a repeating unit represented by (Chemical Formula 2).

【0005】[0005]

【化1】 [Chemical 1]

【0006】[0006]

【化2】 例えば式(I)の構を持つものとしてICI社製VIC
TREX(商標)PEEKがあり、また式(II)の構造
を持つものとしてICI社製VICTREX(商標)P
EK等がある。
[Chemical 2] For example, a VIC manufactured by ICI, which has a structure of formula (I)
TREX (trademark) PEEK, and VICTREX (trademark) P manufactured by ICI as having the structure of formula (II).
There are EK etc.

【0007】上記した芳香族ポリエーテルケトン樹脂
は、射出成形法、押出成形により作製されたシートによ
る熱成形法等により洗浄槽に成形される。洗浄槽の形状
は特に限定は無いが、ウエハキャリア、液晶用ガラス基
板キャリアが1個ないし複数個を内部に保持し洗浄し得
る大きさが必要である。
The above-mentioned aromatic polyetherketone resin is molded into a cleaning tank by an injection molding method, a thermoforming method using a sheet produced by extrusion molding, or the like. The shape of the cleaning tank is not particularly limited, but it is necessary to have a size capable of holding and cleaning one or a plurality of wafer carriers and liquid crystal glass substrate carriers inside.

【0008】以下、本発明を実施例によりより詳細に説
明する。なお、表面粗さは、株式会社ミツトヨ製表面粗
さ測定機サーフテスト402(商品名)を用いて測定し
た。さらに、超純水中の全有機体炭素(TOCと略)
は、東レエンジニアリング株式会社製TOC自動分析装
置MODEL T0C−710(商品名)を用いて測定
した。
Hereinafter, the present invention will be described in more detail with reference to examples. The surface roughness was measured using a surface roughness measuring device Surftest 402 (trade name) manufactured by Mitutoyo Corporation. Furthermore, total organic carbon (abbreviated as TOC) in ultrapure water
Was measured using a TOC engineering analyzer TOC automatic analyzer MODEL T0C-710 (trade name).

【0009】[0009]

【実施例】実施例1 ICI社製VICTREX(商標)PEEKを押出成形
により得られたPEEKシートを熱圧空成形により洗浄
槽を成形した。用いたPEEKシートは、厚み550μ
m、幅750mm、長さ600mmであった。熱圧空成
形は、布施真空株式会社製圧空成形機 TYPE PH
SL−1010−PWBにより、上ヒーター温度500
℃、下ヒーター温度500℃、加熱時間70秒の条件で
行った。また得られた洗浄槽の寸法は、縦240mm、
横310mm、深さ280mmであった。このようにし
て得られたPEEK製の洗浄槽の内面の表面粗さを測定
したところRa0.85μm、Rmax4.8μmであ
った。つぎにこの洗浄槽内部を超純水で洗浄した後、超
純水を満たし80℃で保持した。24時間後に超純水を
取り出し溶出TOC量を測定したところ55ppbであ
った。
Example 1 A PEEK sheet obtained by extrusion molding VICTREX (trademark) PEEK manufactured by ICI was molded into a cleaning tank by hot-press molding. The PEEK sheet used has a thickness of 550μ.
m, width 750 mm, and length 600 mm. Hot air pressure molding is TYPE PH, a pressure air molding machine manufactured by Fuse Vacuum Co., Ltd.
SL-1010-PWB, upper heater temperature 500
C., lower heater temperature 500.degree. C., heating time 70 seconds. The size of the obtained cleaning tank is 240 mm in length,
The width was 310 mm and the depth was 280 mm. When the surface roughness of the inner surface of the PEEK cleaning tank thus obtained was measured, it was Ra 0.85 μm and Rmax 4.8 μm. Next, after the inside of this cleaning tank was washed with ultrapure water, it was filled with ultrapure water and kept at 80 ° C. After 24 hours, ultrapure water was taken out and the amount of TOC eluted was measured and found to be 55 ppb.

【0010】比較例 縦160mm、横320mm、深さ270mmの市販の
PTFE製タンクを入手し、実施例1と同様に、タンク
の表面粗さおよびタンク内に保持した超純水のTOCを
測定した。表面粗さは、Ra3.7μm、Rmax27
μmであり、超純水中のTOCは180ppbであっ
た。
Comparative Example A commercially available PTFE tank having a length of 160 mm, a width of 320 mm, and a depth of 270 mm was obtained, and the surface roughness of the tank and the TOC of the ultrapure water held in the tank were measured in the same manner as in Example 1. .. Surface roughness is Ra 3.7 μm, Rmax 27
μm, and TOC in ultrapure water was 180 ppb.

【0011】[0011]

【発明の効果】本発明の芳香族ポリエーテルケトン樹脂
を成形してなる洗浄槽は、表面の平滑性に優れさらに純
水への溶出も少なく、洗浄槽として優れた特性を有して
いる。
The cleaning tank formed by molding the aromatic polyetherketone resin of the present invention has excellent surface smoothness and less elution into pure water, and has excellent characteristics as a cleaning tank.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体ウエハ、フォトマスク用ガラス等
の薄板状物品を洗浄する超純水洗浄槽において、芳香族
ポリエーテルケトン樹脂を成形してなることを特徴とす
る洗浄槽。
1. An ultrapure water cleaning tank for cleaning thin-plate articles such as semiconductor wafers and glass for photomasks, wherein the cleaning tank is formed by molding an aromatic polyetherketone resin.
JP21945891A 1991-08-30 1991-08-30 Cleaning tank Pending JPH0562959A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21945891A JPH0562959A (en) 1991-08-30 1991-08-30 Cleaning tank

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21945891A JPH0562959A (en) 1991-08-30 1991-08-30 Cleaning tank

Publications (1)

Publication Number Publication Date
JPH0562959A true JPH0562959A (en) 1993-03-12

Family

ID=16735747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21945891A Pending JPH0562959A (en) 1991-08-30 1991-08-30 Cleaning tank

Country Status (1)

Country Link
JP (1) JPH0562959A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692902A1 (en) * 1992-06-25 1993-12-31 Asahi Chemical Ind Composition based on polyamide resin and molded articles of this composition.
US6647998B2 (en) * 2001-06-20 2003-11-18 Taiwan Semiconductor Manufacturing Co. Ltd. Electrostatic charge-free solvent-type dryer for semiconductor wafers

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0463186A (en) * 1990-06-29 1992-02-28 Sekisui Chem Co Ltd Piping system for transporting ultrapure water

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0463186A (en) * 1990-06-29 1992-02-28 Sekisui Chem Co Ltd Piping system for transporting ultrapure water

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692902A1 (en) * 1992-06-25 1993-12-31 Asahi Chemical Ind Composition based on polyamide resin and molded articles of this composition.
US6647998B2 (en) * 2001-06-20 2003-11-18 Taiwan Semiconductor Manufacturing Co. Ltd. Electrostatic charge-free solvent-type dryer for semiconductor wafers

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