JPH0562955A - Semiconductor cleaning device and semiconductor wafer holding device - Google Patents

Semiconductor cleaning device and semiconductor wafer holding device

Info

Publication number
JPH0562955A
JPH0562955A JP22070791A JP22070791A JPH0562955A JP H0562955 A JPH0562955 A JP H0562955A JP 22070791 A JP22070791 A JP 22070791A JP 22070791 A JP22070791 A JP 22070791A JP H0562955 A JPH0562955 A JP H0562955A
Authority
JP
Japan
Prior art keywords
semiconductor wafer
semiconductor
processing
cleaning
holding device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22070791A
Other languages
Japanese (ja)
Inventor
Shoji Kanamaru
正二 金丸
Takeshi Aiba
武 相場
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP22070791A priority Critical patent/JPH0562955A/en
Publication of JPH0562955A publication Critical patent/JPH0562955A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To enable a cleaning processing device to be lessened in size, to save cleaning liquid, and to be clean. CONSTITUTION:Processing tanks 22, a wafer holding device 23 which directly holds a semiconductor wafer 1, and a transfer robot 26 which transfers the wafer holding device 23 to the processing tank 22 are provided, and the semiconductor wafers 1 are successively cleaned in the processing tanks 22 while held by the wafer holding devices 23.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置の製造工程
において、半導体ウエハを洗浄処理するための半導体洗
浄装置及び之に用いる半導体ウエハの保持装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor cleaning apparatus for cleaning a semiconductor wafer in a semiconductor device manufacturing process, and a semiconductor wafer holding apparatus used for the same.

【0002】[0002]

【従来の技術】半導体装置の製造においては、半導体ウ
エハを各種処理プロセスに沿って洗浄を行う洗浄処理
(所謂ウエット処理)工程がある。従来の洗浄処理装置
には2通りの方式が知られている。
2. Description of the Related Art In the manufacture of a semiconductor device, there is a cleaning process (so-called wet process) for cleaning a semiconductor wafer according to various processing processes. Two types of conventional cleaning processing apparatuses are known.

【0003】第1の方式は、カセットに収納された半導
体ウエハをカセットと一緒に処理槽に挿入し、洗浄を行
うというものである。即ち、図6及び図7に示すよう
に、複数枚の半導体ウエハ1が収納されたカセット2を
搬送機3の1対のアーム4に一体に設けられた開閉可能
な対のU字状チャック部材5により吊り下げるように保
持し、搬送機3でカセット2を移動させて各種処理プロ
セスに沿って順次カセット2と一緒に半導体ウエハ1を
各処理槽6に挿入して洗浄処理するようになされる。
The first method is to insert a semiconductor wafer housed in a cassette into a processing tank together with the cassette for cleaning. That is, as shown in FIGS. 6 and 7, a cassette 2 accommodating a plurality of semiconductor wafers 1 is integrally provided on a pair of arms 4 of a carrier 3 and a pair of openable and closable U-shaped chuck members. 5, the cassette 2 is held so as to be suspended, and the cassette 2 is moved by the carrier 3 to sequentially insert the semiconductor wafer 1 into each processing bath 6 together with the cassette 2 along with various processing processes for cleaning processing. ..

【0004】第2の方式は所謂カセットレス洗浄方式と
呼ばれるものであり、図8に示すように処理槽6内に予
め半導体ウエハ1を載置固定する固定台8を配してお
き、半導体ウエハ1を搬送機のチャック部材10にて保
持した状態で処理槽6内の固定台8に移し替えて洗浄す
るようになされる。半導体ウエハ1の洗浄中、チャック
部材10は槽外にて待機される。なお、固定台8には半
導体ウエハ1を1枚毎に固定するための固定溝9が設け
られる。
The second method is a so-called cassetteless cleaning method. As shown in FIG. 8, a fixing table 8 for mounting and fixing the semiconductor wafer 1 is arranged in advance in the processing tank 6, and the semiconductor wafer is fixed. 1 is held by the chuck member 10 of the carrier and is transferred to the fixed table 8 in the processing tank 6 for cleaning. During cleaning of the semiconductor wafer 1, the chuck member 10 stands by outside the bath. The fixing table 8 is provided with a fixing groove 9 for fixing the semiconductor wafers 1 one by one.

【0005】図9の例は、同様にカセットレス洗浄方式
であり、固定台8を昇降アクチェータ11で上下動可能
となし、チャック部材10からの半導体ウエハ1を槽外
で移し替えてから半導体ウエハ1と共に固定台8を処理
槽6内に挿入して半導体ウエハ1の洗浄を行うようにな
される。
The example of FIG. 9 is also a cassetteless cleaning system, in which the fixed base 8 can be moved up and down by an elevating actuator 11, the semiconductor wafer 1 from the chuck member 10 is transferred outside the bath, and then the semiconductor wafer is moved. The fixing table 8 is inserted into the processing bath 6 together with the cleaning unit 1 to clean the semiconductor wafer 1.

【0006】[0006]

【発明が解決しようとする課題】上述の第1の方式の洗
浄処理装置においては、本来洗浄しなくてはならない半
導体ウエハ1以外に搬送用としている大きなカセット2
も処理槽6内に入る為に、微細なごみの持ち込みが多く
なり、洗浄効果が低くなる。又、大きなカセット2が入
る為に処理槽6も大きくなり、薬液、純水等の処理液が
多くなり無駄が大きいという問題があった。
In the above-mentioned cleaning system of the first type, a large cassette 2 for carrying other than the semiconductor wafer 1 which originally has to be cleaned.
Since it also enters the processing tank 6, a large amount of fine dust is brought in and the cleaning effect is reduced. Further, since the large cassette 2 is inserted, the processing tank 6 becomes large, and the amount of processing liquid such as chemical liquid and pure water increases, resulting in a large waste.

【0007】第2の方式の洗浄処理装置においては、第
1の方式での欠点が解消されるも、しかし、各処理槽6
間で半導体ウエハ1の移し替え(着脱)が行われるため
にチャッキングミスが多発する懼れがある。また処理槽
6内に半導体ウエハ1の固定台8を配置するので、第1
の方式に比べれば容積が小さくなるも処理槽6を大きく
する要因がある。
In the cleaning system of the second system, the drawbacks of the first system are solved, but each processing tank 6
Since the semiconductor wafers 1 are transferred (attached / detached) in between, chucking errors may occur frequently. Further, since the fixing base 8 for the semiconductor wafer 1 is arranged in the processing tank 6, the first
Although the volume is smaller than that of the above method, there is a factor of increasing the size of the processing tank 6.

【0008】本発明は、上述の点に鑑み、処理槽内への
ごみの持ち込みを少なくすると共に、処理槽の容積を縮
小可能にし、さらにチャッキングミスを生じさせないで
洗浄処理できるようにした半導体洗浄装置及びこれに用
いる半導体ウエハの保持装置を提供するものである。
In view of the above points, the present invention reduces the amount of dust brought into the processing tank, enables the volume of the processing tank to be reduced, and enables cleaning processing without causing a chucking error. A cleaning device and a semiconductor wafer holding device used for the cleaning device are provided.

【0009】[0009]

【課題を解決するための手段】本発明に係る半導体処理
装置21は、配列された複数の処理槽22と、半導体ウ
エハ1を直接保持する保持手段23と、保持手段23を
各処理槽22に搬送する搬送手段26を有し、半導体ウ
エハ1を保持手段23に保持した状態で順次に処理槽2
2にて洗浄処理するように構成する。
A semiconductor processing apparatus 21 according to the present invention has a plurality of processing tanks 22 arranged therein, a holding means 23 for directly holding the semiconductor wafer 1, and a holding means 23 in each processing tank 22. The semiconductor wafer 1 is carried by the carrying means 26 and the semiconductor wafer 1 is held by the holding means 23 in sequence.
In step 2, the cleaning process is performed.

【0010】又、本発明に係る半導体のウエハ保持装置
23は、1対のアーム33に、半導体ウエハ1の下方両
側縁に当接する対の水平部材35を垂下して設け、この
対の水平部材35をアーム33を介して開閉可能とな
し、閉状態で水平部材35により半導体ウエハ1を保持
するように構成する。
In the semiconductor wafer holding apparatus 23 according to the present invention, a pair of arms 33 is provided with a pair of horizontal members 35 that abut against the lower side edges of the semiconductor wafer 1. 35 is configured to be openable and closable via the arm 33, and the horizontal member 35 holds the semiconductor wafer 1 in the closed state.

【0011】[0011]

【作用】本発明に係る半導体処理装置21においては、
所謂カセットレス方式であり、半導体ウエハ1を直接、
保持手段23にて保持した状態のまま順次に処理槽22
に搬送し洗浄するので、処理槽22内へのごみの持ち込
みが少なく、また、処理槽22の容積が小さくなり、処
理液の消費量を少なくすることができる。さらに、処理
槽22毎に半導体ウエハ1を移し替える必要がないので
半導体ウエハ1に対するチャッキングミスもなく安定且
つ確実な洗浄ができる。
In the semiconductor processing apparatus 21 according to the present invention,
This is a so-called cassetteless system, in which the semiconductor wafer 1 is directly
The processing tank 22 is sequentially held in the state of being held by the holding means 23.
Since it is transferred to and cleaned, the amount of dust brought into the processing tank 22 is small, the volume of the processing tank 22 is small, and the consumption of the processing liquid can be reduced. Further, since it is not necessary to transfer the semiconductor wafer 1 to each processing bath 22, stable and reliable cleaning can be performed without chucking mistakes on the semiconductor wafer 1.

【0012】また、本発明に係る半導体ウエハ保持装置
23においては、半導体ウエハ1の下方両側縁に対の水
平部材35を当接して吊り下げるようにして保持すると
いう簡単な構造であり、従って、半導体ウエハ1を保持
するに必要最小限の大きさで構成できる。これにより処
理槽22の容積が小さくなり、処理液の消費を少なくす
ることができる。
Further, the semiconductor wafer holding device 23 according to the present invention has a simple structure in which a pair of horizontal members 35 are brought into contact with the lower side edges of the semiconductor wafer 1 so as to be hung and held. It can be configured to have a minimum size necessary to hold the semiconductor wafer 1. As a result, the volume of the processing tank 22 is reduced, and the consumption of the processing liquid can be reduced.

【0013】[0013]

【実施例】以下、図1〜図5を参照して本発明の実施例
を説明する。
Embodiments of the present invention will be described below with reference to FIGS.

【0014】図1は本発明に係る半導体処理装置の一例
を示す。同図において、21は半導体処理装置の全体を
示し、22は処理プロセスに応じて複数配列された処理
槽、23は複数の半導体ウエハ1を一括して保持した状
態で洗浄処理を可能にした半導体ウエハ保持装置、24
は各処理槽22に対応した位置に配設した半導体ウエハ
保持装置23の支持台、26は半導体ウエハ保持装置2
3を処理プロセスに沿って順次搬送するための搬送機
(即ち搬送用ロボット)を示す。
FIG. 1 shows an example of a semiconductor processing apparatus according to the present invention. In the figure, reference numeral 21 denotes the entire semiconductor processing apparatus, 22 a plurality of processing tanks arranged according to the processing process, and 23, a semiconductor capable of carrying out cleaning processing while holding a plurality of semiconductor wafers 1 collectively. Wafer holding device, 24
Is a support base of the semiconductor wafer holding device 23 arranged at a position corresponding to each processing tank 22, and 26 is the semiconductor wafer holding device 2
3 shows a transfer machine (that is, a transfer robot) for sequentially transferring 3 along the processing process.

【0015】半導体ウエハ1に対する洗浄処理には、有
機物の洗浄(例えば処理液:NH4 OH+H2 2 +H
2 O)、金属汚染の洗浄(例えば処理液:HCl+H2
2 )、ライトエッチングによる自然酸化膜の除去(例
えば処理液:バッファード沸酸)及びそれら間でのリン
ス処理し(薬液水洗)等がある。処理槽22は、之等の
洗浄が可能なように所要の処理プロセスに応じて適宜選
択して複数配設される。
For cleaning the semiconductor wafer 1, cleaning of organic substances (for example, processing liquid: NH 4 OH + H 2 O 2 + H) is performed.
2 O), cleaning of metal contamination (eg processing liquid: HCl + H 2
O 2 ), removal of the natural oxide film by light etching (for example, treatment liquid: buffered hydrofluoric acid), and rinsing treatment between them (washing with chemical liquid). A plurality of treatment tanks 22 are appropriately selected and arranged according to a required treatment process so that they can be washed.

【0016】搬送用ロボット26は、図1及び図2に示
すように、半導体ウエハ保持装置23の基部27を両側
より挟持的に保持するチャック28と、このチャック2
8を上下方向に移動させる上下移動機構29と、さらに
ロボット自体を各支持台24の背後に設けたレール30
に沿って処理槽22の配列方向に移動させる左右移動機
構31を備えて構成されている。
As shown in FIGS. 1 and 2, the transfer robot 26 has a chuck 28 that holds the base portion 27 of the semiconductor wafer holding device 23 from both sides, and a chuck 28.
A vertical movement mechanism 29 for moving 8 up and down, and a rail 30 provided with the robot itself behind each support 24.
A left-right moving mechanism 31 for moving in the arrangement direction of the processing tanks 22 is configured.

【0017】一方、ウエハ保持装置23は、図2及び図
3に示すように支持台24上に搬送されて係合支持され
る形状の基部27と、基部27と一体に之より水平方向
に延長する1対のアーム33〔33A,33B〕と、ア
ーム33A及び33Bに一体る取付けられ、アームの軸
心を中心とする回転によって開閉される所謂チャックを
構成する例えばテフロン系、石英系の保持用フレーム3
4〔34A,34B〕を有して成る。
On the other hand, as shown in FIGS. 2 and 3, the wafer holding device 23 has a base portion 27 which is conveyed and engaged and supported on a support base 24, and the base portion 27 integrally extends horizontally. For holding a pair of arms 33 [33A, 33B] and a so-called chuck that is integrally attached to the arms 33A and 33B and is opened and closed by rotation about the axis of the arm. Frame 3
4 [34A, 34B].

【0018】保持用フレーム34は夫々水平部材35と
その両端より垂直方向に延びる垂直部材36からなる略
U字状に形成され、閉状態で水平部材35が複数配列さ
れた半導体ウエハの全長に差し渡るように且つ半導体ウ
エハ1を2分する中心線37より下方の両側縁に当接し
て半導体ウエハ1を吊り下げるようにして保持するよう
に形成される。従って、保持用フレーム34は半導体ウ
エハ1を保持した状態で垂直部材36がウエハ面内に存
するようになる。尚、一方の保持用フレーム34Bには
半導体ウエハ1の側縁に当接する補助水平部材35aを
設けるを可とする。図示の例ではウエハ1の上方側縁に
接するように設けているが、洗浄後、処理液のしずくが
たれるのを回避するために下方側縁に接するように設け
るを可とする。
The holding frame 34 is formed in a substantially U-shape including a horizontal member 35 and vertical members 36 extending vertically from both ends of the holding member 34. The holding frame 34 is inserted into the entire length of a semiconductor wafer in which a plurality of horizontal members 35 are arranged in a closed state. The semiconductor wafer 1 is formed so as to cross and contact both side edges below the center line 37 that bisects the semiconductor wafer 1 and hold the semiconductor wafer 1 in a suspended manner. Therefore, the holding frame 34 allows the vertical member 36 to exist within the wafer surface while holding the semiconductor wafer 1. It should be noted that one of the holding frames 34B may be provided with an auxiliary horizontal member 35a that comes into contact with the side edge of the semiconductor wafer 1. In the illustrated example, the wafer 1 is provided so as to be in contact with the upper side edge thereof, but it may be provided so as to be in contact with the lower side edge thereof in order to avoid dripping of the processing liquid after cleaning.

【0019】図4は半導体ウエハ保持装置22の他の例
を示す。この例では半導体ウエハ1の側縁の所定位置即
ちウエハを2分する中心線上の位置と、中心線より下方
の位置に当接する2本の水平部材38〔38a及び38
b〕が差し渡され、この2本の水平部材38が両端垂直
部材39で連結されてなる保持用フレーム40〔40
A,40B〕を夫々回転可能な前述の1対のアーム33
A,33Bに取付けて構成される。このウエハ保持装置
22では、両保持用フレーム40A及び40Bを閉じた
ときに夫々の水平部材38a及び38bが半導体ウエハ
1の中央及び下方の両側縁に当接することにより、半導
体ウエハ1を吊り下げた状態で保持することができる。
FIG. 4 shows another example of the semiconductor wafer holding device 22. In this example, two horizontal members 38 [38a and 38a which contact the predetermined position of the side edge of the semiconductor wafer 1, that is, the position on the center line that bisects the wafer and the position below the center line.
b] is passed over, and the holding frame 40 [40 is formed by connecting the two horizontal members 38 with vertical members 39 at both ends.
A, 40B] and the pair of arms 33 described above that are rotatable respectively.
It is configured by being attached to A and 33B. In the wafer holding device 22, when the holding frames 40A and 40B are closed, the horizontal members 38a and 38b contact the central and lower side edges of the semiconductor wafer 1 to suspend the semiconductor wafer 1. Can be held in a state.

【0020】図3及び図4の半導体ウエハ保持装置で
は、カセット内の半導体ウエハ1を例えばウエハ移載機
を介してカセット外の上方に持ち上げた後、開状態の保
持用フレーム34又は40を半導体ウエハ1に持来して
閉じることにより半導体ウエハ1の保持を行うことがで
きる。
In the semiconductor wafer holding apparatus shown in FIGS. 3 and 4, the semiconductor wafer 1 in the cassette is lifted above the outside of the cassette via, for example, a wafer transfer machine, and then the holding frame 34 or 40 in the open state is placed in the semiconductor. The semiconductor wafer 1 can be held by bringing it into the wafer 1 and closing it.

【0021】図5は半導体ウエハ保持装置22の更に他
の例を示す。この例では半導体ウエハの面内に存するよ
うに形成した1対の略U字型のフレーム42〔42A,
42B〕を半導体ウエハの配列方向に相対向させ、その
フレーム42A及び42B間に半導体ウエハの下方両側
縁の当接する水平部材43〔43a,43b〕を差し渡
して形成した保持用フレーム44を有して成る。この場
合、U字型フレーム42A及び42Bの上方の間隔d1
は半導体ウエハ1が保持される下方の間隔d2 より幅広
に形成され、半導体ウエハ1は例えば垂直多関節ロボッ
トにより上方より枚葉的に移載するようになされる。
FIG. 5 shows still another example of the semiconductor wafer holding device 22. In this example, a pair of substantially U-shaped frames 42 [42A, 42A,
42B] are opposed to each other in the arrangement direction of the semiconductor wafers, and a holding frame 44 formed by interposing horizontal members 43 [43a, 43b] abutting the lower side edges of the semiconductor wafer between the frames 42A and 42B. Become. In this case, the spacing d 1 above the U-shaped frames 42A and 42B
Is formed wider than the lower space d 2 at which the semiconductor wafer 1 is held, and the semiconductor wafer 1 is transferred from above by a single wafer by a vertical articulated robot, for example.

【0022】尚、図3、図4及び図5において、半導体
ウエハ1の側縁に当する部分には各ウエハ1の側縁が係
合する固定溝を形成することもできる。
In addition, in FIGS. 3, 4, and 5, a fixing groove with which the side edge of each wafer 1 engages can be formed in a portion corresponding to the side edge of the semiconductor wafer 1.

【0023】次に、上述の洗浄処理装置21の動作を図
1〜図3を用いて説明する。ローダ側に複数枚例えば2
5枚の半導体ウエハ1を収納したカセット50が搬送さ
れると、図示せざるもウエハ移載機によりカセット50
内の半導体ウエハ1のみが上方に持ち上げられる。
Next, the operation of the cleaning processing device 21 will be described with reference to FIGS. Plural sheets on the loader side, eg 2
When the cassette 50 accommodating the five semiconductor wafers 1 is transported, the cassette 50 is transferred by a wafer transfer machine (not shown).
Only the semiconductor wafer 1 inside is lifted up.

【0024】一方、搬送用ロボット26がチャック28
をして所要の半導体ウエハ保持装置22を保持して、ロ
ーダ側に移動し、ウエハ保持装置23の1対の保持フレ
ーム34A及び34Bにて25枚の半導体ウエハを一括
保持する。
On the other hand, the transfer robot 26 uses the chuck 28.
Then, the required semiconductor wafer holding device 22 is held and moved to the loader side, and the pair of holding frames 34A and 34B of the wafer holding device 23 collectively holds 25 semiconductor wafers.

【0025】次に、搬送用ロボット26を移動して第1
の処理槽22に半導体ウエハ1を保持したまま挿入し、
所要の洗浄処理を行う。洗浄処理中は、半導体ウエハ保
持装置23の基部27を対応する支持台24上に載置さ
せておく。搬送用ロボット26は半導体ウエハ保持装置
23から離れて所定位置に待機するか、或は他の半導体
ウエハ1を保持しているウエハ保持装置23を次の洗浄
を行う処理槽22に搬送するようになされる。
Next, the transfer robot 26 is moved to the first position.
The semiconductor wafer 1 is inserted into the processing bath 22 of
Perform the required cleaning process. During the cleaning process, the base 27 of the semiconductor wafer holding device 23 is placed on the corresponding support base 24. The transfer robot 26 separates from the semiconductor wafer holding device 23 and stands by at a predetermined position, or transfers the wafer holding device 23 holding another semiconductor wafer 1 to the processing tank 22 for the next cleaning. Done.

【0026】第1の処理槽22での洗浄処理が終了する
と、再び搬送用ロボット26によって半導体ウエハ1を
保持した状態のウエハ保持装置23を第2の処理槽22
に送り、ウエハ保持装置23に保持された状態のまま処
理槽22内で第2の洗浄処理が行われる。
When the cleaning processing in the first processing tank 22 is completed, the wafer holding device 23 in which the semiconductor wafer 1 is held by the transfer robot 26 is again placed in the second processing tank 22.
The second cleaning process is performed in the processing tank 22 while being held by the wafer holding device 23.

【0027】この様にして、順次、ウエハ保持装置23
を共に半導体ウエハ1が各処理槽22に送られ所要の洗
浄が施される。そして最終の洗浄処理が終了したのち、
半導体ウエハ1はアンローダ側のカセットに収納され
る。
In this way, the wafer holding device 23 is sequentially operated.
At the same time, the semiconductor wafer 1 is sent to each processing tank 22 and subjected to required cleaning. And after the final cleaning process,
The semiconductor wafer 1 is stored in a cassette on the unloader side.

【0028】上述の実施例によれば、カセット50から
の半導体ウエハ1をウエハ保持装置23にて直接保持
し、その保持した状態のまま、順次に各処理槽22に搬
送して所要の洗浄を行うので、従来のカセットと一緒に
処理槽に挿入して洗浄する方式に比して、処理槽22内
への微細なごみの持ち込みを少なくすることができる。
According to the above-described embodiment, the semiconductor wafer 1 from the cassette 50 is directly held by the wafer holding device 23, and in the holding state, the semiconductor wafers 1 are sequentially transferred to the processing baths 22 to perform the required cleaning. Since this is performed, it is possible to reduce the amount of fine dust brought into the processing tank 22 as compared with the conventional method of inserting the cassette into the processing tank and cleaning it.

【0029】また、ウエハ保持装置23としては、例え
ば図3で示すように保持用フレーム34の水平部材35
及び垂直部材36が半導体ウエハ1の面内に在って半導
体ウエハ1から大きくはみ出ない単純構造、即ち半導体
ウエハ1を保持するに必要最小限の大きさに形成するの
で、処理槽22の容積を小さくすることができる。従っ
て従来に比して処理液の消費量を少なくすることができ
る。図4及び図5のウエハ保持装置22の場合にも、同
様に処理槽22の容積を小さくでき、処理液の消費量を
少なくすることができる。
Further, as the wafer holding device 23, for example, as shown in FIG. 3, the horizontal member 35 of the holding frame 34 is used.
Since the vertical member 36 is formed in the plane of the semiconductor wafer 1 and does not largely protrude from the semiconductor wafer 1, that is, the vertical member 36 is formed to have a minimum size necessary to hold the semiconductor wafer 1, the volume of the processing tank 22 is reduced. Can be made smaller. Therefore, the consumption of the processing liquid can be reduced as compared with the conventional case. Similarly, in the case of the wafer holding device 22 of FIGS. 4 and 5, the volume of the processing bath 22 can be made small and the consumption of the processing liquid can be made small.

【0030】因みに、図6のカセット2と一緒に挿入す
る処理槽6の場合には、縦a1 ×横b1 ×深さc1 =3
10mm×225mm×280mmであるのに対し、図
3の実施例の処理槽22の場合には、縦a2 ×横b2 ×
深さc2 =230mm×235mm×255mmであ
り、処理槽22の容積が小さくなる。
Incidentally, in the case of the processing tank 6 to be inserted together with the cassette 2 of FIG. 6, the length a 1 × the width b 1 × the depth c 1 = 3
While the size is 10 mm × 225 mm × 280 mm, in the case of the processing tank 22 of the embodiment of FIG. 3, vertical a 2 × horizontal b 2 ×
The depth c 2 = 230 mm × 235 mm × 255 mm, and the volume of the processing tank 22 becomes small.

【0031】そして、処理槽22が小さくなるため、全
体の半導体処理装置を小さくすることができ、クリーン
ルームでの占有面積を小さくすることができる。また、
カセットレス方式のため、カセットの寸法ばらつきに影
響されることがないので、処理時のトラブルが少なく、
スループットを向上することができる。
Since the processing tank 22 is small, the entire semiconductor processing apparatus can be downsized, and the occupied area in the clean room can be downsized. Also,
Since it is a cassetteless system, it is not affected by dimensional variations of cassettes, so there are few problems during processing,
Throughput can be improved.

【0032】さらに、本実施例は、一種のカセットレス
方式であるが従来の図8、図9のような各処理槽ごとに
半導体ウエハを移し替える必要がないので、半導体ウエ
ハ1に対するチャッキングミスがなく安定且つ確実に順
次の洗浄処理が可能となる。
Further, although the present embodiment is a kind of cassetteless system, it is not necessary to transfer the semiconductor wafer to each processing tank as shown in FIG. 8 and FIG. Stable and reliable sequential cleaning processes can be performed without any problems.

【0033】[0033]

【発明の効果】本発明によれば、処理槽内へのごみの持
ち込みを少なくし、且つ処理槽の容積を小さくして処理
液の消費量を少なくすることができる。また、処理槽ご
とに半導体ウエハを移し替える必要がないので半導体ウ
エハに対するチャックキングミスがなく、安定、確実な
洗浄処理を行うことができる。
According to the present invention, it is possible to reduce the amount of dust brought into the processing tank and reduce the volume of the processing tank to reduce the consumption of the processing liquid. Further, since it is not necessary to transfer the semiconductor wafers to each processing bath, there is no chucking mistake for the semiconductor wafers, and stable and reliable cleaning processing can be performed.

【0034】さらに、半導体処理装置の全体の小型化が
可能となり、省処理液化、更なるクリーン化等を図るこ
とができる。
Further, the semiconductor processing apparatus can be downsized as a whole, and the processing liquid can be saved and the cleaning can be further improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る半導体処理装置の一例を示す構成
図である。
FIG. 1 is a configuration diagram showing an example of a semiconductor processing apparatus according to the present invention.

【図2】図1の要部の斜視図である。FIG. 2 is a perspective view of a main part of FIG.

【図3】本発明に係る半導体ウエハ保持装置の一例を示
す要部の斜視図である。
FIG. 3 is a perspective view of a main part showing an example of a semiconductor wafer holding device according to the present invention.

【図4】本発明に係る半導体ウエハ保持装置の他の例を
示す要部の側面図である。
FIG. 4 is a side view of a main part showing another example of the semiconductor wafer holding device according to the present invention.

【図5】本発明に係る半導体ウエハ保持装置の更に他の
例を示す要部の斜視図である。
FIG. 5 is a perspective view of a main part showing still another example of the semiconductor wafer holding device according to the present invention.

【図6】従来の洗浄処理装置の例を示す要部の斜視図で
ある。
FIG. 6 is a perspective view of a main part showing an example of a conventional cleaning processing apparatus.

【図7】従来の洗浄処理装置の他の例をめしす要部の構
成図である。
FIG. 7 is a configuration diagram of a main part showing another example of a conventional cleaning processing apparatus.

【図8】従来の洗浄処理装置のさらに他の例を示す要部
の構成図である。
FIG. 8 is a configuration diagram of a main part showing still another example of a conventional cleaning processing apparatus.

【図9】従来の洗浄処理装置のさらに他の例を示す要部
の構成図である。
FIG. 9 is a configuration diagram of a main part showing still another example of a conventional cleaning processing apparatus.

【符号の説明】[Explanation of symbols]

1 半導体ウエハ 50,2 カセット 5 チャック部材 6,22 処理槽 21 半導体処理装置 23 半導体ウエハ保持装置 24 支持台 26 搬送機(搬送用ロボット) 27 基部 33A,33B アーム 34A,34B 保持用フレーム 35 水平部材 36 垂直部材 DESCRIPTION OF SYMBOLS 1 semiconductor wafer 50, 2 cassette 5 chuck member 6,22 processing tank 21 semiconductor processing device 23 semiconductor wafer holding device 24 support stand 26 transfer machine (transfer robot) 27 base 33A, 33B arm 34A, 34B holding frame 35 horizontal member 36 Vertical member

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 配列された複数の処理槽と、半導体ウエ
ハを直接保持する保持手段と、該保持手段を上述各処理
槽に搬送する搬送手段を有し、上記半導体ウエハを上記
保持手段に保持した状態で順次に上記処理槽にて洗浄処
理することを特徴とする半導体洗浄装置。
1. A plurality of processing tanks arranged, a holding means for directly holding a semiconductor wafer, and a carrying means for carrying the holding means to each of the processing tanks, the semiconductor wafer being held by the holding means. A semiconductor cleaning apparatus, wherein cleaning treatment is sequentially performed in the above-mentioned treatment tank in the above state.
【請求項2】 1対のアームに、半導体ウエハの下方両
側縁に当接する対の水平部材が垂下して設けられ、該対
の水平部材は上記アームを介して開閉可能とされ、閉状
態で上記水平部材により上記半導体ウエハを保持するよ
うにして成る半導体ウエハの保持装置。
2. A pair of arms are provided with a pair of horizontal members that abut against lower side edges of the semiconductor wafer, the pair of horizontal members being openable and closable via the arms, and in a closed state. A semiconductor wafer holding device configured to hold the semiconductor wafer by the horizontal member.
JP22070791A 1991-08-30 1991-08-30 Semiconductor cleaning device and semiconductor wafer holding device Pending JPH0562955A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22070791A JPH0562955A (en) 1991-08-30 1991-08-30 Semiconductor cleaning device and semiconductor wafer holding device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22070791A JPH0562955A (en) 1991-08-30 1991-08-30 Semiconductor cleaning device and semiconductor wafer holding device

Publications (1)

Publication Number Publication Date
JPH0562955A true JPH0562955A (en) 1993-03-12

Family

ID=16755244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22070791A Pending JPH0562955A (en) 1991-08-30 1991-08-30 Semiconductor cleaning device and semiconductor wafer holding device

Country Status (1)

Country Link
JP (1) JPH0562955A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5445171A (en) * 1992-09-25 1995-08-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor cleaning apparatus and wafer cassette
US6435199B1 (en) * 1999-04-20 2002-08-20 Tokyo Electron Limited Treatment apparatus
US6871655B2 (en) * 1994-04-28 2005-03-29 Semitool, Inc. Automated semiconductor processing systems
US6960257B2 (en) 1994-04-28 2005-11-01 Semitool, Inc. Semiconductor processing system with wafer container docking and loading station

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5445171A (en) * 1992-09-25 1995-08-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor cleaning apparatus and wafer cassette
US5551459A (en) * 1992-09-25 1996-09-03 Mitsubishi Denki Kabushiki Kaisha Semiconductor cleaning apparatus and wafer cassette
US5568821A (en) * 1992-09-25 1996-10-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor cleaning apparatus and wafer cassette
US5590672A (en) * 1992-09-25 1997-01-07 Mitsubishi Denki Kabushiki Kaisha Semiconductor cleaning apparatus and wafer cassette
US6871655B2 (en) * 1994-04-28 2005-03-29 Semitool, Inc. Automated semiconductor processing systems
US6960257B2 (en) 1994-04-28 2005-11-01 Semitool, Inc. Semiconductor processing system with wafer container docking and loading station
US7080652B2 (en) 1994-04-28 2006-07-25 Semitool, Inc. Automated semiconductor processing systems
US6435199B1 (en) * 1999-04-20 2002-08-20 Tokyo Electron Limited Treatment apparatus

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