JPH0559584B2 - - Google Patents

Description

[Detailed Description of the Invention] Industrial Application Field The present invention relates to a semiconductor integrated device.
It is abbreviated as ) The present invention relates to a wiring structure of a semiconductor integrated device in which a plurality of logic circuits constituted by highly integrated elements such as circuits are arranged.

Conventional configurations and their problems IIL circuits are bipolar highly integrated circuits. IIL circuits are also known as low power consumption circuits and are widely used. When a logic circuit consisting of this IIL circuit, such as a plurality of flip-flops, is connected to form a frequency divider circuit, approximately the same pattern is consecutively placed on a semiconductor substrate. . By the way, before manufacturing a semiconductor integrated device, it is essential to check whether the wiring is done according to the prescribed circuit diagram on a piece of paper on which the pattern of the semiconductor integrated device to be manufactured is drawn. Become. but,
In addition to being inherently highly integrated,
On a pattern in which a plurality of substantially identical patterns are arranged, it is impossible to immediately determine where each logic circuit is arranged. In particular, since it is not immediately possible to determine the placement locations of the input, output, and reset portions of a logic circuit, it is necessary to check the layout of the logic circuit on the paper on which it has been patterned before inspecting whether the logic circuit is placed according to the circuit diagram. In this case, the input section, output section, and reset section must be written before starting work.

In addition, in a built-in semiconductor integrated device,
It may be necessary to bring a probe (needle) into contact with a wiring part when inspecting a part of a circuit or analyzing a defect. However, if the area of the wiring section is small, it is difficult to bring the probe into contact with the probe, and furthermore, there is the problem that the probe may come into contact with an adjacent wiring section, making it impossible to carry out the desired inspection.

OBJECTS OF THE INVENTION The present invention provides a semiconductor integrated device that overcomes the above-mentioned disadvantages.

Structure of the Invention The present invention provides a plurality of logic circuits configured by connecting a plurality of transistors, in which a plurality of logic circuits are successively arranged in substantially the same pattern on the same semiconductor substrate, and an output of at least one of the plurality of logic circuits is provided. The portion is connected to the input portion of another adjacent logic circuit or other element, and the width of the wiring used to connect the input portion or other element is discernible compared to the wiring connecting the plurality of transistors. It has a wide range of semiconductor integrated devices. As a result, the wide wiring portion can be used as a mark during wiring inspection and as a probe contact area.

DESCRIPTION OF THE EMBODIMENTS FIG. 1 shows a unit block of a logic circuit. In the figure, 1 indicates a flip-flop circuit, 2 its input terminal, 3 its output terminal, and 4 its reset terminal.

Figure 2 shows the flip-flop circuit in Figure 1.
A specific circuit example when configured with an IIL circuit is shown below. It should be understood that in FIG. 2, the collector terminal 15 of the transistor 13 shown in FIG. 3 is connected to the bases B of the transistors 5 to 12, respectively. Furthermore, the transistor 13 in FIG.
It is also well known that the emitter terminal 14 is called an injector terminal, and that an injector current is supplied from this injector terminal to operate the IIL circuit.

FIG. 4 shows a portion of a frequency divider circuit in which a plurality of flip-flop circuits are used. 16 in the diagram
is an injector current supply line, 17 is an input signal line, 18 and 21 are flip-flop circuits, 1
Reference numerals 9 and 20 are output signal lines of the flip-flop circuit 18, and in particular, the output signal 19 is the output signal line of the flip-flop circuit 18.
It is also an input signal line for the flop circuit 21. 22,
23 is an output signal line of the flip-flop circuit 21. 24 is a reset signal line.

FIG. 5 shows a pattern diagram when the frequency dividing circuit of FIG. 4 is integrated. Here, FIGS. 2 and 4
The same parts as in the figure are given the same numbers.

As is clear from the pattern diagram in FIG. It can be seen that they are widely distributed. Here, the output signal line 19 is also an input signal line of the flip-flop circuit 21. Further, the output signal line 20 is connected to other elements (not shown) via a diffusion layer 25 and a wiring section 26. The flip-flop circuit 21 is formed in substantially the same pattern as the flip-flop circuit 18 and continuously adjacent thereto. Flip-flop circuit 21
The output signal line 22 is also an input signal line of a logic circuit (a portion of the transistor is shown without reference numerals) formed next to it. The output signal line 23 includes a diffusion layer 25,
It is connected to other elements (not shown) via the wiring section 26.

In this embodiment, both the input section and the output section are formed to have a wide range, but the object of the present invention can be achieved even if only one of them is used. For example, only the output signal line 20 may be made wider.

In addition, the rectangular portions indicated by dotted lines in the pattern diagram of FIG. 5 indicate the transistors 5 to 12 of FIG. show. Furthermore, the square hatched area indicates a window opening in the collector region of the transistor. Note that 27 is a window opening in the injector area.

By the way, the emitters of transistors 5 to 12 in FIG. 2 are grounded, whereas the wiring state of the emitters of the transistors is not shown in FIG. All 12 are NPN
Since it is a transistor and the emitter is an N-type region, it is common to form a common emitter N-type region (epitaxial layer) and ground a part of this N-type region. It is known.

Effects of the Invention As described above, in the semiconductor integrated device of the present invention, when a plurality of logic circuits having substantially the same pattern are connected, the wiring section of at least one of the input section and the output section of the logic circuit Since it is disposed wider than the internal wiring portion constituting the logic circuit, it serves as a mark for wiring inspection performed before integration, resulting in faster wiring inspection.

Furthermore, when inspecting a part of a built-in semiconductor integrated device or during failure analysis, a probe (needle) is used.
It is effectively used as a contact area, and its utility value is great.

[Brief explanation of drawings]

Fig. 1 is a block diagram of a flip-flop circuit with a reset terminal, Fig. 2 is a specific circuit diagram of Fig. 1 configured with an IIL circuit, and Fig. 3 shows an injector current supply transistor of the IIL circuit, The diagram is
FIG. 5, which is a diagram showing a part of the frequency dividing circuit, shows an embodiment in which the frequency dividing circuit of FIG. 4 is constructed using the semiconductor integrated device of the present invention. 1, 18, 21... flip-flop circuit,
2...Input terminal, 3...Output terminal, 4...Reset terminal, 5-12...Transistor, 13...Injector current supply transistor, 14...Injector terminal, 15...Collector terminal, 16...
Injector current supply line, 17... input signal line,
19, 20, 22, 23...output signal line, 24...
...Reset signal line.

Claims (1)

[Claims] 1. A plurality of logic circuits configured by connecting a plurality of transistors are consecutively arranged on the same semiconductor substrate in substantially the same pattern, and the output part of at least one of the plurality of logic circuits is connected to another adjacent logic circuit. The width of the wiring connected to the input part or other element of the logic circuit and used for connecting the input part or other element is so wide as to be discernible compared to the wiring connecting the plurality of transistors. semiconductor integrated devices.