JPH0558768A - Production of single crystal - Google Patents

Production of single crystal

Info

Publication number
JPH0558768A
JPH0558768A JP3224187A JP22418791A JPH0558768A JP H0558768 A JPH0558768 A JP H0558768A JP 3224187 A JP3224187 A JP 3224187A JP 22418791 A JP22418791 A JP 22418791A JP H0558768 A JPH0558768 A JP H0558768A
Authority
JP
Japan
Prior art keywords
single crystal
solid
film
cooling process
material film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3224187A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
誠一 岩松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP3224187A priority Critical patent/JPH0558768A/en
Publication of JPH0558768A publication Critical patent/JPH0558768A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To reduce cost in the ZMR method, to easily obtain a large size single crystal in the CZ method and to make a wide and long single crystal plate or thin film possible in the Slab method in a production method of the single crystal. CONSTITUTION:(1) A solid material film made from the 2nd polycrystalline film or an amorphous film is applied on the 1st solid surface and a single crystal breeding seed is brought into contact with the surface of the 2nd solid material film, and the 2nd solid material film is practically and continuously melted and solidified by cooling process to form the single crystal from the contact part. (2) The 2nd single crystal breeding seed is brought into contact with the 1st fused solid surface and the 1st fused solid body is practically and continuously solidified by cooling process to form the single crystal from the contact part. (3) The 1st fused solid sprue is formed by the 2nd single crystal solid body and the 1st fused solid body is practically and continuously solidified by cooling process to form the single crystal from the contact part of the 2nd single crystal solid body sprue.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体の単結晶体または
単結晶膜の新しい製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a novel method for producing a semiconductor single crystal or a single crystal film.

【0002】[0002]

【従来の技術】従来、半導体の単結晶体または単結晶膜
の製造方法としては、 (1) ZMR(one elting ecr
ystalliza−tion)法: 第1の固体表面
には単結晶育成種が設置されると共に第2の多結晶膜ま
たはアモルファス膜から成る半導体膜が形成され、該第
2の半導体膜表面には、単結晶育成種が接触して成ると
共に、該単結晶育成種の接触部から前記第2の半導体膜
を実質的に連続して融解と冷却過程による固体化により
単結晶化を行い、前記半導体膜を単結晶化する方法。参
考資料:USP4576851,特公昭58ー2079
4。
Conventionally, as a method for manufacturing a semiconductor single crystal or a single crystal film, (1) ZMR (Z one M elting R ecr
YSTALLIZATION-PROCESS): A single-crystal growing seed is placed on the first solid surface, and a semiconductor film made of a second polycrystalline film or an amorphous film is formed on the first solid surface. The second semiconductor film is brought into contact with the crystal growth seeds, and the second semiconductor film is substantially continuously solidified from the contact portion of the single crystal growth seeds by solidification by a melting and cooling process. Method of single crystallization. Reference material: USP 457,851, Japanese Patent Publication 58-2079
4.

【0003】(2) CZ(Czochralski)
法: 第1の半導体熔融表面には第1の半導体から成る
単結晶育成種が接触して成ると共に、該単結晶育成種の
接触部から前記第1の半導体熔融体を実質的に連続して
冷却過程による固体化により単結晶化する方法。
(2) CZ ( Cz ochralski)
Method: A single crystal growing seed made of the first semiconductor is in contact with the surface of the first semiconductor melt, and the first semiconductor melt is substantially continuous from the contact portion of the single crystal growing seed. A method of forming a single crystal by solidification in the cooling process.

【0004】(3) Slab法: 第1の固体熔融湯
口が第2の固体にて形成されて成り、該第2の固体湯口
の接触部から前記第1の固体熔融体を実質的に連続して
冷却過程による固体化により単結晶化する方法。
(3) Slab method: The first solid melt spout is formed of the second solid, and the first solid melt is substantially continuous from the contact portion of the second solid spout. The method of single crystal formation by solidification by cooling process.

【0005】等があった。There was such a thing.

【0006】[0006]

【発明が解決しようとする課題】しかし、上記従来技術
によると、 (1) ZMR法では、1枚または1個の半導体膜を形
成するのに必ず1個または1本の単結晶育成種を必要と
し、コスト高につくという課題があった。本発明はかか
るZMR法によるコスト向上要因を減少することを目的
とする。
However, according to the above-mentioned prior art, (1) in the ZMR method, one or one single crystal growth seed is always required to form one or one semiconductor film. However, there was a problem of high cost. It is an object of the present invention to reduce the cost improvement factor of the ZMR method.

【0007】(2) CZ法では、例えばSi単結晶イ
ンゴットの引き上げには単結晶種に細いSi単結晶を用
いるために耐荷重が小さく、大口径のSi単結晶インゴ
ットが連続してあるいは長尺物ができないという課題が
あった。本発明はかかるCZ法における大型単結晶化を
容易に行うことができる方法を提供することを目的とす
る。
(2) In the CZ method, for example, when pulling a Si single crystal ingot, a thin Si single crystal is used as a single crystal seed, so that the load capacity is small and a large diameter Si single crystal ingot is continuous or long. There was a problem that things could not be done. An object of the present invention is to provide a method capable of easily performing large-scale single crystallization in the CZ method.

【0008】(3) Slab法では広幅で長尺の単結
晶板または単結晶膜が形成できないという課題があっ
た。本発明はかかるSlab法の課題を解決し、幅広で
長尺の単結晶板または単結晶膜が形成できる方法を提供
することを目的とする。
(3) The Slab method has a problem that a wide and long single crystal plate or single crystal film cannot be formed. An object of the present invention is to solve the problems of the Slab method and provide a method capable of forming a wide and long single crystal plate or single crystal film.

【0009】[0009]

【課題を解決するための手段】上記課題を解決し、上記
目的を達成するために、本発明は、単結晶の製造方法に
関し、(1) 第1の固体表面に第2の多結晶膜または
アモルファス膜から成る固体材料膜を被覆し、該第2の
固体材料膜表面に、単結晶育成種を接触すると共に、該
単結晶育成種の接触部から前記第2の固体材料膜を実質
的に連続して融解と冷却過程による固体化により単結晶
化を行い、前記固体材料膜の少なくとも表面において単
結晶化する手段をとること、および、(2) 第1の固
体熔融表面に第2の単結晶育成種を接触すると共に、該
単結晶育成種の接触部から前記第1の固体熔融体を実質
的に連続して冷却過程による固体化により単結晶化する
手段をとること、および、(3) 第1の固体熔融湯口
を第2の単結晶固体にて形成し、該第2の単結晶固体湯
口の接触部から前記第1の固体熔融体を実質的に連続し
て冷却過程による固体化により単結晶化する手段をとる
こと、等の手段をとる。
In order to solve the above problems and achieve the above objects, the present invention relates to a method for producing a single crystal, which comprises: (1) a second polycrystalline film or a second polycrystalline film on a first solid surface. A solid material film made of an amorphous film is coated, a single crystal growing seed is brought into contact with the surface of the second solid material film, and the second solid material film is substantially contacted with the contact portion of the single crystal growing seed. (2) a means for performing single crystallization by continuous solidification by a melting and cooling process and performing single crystallization on at least the surface of the solid material film; and (2) a second single crystal on the first solid melt surface. And a means for contacting the crystal-growing seeds, and substantially single-crystallizing the first solid melt from the contact portion of the single crystal-growing seeds by solidification by a cooling process, and (3) ) The first solid melt spout is made into the second single crystal solid Formed, taking the means of the single crystal by solidification by substantially continuously cooling process the first solid molten material from the contact portion of the single crystal solid sprue second, taking the means equal.

【0010】[0010]

【実施例】以下、実施例により本発明を詳述する。EXAMPLES The present invention will be described in detail below with reference to examples.

【0011】図1は本発明によるZMR法を示す製造方
法の断面図である。
FIG. 1 is a sectional view of a manufacturing method showing a ZMR method according to the present invention.

【0012】いま、石英からなる基板1の表面にCVD
法により多結晶SiまたはアモルファスSiからなる半
導体膜2を0.1ミクロンから2ミクロン厚さ程度に形
成し、その表面の一部に単結晶Siまたは単結晶SiC
からなる単結晶種3を当てがうと共に、該単結晶種3と
前記半導体膜2との接触部にてSiの融点以上の温度に
加熱すると共に、半導体膜2を融解しながら移動走査
し、実質的に連続して融解と冷却過程による固体化によ
る単結晶化を行い、単結晶膜を製作する。尚、半導体膜
はSiにかぎらずGe,GaAs,InP等の他の半導
体膜であってもよく、単結晶種はSiCの他サファイア
であってもよく、Ge,GaAs,InP膜の場合には
それと同等かそれより融点の高いSi等であってもよ
い。更に、基板は石英に限らず、セラミックや耐熱ガラ
スあるいは耐熱合金または金属およびそれらの複合材料
であってもよい。
Now, CVD is performed on the surface of the substrate 1 made of quartz.
Forming a semiconductor film 2 made of polycrystalline Si or amorphous Si to a thickness of about 0.1 to 2 microns, and forming a single crystal Si or a single crystal SiC on a part of the surface thereof.
While applying a single crystal seed 3 consisting of, heating to a temperature above the melting point of Si at the contact portion between the single crystal seed 3 and the semiconductor film 2, and moving scanning while melting the semiconductor film 2, A single crystal film is manufactured by substantially continuously performing single crystallization by solidification by melting and cooling processes. The semiconductor film is not limited to Si, and may be another semiconductor film such as Ge, GaAs, InP, etc., and the single crystal seed may be sapphire other than SiC. In the case of the Ge, GaAs, InP film, It may be Si or the like having a melting point equal to or higher than that. Further, the substrate is not limited to quartz, but may be ceramic, heat-resistant glass, heat-resistant alloy, metal, or a composite material thereof.

【0013】図2は本発明によるCZ法を示す製造方法
の断面図である。
FIG. 2 is a sectional view of a manufacturing method showing the CZ method according to the present invention.

【0014】いま、石英坩堝11内に熔融Si12を満
たし、単結晶SiCからなる単結晶種14を前記熔融S
i12の表面に接触させた後、ゆっくりと回転させなが
ら引き上げると単結晶のSiインゴット13が育成され
る。尚、半導体はSiにかぎらずGe,GaAs,In
P等の他の半導体であってもよく、単結晶種はSiCの
他サファイアであってもよく、Ge,GaAs,InP
の場合にはそれと同等かそれより融点の高いSi等であ
ってもよい。更に、坩堝は石英に限らず、セラミックや
耐熱ガラスあるいは耐熱合金または金属およびそれらの
複合材料であってもよい。
Now, the quartz crucible 11 is filled with molten Si 12 and a single crystal seed 14 made of single crystal SiC is added to the molten S.
After being brought into contact with the surface of i12, the single crystal Si ingot 13 is grown by pulling it while slowly rotating it. The semiconductor is not limited to Si, but Ge, GaAs, In
Other semiconductors such as P may be used, and the single crystal seed may be sapphire in addition to SiC, Ge, GaAs, InP.
In this case, Si or the like having a melting point equal to or higher than that may be used. Further, the crucible is not limited to quartz, but may be ceramic, heat-resistant glass, heat-resistant alloy, metal, or a composite material thereof.

【0015】図3は本発明によるSlab法を示す製造
方法の断面図である。
FIG. 3 is a sectional view of a manufacturing method showing the Slab method according to the present invention.

【0016】いま、石英坩堝21内に熔融Si22を満
たし、単結晶SiCからなる単結晶種24を湯口とし
て、該湯口から熔融Si22を冷却しながら引き出す
と、湯口の形状により10ミクロンから500ミクロン
あるいは更に肉厚の単結晶のSi板またはSi膜が25
ミリ幅以上1メートル幅のものまで製作することができ
る。
Now, when the molten Si22 is filled in the quartz crucible 21 and the single crystal seed 24 made of single crystal SiC is used as a sprue and the molten Si22 is pulled out from the sprue while being cooled, depending on the shape of the sprue, 10 to 500 microns or In addition, the thickness of the single crystal Si plate or Si film is 25
It is possible to manufacture products with a width of 1 mm width or more.

【0017】尚、半導体はSiにかぎらずGe,GaA
s,InP等の他の半導体であってもよく、単結晶種は
SiCの他サファイアであってもよく、Ge,GaA
s,InPの場合にはそれと同等かそれより融点の高い
Si等であってもよい。更に、坩堝は石英に限らず、セ
ラミックや耐熱ガラスあるいは耐熱合金または金属およ
びそれらの複合材料であってもよい。
The semiconductor is not limited to Si, but Ge, GaA
Other semiconductors such as s and InP may be used, and the single crystal seed may be sapphire other than SiC. Ge, GaA
In the case of s and InP, Si or the like having a melting point equal to or higher than that may be used. Further, the crucible is not limited to quartz, but may be ceramic, heat-resistant glass, heat-resistant alloy, metal, or a composite material thereof.

【0018】尚、本発明は半導体単結晶に限らず、セラ
ミックや金属あるいいは有機物等の単結晶体や単結晶膜
の製造に用いることができる。
The present invention is not limited to semiconductor single crystals, but can be used for the production of single crystals such as ceramics, metals or organic substances, and single crystal films.

【0019】[0019]

【発明の効果】本発明により、ZMR法によるコスト向
上要因を減少できること、および、CZ法における大型
単結晶化を容易に行うことができること、および、Sl
ab法において幅広で長尺の単結晶板または単結晶膜が
形成できること等の効果がある
According to the present invention, the factor of cost improvement by the ZMR method can be reduced, and large single crystallization by the CZ method can be easily performed, and Sl
In the ab method, there is an effect that a wide and long single crystal plate or a single crystal film can be formed.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明によるZMR法を示す製造方法の断面
図。
FIG. 1 is a sectional view of a manufacturing method showing a ZMR method according to the present invention.

【図2】 本発明によるCZ法を示す製造方法の断面
図。
FIG. 2 is a sectional view of a manufacturing method showing a CZ method according to the present invention.

【図3】 本発明によるSlab法を示す製造方法の断
面図。
FIG. 3 is a sectional view of a manufacturing method showing a Slab method according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・基板 2・・・半導体膜 3、14、24・・・単結晶種 11、21・・・石英坩堝 12、22・・・熔融Si 13・・・Siインゴット 23・・・Si板またはSi膜 DESCRIPTION OF SYMBOLS 1 ... Substrate 2 ... Semiconductor film 3, 14, 24 ... Single crystal seed 11, 21 ... Quartz crucible 12, 22 ... Molten Si 13 ... Si ingot 23 ... Si plate Or Si film

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 第1の固体表面には第2の多結晶膜また
はアモルファス膜から成る固体材料膜が被覆されて成
り、該第2の固体材料膜表面には、単結晶育成種が接触
して成ると共に、該単結晶育成種の接触部から前記第2
の固体材料膜を実質的に連続して融解と冷却過程による
固体化により単結晶化を行い、前記固体材料膜の少なく
とも表面において単結晶化することを特徴とする単結晶
の製造方法。
1. A first solid surface is coated with a solid material film composed of a second polycrystalline film or an amorphous film, and a single crystal growing seed is in contact with the surface of the second solid material film. From the contact portion of the single crystal growing seed to the second
The method for producing a single crystal, wherein the solid material film is substantially continuously monocrystallized by solidification in a melting and cooling process, and at least the surface of the solid material film is monocrystallized.
【請求項2】 第1の固体熔融表面には第2の単結晶育
成種が接触して成ると共に、該単結晶育成種の接触部か
ら前記第1の固体熔融体を実質的に連続して冷却過程に
よる固体化により単結晶化することを特徴とする単結晶
の製造方法。
2. A first solid melt surface is contacted with a second single crystal growing seed, and the first solid melt is substantially continuously contacted from the contact portion of the single crystal growing seed. A method for producing a single crystal, which is characterized in that a single crystal is formed by solidification in a cooling process.
【請求項3】 第1の固体熔融湯口が第2の単結晶固体
にて形成されて成り、該第2の単結晶固体湯口の接触部
から前記第1の固体熔融体を実質的に連続して冷却過程
による固体化により単結晶化することを特徴とする単結
晶の製造方法。
3. A first solid melt spout is formed of a second single crystal solid spout, and the first solid melt is substantially continuous from a contact portion of the second single crystal solid spout. A method for producing a single crystal, characterized in that the single crystal is formed by solidification in a cooling process.
JP3224187A 1991-09-04 1991-09-04 Production of single crystal Pending JPH0558768A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3224187A JPH0558768A (en) 1991-09-04 1991-09-04 Production of single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3224187A JPH0558768A (en) 1991-09-04 1991-09-04 Production of single crystal

Publications (1)

Publication Number Publication Date
JPH0558768A true JPH0558768A (en) 1993-03-09

Family

ID=16809889

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3224187A Pending JPH0558768A (en) 1991-09-04 1991-09-04 Production of single crystal

Country Status (1)

Country Link
JP (1) JPH0558768A (en)

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