JPH0554093A - Test pattern preparing device - Google Patents

Abstract

PURPOSE:To decrease the complicated input work of an operator in the test pattern preparation. CONSTITUTION:By a data file preparing part 14, plural cycles of a test pattern are made into groups, and the data link flag is given and stored to the data to define successively the value of respective cycles. When the test pattern is prepared, the value of respective cycles made into the groups is inputted by the data including the data link flag with a test pattern group value input part 8, and by a test pattern converting means, the data of the data file designated by the data link flag are assigned and converted into the prescribed format.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test pattern creating apparatus for creating a test pattern for simulating a logic circuit in designing an ASIC (custom LSI), a printed circuit board or the like.

[0002]

2. Description of the Related Art Although data called a test pattern is required for simulating a logic circuit, this test pattern needs to be created in a format that can be read by a simulator by the test pattern creating apparatus as described above. Many of the simulators include some methods such as a test pattern language description as a test pattern and a time and change description in a predetermined format.

In recent years, since it is complicated to describe such test patterns in a language, a test pattern creating apparatus called a test pattern input tool has been proposed.
In this test pattern input tool, a so-called wave editor, which directly edits the waveform of a test pattern by using an input device such as a keyboard or a mouse, is becoming mainstream.

The wave editor has a function of directly inputting a waveform to create a test pattern for each simulator. The function at the time of input is 0, 1, 1 of one signal.
Some are capable of editing with values such as Z, λ, ... And grouped signals with hexadecimal, decimal, octal, etc. values, and some have editing functions such as copying.

As a part of CAD, it has been proposed that a waveform obtained by applying a probe to an actual circuit of an actual machine (test machine or the like) by a logic analyzer and reading the waveform can be read on the CAD.

[0006]

However, in the test pattern creating apparatus as described above, a test pattern can be created by directly inputting a waveform using an input device such as a keyboard or a mouse. When
Data and the like are grouped and hexadecimal (hex) values are input as meaningful data in the grouped waveform. For example, the command (5 for 8-bit data
F indicates setup, 00 indicates reset) and processing data (digital data of image, data of communication, etc.) are input to the grouping waveform.

[0007] However, in this way, one
If you input as a hexadecimal value, if you want to test the command or processing data, create a long test pattern and then enter various commands and data, or create many similar test patterns. You have to modify the commands and data to create different test patterns, so the amount of data in the created test patterns is large and a large amount of memory is required, which increases the cost of the device. However, there is a problem that the amount of work for creating the test pattern increases and it takes time and effort to create the test pattern.

In addition, there are problems that an actual machine is required to create a test pattern by the logic analyzer and that it takes a lot of time to obtain an accurate operation. This invention was made in view of the above points,
The purpose is to reduce the complicated input work in creating a test pattern.

[0009]

In order to achieve the above object, the present invention groups a plurality of cycles forming a test pattern of a logic simulation, and sets a data link flag to data in which the value of each cycle is sequentially defined. A data file creating means for creating an attached data file and storing it in a memory, and a test pattern group value input that allows the value of each grouped cycle to be entered as data including a data link flag when creating a test pattern. Means and a test pattern conversion for converting the data input by the means into a test pattern of a predetermined format by allocating the data of the data file designated by the data link flag, if there is a data link flag in the means. And a test pattern creation device equipped with To provide.

Further, the test pattern creating device is provided with a test pattern displaying means for displaying an input or created test pattern and a data link flag portion of the data inputted by the test pattern group value inputting means on the displaying means. It is advisable to provide a test pattern display switching means for switching between displaying as it is or displaying the data read from the data file designated by the data link flag.

Further, for the data link flag managed on the test pattern converted by the test pattern converting means, the data read from the data file designated by the flag is expanded in place of the data link flag. Therefore, it is advisable to provide a test pattern expansion setting means for making a regular test pattern.

Further, the data file creating means is
It is preferable to have a means for creating a data file from the image data read by the scanner.

Further, the data file creating means is
It has a means to create a data file that includes increment / decrement data that sequentially increases or decreases the values of multiple grouped cycles from the initial value by a fixed value. If there is a data link flag that specifies a data file containing this increment / decrement data, a plurality of values that are sequentially incremented or decremented by a fixed value from the initial value based on the increment / decrement data of the data file designated by the flag will be displayed. It is advisable to provide an increment / decre expansion means for expanding as a cycle value.

[0014]

In the test pattern creating apparatus according to the present invention, the data file creating means groups a plurality of cycles forming the test pattern of the logic simulation, and data in which the values of the respective cycles are sequentially defined is added with a data link flag. Create a file and store it in memory.

Then, when creating the test pattern,
The test pattern group value input means inputs the value of each cycle grouped by the data including the data link flag, and the input data is detected by the test pattern conversion means if the data link flag exists in the data link flag. By allocating the data of the data file designated by, the test pattern is converted into a test pattern of a predetermined format.

Therefore, by making it possible to input the data link flag to the input for the group signal group in this way, it is possible to directly input data, commands, etc. on the waveform from a data file created separately. It becomes possible to expand and use it, and it becomes possible to create a test pattern for simulation by modifying the data file or changing the designated data file without modifying the data on the waveform, and the operator's complicated input work Can be reduced.

Further, the test pattern input or created by the test pattern display means is displayed, and the data pattern flag portion of the data input by the test pattern group value input means is directly displayed on the display means by the test pattern display switching means. By switching whether to display or to display the data read from the data file specified by the data link flag, not only the link flag is displayed on the display but also the part of the data in the data file corresponding to Since the data can be actually expanded into the waveform, the operator can easily confirm what kind of data is input into the waveform without performing complicated work.

Further, for the data link flag managed on the test pattern converted by the test pattern conversion means by the test pattern expansion setting means, the data read from the data file designated by the flag is used as the data link flag. If a normal test pattern is created by expanding the data instead of the data link flag, the data of the corresponding part is read from the data file specified by the data link flag, the data link is stopped, and it is not changed by one other data. It becomes possible to make it a pattern, and by using a test pattern that does not use a data link for the completely completed test pattern, the operator can mistakenly correct the data without performing complicated work. You can prevent things from happening.

Furthermore, if the data file creating means creates the data file from the image data read by the scanner, the operator can create the data file and create the test pattern without performing complicated work. Will be able to.

When the data file creating means creates a data file containing incremental / decrement data for sequentially increasing or decreasing the values of a plurality of cycles grouped by a fixed value from the initial value, and creating a test pattern, , If there is a data link flag that specifies the data file containing this increment / decre data in the data input by the increment / decre expansion means, the initial value is based on the increment / decre data of the data file specified by that flag. By expanding the value that has been incremented or decremented by a constant value as a value of multiple cycles, it is possible to describe the increment / decrement designation in the data of the data file, and when there is a lot of data on the waveform. Enter all data, such as when trying out all test patterns Ku also well, the operator will be able to create a test pattern without performing a complicated operation.

[0021]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be specifically described below with reference to the drawings. FIG. 2 is a block diagram showing the configuration of the test pattern creating apparatus according to the present invention. This test pattern creating apparatus includes a keyboard 1 having various input keys, a mouse 2 for inputting position data, and a CR.
A screen display device 3 which is a display such as T or LCD,
The scanner 4 is an image reading device, a memory 5 such as a hard disk device, and a data processing device 6 having a microprocessor including a CPU, a ROM, a RAM, and the like.

FIG. 1 is a block diagram showing functions relating to the present invention of the data processing device 6 of the test pattern creating device shown in FIG. The data processing device 6 includes a test pattern waveform input section 7 for inputting waveform data and the like created using the keyboard 1 or the mouse 2, and the keyboard 1
The value of each cycle grouped when inputting values such as hexadecimal value, decimal value, octal value, etc. of the signal group grouped by using the data link flag described later. A test pattern group value input unit 8 for inputting data including

Further, by converting into a test pattern of a format that can be used by a designated simulator, that is, by allocating the data of the data file designated by the input data if there is a data link flag in it, It also includes a test pattern conversion unit 9 for converting a test pattern in a predetermined format, and a data file link unit 10 for reading out a data portion from a designated data file and passing it to the corresponding portion.

Further, the test pattern display portion 11 for displaying the input or created test pattern on the screen display device 3 and the data link flag portion of the input data are displayed as they are or designated by the data link flag. The test pattern display switching unit 12 is also provided for switching whether to display the data read from the data file.

Furthermore, for the data link flag managed on the test pattern converted by the test pattern conversion unit 9, the data read from the data file designated by the flag is expanded in place of the data link flag. By doing so, the test pattern data expansion setting unit 13 that makes a normal test pattern and a plurality of cycles that make up the test pattern of the logic simulation are grouped, and the data of which the value of each cycle is sequentially defined is given a data link flag. A data file including increment / decrement data for creating a data file, creating a data file with data read from the scanner 4, or sequentially increasing or decreasing the values of a plurality of grouped cycles from an initial value by a constant value. Or create And a data file creating unit 14 to be stored in the memory 5.

When creating the test pattern,
If there is a data link flag that specifies the data file containing the increment / decrement data in the input data,
An increment / decre development unit 15 is also provided which develops a value that is sequentially increased or decreased by a constant value from the initial value as a value of a plurality of cycles based on the increment / decrement data of the data file designated by the flag.

Next, the process of creating the test pattern will be described with reference to the flow charts shown in FIGS. As shown in FIG. 3, first, it is determined whether or not a command for creating data is input from the scanner. If YES, the process proceeds to the process of the flowchart shown in FIG. Then, the scanner 4 reads the data, cuts out the data portion to be used, inputs the data file name for storing the data, and then creates the data file with the input file name so as to match the format, and returns to the beginning of FIG.

If it is not a command input for creating data from the scanner in the flowchart of FIG. 3, it is checked whether or not the command is test pattern conversion. If YES, the process proceeds to the flowchart of FIG. And
If the conversion destination is specified and the test pattern name is input, it is checked whether or not there is a data link flag in the data of the specified test pattern. If not, the normal test pattern conversion is performed and the beginning of FIG. Return to.

On the other hand, if there is a data link flag in the data, the corresponding data is read from the specified data file, and it is checked whether or not there is incremental / decrement data in the corresponding data. As a result, if there is the increment / decrement data, the test pattern is converted to the conversion destination format in the form of expanding the data in the data link flag portion in consideration of the increment or decrement, and the process returns to the beginning of FIG. If there is no ink / decrement data, the test pattern is converted to the conversion destination format by expanding the data in the data link flag part, and the data shown in FIG.
Return to the beginning of.

If none of the above in the flow chart of FIG. 3, it is checked whether or not the input command stops the data link and expands the data. If the data is expanded, the process proceeds to the process of the flow chart shown in FIG. If the answer is NO, the process returns to the beginning of FIG. 3. If YES, the test pattern name is input, and it is checked whether or not there is a data link flag in the data of the input test pattern. If not, the process returns to the beginning of FIG. 3, but if there is, it is specified. The corresponding data is read from the data file, and it is checked whether or not there is increment / decrement data in the data.

As a result, if there is no increment / decrement data, the data read from the data file is expanded in place of the data link flag to form a regular test pattern, and then the process returns to the beginning of FIG. If there is the increment / decrement data, the data is expanded in consideration of the increment / decrement data based on the data read from the data file instead of the data link flag, and after the normal test pattern, the beginning of FIG. Return to.

In the flowchart of FIG. 3, it is checked whether the data link is stopped and the data is expanded.
If so, the input of the test pattern name is checked to see if it is an existing test pattern. If it is not an existing test pattern, the process of the flowchart shown in FIG. 5 is executed. Is read and the processing shifts to the processing shown in FIG.

In the process shown in FIG. 4, it is checked whether or not there is a data link flag in the data of the designated test pattern. If there is no data link flag, normal waveform display is performed and the process shown in the flowchart of FIG. 5 is entered. .. Also, if there is, it is checked whether or not the data file is specified, and if there is, it is left as it is, and if it is not, after receiving the input of the data link file name, the corresponding data from the specified data file is received. To check whether the waveform display switching flag is a data link flag display or a data display.

If the check shows that the data link flag is displayed, the flag is displayed as a waveform with the flag kept, and the process proceeds to the process shown in FIG. Also, if it is a data display, check whether there is incremental / decrement data in the corresponding data,
If not, the waveform is expanded and displayed so that the corresponding data is displayed at the position of the data link flag, and the process proceeds to the process shown in FIG. On the other hand, if there is the increment / decrement data, it is incremented or decremented in consideration of the data, the waveform is expanded and displayed so that the corresponding data is displayed at the position of the data link flag, and then the process shown in FIG. Move to.

In the process shown in FIG. 5, it is checked whether or not the command after waveform expansion is waveform input, and if YES, the command shown in FIG.
After shifting to the processing of the flowchart shown in, the input target signal is specified and the specified target is checked to see if it is a grouped signal group. If it is not a group but a single signal, the single signal input processing is performed. Check whether it is a termination request. Here, if there is an end request, the process proceeds to the process of the flowchart shown in FIG. 5, but if there is no end request, the process returns to the process of designating the input target signal.

On the other hand, if it is a group, the group value input processing of the grouped signal group is performed, and it is checked whether the input value is the data link flag. If NO, the processing of checking whether it is the above-mentioned end or not. If it is a data link flag, it is checked whether or not the display switching is flag display. If YES, the data link flag is displayed as a waveform in the form of a flag as it is, and the process returns to the input target signal designating process.

If the display switching flag is not the flag display, it is checked whether the data file name has been defined. If it is undefined as a result of the check, the process returns to the process of the flowchart shown in FIG. 4, but if it is defined, the corresponding data is read from the specified data file, the corresponding data is placed at the flag position, the waveform is expanded and displayed, and input The process returns to the target signal designation process.

Next, in the flowchart of FIG. 5, it is checked whether the command after waveform expansion is display switching, and Y
Although not shown in the case of ES, the display switching flag is reversed (for example, in the case of data display, it is changed to flag display), and FIG.
Return to processing. If NO, it is checked whether the command after waveform expansion is terminated or saved, and if it is NO, the process returns to the process of checking whether the waveform is input, but if YES, the process proceeds to the process of the flowchart shown in FIG.

Here, it is judged whether or not the command is finished, and if it is not finished (save), the data is saved and the command shown in FIG.
If the process is completed, the process proceeds to the process of the flowchart shown in, and if it is finished, it is checked whether or not the test pattern currently being developed is unsaved data. If NO, all the processes are finished, but Y
If it is ES, it is judged whether or not to save further, and if it is NO, it ends as it is. If YES, the data is saved and all the processes are completed.

Next, the actual specifications of the link with the data file will be described. Regarding the link between the test pattern and the data, the case where the data is treated as a grouped bus signal and the value of each cycle is input as a hex value will be described.

For example, in order to perform data link with respect to the signal group of the test pattern of D <7: 0>, FIG.
# 1, # 2 to the desired cycle value part as shown in
Define by inputting data link flags such as # 3. It is specified by this [default is test pattern name. dat file] and assign the corresponding data among them.

In the example shown in FIG. 11, a region 1 surrounded by a broken line
The portion 6 indicates to repeat, and the shaded portion of the area 16 is repeated a designated number of times. For example, if ZZ indicating a break is input together with # 1 in this repeat part, the first # 1 is the 1 of # 1 in the data file.
The second and third # 1s are linked to the second data, and the second and third # 1s in the data file are linked.

FIG. 12 is an explanatory diagram showing an example of a data file format. In this example, ASCII files are used in consideration of maintainability and portability. That is, for example, # 1; comment: AA, 55, 0 with # number; comment: value, value, ...; as a basic format.
Described as 0, ...; Note that the ";comment" can be omitted, and line breaks in the "value, value," part are placed before and after the "," so that they do not occur in the middle of the value, and any number of data values can be described. Is ";"
Be sure to attach.

The # numbers do not have to be sequential, and can be specified by skipping like # 100 and # 25, and the order in which they are contained in the data file is not the same. If the number of file data is smaller than the number of data on the waveform, the last data is continuously used.

Next, the format of the data file including the increment / decrement data will be described with reference to FIG. When including the increment data or the decrement data in the data, specify and describe in the format of "value (initial value) / increment or decrement rate". In the example shown in FIG. 13, when the data link flag # 30 and the waveform are designated, F5 is first, E9 is second, and 0A is third.
, 00 (initial value of increment) is assigned to the fourth, 01 of 00 + 1 is assigned to the fifth, 02 of 01 + 1 is assigned to the sixth, and after reaching FF, the value returns to 00 and the data is changed from the initial value "00". The links are made so that they are sequentially incremented (increased) by one and assigned.

Further, the data link flag # shown in FIG.
If it is designated as 50, the initial value FF is first, the FD of FF-2 is second, the FB of FD-2 is third, and
Next, the initial value "FF" is sequentially decreased by 2 so that F9 of FB-2 is assigned. And F
After F → …… → 01 → FF → …… and 00, return to FF again. Even if "0F / + 3,0B" is described, the last "0B" is not used, but it is not an error and is ignored.

Next, the actual test pattern creating process will be briefly described with reference to FIG. The test pattern data file stores, for example, data as shown in FIG. 14, and the # numbers are written as they are in the data link portion, such as data link flags # 1 and # 3.

When the waveform of this data file is read, the data corresponding to the data link flag # 1 is sequentially read from the data link file, and the data is read without depending on the flag of the test pattern display switching unit 12. To do so. Then, when the display switching flag is switched, the display is switched from the # number to the actual data and displayed immediately. Even if the test pattern for simulator is created, if the read data is used, it is processed. The speed can be increased. If the data file cannot be reflected immediately after being modified, the same test pattern may be read again to deal with it.

In this way, the test pattern creating apparatus can easily create a test pattern containing different data by modifying the data file or changing the data file of the designated destination without modifying the data on the waveform. Therefore, the complicated input work by the operator can be reduced. In addition, you can easily create a test pattern by specifying a link with another file and easily check what kind of data is actually linked by the data link on the waveform, which is troublesome for the operator. You can reduce unnecessary input work.

Furthermore, by stopping the data link, expanding the data, and using a test pattern that does not use the data link, it is possible to prevent the operator from erroneously correcting the data and to keep the test unchanged after completion. Data can be reliably protected against patterns. Furthermore, it becomes possible to create a data file by the image data read from the scanner, and it is possible to reduce the troublesome work when the operator creates the data file.

Since the increment / decrement data can be described in the data in the data file corresponding to the data link flag, when inputting a large amount of data on the test pattern, etc. It is not necessary for the operator to input a large amount of data with respect to the data input that performs a regular operation, such as when testing the, and it is possible to reduce such complicated work.

[0052]

As described above, according to the test pattern creating apparatus of the present invention, it is possible to reduce the complicated input work when creating the test pattern.

[Brief description of drawings]

FIG. 1 is a block diagram showing functions relating to the present invention in a data processing device 6 of the test pattern creating device shown in FIG.

FIG. 2 is a block diagram showing a configuration of a test pattern creating apparatus according to the present invention.

FIG. 3 is a flowchart showing a process of creating a test pattern in the data processing device 6 shown in FIG.

FIG. 4 is a flowchart similarly showing the subsequent processing.

FIG. 5 is a flowchart showing the same processing as that of the above.

FIG. 6 is a flow chart showing the same processing as the above.

FIG. 7 is a flowchart similarly showing the subsequent processing.

FIG. 8 is a flowchart similarly showing the subsequent processing.

FIG. 9 is a flowchart showing the subsequent processing in the same manner.

FIG. 10 is a flowchart similarly showing the subsequent processing.

FIG. 11 is a diagram showing an example of a test pattern for explaining an actual specification of a link with a data file.

FIG. 12 is an explanatory diagram showing an example of a data file format.

FIG. 13 is a diagram for explaining a format of a data file including increment / decrement data.

FIG. 14 is a diagram for explaining an actual test pattern creation process.

[Explanation of symbols]

1 keyboard 2 mouse 3 screen display device 4 scanner 5 memory 6 data processing device 7 test pattern waveform input unit 8 test pattern group value input unit 9 test pattern input unit 10 data file link unit 11 test pattern display unit 12 test pattern display switching unit 13 Test pattern data expansion setting part 14 Data file creation part 15 Increment / decre expansion part

─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. ⁵ Identification code Internal reference number FI Technical display location G06F 11/22 J 9072-5B 11/26 310 9072-5B

Claims (5)

[Claims] 1. A data file creation for grouping a plurality of cycles constituting a test pattern of a logic simulation, creating a data file in which a data link flag is added to data in which the values of each cycle are sequentially defined, and storing the data file in a memory. Means, a test pattern group value input means capable of inputting the value of each grouped cycle in the data including the data link flag, and the data inputted by the means. If there is the data link flag in the, the test pattern conversion means for converting the data of the data file specified by the data link flag into a test pattern of a predetermined format. Creation device. 2. The test pattern creation device according to claim 1, wherein the test pattern display means for displaying the input or created test pattern, and the data of the data input to the display means by the test pattern group value input means. A test pattern display device, comprising: a test pattern display switching means for switching between displaying the link flag portion as it is and displaying the data read from the data file designated by the data link flag. 3. The test pattern creating apparatus according to claim 1, wherein a data file designated by a data link flag managed on the test pattern converted by the test pattern converting means is specified by the flag. A test pattern creation device, comprising: a test pattern expansion setting unit that expands the data read from the device instead of the data link flag to create a normal test pattern. 4. The test pattern creating apparatus according to claim 1, wherein the data file creating means has means for creating a data file from the image data read by the scanner. Characteristic test pattern creation device. 5. The test pattern creating device according to claim 1, wherein the data file creating means sequentially increases or decreases the values of the plurality of grouped cycles from the initial value by a constant value. It has a means to create a data file containing increment / decrement data, and when creating a test pattern, if there is a data link flag that specifies the data file containing this increment / decrement data in the input data, A test characterized by including an increment / decrement expanding means for expanding, as a value of a plurality of cycles, a value that is sequentially increased or decreased by a constant value from an initial value based on the increment / decrement data of the data file designated by the flag. Pattern making device.