JPH0552534A - Inspecting apparatus of soldering - Google Patents

Inspecting apparatus of soldering

Info

Publication number
JPH0552534A
JPH0552534A JP24473891A JP24473891A JPH0552534A JP H0552534 A JPH0552534 A JP H0552534A JP 24473891 A JP24473891 A JP 24473891A JP 24473891 A JP24473891 A JP 24473891A JP H0552534 A JPH0552534 A JP H0552534A
Authority
JP
Japan
Prior art keywords
soldering
reflected light
illumination
soldering part
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24473891A
Other languages
Japanese (ja)
Inventor
Masahiko Uno
真彦 宇野
Tatsunori Hibara
辰則 火原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP24473891A priority Critical patent/JPH0552534A/en
Publication of JPH0552534A publication Critical patent/JPH0552534A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable execution of quick and accurate inspection in consideration of a change in a shape by a method wherein positions of reflected lights obtained by illuminators disposed on a circumference are expressed by polar coordinates from the basic position of an illuminator positioned vertically above. CONSTITUTION:The image of an electronic component which is soldered on a base and to the soldered part 14 of which lights of an illuminator 1 positioned vertically above and illuminators 2 to 7 disposed on a circumference obliquely above are applied is picked up by a TV camera 8. Positions of reflected lights are computed by a measuring means 11 from that image taken in an image memory 9. A determining means 12 expresses the positions of the reflected lights obtained by the illuminators 2 to 7, by the radiuses and deflection angles of polar coordinates around the position of the reflected light of the illuminator 1, and makes these radiuses and deflection angles be parameters showing the three-dimensional shape of the soldered part 14. Values of them are compared with ones in a set allowable range and the quality is determined. In this way, quantitative or qualitative determination is conducted and information for knowing an approximate shape can be processed at a high speed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば基盤上に実装す
る電子部品等の電気機器の半田付け状態を画像情報から
検査する半田付け検査装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a soldering inspection device for inspecting a soldering state of an electric device such as an electronic component mounted on a board from image information.

【0002】[0002]

【従来の技術】この種の従来の半田付け検査装置とし
て、例えば特開平3−6447号公報に開示されたもの
がある。これは半田付け部の斜め上方に4つの照明を配
置し、それらの反射光の重心位置で囲まれる面積の値か
ら半田付けの良否判定を行うものである。
2. Description of the Related Art As a conventional soldering inspection apparatus of this type, there is one disclosed in Japanese Patent Application Laid-Open No. 3-6447. In this method, four illuminations are arranged diagonally above the soldering portion, and the quality of soldering is determined based on the value of the area surrounded by the center of gravity of the reflected light.

【0003】この方法の概略を図5に示す。図5におい
て、31は部品、32は半田部、33は半田付け用ラン
ドに設定されたマスク領域(破線枠)、34、35、3
6はそれぞれの3方向より半田付け部を照明して明るく
光った領域、37、38、39は明るい領域34、3
5、36のそれぞれの重心値、40は良品の場合の3つ
の重心点を頂点とする三角形、41は不良の場合の3つ
の重心点を頂点とする三角形を示している。
An outline of this method is shown in FIG. In FIG. 5, 31 is a component, 32 is a solder portion, 33 is a mask region (broken line frame) set on a soldering land, 34, 35, 3
6 is an area where the soldering part is illuminated from three directions and shines brightly, 37, 38 and 39 are bright areas 34 and 3
Each of the barycentric values 5 and 36, 40 is a triangle having the three barycentric points as vertices in the case of a non-defective product, and 41 is a triangle having three barycentric points in the case of being defective.

【0004】図5に示すように、図5(a)は良品であ
り、囲まれる面積の値が大きい。一方、図5(b)は不
良品であり、半田が少ないため面積の値が小さい。この
ことからこの面積の大きさを判定用のしきい値と比較し
て、しきい値よりも大きければ良品、小さければ不良品
と判定することができるというものである。
As shown in FIG. 5, FIG. 5 (a) is a non-defective product, and the value of the enclosed area is large. On the other hand, FIG. 5B is a defective product, and the area value is small because the amount of solder is small. From this, it is possible to compare the size of this area with a threshold value for determination, and if it is larger than the threshold value, it can be determined as a good product, and if it is smaller than the threshold value, it can be determined as a defective product.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上述し
た従来例で示した検査方法は、比較的形状が安定してい
る半田付けについて半田の有無を調べる意味においては
有効であるが、スポット半田付けなど半田付け形状が様
々に変化する可能性のあるものには適用できない。半田
付け形状が大きく変化した場合には反射光の重心位置は
大きく変化するが、面積だけを見た場合にはその形状変
化が測定できないことがしばしばあるためである。この
ような半田付けの良否を判定するためには、複数の照明
から半田付けの3次元形状を高速に把握することが最も
重要な課題である。
However, the inspection method shown in the above-mentioned conventional example is effective in the case of checking the presence / absence of solder in the soldering in which the shape is relatively stable, but spot soldering or the like. It cannot be applied to soldering shapes that may change in various ways. This is because the position of the center of gravity of reflected light changes greatly when the soldering shape changes significantly, but it is often impossible to measure the shape change when only looking at the area. In order to judge the quality of such soldering, it is the most important task to grasp the three-dimensional shape of soldering from a plurality of lights at high speed.

【0006】[0006]

【課題を解決するための手段】上記課題を達成するため
に、本発明では、第1に、半田付け部鉛直上方の照明の
反射光位置を測定して半田付け部の基本位置とし、その
他の円周上の照明の反射光位置をこの基本位置からの極
座標の動径と偏角で表現し、この値をもって半田付け部
の3次元形状を示すパラメータとする。これらの値がそ
れぞれの指定した値の範囲内に入っていれば良品、そう
でなければ不良品と判定するものである。
In order to achieve the above object, in the present invention, firstly, the position of the reflected light of the illumination above the soldering portion vertically is measured and set as the basic position of the soldering portion. The position of the reflected light of the illumination on the circumference is expressed by the radius vector and the polar angle from this basic position, and this value is used as a parameter indicating the three-dimensional shape of the soldered portion. If these values are within the range of the respective designated values, it is determined as a good product, and if not, it is determined as a defective product.

【0007】第2は、第1の手段に加えて、半田付け部
鉛直上方の照明の反射光位置、すなわち半田付け部の基
本位置が所定の位置よりどれだけずれているかを計測
し、そのズレ量が大きければ不良とするものである。
Secondly, in addition to the first means, the position of the reflected light of the illumination vertically above the soldering portion, that is, the basic position of the soldering portion is measured by a certain amount, and the deviation is measured. If the amount is large, it is regarded as defective.

【0008】第3は、照明手段として、半田付け部の鉛
直上方にリング照明を配置し、さらに斜め上方に複数の
リング照明を円周上に配置した構成にしたものである。
Thirdly, as the illuminating means, a ring illuminator is arranged vertically above the soldering portion, and a plurality of ring illuminators are arranged obliquely upwardly on the circumference.

【0009】[0009]

【作用】本発明は、第1に、複数の円周上の照明を異な
る角度で半田付け部にあて、その反射光位置を測定する
ことによって、撮像手段のカメラ位置と照明位置によっ
て定められる傾きをもつ面の位置を得る。これにより、
半田付け形状の一部分の情報しか得られないが、概形を
知る上で重要な情報を高速に処理できる。そして、面積
などと異なり、直接反射光の位置関係を判定の材料とし
ているため半田付け部の概形を適切にとらえることがで
きる。
According to the present invention, first, a plurality of illuminations on the circumference are applied to the soldering portion at different angles, and the reflected light position thereof is measured, whereby the inclination determined by the camera position and the illumination position of the image pickup means. Get the position of the face with. This allows
Although only information on a part of the soldering shape can be obtained, information that is important for knowing the outline can be processed at high speed. Further, unlike the area and the like, since the positional relationship of the directly reflected light is used as a material for the determination, it is possible to appropriately grasp the outline of the soldered portion.

【0010】また、鉛直上方の照明の反射光位置を基本
位置として、他の照明の反射光位置を相対的に測定する
ことによって、半田付け部の位置が全体的にずれても半
田付け部の形状測定に影響を与えない。
Further, by using the reflected light position of the vertically upper illumination as the basic position and measuring the reflected light positions of the other illuminations relatively, even if the position of the soldered portion is entirely displaced, Does not affect shape measurement.

【0011】さらに、照明が円周上に配置してあること
から、その反射光の位置も極座標表現でとらえることに
よって半田付け部の形状が適切に把握できる。そして、
また、半田付け部の形状に対称性が見られる場合には、
照明の反射光位置の許容範囲を極座標表現することによ
って形状を表現するデータ数を減少させることができ、
例えば、半田付け部が半球上である場合は、良品の動径
のデータは一定となる。
Further, since the illumination is arranged on the circumference, the shape of the soldered portion can be properly grasped by capturing the position of the reflected light in polar coordinates. And
Also, if symmetry is seen in the shape of the soldered part,
By expressing the allowable range of the reflected light position of the illumination in polar coordinates, the number of data expressing the shape can be reduced,
For example, when the soldering part is on a hemisphere, the data of the radius vector of the non-defective product is constant.

【0012】第2は、上述したことに加えて、基本位置
である鉛直上方照明の反射光位置をその所定の位置と比
較することによって、半田付け部全体の位置ずれを検出
することができる。これに従えば、半田付け部の形状が
良品であっても、全体的に位置がずれているものを不良
品として取り除くことができる。
Second, in addition to the above, by comparing the reflected light position of the vertically upper illumination, which is the basic position, with the predetermined position, it is possible to detect the positional deviation of the entire soldered portion. According to this, even if the shape of the soldering portion is a good product, it is possible to remove a product whose position is displaced as a whole as a defective product.

【0013】第3に、半田付け部は鏡面かつ微細な構造
をもつため、一つの照明ではその局所的な構造に影響さ
れて正しい面の測定ができない。面の傾きは空間の3点
で決定されるが、その意味で面の傾きはある程度マクロ
にとらえなければならない。本発明では、照明をリング
照明にすることによって、照射角にある程度の裕度をも
たせ反射光を安定に得ることができる。さらに、リング
照明は通常ならば角度的にカメラと干渉する位置にも設
置可能という利点もある。
Thirdly, since the soldering portion has a mirror surface and a fine structure, the correct surface cannot be measured by one illumination because of its local structure. The inclination of a surface is determined by three points in space, and in that sense the inclination of the surface must be grasped to some extent as a macro. In the present invention, by using ring illumination as the illumination, it is possible to obtain a certain degree of latitude in the irradiation angle and to stably obtain the reflected light. Further, the ring illumination has an advantage that it can be installed at a position where it normally interferes with the camera angularly.

【0014】[0014]

【実施例】【Example】

実施例1.以下、本発明の一実施例を図を用いて説明す
る。図1において、1は半田付け部14の鉛直上方にあ
る照明、2〜7は半田付け部14の斜め上方に円周上に
配置した複数の照明、8は撮像手段の一部であるテレビ
カメラ、9は撮像手段の一部である画像メモリ、10は
照明制御や撮像制御などの一連の制御を行う制御手段、
11は画像メモリの内容から反射光位置を計測する計測
手段、12は判定手段、13は判定結果である。
Example 1. An embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, reference numeral 1 is an illumination vertically above the soldering portion 14, 2 to 7 are a plurality of illuminations arranged on the circumference obliquely above the soldering portion 14, and 8 is a television camera which is a part of an image pickup means. , 9 is an image memory which is a part of the image pickup means, 10 is a control means for performing a series of control such as lighting control and image pickup control,
Reference numeral 11 is a measuring means for measuring the reflected light position from the contents of the image memory, 12 is a determining means, and 13 is a determination result.

【0015】次に動作について説明する。このように構
成された検査装置では、検査手順は以下のようになる。
まず、制御手段10の指令により照明1が点灯される。
この照明による画像はテレビカメラ8によって撮像され
画像メモリ9に取り込まれた後、計測手段11によって
反射光位置が計算される。反射光位置の計算方法は、あ
る区域における2値画像の重心を求めても良いし、ラベ
リングによる粒子解析の計算を用いてもよい。または濃
淡画像の重心計算を行っても良い。また、反射光の位置
の計算は照明2〜7についても同様に行われ、すべての
照明による反射光位置が計算された後、そのデータが判
定部12に送られる。円周上の照明の数はこの図に示し
た6つに限らず幾つでも良い。
Next, the operation will be described. In the inspection device configured in this way, the inspection procedure is as follows.
First, the illumination 1 is turned on by a command from the control means 10.
The image by this illumination is picked up by the television camera 8 and taken into the image memory 9, and then the reflected light position is calculated by the measuring means 11. As the calculation method of the reflected light position, the center of gravity of the binary image in a certain area may be obtained, or the particle analysis calculation by labeling may be used. Alternatively, the center of gravity of the grayscale image may be calculated. The calculation of the position of the reflected light is similarly performed for the illuminations 2 to 7, and after the positions of the reflected light by all the illuminations are calculated, the data is sent to the determination unit 12. The number of illuminations on the circumference is not limited to the six shown in this figure, but may be any number.

【0016】判定部12では、例えば図2に示されるよ
うに、動径、偏角に許容範囲を設定してその範囲内に反
射光があることを調べて良否を決定し、判定結果13を
出力する。この場合は設定した許容範囲内での反射光の
有無を調べるので定量的な判定法になる。なお、図2に
おいて、15はリード部、16〜22は順次照明1〜7
による反射光、ri とθi は照明i(iは照明1〜7の
符号に表される整数)の反射光位置の動径と偏角を示
し、図示する斜線部は照明3の反射光の許容範囲で、下
記の範囲を有する。 r3 *−δr3 *≦r3 ≦r3 *+δr3 * θ3 *−δθ3 *≦θ3 ≦θ3 *+δr3 *
As shown in FIG. 2, for example, the judging section 12 sets an allowable range for the radius vector and the deviation angle, checks that the reflected light is in the range, and decides whether the result is good or bad. Output. In this case, the presence / absence of reflected light within the set allowable range is checked, which is a quantitative determination method. In FIG. 2, 15 is a lead part, and 16 to 22 are illuminations 1 to 7 in order.
, R i and θ i represent the radius vector and the deviation angle of the reflected light position of the illumination i (i is an integer represented by the symbols of the illuminations 1 to 7), and the hatched portion in the figure indicates the reflected light of the illumination 3. Within the allowable range of, the following ranges are provided. r 3 * -δr 3 * ≦ r 3 ≦ r 3 * + δr 3 * θ 3 * -δθ 3 * ≦ θ 3 ≦ θ 3 * + δr 3 *

【0017】実施例2.上記の装置構成で判定部12の
偏角の許容範囲を予め指定された値で定めるのでなく、
反射光位置の並びで決定することもできる。例えば図2
の偏角の大小関係が合っていれば良品とする(円周上の
照明2〜7を順次点灯した場合には、θ2 <θ3 <θ4
<θ5 <θ6 <θ7 …であれば良品とする)ように判定
部12を構成してもよい。このときは偏角の許容範囲を
設定することが不要であり定性的な判定ができる。
Embodiment 2. In the above-mentioned device configuration, the allowable range of the deflection angle of the determination unit 12 is not determined by a predesignated value,
It can also be determined by the arrangement of the reflected light positions. Figure 2
If the magnitude relationships of the deviation angles are matched, it is considered as a good product (when lighting 2 to 7 on the circumference are sequentially turned on, θ 234
The determination unit 12 may be configured such that <θ 567 ... At this time, it is not necessary to set the allowable range of the deviation angle, and qualitative determination can be performed.

【0018】実施例3.実施例1で述べた方法は、照明
1〜7の全ての反射光位置を求めて、半田付けの形状に
より判定を行っていたが、最初に照明1の反射光位置が
所定の範囲内に入っているか否かを調べて、そこで、ま
ず不良品を取り除くように、計測部11、判定部12を
構成してもよい。この方法では、全体的な位置ずれをお
こしている半田付け部14を不良品として取り除くこと
ができる。
Example 3. In the method described in the first embodiment, all the reflected light positions of the illuminations 1 to 7 are obtained, and the determination is made based on the soldering shape. First, the reflected light position of the illumination 1 falls within a predetermined range. It is also possible to configure the measurement unit 11 and the determination unit 12 so that the defective product is removed first by checking whether or not the defective product is present. With this method, the soldering portion 14 that causes the overall positional deviation can be removed as a defective product.

【0019】実施例4.図3に示すように照明2〜7を
リング照明によって構成してもよい。この様にすること
によって反射光を安定に得ることができる。また、図4
に示した様にリング照明24とカメラ23を対にして設
置し、カメラの数を増やして反射光の位置を信頼性高く
求めるようにしてもよい。
Example 4. As shown in FIG. 3, the illuminations 2 to 7 may be ring illuminations. By doing so, the reflected light can be stably obtained. Also, FIG.
Alternatively, the ring illumination 24 and the camera 23 may be installed as a pair as shown in FIG. 3 and the number of cameras may be increased to obtain the position of the reflected light with high reliability.

【0020】[0020]

【発明の効果】以上の様に、本発明によれば、第1に、
半田付け部鉛直上方の照明の反射光位置を測定して半田
付け部の基本位置とし、その他の円周上の照明の反射光
位置をこの基本位置からの極座標の動径と偏角で表現
し、この値をもって半田付け部の3次元形状を示すパラ
メータとして、定量的あるいは定性的な判定を行うた
め、半田付け部の形状を考慮した半田付け検査を速く正
確に行うことができる。
As described above, according to the present invention, firstly,
The position of the reflected light of the illumination above the soldering part is measured as the basic position of the soldering part, and the positions of the reflected light of the illumination on the other circumferences are expressed by the polar coordinate radius vector and declination angle from this basic position. Since this value is used as a parameter indicating the three-dimensional shape of the soldered portion to make a quantitative or qualitative determination, the soldering inspection in consideration of the shape of the soldered portion can be performed quickly and accurately.

【0021】第2に、第1の効果に加えて、基本位置で
ある鉛直上方照明の反射光位置をその所定の位置と比較
することによって、半田付け部全体の位置ずれを検出す
ることができる。これによって、半田付け部の全体的な
位置ずれを不良品として取り除くことができる。
Secondly, in addition to the first effect, by comparing the reflected light position of the vertically upper illumination, which is the basic position, with the predetermined position, the positional deviation of the entire soldered portion can be detected. .. As a result, the overall positional deviation of the soldered portion can be removed as a defective product.

【0022】第3に、照明にリング照明を用いることに
よって反射光を安定に得ることができ、判定の信頼性が
向上する。
Thirdly, the reflected light can be stably obtained by using the ring illumination as the illumination, and the reliability of the determination is improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による半田付け検査装置の構
成図である。
FIG. 1 is a configuration diagram of a soldering inspection apparatus according to an embodiment of the present invention.

【図2】本発明の判定部における良否判定方法の概念図
である。
FIG. 2 is a conceptual diagram of a quality determination method in a determination unit of the present invention.

【図3】本発明において照明をリング照明による構成と
した半田付け検査装置の一構成図である。
FIG. 3 is a configuration diagram of a soldering inspection apparatus in which illumination is configured by ring illumination in the present invention.

【図4】リング照明の有効性を示す説明図である。FIG. 4 is an explanatory diagram showing effectiveness of ring illumination.

【図5】従来の半田付け検査装置の検査方法の一例を示
す説明図である。
FIG. 5 is an explanatory diagram showing an example of an inspection method of a conventional soldering inspection device.

【符号の説明】[Explanation of symbols]

1 半田付け部鉛直上方の照明 2〜7 半田付け部斜め上方に円周上に配置した複数
の照明 8 撮像手段の一部であるテレビカメラ 9 撮像手段の一部である画像メモリ 10 照明制御や撮像制御などの一連の制御を行う
制御手段 11 画像メモリの内容から反射光位置を計測する
計測手段 12 判定手段 13 判定結果 14 半田付け部 15 リード部 16 照明1による反射光 17 照明2による反射光 18 照明3による反射光 19 照明4による反射光 20 照明5による反射光 21 照明6による反射光 22 照明7による反射光 23 カメラ 24 リング照明
1 Illumination above the soldering portion vertically 2 to 7 Plural illuminations arranged on the circumference diagonally above the soldering portion 8 Television camera 9 which is a part of the image pickup means 9 Image memory 10 which is a part of the image pickup means 10 Lighting control and Control means for performing a series of control such as imaging control 11 Measuring means for measuring the reflected light position from the contents of the image memory 12 Judgment means 13 Judgment result 14 Soldering part 15 Lead part 16 Reflected light from illumination 1 17 Reflected light from illumination 2 18 Reflected Light from Illumination 3 19 Reflected Light from Illumination 4 20 Reflected Light from Illumination 5 21 Reflected Light from Illumination 6 22 Reflected Light from Illumination 7 23 Camera 24 Ring Illumination

─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成4年8月6日[Submission date] August 6, 1992

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】特許請求の範囲[Name of item to be amended] Claims

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【特許請求の範囲】[Claims]

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 基板に半田付けされた電子部品の半田付
け部鉛直上方の照明と半田付け部斜め上方に円周上に配
置した複数の照明によって構成される照明手段と、その
照明が当てられた半田付け部を撮像する撮像手段と、そ
の半田付け部の画像から半田付け部に照明された反射光
の位置を測定する計測手段と、上記撮像手段と計測手段
及び照明手段などを制御する制御手段と、上記複数の照
明手段より得られた反射光の位置を、半田付け部の鉛直
上方の照明の反射光位置を中心とした動径および偏角で
表現し、それらの値がそれぞれの指定された値に入って
いるか否かで半田付けの良否を判定する判定手段を備え
たことを特徴とする半田付け検査装置。
1. An illuminating means comprising an illuminator vertically above a soldering part of an electronic component soldered to a substrate and a plurality of illuminators arranged circumferentially obliquely above the soldering part, and the illuminating means. An image pickup means for picking up an image of the soldering part, a measuring means for measuring the position of the reflected light illuminated on the soldering part from the image of the soldering part, and a control for controlling the image pickup means, the measuring means, and the illuminating means Means and the position of the reflected light obtained from the plurality of illuminating means are represented by a radius vector and a deflection angle centered on the reflected light position of the illumination vertically above the soldering part, and those values are designated respectively. A soldering inspection apparatus comprising: a determining unit that determines whether the soldering is good or bad depending on whether or not the value is within a predetermined value.
【請求項2】 上記判定手段は、半田付け部の鉛直上方
の照明の反射光位置を所定の位置と比較し、その差がし
きい値を越えれば不良と判定することを特徴とする請求
項1記載の半田付け検査装置。
2. The determining means compares the reflected light position of the illumination vertically above the soldering part with a predetermined position, and if the difference exceeds a threshold value, it is determined as defective. 1. The soldering inspection device according to 1.
【請求項3】 上記照明手段は、半田付け部の鉛直上方
に1つのリング照明、斜め上方に円周上に配置された複
数のリング照明によって構成することを特徴とする請求
項1または2記載の半田付け検査装置。
3. The illuminating means comprises one ring illuminator vertically above the soldering part and a plurality of ring illuminators arranged obliquely above the circumference. Soldering inspection device.
JP24473891A 1991-08-29 1991-08-29 Inspecting apparatus of soldering Pending JPH0552534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24473891A JPH0552534A (en) 1991-08-29 1991-08-29 Inspecting apparatus of soldering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24473891A JPH0552534A (en) 1991-08-29 1991-08-29 Inspecting apparatus of soldering

Publications (1)

Publication Number Publication Date
JPH0552534A true JPH0552534A (en) 1993-03-02

Family

ID=17123159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24473891A Pending JPH0552534A (en) 1991-08-29 1991-08-29 Inspecting apparatus of soldering

Country Status (1)

Country Link
JP (1) JPH0552534A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0933445A (en) * 1995-07-25 1997-02-07 Nagoya Denki Kogyo Kk Illumination device for apparatus for inspecting printed wiring board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0933445A (en) * 1995-07-25 1997-02-07 Nagoya Denki Kogyo Kk Illumination device for apparatus for inspecting printed wiring board

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