JPH0548134Y2 - - Google Patents

Info

Publication number
JPH0548134Y2
JPH0548134Y2 JP6001087U JP6001087U JPH0548134Y2 JP H0548134 Y2 JPH0548134 Y2 JP H0548134Y2 JP 6001087 U JP6001087 U JP 6001087U JP 6001087 U JP6001087 U JP 6001087U JP H0548134 Y2 JPH0548134 Y2 JP H0548134Y2
Authority
JP
Japan
Prior art keywords
switch
input
output
changeover
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP6001087U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63167270U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6001087U priority Critical patent/JPH0548134Y2/ja
Publication of JPS63167270U publication Critical patent/JPS63167270U/ja
Application granted granted Critical
Publication of JPH0548134Y2 publication Critical patent/JPH0548134Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP6001087U 1987-04-20 1987-04-20 Expired - Lifetime JPH0548134Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6001087U JPH0548134Y2 (enrdf_load_stackoverflow) 1987-04-20 1987-04-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6001087U JPH0548134Y2 (enrdf_load_stackoverflow) 1987-04-20 1987-04-20

Publications (2)

Publication Number Publication Date
JPS63167270U JPS63167270U (enrdf_load_stackoverflow) 1988-10-31
JPH0548134Y2 true JPH0548134Y2 (enrdf_load_stackoverflow) 1993-12-20

Family

ID=30892042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6001087U Expired - Lifetime JPH0548134Y2 (enrdf_load_stackoverflow) 1987-04-20 1987-04-20

Country Status (1)

Country Link
JP (1) JPH0548134Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS63167270U (enrdf_load_stackoverflow) 1988-10-31

Similar Documents

Publication Publication Date Title
US9947985B2 (en) System and method for a directional coupler
US6397160B1 (en) Power sensor module for microwave test systems
KR20010031308A (ko) 개선된 정확도를 갖춘 자동화된 마이크로웨이브 테스트시스템
CN113132025B (zh) 终端天线阵元间相位差的测试方法、修正方法及测试设备
US4349840A (en) Apparatus for automatically steering an electrically steerable television antenna
US20060005065A1 (en) Network analyzer, network analyzing method, automatic corrector, correcting method, program, and recording medium
JPS61237065A (ja) 2チヤンネル伝送反射特性解析装置
CN101094491A (zh) 用于双模单待机移动终端的单板射频测试系统
KR100752252B1 (ko) 오차 요인 취득용 장치, 오차 요인 취득 방법, 및 인스트럭션 프로그램을 기록한 컴퓨터 판독가능한 기록 매체
JPH0548134Y2 (enrdf_load_stackoverflow)
US10379191B2 (en) Apparatus and method for vector s-parameter measurements
EP0219991A2 (en) R F interferometer
Avci et al. Design optimization for N-port RF network reflectometers under noise and gain imperfections
US4336534A (en) Control generator for use in broadcast receiver including improved signal level indicator
US5812941A (en) Circuit for measuring output powers of channels and stabilizing radiofrequency output in system using linear power amplifier
JPH04368022A (ja) 空中線整合回路およびこれを用いた空中線整合方法
JP2001272428A (ja) ネットワークアナライザ、ネットワーク分析方法およびネットワーク分析プログラムを記録した記録媒体
US2571650A (en) Peak-reading tuning indicator
US20250116746A1 (en) Calibration system and calibration method for a vector network analyzer
JPH11289499A (ja) テレビジョン受像機
JP2001059853A (ja) ネットワーク・アナライザの測定誤差補正装置及び方法
US20060284652A1 (en) Power detecting circuit and demodulator comprising it
US5374855A (en) Apparatus and a method for detecting the coincidence of two signal levels
US5004934A (en) Semiconductor integrated circuit and test method for characteristics
JP2510083Y2 (ja) 並列接続線路切換型移相器