JPH0547415Y2 - - Google Patents

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Publication number
JPH0547415Y2
JPH0547415Y2 JP4059188U JP4059188U JPH0547415Y2 JP H0547415 Y2 JPH0547415 Y2 JP H0547415Y2 JP 4059188 U JP4059188 U JP 4059188U JP 4059188 U JP4059188 U JP 4059188U JP H0547415 Y2 JPH0547415 Y2 JP H0547415Y2
Authority
JP
Japan
Prior art keywords
dust
dehumidifier
electronic component
measuring
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP4059188U
Other languages
Japanese (ja)
Other versions
JPH01142869U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4059188U priority Critical patent/JPH0547415Y2/ja
Publication of JPH01142869U publication Critical patent/JPH01142869U/ja
Application granted granted Critical
Publication of JPH0547415Y2 publication Critical patent/JPH0547415Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【考案の詳細な説明】 (産業上の利用分野) 本考案は電子部品の粉塵環境試験装置に関す
る。
[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a dust environment testing device for electronic components.

(従来の技術) 電子部品特にスイツチ、リレー、コネクター等
の接触部を有する部品における接触部の粉塵に起
因する接触不良等を試験する粉塵環境試験装置
は、従来部品の防塵及び耐磨用試験として開発さ
れたものであるため、その粉塵濃度は高濃度であ
つて、環境加速試験となつていた。
(Prior art) A dust environment test device for testing contact failures caused by dust on contact parts of electronic parts, especially parts with contact parts such as switches, relays, and connectors, is used as a dustproof and abrasion resistance test of conventional parts. Because it was developed, its dust concentration was high and it was an accelerated environmental test.

(考案が解決しようとする課題) このため通常の大気中での粉塵の影響を解明す
るには役立たず、その試験の信頼性を確保できな
い問題点があつた。
(Problem that the invention aims to solve) For this reason, it was not useful for elucidating the effects of dust in the normal atmosphere, and there was a problem that the reliability of the test could not be ensured.

本考案はかゝる問題点を解決することを目的と
したもので、粉塵濃度は低濃度で、かつ長時間に
渉り一定濃度を保持できるようにした装置を提供
するにある。
The purpose of the present invention is to solve this problem by providing an apparatus that can maintain a low dust concentration and maintain a constant dust concentration over a long period of time.

(課題を解決するための手段) 上記の目的を達成するための本考案の構成を実
施例に対応する図を用いて説明すると本考案は、
エアコンプレツサ1に連なる除湿器3と、該除湿
器3に連なる粉塵発生器8と、該粉塵発生器8に
連なる電子部品試験室10と該電子部品試験室1
0内の電子部品を計測する計測器27とからな
り、前記粉塵発生器7に調整自在のフイーダ8を
有する粉塵タンク9を設けると共に前記電子部品
試験室10に、前記除湿器3に接続される1対の
空気噴出口19,19を介して設置される投光器
20と受光器21とからなる粉塵測定部22を設
け、該測定部22に接続される粉塵濃度測定器2
4を前記フイーダ8に接続したことを特徴とす
る。
(Means for Solving the Problems) The structure of the present invention for achieving the above object will be explained using diagrams corresponding to embodiments.
A dehumidifier 3 connected to the air compressor 1, a dust generator 8 connected to the dehumidifier 3, an electronic component testing chamber 10 connected to the dust generator 8, and the electronic component testing chamber 1.
The dust generator 7 is provided with a dust tank 9 having an adjustable feeder 8, and is connected to the electronic component testing chamber 10 and the dehumidifier 3. A dust measuring section 22 consisting of a light emitter 20 and a light receiver 21 installed through a pair of air outlets 19, 19 is provided, and a dust concentration measuring device 2 is connected to the measuring section 22.
4 is connected to the feeder 8.

(作用) そして本考案は前記の手段により試験室10内
の電子部品は計測器27により計測されると共に
試験室10内の粉塵濃度は測定部22により測定
され、これに連なる粉塵濃度測定器24により該
試験室10に連なる粉塵発生器7の粉塵濃度は調
整されるため試験室10内の粉塵濃度は常に所望
の濃度に調整される。
(Function) According to the above-mentioned means, the electronic components in the test chamber 10 are measured by the measuring device 27, and the dust concentration in the test chamber 10 is measured by the measuring section 22, and the dust concentration measuring device 24 connected thereto As a result, the dust concentration in the dust generator 7 connected to the test chamber 10 is adjusted, so that the dust concentration in the test chamber 10 is always adjusted to a desired concentration.

(実施例) 以下図面に基づいて本考案の実施例を説明する
と、1はコンプレツサを示し、該コンプレツサ1
はエアフイルタ2を介して除湿器3に接続され、
該除湿器3は更に圧力調整弁4、流量調整弁5及
び流量計6を介して粉塵発生器7に接続され、該
発生器7には例えばスクリユーフイーダ等の調整
自在のフイーダ8を有する粉塵タンク9が設けら
れている。
(Embodiment) An embodiment of the present invention will be described below based on the drawings. Reference numeral 1 indicates a compressor;
is connected to a dehumidifier 3 via an air filter 2,
The dehumidifier 3 is further connected to a dust generator 7 via a pressure regulating valve 4, a flow regulating valve 5 and a flow meter 6, and the generator 7 has an adjustable feeder 8, such as a screw feeder. A dust tank 9 is provided.

10は電子部品試験室を示し、該試験室10は
覗き窓11を有する開閉扉12が設けられる箱体
内に形成されて、その内部に、前記粉塵発生器7
に連なる流入口13と該流入口13の下面に位置
する傘型の拡散板14と該拡散板14の下方に位
置する電子部品支持台15と該支持台15の下方
に位置して開口するエアフイルタ付き排出口16
と前記除湿器3に調整弁4、第2流量調整弁17
及び第2流量計18を介して接続される1対の空
気噴出口19,19と該噴出口19,19内に位
置する投光器20及び受光器21とからなる粉塵
測定部22とを設け、該測定部22は図示のもの
では、その投光器20と受光器21とを併列させ
て、これを一方の噴出口19内に設置すると共に
他方の噴出口19にこれに対向するプリズム23
を設けたが、これら投光器20と受光器21と
は、それぞれ噴出口19,19内に別々に設け
て、プリズム23を介さず直接対向させてもよ
い。
Reference numeral 10 indicates an electronic component testing chamber, and the testing chamber 10 is formed in a box body provided with an opening/closing door 12 having a viewing window 11, and the dust generator 7 is installed inside the box.
an inlet 13 connected to the inlet 13, an umbrella-shaped diffusion plate 14 located on the lower surface of the inlet 13, an electronic component support 15 located below the diffusion plate 14, and an air filter opened below the support 15. With outlet 16
and a regulating valve 4 and a second flow regulating valve 17 in the dehumidifier 3.
and a dust measuring unit 22 consisting of a pair of air outlets 19, 19 connected via a second flowmeter 18, and a light emitter 20 and a light receiver 21 located within the air outlets 19, 19. In the illustrated measurement unit 22, a light projector 20 and a light receiver 21 are arranged in parallel, and these are installed in one of the jet ports 19, and a prism 23 is installed in the other jet port 19 facing thereto.
However, the light projector 20 and the light receiver 21 may be provided separately in the ejection ports 19, 19, respectively, and directly face each other without interposing the prism 23.

そして該測定部22は粉塵濃度測定器24に接
続し、該測定器24はその測定によつて前記フイ
ーダ8を調整するように該フイーダ8に接続され
ると共にデジタルボルトメータ25を介してマイ
クロコンピユータ26に接続されている。
The measuring unit 22 is connected to a dust concentration measuring device 24, and the measuring device 24 is connected to the feeder 8 so as to adjust the feeder 8 based on the measurement, and is also connected to the microcomputer via a digital voltmeter 25. 26.

27は計測器を示し、該計測器27はユニバー
サルスキヤナをもつて形成し、該計測器27は前
記電子部品支持台15上の電子部品28の試験条
件を設定するため設けた発振器29に連なる電源
30に接続され、更に計測器27はデジタルボル
トメータ31を介して前記マイクロコンピユータ
26に接続した。
Reference numeral 27 indicates a measuring instrument, the measuring instrument 27 is formed with a universal scanner, and the measuring instrument 27 is connected to an oscillator 29 provided for setting test conditions for the electronic component 28 on the electronic component support stand 15. It was connected to a power source 30, and the measuring instrument 27 was further connected to the microcomputer 26 via a digital voltmeter 31.

図中32は洗浄用水取入口、33は排水口、3
4は排風容器を示す。
In the figure, 32 is the washing water intake, 33 is the drain, 3
4 indicates an exhaust container.

第2図は本考案の試験結果測定に用いたプログ
ラム処理のフロー・チヤートで、その手順として
電子部品支持台15上の例えばリレーからなる電
子部品28に発振器29と電源30とを接続して
該電子部品28に一定のサイクルで開閉する動作
状態にする。次に第2図に示すようにステツプ35
でマイクロコンピユータ29を動作させステツプ
36でデジタルボルトメータ25,31と計測器2
7とを制御命令が実行し得るよう初期設定を行な
う。次いでステツプ37で1回目のデータ取り込み
にかゝる時間を設定し、この状態で計測器27は
測定可能な状態におかれ、マイクロコンピユータ
26からのデータ取り込みの制御命令が実行され
て、ステツプ38,39,40で粉塵濃度、接触抵抗値
の測定データがマイクロ・コンピユータ28に入
力される。
FIG. 2 is a flow chart of the program processing used to measure the test results of the present invention, in which an oscillator 29 and a power supply 30 are connected to an electronic component 28, such as a relay, on an electronic component support stand 15. The electronic component 28 is brought into an operating state in which it opens and closes in a constant cycle. Next, step 35 as shown in Figure 2.
Operate the microcomputer 29 with step
36 with digital voltmeter 25, 31 and measuring instrument 2
7 and 7 are initialized so that the control command can be executed. Next, in step 37, the time required for the first data acquisition is set, and in this state, the measuring instrument 27 is placed in a measurable state, the control command for data acquisition from the microcomputer 26 is executed, and the process proceeds to step 38. , 39 and 40, the measurement data of dust concentration and contact resistance value are input to the microcomputer 28.

粉塵濃度は粉塵濃度測定器24で測定され、測
定データはデジタルボルトメータ25を介して入
力され、接触抵抗値は計測器27により制御命令
で設定されたチヤンネル数分の抵触抵抗値が順次
測定され、デジタルボルトメータ31を介して入
力される。
The dust concentration is measured by the dust concentration measuring device 24, the measurement data is inputted via the digital voltmeter 25, and the contact resistance value is sequentially measured by the measuring device 27 for the number of channels set by the control command. , are input via the digital voltmeter 31.

これにより1回目の測定データのマイクロコン
ピユータ26への入力は終了してステツプ37で設
定した割り込み時間に達するまで待機した後、ル
ーチンをステツプ38に戻して再び測定データを入
力する。このようにして設定された所定の試験時
間に達するまで測定データを入力し続ける。なお
蓄積した測定データはマイクロ・コンピユータ2
6の記録容量のためのステツプ42,43,44で6時
間分毎、外部記録装置に蓄積していく。
This completes the input of the first measurement data to the microcomputer 26, and after waiting until the interrupt time set in step 37 is reached, the routine returns to step 38 and measurement data is input again. Measurement data continues to be input until the predetermined test time thus set is reached. The accumulated measurement data is stored on microcomputer 2.
In steps 42, 43, and 44 for a recording capacity of 6, data is stored in the external recording device every 6 hours.

(考案の効果) このように本考案によるときはコンプレツサ1
に連なる除湿器3と該除湿器3に連なる粉塵発生
器7と該発生器7に連なる電子部品試験室10
と、該試験室10内の電子部品を計測する計測器
27とから形成してその粉塵発生器7に調整自在
のフイーダ8を有する粉塵タンク9を設けると共
にその試験室10に前記除湿器3に接続される1
対の空気噴出口19,19を介して設置される投
光器20及び受光器21とからなる濃度測定部2
2を設けて該測定部22に接続される粉塵濃度測
定器24を前記フイーダ8に接続されたから試験
室10は簡単な測定部22によつて粉塵濃度が測
定されると共にその測定部22の粉塵による汚れ
は、噴出口19,19を介して除湿器3からの乾
燥空気により清浄にされてその測定誤差を少なく
し而もその測定結果により粉塵発生器7に設けた
粉塵タンクの9のフイーダ8は調整されて該発生
器7の粉塵の調整が極めて簡単且つ正確に行なわ
れ、その試験の信頼性を確保できる効果を有す
る。
(Effect of the invention) In this way, when the invention is applied, the compressor 1
A dehumidifier 3 connected to the dehumidifier 3, a dust generator 7 connected to the dehumidifier 3, and an electronic component testing chamber 10 connected to the generator 7.
and a measuring device 27 for measuring electronic components in the test chamber 10, and the dust generator 7 is provided with a dust tank 9 having an adjustable feeder 8, and the dehumidifier 3 is provided in the test chamber 10. Connected 1
Concentration measuring section 2 consisting of a light projector 20 and a light receiver 21 installed via a pair of air outlets 19, 19
2 is provided and a dust concentration measuring device 24 connected to the measuring section 22 is connected to the feeder 8. Therefore, in the test chamber 10, the dust concentration is measured by the simple measuring section 22, and the dust in the measuring section 22 is The dirt caused by this is cleaned by the dry air from the dehumidifier 3 through the spout ports 19, 19, thereby reducing the measurement error. is adjusted so that the dust in the generator 7 can be adjusted very easily and accurately, which has the effect of ensuring the reliability of the test.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す構成図、第2
図は計測プログラム処理のフロー・チヤートであ
る。 1……コンプレツサ、3……除湿器、7……粉
塵発生器、8……フイーダ、9……粉塵タンク、
10……試験室、19……噴出口、20……投光
器、21……受光器、22……測定部、24……
粉塵濃度測定器、27……計測器。
Fig. 1 is a configuration diagram showing one embodiment of the present invention;
The figure is a flow chart of measurement program processing. 1... Compressor, 3... Dehumidifier, 7... Dust generator, 8... Feeder, 9... Dust tank,
DESCRIPTION OF SYMBOLS 10... Test chamber, 19... Spout, 20... Emitter, 21... Light receiver, 22... Measurement part, 24...
Dust concentration measuring device, 27... Measuring device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] エアコンプレツサに連なる除湿器と、該除湿器
に連なる粉塵発生器と、該粉塵発生器に連なる電
子部品試験室と該電子部品試験室内の電子部品を
計測する計測器とからなり、前記粉塵発生器に調
整自在のフイーダを有する粉塵タンクを設けると
共に前記電子部品試験室に、前記除湿器に接続さ
れる1対の空気噴出口を介して設置される投光器
と受光器とからなる濃度測定部を設け、該測定部
に接続される粉塵濃度測定器を前記フイーダに接
続したことを特徴とする電子部品の粉塵環境試験
装置。
It consists of a dehumidifier connected to the air compressor, a dust generator connected to the dehumidifier, an electronic component testing room connected to the dust generator, and a measuring instrument for measuring electronic components in the electronic component testing room, and the dust generator is connected to the air compressor. A dust tank having an adjustable feeder is provided in the device, and a concentration measuring section consisting of a light emitter and a light receiver is installed in the electronic component testing room via a pair of air outlets connected to the dehumidifier. 1. A dust environment testing device for electronic components, characterized in that a dust concentration measuring device is provided and connected to the measuring section and connected to the feeder.
JP4059188U 1988-03-28 1988-03-28 Expired - Lifetime JPH0547415Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4059188U JPH0547415Y2 (en) 1988-03-28 1988-03-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4059188U JPH0547415Y2 (en) 1988-03-28 1988-03-28

Publications (2)

Publication Number Publication Date
JPH01142869U JPH01142869U (en) 1989-09-29
JPH0547415Y2 true JPH0547415Y2 (en) 1993-12-14

Family

ID=31267059

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4059188U Expired - Lifetime JPH0547415Y2 (en) 1988-03-28 1988-03-28

Country Status (1)

Country Link
JP (1) JPH0547415Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140000904A (en) * 2012-06-26 2014-01-06 삼성전기주식회사 Particle dispersion device

Also Published As

Publication number Publication date
JPH01142869U (en) 1989-09-29

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