JPH0541506A - Solid-state image sensing device provided with microlens - Google Patents

Solid-state image sensing device provided with microlens

Info

Publication number
JPH0541506A
JPH0541506A JP3222193A JP22219391A JPH0541506A JP H0541506 A JPH0541506 A JP H0541506A JP 3222193 A JP3222193 A JP 3222193A JP 22219391 A JP22219391 A JP 22219391A JP H0541506 A JPH0541506 A JP H0541506A
Authority
JP
Japan
Prior art keywords
microlens
solid
state image
refractive index
image sensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3222193A
Other languages
Japanese (ja)
Inventor
Yukinobu Wataya
行展 綿谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP3222193A priority Critical patent/JPH0541506A/en
Publication of JPH0541506A publication Critical patent/JPH0541506A/en
Pending legal-status Critical Current

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  • Solid State Image Pick-Up Elements (AREA)

Abstract

PURPOSE:To provide a simply manufactured solid-state image sensing device which is provided with a microlens and the effect of the microlens is not spoiled even with a molded package. CONSTITUTION:A solid-state image sensing device provided with a microlens is composed of the following: a solid-state image sensing element 1 which is mounted on a lead frame 2 and which has been wired by means of wires 3; a microlens 4 installed on the surface of the solid-state image sensing element 1; and a transparent resin 6 which seals the element and the microlens integrally. In the solid-state image sensing element, a resin layer 5 whose refractive index is low is formed on the surface of the microlens 4. A glass plate 7 is installed on the surface of the resin layer 5, and the surface of the glass plate 7 is exposed from the integrally sealed transparent resin 6.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、固体撮像素子の上面に
マイクロレンズを設け、透明樹脂にて一体封止したマイ
クロレンズ付固体撮像装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid-state image pickup device with a microlens, which is provided with a microlens on the upper surface of a solid-state image pickup device and is integrally sealed with a transparent resin.

【0002】[0002]

【従来の技術】従来、マイクロレンズ付固体撮像装置の
パッケージとして、中空型パッケージがある。これは、
セラミック等のケースに固体撮像素子を搭載し、その上
面にマイクロレンズを設けて気密封止したものである。
しかし、製造工程が簡易で、かつ低コストであるという
観点から、図5に示すようなモールド型パッケージが提
案される。これは、リードフレーム2上に搭載し、ワイ
ヤー3にて配線した固体撮像素子1と、この固体撮像素
子1の上面に設けたマイクロレンズ4とを透明樹脂6に
て一体封止した構造である。このマイクロレンズ4は、
図6に示すように固体撮像素子1の各受光画素11の上
面に微小な半球状の凸レンズを各々配列したもので、マ
イクロレンズ4の屈折率n1 と透明樹脂6の屈折率n2
との差により図中矢印のごとく入射光を集束するもので
ある。
2. Description of the Related Art Conventionally, there is a hollow package as a package of a solid-state image pickup device with a microlens. this is,
A solid-state image sensor is mounted on a case such as ceramic, and a microlens is provided on the upper surface of the case to hermetically seal it.
However, from the viewpoint of simple manufacturing process and low cost, a mold type package as shown in FIG. 5 is proposed. This is a structure in which a solid-state image sensor 1 mounted on a lead frame 2 and wired by wires 3 and a microlens 4 provided on the upper surface of the solid-state image sensor 1 are integrally sealed with a transparent resin 6. .. This micro lens 4
Obtained by each array minute hemispherical lens on the upper surface of the light receiving pixel 11 of the solid-state imaging device 1 as shown in FIG. 6, the refractive index n 2 of the refractive index n 1 and the transparent resin 6 of the microlens 4
The incident light is focused as indicated by the arrow in the figure due to the difference between and.

【0003】[0003]

【発明が解決しようとする課題】しかし、このマイクロ
レンズを設けたモールド型パッケージには以下の問題が
ある。すなわち、図5、図6に示すようにマイクロレン
ズ4の設けられた固体撮像素子1を透明樹脂6で一体封
止すると、マイクロレンズ4の上方が直接透明樹脂6で
覆われることになる。この状態において、マイクロレン
ズ4の屈折率n1 と透明樹脂6の屈折率n2 との差が小
さいと、マイクロレンズ4による光の集束効果が十分に
得られない。すなわち、このマイクロレンズ4を設けた
モールド型パッケージの集光率は、マイクロレンズ4の
上方が空気層である中空型パッケージの集光率に比べて
半分以下になってしまう。また、モールド型パッケージ
の構造において、マイクロレンズ4の上方に空気層を設
けることが考えられるが、これには煩雑な工程が必要に
なり、コストアップにつながる。よって、本発明は、モ
ールド型パッケージであっても、マイクロレンズの効果
が損なわれず、かつ製造が簡易なマイクロレンズ付固体
撮像装置を提供することを目的とする。
However, the mold type package provided with this microlens has the following problems. That is, when the solid-state imaging device 1 provided with the microlens 4 as shown in FIGS. 5 and 6 is integrally sealed with the transparent resin 6, the upper part of the microlens 4 is directly covered with the transparent resin 6. In this state, when the difference between the refractive index n 2 of the refractive index n 1 and the transparent resin 6 of the microlens 4 is small, the focusing effect of the light can not be sufficiently obtained by the microlens 4. That is, the light collection rate of the mold package provided with the microlenses 4 is less than half the light collection rate of the hollow package in which the air above the microlenses 4 is the air layer. Further, in the structure of the mold type package, it is conceivable to provide an air layer above the microlens 4, but this requires a complicated process, leading to an increase in cost. Therefore, it is an object of the present invention to provide a microlens-equipped solid-state imaging device that does not impair the effect of the microlens and is easy to manufacture even in a mold-type package.

【0004】[0004]

【課題を解決するための手段】本発明は、前記の課題を
解決するために成されたマイクロレンズ付固体撮像装置
である。すなわち、リードフレーム上に搭載され、かつ
ワイヤーにて配線された固体撮像素子と、この固体撮像
素子の上面に設けられたマイクロレンズとを一体封止し
た透明樹脂とから成るマイクロレンズ付固体撮像装置で
あって、マイクロレンズの上面に、このマイクロレンズ
より屈折率の低い樹脂層を設けたものである。さらに、
この樹脂層の上面にガラス板を設け、このガラス板の表
面を一体封止した透明樹脂から露出させたものである。
The present invention is a solid-state image pickup device with a microlens, which has been made to solve the above problems. That is, a solid-state imaging device with a microlens including a solid-state imaging device mounted on a lead frame and wired by a wire, and a transparent resin integrally sealing a microlens provided on the upper surface of the solid-state imaging device. The resin layer having a lower refractive index than the microlens is provided on the upper surface of the microlens. further,
A glass plate is provided on the upper surface of the resin layer, and the surface of the glass plate is exposed from the integrally sealed transparent resin.

【0005】[0005]

【作用】マイクロレンズの屈折率(n1 )より低い屈折
率(n3)の樹脂層がこのマイクロレンズの上面に設け
られているので、入射光は透明樹脂の屈折率(n2 )に
影響されず、樹脂層の屈折率(n3 )とマイクロレンズ
の屈折率(n1 )との差により効率よく集束され受光画
素に取り込まれる。また、この樹脂層の上面にガラス板
を設けても、入射光はこのガラス板の屈折率(n4 )に
影響されず、マイクロレンズの屈折率(n1 )とこのマ
イクロレンズの上面に設けられた樹脂層の屈折率
(n3 )との差により効率よく集束されることになる。
Since the resin layer having a refractive index (n 3 ) lower than the refractive index (n 1 ) of the microlens is provided on the upper surface of the microlens, the incident light affects the refractive index (n 2 ) of the transparent resin. Sarezu, incorporated into the light receiving pixels is focused efficiently by the difference between the refractive index (n 1) of the refractive index of the resin layer (n 3) and microlenses. Even if a glass plate is provided on the upper surface of the resin layer, the incident light is not affected by the refractive index (n 4 ) of the glass plate, and the refractive index (n 1 ) of the microlens and the upper surface of the microlens are provided. Due to the difference from the refractive index (n 3 ) of the resin layer thus obtained, the resin layer is efficiently focused.

【0006】[0006]

【実施例】以下、本発明の実施例を図に基づいて説明す
る。図1は本発明を説明する概略断面図であり、図2は
図1のマイクロレンズ部分の拡大断面図である。図1に
示すように、固体撮像素子1は、リードフレーム2上に
搭載されており、ワイヤー3にて配線されている。この
固体撮像素子1の上面にはポリイミド等で形成されたマ
イクロレンズ4が設けられており、入射光を集束する働
きをしている。また、マイクロレンズ4の上面には、こ
のマイクロレンズ4より屈折率の低い樹脂層5が設けら
れており、マイクロレンズ4の集束効果を高めている。
そして、これら全体をトランスファーモールド法等によ
り透明樹脂6にて一体封止する構造になっている。
Embodiments of the present invention will be described below with reference to the drawings. 1 is a schematic sectional view for explaining the present invention, and FIG. 2 is an enlarged sectional view of a microlens portion of FIG. As shown in FIG. 1, the solid-state imaging device 1 is mounted on a lead frame 2 and wired by wires 3. A microlens 4 made of polyimide or the like is provided on the upper surface of the solid-state imaging device 1 and serves to focus incident light. A resin layer 5 having a lower refractive index than the microlens 4 is provided on the upper surface of the microlens 4 to enhance the focusing effect of the microlens 4.
The entire structure is integrally sealed with the transparent resin 6 by a transfer molding method or the like.

【0007】図2に示すように、マイクロレンズ4は固
体撮像素子1に形成されている受光画素11の上面に微
小な凸レンズを各々配列したものである。このマイクロ
レンズ4の上面に設けられた低屈折率の樹脂層5は、例
えばプラスチック光ファイバのクラッド部に用いられる
ポリメタクリル酸メチル(PMMA)にフッ素ポリマー
を添加したものである。これをマイクロレンズ4の上面
に塗布し、スピンコート等により表面を平坦にして樹脂
層5を形成している。この樹脂層5の屈折率n3 とマイ
クロレンズ4の屈折率n1 との関係はn1 >n3 になっ
ており、これらの屈折率の差(n1−n3 )はマイクロ
レンズ4の屈折率n1 と透明樹脂6の屈折率n2 との差
(n1 −n2 )より大きくなっている。したがって、マ
イクロレンズ4の上面を直接透明樹脂6が覆っている場
合に比べ、入射光は効率よく集束して図中矢印のように
受光画素11に取り込まれることになる。
As shown in FIG. 2, the microlens 4 is formed by arranging minute convex lenses on the upper surface of the light receiving pixel 11 formed in the solid-state image pickup device 1. The resin layer 5 having a low refractive index provided on the upper surface of the microlens 4 is formed by adding a fluoropolymer to polymethylmethacrylate (PMMA) used for the clad portion of a plastic optical fiber, for example. This is applied on the upper surface of the microlens 4, and the resin layer 5 is formed by flattening the surface by spin coating or the like. The relationship between the refractive index n 3 of the resin layer 5 and the refractive index n 1 of the microlens 4 is n 1 > n 3 , and the difference (n 1 −n 3 ) between these refractive indices is It is larger than the difference (n 1 −n 2 ) between the refractive index n 1 and the refractive index n 2 of the transparent resin 6. Therefore, as compared with the case where the transparent resin 6 directly covers the upper surface of the microlens 4, the incident light is efficiently focused and taken into the light receiving pixel 11 as indicated by an arrow in the figure.

【0008】具体的な一例として、マイクロレンズ4の
屈折率n1 が約1.8のポリイミドを、樹脂層5の屈折
率n3 が約1.3のフッ素ポリマー添加樹脂(PMM
A)を、透明樹脂6の屈折率n2 が約1.55の熱硬化
性樹脂を使用した場合、このマイクロレンズ4の集光率
は、透明樹脂6がマイクロレンズ4の上面を直接覆って
いる場合に比べ約30%向上することになる。
As a concrete example, a polyimide having a refractive index n 1 of the microlens 4 of about 1.8 and a fluoropolymer-added resin (PMM) having a refractive index n 3 of the resin layer 5 of about 1.3 are used.
When a thermosetting resin having a refractive index n 2 of the transparent resin 6 of about 1.55 is used in A), the condensing rate of the microlens 4 is such that the transparent resin 6 directly covers the upper surface of the microlens 4. It will be improved by about 30% compared to the case where there is.

【0009】図3に本発明の他の実施例を説明する概略
断面図を、図4に他の実施例のマイクロレンズ部分の拡
大断面図を示す。図3に示すように、固体撮像素子1が
リードフレーム2上に搭載され、ワイヤー3にて接続さ
れている。この固体撮像素子1の上面には、前記実施例
同様マイクロレンズ4が設けられ、さらにこのマイクロ
レンズ4の上面に樹脂層5が形成されている。そして、
この樹脂層5の上面に設けられたガラス板7の表面が一
体封止した透明樹脂6から露出する状態になっている。
したがって、図4に示すように、マイクロレンズ4の上
面に樹脂層5が設けられているので、入射光はガラス板
7の屈折率n4 に影響されず、樹脂層5の屈折率n3
マイクロレンズ4の屈折率n1 との差により、図中矢印
のように集束して受光画素11に取り込まれることにな
る。
FIG. 3 shows a schematic sectional view for explaining another embodiment of the present invention, and FIG. 4 shows an enlarged sectional view of a microlens portion of another embodiment. As shown in FIG. 3, the solid-state imaging device 1 is mounted on a lead frame 2 and connected by wires 3. The microlens 4 is provided on the upper surface of the solid-state image pickup device 1 as in the above-described embodiment, and the resin layer 5 is further formed on the upper surface of the microlens 4. And
The surface of the glass plate 7 provided on the upper surface of the resin layer 5 is exposed from the integrally sealed transparent resin 6.
Accordingly, as shown in FIG. 4, the resin layer 5 on the upper surface of the microlens 4 is provided, the incident light is not affected by the refractive index n 4 of the glass plate 7, and the refractive index n 3 of the resin layer 5 Due to the difference from the refractive index n 1 of the microlens 4, the light is focused and taken into the light receiving pixel 11 as shown by the arrow in the figure.

【0010】このガラス板7は、一体封止に用いる透明
樹脂6より不純物の混入が少ないので光の透過性がよ
い。したがって、このガラス板7を使用すれば受光感度
や画質が向上する。さらに、ガラス板7の表面が平坦で
あるので、透明樹脂6にて一体封止した後、この透明樹
脂6の表面を鏡面研磨する必要がない。また本実施例で
は、ガラス板7が露出している面から光が入射して固体
撮像素子1まで到達する構造なので、一体封止する樹脂
として透光性の樹脂に限定されることがない。したがっ
て、不透光性の樹脂にて一体封止すれば、ガラス板7以
外から進入して映像に悪影響を及ぼす光を遮断すること
が可能となる。
Since the glass plate 7 contains less impurities than the transparent resin 6 used for the integral sealing, it has a good light transmission property. Therefore, if the glass plate 7 is used, the light receiving sensitivity and the image quality are improved. Further, since the surface of the glass plate 7 is flat, it is not necessary to mirror-polish the surface of the transparent resin 6 after integrally sealing with the transparent resin 6. In addition, in the present embodiment, since the light enters from the surface where the glass plate 7 is exposed and reaches the solid-state imaging device 1, the resin that is integrally sealed is not limited to the translucent resin. Therefore, if it is integrally sealed with a non-translucent resin, it is possible to block light that enters from other than the glass plate 7 and adversely affects the image.

【0011】[0011]

【発明の効果】以上説明したように、本発明のマイクロ
レンズ付固体撮像装置によれば、以下のような効果があ
る。すなわち、透明樹脂の屈折率とマイクロレンズの屈
折率との差が小さいモールド型パッケージであっても、
マイクロレンズの上面に形成された、このマイクロレン
ズより屈折率の低い樹脂層を設けることにより、入射光
は効率よく集束され受光画素に取り込まれることにな
る。したがって、マイクロレンズの上方に空気層を設け
ることなく、簡易な工程で受光感度を向上させることが
でき、さらにコストダウンも可能となる。
As described above, the solid-state image pickup device with a microlens of the present invention has the following effects. That is, even in the case of a mold type package in which the difference between the refractive index of the transparent resin and the refractive index of the microlens is small,
By providing a resin layer formed on the upper surface of the microlens and having a refractive index lower than that of the microlens, incident light is efficiently focused and taken into the light receiving pixels. Therefore, the light receiving sensitivity can be improved in a simple process without providing an air layer above the microlens, and the cost can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明を説明する概略断面図である。FIG. 1 is a schematic sectional view illustrating the present invention.

【図2】本発明のマイクロレンズ部分の拡大断面図であ
る。
FIG. 2 is an enlarged sectional view of a microlens portion of the present invention.

【図3】本発明の他の実施例を説明する概略断面図であ
る。
FIG. 3 is a schematic sectional view illustrating another embodiment of the present invention.

【図4】他の実施例のマイクロレンズ部分の拡大断面図
である。
FIG. 4 is an enlarged cross-sectional view of a microlens portion of another embodiment.

【図5】従来例のモールド型パッケージを説明する概略
断面図である。
FIG. 5 is a schematic cross-sectional view illustrating a conventional mold-type package.

【図6】従来例のマイクロレンズ部分の拡大断面図であ
る。
FIG. 6 is an enlarged cross-sectional view of a microlens portion of a conventional example.

【符号の説明】[Explanation of symbols]

1 固体撮像素子 2 リードフレーム 3 ワイヤー 4 マイクロレンズ 5 樹脂層 6 透明樹脂 1 Solid-state image sensor 2 Lead frame 3 Wire 4 Micro lens 5 Resin layer 6 Transparent resin

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 リードフレーム上に搭載され、かつワイ
ヤーにて配線された固体撮像素子と、前記固体撮像素子
の上面に設けられたマイクロレンズとを一体封止した透
明樹脂とから成るマイクロレンズ付固体撮像装置であっ
て、 前記マイクロレンズの上面に同マイクロレンズより屈折
率の低い樹脂層を設けたことを特徴とするマイクロレン
ズ付固体撮像装置。
1. A microlens comprising a solid-state imaging device mounted on a lead frame and wired by a wire, and a transparent resin integrally sealing a microlens provided on an upper surface of the solid-state imaging device. A solid-state imaging device having a microlens, wherein a resin layer having a refractive index lower than that of the microlens is provided on an upper surface of the microlens.
【請求項2】 前記樹脂層の上面にガラス板を設け、か
つ前記ガラス板の表面が前記一体封止した透明樹脂から
露出していることを特徴とする請求項1記載のマイクロ
レンズ付固体撮像装置。
2. A solid-state imaging device with a microlens according to claim 1, wherein a glass plate is provided on an upper surface of the resin layer, and a surface of the glass plate is exposed from the integrally sealed transparent resin. apparatus.
JP3222193A 1991-08-06 1991-08-06 Solid-state image sensing device provided with microlens Pending JPH0541506A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3222193A JPH0541506A (en) 1991-08-06 1991-08-06 Solid-state image sensing device provided with microlens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3222193A JPH0541506A (en) 1991-08-06 1991-08-06 Solid-state image sensing device provided with microlens

Publications (1)

Publication Number Publication Date
JPH0541506A true JPH0541506A (en) 1993-02-19

Family

ID=16778612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3222193A Pending JPH0541506A (en) 1991-08-06 1991-08-06 Solid-state image sensing device provided with microlens

Country Status (1)

Country Link
JP (1) JPH0541506A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583438B1 (en) 1999-04-12 2003-06-24 Matsushita Electric Industrial Co., Ltd. Solid-state imaging device
KR100623344B1 (en) * 2000-06-30 2006-09-11 매그나칩 반도체 유한회사 Chip Scale Package of Image Sensor
JP2007142207A (en) * 2005-11-18 2007-06-07 Matsushita Electric Ind Co Ltd Solid-state image pickup device, and manufacturing method thereof
US7479627B2 (en) 2006-02-09 2009-01-20 Fujitsu Microelectronics Limited Semiconductor device having transparent member and manufacturing method of the same
US7767485B2 (en) 2008-08-01 2010-08-03 Kabushiki Kaisha Toshiba Solid-state imaging device and method for manufacturing same
US8411197B2 (en) 2004-06-15 2013-04-02 Fujitsu Semiconductor Limited Image pickup device and production method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583438B1 (en) 1999-04-12 2003-06-24 Matsushita Electric Industrial Co., Ltd. Solid-state imaging device
US6831311B2 (en) 1999-04-12 2004-12-14 Matsushita Electric Industrial Co., Ltd. Solid-state imaging device
KR100623344B1 (en) * 2000-06-30 2006-09-11 매그나칩 반도체 유한회사 Chip Scale Package of Image Sensor
US8411197B2 (en) 2004-06-15 2013-04-02 Fujitsu Semiconductor Limited Image pickup device and production method thereof
JP2007142207A (en) * 2005-11-18 2007-06-07 Matsushita Electric Ind Co Ltd Solid-state image pickup device, and manufacturing method thereof
US7479627B2 (en) 2006-02-09 2009-01-20 Fujitsu Microelectronics Limited Semiconductor device having transparent member and manufacturing method of the same
US7767485B2 (en) 2008-08-01 2010-08-03 Kabushiki Kaisha Toshiba Solid-state imaging device and method for manufacturing same

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