JPH0540882U - Measuring instrument probe - Google Patents

Abstract

(57) [Abstract] [Purpose] An object of the present invention is to obtain a probe for a measuring instrument in which a contact at the tip of the probe is improved so that measurement can be performed according to the state of a measured portion such as an electronic circuit connector. A probe for a measuring instrument having a conductive contactor at a tip of a probe body 1, a needle-like contactor 3 which is electrically connected to the inside of the probe body 1 and fixed to a conductive portion 2 exposed at the tip, and the needle. Consisting of a pair of holding parts 4 and 5 which are mounted so as to be openable and closable right and left centering on the contact 3
A probe for a measuring instrument, characterized in that the tip portions 4a, 5a of the holding portions 4, 5 can be opened and closed by operating a knob 6 installed on the probe body 1.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a probe for a measuring instrument used in an electronic measuring instrument such as an oscilloscope, and more particularly, to an improvement of a probe tip portion capable of performing measurement according to the state of a measured portion such as an electronic circuit connector.

[0002]

[Prior Art]

 Generally, when measuring a signal of an electronic circuit using an oscilloscope or the like using a probe, attach a contact at the tip of the probe to the measured part such as the lead part of the electronic part to be measured or the terminal on the circuit. Measurement is performed by pressing.

Conventionally, various types of tip contacts of this kind of measuring instrument probe have been proposed. For example, as shown in Japanese Patent Application No. 2-99684, which is the prior application of the present applicant. There is known a needle-shaped contactor in which the tip of the wiring material coating is pierced to establish electrical connection with a required portion.

[0004]

[Problems to be solved by the device]

 However, recently, the lead parts of electronic parts, terminals on circuits, etc. to be measured have less exposed parts due to high-density mounting of integrated circuit elements and downsizing of printed circuit boards, and the probe tip Since the insertion space of the contactor etc. is narrow, it is not possible to pierce the tip of the needle-shaped contactor into the wiring material coating for measurement with the above-mentioned conventional tip contactor shape, or to directly contact the contactor. There was a problem that it could not be pressed against the terminals of the measurement section, making it difficult to observe and measure signals quickly and reliably.

The object of the present invention is to solve the above-mentioned conventional problems, and to improve the structure of the probe tip contactor to improve the condition of the measured part such as the connector for electronic circuits. In order to obtain a probe for a measuring instrument which can measure according to.

[0006]

[Means for Solving the Problems]

 In order to achieve this object, the present invention provides a probe for a measuring instrument having a conductive contact at the tip of a probe body, which is electrically connected to the inside of the probe body and fixed to a conductive part exposed at the tip. It consists of a contactor and a pair of hold parts that can be opened and closed left and right around this needle-like contactor.The tip of the hold part is operated by operating a knob installed on the probe body. It is characterized by being configured to open and close.

[0007]

[Action]

 Based on such a configuration, according to the probe for a measuring instrument of the present invention, the tip of the probe main body can be brought into contact with the measured portion of the electronic measuring instrument, and the wiring material coating of the measured portion. Alternatively, a holding part capable of detachably sandwiching a terminal fixing the wiring member is provided, and the holding part is configured to be opened and closed by operating a knob provided at the rear end of the probe body. Therefore, when measuring the signal of an electronic circuit using the above probe, press the contact at the tip of the probe against the measured part such as the lead part of the electronic part to be measured or the terminal on the circuit. While touching and touching, push the knob on the back of the probe body to open the hold part, sandwich the wiring material coating of the measured part with this hold part, and release the finger pressing the knob to close the hold part. It is. When removing the probe, push the knob on the back of the probe body again to open the hold part, open the pinching of the wiring material coating, and pull the tip contact from the part to be measured. Therefore, since the contactor at the tip of the probe can be easily attached to and detached from the part to be measured, quick and reliable signal observation and measurement can be performed.

[0008]

【Example】

 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

FIGS. 1 and 2 show a probe according to a first embodiment of the present invention. In the drawings, reference numeral 1 is a pen having a predetermined circuit element and a switching button 1a built-in and an insulating coating pen. The probe body 2 of the mold is a conductive portion that is electrically connected to the inside of the probe body 1 and is exposed at the tip. A needle-shaped contactor 3 capable of contacting a contact surface of a portion to be measured such as a terminal is integrally fixed to the conductive portion 2 of the probe body 1, and the tip of the conductive portion 2 has a needle-shaped contact. Hold parts 4 and 5 which can be opened and closed to the left and right around the child 3 are attached.

The needle-shaped contactor 3 is attached so as to be inclined with respect to the axis of the probe main body 1 in the direction in which the tip is open, and pierces the wiring material coating of the measured portion or fixes the wiring material. It can be inserted into the space of the terminal. Further, the tip portions 4a and 5a of the holding portions 4 and 5 attached to the tip portions of the conductive portions 2 are formed in a hook shape curved inwardly facing each other, and a wiring material coating or the like can be detachably attached. It can be clamped.

FIG. 4 and FIG. 5 are cross-sectional views showing an embodiment of a specific internal structure of the probe of the present invention, wherein the tip portions 4a and 5a of the holding portions 4 and 5 are the rear ends of the probe body 1. By pushing the knob 6 installed in the portion forward, the spring member 1c is pushed in and opened via the link rod passing through the inside of the probe body 1, and the pushing force of the knob 6 is released to close it. Further, although not shown, the needle-shaped contactor 3 is configured to be detachably attached to the tip portion 1b of the probe main body 1, so that the needle-shaped contactor 3 can be attached according to the shape of the measured portion. By changing the length and shape, the range of the measured part is expanded.

Next, the operation of the embodiment thus configured will be described with reference to FIG. First, when measuring a signal of an electronic circuit using a probe, the needle-shaped contactor 3 at the tip of the probe is attached to the measured portion 21 such as the lead portion of the electronic component to be measured or the terminal 20 on the circuit. Stab or press to bring them into contact, and push in the knob 6 at the rear of the probe body 1 to open the tips 4a and 5a of the hold sections 4 and 5, and use the tips 4a and 5a of the hold sections 4 and 5 to cover them. When the wiring material coating 22 of the measuring portion 21 is sandwiched and the finger pressing the knob 6 is released, the tip portions 4a, 5a of the holding portions 4, 5 are closed and fixed. When the probe is to be removed, the front ends 4a and 5a of the hold parts 4 and 5 are opened by pushing the knob 6 at the rear part of the probe body 1 again, so that the tip end contactor 3 is detached from the measured part 21 and removed. be able to.

In the above description, the knob 6 is installed at the rear end portion of the probe body 1, but the present invention is not limited to this, and the probe body 1 is installed at a position where it can be easily operated. You may.

[0014]

[Effect of the device]

 As described in detail above, according to the probe for a measuring instrument of the present invention, the tip of the probe main body is provided with a contact for contacting the measured portion of the electronic measuring instrument and the wiring material coating or wiring material of the measured portion. It is equipped with a hold part that can removably sandwich the terminal that holds the probe.The hold part can be opened and closed by operating the knob provided at the rear end of the probe body. When measuring signals in the electronic circuit with a probe, press the contact at the tip of the probe against the part to be measured such as a terminal to bring it into contact, and push the knob at the rear of the probe body to open the hold part. The wire covering of the measured part is sandwiched between the parts, and the hold part is closed and fixed when the finger pressing the knob is released. When removing the probe, the knob at the rear of the probe body can be pushed in again to open the hold part, and the tip contactor can be detached from the part to be measured. Therefore, the contact at the tip of the probe can be easily attached and detached according to the state of the portion to be measured, so that quick and reliable signal observation and measurement can be performed.

[Brief description of drawings]

FIG. 1 is a top view showing a probe according to a first embodiment of the present invention.

FIG. 2 is a side view of FIG.

FIG. 3 is a side view showing a state in which a tip contact of the probe according to the present invention is fixed to a portion to be measured.

FIG. 4 is a sectional view showing an embodiment of the internal structure of the probe according to the present invention.

5 is a side cross-sectional view showing the main part of the tip of FIG.

[Explanation of symbols]

 1 Probe body 2 Conductive part 3 Needle-like contactor 4 Hold part 4a Tip part 5 Hold part 5a Tip part 6 Knob

Claims (1)

[Scope of utility model registration request] 1. A probe for a measuring instrument having a conductive contact at the tip of a probe body, and a needle contact fixed to a conductive portion exposed at the tip of the probe body, the needle contact being electrically connected to the inside of the probe body. It is composed of a pair of holding parts mounted so as to be openable and closable left and right around the child, and the tip part of the holding part is configured to be opened and closed by operating a knob installed in the probe body. Measuring instrument probe.