JPH0536354U - Product defect inspection device - Google Patents

Abstract

(57) [Summary] [Purpose] The purpose is to improve inspection accuracy. A structure is provided in which an object to be inspected 2 having a layer through which light can be transmitted is irradiated with light, the transmitted light is captured as an image in an image section 3 and is output as an image signal, and the image signal is processed to be inspected. A product defect inspection device for inspecting a defect of an object 2, wherein a light source 1 is provided with an irradiation optical waveguide 4 for guiding the light emitted by the light source 1 to the object to be inspected 2, and an image portion 3 is provided with transmitted light from the object to be inspected 2. Is provided, the light emitted from the light source 1 is irradiated onto the inspection object 2 through the irradiation optical waveguide 4, and the transmission light from the inspection object 2 is imaged through the transmission optical waveguide 5. Lead to Part 3.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a product defect inspection apparatus, and more particularly to a product defect inspection apparatus capable of accurately performing defect determination.

[0002]

[Prior Art and Problems to be Solved]

 2. Description of the Related Art Conventionally, as a product defect inspection apparatus for inspecting whether or not there is a defect in an inspection object, one using reflected light as shown in FIG. 4 is known.

This product defect inspection apparatus includes a light source 51 for illumination that irradiates the surface of the inspection object 52 with light, an image section 53 that receives the light reflected by the surface of the inspection object 52, and this image section. It comprises a defect determination device (not shown) such as a personal computer connected to 53.

In the product defect inspection device configured as described above, the object 52 to be inspected is irradiated with uniform light from the light source 51 for illumination, and the light reflected on the surface of the object 52 to be inspected is imaged. The unit 53 receives and detects the surface state of the inspected object 52 by the output of the image section 53 to inspect the product as the inspected object 52 for defects.

In addition, the inspection object 52 is an inspection object having a layer through which light can pass, for example, an inspection object 52 in which a resin layer 52b through which light can pass is laminated with a rubber material 52a as shown in FIG. In some cases, the boundary between the resin layer 52b that allows light to pass through and the rubber material 52a is used as the inspection surface 59, and the defect detection of the product as the inspection object 52 is performed by the image signal output of the image section 53.

However, in the conventional product defect inspection apparatus, the output of the image signal of the image section 53 does not indicate the difference in the material but the output indicating the unevenness of the surface. Therefore, when the unevenness of the surface is the same. Does not change the output of the image signal of the image part 53, and cannot distinguish the boundary between the resin layer 52b and the rubber material 52a which can transmit light on the inspection surface 59. It had a problem that it could not detect defects.

This invention solves the above-mentioned problems of the conventional ones, and detects a defect of an object to be inspected having a layer through which light can be transmitted, regardless of the unevenness of the inspection surface. It is an object of the present invention to provide a product defect inspection device capable of performing the above.

[0008]

[Means for Solving the Problems]

 In order to achieve the above object, the present invention irradiates an object to be inspected having a layer through which light can be transmitted, captures the transmitted light as an image in an image section, and outputs it as an image signal. A product defect inspection device that processes signals to inspect for defects in an inspected object, wherein a light source is provided with an irradiation optical waveguide that guides the light emitted by the light source to the inspected object, and the image part A transmission light guide that guides the transmitted light is provided, and the light emitted from the light source is applied to the inspection object through the irradiation light waveguide, and the transmission light from the inspection object is guided to the image portion through the transmission light waveguide. This means is adopted.

[0009]

[Action]

 This device adopts the above-mentioned means, and when light is irradiated from the light source to the inspection surface of the inspection object through the irradiation optical waveguide, this light is absorbed or reflected by the non-transmissive layer and transmitted. Is transmitted in the layer having. Then, the light transmitted through the transparent layer is received by the image section through the transmission optical waveguide located at a predetermined distance from the irradiation optical waveguide, and converted into an image signal by the image section. By successively comparing this image signal with the reference signal, it is possible to inspect the object to be inspected for defects.

[0010]

【Example】

 An embodiment of the present invention shown in the drawings will be described below. 1 to 3 show an embodiment of a product defect inspection apparatus according to the present invention, and FIG. 1 shows an overall view of the product defect inspection apparatus.

This product defect inspection apparatus detects a light source 1, an irradiation optical waveguide 4 that irradiates the inspection object 2 with light from the light source 1 as parallel rays, and detects the light as an image and outputs it as an image signal. The image section 3 and the transmission optical waveguide 5 for guiding the light transmitted through the inspection object 2 to the image section 3 are provided.

The irradiation optical waveguide 4 includes an irradiation optical fiber 4a connected to the light source 1, and the irradiation optical fiber 4a is bifurcated on the way, and a light guide 4b is provided at each tip. And 4b.

Further, the transmission optical waveguide 5 has a tubular shape with a small diameter at its tip portion and serves as a light shielding plate for scattered light.

Further, the image section 3 is connected to a defect determination device 7 including a personal computer or the like via a peripheral device 6. The defect determination device 7 is configured to perform defect determination by comparing the image signal sent from the image section 3 with the reference signal stored in the defect determination device 7.

The object 2 to be inspected in this embodiment is a bladder used for an accumulator, and the bladder has a bowl shape with a raised central portion, and is provided between the rubber material 2a and the rubber material 2a. Has a laminated structure in which a resin layer 2b, which is a permeable layer, is formed. The inspection object 2 is installed on the table 8a of the rotating jig 8 and is rotatable.

Then, as shown in FIG. 2, the tip of the transmission optical waveguide 5 is made to face the resin layer 2b on the inspection surface 9 at the peripheral portion of the bladder which is the inspection object 2. The light guide 4b provided at the tip of the irradiation optical waveguide 4 is opposed to the resin layer 2b of the inspection surface 9 of the bladder with a distance of 10 mm between the light guide 4b and the tip of the transmission optical waveguide 5.

Next, the operation of the product defect inspection device configured as described above will be described below. First, the light source 1 is operated to irradiate the inspection surface 9 of the inspection object 2 with light from the light guide 4b through the irradiation optical fiber 4a.

At this time, as shown in FIG. 3, the light radiated to the part indicated by the broken line ellipse passes through the resin layer 2b like the chain line, and the light radiated to the rubber material 2a is changed to the rubber material 2a. Is not transparent to light, it is absorbed by the rubber material 2a or is reflected by the surface of the rubber material 2a. Then, the light transmitted through the resin layer 2b is received by the image section 3 through the transmission optical waveguide 5 located in the portion indicated by the broken line circle in FIG. 3, and converted into an image signal by the image section 3. And is sent to the defect determination device 7 via the peripheral device 6.

The defect determination device 7 determines a defect by comparing the image signal with the reference signal, and inspects the product for defects.

Further, the rotating jig 8 is rotated to rotate the bladder, which is the inspection object 2, and the light guide 4 b of the irradiation optical waveguide 4 and the transmission optical waveguide 5 are arranged along the resin layer 2 b of the inspection surface 9. Move the tip and. Then, by sequentially comparing the image signal with the reference signal, it is possible to efficiently inspect the defect of the bladder as the inspection object 2.

Further, the configuration is such that the light transmitted through the resin layer 2b is detected to inspect the product for defects, and the irradiation optical waveguide 4 and the transmission optical waveguide 5 are separated from each other by a predetermined distance so that the inspection surface 9 is covered. By arranging them, the difference between the light transmittance and the absorptance appears as the difference in the output of the image signal, the contrast between the rubber material 2a and the resin layer 2b becomes clear, and the difference between the materials is captured as an image. Since it is possible to make a distinction, the accuracy of the product defect judgment is improved. That is, the resin layer 2b outputs a large image signal, and the rubber material 2a outputs a small image signal.

Further, since the irradiation optical waveguide 4 is provided between the inspection object 2 and the light source 1, the light leakage from the light source 1 is eliminated, and the light is accurately applied to the target portion of the inspection surface 9. In addition, even if the same light source as the conventional one is used, its intensity becomes stronger than the conventional one. In addition, since the transmission optical waveguide 5 is provided between the image part 3 and the inspection object 2, Since the incoming light can be directly transmitted to the image section 3, the influence of irregular reflection or scattered light is eliminated, and the defect of the product can be accurately inspected regardless of the unevenness of the inspection surface 9.

In this embodiment, the irradiation optical waveguide 4 is bifurcated and is positioned so as to face the inspection surface 9 with the transmission optical waveguide 5 sandwiched therebetween. However, the present invention is not limited to this. It is also possible to position the irradiation optical waveguide 4 and the transmission optical waveguide 5 so as to be opposed to the inspection surface 9 with a predetermined interval, with the number 4 being one. In addition, in this embodiment, the resin layer 2a is used as the light permeable layer, but the material is not limited to the transparent material such as a rubber material. Further, it is needless to say that the object to be inspected can be applied to various objects other than the bladder shown in the above embodiment.

[0024]

[Effect of the device]

 This invention is configured as described above to detect the light transmitted through the transparent layer, and the inspection is performed by separating the irradiation optical waveguide and the transmission optical waveguide by a predetermined distance. By arranging it on the surface, the difference between the light transmittance and the absorptance appears as the difference in the output of the image signal, the contrast between the transparent layer and the non-transparent layer becomes clear, and the difference in the material is discriminated. Since it has become possible to improve the accuracy of product defect judgment. In addition, by providing an irradiation optical waveguide between the object to be inspected and the light source, light leakage from the light source is eliminated, and it is possible to accurately irradiate the target portion of the inspection surface with light. The intensity of the light source is stronger than that of the conventional light source, and the transmission light guide is provided between the image part and the object to be inspected, so that the transmitted light is transmitted directly to the image part. Since it can be transmitted, it is not affected by diffused reflection or scattered light, and is not affected by surface irregularities, which has the excellent effect that product defects can be accurately judged.

[Brief description of drawings]

FIG. 1 is an overall view showing an embodiment of a product defect inspection device according to the present invention.

FIG. 2 is a schematic view showing a state in which an irradiation optical waveguide and a transmission optical waveguide are arranged on an inspection surface of an inspection object.

FIG. 3 is an enlarged schematic view showing an inspection surface of an inspection object.

FIG. 4 is an overall view showing a conventional product defect inspection apparatus.

FIG. 5 is an enlarged schematic sectional view showing an inspection surface of an inspection object.

[Explanation of symbols]

 1, 51 ... Light source 2, 52 ... Inspected object 2a, 52a ... Rubber material 2b, 52b ... Resin layer 3, 53 ... Image part 4 ... Irradiation optical waveguide 4a ... Irradiation optical fiber 4b ... … Light guide 5 …… Transmission optical waveguide 6 …… Peripheral equipment 7 …… Defectiveness judgment device 8 …… Rotating jig 8a …… Table 9, 59 …… Inspection surface

Claims (1)

[Scope of utility model registration request] 1. An object to be inspected (2) having a layer (2b) through which light can be transmitted is irradiated with light and the transmitted light is transferred to the image part (3).
Is a product defect inspection apparatus that captures an image as an image and outputs it as an image signal, processes the image signal, and inspects the inspected object (2) for defects. Irradiation optical waveguide (4) leading to the inspection object (2)
And a transmission optical waveguide (5) for guiding the transmitted light from the inspection object (2) is provided in the image part (3), and the light emitted from the light source (1) is passed through the irradiation optical waveguide (4). A product defect inspection apparatus characterized by irradiating an inspection object (2) and guiding transmitted light from the inspection object (2) to an image section (3) through the transmission optical waveguide (5).