JPH0535855U - Plating device - Google Patents

Plating device

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Publication number
JPH0535855U
JPH0535855U JP8297891U JP8297891U JPH0535855U JP H0535855 U JPH0535855 U JP H0535855U JP 8297891 U JP8297891 U JP 8297891U JP 8297891 U JP8297891 U JP 8297891U JP H0535855 U JPH0535855 U JP H0535855U
Authority
JP
Japan
Prior art keywords
plating
metal piece
anode
area
voltmeter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8297891U
Other languages
Japanese (ja)
Inventor
光司 小倉
友雄 中川
Original Assignee
兵庫日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 兵庫日本電気株式会社 filed Critical 兵庫日本電気株式会社
Priority to JP8297891U priority Critical patent/JPH0535855U/en
Publication of JPH0535855U publication Critical patent/JPH0535855U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】金属片の先端のごく一部を浸漬めっきする場合
のバッチ間のぬれ面積の変動によるめっき厚さのバラツ
キをなくす。 【構成】一定電流にて被めっき面積5を変化させた時の
金属片1と陽極2間の電圧の変化を測定し、極間電圧と
めっき面積の換算式を求めておく。めっき初期において
一定電流を流した時の極間電圧を測定し、換算式により
めっき面積を推定する。次に推定面積と指定の電流密度
との積でめっき電源を制御し、指定時間めっきする。す
なわち、バッチが変わっても常に定電流密度でめっきで
きる。
(57) [Summary] [Purpose] To eliminate variations in plating thickness due to fluctuations in the wetted area between batches when immersion plating a small part of the tip of a metal piece. [Structure] The change in voltage between the metal piece 1 and the anode 2 when the plated area 5 is changed at a constant current is measured, and a conversion formula for the inter-electrode voltage and the plated area is obtained. Measure the inter-electrode voltage when a constant current is applied at the beginning of plating and estimate the plating area by the conversion formula. Next, the plating power source is controlled by the product of the estimated area and the specified current density, and plating is performed for the specified time. That is, plating can always be performed at a constant current density even if the batch is changed.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

本考案はめっき装置に関し、特に液面制御により金属片の先端の一部に金属め っきを施す装置に関する。 The present invention relates to a plating apparatus, and more particularly, to an apparatus for plating a part of the tip of a metal piece by controlling the liquid level.

【0002】[0002]

【従来の技術】[Prior Art]

従来のめっき装置は、めっき液の満されためっき槽内に陽極をセットし、陰極 としての被めっき物の先端の一部をめっき液中に浸漬し、定電流電源にて一定時 間通電し、めっきするように構成されていた。 In conventional plating equipment, the anode is set in a plating tank filled with plating solution, part of the tip of the object to be plated as the cathode is immersed in the plating solution, and a constant current power supply is used for a certain period of time. , Was configured to plate.

【0003】 このめっき装置において、バッチ処理で連続めっきする場合、めっき膜の厚さ のバラツキを小さくする為に、めっき液の液面の高さや、被めっき物の高さ及び めっき治具の精度等を厳密に管理する必要がある。In this plating apparatus, when performing continuous plating by batch processing, in order to reduce the variation in the thickness of the plating film, the height of the liquid level of the plating solution, the height of the object to be plated, and the accuracy of the plating jig. Etc. must be strictly controlled.

【0004】[0004]

【考案が解決しようとする課題】[Problems to be solved by the device]

この従来のめっき装置では、被めっき物のめっき液中への浸漬される長さが短 い場合、実際のぬれ面積は、液体の這い上げ高さの変動に大きく左右され、めっ き膜の厚さ変動の大きな支配因子になる。 In this conventional plating apparatus, when the length of the material to be plated dipped in the plating solution is short, the actual wetted area is greatly affected by fluctuations in the crawling height of the liquid and the plating film It becomes a major controlling factor of thickness variation.

【0005】 固液界面張力は、液体の表面張力より固体の表面状態により強く支配され、こ れを一定にコントロールすることは非常に難しい。固体表面を乾燥状態にしても 直ぐ蒸気などを吸着する。あるいは予め液体に浸漬しても表面粗さや物理的化学 的吸着能の変動により、濡れの状態を一定にすることは難しい。The solid-liquid interfacial tension is more strongly governed by the surface state of the solid than the surface tension of the liquid, and it is very difficult to control this constant. Even if the solid surface is in a dry state, it immediately adsorbs steam. Alternatively, even if it is immersed in a liquid in advance, it is difficult to make the wet state constant because of variations in surface roughness and physical / chemical adsorption capacity.

【0006】 したがって被めっき物の先端の一部に、一定厚さのめっき膜を付与するとき、 めっき長を短かくしようとする程、めっき膜の厚さ変動が大きくなるという問題 がある。Therefore, when a plating film having a constant thickness is applied to a part of the tip of the object to be plated, there is a problem that the thickness variation of the plating film increases as the plating length is shortened.

【0007】[0007]

【課題を解決するための手段】[Means for Solving the Problems]

第1の考案のめっき装置は、めっき槽と、このめっき槽にセットされる陽極と 陰極としての金属片と、この陽極と金属片との間に一定の電流を供給する電源と 、前記陽極と金属片との間の電圧を測定する電圧計と、この電圧計からの信号に より前記金属片の被めっき面積を算出すると共にこの金属片に供給される電流を 制御する演算制御部とを含むものである。 A plating apparatus of a first invention is a plating tank, an anode and a metal piece as a cathode set in the plating tank, a power supply for supplying a constant current between the anode and the metal piece, and the anode. It includes a voltmeter that measures the voltage between the metal piece and a calculation control unit that calculates the plated area of the metal piece from the signal from the voltmeter and controls the current supplied to the metal piece. It is a waste.

【0008】 第2の考案のめっき装置は、めっき槽と、このめっき槽にセットされる陽極と 陰極としての金属片と、この陽極と金属片との間に一定の電流を供給する電源と 、前記陽極と金属片との間の電圧を測定する電圧計と、この電圧計からの信号に より前記金属片の被めっき面積を算出するシーケンサと、このシーケンサからの 信号により前記金属片を上下動させる可動手段とを含むものである。A plating apparatus of a second invention is a plating tank, an anode and a metal piece as a cathode set in the plating tank, and a power supply for supplying a constant current between the anode and the metal piece. A voltmeter that measures the voltage between the anode and the metal piece, a sequencer that calculates the plated area of the metal piece based on the signal from this voltmeter, and a vertical movement of the metal piece based on the signal from this sequencer. And a movable means for causing the movement.

【0009】 陰・陽極間の電圧はV=I〔R(境界)+R(液体)〕で表わされる。The voltage between the cathode and the anode is represented by V = I [R (boundary) + R (liquid)].

【0010】 R(境界)は固体の真の接触面積と、固体の表面被膜抵抗により支配されるが 、表面被膜抵抗の変動は管理されためっき前処理直後であれば無視できる。R( 液体)は液中のイオン量に支配されるがこれも伝導塩等管理されためっき液であ れば短時間で急変することはない。従って短時間内における電極間電圧変動の主 要因は、固体の真の接触面積(被めっき面積)の変動と見なせる。The R (boundary) is governed by the true contact area of the solid and the surface coating resistance of the solid, but variations in the surface coating resistance can be ignored immediately after controlled plating pretreatment. R (liquid) is governed by the amount of ions in the liquid, but this also does not change suddenly in a short time if it is a plating liquid in which a conductive salt is controlled. Therefore, the main cause of the voltage fluctuation between the electrodes in a short time can be regarded as the fluctuation of the true contact area (plating area) of the solid.

【0011】 つまり、陰・陽極間の電圧を測定し、めっき面積を推定して電流を増減する( 陰極電流密度を一定にする)か、電圧に応じてめっき時間を制御するか、電圧が 一定になる様被めっき物を上下する(めっき面積を一定にする)事により、一定 の厚さのめっき膜を形成することが可能となる。That is, the voltage between the cathode and the anode is measured, the plating area is estimated and the current is increased or decreased (the cathode current density is kept constant), the plating time is controlled according to the voltage, or the voltage is kept constant. By vertically moving the object to be plated (making the plating area constant), it becomes possible to form a plating film having a constant thickness.

【0012】[0012]

【実施例】【Example】

次に、本考案の実施例について図面を参照して説明する。図1は本考案の第1 の実施例のブロック図である。 Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram of the first embodiment of the present invention.

【0013】 図1においてめっき装置は、めっき液3が満されるめっき槽13と、このめっ き液中にセットされる陽極2と、この陽極2と被めっき物である陰極としての金 属片1との間に一定の電流を供給する電源10と、陽極と金属片との間の電圧を 測定するための電圧計11と、この電圧計11からの信号により金属片1の被め っき面積5を算出し金属片1に供給される電流を制御する演算制御部12とから 主に構成されている。以下図2に示す工程図と共に更に説明する。In FIG. 1, the plating apparatus includes a plating tank 13 filled with a plating solution 3, an anode 2 set in the plating solution, a metal as a cathode which is the anode 2 and an object to be plated. A power supply 10 that supplies a constant current to the strip 1, a voltmeter 11 for measuring the voltage between the anode and the metal strip, and a signal from the voltmeter 11 covers the metal strip 1. It is mainly configured by an arithmetic control unit 12 that calculates a contact area 5 and controls a current supplied to the metal piece 1. The process will be further described below with reference to the process chart shown in FIG.

【0014】 まず被めっき物である金属片1をめっき液3中に浸漬しシーケンサやCPU等 からなる演算制御部12により制御された電源10より、一定のパルス電流Ip を通電すると共に、陽極2と金属片1との間の電圧Vm を電圧計11により測定 する。そしてこのVm の出力を演算制御部12に入力し、あらかじめ決められた 換算式S=f(V)により被めっき面積Sを推定し、次でめっき条件の陰極電流 密度Dk との積によりめっき電流Ia を演算する。次にこのIa に基づき、演算 制御部12によりめっき電源10を制御し、金属片1を一定時間めっきする。First, a metal piece 1 to be plated is immersed in a plating solution 3 and a constant pulse current I p is supplied from a power source 10 controlled by a calculation control unit 12 including a sequencer and a CPU, and an anode is also provided. The voltage V m between 2 and the metal piece 1 is measured by the voltmeter 11. Then, the output of V m is input to the arithmetic and control unit 12, the plated area S is estimated by a predetermined conversion formula S = f (V), and then the product of the cathode current density D k under the plating conditions is calculated. The plating current I a is calculated. Next, based on this I a , the arithmetic control unit 12 controls the plating power source 10 to plate the metal piece 1 for a certain period of time.

【0015】 又、前記面積Sに応じてめっき膜の厚さを所定の厚さにするためのめっき時間 を制御することもできる。Further, it is possible to control the plating time for adjusting the thickness of the plating film to a predetermined thickness according to the area S.

【0016】 図2は本考案の第2の実施例のブロック図である。この第2の実施例において は、電源10Aにより一定の電流を流して金属片1にめっきを開始し、電圧計1 1Aにより測定される極間電圧Vm があらかじめ決定された電圧になる様にパル スモータ6を制御し、このパルスモータ6により上下動可能に設定され金属片1 の高さを変化せしめ、液面4で濡れる被めっき面積5を一定に保つ様にするもの である。FIG. 2 is a block diagram of a second embodiment of the present invention. In the second embodiment, a constant current is supplied from the power source 10A to start plating on the metal piece 1 so that the inter-electrode voltage V m measured by the voltmeter 11A becomes a predetermined voltage. The pulse motor 6 is controlled so that it can be moved up and down by the pulse motor 6 to change the height of the metal piece 1 so as to keep the plated area 5 wet with the liquid surface 4 constant.

【0017】 このように第2の実施例によれば、Vm の制御のみで被めっき面積とめっき膜 の厚さを一定にするため、制御部を簡単にできるという利点がある。As described above, according to the second embodiment, since the area to be plated and the thickness of the plated film are made constant only by controlling V m , there is an advantage that the control unit can be simplified.

【0018】[0018]

【考案の効果】[Effect of the device]

以上説明したように本考案は、バッチ毎にめっき条件を制御できるので、バッ チ間のめっき厚さのバラツキを低減し、めっき厚さ不良を減少させることができ るという効果がある。 As described above, the present invention can control the plating conditions for each batch, so that there is an effect that variations in plating thickness between batches can be reduced and defective plating thickness can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の第1の実施例のブロック図。FIG. 1 is a block diagram of a first embodiment of the present invention.

【図2】第1の実施例を用いてめっきする場合の工程
図。
FIG. 2 is a process drawing for plating using the first embodiment.

【図3】本考案の第2の実施例のブロック図。FIG. 3 is a block diagram of a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 金属片 2 陽極 3 めっき液 4 液面 5 被めっき面積 6 パルスモータ 10,10A 電源 11 電圧計 12 演算制御部 13 シーケンサ 1 Metal Fragment 2 Anode 3 Plating Solution 4 Liquid Level 5 Plated Area 6 Pulse Motor 10, 10A Power Supply 11 Voltmeter 12 Calculation Controller 13 Sequencer

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 めっき槽と、このめっき槽にセットされ
る陽極と陰極としての金属片と、この陽極と金属片との
間に一定の電流を供給する電源と、前記陽極と金属片と
の間の電圧を測定する電圧計と、この電圧計からの信号
により前記金属片の被めっき面積を算出すると共にこの
金属片に供給される電流を制御する演算制御部とを含む
ことを特徴とするめっき装置。
1. A plating tank, a metal piece as an anode and a cathode set in the plating tank, a power supply for supplying a constant current between the anode and the metal piece, and the anode and the metal piece. It is characterized by including a voltmeter for measuring a voltage between the voltmeter and an arithmetic control unit for calculating a plated area of the metal piece by a signal from the voltmeter and controlling a current supplied to the metal piece. Plating equipment.
【請求項2】 めっき槽と、このめっき槽にセットされ
る陽極と陰極としての金属片と、この陽極と金属片との
間に一定の電流を供給する電源と、前記陽極と金属片と
の間の電圧を測定する電圧計と、この電圧計からの信号
により前記金属片の被めっき面積を算出するシーケンサ
と、このシーケンサからの信号により前記金属片を上下
動させる可動手段とを含むことを特徴とするめっき装
置。
2. A plating tank, a metal piece as an anode and a cathode set in the plating tank, a power supply for supplying a constant current between the anode and the metal piece, and the anode and the metal piece. A voltmeter for measuring a voltage between the voltmeter, a sequencer for calculating the plated area of the metal piece by a signal from the voltmeter, and a moving means for moving the metal piece up and down by a signal from the sequencer. Characteristic plating equipment.
JP8297891U 1991-10-14 1991-10-14 Plating device Pending JPH0535855U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8297891U JPH0535855U (en) 1991-10-14 1991-10-14 Plating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8297891U JPH0535855U (en) 1991-10-14 1991-10-14 Plating device

Publications (1)

Publication Number Publication Date
JPH0535855U true JPH0535855U (en) 1993-05-14

Family

ID=13789306

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8297891U Pending JPH0535855U (en) 1991-10-14 1991-10-14 Plating device

Country Status (1)

Country Link
JP (1) JPH0535855U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7563352B2 (en) 2001-10-27 2009-07-21 Atotech Deutschland Gmbh Method and conveyorized system for electorlytically processing work pieces

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7563352B2 (en) 2001-10-27 2009-07-21 Atotech Deutschland Gmbh Method and conveyorized system for electorlytically processing work pieces

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