JPH0534472A - Time measurement circuit - Google Patents

Time measurement circuit

Info

Publication number
JPH0534472A
JPH0534472A JP19335091A JP19335091A JPH0534472A JP H0534472 A JPH0534472 A JP H0534472A JP 19335091 A JP19335091 A JP 19335091A JP 19335091 A JP19335091 A JP 19335091A JP H0534472 A JPH0534472 A JP H0534472A
Authority
JP
Japan
Prior art keywords
time
measured
signal
clock
clock signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19335091A
Other languages
Japanese (ja)
Other versions
JP2818504B2 (en
Inventor
Hiromitsu Iwata
浩充 岩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP3193350A priority Critical patent/JP2818504B2/en
Publication of JPH0534472A publication Critical patent/JPH0534472A/en
Application granted granted Critical
Publication of JP2818504B2 publication Critical patent/JP2818504B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To improve accuracy in measured value by providing a timing detection circuit, and by detecting plus or minus error based on the electric potential levels of a clock for rising as well as lowering timings of a time signal to be measured. CONSTITUTION:An output signal and a clock signal of a detection circuit 12 for time to be measured are received by a timing circuit 10, and an electric potential level of the clock signal when the electric potential level of the time signal to be measured is output to monitor terminals 17, 18. An error is judged to be plus level when the clock is in a high level regardless of rising or lowering state of the time signal to be measured, while it is judged to be minus level when the clock is in low level regardless of rising or lowering state of the time signal to be measured. An actual value and a measured value are close to each other when one of either rising or lowering state of the time signal to be measured is at clock high level, while the other is at low level. Since an estimated value is determined according to the electric potential level of the clock signal at the times of starting and finishing times of the time to be measured, a maximum value of the error is reduced to a semi-clock period.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は時間測定回路に関し、特
に測定精度の高い時間測定回路に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a time measuring circuit, and more particularly to a time measuring circuit having high measurement accuracy.

【0002】[0002]

【従来の技術】図5に従来の時間測定回路の一例を、図
6に図5の従来回路の動作例を表わすタイミング図を示
す。
2. Description of the Related Art FIG. 5 shows an example of a conventional time measuring circuit, and FIG. 6 shows a timing chart showing an operation example of the conventional circuit of FIG.

【0003】図5において、従来回路は、被測定信号
1,2の入力端子13,14,被測定時間検出回路1
2,クロック信号の入力端子15,ANDゲート(AN
D1)21,エッジカウンタ回路11,および出力端子
群16で構成されている。被測定時間検出回路12は、
インバータ(G1)19と、NORゲート(NOR1)
とを有する。
In FIG. 5, the conventional circuit is the input terminals 13 and 14 of the signals 1 and 2 to be measured and the measured time detection circuit 1.
2, clock signal input terminal 15, AND gate (AN
D1) 21, an edge counter circuit 11, and an output terminal group 16. The measured time detection circuit 12 is
Inverter (G1) 19 and NOR gate (NOR1)
Have and.

【0004】従来回路において,被測定時間検出回路1
2は、通常低(Low)レベル出力を行ない、入力端子
群により目的とする,被測定時間のみを高(High)
レベル検出し、被測定時間信号30として出力する回路
である。
In the conventional circuit, the measured time detection circuit 1
2 normally outputs a low level, and the target measurement time is set high by the input terminal group.
It is a circuit that detects a level and outputs the measured time signal 30.

【0005】例えば図5に示す被測定信号1の立ち上が
り時刻から、被測定信号2の立ち上がり時刻までの時間
の検出は,インバータ19,NORゲート20により行
なわれ、図6に示す被測定時間信号30として出力され
る。
For example, the time from the rising time of the signal under test 1 shown in FIG. 5 to the rising time of the signal under test 2 is detected by the inverter 19 and the NOR gate 20, and the time under measurement signal 30 shown in FIG. Is output as.

【0006】被測定時間信号30におけるHighレベ
ル出力時間は、被測定時間であり、従って被測定時間信
号30と,既知の適切な周期のクロック信号との論理積
における,立ち上がりエッジ数または立ち上がりエッジ
数のエッジカウンタ回路11によるカウントにより、被
測定時間信号30のHighレベル出力時間すなわち被
測定時間は、前記カウント結果とクロック周期により、
推定できる。
The high level output time in the measured time signal 30 is the measured time, and therefore the number of rising edges or the number of rising edges in the logical product of the measured time signal 30 and the clock signal of a known proper period. According to the count by the edge counter circuit 11, the High level output time of the measured time signal 30, that is, the measured time depends on the count result and the clock cycle.
Can be estimated.

【0007】[0007]

【発明が解決しようとする課題】従来の時間測定回路に
おいて、被測定時間信号30とクロック信号の論理との
比較は、ランダムなタイミングで行なわれる。従って、
被測定時間信号30とクロック信号の論理積における立
ち上がりまたは立ち下がりエッジの数は、被測定時間信
号とクロック信号との間のタイミングに依存する。しか
し、被測定時間信号とクロック信号との間のタイミング
をモニタする機能がないため、前記論理積の立ち上がり
または立ち下がりエッジ数のカウント結果nに対して、
次のようになる。
In the conventional time measuring circuit, the comparison between the measured time signal 30 and the logic of the clock signal is performed at random timing. Therefore,
The number of rising or falling edges in the logical product of the measured time signal 30 and the clock signal depends on the timing between the measured time signal and the clock signal. However, since there is no function of monitoring the timing between the measured time signal and the clock signal, the count result n of the number of rising or falling edges of the logical product is
It looks like this:

【0008】(1)被測定時間信号の立ち上がり時刻が
クロック信号の立ち下がり時刻の直前の時刻でかつ、被
測定時間信号の立ち下がり時刻がクロック信号の立ち上
がり時刻直後の時刻であるとき、実際の測定時間は、最
小値(n−1.5)×クロック周期となる。
(1) When the rising time of the measured time signal is immediately before the falling time of the clock signal and the falling time of the measured time signal is immediately after the rising time of the clock signal, the actual The measurement time is the minimum value (n-1.5) × clock period.

【0009】(2)被測定時間信号の立ち上がり時刻
が、クロック信号の立ち下がり時刻直後の時刻でかつ被
測定時間信号の立ち下がり時刻がクロック信号の立ち上
がり時刻直前の時刻であるとき、実際の測定時間は最大
値(n+0.5)×クロック周期となる。
(2) When the rising time of the measured time signal is immediately after the falling time of the clock signal and the falling time of the measured time signal is immediately before the rising time of the clock signal, the actual measurement is performed. The time is the maximum value (n + 0.5) × clock period.

【0010】すなわち、前記カウント結果nに対し、測
定時間としてとり得る値は、(n−1.5)×クロック
周期<測定時間としてとり得る値<(n+0.5)×ク
ロック周期であり、中間値(n−0.5)×クロック周
期を測定時間の推定値として採用すると、被測定時間の
推定値と真値との誤差は、最大±1×クロック周期とな
り、推定値の真値に対する信頼性が低いという問題点が
ある。
That is, with respect to the count result n, the value that can be taken as the measurement time is (n-1.5) × clock cycle <the value that can be taken as the measurement time <(n + 0.5) × clock cycle, which is an intermediate value. When the value (n−0.5) × clock cycle is adopted as the estimated value of the measurement time, the error between the estimated value of the measured time and the true value is ± 1 × clock cycle at the maximum, and the reliability of the estimated value with respect to the true value. There is a problem that the property is low.

【0011】本発明の目的は、前記問題点を解決し、真
値に対する推定値の信頼性が低くならないようにした時
間測定回路を提供することにある。
An object of the present invention is to solve the above problems and provide a time measuring circuit in which the reliability of the estimated value with respect to the true value is not lowered.

【0012】[0012]

【課題を解決するための手段】本発明の構成は、被測定
信号の入力端子群と、被測定時間検出回路と、クロック
信号の入力端子と、ANDゲートと、エッジカウンタ回
路とを備えた時間測定回路において、前記被測定時間検
出回路の出力信号と前記クロック信号とを受信し、被測
定時間信号の電位レベルの変化時の時刻における前記ク
ロック信号の電位レベルをそれぞれモニタ出力端子へ出
力信号化するタイミング検出回路を備えたことを特徴と
する。
SUMMARY OF THE INVENTION The structure of the present invention is a time period including an input terminal group for a signal under measurement, a measured time detection circuit, an input terminal for a clock signal, an AND gate, and an edge counter circuit. In the measurement circuit, the output signal of the measured time detection circuit and the clock signal are received, and the potential level of the clock signal at the time when the potential level of the measured time signal changes is output to a monitor output terminal, respectively. And a timing detection circuit for

【0013】[0013]

【実施例】図1は本発明の一実施例の時間測定回路を示
すブロック図、図2は図1のタイミング検出回路を具体
的に示したブロック図である。
1 is a block diagram showing a time measuring circuit according to an embodiment of the present invention, and FIG. 2 is a block diagram specifically showing the timing detecting circuit of FIG.

【0014】図3は図1の回路の動作例を示すタイミン
グ図であり、被測定時間開始時刻および終了時刻におけ
るクロック信号電位レベルが低(Low)レベルの時で
ある。
FIG. 3 is a timing chart showing an operation example of the circuit of FIG. 1, when the clock signal potential level at the start time and end time of the measured time is low level.

【0015】図4は図1の回路の動作例を示すタイミン
グ図であり、被測定時間開始時刻および終了におけるク
ロック信号電位レベルが高(High)レベルの時であ
る。
FIG. 4 is a timing chart showing an operation example of the circuit of FIG. 1, when the clock signal potential level at the start time and end time of the measured time is high level.

【0016】図1において、本実施例は、図5の回路の
他に、リセット信号入力端子50,タイミング検出回路
10,モニタ出力端子(1)(2)17,18を有す
る。
In FIG. 1, this embodiment has a reset signal input terminal 50, a timing detection circuit 10, and monitor output terminals (1) (2) 17, 18 in addition to the circuit of FIG.

【0017】このタイミング検出回路10は、D型フリ
ップフロップ(DFF)47,48,R/S型ラッチ4
5,46,インバータ40,44,49,NOR2ゲー
ト41,AND2,3ゲート42,43とを有する。
The timing detection circuit 10 includes a D-type flip-flop (DFF) 47, 48 and an R / S-type latch 4.
5, 46, inverters 40, 44, 49, NOR2 gate 41, AND2, 3 gates 42, 43.

【0018】図2において、被測定時間検出回路12、
ANDゲート21およびエッジカウンタ回路11による
計測機能は、従来の同機能を備える。
In FIG. 2, the measured time detection circuit 12,
The measurement function of the AND gate 21 and the edge counter circuit 11 has the same conventional function.

【0019】図2のタイミング検出回路において、フリ
ップフロップ47,48は入力Dの電位レベルを、クロ
ック信号(CK)のLowレベルで読みこみ、High
レベルで出力Qの電位レベルとして出力するD型フリッ
プフロップである。
In the timing detection circuit of FIG. 2, the flip-flops 47 and 48 read the potential level of the input D at the Low level of the clock signal (CK), and set it to High.
It is a D-type flip-flop that outputs the potential level of the output Q at the level.

【0020】従ってフリップフロップ47は通常Low
レベル出力であり、被測定時間の開始時刻後はじめての
クロック信号の立ち上がり時刻から、被測定時間の終了
時刻後はじめてのクロック信号の立ち上がり時刻までの
時間だけHighレベルを出力する。
Therefore, the flip-flop 47 is normally Low.
This is a level output, and outputs a high level only for the time from the rising time of the clock signal for the first time after the start time of the measured time to the rising time of the clock signal for the first time after the end time of the measured time.

【0021】フリップフロップは、通常Lowレベル出
力であり、被測定時間の開始時刻後はじめてのクロック
信号の立ち下がり時刻から被測定時間の終了時刻後はじ
めてのクロック信号の立ち下がり時刻までの時間、Hi
ghレベルを出力する。
The flip-flop normally outputs a Low level signal, and is the time from the falling time of the clock signal for the first time after the start time of the measured time to the falling time of the clock signal for the first time after the end time of the measured time, Hi.
Output gh level.

【0022】従って次段NORゲート(NOR2)41
の出力電位レベルは通常Lowレベルであり、被測定時
間開始時刻12おけるクロック信号の電位レベルがLo
wのとき、被測定時間開始時刻直後のクロック信号の立
ち上がり時刻から、次の立ち下がり時刻までの時間Hi
ghレベルを出力し、さらに被測定時間終了時刻におけ
るクロック信号の電位レベルがHighのとき、被測定
時間終了時刻直後のクロック信号の立ち下がり時刻か
ら、次の立ち上がり時刻までの時間,Highレベルを
出力する。
Therefore, the next-stage NOR gate (NOR2) 41
Is normally Low level, and the potential level of the clock signal at the measured time start time 12 is Lo.
When w, the time Hi from the rising time of the clock signal immediately after the measured time start time to the next falling time Hi
GH level is output, and when the potential level of the clock signal at the end time of the measured time is High, the High level is output for the time from the falling time of the clock signal immediately after the end time of the measured time to the next rising time. To do.

【0023】さらに、NORゲート41の出力信号は、
ANDゲート42,および43により、被測定時間の開
始時刻のクロック信号電位レベルモニタ用信号,被測定
時間の終了時刻のクロック信号電位レベルモニタ用信号
とに分割され、ANDゲート42出力信号における、H
ighレベル出力状態の有無により、被測定時間の開始
時刻における、クロック信号の電位レベルが、さらにA
NDゲート43出力信号におけるHighレベル出力状
態の有無により、被測定時間の終了時刻における、クロ
ック信号の電位レベルを判断できる。
Further, the output signal of the NOR gate 41 is
AND gates 42 and 43 divide the signal into a clock signal potential level monitor signal at the start time of the measured time and a clock signal potential level monitor signal at the end time of the measured time.
Depending on the presence or absence of the high level output state, the potential level of the clock signal at the start time of the measured time is further
The potential level of the clock signal at the end time of the measured time can be determined by the presence / absence of the high level output state in the output signal of the ND gate 43.

【0024】従ってANDゲート42,43の出力信号
を、それぞれR/Sラッチ45、R/Sラッチ46のセ
ット入力信号とすることにより、被測定時間の開始時刻
および終了時刻におけるクロック信号電位レベルは、そ
れぞれR/Sラッチ45の出力Q,R/Sラッチ46の
出力Q(否定値)として得られる。
Therefore, by setting the output signals of the AND gates 42 and 43 as the set input signals of the R / S latch 45 and the R / S latch 46, the clock signal potential level at the start time and the end time of the measured time is set. , Output Q of the R / S latch 45 and output Q (negative value) of the R / S latch 46, respectively.

【0025】被測定時間信号におけるクロック信号の立
ち上がりまたは立ち下がりエッジのカウント結果nのと
き、測定時間としてとり得る値は、被測定時間の開始時
刻および終了時刻におけるクロック信号の電位レベルに
応じて以下の様になり、各条件において中間値を被測定
時間の推定値として採用する。
When the count result n of the rising or falling edge of the clock signal in the measured time signal is a value that can be taken as the measurement time, the value that can be obtained is as follows depending on the potential level of the clock signal at the start time and the end time of the measured time. The intermediate value is adopted as the estimated value of the measured time under each condition.

【0026】(A)被測定時間の開始時刻におけるクロ
ック信号の電位レベルおよび被測定時間の終了時刻にお
けるクロック信号の電位レベルがともにHighレベル
のとき、(n−1.5)×クロック周期<測定時間とし
てとり得る値<(n−0.5)×クロック周期。
(A) When both the potential level of the clock signal at the start time of the measured time and the potential level of the clock signal at the end time of the measured time are High level, (n-1.5) × clock period <measured Possible value of time <(n-0.5) x clock period.

【0027】(B)被測定時間の開始時刻におけるクロ
ック信号の電位レベルと、被測定時間の終了時刻におけ
るクロック信号の電位レベルが異なるとき、(n−1)
×クロック周期<測定時間としてとり得る値<n×クロ
ック周期。
(B) When the potential level of the clock signal at the start time of the measured time is different from the potential level of the clock signal at the end time of the measured time, (n-1)
× clock cycle <value that can be taken as measurement time <n × clock cycle.

【0028】(C)被測定時間の開始時刻におけるクロ
ック信号の電位レベルおよび被測定時間の終了時刻にお
けるクロック信号の電位レベルがともにLowレベルの
とき、(n−0.5)<クロック周期<測定時間として
とり得る値<(n+0.5)×クロック周期。
(C) When the potential level of the clock signal at the start time of the measured time and the potential level of the clock signal at the end time of the measured time are both low, (n-0.5) <clock cycle <measured Possible value of time <(n + 0.5) × clock period.

【0029】以上、本実施例は、被測定信号の入力端子
群と、この被測定信号の入力端子群に入力される被測定
信号群の目的とする被測定時間のみをHighレベル検
出し、通常はLowレベル出力する被測定時間検出回
路,およびクロック信号入力端子と、このクロック信号
と前記被測定時間検出回路の出力信号とを入力信号とす
る2入力ANDゲート,およびこのANDゲートの出力
信号を入力信号とし、この入力信号における立ち上がり
または立ち下がりエッジ数をカウントし出力する機能を
もつエッジカウンタ回路を有し、さらに前記被測定時間
検出回路の出力信号と,前記クロック信号をそれぞれ入
力信号とし、前記被測定時間検出回路の出力信号の電位
レベル変化(Low→HighおよびHigh→Lo
w)の時刻における前記クロック信号の電位レベルを検
出し、それぞれモニタ出力端子1,2へ出力する機能を
もつタイミング検出回路を備えることを特徴とする。
As described above, according to the present embodiment, only the input terminal group of the signal under measurement and the target measured time of the signal under measurement input to the input terminal group of the signal under measurement are detected at the High level, Is a low-time output measured time detection circuit and a clock signal input terminal, a 2-input AND gate having the clock signal and the output signal of the measured time detection circuit as input signals, and an output signal of the AND gate. As an input signal, having an edge counter circuit having a function of counting and outputting the number of rising or falling edges in this input signal, further, the output signal of the measured time detection circuit, and the clock signal as an input signal respectively, Changes in the potential level of the output signal of the measured time detection circuit (Low → High and High → Lo
It is characterized by comprising a timing detection circuit having a function of detecting the potential level of the clock signal at the time of w) and outputting it to the monitor output terminals 1 and 2, respectively.

【0030】[0030]

【発明の効果】以上説明したように、本発明は、被測定
時間信号におけるクロック信号の立ち上がりまたは立ち
下がりエッジのカウント結果nによる測定時間の推定
を、従来では常に(n−0.5)×クロック周期で推定
値とするのに対し、被測定時間の開始時刻および終了時
刻におけるクロック信号の電位レベルに応じて推定値を
決定する。
As described above, according to the present invention, the estimation of the measurement time based on the counting result n of the rising or falling edge of the clock signal in the measured time signal is always (n-0.5) × in the past. The estimated value is determined in the clock cycle, whereas the estimated value is determined according to the potential level of the clock signal at the start time and end time of the measured time.

【0031】従って、被測定時間の推定値と真値との誤
差の最大値は、従来の±1×クロック周期に対し、本発
明によれば±0.5×クロック周期に低減できるという
効果がある。
Therefore, according to the present invention, the maximum value of the error between the estimated value of the measured time and the true value can be reduced to ± 0.5 × clock cycle in contrast to the conventional ± 1 × clock cycle. is there.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の時間測定回路を示すブロッ
ク図である。
FIG. 1 is a block diagram showing a time measuring circuit according to an embodiment of the present invention.

【図2】図1のタイミング検出回路を具体的に示したブ
ロック図である。
FIG. 2 is a block diagram specifically showing the timing detection circuit of FIG.

【図3】図1の回路の動作の一例を示すタイミング図で
ある。
3 is a timing diagram showing an example of the operation of the circuit of FIG.

【図4】図1の回路の動作の他例を示すタイミング図で
ある。
4 is a timing diagram showing another example of the operation of the circuit of FIG.

【図5】従来の時間測定回路を示す回路図である。FIG. 5 is a circuit diagram showing a conventional time measurement circuit.

【図6】図5の動作例を示すタイミング図である。FIG. 6 is a timing chart showing an operation example of FIG.

【符号の説明】[Explanation of symbols]

D D型フリップフロップデータ入力端子 CK D型フリップフロップクロック入力端子 S R/Sラッチセット端子 R R/Sラッチリセット端子 Q,Q(否定値) D型フリップフロップ,R/Sラ
ッチ出力端子 10 タイミング検出回路 11 エッジカウンタ回路 12 被測定時間検出回路 13 被測定信号1入力端子 14 被測定信号2入力端子 15 クロック信号入力端子 16 出力端子群 17 モニタ出力端子1 18 モニタ出力端子2 19,40,44,49 インバータ 20,41 NORゲート 21,42,43 ANDゲート 47,48 D型フリップフロップ 45,46 R/Sラッチ
D D-type flip-flop data input terminal CK D-type flip-flop clock input terminal S R / S latch set terminal R R / S latch reset terminal Q, Q (negative value) D-type flip-flop, R / S latch output terminal 10 Timing Detection circuit 11 Edge counter circuit 12 Measured time detection circuit 13 Measured signal 1 input terminal 14 Measured signal 2 input terminal 15 Clock signal input terminal 16 Output terminal group 17 Monitor output terminal 1 18 Monitor output terminal 2 19, 40, 44 , 49 Inverter 20,41 NOR gate 21, 42,43 AND gate 47,48 D-type flip-flop 45,46 R / S latch

Claims (1)

【特許請求の範囲】 【請求項1】 被測定信号の入力端子群と、被測定時間
検出回路と、クロック信号の入力端子と、ANDゲート
と、エッジカウンタ回路とを備えた時間測定回路におい
て、前記被測定時間検出回路の出力信号と前記クロック
信号とを受信し、被測定時間信号の電位レベルの変化時
の時刻における前記クロック信号の電位レベルをそれぞ
れモニタ出力端子へ出力信号化するタイミング検出回路
を備えたことを特徴とする時間測定回路。
Claim: What is claimed is: 1. A time measuring circuit comprising a group of input terminals for a signal under measurement, a measured time detection circuit, an input terminal for a clock signal, an AND gate, and an edge counter circuit, Timing detection circuit that receives the output signal of the measured time detection circuit and the clock signal, and converts the potential level of the clock signal at the time when the potential level of the measured time signal changes to an output signal to a monitor output terminal, respectively. A time measuring circuit characterized by comprising.
JP3193350A 1991-08-02 1991-08-02 Time measurement circuit Expired - Lifetime JP2818504B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3193350A JP2818504B2 (en) 1991-08-02 1991-08-02 Time measurement circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3193350A JP2818504B2 (en) 1991-08-02 1991-08-02 Time measurement circuit

Publications (2)

Publication Number Publication Date
JPH0534472A true JPH0534472A (en) 1993-02-09
JP2818504B2 JP2818504B2 (en) 1998-10-30

Family

ID=16306442

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3193350A Expired - Lifetime JP2818504B2 (en) 1991-08-02 1991-08-02 Time measurement circuit

Country Status (1)

Country Link
JP (1) JP2818504B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7191753B2 (en) 2003-03-13 2007-03-20 Yanmar Co., Ltd. Cover structure for engine
CN107317581A (en) * 2016-04-26 2017-11-03 华邦电子股份有限公司 With high-resolution time-to-digit converter

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04175690A (en) * 1990-11-08 1992-06-23 Mitsubishi Heavy Ind Ltd Time measuring instrument

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04175690A (en) * 1990-11-08 1992-06-23 Mitsubishi Heavy Ind Ltd Time measuring instrument

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7191753B2 (en) 2003-03-13 2007-03-20 Yanmar Co., Ltd. Cover structure for engine
CN107317581A (en) * 2016-04-26 2017-11-03 华邦电子股份有限公司 With high-resolution time-to-digit converter
CN107317581B (en) * 2016-04-26 2021-01-12 华邦电子股份有限公司 Time-to-digital converter with high resolution

Also Published As

Publication number Publication date
JP2818504B2 (en) 1998-10-30

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