JPH05343567A - Resin sealed semiconductor device - Google Patents

Resin sealed semiconductor device

Info

Publication number
JPH05343567A
JPH05343567A JP4144708A JP14470892A JPH05343567A JP H05343567 A JPH05343567 A JP H05343567A JP 4144708 A JP4144708 A JP 4144708A JP 14470892 A JP14470892 A JP 14470892A JP H05343567 A JPH05343567 A JP H05343567A
Authority
JP
Japan
Prior art keywords
resin
semiconductor device
wiring board
sealed
sealed semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4144708A
Other languages
Japanese (ja)
Inventor
Katsuyuki Naito
克幸 内藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP4144708A priority Critical patent/JPH05343567A/en
Publication of JPH05343567A publication Critical patent/JPH05343567A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Abstract

PURPOSE:To provide a resin-sealed semiconductor device in which the low cost and a thin type construction are realized and which serves to obtain high performance, high reliability, and low cost electronic instruments with high density electronic parts mounted. CONSTITUTION:A resin-sealed semiconductor device has a heat radiation structure in which a semiconductor device 2 is connected with a wiring board 1 and which is resin-sealed through transfer molding. For the wiring board 1 high heat radiation aluminum nitride is employed, and the wiring board 1 is exposed from sealed resin 10. Accordingly, the wiring board 1 serves also as a heat radiation plate, eliminating the need of such a heat radiation plate. Thus, a low cost and thin construction is achieved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は放熱構造を持つ樹脂封
止型半導体装置の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in a resin-sealed semiconductor device having a heat dissipation structure.

【0002】[0002]

【従来の技術】図4は従来の放熱構造を持つ樹脂封止型
半導体装置の断面図である。ダイパッド41上にAgペ
ーストなどの接着剤43で半導体素子42が接着されて
搭載され、その半導体素子42の電極44と外部接続用
リード48がAuワイヤ49で結線されている。そして
放熱板411はダイパッド41に接触し、放熱特性を向
上させるため、機械的強度及び耐湿性等の信頼性を確保
するための樹脂用封止410より一部露出する構造とな
っている。図4に示す従来技術は半導体素子の電極と外
部リードとの間をAuワイヤとで電気的導通を成す、主
に単体チップパッケージに用いられる手法である。
2. Description of the Related Art FIG. 4 is a sectional view of a conventional resin-sealed semiconductor device having a heat dissipation structure. A semiconductor element 42 is bonded and mounted on the die pad 41 with an adhesive 43 such as Ag paste, and an electrode 44 of the semiconductor element 42 and an external connection lead 48 are connected by an Au wire 49. The heat dissipation plate 411 is in contact with the die pad 41 and is partially exposed from the resin sealing 410 for ensuring reliability such as mechanical strength and moisture resistance in order to improve heat dissipation characteristics. The prior art shown in FIG. 4 is a method mainly used for a single chip package in which an Au wire electrically connects between an electrode of a semiconductor element and an external lead.

【0003】一方、基板上に複数の電子部品が搭載され
たモジュール形態での放熱構造を持つ樹脂封止型半導体
装置としては図5のような構造が用いられる。図は断面
図であり、アルミナ基板51上に半導体素子52及び抵
抗、コンデンサ等の各種電子部品512が搭載されて電
子部品モジュールを形成しており、その電子部品モジュ
ールの外部接続用端子57と外部接続用リード58がA
uワイヤ59で結線されている。そして放熱板511は
アルミナ基板51に接触し、放熱特性を向上させるた
め、機械的強度及び耐湿性等の信頼性を確保するための
封止用樹脂510より一部露出する構造となっている。
On the other hand, a structure as shown in FIG. 5 is used as a resin-sealed semiconductor device having a heat dissipation structure in the form of a module in which a plurality of electronic components are mounted on a substrate. The figure is a cross-sectional view, in which a semiconductor element 52 and various electronic components 512 such as resistors and capacitors are mounted on an alumina substrate 51 to form an electronic component module, and the external connection terminals 57 and the outside of the electronic component module are formed. Connection lead 58 is A
It is connected by the u wire 59. The heat dissipation plate 511 is in contact with the alumina substrate 51 and is partially exposed from the sealing resin 510 for ensuring reliability such as mechanical strength and moisture resistance in order to improve heat dissipation characteristics.

【0004】[0004]

【発明が解決しようとする課題】上述したように樹脂封
止型半導体装置ではダイパッドもしくは基板に放熱板が
被着され、これらが樹脂封止されている。したがって、
半導体装置構造が複雑になり、材料のコストアップ、製
造工程の複雑化を招くとともに、必然的に樹脂封止型半
導体装置自体の厚さは放熱板と基板と電子部品自体の厚
さの合計以上になる。しかし、これは電子機器に要望さ
れる低コスト化、薄型化、小型化を達成するのに不利で
ある。
As described above, in the resin-sealed semiconductor device, the die pad or the substrate is covered with the heat sink, and these are resin-sealed. Therefore,
The structure of the semiconductor device becomes complicated, the material cost increases, the manufacturing process becomes complicated, and the thickness of the resin-encapsulated semiconductor device itself is necessarily more than the total thickness of the heat sink, the substrate, and the electronic component itself. become. However, this is disadvantageous in achieving cost reduction, thinning, and size reduction required for electronic devices.

【0005】そこで、この発明の目的は、電子機器の低
価格化、小型化に貢献する低価格、薄型化の放熱構造を
持つ樹脂封止型半導体装置を提供することにある。
Therefore, an object of the present invention is to provide a resin-sealed semiconductor device having a low-priced and thin heat dissipation structure which contributes to the cost reduction and size reduction of electronic equipment.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するた
め、この発明の樹脂封止型半導体装置は半導体素子が配
線基板に接続されトランスファーモールド成型により該
半導体装置と共に樹脂封止される樹脂封止型半導体装置
構造において、前記配線基板が高熱伝導性を有する窒化
アルミニウムより成り、かつ、前記配線基板が封止樹脂
より露出したことを特徴としている。
In order to achieve the above object, a resin-sealed semiconductor device of the present invention is a resin-sealed semiconductor device in which a semiconductor element is connected to a wiring substrate and is resin-sealed together with the semiconductor device by transfer molding. In the type semiconductor device structure, the wiring board is made of aluminum nitride having high thermal conductivity, and the wiring board is exposed from a sealing resin.

【0007】[0007]

【作用】本発明の樹脂封止型半導体装置を用いれば、半
導体素子が配線基板に接続されトランスファーモールド
成型により樹脂封止される樹脂封止型半導体装置構造に
おいて、配線基板は窒化アルミニウムより成り、この配
線基板の一部が封止樹脂より露出する構造なので、即
ち、配線基板に高放熱性である窒化アルミニウムを用
い、これが放熱板を兼ねているので、放熱板が不要にな
り低コスト化が図れると共に樹脂封止型半導体装置自体
の厚さは放熱板の厚さを含むことがない。したがって、
放熱構造を持つ樹脂封止型半導体装置の低価格化、薄型
化が可能である。
When the resin-sealed semiconductor device of the present invention is used, in the resin-sealed semiconductor device structure in which the semiconductor element is connected to the wiring board and resin-molded by transfer molding, the wiring board is made of aluminum nitride, Since a part of this wiring board is exposed from the sealing resin, that is, aluminum nitride having high heat dissipation is used for the wiring board, and this also serves as a heat dissipation plate, so that the heat dissipation plate is not required and the cost can be reduced. In addition, the thickness of the resin-encapsulated semiconductor device itself does not include the thickness of the heat sink. Therefore,
It is possible to reduce the cost and the thickness of the resin-sealed semiconductor device having the heat dissipation structure.

【0008】[0008]

【実施例】以下、この発明を図示の実施例により詳細に
説明する。
The present invention will be described in detail below with reference to the embodiments shown in the drawings.

【0009】図1は本発明の第1の実施例における樹脂
封止型半導体装置の断面図である。窒化アルミニウムを
材料とする配線基板1上にAgペースト等の接着剤3で
半導体素子2が接着されて搭載され、その半導体素子2
の電極4と窒化アルミニウム配線基板1の電極5がAu
ワイヤ6で結線され、さらに、その窒化アルミニウム配
線基板1の外部接続用端子7と外部接続用リード8がA
uワイヤ9で結線され電気的導通を成し、機械的強度及
び耐湿性等の信頼性を確保するための封止用樹脂10で
配線基板1の裏面の一部が露出するかたちでトランスフ
ァーモールド成型により封止されている。
FIG. 1 is a sectional view of a resin-sealed semiconductor device according to the first embodiment of the present invention. The semiconductor element 2 is attached and mounted on the wiring board 1 made of aluminum nitride with an adhesive 3 such as Ag paste.
Of the electrode 4 and the electrode 5 of the aluminum nitride wiring substrate 1 are Au.
The wires 6 are connected, and the external connection terminals 7 and external connection leads 8 of the aluminum nitride wiring board 1 are
Transfer molding is performed in such a manner that a part of the back surface of the wiring board 1 is exposed by the sealing resin 10 for connecting the u-wire 9 to establish electrical continuity and ensuring reliability such as mechanical strength and moisture resistance. It is sealed by.

【0010】ここで、AINの熱伝導率は230W/m
・kと従来、放熱板に用いられるAl(熱伝導率は20
5W/m・k)と同レベルであり、基板材料として窒化
アルミニウムを用いることにより放熱板なしで十分な放
熱効果を得ることができる。図2は第2の実施例におけ
る樹脂封止型半導体装置の断面図である。図2における
図1と同じ部材には同じ番号を付して説明は省略する。
本発明の第1の実施例と第2の実施例の相違点は第1の
実施例がAuワイヤで配線基板の外部接続用端子と外部
接続用リードとの電気的導通を成しているのに対し、第
2の実施例は配線基板に直接ハンダ29付けで外部接続
用リード8を接続している事である。さらにもう一つ
は、半導体素子2が配線基板にフリップチップ法により
接続され、COBモジュールが形成されている事であ
る。ハンダ付けによる外部接続用リードの電気的接続
は、外部接続用リード8がリードフレームの状態であら
かじめハンダコートされた配線基板の外部接続用端子7
にハンダリフローにより一括で接続することができ、ま
た、樹脂モールド時に樹脂流れでのワイヤ切れや隣接す
るワイヤ同士のショートもない。そしてCOB実装によ
り半導体素子の電極と配線基板の電極との電気的導通を
成すことで同じくAuワイヤによるトラブルの心配もな
い。
Here, the thermal conductivity of AIN is 230 W / m.
・ K and Al used in the conventional heat sink (heat conductivity is 20
5 W / m · k), and by using aluminum nitride as the substrate material, a sufficient heat dissipation effect can be obtained without a heat dissipation plate. FIG. 2 is a sectional view of a resin-sealed semiconductor device according to the second embodiment. The same members as those in FIG. 1 in FIG. 2 are designated by the same reference numerals and the description thereof is omitted.
The difference between the first embodiment and the second embodiment of the present invention is that the first embodiment uses Au wires to establish electrical continuity between the external connection terminals of the wiring board and the external connection leads. On the other hand, in the second embodiment, the external connection leads 8 are directly connected to the wiring board by soldering 29. Still another is that the semiconductor element 2 is connected to a wiring board by a flip chip method to form a COB module. The electrical connection of the external connection leads by soldering is performed by externally connecting the external connection terminals 8 of the wiring board to which the external connection leads 8 are preliminarily solder-coated in the state of the lead frame.
It is possible to connect all at once by solder reflow, and there is no wire breakage or short circuit between adjacent wires due to resin flow during resin molding. Also, since the electrodes of the semiconductor element and the electrodes of the wiring board are electrically connected by the COB mounting, there is no fear of trouble due to the Au wire.

【0011】以上のようにAuワイヤを用いないこれら
の手法を採用することにより、樹脂封止型半導体装置の
高密度、挟ピッチ化が可能である。
As described above, by adopting these methods which do not use Au wires, the resin-encapsulated semiconductor device can have a high density and a narrow pitch.

【0012】図3は第3の実施例における樹脂封止型半
導体装置の断面図である。図3における図1と同じ部材
には同じ番号を付して説明は省略する。本発明の第1、
及び第2の実施例との相違点は第3の実施例が基板上に
半導体素子2及び抵抗コンデンサ等の各種電子部品12
が搭載されたマルチチップ構造の配線基板を本発明の効
果を得るために配線基板の裏面の一部が露出するかたち
でトランスファモールド成型により封止されている事で
ある。
FIG. 3 is a sectional view of a resin-sealed semiconductor device according to the third embodiment. The same members as those in FIG. 1 in FIG. 3 are designated by the same reference numerals and the description thereof will be omitted. The first of the present invention,
The third embodiment is different from the second embodiment in that the third embodiment has a semiconductor element 2 and various electronic components 12 such as a resistance capacitor on the substrate.
In order to obtain the effect of the present invention, the wiring board having a multi-chip structure mounted with is sealed by transfer molding so that a part of the back surface of the wiring board is exposed.

【0013】なお、本発明の実施例は上記に限定される
ものではなく本発明にかかわる特徴をもっていれば、い
かなる形態においても応用できるものである。
The embodiment of the present invention is not limited to the above, but can be applied in any form as long as it has the features related to the present invention.

【0014】[0014]

【発明の効果】以上より明らかなようにこの発明の放熱
構造を持つ樹脂封止型半導体装置は基板は高放熱性の窒
化アルミニウムを用い、この裏面を封止樹脂から露出さ
せることにより、これが放熱板を兼ねている構造なので
効率よく放熱でき、しかも構造がシンプルであり、低価
格化、薄型化が可能である。したがって、電子部品が高
密度で実装される電子機器の高性能化、高信頼性化低価
格化に貢献できる。
As is apparent from the above, in the resin-sealed semiconductor device having the heat dissipation structure of the present invention, the substrate is made of aluminum nitride having a high heat dissipation property, and the back surface is exposed from the encapsulation resin so that the heat dissipation can be improved. The structure that doubles as a plate allows efficient heat dissipation, and the structure is simple, and the cost and thickness can be reduced. Therefore, it is possible to contribute to higher performance, higher reliability, and lower cost of electronic devices in which electronic components are mounted at high density.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の樹脂封止型半導体装置の断
面図である。
FIG. 1 is a cross-sectional view of a resin-sealed semiconductor device according to an embodiment of the present invention.

【図2】本発明の他の実施例の樹脂封止型半導体装置の
断面図である。
FIG. 2 is a sectional view of a resin-sealed semiconductor device according to another embodiment of the present invention.

【図3】本発明のさらに他の実施例の樹脂封止型半導体
装置の断面図である。
FIG. 3 is a sectional view of a resin-encapsulated semiconductor device according to still another embodiment of the present invention.

【図4】従来の樹脂封止型半導体装置の断面図である。FIG. 4 is a sectional view of a conventional resin-sealed semiconductor device.

【図5】従来の樹脂封止型半導体装置の断面図である。FIG. 5 is a cross-sectional view of a conventional resin-sealed semiconductor device.

【符号の説明】[Explanation of symbols]

1 窒化アルミニウム配線基板 41 ダイパッド 51 アルミナ基板 2、42、52 半導体素子 3、43 Agペーストなどの接着剤 4、44 半導体素子の電極 5 配線基板の電極 6 Auワイヤ 7、57 外部接続用端子 8、48、58 外部接続用リード 9、49、59 Auワイヤ 10、410、510 封止用樹脂 29 ハンダ 411、511 放熱板 12、512 各種電子部品 DESCRIPTION OF SYMBOLS 1 Aluminum nitride wiring board 41 Die pad 51 Alumina substrate 2, 42, 52 Semiconductor element 3, 43 Adhesive such as Ag paste 4, 44 Semiconductor element electrode 5 Wiring board electrode 6 Au wire 7, 57 External connection terminal 8, 48, 58 External connection lead 9, 49, 59 Au wire 10, 410, 510 Sealing resin 29 Solder 411, 511 Heat sink 12, 512 Various electronic parts

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体素子が配線基板に接続されトラン
スファーモールド成型により樹脂封止される樹脂封止型
半導体装置構造において、前記配線基板が窒化アルミニ
ウムより成り、かつ、前記配線基板が封止樹脂より露出
したことを特徴とする樹脂封止型半導体装置。
1. In a resin-sealed semiconductor device structure in which a semiconductor element is connected to a wiring board and resin-sealed by transfer molding, the wiring board is made of aluminum nitride, and the wiring board is made of a sealing resin. A resin-encapsulated semiconductor device, which is exposed.
JP4144708A 1992-06-05 1992-06-05 Resin sealed semiconductor device Pending JPH05343567A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4144708A JPH05343567A (en) 1992-06-05 1992-06-05 Resin sealed semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4144708A JPH05343567A (en) 1992-06-05 1992-06-05 Resin sealed semiconductor device

Publications (1)

Publication Number Publication Date
JPH05343567A true JPH05343567A (en) 1993-12-24

Family

ID=15368445

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4144708A Pending JPH05343567A (en) 1992-06-05 1992-06-05 Resin sealed semiconductor device

Country Status (1)

Country Link
JP (1) JPH05343567A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004228447A (en) * 2003-01-24 2004-08-12 Nec Semiconductors Kyushu Ltd Semiconductor device and method for manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004228447A (en) * 2003-01-24 2004-08-12 Nec Semiconductors Kyushu Ltd Semiconductor device and method for manufacturing the same

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