JPH0533356B2 - - Google Patents
Info
- Publication number
- JPH0533356B2 JPH0533356B2 JP13549284A JP13549284A JPH0533356B2 JP H0533356 B2 JPH0533356 B2 JP H0533356B2 JP 13549284 A JP13549284 A JP 13549284A JP 13549284 A JP13549284 A JP 13549284A JP H0533356 B2 JPH0533356 B2 JP H0533356B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- signal
- output
- amplifier
- wave height
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005855 radiation Effects 0.000 claims description 28
- 238000007493 shaping process Methods 0.000 claims description 27
- 238000001514 detection method Methods 0.000 claims description 21
- 239000004065 semiconductor Substances 0.000 claims description 17
- 238000012937 correction Methods 0.000 claims description 10
- 150000001875 compounds Chemical class 0.000 claims description 8
- 230000003321 amplification Effects 0.000 claims description 7
- 230000006866 deterioration Effects 0.000 claims description 7
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 description 17
- 238000010521 absorption reaction Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 8
- 239000013078 crystal Substances 0.000 description 6
- 230000004044 response Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000006872 improvement Effects 0.000 description 5
- 229910004613 CdTe Inorganic materials 0.000 description 4
- 230000009467 reduction Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229960003671 mercuric iodide Drugs 0.000 description 1
- YFDLHELOZYVNJE-UHFFFAOYSA-L mercury diiodide Chemical compound I[Hg]I YFDLHELOZYVNJE-UHFFFAOYSA-L 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- MYWUZJCMWCOHBA-VIFPVBQESA-N methamphetamine Chemical compound CN[C@@H](C)CC1=CC=CC=C1 MYWUZJCMWCOHBA-VIFPVBQESA-N 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000009206 nuclear medicine Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13549284A JPS6114590A (ja) | 1984-06-30 | 1984-06-30 | 半導体放射線検出装置 |
| EP85107993A EP0167119B1 (fr) | 1984-06-30 | 1985-06-27 | Détecteur de rayonnement à semi-conducteur |
| DE8585107993T DE3584477D1 (de) | 1984-06-30 | 1985-06-27 | Halbleiterstrahlungsdetektor. |
| US06/749,212 US4727256A (en) | 1984-06-30 | 1985-06-27 | Semiconductor radiation detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13549284A JPS6114590A (ja) | 1984-06-30 | 1984-06-30 | 半導体放射線検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6114590A JPS6114590A (ja) | 1986-01-22 |
| JPH0533356B2 true JPH0533356B2 (fr) | 1993-05-19 |
Family
ID=15152997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13549284A Granted JPS6114590A (ja) | 1984-06-30 | 1984-06-30 | 半導体放射線検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6114590A (fr) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4893018A (en) * | 1986-05-21 | 1990-01-09 | Kabushiki Kaisha Toshiba | Radiation detecting circuit including positional error calibrator |
| US4767929A (en) * | 1986-10-06 | 1988-08-30 | The United States Of America As Represented By The United State Department Of Energy | Extended range radiation dose-rate monitor |
| JP2002350552A (ja) * | 2001-05-28 | 2002-12-04 | Mitsubishi Electric Corp | 放射線検出装置 |
| JP2005049144A (ja) * | 2003-07-30 | 2005-02-24 | Toshiba Corp | 放射線計測方法 |
| JP3622967B1 (ja) | 2004-09-02 | 2005-02-23 | 株式会社日立製作所 | 放射線撮像装置 |
| JP4748567B2 (ja) * | 2005-02-25 | 2011-08-17 | 株式会社東芝 | 放射線入射位置検出装置 |
| JP5126739B2 (ja) * | 2007-10-16 | 2013-01-23 | 大学共同利用機関法人 高エネルギー加速器研究機構 | 中性子計測用ガス検出装置 |
| US8183535B2 (en) * | 2009-02-11 | 2012-05-22 | Mats Danielsson | Silicon detector assembly for X-ray imaging |
| CN104020484B (zh) * | 2014-05-20 | 2017-01-04 | 西北核技术研究所 | 一种用于系统触发和波形测量的闪烁探测系统及方法 |
-
1984
- 1984-06-30 JP JP13549284A patent/JPS6114590A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6114590A (ja) | 1986-01-22 |
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