JPH05332941A - Hulling yield measuing method and device - Google Patents

Abstract

PURPOSE:To obtain a method and device for accurately determining how much hulling advanced by calculating the hulling yield of grains with one particulate yield after hulling of one particulate of a raw material. CONSTITUTION:Image data in X, Y, and Z directions of one grain particulate which are picked up by camera devices 18, 19, and 20 are processed by an image processing means 34 to obtain the length data in each direction and an operation means 37 calculates the volume data and weight data of the grain particulate according to the length data. When an arbitrary number of data are obtained, a standard deviation sigma is calculated and then data outside a range which is determined arbitrarily based on the standard deviation sigma is excluded as a faulty data and then an value is calculated using the data remaining within the range. Then, a calculation means 39 compares the reaveraging data before hulling with that after hulling to calculate the yield.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for accurately measuring the polishing yield of cereals, which changes before and after polishing, and an apparatus for measuring the polishing yield by the method.

[0002]

2. Description of the Related Art In the prior art, in particular, in the process of scouring grains and the like, the degree of progress of scouring of grains is determined by the weight of the raw grains before being fed into the scouring device and the grain discharged from the scouring device. The weight was measured and the ratio was calculated as the yield.

Further explaining with reference to FIG. 1, for example, a flow is shown in which batch type flow meters 2 and 3 are provided before and after the polishing device 1. Toe of grain raw material measured by flow meter 2
The weight ratio of the total weight of the tar and the total weight of the grain after milling measured by the flow meter 3 is defined as the yield, and the yield value is used to check how much the milling progressed and the milling time in the milling device 1 was adjusted. I was controlling Shimizu. This example is especially remarkable in the case of brewing for sake brewing, where the brewing time takes 60 hours or 70 hours little by little, and in the brewing method that circulates repeatedly and little by little, this Yield measurement is important.

[0004]

The yield in the prior art as described above is expressed by the total weight ratio before and after the polishing device, and is generally called "apparent yield". On the other hand, the yield obtained by comparing one sized (fully ripe crushed) grain before milling and one sized grain after milling is called "genuine yield". In other words, it should be confirmed by the value of this "genuine yield" that the degree of progress of the polishing and how much the surface texture of the grain has been shaved originally. However, the “apparent yield” is the value of the “product yield” regarding how many products are produced from the raw materials.

In the above-mentioned "apparent yield", what is removed from the raw material grain in the polishing device is not only the surface texture of the raw material grain by the polishing, but also the fragile grain becomes crushed particles and the outside of the polishing device. In some cases, it will be removed, and there will be a big difference when compared to the “genuine yield”. In other words, if this "apparent yield" is treated as a milling yield, the total weight after milling becomes lighter as much as the fragile grains are crushed and removed to the outside of the milling device as described above. Apparently, it will be judged that the progress has been advanced.
This is because even if grains of varieties with the same properties are scoured based on the “apparent yield”, the scouring will be performed depending on the composition of the raw grain, that is, the content ratio of the fragile grain contained in the raw grain. This means that the subsequent sizing yield will be different, and it is impossible to always supply a stable product with the same polishing yield.

In order to measure the "true yield", it is necessary to take out only the sized particles before and after the polishing in order to compare the volume or weight of the sized particles of the raw material before the polishing and the size or weight of the sized particles after the polishing. In order to improve the reliability of the measured values, it is necessary to take out 1000 sized particles before and after polishing, measure their volume or weight, and compare them, and in the prior art, the purpose is to measure this "true yield". There is no suggestion of the method for measuring the yield of luster and the device for measuring the yield of luster.

[0007] From the above, the applicant of the present invention has a practical method for measuring the true yield of starch, which makes it possible to measure the "true yield" that is originally required, regardless of the composition of the raw material grain, and the true yield of the starch extract by the method. The technical problem is to provide a measuring device.

[0008]

Means for Solving the Problems The applicant of the present invention has found that image data in the X, Y, and Z directions acquired from a plurality of measured objects before the polishing process and a plurality of measured objects after the polishing process, respectively. −
Depending on the dimensions in the X, Y, and Z directions obtained by processing the data, the volume data and the standard deviation σ of a plurality of measured objects before the polishing process are performed.
Also, volume data of a plurality of objects to be measured after the polishing process and its standard deviation σ are arithmetically processed, and volume data outside a range arbitrarily determined by the standard deviation σ obtained by the arithmetic processing are excluded. Comparison of the average value of the volume data of a plurality of measured objects before polishing processing and the average value of the volume data of a plurality of measured objects after polishing processing obtained from the volume data after polishing Then, a method for measuring the polishing yield of grains or the like for calculating the polishing yield of the measured object after the polishing treatment is used as a means for solving the above problems.

Further, the X obtained by processing the image data in the X, Y and Z directions taken from each of the plurality of measured objects before the polishing processing and the plurality of measured objects after the polishing processing. ，
By the dimensions in the Y and Z directions and the specific gravities of the plurality of measured objects before the polishing treatment and the specific gravity of the plurality of measured objects after the polishing treatment,
Weight data of a plurality of measured objects before polishing treatment and its standard deviation σ, and weight data of a plurality of measured objects after polishing treatment.
Data and a standard deviation σ thereof are subjected to arithmetic processing, and a plurality of data before the polishing processing obtained from the data after excluding weight data outside a range arbitrarily determined by the standard deviation σ obtained by the arithmetic processing The average value of the weight data of the measured objects and the average value of the weight data of a plurality of measured objects after the polishing treatment are compared to calculate the polishing yield of the measured objects after the polishing treatment. The method for measuring the yield of grains and the like was used as means for solving the above problems.

Further, as an apparatus, a supply unit for supplying the measured objects such as grains and the like one by one, and a measuring position at an arbitrary interval from the supply unit, in the X, Y, Z axis directions of the measured object. A camera device installed in each axial direction to capture image data from the device, an illumination device that illuminates the measurement position from below and around the measurement position, and an exclusion device that excludes the measured object outside the measurement position. And a semitransparent stage on which the object to be measured supplied from the supply unit is placed, and the stage.
A measuring stage section having a driving device capable of moving the measuring section from the supply section to the measuring position of the measuring section, an input section for inputting a known characteristic value of the measured object, and the measured before polishing process. An object to be measured from a plurality of objects to be measured and a plurality of objects to be measured after polishing processing, an image processing means for image data in X, Y and Z directions, the characteristic value and the image data. And a calculating means for calculating the volume or weight of the measurement object and the standard deviation σ, and a calculation means for calculating the polishing yield of the measurement object after the polishing processing from the volume or weight of the measurement object and the standard deviation σ. Means for solving the above-mentioned problems are provided by a polishing precision measuring device comprising a measuring unit, a measuring unit, a measuring stage unit, and a control unit in communication with each of the input units.

[0011]

The operation of the present invention will be described. The applicant of the present invention processes the image data in the X, Y, and Z directions acquired from each of the plurality of measured objects before the polishing processing and the plurality of measured objects after the polishing processing to obtain X. , Y and Z directions, the volume data of a plurality of measured objects before the polishing process and its standard deviation σ and the volume data of a plurality of measured objects after the polishing process and their standard deviation σ And are calculated.

Further, the volumes of a plurality of objects to be measured before the polishing process obtained from the volume data after excluding the volume data outside the range arbitrarily determined by the standard deviation σ obtained by the arithmetic processing. Comparing the average value of the data and the average value of the volume data of a plurality of measured objects after the polishing treatment to calculate the polishing yield of the measured samples after the polishing treatment Distillation measurement method was used.

As a result, the X, Y, and Z directions of the sample grain before the polishing process and the sample grain after the polishing process are obtained by the image data, and the dimensions are calculated and processed. Each grain can be regarded as volume data.

Further, the average value of the volume data of a plurality of grains thus obtained is not used as it is as the volume data of the sized grains, but the standard deviation σ obtained at the same time by the above calculation is used. The average value obtained from the volume data after excluding the volume data outside the range arbitrarily determined by the standard deviation σ is used to compare the volume data outside the range.
That is, it is possible to exclude volume data such as crushed grains having an extremely small volume, foreign grains having an extremely large volume, and foreign substances having an extremely large volume. Only the grains to be sized among the sample grains can be excluded. It has become possible to accurately calculate the yield ratio before and after polishing with the average value of the volume data of.

Further, if each volume data is multiplied by the specific gravity of the grain before the polishing treatment and the specific gravity of the grain after the polishing treatment, the volume data can be regarded as the weight data.

Further, as the apparatus, there are provided a supply unit for supplying grains to be measured one by one, and a measurement position at an arbitrary interval from the supply unit, in the X-, Y-, and Z-axis directions of the measured substance. A camera device installed in each axial direction to capture image data from the device, an illumination device that illuminates the measurement position from below and around the measurement position, and an exclusion device that excludes the measured object outside the measurement position. And a semitransparent stage on which the object to be measured supplied from the supply unit is placed, and the stage.
Measuring stage part having a driving device that is movable from the supply part to the measuring position of the measuring part, an input part for inputting known characteristic values of the measured object, and the measured object. Counting means, image processing means for image data in X, Y and Z directions, computing means for computing the volume or weight of the object to be measured and standard deviation σ from the characteristic value and the image data, and the object to be measured. It has a calculating means for calculating the polishing yield of the object to be measured after the polishing processing from the volume or weight of the object and the standard deviation σ, and communicates with each of the supply section, the measuring section, the measuring stage section and the input section. A concentrating device for measuring the yield of luster was constructed from the control unit.

The lumber sperm yield measuring device thus constructed is
Measure multiple objects to be measured before polishing treatment such as grains and multiple objects to be measured after polishing treatment, but since the action is the same regardless of the grain before and after polishing treatment, only one And

When one grain is supplied to the translucent stage of the measurement stage from the supply unit for supplying the grain one by one, the driving device of the supply unit is operated to cause the above-mentioned stage. Is moved from the supply unit to the measuring position of the measuring unit. At the measurement position, the grain is illuminated from below and around the measurement position by the illumination device of the measurement unit. The illuminated grain is imaged by a camera device installed in each axial direction so as to capture image data of the grain from the X, Y, and Z axis directions with respect to the grain of the stage. The grain whose imaging has been completed is excluded to the outside of the measuring unit by the measuring unit excluding device. This exclusion may be carried out immediately after the imaging is finished or after completion of the calculation of the volume data or the weight data of the polishing precision measuring device. In the latter case, the volume data is removed. Alternatively, it is possible to classify based on the value of the weight data.

When the grain is removed by the removing device of the measuring unit, the measuring stage unit operates the driving device to move the stage to the supplying unit. The next grain is supplied from the supply unit, and the measurement in the measurement unit is started again. The polishing precision measuring device repeats the above by the control of the control unit.

The data of the grain thus measured is calculated by the control unit as follows. The image data of one grain in the X, Y, Z directions imaged by the camera device is image-processed by the image processing means, and X, Y,
The data has a length in the Z direction. The volume data of the grain is obtained by the calculating means from the data of this length. If the specific gravity of the grain is input by the input means,
The weight data can be calculated from the data. At this time, the excluding device can be controlled and classified based on the data obtained by the calculation.

When the data thus obtained reaches an arbitrary number of data, for example, 1000 grains by the counting means, the data for 1000 grains is also similarly calculated by the computing means.
The standard deviation σ of the data is calculated. Furthermore, data outside the range arbitrarily determined based on this standard deviation σ, for example, data outside the range exceeding ± 3σ is excluded as defective data, and the average value is calculated with the data within the remaining range. To do. Next, by calculation means,
The average value data calculated as described above is compared with the average data obtained in the same manner as the raw grain before being put into the polishing device to calculate the yield.

The yield obtained by this yield calculation is volume data or weight data obtained by measuring each grain by image data, and is the raw material before the polishing process. It is the "true yield" obtained by comparing the data of one grain of grain with the data of one grain of grain after polishing treatment.

By the way, the measuring station in the supplying section in the previous term
If the object to be measured detection device is provided at the position and the supply unit is contacted via the control device, when the sensor of the device to be measured detection unit detects the fall of the grain, the supply unit is stopped at the same time. Therefore, it is possible to surely feed the grains one by one onto the stage.

[0024]

Embodiments of the present invention will be described with reference to FIGS. First, the outline of the device will be described with reference to FIG.

The milling yield measuring device 10 vibrates the feeder trough 11 and the feeder trough 11 regularly in order to supply an object to be measured such as a grain so that it can be measured grain by grain. It is equipped with a supply unit 13 composed of a vibrator 12 and a semi-transparent stage 14 on which an object to be measured supplied from the supply unit 13 is placed and the stage 14 from the supply unit 13 to a measuring position 15. A measuring stage unit 17 having a movable driving device 16 is provided.

At the measuring position 15 spaced from the supply unit 11 by an arbitrary distance, X, X of the object to be measured on the stage 14 are measured.
A camera device 18, 19, 20 is installed in each axial direction so as to capture image data from the Y and Z axis directions, and an illuminating device 21 for illuminating an object to be measured from below and around the stage 14. 22 and 23 are provided. Further, in order to exclude the object to be measured after measurement from the measurement position 15, an exclusion device 26 including an exclusion arm 24 and an arm driving device 25 for rotationally driving the exclusion arm 24 is provided. 18, 19,
The measuring unit 27 is composed of 20, the lighting devices 21, 22, 23, and the excluding device 26.

The object to be measured, which is removed from the measuring section 27 after the measurement is completed, is excluded to the outside by the excluding device 26, and in that direction, sorting can be performed based on the measurement result of the polishing yield measuring device 10. , A receiving box 28 divided into a plurality of parts, a rail 29 that allows the receiving box 28 to slide left and right, a belt 30 fixed to the receiving box 28, and the belt 30 are stretched to move the receiving box 28 left and right. The selecting unit 32 is configured by the drive motor 31 described above.

The control unit 35 will be described with reference to FIG. FIG. 2 is a block diagram for explaining the control unit 35. A CPU 33 is provided at the center of the control unit 35, and the CPU 33 is first provided with the camera device 18, 19, 20.
Is connected to the CPU 35 through the image processing means 34 for processing the image data and the counting means 36 for counting the number of measured objects. Counting means 36 here
Is a signal output to the CPU 35 when a prescribed number of image data is measured. Further, the calculating means 37 for calculating the volume or weight of the object to be measured and the standard deviation σ from the characteristic values of the object to be measured and the image data obtained from the image processing means 34, and the results of these operations and the object to be measured. The storing means 38 for storing the characteristic value of the measuring means, and the volume or weight of the measuring object and the standard deviation σ obtained by the calculating means 37 of the storing means in response to the signal of the counting means. The calculating means 39 for calculating the stay is provided, and the input means 41 for inputting the characteristic value of the object to be measured through the I / O port 40, the supplying portion 13, the measuring stage portion 17, and the measuring portion. 27 is connected.

Luminaceous yield measuring device 10 constructed as described above
Measures a plurality of measured objects before grain polishing and a plurality of measured objects after grain polishing, respectively, but since the action is the same regardless of the grain before and after the grain processing, Only one.

When one grain is supplied from the supply unit 13 for supplying the grains one by one to the semitransparent stage 14 of the measuring stage unit 17, the drive unit 16 of the supply unit 13 operates. ,
The stage 14 is moved from the supply unit 13 to the measuring position 15 of the measuring unit 27. At the measurement position 15, the illumination devices 21, 22, 23 of the measurement unit 27 are measured from below and around the measurement position 15.
The grain is illuminated by. The illuminated grains are
A camera device 1 installed in each axial direction so as to capture image data of the kernel from the X, Y, and Z axis directions with respect to the grain of Ji 14
Imaged by 8, 19, 20.

The grain whose imaging has been completed is excluded to the outside of the measuring unit 27 by the excluding device 26 of the measuring unit 27. This elimination may be carried out immediately after the imaging is finished, or may be eliminated after the calculation of the volume data or the weight data of the polishing precision measuring device 10 is finished, but in the latter case, the volume data is eliminated.
It is also possible to sort based on the value of the data or the weight data.

In the division based on the value of the volume data or the weight data, each of the plurality of receiving boxes 28 is made to correspond in advance by the data, and driven according to the measured data. Exclusion device 2 by driving motor 31 and stopping it at a position for discharging corresponding receiving box 28
6 is activated.

When the removing device 26 of the measuring unit 27 removes the grains, the measuring stage unit 17 causes the driving device 16 to move.
Is operated to move the stage 14 to the supply unit 13. The next grain is supplied from the supply unit 13, and the measurement in the measurement unit 27 is started again. The above-described repetition is performed under the control of the control unit 35, and the starch-refined yield measuring device 10 operates.

The thus measured grain data is processed by the control unit 35 as follows. The image data in the X, Y, Z directions of one grain imaged by the camera devices 18, 19, 20 is image-processed by the image processing means 34, and the data of the lengths in the X, Y, Z directions is obtained. It is said that. The calculation means 37 calculates the volume data of the grain based on the data of this length. Further, if the specific gravity of the grain is input by the input means 41, the weight data can be calculated from the previous volume data. At this time, the data calculated
The exclusion device 26 can be controlled and classified based on the data.

The calculation of the volume data and the weight data will be described with reference to FIG. The one shown in FIG. 5 is a grain,
Especially, rice grains are taken as an example here. Camera device 18,
The data in the X, Y and Z directions imaged by 19, 20 are subjected to image processing by the image processing means 34 as data of respective lengths. The volume data Vb, Vw can be obtained from the following equations by the image-processed data in the X, Y, Z directions. Where Vb is the volume data of the raw brown rice
w represents the volume data of the polished rice after polishing.

[0036]

[Formula 1] Further, by multiplying these by the specific gravity ρb of the raw brown rice or the specific gravity ρw of the polished rice after polishing, the weight data Wb and Ww can be obtained.

[0037]

[Formula 2] Further, from the comparison of the volume data Vb or the weight data Ww, the calculating means 39 can obtain the polishing yield P by the following equation.

[0038]

[Formula 3] The data obtained by the arithmetic processing is stored in the storage means 38.
Is stored in, and is read by the computing means 37 after waiting for the count-up signal of the counting means 36.

Now, the processing of the data thus obtained will be described with reference to FIG. When this weight data or volume data is counted up by the counting means 36 and reaches an arbitrary number of data, for example, 1000 grains, the computing means 37 similarly computes the standard deviation σ of the data for 1000 grains. .. Further, data outside the range arbitrarily determined based on this standard deviation σ, for example, the range exceeding ± 3σ is excluded as defective data, and the average value is re-calculated with the data within the remaining range. Calculate In this way, using the standard deviation σ obtained at the same time in the above calculation, the average values obtained from the volume data after excluding the volume data outside the range arbitrarily determined by the standard deviation σ are compared. I did so,
It is possible to exclude volume data outside the above range, that is, extremely small volume like crushed grains, or extremely large volume different grains, foreign matter like volume data, among the sample grains, It has become possible to accurately calculate the polishing yield before and after polishing using the average value of the volume data of only the grain to be sized. The calculated re-average value is stored in the storage means 38.

The re-average value data calculated by the calculating means 37 is also obtained in the same manner as the re-average value data of the raw grain before being put into the polishing device. Next, in the calculation means 39,
Yield is calculated by comparing the re-averaged data before and after re-polishing. The yield obtained by this yield calculation is volume data or weight data obtained by measuring each grain by image data, and it is one of the raw grains before the polishing process. It is the "true yield" obtained by comparing the grain data with the grain data after the polishing process.

By the way, when the object-to-be-measured device 42 is provided at the position of the measuring stage 14 in the supply unit 13 and the supply unit 13 is communicated through the control unit 35, the fall of the grain is measured. When the sensor 42 of the detection device detects, it is possible to stop the supply part 13 at the same time, and
Grains can be surely supplied onto the dice one by one.

[0042]

As described above, the yield obtained by this calculation is the volume data or the weight data obtained by measuring each grain by image data. It is the "true yield" obtained by comparing the data of one grain of raw grain before treatment with the data of one grain of grain after polishing treatment. Therefore, it does not include a decrease in the amount of grains discharged to the outside of the polishing device, which should not be included in the yield calculation as in the prior art, and the data used for the yield calculation is not manually included. Since the grains are directly read by the image data, it is possible to "calculate the true yield" in a short time. With the data of the "genuine yield" obtained in this way, it is possible to accurately control the yield rate and set the exact operation of the strainer.

[Brief description of drawings]

FIG. 1 is a flow chart of an apparatus showing a prior art.

FIG. 2 is a block diagram showing a control unit of the present invention.

FIG. 3 is a view showing a polishing yield measuring device of the present invention.

FIG. 4 is a diagram showing data processing according to the standard deviation of the present invention.

FIG. 5 is an example of a grain showing a length obtained by image processing of the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 polishing device 2 flow meter 3 flow meter 10 polishing device yield measuring device 11 feeder trough 12 vibrator 13 supply part 14 translucent stage 15 measuring position 16 driving device 17 measuring stage part 18 camera device 19 Camera Device 20 Camera Device 21 Illumination Device 22 Illumination Device 23 Illumination Device 24 Exclusion Arm 25 Arm Drive Device 26 Exclusion Device 27 Measuring Unit 28 Receiving Box 29 Rail 30 Belt 31 Driving Motor 32 Sorting Unit 33 CPU 34 Image processing means 35 Control section 36 Counting means 37 Computing means 38 Storage means 39 Calculation means 40 I / O port 41 Input means 42 Measured object detecting device (sensor)

Claims (4)

[Claims] 1. An X obtained by processing image data in the X, Y, and Z directions taken from each of a plurality of measured objects before the polishing processing and a plurality of measured objects after the polishing processing. ，
Depending on the dimensions in the Y and Z directions, the volume data of the plurality of objects to be measured before the polishing process and its standard deviation σ, and the volume data of the plurality of objects to be measured after the polishing process and their standard deviation σ are obtained. And the volume of a plurality of measured objects obtained from the volume data after excluding the volume data outside the range arbitrarily determined by the standard deviation σ obtained by the arithmetic processing. It is characterized in that the average value of the data and the average value of the volume data of the plurality of measured objects after the polishing treatment are compared to calculate the polishing yield of the measured object after the polishing treatment. A method for measuring the yield of grains such as grains. 2. An X obtained by processing image data in the X, Y and Z directions taken from each of a plurality of measured objects before the polishing processing and a plurality of measured objects after the polishing processing. ，
By the dimensions in the Y and Z directions and the specific gravities of the plurality of measured objects before the polishing treatment and the specific gravity of the plurality of measured objects after the polishing treatment,
The weight data of a plurality of objects to be measured and its standard deviation σ before the polishing process and the weight data of a plurality of objects to be measured and their standard deviation σ after the polishing process are arithmetically processed, and the arithmetic processing is performed. The average value of the weights of a plurality of objects to be measured before the polishing treatment and the average of the weights after the polishing treatment obtained from the data after excluding weight data outside the range arbitrarily determined by the standard deviation σ obtained by A method for measuring the yield of grains or the like, which comprises calculating an average yield of the measured substances after the polishing treatment by comparing the average value of the weight of each measured substance. 3. A supply unit for supplying an object to be measured, such as grains, one by one, and a measurement position at an arbitrary interval from the supply unit, and an image data is obtained from the X, Y, Z axis directions of the object to be measured. -Measurement including a camera device installed in each axial direction so as to capture the data, an illumination device that illuminates the measurement position from below and around the measurement position, and an exclusion device that excludes the measured object outside the measurement position. Section, a translucent stage on which an object to be measured supplied from the supply section is placed, and a drive unit capable of moving the stage from the supply section to the measurement position of the measurement section. A measuring section, an input section for inputting known characteristic values of the object to be measured, counting means for measuring a plurality of measured objects, image processing means for image data in X, Y and Z directions; Calculation of the volume or weight of the object to be measured and the standard deviation σ from the characteristic values and image data It has a calculating means for performing and a calculating means for calculating the polishing yield of the measured object after the polishing processing from the volume or weight of the measured object and the standard deviation σ, and the supplying section, the measuring section and the measuring stage section. And a control unit that communicates with each of the input unit, and a polishing precision yield measuring device. 4. The milling yield measuring device according to claim 3, wherein the measuring stage in the supply unit is provided with an object-to-be-measured device, the object-to-be-measured detecting device passing through the controller. Measuring device which contacted the supply department.