JPH05315732A - Manufacture of wiring board - Google Patents
Manufacture of wiring boardInfo
- Publication number
- JPH05315732A JPH05315732A JP14697592A JP14697592A JPH05315732A JP H05315732 A JPH05315732 A JP H05315732A JP 14697592 A JP14697592 A JP 14697592A JP 14697592 A JP14697592 A JP 14697592A JP H05315732 A JPH05315732 A JP H05315732A
- Authority
- JP
- Japan
- Prior art keywords
- wiring pattern
- resin film
- photosensitive resin
- magnetic
- insulating substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、配線基板の製造方法
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board manufacturing method.
【0002】[0002]
【従来の技術】配線基板の一つとして、絶縁基板上に配
線パターンを形成し、この配線パターン以外の絶縁基板
表面を配線パターンより厚い保護膜で覆ったものがあ
る。この配線基板は半田バンプを有するICチップとの
接続などに用いられるもので、配線パターンより厚く形
成された保護膜は、配線パターンに対する半田バンプの
溶融接続時、半田が配線パターン上以外の部分に流れ出
ないように、流れ止めの役目を果すとともに、絶縁基板
表面を保護する役目をも備えている。2. Description of the Related Art As one of wiring boards, there is one in which a wiring pattern is formed on an insulating substrate and the surface of the insulating substrate other than this wiring pattern is covered with a protective film thicker than the wiring pattern. This wiring board is used for connection with an IC chip having solder bumps, and the protective film formed to be thicker than the wiring pattern has a solder on a portion other than the wiring pattern when the solder bump is melt-bonded to the wiring pattern. In addition to serving as a flow stop so as not to flow out, it also serves to protect the surface of the insulating substrate.
【0003】このような配線基板は、従来、図7ないし
図9に示すようにして製造されている。まず図7に示す
ように、絶縁基板1上に配線パターン2を形成する。次
に、配線パターン2の上面を含む絶縁基板1上の表面に
図8に示すようにネガ型の感光性樹脂膜3を形成する。
そして、この感光性樹脂膜3の上方にフォトマスク4を
設ける。このとき、フォトマスク4は、配線パターン2
の上方に遮光部4aが位置するとともに、配線パターン
2相互間など配線パターン2の上方以外の部分に透光部
4bが位置するように構成されている。しかる後、フォ
トマスク4を通して紫外光等の光を用いて感光性樹脂膜
3を露光する。これにより感光性樹脂膜3は、配線パタ
ーン2の上面以外の部分だけが光照射により硬化する。
したがって、次に感光性樹脂膜3を現像すると、図9に
示すように、配線パターン2の上面の感光性樹脂膜3が
除去され、配線パターン2の上面以外の感光性樹脂膜3
だけが残り、この残存感光性樹脂膜3により配線パター
ン2の上面以外に保護膜が完成する。かくして、配線パ
ターン2の上面以外に保護膜で覆った配線基板が完成す
る。Conventionally, such a wiring board is manufactured as shown in FIGS. First, as shown in FIG. 7, the wiring pattern 2 is formed on the insulating substrate 1. Next, as shown in FIG. 8, a negative photosensitive resin film 3 is formed on the surface of the insulating substrate 1 including the upper surface of the wiring pattern 2.
Then, a photomask 4 is provided above the photosensitive resin film 3. At this time, the photomask 4 has the wiring pattern 2
The light shielding portion 4a is located above the wiring pattern 2 and the light transmitting portion 4b is located in a portion other than above the wiring pattern 2 such as between the wiring patterns 2. Thereafter, the photosensitive resin film 3 is exposed to light such as ultraviolet light through the photomask 4. As a result, the photosensitive resin film 3 is cured by light irradiation only in the portion other than the upper surface of the wiring pattern 2.
Therefore, when the photosensitive resin film 3 is developed next, as shown in FIG. 9, the photosensitive resin film 3 on the upper surface of the wiring pattern 2 is removed, and the photosensitive resin film 3 other than the upper surface of the wiring pattern 2 is removed.
The remaining photosensitive resin film 3 completes the protective film except the upper surface of the wiring pattern 2. In this way, the wiring substrate having the wiring pattern 2 other than the upper surface covered with the protective film is completed.
【0004】[0004]
【発明が解決しようとする課題】しかるに、上記のよう
な従来の製造方法では、図10に示すようにフォトマス
ク4が位置ずれを起こした場合に、図11に示すように
保護膜(残存感光性樹脂膜3)が配線パターン2の上面
に一部重なって形成されたり、保護膜と配線パターン2
間にすき間ができたりすることが有り、保護膜を配線パ
ターン2の上面以外の部分に正確に形成することが困難
であった。特に、フォトマスク4の位置精度が±50μ
m程度であるため、例えば幅50μm、ピッチ100μ
mの微細な配線パターン2においては、配線パターン2
間に正確に保護膜を形成することは甚だ困難となる。そ
して、図11のようにずれが生じると、配線パターン2
上にICチップの半田バンプを溶融接続したときに、配
線パターン2上に半田バンプが正確に位置せず、接続の
信頼性が低下するとともに、半田がすき間(絶縁基板
1)上に流れ出てしまうなどの障害が発生し、また、絶
縁基板のうちで保護膜で覆われずに露出された部分が保
護されないといった問題が発生する。However, in the conventional manufacturing method as described above, when the photomask 4 is displaced as shown in FIG. 10, as shown in FIG. Resin film 3) partially overlaps the upper surface of the wiring pattern 2, or the protective film and the wiring pattern 2 are formed.
A gap may be formed in some cases, which makes it difficult to accurately form the protective film on a portion other than the upper surface of the wiring pattern 2. Especially, the positional accuracy of the photomask 4 is ± 50μ.
Since it is about m, for example, width 50 μm, pitch 100 μ
In the fine wiring pattern 2 of m, the wiring pattern 2
It is very difficult to form the protective film accurately. Then, when the displacement occurs as shown in FIG. 11, the wiring pattern 2
When the solder bumps of the IC chip are fused and connected to the upper side, the solder bumps are not accurately positioned on the wiring pattern 2, the reliability of the connection is lowered, and the solder flows out into the gap (insulating substrate 1). However, there is a problem that the exposed portion of the insulating substrate that is not covered with the protective film is not protected.
【0005】なお、絶縁基板1の裏面側から配線パター
ン2をフォトマスクとして感光性樹脂膜3を露光し、現
像することにより、配線パターン2の上面以外の部分に
配線パターン2と自己整合的に保護膜を形成することも
考えられるが、その場合には絶縁基板1が透光性を有す
る必要があり、絶縁基板1が透光性を有さない場合には
この方法は採用できない。The photosensitive resin film 3 is exposed from the back surface side of the insulating substrate 1 using the wiring pattern 2 as a photomask and developed, so that portions other than the upper surface of the wiring pattern 2 are self-aligned with the wiring pattern 2. It is conceivable to form a protective film, but in that case the insulating substrate 1 needs to have a light-transmitting property, and if the insulating substrate 1 does not have a light-transmitting property, this method cannot be adopted.
【0006】この発明の目的は、配線パターンの上面以
外の部分に保護膜を正確に形成できる配線基板の製造方
法を提供することにある。An object of the present invention is to provide a method of manufacturing a wiring board which can form a protective film accurately on a portion other than the upper surface of a wiring pattern.
【0007】[0007]
【課題を解決するための手段】この発明は、絶縁基板上
に少なくとも一部の層が磁性体から構成される配線パタ
ーンを形成した後、前記配線パターンの上面を含む前記
絶縁基板上の表面にネガ型感光性の樹脂膜を形成し、こ
の樹脂膜の上面に多数の磁性体粒子を設けた後、磁界を
作用させることにより前記樹脂膜の上面のうちの前記配
線パターンの上方に位置する前記磁性体粒子を磁力によ
り固定し、その状態で前記樹脂膜の上面のうちの前記配
線パターンの上方に位置しない前記磁性体粒子を除去
し、その後残存した前記磁性体粒子をフォトマスクとし
て前記樹脂膜を露光し、次いで現像することにより残存
する前記磁性体粒子とともに前記配線パターンの上面の
前記樹脂膜を除去して、前記配線パターンの上面以外の
部分に前記樹脂膜を残すようにしたものである。According to the present invention, after forming a wiring pattern having at least a part of a layer made of a magnetic material on an insulating substrate, the wiring pattern is formed on the surface of the insulating substrate including the upper surface of the wiring pattern. A negative photosensitive resin film is formed, and a large number of magnetic particles are provided on the upper surface of the resin film, and then a magnetic field is applied to position the upper surface of the resin film above the wiring pattern. The magnetic particles are fixed by magnetic force, the magnetic particles that are not located above the wiring pattern on the upper surface of the resin film in that state are removed, and then the remaining magnetic particles are used as a photomask for the resin film. The resin film on the upper surface of the wiring pattern is removed together with the remaining magnetic particles by exposing and then developing the resin film on a portion other than the upper surface of the wiring pattern. It is obtained by the Suyo.
【0008】[0008]
【作用】この発明によれば、磁界を作用させると、少な
くとも一部の層が磁性体から構成される配線パターンに
磁束が集中するので、この配線パターンの上方に位置す
る磁性体粒子は磁力により感光性樹脂膜上面に固定され
るようになり、その状態で配線パターンの上方に位置し
ない磁性体粒子を真空吸引等で除去することにより、配
線パターンの上方の感光性樹脂膜上面に磁性体粒子で自
己整合的にフォトマスクを正確に形成できる。したがっ
て、このフォトマスクを用いて感光性樹脂膜を露光し、
現像することにより、残存する磁性体粒子とともに配線
パターンの上面の感光性樹脂膜のみを正確に除去し、配
線パターンの上面以外の部分にのみ正確に感光性樹脂膜
を保護膜として残すことができる。According to the present invention, when a magnetic field is applied, magnetic flux concentrates on the wiring pattern having at least a part of the layer made of a magnetic material. The magnetic particles that are fixed to the upper surface of the photosensitive resin film and are not located above the wiring pattern in that state are removed by vacuum suction or the like. The photomask can be accurately formed in a self-aligning manner. Therefore, using this photomask to expose the photosensitive resin film,
By developing, it is possible to accurately remove only the photosensitive resin film on the upper surface of the wiring pattern together with the remaining magnetic particles, and accurately leave the photosensitive resin film as a protective film only on the portion other than the upper surface of the wiring pattern. ..
【0009】[0009]
【実施例】図1ないし図5はこの発明の一実施例を工程
順に示す断面図である。これらの図を参照して以下この
発明の一実施例を説明する。まず図1に示すように、樹
脂またはセラミック等からなる絶縁基板11上に銅等の
金属からなる金属パターン12を公知のフォトリソグラ
フィ法で配線パターン状に形成する。次に、金属パター
ン12の表面にニッケルまたはパーマロイ(ニッケルと
鉄の合金)等よりなる磁性体膜13をめっき、例えば電
解めっきにより形成する。これにより、絶縁基板11上
に、銅等の金属パターン12と磁性体膜13からなる2
層構造の配線パターン14が完成する。次に、配線パタ
ーン14の上面を含む絶縁基板11上の表面にロールコ
ートまたはスピンコート等により、図2に示すようにネ
ガ型の感光性樹脂膜15を形成する。そして、この感光
性樹脂膜15上に鉄等よりなる磁性体粒子16を散布す
る。1 to 5 are sectional views showing an embodiment of the present invention in the order of steps. An embodiment of the present invention will be described below with reference to these drawings. First, as shown in FIG. 1, a metal pattern 12 made of a metal such as copper is formed in a wiring pattern shape on an insulating substrate 11 made of resin or ceramic by a known photolithography method. Next, a magnetic film 13 made of nickel or permalloy (alloy of nickel and iron) or the like is formed on the surface of the metal pattern 12 by plating, for example, electrolytic plating. As a result, a metal pattern 12 made of copper or the like and a magnetic film 13 are formed on the insulating substrate 11.
The wiring pattern 14 having a layered structure is completed. Next, a negative photosensitive resin film 15 is formed on the surface of the insulating substrate 11 including the upper surface of the wiring pattern 14 by roll coating or spin coating, as shown in FIG. Then, magnetic particles 16 made of iron or the like are dispersed on the photosensitive resin film 15.
【0010】しかる後、絶縁基板11の上方と下方との
間で磁界を発生させる。すると、これにより生じた絶縁
基板11を貫く磁束は図3に矢印で示すように磁性体膜
13を有する配線パターン14に集中することになり、
したがって、配線パターン14の上方の磁性体粒子16
は磁力により感光性樹脂膜15上面に固定されることに
なる。しかる後、このまま磁界を発生させた状態で、感
光性樹脂膜15上面のうちの配線パターン14の上方以
外の磁束の少ない部分に位置する磁性体粒子16を、配
線パターン14の上方の磁性体粒子16を吸い取らない
程度の真空圧で吸引除去する。この吸引除去後の状態が
図3に示されている。After that, a magnetic field is generated between above and below the insulating substrate 11. Then, the magnetic flux penetrating the insulating substrate 11 thus generated is concentrated on the wiring pattern 14 having the magnetic film 13 as indicated by an arrow in FIG.
Therefore, the magnetic particles 16 above the wiring pattern 14
Will be fixed to the upper surface of the photosensitive resin film 15 by the magnetic force. Then, with the magnetic field being generated as it is, the magnetic particles 16 located on the upper surface of the photosensitive resin film 15 other than above the wiring pattern 14 where the magnetic flux is small are replaced with the magnetic particles above the wiring pattern 14. Suction and remove 16 with a vacuum pressure that does not suck up. The state after the removal by suction is shown in FIG.
【0011】しかる後、このまま磁界を発生させた状態
あるいは磁界をなくした状態(どちらでもよい)で、配
線パターン14の上方の感光性樹脂膜15上面の磁性体
粒子16をフォトマスクとして図4に示すように紫外光
等の光により感光性樹脂膜15を露光する。これにより
感光性樹脂膜15は、配線パターン14の上面以外の部
分だけが光照射により硬化する。したがって、次に感光
性樹脂膜15を現像すると、図5に示すように、残存す
る磁性体粒子とともに配線パターン14の上面の感光性
樹脂膜15が除去され、配線パターン14の上面以外の
感光性樹脂膜15だけが残り、この残存感光性樹脂膜1
5により配線パターンの上面以外に保護膜が完成する。
かくして、配線パターン14の上面を保護膜で覆った配
線基板が完成する。Then, in the state where the magnetic field is generated as it is or the state where the magnetic field is eliminated (whichever is acceptable), the magnetic particles 16 on the upper surface of the photosensitive resin film 15 above the wiring pattern 14 are used as a photomask in FIG. As shown, the photosensitive resin film 15 is exposed to light such as ultraviolet light. As a result, only the portion of the photosensitive resin film 15 other than the upper surface of the wiring pattern 14 is cured by light irradiation. Therefore, when the photosensitive resin film 15 is developed next, the photosensitive resin film 15 on the upper surface of the wiring pattern 14 is removed together with the remaining magnetic particles as shown in FIG. Only the resin film 15 remains, and the remaining photosensitive resin film 1
By 5, the protective film is completed on the part other than the upper surface of the wiring pattern.
Thus, the wiring board in which the upper surface of the wiring pattern 14 is covered with the protective film is completed.
【0012】上記のような製造方法によれば、絶縁基板
11の上方と下方との間で磁界を発生させた際の絶縁基
板11を貫く磁束が配線パターン14に集中して、この
配線パターン14上の磁性体粒子16が感光性樹脂膜1
5上面に磁力により固定されることを利用して、配線パ
ターン14の上方の感光性樹脂膜15上面に磁性体粒子
16で自己整合的に正確に露光用のフオトマスクを形成
できるから、このフォトマスクを用いて感光性樹脂膜1
5を露光し、現像することにより、配線パターン14の
上面以外の部分に正確に感光性樹脂膜15を残して正確
に保護膜を形成できる。したがって、上記製造方法によ
る配線基板上に図6に示すように半田バンプ21を有す
るICチップ22をマウントした場合は、配線パターン
14上に半田バンプ21が正確に位置合わせされ、接続
の信頼性が向上すると共に、半田が絶縁基板11上に流
れ出ることは保護膜(感光性樹脂膜15)で確実に防止
される。また、絶縁基板11上における配線パターン1
4相互間の部分は保護膜によって完全に覆われるので、
絶縁基板11の表面を確実に保護することができる。According to the manufacturing method as described above, the magnetic flux penetrating the insulating substrate 11 when the magnetic field is generated between the upper side and the lower side of the insulating substrate 11 is concentrated on the wiring pattern 14 and the wiring pattern 14 is formed. The upper magnetic particles 16 are the photosensitive resin film 1
Since a photomask for exposure can be accurately formed in a self-aligned manner with the magnetic particles 16 on the upper surface of the photosensitive resin film 15 above the wiring pattern 14 by being fixed to the upper surface of the photomask by magnetic force. Using a photosensitive resin film 1
By exposing and developing 5, the protective film can be accurately formed by leaving the photosensitive resin film 15 on the portion other than the upper surface of the wiring pattern 14 accurately. Therefore, when the IC chip 22 having the solder bumps 21 is mounted on the wiring board by the above manufacturing method as shown in FIG. 6, the solder bumps 21 are accurately aligned on the wiring pattern 14 and the reliability of connection is improved. At the same time, the protective film (photosensitive resin film 15) reliably prevents the solder from flowing out onto the insulating substrate 11. In addition, the wiring pattern 1 on the insulating substrate 11
Since the part between 4 is completely covered by the protective film,
The surface of the insulating substrate 11 can be reliably protected.
【0013】なお、上記一実施例では、配線パターン1
4の表面層のみを磁性体膜13で形成したが、配線パタ
ーンの全体を磁性体膜で形成してもよい。In the above embodiment, the wiring pattern 1
Although only the surface layer of No. 4 is formed of the magnetic film 13, the entire wiring pattern may be formed of the magnetic film.
【0014】[0014]
【発明の効果】以上説明したように、この発明によれ
ば、配線パターンの上方の感光性樹脂膜上面に磁性体粒
子によって自己整合的に正確にフォトマスクを形成でき
るから、配線パターンの上面以外の部分に正確に感光性
樹脂膜を残して正確に保護膜を形成でき、例えば半田バ
ンプを有するICチップをマウントした時にマウント状
態を良好にすることができる。As described above, according to the present invention, a photomask can be accurately formed in a self-aligned manner by magnetic particles on the upper surface of the photosensitive resin film above the wiring pattern. The protective film can be accurately formed by leaving the photosensitive resin film exactly at the portion, and the mounted state can be improved when the IC chip having the solder bump is mounted, for example.
【図1】この発明の一実施例において、配線パターン形
成工程までを示す断面図。FIG. 1 is a cross-sectional view showing a wiring pattern forming step in an embodiment of the present invention.
【図2】この発明の一実施例において、図1に続く工程
を示す断面図。FIG. 2 is a cross-sectional view showing a step that follows FIG. 1 in one embodiment of the present invention.
【図3】この発明の一実施例において、図2に続く工程
を示す断面図。FIG. 3 is a cross-sectional view showing a step that follows FIG. 2 in one embodiment of the present invention.
【図4】この発明の一実施例において、図3に続く工程
を示す断面図。FIG. 4 is a cross-sectional view showing a step that follows FIG. 3 in one embodiment of the present invention.
【図5】この発明の一実施例において、図4に続く工程
を示す断面図。5 is a cross-sectional view showing a step that follows FIG. 4 in an embodiment of the present invention. FIG.
【図6】この発明の一実施例により製造された配線基板
上にICチップをマウントした状態を示す断面図。FIG. 6 is a sectional view showing a state in which an IC chip is mounted on a wiring board manufactured according to an embodiment of the present invention.
【図7】従来の製造方法において、配線パターン形成工
程までを示す断面図。FIG. 7 is a cross-sectional view showing a wiring pattern forming step in a conventional manufacturing method.
【図8】従来の製造方法において、図7に続く工程を示
す断面図。FIG. 8 is a cross-sectional view showing a step that follows the step of FIG. 7 in a conventional manufacturing method.
【図9】従来の製造方法において、図8に続く工程を示
す断面図。FIG. 9 is a cross-sectional view showing a step that follows the step of FIG. 8 in the conventional manufacturing method.
【図10】従来の製造方法において、フォトマスクにず
れが生じた状態を示す断面図。FIG. 10 is a cross-sectional view showing a state where a photomask is displaced in a conventional manufacturing method.
【図11】従来の製造方法において、保護膜にずれが生
じた状態を示す断面図。FIG. 11 is a cross-sectional view showing a state in which the protective film is displaced in the conventional manufacturing method.
11 絶縁基板 13 磁性体膜 14 配線パターン 15 感光性樹脂膜 16 磁性体粒子 11 Insulating Substrate 13 Magnetic Film 14 Wiring Pattern 15 Photosensitive Resin Film 16 Magnetic Particles
Claims (1)
体から構成される配線パターンを形成した後、前記配線
パターンの上面を含む前記絶縁基板上の表面にネガ型感
光性の樹脂膜を形成し、この樹脂膜の上面に多数の磁性
体粒子を設けた後、磁界を作用させることにより前記樹
脂膜の上面のうちの前記配線パターンの上方に位置する
前記磁性体粒子を磁力により固定し、その状態で前記樹
脂膜の上面のうちの前記配線パターンの上方に位置しな
い前記磁性体粒子を除去し、その後残存した前記磁性体
粒子をフォトマスクとして前記樹脂膜を露光し、次いで
現像することにより残存する前記磁性体粒子とともに前
記配線パターンの上面の前記樹脂膜を除去して、前記配
線パターンの上面以外の部分に前記樹脂膜を残すように
したことを特徴とする配線基板の製造方法。1. A negative photosensitive resin film is formed on a surface of the insulating substrate including an upper surface of the wiring pattern after forming a wiring pattern having at least a part of a layer made of a magnetic material on the insulating substrate. After forming a large number of magnetic particles on the upper surface of the resin film, a magnetic field is applied to fix the magnetic particles located above the wiring pattern on the upper surface of the resin film by magnetic force. In that state, removing the magnetic particles not located above the wiring pattern on the upper surface of the resin film, exposing the resin film with the remaining magnetic particles as a photomask, and then developing. The resin film on the upper surface of the wiring pattern is removed together with the remaining magnetic particles so that the resin film is left on a portion other than the upper surface of the wiring pattern. Wiring board manufacturing method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14697592A JPH05315732A (en) | 1992-05-13 | 1992-05-13 | Manufacture of wiring board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14697592A JPH05315732A (en) | 1992-05-13 | 1992-05-13 | Manufacture of wiring board |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05315732A true JPH05315732A (en) | 1993-11-26 |
Family
ID=15419797
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14697592A Pending JPH05315732A (en) | 1992-05-13 | 1992-05-13 | Manufacture of wiring board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05315732A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009021046A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Reinforcement for asphaltic paving, method of paving, and process for making a grid with the coating for asphaltic paving |
WO2009021051A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Composite with tack film for asphaltic paving, method of paving, and process for making a composite with tack film for asphaltic paving |
WO2009021040A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Composite tack film for asphaltic paving, method of paving, and process for making a composite tack film for asphaltic paving |
US9200413B2 (en) | 2012-10-19 | 2015-12-01 | Saint-Gobain Adfors Canada, Ltd. | Composite tack film |
WO2022224473A1 (en) * | 2021-04-21 | 2022-10-27 | 昭和電工マテリアルズ株式会社 | Wiring substrate |
-
1992
- 1992-05-13 JP JP14697592A patent/JPH05315732A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009021046A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Reinforcement for asphaltic paving, method of paving, and process for making a grid with the coating for asphaltic paving |
WO2009021051A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Composite with tack film for asphaltic paving, method of paving, and process for making a composite with tack film for asphaltic paving |
WO2009021040A2 (en) | 2007-08-07 | 2009-02-12 | Saint Gobain Technical Fabrics America, Inc. | Composite tack film for asphaltic paving, method of paving, and process for making a composite tack film for asphaltic paving |
US9139961B2 (en) | 2007-08-07 | 2015-09-22 | Saint-Gobain Adfors Canada, Ltd. | Reinforcement for asphaltic paving, method of paving, and process for making a grid with the coating for asphaltic paving |
EP3156542A1 (en) | 2007-08-07 | 2017-04-19 | SAINT-GOBAIN ADFORS America, Inc. | Composite tack film for asphaltic paving, method of paving, and process for making a composite tack film for asphaltic paving |
US9200413B2 (en) | 2012-10-19 | 2015-12-01 | Saint-Gobain Adfors Canada, Ltd. | Composite tack film |
WO2022224473A1 (en) * | 2021-04-21 | 2022-10-27 | 昭和電工マテリアルズ株式会社 | Wiring substrate |
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