JPH05315250A - Molecular beam crystal growing apparatus - Google Patents

Molecular beam crystal growing apparatus

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Publication number
JPH05315250A
JPH05315250A JP12091992A JP12091992A JPH05315250A JP H05315250 A JPH05315250 A JP H05315250A JP 12091992 A JP12091992 A JP 12091992A JP 12091992 A JP12091992 A JP 12091992A JP H05315250 A JPH05315250 A JP H05315250A
Authority
JP
Japan
Prior art keywords
crucible
molecular beam
cover
droplet
droplets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP12091992A
Other languages
Japanese (ja)
Inventor
Fumihiko Sato
文彦 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Fujitsu Quantum Devices Ltd
Original Assignee
Fujitsu Ltd
Fujitsu Quantum Devices Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Fujitsu Quantum Devices Ltd filed Critical Fujitsu Ltd
Priority to JP12091992A priority Critical patent/JPH05315250A/en
Publication of JPH05315250A publication Critical patent/JPH05315250A/en
Withdrawn legal-status Critical Current

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Abstract

PURPOSE:To provide a molecular beam crystal growing apparatus which prevents adherence of liquid droplet of a molecular beam source material to a crucible to cause a defect at the time of growing a crystal. CONSTITUTION:The molecular beam crystal growing apparatus comprises a crucible 1 to be filled with a molecular beam source material 8, a cylindrical liquid droplet adhering cover 2 disposed on an upper part of the crucible 1 in contact with an inner wall periphery of the crucible 1 at its lower end and opened at its lower and upper bottoms, heaters 3a, 3b for heating the crucible 1, and moving mechanisms 4a, 4b for raising the cover 2 to remove it from the crucible 1. Further, the cover 2 has a collar 2a at its upper bottom and each moving mechanisms has a moving rod 4a for raising the collar 2a.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は分子線結晶成長装置に係
り,特に,分子線源セルの構造に関する。分子線結晶成
長装置は超精密制御の薄膜エピタキシャル層を成長する
装置であり,低温で大面積の薄膜エピタキシャル層を形
成することができる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a molecular beam crystal growth apparatus, and more particularly to the structure of a molecular beam source cell. The molecular beam crystal growth apparatus is an apparatus for growing a thin film epitaxial layer under ultra-precision control, and can form a large area thin film epitaxial layer at low temperature.

【0002】近年,半導体装置の高速化に伴い,化合物
半導体を用いた集積回路として,例えば,GaAsIC
が開発されている。このようなICでは,表面欠陥の少
ないエピタキシャルウエハーが要求される。
In recent years, as semiconductor devices have become faster, integrated circuits using compound semiconductors, such as GaAs ICs, have been used.
Is being developed. Such an IC requires an epitaxial wafer with few surface defects.

【0003】[0003]

【従来の技術】図3は分子線結晶成長装置の外観略図で
真空容器の一部を破断して示してあり,13は真空容器,
14は第1のクヌードセンセル,15は第2のクヌードセン
セル,16a, 16bは基板, 17は基板ホルダ, 18は基板ヒー
タ, 19は支持台, 20は基板ヒータ端子, 21は回転導入器
を表す。第1のクヌードセンセル14,第2のクヌードセ
ンセル15には基板16a, 16bに成長させる分子線源が装着
されている。
2. Description of the Related Art FIG. 3 is a schematic view of a molecular beam crystal growth apparatus in which a part of a vacuum container is cut away, and 13 is a vacuum container.
14 is the first knudsen cell, 15 is the second knudsen cell, 16a and 16b are substrates, 17 is a substrate holder, 18 is a substrate heater, 19 is a support, 20 is a substrate heater terminal, and 21 is rotating. Represents an introducer. The first Knudsen cell 14 and the second Knudsen cell 15 are equipped with a molecular beam source for growing the substrates 16a and 16b.

【0004】図2は従来の分子線結晶成長装置を説明す
るための概略図であり,図3の第1のクヌードセンセル
14または第2のクヌードセンセル15の内部の詳細を示
す。図中,1はるつぼ,3aは上部ヒータ, 3bは下部ヒー
タ, 5はセルシャッタ,6aは上部熱電対, 6bは下部熱電
対, 7は熱シールド,8はソースであって分子線源材
料,10は台,11はフランジ, 12はシュラウド, 13は真空
容器を表す。
FIG. 2 is a schematic diagram for explaining a conventional molecular beam crystal growth apparatus, which is the first Knudsen cell of FIG.
14 or the internal details of the second Knudsen cell 15 are shown. In the figure, 1 is a crucible, 3a is an upper heater, 3b is a lower heater, 5 is a cell shutter, 6a is an upper thermocouple, 6b is a lower thermocouple, 7 is a heat shield, 8 is a source and a molecular beam source material, 10 is a stand, 11 is a flange, 12 is a shroud, and 13 is a vacuum vessel.

【0005】固体材料を蒸発源とする分子線結晶成長装
置では,材料をるつぼ1に充填後,材料に含まれる不純
物ガス,充填時に吸着したガスを除去するため,真空引
きを行ってから,セルシャッター5を閉じた状態で材料
を上部ヒータ3a, 下部ヒータ3bにより加熱して脱ガスす
る。
In a molecular beam crystal growth apparatus using a solid material as an evaporation source, after filling the crucible 1 with the material, vacuuming is performed in order to remove the impurity gas contained in the material and the gas adsorbed during filling, and then the cell With the shutter 5 closed, the material is heated by the upper heater 3a and the lower heater 3b to degas.

【0006】ところで,材料がガリウムの場合,脱ガス
時に温度の低いるつぼ開口部(るつぼの上部内壁)にガ
リウムソースが液滴(ドロップレット)となって付着す
る。その後,セルシャッター5を開いて基板に例えばG
aAsをエピタキシャル成長すると,この液滴に起因す
る表面欠陥が発生する。この表面欠陥はオーバル欠陥と
呼ばれるもので,通常,径が数μmの盛り上がりであ
る。GaAsICの製造には,まずガリウムソースの液
滴を生じさせないようにして成長したエピタキシャルウ
エハーが必要となる。
By the way, when the material is gallium, the gallium source adheres to the opening of the crucible (the inner wall of the upper part of the crucible) having a low temperature as droplets when degassing. After that, the cell shutter 5 is opened and, for example, G
When aAs is epitaxially grown, surface defects due to the droplets occur. This surface defect is called an oval defect, and usually has a diameter of several μm. In order to manufacture a GaAs IC, an epitaxial wafer grown without generating gallium source droplets is first required.

【0007】そのため,上部ヒータの温度を下部ヒータ
の温度より高くして液滴の発生を防ぐことも行われる
が,るつぼ開口部の先端まで完全に液滴の発生をなくす
のは難しく,また,温度を上げ過ぎるとガリウムソース
自体の減少が激しくなるといった問題を生じる。
Therefore, the temperature of the upper heater is made higher than the temperature of the lower heater to prevent the generation of droplets, but it is difficult to completely eliminate the generation of droplets up to the tip of the crucible opening. If the temperature is raised too high, there is a problem that the gallium source itself is greatly reduced.

【0008】[0008]

【発明が解決しようとする課題】本発明は上記の問題に
鑑み,ソースの脱ガス時に液滴を生じたとしても,それ
を取り除いて結晶成長を行うことができる分子線結晶成
長装置を提供することを目的とする。
In view of the above problems, the present invention provides a molecular beam crystal growth apparatus capable of removing a droplet even when a source is degassed and removing the droplet to perform crystal growth. The purpose is to

【0009】[0009]

【課題を解決するための手段】図1は本発明の分子線結
晶成長装置を説明するための概略図である。上記課題
は,分子線源材料8を入れるるつぼ1と, 該るつぼ1の
内壁周囲に下端を接して該るつぼ1上部に配置され,下
底及び上底が開いた筒形の液滴付着用カバー2と, 該る
つぼ1を加熱するヒータ3a, 3bと, 該液滴付着用カバー
2を持ち上げて該るつぼ2からはずすための移動機構4
a, 4bとを有する分子線結晶成長装置によって解決され
る。
FIG. 1 is a schematic view for explaining a molecular beam crystal growth apparatus of the present invention. The above-mentioned problem is a crucible 1 into which a molecular beam source material 8 is inserted, and a cylindrical droplet attachment cover which is arranged on the upper part of the crucible 1 with its lower end in contact with the inner wall periphery of the crucible 1 and whose lower and upper bases are open. 2, heaters 3a and 3b for heating the crucible 1, and a moving mechanism 4 for lifting the droplet attaching cover 2 and removing it from the crucible 2.
It is solved by a molecular beam crystal growth apparatus having a and 4b.

【0010】また,前記液滴付着用カバー2は上底につ
ば2aを有し,前記移動機構は該つば2aを持ち上げるため
の移動棒4aを有する分子線結晶成長装置により解決され
る。
Further, the droplet attaching cover 2 has a collar 2a on the upper bottom, and the moving mechanism is solved by a molecular beam crystal growth apparatus having a moving rod 4a for lifting the collar 2a.

【0011】[0011]

【作用】本発明の分子線結晶成長装置では,下底及び上
底が開いた筒形で,るつぼ1の内壁周囲に下端を接して
るつぼ1上部に配置された液滴付着用カバー2を設けて
いる。るつぼ1に分子線源材料を装填し脱ガスを行う
時,液滴付着用カバー2の下端が分子線源材料のすぐ近
くまで来るようにしておけば,液滴(ドロップレット)
は液滴付着用カバー2に付着し,るつぼ1には付着しな
い。
In the molecular beam crystal growth apparatus of the present invention, a cover 2 for depositing droplets, which has a cylindrical shape with an open lower bottom and an upper bottom, is provided on the upper part of the crucible 1 with its lower end in contact with the inner wall of the crucible 1. ing. When the crucible 1 is charged with the molecular beam source material and degassed, if the lower end of the droplet attachment cover 2 is brought close to the molecular beam source material, droplets
Adheres to the droplet adhesion cover 2 and does not adhere to the crucible 1.

【0012】脱ガスを終了した後,移動機構4a, 4bによ
り液滴付着用カバー2を持ち上げてるつぼ1からはず
し,るつぼ1の上部から外側へ移動させ,それからシャ
ッター5を開いて基板にるつぼ1から出る分子線をあて
るようにすれば,液滴に起因する成長欠陥の発生を防ぐ
ことができる。
After the degassing is completed, the moving mechanism 4a, 4b lifts the droplet attaching cover 2 from the crucible 1 and moves it from the upper part of the crucible 1 to the outside, and then the shutter 5 is opened to open the crucible 1 on the substrate. By applying the molecular beam emitted from the inside, it is possible to prevent the generation of growth defects due to the droplets.

【0013】また,液滴付着用カバー2は上底につば2a
をつけ,移動機構はつば2aを持ち上げるための移動棒4a
を有するようにすれば,移動棒4aを上方に移動して液滴
付着用カバー2をるつぼ1の上方に移すことができる。
クヌードセンセルは図3に見るように傾斜しており,移
動棒4aは液滴付着用カバー2を斜め上方に持ち上げるこ
とになるから,液滴付着用カバー2をるつぼ1の外に出
した後,真空容器13の底に落とすようにすることができ
る。
The cover 2 for depositing liquid drops has a brim 2a on the upper bottom.
And the moving mechanism is a moving rod 4a for lifting the brim 2a.
With this structure, the moving rod 4a can be moved upward to move the droplet attaching cover 2 above the crucible 1.
The knudsen cell is inclined as shown in FIG. 3, and the moving rod 4a lifts the droplet attaching cover 2 obliquely upward, so the droplet attaching cover 2 is taken out of the crucible 1. After that, it can be dropped on the bottom of the vacuum container 13.

【0014】[0014]

【実施例】図1は本発明の分子線結晶成長装置を説明す
るための概略図で,符号は図2と共通である。さらに,
2は液滴付着用カバー,2aはつば, 4aは移動機構であっ
て移動棒, 4bは移動機構であって直線導入器である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic view for explaining a molecular beam crystal growth apparatus of the present invention, and the reference numerals are the same as those in FIG. further,
Reference numeral 2 is a cover for depositing droplets, 2a is a collar, 4a is a moving mechanism and a moving rod, and 4b is a moving mechanism and a linear introducer.

【0015】るつぼ1を収容するクヌードセンセルは真
空容器13とは電気的に絶縁されている。るつぼ1は例え
ばPBN(Pyro Boron Nitride)であり, その開口部と底
部に,それぞれ,上部熱電対6a, 下部熱電対6bを配置す
る。
The Knudsen cell containing the crucible 1 is electrically insulated from the vacuum container 13. The crucible 1 is, for example, PBN (Pyro Boron Nitride), and an upper thermocouple 6a and a lower thermocouple 6b are arranged at the opening and the bottom thereof, respectively.

【0016】クヌードセンセルにはるつぼ1を加熱する
上部ヒータ3aと下部ヒータ3bを配置され,供給する電力
の制御は上部熱電対6a, 下部熱電対6bを介してPID温
度調節器と直流安定電源により行う。
An upper heater 3a and a lower heater 3b for heating the crucible 1 are arranged in the knudsen cell, and the power supply is controlled by a PID temperature controller and a DC stabilization via the upper thermocouple 6a and the lower thermocouple 6b. Use the power supply.

【0017】図1及び図3を参照しながら,GaAs基
板にGaAsをエピタキシャル成長する例について説明
する。フランジ11をはずして真空容器を開け, 大気中で
ガリウムソース8を入れたるつぼ1をクヌードセンセル
に装着した後,フランジ10を真空容器13に固定する。
An example of epitaxially growing GaAs on a GaAs substrate will be described with reference to FIGS. 1 and 3. The flange 11 is removed, the vacuum container is opened, the crucible 1 containing the gallium source 8 is attached to the Knudsen cell in the atmosphere, and then the flange 10 is fixed to the vacuum container 13.

【0018】真空容器上部のハッチ(図3参照)から液
滴付着用カバー2をるつぼ1内に挿入する。この時セル
シャッター5は開いている。液滴付着用カバー2は,材
料が例えばPBNで,その形状は上底と下底が開いた筒
状の部分を有しさらに上底につば2aを有している。
The droplet attachment cover 2 is inserted into the crucible 1 from the hatch (see FIG. 3) above the vacuum container. At this time, the cell shutter 5 is open. The cover 2 for depositing droplets is made of, for example, PBN, and its shape has a cylindrical portion having an open upper bottom and a lower bottom, and further has a collar 2a on the upper bottom.

【0019】液滴付着用カバー2の下端はるつぼ1の内
壁に接し,ガリウムソース8が融解した状態で液面の上
方1mm程度となるようにする。この時,移動機構の移動
棒4aの先端は,液滴付着用カバー2をるつぼ1内に挿入
する邪魔とならないように引っ込めておく。
The lower end of the droplet attaching cover 2 is in contact with the inner wall of the crucible 1 so that the gallium source 8 is about 1 mm above the liquid surface in the molten state. At this time, the tip of the moving rod 4a of the moving mechanism is retracted so as not to interfere with the insertion of the droplet attaching cover 2 into the crucible 1.

【0020】図示しないが,他のクヌードセンセルにヒ
素ソースを装填する。また,基板ホルダ17にGaAs基
板16a, 16bを装着する。真空排気を行い,真空容器13の
中を3×10-7Torrの圧力とする。セルシャッター5を
閉じ,上部ヒータ3aにより開口部を約1100℃に昇温し,
底部は開口部より50℃低くなるように下部ヒータ3bの
電力を調節し,ガリウムソース8の脱ガスを9時間行っ
た。液滴付着用カバー2にガリウムの液滴が生じたが,
るつぼ1には液滴が生じなかった。
Although not shown, another Knudsen cell is loaded with an arsenic source. Further, the GaAs substrates 16a and 16b are mounted on the substrate holder 17. The chamber is evacuated to a pressure of 3 × 10 −7 Torr in the vacuum container 13. The cell shutter 5 is closed, and the upper heater 3a heats the opening to about 1100 ° C.
The electric power of the lower heater 3b was adjusted so that the bottom was 50 ° C. lower than the opening, and the gallium source 8 was degassed for 9 hours. Gallium droplets were generated on the droplet attachment cover 2,
No droplets were generated in the crucible 1.

【0021】また,上部ヒータ3aと下部ヒータ3bを直列
に配線し,約1100℃で9時間の脱ガスを行った時も,液
滴付着用カバー2にガリウムの液滴が生じたが,るつぼ
1には液滴が生じなかった。
Further, when the upper heater 3a and the lower heater 3b were wired in series and degassing was performed at about 1100 ° C. for 9 hours, a droplet of gallium was produced on the droplet attaching cover 2, but the crucible No droplets were generated in 1.

【0022】脱ガス終了後,直線導入器4bにより移動棒
4aを上方に伸ばして液滴付着用カバー2のつば2aを持ち
上げ, 液滴付着用カバー2をるつぼ1からはずし,真空
容器13の底に落とした。
After the degassing is completed, the moving rod is moved by the straight line introduction device 4b.
4a was extended upward and the brim 2a of the droplet attaching cover 2 was lifted, the droplet attaching cover 2 was removed from the crucible 1 and dropped onto the bottom of the vacuum container 13.

【0023】ヒ素ソースは 250℃, 2時間の脱ガスを行
った。この場合は液滴の生じることはないから,液滴付
着用カバーの装着の必要はない。次に,上部ヒータ3aに
より開口部を1000℃, 下部ヒータ3bにより底部を 850℃
に加熱し,また,ヒ素ソース(図示せず)を 200℃に加
熱した。さらにGaAs基板16a, 16bの温度を 680℃と
した。セルシャッター5を開き(ヒ素ソースのセルシャ
ッターも開き),回転導入器21により基板16a, 16bを回
転しながらガリウム分子線及びヒ素分子線をあて,30
分で5000ÅのGaAs層を成長した。
The arsenic source was degassed at 250 ° C. for 2 hours. In this case, since droplets are not generated, it is not necessary to attach the droplet attachment cover. Next, the upper heater 3a opens the opening at 1000 ° C, and the lower heater 3b opens the bottom at 850 ° C.
And an arsenic source (not shown) to 200 ° C. Further, the temperature of the GaAs substrates 16a and 16b was set to 680 ° C. Open the cell shutter 5 (also open the cell shutter for the arsenic source), and apply the gallium molecular beam and the arsenic molecular beam while rotating the substrates 16a and 16b by the rotation introducing device 21.
A 5000 Å GaAs layer was grown in minutes.

【0024】GaAs成長層のオーバル欠陥密度は10
箇/cm2 以下であった。ちなみに,液滴付着用カバー2
を配置しない従来法では,GaAs成長層のオーバル欠
陥密度は数10箇/cm2 程度であった。
Oval defect density of the GaAs growth layer is 10
It was less than the number of pieces / cm 2 . By the way, the droplet attachment cover 2
In the conventional method in which the GaAs is not arranged, the density of oval defects in the GaAs growth layer is about several tens / cm 2 .

【0025】[0025]

【発明の効果】以上説明したように,本発明の分子線結
晶成長装置によれば,分子線源材料8の脱ガス時に液滴
が発生したとしても,それを液滴付着用カバー2に付着
させ,るつぼ1の内壁には液滴を生じさせないようにす
ることができる。脱ガス後,液滴の付着した液滴付着用
カバー2をるつぼ1からはずして外側に移動し,その後
分子線結晶成長を行うことにより,成長層にオーバル欠
陥の発生を防止することができる。
As described above, according to the molecular beam crystal growth apparatus of the present invention, even if droplets are generated when the molecular beam source material 8 is degassed, they are attached to the droplet attachment cover 2. Therefore, it is possible to prevent droplets from being generated on the inner wall of the crucible 1. After degassing, the droplet attachment cover 2 to which the droplets are attached is removed from the crucible 1 and moved to the outside, and then molecular beam crystal growth is performed to prevent the oval defect from occurring in the growth layer.

【0026】また,脱ガス時に液滴を発生してもよいの
で,ソースを過度に加熱する必要がなく,脱ガス時のソ
ースの減少が少なくなるという効果もある。本発明の分
子線結晶成長装置によれば,表面欠陥の極めて少ない化
合物半導体エピタキシャルウエハーを供給することがで
きる。
Further, since droplets may be generated during degassing, it is not necessary to excessively heat the source, and there is an effect that the reduction of the source during degassing is reduced. According to the molecular beam crystal growth apparatus of the present invention, a compound semiconductor epitaxial wafer with extremely few surface defects can be supplied.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の分子線結晶成長装置を説明するための
概略図である。
FIG. 1 is a schematic diagram for explaining a molecular beam crystal growth apparatus of the present invention.

【図2】従来の分子線結晶成長装置を説明するための概
略図である。
FIG. 2 is a schematic diagram for explaining a conventional molecular beam crystal growth apparatus.

【図3】分子線結晶成長装置の外観略図である。FIG. 3 is a schematic view of a molecular beam crystal growth apparatus.

【符号の説明】[Explanation of symbols]

1はるつぼ 2は液滴付着用カバー 2aはつば 3a, 3bは, それぞれ, 上部ヒータ, 下部ヒータ 4aは移動機構であって移動棒 4bは移動機構であって直線導入器 5はシャッターであってセルシャッター 6a, 6bは, それぞれ, 上部熱電対, 下部熱電対 7は熱シールド 8は分子線源材料でありソースであってガリウムソース 10は台 11はフランジ 12はシュラウド 13は真空容器 14はクヌードセンセルであって第1のクヌードセンセル 15はクヌードセンセルであって第2のクヌードセンセル 16a, 16bは基板であってGaAs基板 17は基板ホルダ 18は基板ヒータ 19は支持台 20は基板ヒータ端子 21は回転導入器 1 is a crucible 2 is a cover for depositing droplets 2a is a collar 3a, 3b is an upper heater, a lower heater 4a is a moving mechanism, a moving rod 4b is a moving mechanism, and a linear introducer 5 is a shutter. The cell shutters 6a and 6b are an upper thermocouple and a lower thermocouple 7, respectively, and a heat shield 8 is a molecular beam source material and is a source, and a gallium source 10 is a base 11 a flange 12 a shroud 13 a vacuum container 14 Nude sencel, first kunudesencel 15 is kunudesencel, second kunudesencel 16a, 16b is a substrate, GaAs substrate 17 is substrate holder 18, substrate heater 19 is supported The base 20 is the substrate heater terminal 21 is the rotation introducer

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 分子線源材料(8) を入れるるつぼ(1)
と,該るつぼ(1) の内壁周囲に下端を接して該るつぼ(1)
上部に配置され,下底及び上底が開いた筒形の液滴付
着用カバー(2) と,該るつぼ(1) を加熱するヒータ(3a,
3b)と,該液滴付着用カバー(2) を持ち上げて該るつぼ
(1) からはずすための移動機構(4a, 4b)とを有すること
を特徴とする分子線結晶成長装置。
1. A crucible (1) for containing a molecular beam source material (8)
The crucible (1) with its lower end in contact with the inner wall of the crucible (1)
A cylindrical droplet cover (2), which is arranged at the top and has an open bottom and a bottom, and a heater (3a, 3a, which heats the crucible (1).
3b) and the cover (2) for adhering the droplets are lifted to bring the crucible
A molecular beam crystal growth apparatus having a moving mechanism (4a, 4b) for removing from (1).
【請求項2】 前記液滴付着用カバー(2) は上底につば
(2a)を有し,前記移動機構は該つば(2a)を持ち上げるた
めの移動棒(4a)を有することを特徴とする請求項1記載
の分子線結晶成長装置。
2. The droplet attaching cover (2) has a brim on the upper bottom.
2. The apparatus for growing a molecular beam crystal according to claim 1, further comprising (2a), wherein the moving mechanism has a moving rod (4a) for lifting the collar (2a).
JP12091992A 1992-05-14 1992-05-14 Molecular beam crystal growing apparatus Withdrawn JPH05315250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12091992A JPH05315250A (en) 1992-05-14 1992-05-14 Molecular beam crystal growing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12091992A JPH05315250A (en) 1992-05-14 1992-05-14 Molecular beam crystal growing apparatus

Publications (1)

Publication Number Publication Date
JPH05315250A true JPH05315250A (en) 1993-11-26

Family

ID=14798242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12091992A Withdrawn JPH05315250A (en) 1992-05-14 1992-05-14 Molecular beam crystal growing apparatus

Country Status (1)

Country Link
JP (1) JPH05315250A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112538654A (en) * 2020-11-20 2021-03-23 湖南烁科晶磊半导体科技有限公司 Molecular beam epitaxy source material cooling method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112538654A (en) * 2020-11-20 2021-03-23 湖南烁科晶磊半导体科技有限公司 Molecular beam epitaxy source material cooling method
CN112538654B (en) * 2020-11-20 2021-08-27 湖南烁科晶磊半导体科技有限公司 Molecular beam epitaxy source material cooling method

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