JPH05311474A - Optical washing method - Google Patents

Optical washing method

Info

Publication number
JPH05311474A
JPH05311474A JP4120756A JP12075692A JPH05311474A JP H05311474 A JPH05311474 A JP H05311474A JP 4120756 A JP4120756 A JP 4120756A JP 12075692 A JP12075692 A JP 12075692A JP H05311474 A JPH05311474 A JP H05311474A
Authority
JP
Japan
Prior art keywords
water
ultraviolet rays
mercury lamp
cleaned
washing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4120756A
Other languages
Japanese (ja)
Other versions
JP3192475B2 (en
Inventor
Osamu Nagasaki
修 長崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP12075692A priority Critical patent/JP3192475B2/en
Publication of JPH05311474A publication Critical patent/JPH05311474A/en
Application granted granted Critical
Publication of JP3192475B2 publication Critical patent/JP3192475B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)

Abstract

PURPOSE:To provide the washing method for electronic materials, more particularly the method for washing lead frames after silver plating and washing shadow masks, photomask blanks, silicon wafers, substrate glass for liquid crystal display devices, glass formed with transparent electrodes, etc. CONSTITUTION:The org. matter sticking to the lead frames, shadow masks, photomask blanks, silicon wafers, substrate glass for liquid crystal display devices, glass formed with transparent electrodes, etc., is irradiated with UV rays in the state of providing base materials in water or forming the films of water on the surfaces to be treated, by which the org. matter sticking to the base materials is decomposed and the wettability is improved. As a result, the org. matter is removed and the wettability is improved without generating the oxidation, etc., of the base materials.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、各種の固体材料の洗浄
方法に関し、とくにリードフレームの銀めっき後の洗
浄、シャドウマスク、フォトマスクブランクス、シリコ
ンウエハ、液晶表示装置用の基板ガラス、透明電極を形
成したガラス等の電子材料の洗浄方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of cleaning various solid materials, and more particularly, cleaning of lead frames after silver plating, shadow masks, photomask blanks, silicon wafers, substrate glass for liquid crystal display devices, transparent electrodes. The present invention relates to a method for cleaning electronic materials such as glass, which have been formed.

【0002】[0002]

【従来の技術】各種の固体材料からなる電子材料の表面
に有機物等が付着していると、装置の性能に悪影響を及
ぼすために、種々の方法で表面を洗浄し付着物を除去す
ることが行われている。たとえば、リードフレーム等の
ように金属の薄板をエッチングして得られるものの場合
には、エッチング液の残渣をアルカリで中和した後に、
水洗を繰り返し行って洗浄している。また、フォトマス
クブランクス、シリコンウエハ、液晶表示装置用のガラ
ス基板等のガラス、セラミック等の洗浄ではスクラブ洗
浄、超音波洗浄、高圧水洗等物理的な洗浄を行ってい
る。
2. Description of the Related Art If an organic material or the like adheres to the surface of an electronic material made of various solid materials, the performance of the device is adversely affected. Therefore, the surface can be cleaned by various methods to remove the adhered material. Has been done. For example, in the case of a lead frame or the like obtained by etching a thin metal plate, after neutralizing the residue of the etching solution with an alkali,
Washing is repeated by washing with water. Further, in cleaning photomask blanks, silicon wafers, glass such as glass substrates for liquid crystal display devices, ceramics, etc., physical cleaning such as scrub cleaning, ultrasonic cleaning, high pressure water cleaning is performed.

【0003】[0003]

【発明が解決しようとする課題】ガラス、セラミック、
シリコンウエハ等の水による洗浄に先立って、被洗浄面
に大気中において紫外線を照射し、表面に付着した有機
物を紫外線および紫外線によって励起された空気中の酸
素から生じたオゾンによって分解する方法は、化学薬品
を用いる必要がなく、洗浄水の処理も容易で取り扱いも
簡単であり、さらには大きな洗浄効果が得られ、非常に
有用な方法であった。
DISCLOSURE OF THE INVENTION Glass, ceramic,
Prior to cleaning a silicon wafer or the like with water, the surface to be cleaned is irradiated with ultraviolet rays in the atmosphere, and the organic matter adhering to the surface is decomposed by ultraviolet rays and ozone generated from oxygen in the air excited by the ultraviolet rays. It was a very useful method because it did not require the use of chemicals, the treatment of washing water was easy, the handling was simple, and a great washing effect was obtained.

【0004】ところが、金属の表面に付着した有機物を
こうした方法で処理すると、金属表面の有機物は除去さ
れるものの、金属表面には酸化物が形成される。例え
ば、接続部等に銀めっきを施した金属材料に大気中にお
いて紫外線を照射すると、表面の銀が短時間に酸化され
る。酸化被膜は導線等の接合に障害となり、また酸化物
が基体から剥離するという問題があった。表面が酸化し
たシャドウマスクでは表面処理工程での黒化処理の際
に、黒化が行われなかったり、むらが生じることが起こ
る。さらに、その他の鉄、銅、銅合金等においても酸化
によって導電接続に悪影響を及ぼしたり、変色するとい
う問題があった。
However, when the organic matter attached to the surface of the metal is treated by such a method, the organic matter on the metal surface is removed, but an oxide is formed on the metal surface. For example, when a metallic material having a connection portion or the like plated with silver is irradiated with ultraviolet rays in the atmosphere, silver on the surface is oxidized in a short time. The oxide film has a problem in that it interferes with the joining of conductors and the like, and the oxide peels off from the substrate. In a shadow mask whose surface is oxidized, blackening may not be performed or unevenness may occur during blackening treatment in the surface treatment process. Further, other iron, copper, copper alloys and the like have a problem that they have a bad influence on the conductive connection and are discolored by oxidation.

【0005】さらに、鉄、銅、鉄系合金、銅系合金の板
状材料のエッチング加工において、レジストの塗布性、
密着性を良くするために、レジストの塗布に先だって従
来はアルカリや酸による処理を行っていたが、表面の荒
さやつやが変化し問題となることがあった。又、洗浄後
の乾燥時に変色の発生が見られた。しかし、乾燥状態で
低圧水銀灯の光線を照射すると表面が酸化し変色した
り、酸化膜の形成によるレジストの濡れ不良、密着性の
低下、さらにはエッチング特性が変化し問題であった。
Further, in etching processing of plate materials of iron, copper, iron-based alloys, and copper-based alloys, resist coating properties,
In order to improve the adhesiveness, treatment with an alkali or an acid has been conventionally performed prior to the coating of the resist, but the roughness and gloss of the surface may change, which may cause a problem. In addition, discoloration was observed during drying after washing. However, when a light beam of a low-pressure mercury lamp is irradiated in a dry state, the surface is oxidized and discolored, resist wetting due to the formation of an oxide film is deteriorated, adhesion is lowered, and etching characteristics are changed, which is a problem.

【0006】本発明は、基材に悪影響を及ぼさないで有
機物の被膜等を洗浄によって除去するとともに、基材の
濡れ性を改善し、洗浄後の乾燥においてウォーターマー
クを形成させないことを目的とするものである。
An object of the present invention is to remove an organic film and the like by washing without adversely affecting the base material, improve the wettability of the base material, and prevent the formation of a watermark during drying after cleaning. It is a thing.

【0007】[0007]

【課題を解決するための手段】本発明は、被洗浄面を水
中に設置するか、または水で被覆した状態で紫外線を照
射して被洗浄面上の有機物等を除去する方法である。本
発明の方法を金属表面の洗浄に使用した場合には金属表
面に好ましくない酸化物が形成されることはなく、表面
の有機物等を除去することができ、またガラス、セラミ
ックス、シリコンウエハ等の表面の洗浄に使用した場合
には表面の濡れ性を高め、その結果洗浄性を向上させる
ことが可能となり、洗浄水中の微量有機物の被洗浄物へ
の再付着によるシミや乾燥時にウォーターマークが形成
されることを防止することができる。
The present invention is a method for removing organic substances and the like on a surface to be cleaned by placing the surface to be cleaned in water or irradiating with ultraviolet rays in a state of being covered with water. When the method of the present invention is used for cleaning a metal surface, an undesired oxide is not formed on the metal surface, organic substances on the surface can be removed, and glass, ceramics, silicon wafers, etc. can be removed. When used for cleaning the surface, it enhances the wettability of the surface, and as a result, it becomes possible to improve the cleaning performance.Stains due to redeposition of trace organic substances in the cleaning water on the object to be cleaned and water marks when drying Can be prevented.

【0008】本発明において使用することができる紫外
線は、低圧水銀灯から得られる波長が253〜255n
mにピークを有する紫外線、および180〜185nm
にピークを有する紫外線の両者を用いることができる
が、少なくとも253〜255mにピークを有する紫外
線を使用することが好ましい。また、本発明の方法によ
り銀、鉄、クロム、導波路型光デバイス評価装置、ニッ
ケル、ガラス、シリコンウエハ、ITOなどの表面が直
接活性化され水との濡れ性がよくなる。また、これらの
表面に薄く有機物が付着している場合には有機物は除去
されて表面が洗浄化される。
The ultraviolet rays which can be used in the present invention have a wavelength of 253 to 255n obtained from a low pressure mercury lamp.
UV with a peak at m, and 180 to 185 nm
Both of the UV rays having a peak at 2 can be used, but it is preferable to use the UV rays having a peak at at least 253 to 255 m. Further, the surface of silver, iron, chromium, a waveguide type optical device evaluation device, nickel, glass, a silicon wafer, ITO or the like is directly activated by the method of the present invention, and the wettability with water is improved. In addition, when thin organic matter is attached to these surfaces, the organic matter is removed and the surfaces are cleaned.

【0009】さらに、エッチング加工において、上記と
同様に水中に被洗浄物を設置した状態で低圧水銀灯の光
を照射することによって酸化膜の生成をおさえることが
でき、また濡れ性が良くなり、レジストの塗布時の塗布
むらをなくすことができる。
Further, in the etching process, the formation of an oxide film can be suppressed and the wettability can be improved by irradiating with light of a low-pressure mercury lamp in the state where the object to be cleaned is installed in the same manner as above. It is possible to eliminate coating unevenness during coating.

【0010】[0010]

【作用】表面の清浄化に有効な方法である紫外線照射に
よる有機物の処理の際に生じる金属表面の酸化等の問題
点を、被処理物を水中に置くか、あるいは被処理面上に
水の膜を形成して紫外線を照射することによって解決す
るとともに、多くの材質の濡れ性を改善することが可能
となった。
[Function] The problem such as the oxidation of the metal surface which occurs during the treatment of organic substances by ultraviolet irradiation, which is an effective method for cleaning the surface, is caused by placing the substance to be treated in water or by applying water on the treated surface. It has become possible to solve this problem by forming a film and irradiating it with ultraviolet rays, and improve the wettability of many materials.

【0011】[0011]

【実施例】本発明の方法を図面を参照して説明する。図
1は、本発明の1実施例を説明する図である。リードフ
レームの被処理物1が水2中に置かれており、水面上に
は低圧水銀灯3が設けられている。被処理物の被処理面
上には水の層4もしくは水の膜が形成されている。水の
層は照射する紫外線の強度が大きければ厚くてもよい。
一方、水の層が薄い場合には、処理中に水が蒸発し処理
面が直接に大気に触れないように処理中に水を補給する
等の方法を行うことが好ましい。また、被処理面と水銀
灯との間隔は低圧水銀灯の発光強度によって適宜設定す
ることができるが、一般には10〜30mmとすること
が好ましい。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The method of the present invention will be described with reference to the drawings. FIG. 1 is a diagram for explaining one embodiment of the present invention. An object to be treated 1 of a lead frame is placed in water 2, and a low pressure mercury lamp 3 is provided on the water surface. A water layer 4 or a water film is formed on the surface of the object to be processed. The water layer may be thick as long as the intensity of the ultraviolet rays applied is high.
On the other hand, when the water layer is thin, it is preferable to replenish the water during the treatment so that the water does not evaporate during the treatment and the treated surface does not come into direct contact with the atmosphere. The distance between the surface to be treated and the mercury lamp can be appropriately set depending on the emission intensity of the low-pressure mercury lamp, but it is generally preferably 10 to 30 mm.

【0012】また、図2には他の実施例を示すが、図2
(a)は、被処理物21と低圧水銀灯22が水23が満
たされた処理槽24中に設けられている。水銀灯の管壁
が直接処理槽の水に接しても良いが、低圧水銀灯の管壁
の温度を安定な出力が得られる温度とするために、水銀
灯を紫外線の透過を妨げない合成石英等の透明な保護管
25中に設け、保護管と水銀灯の器壁との空間は、真空
あるいは紫外線と反応しない窒素などを充填することが
好ましい。
FIG. 2 shows another embodiment.
In (a), the object to be treated 21 and the low-pressure mercury lamp 22 are provided in a treatment tank 24 filled with water 23. The tube wall of the mercury lamp may come into direct contact with the water in the treatment tank, but in order to keep the temperature of the tube wall of the low-pressure mercury lamp at a temperature at which stable output can be obtained, the mercury lamp is transparent such as synthetic quartz that does not block the transmission of ultraviolet rays. It is preferable that the protective tube 25 is provided in the protective tube 25 and the space between the protective tube and the wall of the mercury lamp is filled with nitrogen or the like that does not react with vacuum or ultraviolet rays.

【0013】また、図2(b)は、被処理物21の下部
に保護管25に設けた低圧水銀灯22を設けたもので、
搬送装置26に取り付けて被処理物を移動させながら、
被処理物の下部に設けた噴射ノズル27から水を連続的
に被処理面に噴射して被処理面に水の膜28を形成した
状態で紫外線を照射する方法を示している。また、被処
理物と水銀灯との位置関係は上記に示したものに以外に
も各種の配置をとることができる。例えば、被処理物を
垂直方向に移動しながら、被処理面上に水の膜を形成
し、紫外線を照射するなどの任意の配置をとることが可
能である。
Further, FIG. 2 (b) shows a low pressure mercury lamp 22 provided in a protective tube 25 below the object to be treated 21,
While attached to the transfer device 26 to move the object to be processed,
A method is shown in which water is continuously jetted from a jet nozzle 27 provided in the lower part of the object to be treated onto the surface to be treated, and ultraviolet rays are irradiated in a state where a water film 28 is formed on the surface to be treated. Further, the positional relationship between the object to be treated and the mercury lamp may be various arrangements other than the above-mentioned ones. For example, it is possible to take an arbitrary arrangement such as forming a water film on the surface to be processed and irradiating with ultraviolet rays while moving the object to be processed in the vertical direction.

【0014】実施例1 鉄系合金(ニッケル42%を含む42合金、ニッケル5
0%含む50合金、コバルト13%、ニッケル29%を
含むコバール)、銅系合金(ヤマハ製オーリン194、
神戸製鋼製KLF5、古河電工製エフテック764)を
基材として部分銀めっきを行った0.05〜0.25m
mの各種の厚みのリードフレームを用意し、図1に示す
方法により、リードフレームと低圧水銀灯との距離を3
0mm、水の深さを5mmとしてリードフレーム上での
光の強度を30mW/cm2 として照射時間を変えて照
射した後に、超純水によって洗浄後オーブンで乾燥し、
水滴の接触角を測定し、紫外線を照射せずに超純水によ
って洗浄したものを比較試料とした。
Example 1 Iron-based alloy (42 alloy containing 42% nickel, nickel 5
50 alloy containing 0%, Kovar containing 13% cobalt and 29% nickel), copper alloy (Orin 194 made by Yamaha,
0.05 to 0.25 m that was partially silver-plated using Kobe Steel KLF5 and Furukawa Electric F-Tech 764) as a base material.
Prepare lead frames with various thicknesses of m and set the distance between the lead frame and the low-pressure mercury lamp to 3 by the method shown in FIG.
After irradiation with 0 mm, water depth of 5 mm and light intensity on the lead frame of 30 mW / cm 2 , irradiation time was changed, washing with ultrapure water and drying in an oven were performed.
The contact angle of water droplets was measured, and the sample was washed with ultrapure water without being irradiated with ultraviolet rays and used as a comparative sample.

【0015】10枚の各試料の水に対する接触角を照射
後に測定し、その最小値と最大値を示す。 試料 水の接触角 最小 最大 めっき後水洗のみで乾燥した物 85度 92度 水中で低圧水銀灯で 10秒照射 30 60 〃 30秒 30 45 1分 30 40 5分 16 17 また、基材の差によって接触角の違いは認められなかっ
た。さらに、5分照射した後の銀表面の酸化物量は、E
SCAによる表面分析で水洗のみで乾燥した物とほとん
ど差は認められなかった。
The contact angle of each of the 10 samples with water was measured after irradiation, and the minimum and maximum values are shown. Contact angle of sample water Minimum Maximum Maximum dried product after plating only 85 ° 92 ° Irradiation with low pressure mercury lamp in water for 10 seconds 30 60 〃 30 seconds 30 45 1 minute 30 40 5 minutes 16 17 Also contact due to difference in base material No difference in horn was observed. Furthermore, the amount of oxide on the silver surface after irradiation for 5 minutes was E
The surface analysis by SCA showed almost no difference from the product dried only by washing with water.

【0016】実施例2 リードフレームの連続めっき装置の純水による洗浄工程
の前に、500W低圧水銀灯を装着し、純水によって基
板面を被覆した状態で紫外線を照射した。水銀灯表面と
製品との間隔は30mmとし、リードフレームの送り速
度は15mm/秒とした。
Example 2 Before the washing process of the lead frame continuous plating apparatus with pure water, a 500 W low-pressure mercury lamp was attached, and ultraviolet rays were irradiated while the substrate surface was covered with pure water. The distance between the surface of the mercury lamp and the product was 30 mm, and the feed rate of the lead frame was 15 mm / sec.

【0017】この結果、乾燥後の銀表面の水に対する濡
れ性を示す接触角は25〜35度となり、紫外線を照射
しない場合の接触角60〜95度と比較し濡れ性が大き
く向上している。また、紫外線を照射したリードフレー
ムについて金線およびアルミニウム線のワイヤーボンデ
ィング性をテストしたが、通常品とまったく差はなかっ
た。表面のESCAによる炭素量の測定では、純水によ
る洗浄のみのものが銀の強度100に対し、50〜10
0の強度比であったのに対し、紫外線を照射したリード
フレームでは、銀の強度100に対し0〜30と表面の
有機物量も減少している。
As a result, the contact angle showing the wettability of the silver surface after drying to water is 25 to 35 degrees, which is much higher than the contact angle of 60 to 95 degrees when the silver is not irradiated. .. Further, the lead frame irradiated with ultraviolet rays was tested for the wire bonding property of the gold wire and the aluminum wire, but there was no difference from the ordinary product. In the measurement of the amount of carbon on the surface by ESCA, the amount of pure water only 50 to 10 against silver strength of 100.
While the intensity ratio was 0, in the lead frame irradiated with ultraviolet rays, the amount of organic substances on the surface was 0 to 30 per 100 of silver intensity, which was also reduced.

【0018】実施例3 実施例1、2と同様に、部分的に銀めっきを施したリー
ドフレームについて、図2(a)に示すように、低圧水
銀灯を水中に設けて紫外線を照射したところ、照射時間
10秒では60〜70度までしか接触角は低くならなか
った。この原因は、ランプが水冷され、管壁の温度が低
下したために発光効率が低下することが原因であること
が判明した。
Example 3 Similar to Examples 1 and 2, a lead frame partially plated with silver was exposed to ultraviolet rays by placing a low pressure mercury lamp in water as shown in FIG. 2 (a). When the irradiation time was 10 seconds, the contact angle decreased only to 60 to 70 degrees. It has been found that this is because the lamp is water-cooled and the temperature of the tube wall is lowered, so that the luminous efficiency is lowered.

【0019】実施例4 低圧水銀灯を合成石英のカバー内に設けて、これを水中
に設置し、カバー内部には窒素を封入して、銀めっきを
施したリードフレームに紫外線を照射したところ、実施
例1および2と同様、10秒の照射で、水に対する接触
角は25〜30度と低くすることができた。なお、本実
施例においては水銀灯と石英カバーとの空間は真空にし
ても良い。
Example 4 A low-pressure mercury lamp was provided in a synthetic quartz cover, which was placed in water, nitrogen was sealed inside the cover, and a silver-plated lead frame was irradiated with ultraviolet rays. As in Examples 1 and 2, the contact angle to water could be lowered to 25 to 30 degrees by irradiation for 10 seconds. In this embodiment, the space between the mercury lamp and the quartz cover may be vacuum.

【0020】実施例5 実施例4の結果をもとに、図3に示すめっき面が下向き
のラインにおいて、洗浄を行った。被処理物搬送ロール
29によって送られた被処理物21は、オーバーフロー
槽30の上部において、オーバーフロー水31によって
被処理物表面に濡れ状態を形成する。被処理物のめっき
部32には、保護管25によって覆われた低圧水銀灯2
2から紫外線を照射した。被処理物を濡れ状態とした水
は受水槽33に受けられて貯水槽34に集められる。貯
水槽からは送水ポンプ35によっオーバーフロー槽へ送
られて被処理物表面を濡らすために使用される。
Example 5 Based on the result of Example 4, cleaning was performed in the line shown in FIG. 3 with the plated surface facing downward. The processing object 21 sent by the processing object transport roll 29 forms a wet state on the surface of the processing object by the overflow water 31 in the upper part of the overflow tank 30. The low-pressure mercury lamp 2 covered with the protective tube 25 is provided on the plated portion 32 of the object to be processed.
It was irradiated with ultraviolet rays from 2. Water that wets the object to be processed is received by the water receiving tank 33 and collected in the water storing tank 34. From the water storage tank, it is sent to the overflow tank by the water supply pump 35 and used for wetting the surface of the object to be treated.

【0021】リードフレームは15mm/秒の送り速度
で被処理物搬送ロールによって移動して処理を行った。
この結果、乾燥後の銀表面の水に対する接触角は、20
〜25度と良好であった。また、ワイヤーボンディング
性は通常品と差はなく、ESCAによる表面分析結果は
実施例2と同様、銀の強度100に対し、炭素の強度比
は50以下であり有機物汚染のないことを示していた。
The lead frame was moved by the object-conveying roll at a feed rate of 15 mm / sec for processing.
As a result, the contact angle of water on the silver surface after drying was 20.
It was as good as ~ 25 degrees. Further, the wire bondability was not different from that of the normal product, and the surface analysis result by ESCA was the same as in Example 2, indicating that the strength ratio of carbon was 50 or less with respect to the strength of silver of 100, and that there was no organic contamination. ..

【0022】[0022]

【発明の効果】本発明の方法は、被処理物を水中に設置
するかもしくは被処理面に水の膜を形成した状態で、紫
外線を照射することによって銀等の被処理物の酸化等を
防止した状態で表面の清浄化と濡れ性を高めることがで
き、ウォーターマークの形成も防止することが可能とな
る。
INDUSTRIAL APPLICABILITY According to the method of the present invention, the object to be treated such as silver is oxidized by irradiating with ultraviolet rays while the object to be treated is placed in water or a water film is formed on the surface to be treated. The surface can be cleaned and wettability can be improved in the state of being prevented, and the formation of the watermark can be prevented.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の1実施例を説明する図。FIG. 1 is a diagram illustrating an embodiment of the present invention.

【図2】本発明の実施例2〜4を説明する図。FIG. 2 is a diagram illustrating Examples 2 to 4 of the present invention.

【図3】本発明の実施例5を説明する図。FIG. 3 is a diagram illustrating a fifth embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…被処理物、2…水、3…低圧水銀灯、4…水の層、
21…被処理物、22…低圧水銀灯、23…水、24…
処理槽、25…保護管、26…搬送装置、27…噴射ノ
ズル、28…水の膜、29…被処理物搬送ロール、30
…オーバーフロー槽、31…オーバーフロー水、32…
めっき部、33…受水槽、34…貯水槽、35…送水ポ
ンプ
1 ... Object to be treated, 2 ... Water, 3 ... Low-pressure mercury lamp, 4 ... Water layer,
21 ... Object to be treated, 22 ... Low-pressure mercury lamp, 23 ... Water, 24 ...
Processing tank, 25 ... Protective tube, 26 ... Conveying device, 27 ... Injection nozzle, 28 ... Water film, 29 ... Conveying object conveying roll, 30
… Overflow tank, 31… Overflow water, 32…
Plating section, 33 ... Water receiving tank, 34 ... Water storage tank, 35 ... Water pump

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 被洗浄物を紫外線を利用して洗浄する光
洗浄方法において、被洗浄物を水中に設けるか、もしく
は被洗浄物表面が水で被覆された状態で紫外線を照射す
ることを特徴とする光洗浄方法。
1. An optical cleaning method for cleaning an object to be cleaned by using ultraviolet rays, wherein the object to be cleaned is provided in water, or the surface of the object to be cleaned is irradiated with ultraviolet rays while being covered with water. And light cleaning method.
【請求項2】 260nm以下の波長域にピークを有す
る紫外線を用いることを特徴とする請求項1記載の光洗
浄方法。
2. The photocleaning method according to claim 1, wherein ultraviolet rays having a peak in a wavelength range of 260 nm or less are used.
【請求項3】 紫外線を低圧水銀灯、エキシマレーザ、
YAGレーザによって照射することを特徴とする請求項
1〜2記載の光洗浄方法。
3. A low pressure mercury lamp, an excimer laser,
Irradiation with a YAG laser is carried out, The optical cleaning method of Claim 1 or 2 characterized by the above-mentioned.
【請求項4】 紫外線発光管を紫外線が透過する保護管
によって覆い、保護管と紫外線発光管の間は、紫外線を
吸収しない気体の充填もしくは真空としたことを特徴と
する請求項1〜3記載の光洗浄方法。
4. The ultraviolet luminous tube is covered with a protective tube through which ultraviolet rays are transmitted, and a gas that does not absorb ultraviolet rays is filled or vacuumed between the protective tube and the ultraviolet luminous tube. Light cleaning method.
【請求項5】 被洗浄物が連続的に移送される状態で紫
外線を照射することを特徴とする請求項1記載の光洗浄
方法。
5. The photo-cleaning method according to claim 1, wherein the UV-irradiation is performed in a state where the object to be cleaned is continuously transferred.
JP12075692A 1992-05-13 1992-05-13 Light cleaning method Expired - Fee Related JP3192475B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12075692A JP3192475B2 (en) 1992-05-13 1992-05-13 Light cleaning method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12075692A JP3192475B2 (en) 1992-05-13 1992-05-13 Light cleaning method

Publications (2)

Publication Number Publication Date
JPH05311474A true JPH05311474A (en) 1993-11-22
JP3192475B2 JP3192475B2 (en) 2001-07-30

Family

ID=14794217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12075692A Expired - Fee Related JP3192475B2 (en) 1992-05-13 1992-05-13 Light cleaning method

Country Status (1)

Country Link
JP (1) JP3192475B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001201608A (en) * 1999-11-08 2001-07-27 Nikon Corp Method for forming optical thin film, optical element and exposure system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001201608A (en) * 1999-11-08 2001-07-27 Nikon Corp Method for forming optical thin film, optical element and exposure system

Also Published As

Publication number Publication date
JP3192475B2 (en) 2001-07-30

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