JPH05299350A - Substrate heating mechanism - Google Patents

Substrate heating mechanism

Info

Publication number
JPH05299350A
JPH05299350A JP4126792A JP12679292A JPH05299350A JP H05299350 A JPH05299350 A JP H05299350A JP 4126792 A JP4126792 A JP 4126792A JP 12679292 A JP12679292 A JP 12679292A JP H05299350 A JPH05299350 A JP H05299350A
Authority
JP
Japan
Prior art keywords
substrate
gas
heating
temperature
heater
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4126792A
Other languages
Japanese (ja)
Inventor
Masahiro Yasumatsu
正博 安松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4126792A priority Critical patent/JPH05299350A/en
Publication of JPH05299350A publication Critical patent/JPH05299350A/en
Pending legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To avoid the extension of the attaining time to a target temperature as well as the higher substrate temperature than the target temperature when the substrate is to be heated at high temperature before it is heat-treated. CONSTITUTION:Within the substrate heating mechanism, an infrared ray lamp heater 7 heating a substrate 2 using the thermal radiation on the rear side of the substrate 2, a gas leading-in part 10 heating the same 2 using the thermal conduction of gas and a heater 8 are provided inside a substrate holder 4. For the high temperature heating, the substrate 2 is heated using the thermal radiation by the infrared ray lamp heater 7, on the other hand, while the substrate 2 is being heat-treated, a gas is led in through the gas leading-in part 10 so that the substrate 2 may be heated using the thermal conduction of the gas by heating the gas led in the rear side of the substrate 2 using the heater 8.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、基板加熱機構に関し、
特に、真空処理装置における基板加熱機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate heating mechanism,
In particular, it relates to a substrate heating mechanism in a vacuum processing apparatus.

【0002】[0002]

【従来の技術】従来、真空処理装置において、被処理基
板を加熱する機構には、熱輻射を利用して加熱を行うラ
ンプ式加熱機構と、高温に加熱されたガスの熱伝導を利
用して加熱を行うガス式加熱機構との2種類がある。
2. Description of the Related Art Conventionally, in a vacuum processing apparatus, as a mechanism for heating a substrate to be processed, a lamp type heating mechanism for heating by utilizing heat radiation and a heat conduction of a gas heated to a high temperature are utilized. There are two types: a gas type heating mechanism for heating.

【0003】前者のランプ式加熱機構は、一般に図2に
示すように真空容器1の内部に、ガラス板3,赤外線ラ
ンプヒータ7,反射板13,熱電対5が組み込まれた機
構となっている。
The former lamp type heating mechanism is generally a mechanism in which a glass plate 3, an infrared lamp heater 7, a reflecting plate 13 and a thermocouple 5 are incorporated in a vacuum container 1 as shown in FIG. ..

【0004】基板2は、基板加熱位置であるガラス板3
上へ基板搬送機構(図示せず)により搬送され、ここで
赤外線ランプヒータ7からの熱輻射により加熱される。
なお、赤外線ランプヒータ7からの熱輻射を効率的に基
板2へ照射するために、反射板13が設けてある。
The substrate 2 is a glass plate 3 which is a substrate heating position.
The substrate is transported upward by a substrate transport mechanism (not shown), and heated by heat radiation from the infrared lamp heater 7.
A reflecting plate 13 is provided in order to efficiently irradiate the substrate 2 with the heat radiation from the infrared lamp heater 7.

【0005】また、基板2の温度を目標温度に制御する
ために熱電対5の出力信号をフィートバックして赤外線
ランプヒータ7に供給する電力を調節する温度制御部6
とを有している。
Further, in order to control the temperature of the substrate 2 to a target temperature, the temperature controller 6 for adjusting the electric power supplied to the infrared lamp heater 7 by feedbacking the output signal of the thermocouple 5.
And have.

【0006】一方、ガス式加熱機構は、図3に示すよう
にガス導入部10,基板ホルダ4,加熱ヒータ8及び冷
却板12により構成される。基板ホルダ4には、熱電対
5が組み込まれており、また、冷却板12は、冷却水に
より冷却され基板ホルダ14の加熱を防止する役目を有
する。
On the other hand, as shown in FIG. 3, the gas type heating mechanism is composed of a gas introducing section 10, a substrate holder 4, a heater 8 and a cooling plate 12. A thermocouple 5 is incorporated in the substrate holder 4, and the cooling plate 12 is cooled by cooling water to prevent the substrate holder 14 from being heated.

【0007】基板2は、基板加熱位置である基板ホルダ
4上へ基板搬送機構(図示せず)により搬送される。基
板ホルダ4は、加熱ヒータ8により加熱されているた
め、ガス導入部10から導入されたガスは、基板ホルダ
4の内部を通過することにより加熱される。
The substrate 2 is carried onto the substrate holder 4 at the substrate heating position by a substrate carrying mechanism (not shown). Since the substrate holder 4 is heated by the heater 8, the gas introduced from the gas introduction unit 10 is heated by passing through the inside of the substrate holder 4.

【0008】この加熱されたガスが、ガス吹出口11
a,11b,11cより基板2の裏面へ吹付けられるこ
とにより、基板2が加熱される。なお、温度制御部6と
熱電対5により基板2の温度は、目標値に保たれ、ま
た、ガス流量は、ガス流量制御部9により制御されてい
る。
The heated gas is the gas outlet 11
The substrate 2 is heated by being blown onto the back surface of the substrate 2 from a, 11b, and 11c. The temperature of the substrate 2 is kept at a target value by the temperature control unit 6 and the thermocouple 5, and the gas flow rate is controlled by the gas flow rate control unit 9.

【0009】[0009]

【発明が解決しようとする課題】一般に真空中で基板処
理を行う場合、例えば、スパッタリングにより基板に薄
膜を形成する場合、あるいは基板表面をプラズマにより
エッチングする場合等は、基板に対して高エネルギーを
もった粒子が入射,衝突するため、基板の温度が上昇す
ることが多い。
Generally, when a substrate is processed in a vacuum, for example, when a thin film is formed on the substrate by sputtering, or when the surface of the substrate is etched by plasma, high energy is applied to the substrate. The temperature of the substrate often rises due to the particles that have entered and collided.

【0010】上述の従来のランプ式加熱機構では、基板
処理と同時に加熱を行うと、赤外線ランプヒータの熱輻
射に加え、基板処理によっても基板温度が上昇し、目標
温度より高くなる。
In the above-described conventional lamp type heating mechanism, if the heating is performed at the same time as the substrate processing, the substrate temperature rises due to the substrate radiation as well as the heat radiation of the infrared lamp heater, and becomes higher than the target temperature.

【0011】しかし、真空中では、熱の逃げ道がないた
め、基板温度を目標値に保つことができなくなるという
問題点があった。
However, there is a problem that the substrate temperature cannot be maintained at the target value because there is no escape route for heat in a vacuum.

【0012】一方、従来のガス加熱機構では、ガスを熱
伝導の媒体としているため、上述のように基板処理中に
基板温度が上昇しても、その熱を基板ホルダから冷却板
へと逃がすことが可能であり、基板温度を一定に保つこ
とができる。
On the other hand, in the conventional gas heating mechanism, since the gas is used as a heat conducting medium, even if the substrate temperature rises during the substrate processing as described above, the heat can be released from the substrate holder to the cooling plate. It is possible to keep the substrate temperature constant.

【0013】しかし、このように基板ホルダは冷却板に
より冷却されているため、加熱効率が悪く、ランプ式加
熱機構に比べて、最高加熱温度が低く、また、昇温速度
が遅いという欠点を有していた。昇温速度が遅いと、加
熱時間が長くなり、装置の処理能力を低下させてしま
う。
However, since the substrate holder is cooled by the cooling plate, the heating efficiency is poor, and the maximum heating temperature is lower and the temperature rising rate is slower than that of the lamp type heating mechanism. Was. If the temperature rising rate is slow, the heating time becomes long and the processing capacity of the apparatus is reduced.

【0014】本発明の目的は、基板の所望加熱温度に達
するまでの時間を短縮し、かつ処理中の基板温度が目標
温度より高くなることを防止した基板加熱機構を提供す
ることにある。
It is an object of the present invention to provide a substrate heating mechanism which shortens the time required to reach a desired heating temperature of a substrate and prevents the substrate temperature during processing from becoming higher than a target temperature.

【0015】[0015]

【課題を解決するための手段】前記目的を達成するた
め、本発明に係る基板加熱機構は、基板ホルダと、ガス
導入部と、加熱ヒータと、冷却部と、赤外線ランプヒー
タと、制御部とを有する基板加熱機構であって、基板ホ
ルダは、真空容器内に被処理基板を保持するものであ
り、ガス導入部は、基板ホルダ内を通して供給されたガ
スを被処理基板に吹付けてガスの熱伝導により基板を加
熱するものであり、加熱ヒータは、基板ホルダを加熱す
るものであり、冷却板は、基板ホルダを冷却するもので
あり、赤外線ランプヒータは、基板を熱輻射により加熱
するものであり、制御部は、被処理基板が所望の温度に
達した時点で赤外線ランプヒータをOFFし、ガス導入
部による加熱に切替える機能を有するものであるもので
ある。
In order to achieve the above object, a substrate heating mechanism according to the present invention comprises a substrate holder, a gas introducing section, a heater, a cooling section, an infrared lamp heater, and a control section. In the substrate heating mechanism having the substrate holder, the substrate holder holds the substrate to be processed in a vacuum container, and the gas introduction unit blows the gas supplied through the substrate holder onto the substrate to be processed. The heater heats the substrate by heat conduction, the heater heats the substrate holder, the cooling plate cools the substrate holder, and the infrared lamp heater heats the substrate by heat radiation. The control unit has a function of turning off the infrared lamp heater when the temperature of the substrate to be processed reaches a desired temperature and switching to heating by the gas introducing unit.

【0016】[0016]

【作用】ランプ式加熱機構とガス加熱機構とを併用し、
基板の所望加熱温度に達するまでランプ式加熱機構を用
い、その温度に達した後にガス加熱機構に切替えて処理
を行う。
[Function] Using a lamp type heating mechanism and a gas heating mechanism together,
The lamp type heating mechanism is used until the desired heating temperature of the substrate is reached, and after the temperature is reached, the processing is switched to the gas heating mechanism.

【0017】[0017]

【実施例】以下、本発明の一実施例を図により説明す
る。図1は、本発明の一実施例を示す断面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view showing an embodiment of the present invention.

【0018】図1において、真空容器1の内部には、基
板2を保持する基板ホルダ4が備えられており、基板ホ
ルダ4内部には、赤外線ランプヒータ7,熱電対5a,
加熱ヒータ8,熱電対5b,ガス導入部10とが組み込
まれている。14は基板押えであり、基板ホルダ4上の
基板2を保持する機能を有している。
In FIG. 1, a substrate holder 4 for holding a substrate 2 is provided inside the vacuum container 1. Inside the substrate holder 4, an infrared lamp heater 7, a thermocouple 5a,
The heater 8, the thermocouple 5b, and the gas introduction part 10 are incorporated. A substrate holder 14 has a function of holding the substrate 2 on the substrate holder 4.

【0019】熱電対5aと熱電対5bの出力信号は、そ
れぞれ温度制御部6a,6bに取り込まれる。なお、1
3は、赤外線ランプヒータ7の熱輻射を効率良く基板2
へ照射するための反射板であり、ガラス板3を透過し基
板2に照射される。
The output signals of the thermocouple 5a and the thermocouple 5b are taken into the temperature control units 6a and 6b, respectively. 1
3 is a substrate 2 for efficiently radiating the thermal radiation of the infrared lamp heater 7.
It is a reflection plate for irradiating the substrate 2, and the substrate 2 is irradiated with the light through the glass plate 3.

【0020】また、15は、温度制御部6a,6bから
の温度データに基づいて、基板2の所望加熱温度に達し
た時点で赤外線ランプヒータ7の電源を停止し、導入ガ
ス流量制御部9からガスをガス導入部10に導入してガ
スの熱伝導による加熱に切替える機能を有するととも
に、基板加熱機構全体の動作を制御する機能を有する制
御部である。
The reference numeral 15 stops the power supply of the infrared lamp heater 7 when the desired heating temperature of the substrate 2 is reached based on the temperature data from the temperature control units 6a and 6b, and the introduction gas flow rate control unit 9 The control unit has a function of introducing gas into the gas introduction unit 10 and switching to heating by heat conduction of the gas, and a function of controlling the operation of the entire substrate heating mechanism.

【0021】次に、基板の加熱方法について順に説明し
ていく。まず、基板搬送機構(図示せず)により加熱ヒ
ータ8で加熱されている基板ホルダ4上に基板2が搬送
されると、基板押え14が基板2を固定する。
Next, the method of heating the substrate will be described in order. First, when the substrate 2 is transferred onto the substrate holder 4 heated by the heater 8 by the substrate transfer mechanism (not shown), the substrate retainer 14 fixes the substrate 2.

【0022】次に、制御部15は赤外線ランプヒータ7
をONさせ温度制御部6aにより基板2の加熱温度を制
御する。
Next, the control unit 15 controls the infrared lamp heater 7
Is turned on and the heating temperature of the substrate 2 is controlled by the temperature controller 6a.

【0023】基板2の温度が所望の温度に達すると、制
御部15は赤外線ランプヒータ7をOFFにし、基板処
理を開始すると同時に、ガス導入部10よりプロセスガ
スと同等もしくは、不活性なガスを導入する。そのガス
量は、導入ガス流量制御部9により一定になるように制
御される。
When the temperature of the substrate 2 reaches a desired temperature, the control unit 15 turns off the infrared lamp heater 7 to start the substrate processing, and at the same time, the gas introduction unit 10 supplies a gas equal to or inert to the process gas. Introduce. The amount of gas is controlled to be constant by the introduced gas flow rate control unit 9.

【0024】加熱されている基板ホルダ4の内部を通過
することにより加熱されたガスが、ガス吹出口11a,
11b,11cより基板2の裏面に吹付けられる。この
加熱されたガスにより基板2が加熱される。
The gas heated by passing through the inside of the heated substrate holder 4 is heated by the gas outlet 11a,
It is sprayed on the back surface of the substrate 2 from 11b and 11c. The substrate 2 is heated by this heated gas.

【0025】また、基板処理により生じる熱で基板2自
体が加熱されても、ガスが導入されているため、基板2
の熱を基板ホルダ4から冷却板13へ逃がすことによ
り、基板2の温度上昇を抑え、かつ、温度制御部6bに
より目標値に制御を行う。
Further, even if the substrate 2 itself is heated by the heat generated by the substrate processing, since the gas is introduced, the substrate 2
By letting the heat from the substrate holder 4 escape to the cooling plate 13, the temperature rise of the substrate 2 is suppressed, and the temperature controller 6b controls the temperature to the target value.

【0026】基板2の処理終了と同時に導入していたガ
スを止めて、基板搬送機構(図示せず)により、次の基
板2と入れ替える。以上のようにして、順次基板の加熱
処理が行われていく。
The gas introduced at the same time as the processing of the substrate 2 is stopped, and the substrate 2 is replaced with the next substrate by a substrate transfer mechanism (not shown). As described above, the heat treatment of the substrate is sequentially performed.

【0027】[0027]

【発明の効果】以上説明したように本発明の基板加熱機
構は、一つの基板ホルダ内部に熱輻射による基板加熱機
構とガスの熱伝導による加熱機構とを同時に備え、かつ
両者を切替えて使用するようにしたため、基板処理前の
昇温速度を早め、かつ処理中に基板温度上昇を抑えて温
度制御ができる。
As described above, the substrate heating mechanism of the present invention is provided with a substrate heating mechanism by heat radiation and a heating mechanism by heat conduction of gas in one substrate holder at the same time, and both are used by switching. As a result, the temperature can be controlled by increasing the temperature rising rate before the substrate processing and suppressing the substrate temperature rise during the processing.

【0028】このため、装置の処理能力が向上し、処理
中にも所望の温度で基板加熱ができるという効果を有す
る。
Therefore, the processing capacity of the apparatus is improved, and the substrate can be heated at a desired temperature during processing.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.

【図2】従来のランプ式加熱機構を示す断面図である。FIG. 2 is a sectional view showing a conventional lamp type heating mechanism.

【図3】従来のガス式加熱機構を示す断面図である。FIG. 3 is a sectional view showing a conventional gas type heating mechanism.

【符号の説明】[Explanation of symbols]

1 真空容器 2 基板 3 ガラス板 4 基板ホルダ 5a,5b 熱電対 6a,6b 温度制御部 7 赤外線ランプヒータ 8 加熱ヒータ 9 導入ガス流量制御部 10 ガス導入部 11a,11b,11c ガス吹出口 12 冷却板 13 反射板 14 基板押え 15 制御部 DESCRIPTION OF SYMBOLS 1 Vacuum container 2 Substrate 3 Glass plate 4 Substrate holder 5a, 5b Thermocouple 6a, 6b Temperature control unit 7 Infrared lamp heater 8 Heating heater 9 Introduced gas flow rate control unit 10 Gas introduction unit 11a, 11b, 11c Gas outlet 12 Cooling plate 13 Reflector 14 Substrate retainer 15 Controller

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 基板ホルダと、ガス導入部と、加熱ヒー
タと、冷却部と、赤外線ランプヒータと、制御部とを有
する基板加熱機構であって、 基板ホルダは、真空容器内に被処理基板を保持するもの
であり、 ガス導入部は、基板ホルダ内を通して供給されたガスを
被処理基板に吹付けてガスの熱伝導により基板を加熱す
るものであり、 加熱ヒータは、基板ホルダを加熱するものであり、 冷却板は、基板ホルダを冷却するものであり、 赤外線ランプヒータは、基板を熱輻射により加熱するも
のであり、 制御部は、被処理基板が所望の温度に達した時点で赤外
線ランプヒータをOFFし、ガス導入部による加熱に切
替える機能を有するものであることを特徴とする基板加
熱機構。
1. A substrate heating mechanism having a substrate holder, a gas introduction unit, a heater, a cooling unit, an infrared lamp heater, and a control unit, wherein the substrate holder is a substrate to be processed in a vacuum container. The gas introduction part is to heat the substrate by spraying the gas supplied through the substrate holder onto the substrate to be processed to heat the substrate by heat conduction of the gas. The heater heats the substrate holder. The cooling plate is for cooling the substrate holder, the infrared lamp heater is for heating the substrate by heat radiation, and the control unit is the infrared ray when the substrate to be processed reaches a desired temperature. A substrate heating mechanism having a function of turning off a lamp heater and switching to heating by a gas introduction unit.
JP4126792A 1992-04-20 1992-04-20 Substrate heating mechanism Pending JPH05299350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4126792A JPH05299350A (en) 1992-04-20 1992-04-20 Substrate heating mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4126792A JPH05299350A (en) 1992-04-20 1992-04-20 Substrate heating mechanism

Publications (1)

Publication Number Publication Date
JPH05299350A true JPH05299350A (en) 1993-11-12

Family

ID=14944065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4126792A Pending JPH05299350A (en) 1992-04-20 1992-04-20 Substrate heating mechanism

Country Status (1)

Country Link
JP (1) JPH05299350A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007226122A (en) * 2006-02-27 2007-09-06 Hitachi Displays Ltd Manufacturing method for liquid crystal display device and liquid crystal display device manufactured by same manufacturing method
KR20140026307A (en) * 2012-08-23 2014-03-05 램 리서치 아게 Method and appratus for liquid treatment of wafer shaped articles
US10937672B2 (en) 2015-10-09 2021-03-02 Beijing Naura Microelectronics Equipment Co., Ltd. Heating device and heating chamber

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007226122A (en) * 2006-02-27 2007-09-06 Hitachi Displays Ltd Manufacturing method for liquid crystal display device and liquid crystal display device manufactured by same manufacturing method
KR20140026307A (en) * 2012-08-23 2014-03-05 램 리서치 아게 Method and appratus for liquid treatment of wafer shaped articles
JP2014042027A (en) * 2012-08-23 2014-03-06 Lam Research Ag Method and apparatus for liquid treatment of wafer shaped articles
US10937672B2 (en) 2015-10-09 2021-03-02 Beijing Naura Microelectronics Equipment Co., Ltd. Heating device and heating chamber

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