JPH0529467A - Fuse for redundant circuit use - Google Patents
Fuse for redundant circuit useInfo
- Publication number
- JPH0529467A JPH0529467A JP18283391A JP18283391A JPH0529467A JP H0529467 A JPH0529467 A JP H0529467A JP 18283391 A JP18283391 A JP 18283391A JP 18283391 A JP18283391 A JP 18283391A JP H0529467 A JPH0529467 A JP H0529467A
- Authority
- JP
- Japan
- Prior art keywords
- fuse
- laser beam
- fuses
- redundant circuit
- window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は冗長回路用ヒューズに関
し、特に半導体集積回路用の冗長回路用ヒューズに関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a redundant circuit fuse, and more particularly to a redundant circuit fuse for a semiconductor integrated circuit.
【0002】[0002]
【従来の技術】従来の冗長回路用ヒューズは、図3に示
すように、等間隔にヒューズ3が並んでおり、ヒューズ
に対して垂直方向に直線的な照射窓5が開いているとい
う構造であった。ヒューズ3はコンタクト2を介して対
応する配線1と接続されていた。2. Description of the Related Art A conventional redundant circuit fuse has a structure in which, as shown in FIG. 3, fuses 3 are arranged at equal intervals and a linear irradiation window 5 is opened in a direction perpendicular to the fuses. there were. The fuse 3 was connected to the corresponding wiring 1 via the contact 2.
【0003】[0003]
【発明が解決しようとする課題】この従来の冗長回路用
ヒューズでは、ヒューズ切断用レーザ装置のレーザ光線
の位置ずれによって隣接するヒューズを切断してしまう
という欠点があった。また、ヒューズの切断ミスを無く
そうとしてレーザ光線の大きさを大きくすればする程前
述の欠点が発生し易くなるという問題点があった。さら
に、この問題点を回避しようとして、ヒューズの間隔を
大きくすると必然的に半導体集積回路の寸法が大きくな
るという問題点があった。This conventional redundant circuit fuse has a drawback that adjacent fuses are cut due to the positional deviation of the laser beam of the fuse cutting laser device. In addition, the larger the size of the laser beam in order to eliminate a mistake in cutting the fuse, the more likely the above-mentioned defects occur. Further, there has been a problem that if the distance between the fuses is increased to avoid this problem, the size of the semiconductor integrated circuit inevitably increases.
【0004】[0004]
【課題を解決するための手段】本発明の冗長回路用ヒュ
ーズは、使用中の冗長回路である第一の冗長回路と、不
用な冗長回路である第二の冗長回路と、等間隔に配列さ
れ前記第一および第二の冗長回路にそれぞれ接続された
第一および第二のヒューズと、前記第二の冗長回路を分
離するためレーザ光線により前記第二のヒューズを照射
するための照射窓とを備える半導体集積回路の冗長回路
用ヒューズにおいて、前記レーザ光線が燒断する第二の
ヒューズに互いに隣接する前記第一のヒューズを照射し
ないようジグザグ状に形成した前記照射窓を備えて構成
されている。A fuse for a redundant circuit of the present invention has a first redundant circuit, which is a redundant circuit in use, and a second redundant circuit, which is an unnecessary redundant circuit, arranged at equal intervals. First and second fuses respectively connected to the first and second redundant circuits, and an irradiation window for irradiating the second fuse with a laser beam for separating the second redundant circuit. In a redundant circuit fuse of a semiconductor integrated circuit, which is provided, the irradiation window is formed in a zigzag shape so as not to irradiate the first fuses adjacent to each other with the second fuse blown by the laser beam. .
【0005】[0005]
【実施例】次に本発明について図面を参照して説明す
る。図1は本発明の冗長回路用ヒューズの第一実施例を
示す平面図である。The present invention will be described below with reference to the drawings. FIG. 1 is a plan view showing a first embodiment of a redundant circuit fuse of the present invention.
【0006】図1において、配線1とコンタクト2で接
続された互いに隣接したヒューズ3A,3Bが形成され
ており、そのヒューズ3A,3B上にヒューズ燒断用レ
ーザ光線の照射窓4がジグザグに形成されている。レー
ザ光線によりヒューズ3Aを切断する場合、この照射窓
4が開いている部分にレーザを照射する。In FIG. 1, fuses 3A and 3B connected to a wiring 1 and a contact 2 are formed adjacent to each other, and an irradiation window 4 of a laser beam for blowing a fuse is formed in a zigzag pattern on the fuses 3A and 3B. Has been done. When the fuse 3A is cut by the laser beam, the laser is applied to the portion where the irradiation window 4 is open.
【0007】同じレーザ光線を照射する場合でも照射窓
4の開口部分のヒューズ3Aと照射窓4の開口から外れ
ている部分のヒューズ3Bでは切断可能なレーザ出力が
異なるため、レーザの照射位置がずれて照射窓4の開口
部から外れている隣接するヒューズ3Bにレーザが照射
されても誤って切断される事はない。Even when the same laser beam is emitted, the fuse 3A in the opening portion of the irradiation window 4 and the fuse 3B in the portion outside the opening of the irradiation window 4 have different laser outputs that can be cut, and therefore the laser irradiation position is displaced. Even if the fuse 3B adjacent to the fuse 3B that is out of the opening of the irradiation window 4 is irradiated with the laser, it is not accidentally cut.
【0008】またレーザ光線照射位置ズレによるヒュー
ズ3Aの切断ミスを回避するためにレーザビーム径を大
きくした事によって隣接するヒューズ3Bが切断され易
くなるという恐れもなくなる。Further, since the diameter of the laser beam is increased in order to avoid mistaken cutting of the fuse 3A due to the deviation of the laser beam irradiation position, there is no fear that the adjacent fuse 3B is easily cut.
【0009】また、隣接するヒューズ3Bが切断され難
いということより、ヒューズ3Aとの間の間隔を小さく
できるようになる。Further, since it is difficult for the adjacent fuse 3B to be blown, the space between the fuse 3A and the fuse 3A can be reduced.
【0010】図2は本発明の冗長回路用ヒューズの第二
の実施例を示す平面図である。FIG. 2 is a plan view showing a second embodiment of the redundant circuit fuse of the present invention.
【0011】本実施例では、実際に切断されるヒューズ
3Aの隣りが材質の異なる配線1であるため、この配線
1にヒューズ3Aより切断され難い材料を使うことで隣
接するヒューズ3Aに照射されるレーザによる切断等の
影響を受けにくくなる。In the present embodiment, the fuse 3A that is actually cut is adjacent to the wiring 1 made of a different material. Therefore, by using a material that is harder to cut than the fuse 3A for this wiring 1, the adjacent fuse 3A is irradiated. It is less susceptible to laser cutting and the like.
【0012】[0012]
【発明の効果】以上説明したように、本発明の冗長回路
用ヒューズは、ジグザグ状に形成したレーザ光線の照射
窓を備えることにより、ヒューズをレーザ光線で燒断す
るときに隣接するヒューズまで燒断してしまうというこ
とを防止できるという効果がある。また、ヒューズの間
隔を小さくすることができるという効果がある。As described above, the redundant circuit fuse of the present invention is provided with the laser beam irradiation window formed in a zigzag shape, so that when the fuse is blown by the laser beam, the adjacent fuse is blown. There is an effect that it is possible to prevent it from being cut off. Further, there is an effect that the interval between the fuses can be reduced.
【図1】本発明の冗長回路用ヒューズの第一の実施例を
示す平面図である。FIG. 1 is a plan view showing a first embodiment of a redundant circuit fuse of the present invention.
【図2】本発明の冗長回路用ヒューズの第一の実施例を
示す平面図である。FIG. 2 is a plan view showing a first embodiment of a redundant circuit fuse of the present invention.
【図3】従来の冗長回路用ヒューズの一例を示す平面図
である。FIG. 3 is a plan view showing an example of a conventional redundant circuit fuse.
1 配線 2 コンタクト 3,3A,3B ヒューズ 4,5 照射窓 1 Wiring 2 Contact 3, 3A, 3B Fuse 4, 5 Irradiation window
Claims (1)
と、不用な冗長回路である第二の冗長回路と、等間隔に
配列され前記第一および第二の冗長回路にそれぞれ接続
された第一および第二のヒューズと、前記第二の冗長回
路を分離するためレーザ光線により前記第二のヒューズ
を照射するための照射窓とを備える半導体集積回路の冗
長回路用ヒューズにおいて、 前記レーザ光線が燒断する第二のヒューズに互いに隣接
する前記第一のヒューズを照射しないようジグザグ状に
形成した前記照射窓を備えることを特徴とする冗長回路
用ヒューズ。Claim: What is claimed is: 1. A first redundant circuit, which is a redundant circuit in use, and a second redundant circuit, which is an unnecessary redundant circuit. The first and second redundant circuits are arranged at equal intervals. Redundant circuit of semiconductor integrated circuit including first and second fuses respectively connected to the redundant circuit, and an irradiation window for irradiating the second fuse with a laser beam for separating the second redundant circuit Fuse for a redundant circuit, comprising: a second fuse that is blown by the laser beam, and the irradiation window formed in a zigzag shape so as not to irradiate the first fuse adjacent to each other.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18283391A JPH0529467A (en) | 1991-07-24 | 1991-07-24 | Fuse for redundant circuit use |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18283391A JPH0529467A (en) | 1991-07-24 | 1991-07-24 | Fuse for redundant circuit use |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0529467A true JPH0529467A (en) | 1993-02-05 |
Family
ID=16125267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18283391A Pending JPH0529467A (en) | 1991-07-24 | 1991-07-24 | Fuse for redundant circuit use |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0529467A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0746025A2 (en) * | 1995-05-31 | 1996-12-04 | Siemens Aktiengesellschaft | Improved fuse link structures through the addition of dummy structures |
EP0720229A3 (en) * | 1994-12-29 | 1998-01-07 | Siemens Aktiengesellschaft | Double density fuse bank for the laser break-link programming of an integrated circuit |
WO2000008687A1 (en) * | 1998-08-04 | 2000-02-17 | Infineon Technologies Ag | Integrated circuit comprising fuse links which can be separated by the action of energy |
KR100317533B1 (en) * | 1999-11-10 | 2001-12-24 | 윤종용 | Architecture of LASER fuse box in semiconductor intergreated circuit device and method for fabricating the same |
US6380838B1 (en) | 1999-06-07 | 2002-04-30 | Nec Corporation | Semiconductor device with repair fuses and laser trimming method used therefor |
KR100338842B1 (en) * | 1998-11-11 | 2002-05-30 | 니시가키 코지 | Redundancy fuse block having a small occupied area |
JP2017084849A (en) * | 2015-10-22 | 2017-05-18 | ラピスセミコンダクタ株式会社 | Semiconductor device and method of manufacturing the same |
-
1991
- 1991-07-24 JP JP18283391A patent/JPH0529467A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0720229A3 (en) * | 1994-12-29 | 1998-01-07 | Siemens Aktiengesellschaft | Double density fuse bank for the laser break-link programming of an integrated circuit |
KR100399448B1 (en) * | 1994-12-29 | 2004-02-25 | 지멘스 악티엔게젤샤프트 | Fusebanks used in laser programming of integrated circuits and methods of manufacturing the same |
EP0746025A2 (en) * | 1995-05-31 | 1996-12-04 | Siemens Aktiengesellschaft | Improved fuse link structures through the addition of dummy structures |
EP0746025A3 (en) * | 1995-05-31 | 1998-06-03 | Siemens Aktiengesellschaft | Improved fuse link structures through the addition of dummy structures |
WO2000008687A1 (en) * | 1998-08-04 | 2000-02-17 | Infineon Technologies Ag | Integrated circuit comprising fuse links which can be separated by the action of energy |
US6302729B2 (en) | 1998-08-04 | 2001-10-16 | Infineon Technologies Ag | Integrated circuit with electrical connection points that can be severed by the action of energy |
KR100338842B1 (en) * | 1998-11-11 | 2002-05-30 | 니시가키 코지 | Redundancy fuse block having a small occupied area |
US6380838B1 (en) | 1999-06-07 | 2002-04-30 | Nec Corporation | Semiconductor device with repair fuses and laser trimming method used therefor |
KR100317533B1 (en) * | 1999-11-10 | 2001-12-24 | 윤종용 | Architecture of LASER fuse box in semiconductor intergreated circuit device and method for fabricating the same |
JP2017084849A (en) * | 2015-10-22 | 2017-05-18 | ラピスセミコンダクタ株式会社 | Semiconductor device and method of manufacturing the same |
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