JPH05291886A - Semiconductor integrated circuit device - Google Patents

Abstract

PURPOSE:To prevent malfunction of the semiconductor integrated circuit device main body due to external noise. CONSTITUTION:A resistor 6 is inserted to an external power supply line 3 connecting to a power terminal 1A of the semiconductor integrated circuit device main body 1 and a resistor 7 is inserted to an external ground line 4 connecting to a ground terminal 1B of the semiconductor integrated circuit device main body 1 and a capacitor 2 used to form a noise filter with the resistors 6, 7 is connected between the power terminal 1A and the ground terminal 1B of the semiconductor integrated circuit device main body 1. A fluctuation of a potential at the power terminal 1A and the ground terminal 1B due to external noise superimposed on the external power line 3 and the external ground line 4 is suppressed by the noise filter.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device.

[0002]

2. Description of the Related Art FIG. 3 shows a conventional example of a semiconductor integrated circuit device. In this semiconductor integrated circuit device, as shown in FIG. 3, a capacitor 2 is connected between a power supply terminal 1A and a ground terminal 1B of the semiconductor integrated circuit device body 1, and an external power supply line is connected to the power supply terminal 1A of the semiconductor integrated circuit device body 1. (V _CC ) 3
, An external ground line (G _ND ) 4 is connected to the ground terminal 1B, and an external output line (O _UT ) 5 is connected to the output terminal 1C.

In the semiconductor integrated circuit device configured as described above, when the potential of the external power supply line 3 swings due to external noise, the potential fluctuation ΔV _A of the power supply terminal 1A is determined by the impedance Z _{C of the} capacitor 2 and the external power supply. From the impedance Z _{1 of the} line 3, it can be expressed by Equation 1.

[0004]

[Equation 1]

Further, when the potential of the external ground line 4 fluctuates due to external noise, the fluctuation ΔV _B of the potential of the ground terminal 1B is determined by the impedance Z _{C of the} capacitor 2.
And the impedance Z ₂ of the external ground line 4 can be expressed by Equation 2.

[0006]

[Equation 2]

[0007]

However, in the above-mentioned configuration of the conventional example, the line impedances Z ₁ and Z ₂ of the external power supply line 3 and the external ground line 4 are extremely small, respectively, and the power supply terminal 1A and the ground terminal. It has been determined only by the capacitance of the capacitor 2 that the fluctuations ΔV _A and ΔV _B of the potential of 1B are suppressed.

However, since the capacity of the capacitor 2 has a limit, the fluctuations ΔV _A and ΔV _B of the potentials of the power supply terminal 1A and the ground terminal 1B cannot be suppressed, and the semiconductor integrated circuit device body 1 malfunctions due to external noise. There was a problem that it would end up. Therefore, the object of the present invention is to
An object of the present invention is to provide a semiconductor integrated circuit device capable of preventing malfunction of the semiconductor integrated circuit device main body due to external noise.

[0009]

According to the present invention, a resistor is inserted in each of a power line and a ground line, and a noise filter is formed by these resistors and a capacitor connected between the power terminal and the ground terminal of a semiconductor integrated circuit device body. With this noise filter, fluctuations in the potential of the power supply terminal and the ground terminal due to external noise on the power supply line and the ground line, or the internal power supply line from the power supply terminal and the ground terminal of the semiconductor integrated circuit device body to the internal circuit, respectively. It is intended to suppress the fluctuation of the potential of the internal ground line and prevent the malfunction of the internal circuit of the semiconductor integrated circuit device body.

According to another aspect of the semiconductor integrated circuit device of the present invention, a first resistor is inserted into an external power supply line connected to a power supply terminal of the semiconductor integrated circuit device body and is connected to a ground terminal of the semiconductor integrated circuit device body. A second resistor is inserted in the external ground line, and a capacitor forming a noise filter is connected between the power supply terminal and the ground terminal of the semiconductor integrated circuit device body by the first and second resistors.

According to another aspect of the semiconductor integrated circuit device of the present invention, a first resistor is inserted in an internal power supply line from the power supply terminal of the semiconductor integrated circuit device body to its internal circuit, and the first resistor is connected to the ground terminal of the semiconductor integrated circuit device body. Between the first and second capacitor connection terminals of the semiconductor integrated circuit device main body, in which a second resistor is inserted in an internal ground line reaching the internal circuit, and the internal power supply line connection part and the internal ground line connection part of the internal circuit are respectively drawn. To the first and second
A capacitor that forms a noise filter is connected to the resistor.

According to another aspect of the semiconductor integrated circuit device of the present invention, a first path is provided in the internal power supply line extending from the power supply terminal of the semiconductor integrated circuit device body to the plurality of internal circuits, and only to the internal circuit vulnerable to external noise. A resistor is inserted, and a second resistor is inserted in a path extending only to an internal circuit vulnerable to external noise in an internal ground line extending from the ground terminal of the semiconductor integrated circuit device body to the plurality of internal circuits, and is vulnerable to external noise. A capacitor is connected between the first and second capacitor connection terminals of the main body of the semiconductor integrated circuit device which are respectively drawn into the internal power line connection part and the internal ground line connection part of the internal circuit.

[0013]

According to the structure of claim 1, between the first resistor inserted in the external power supply line, the second resistor inserted in the external ground line, and the power supply terminal and the ground terminal of the semiconductor integrated circuit device body. The connected capacitor functions as a noise filter for external noise on the external power supply line and the external ground line, and suppresses fluctuations in the potentials of the power supply terminal and the ground terminal of the semiconductor integrated circuit device body due to external noise. Prevents malfunction of internal circuits of the device.

According to the second aspect of the present invention, the first resistor inserted in the internal power supply line, the second resistor inserted in the internal ground line, the internal power supply line connecting portion and the internal ground line connecting portion of the internal circuit are connected. An external power supply line and an external ground line, in which capacitors respectively connected between the first and second capacitor connection terminals of the semiconductor integrated circuit device body to be drawn are respectively connected to the power supply terminal and the ground terminal of the semiconductor integrated circuit device body. Functions as a noise filter against external noise
The potential fluctuations of the internal power supply line connecting portion and the internal ground line connecting portion of the internal circuit of the semiconductor integrated circuit device main body due to external noise are suppressed, and malfunction of the internal circuit of the semiconductor integrated circuit device main body is prevented.

According to the third aspect of the present invention, the first resistor inserted in the path extending only to the internal circuit vulnerable to external noise in the internal power supply line and the internal circuit vulnerable to external noise in the internal ground line. Between the first resistor and the second capacitor connected terminals of the semiconductor integrated circuit device body which are respectively drawn into the second resistor inserted in the path extending only to the internal power supply line connection part and the internal ground line connection part of the internal circuit vulnerable to external noise. The connected capacitor functions as a noise filter for external noise on the external power supply line and the external ground line connected to the power supply terminal and the ground terminal of the semiconductor integrated circuit device body, respectively, and the semiconductor integrated circuit device body due to external noise Internal power supply line connection part of the internal circuit that is vulnerable to external noise among multiple internal circuits of Shake the suppression parts ground line connection of potential, to prevent malfunction of the internal circuit of the semiconductor integrated circuit device body.

Further, since the first and second resistors are not inserted in the path to the internal circuit which is strong against external noise in the internal power supply line and the internal ground line,
There is no useless voltage drop due to the first and second resistors when power is supplied to the internal circuit that is strong against external noise, and the power supply voltage can be effectively used.

[0017]

Embodiments of the present invention will now be described with reference to the drawings. [First Embodiment] FIG. 1 is a circuit diagram of a semiconductor integrated circuit device according to a first embodiment of the present invention. In this semiconductor integrated circuit device, as shown in FIG. 1, a capacitor 2 is connected between a power supply terminal 1A and a ground terminal 1B of a semiconductor integrated circuit device body 1, and a power supply terminal 1A of the semiconductor integrated circuit device body 1 is connected.
_Is connected to the external power supply line (V _CC ) 3, the ground terminal 1B is connected to the external ground line (G _ND ) 4, and the output terminal 1C is connected to the external output line (O _UT ) 5.
Then, the first resistor 6 is inserted in the external power supply line 3 and the second resistor 7 is inserted in the external ground line 4.

In this semiconductor integrated circuit device, the first resistor 6 inserted in the external power supply line 3, the second resistor 7 inserted in the external ground line 4, and the semiconductor integrated circuit device body 1
The capacitor 2 connected between the power supply terminal 1A and the ground terminal 1B functions as a noise filter for external noise on the external power supply line 3 and the external ground line 4.

Specifically, for the external noise on the external power supply line 3, the first resistor 6 and the capacitor 2 function as a noise filter, and the external ground line 4
The second resistor 7 and the capacitor 2 function as a noise filter for the external noise due to the noise. As a result,
It is possible to suppress fluctuations in the potentials of the power supply terminal 1A and the ground terminal 1B of the semiconductor integrated circuit device body 1 due to external noise, and prevent malfunction of the internal circuit of the semiconductor integrated circuit device body 1.

[Second Embodiment] FIG. 2 is a circuit diagram of a semiconductor integrated circuit device according to a second embodiment of the present invention. In this semiconductor integrated circuit device, as shown in FIG. 2, a semiconductor integrated circuit device main body 1 includes a comparator 8 having a hysteresis characteristic in input / output characteristics, a transistor 9 whose output is a base input, and a noise filter configuration. First and second
The resistors 10 and 11 are built in.

The first resistor 10 is inserted in the middle of the internal power supply line 12 from the power supply terminal 1A to the internal power supply line connecting portion 8A of the comparator 8. The second resistor 11 is inserted in the middle of the internal ground line 13 from the ground terminal 1B to the internal ground line connection portion 8B of the comparator 8. In addition, the comparator 8
The first and second capacitor connection terminals 1D and 1E, which are respectively drawn into the internal power supply line connecting portion 8A and the internal ground line connecting portion 8B, are provided in the semiconductor integrated circuit device main body 1, and the first and second capacitor connecting terminals are provided. A capacitor 2 that forms a noise filter with the first and second resistors 10 and 11 is connected between 1D and 1E.

The pair of input terminals of the comparator 8 are connected to the signal input terminals 1F and 1G of the semiconductor integrated circuit device body 8. The collector of the transistor 9 is the output terminal 1C.
And the emitter is connected to the ground terminal 1B. The external power supply line (V _CC ) 3 is connected to the power supply terminal 1A of the semiconductor integrated circuit device body 1, and the ground terminal 1B
_Is connected to the external ground line (G _ND ) 4 and the output terminal 1C is connected to the external output line (O _UT ) 5.

The operation of the circuit shown in FIG. 2 will be described. In this semiconductor integrated circuit device body 1, when a signal is input from the signal input terminals 1F and 1G, the comparator 8 operates, and an "H" or "L" signal is output depending on the level of the signal input from the comparator 8. It is output and input to the base of the transistor 9. Transistor 9, "H" or in accordance with the "L" signal performs the operation of "ON" or "OFF", the external output line (O _UT)
The large current I _SINK flowing through 5 is interrupted.

If external noise is present on the power supply line 3, the potential fluctuation ΔV _A of the comparator 8 on the power supply side, that is, the internal power supply line connection point 8A can be expressed by Equation 3.

[0025]

[Equation 3]

When an external noise is introduced to the ground line 4, the fluctuation ΔV _B of the potential of the ground side of the comparator 8, that is, the internal ground line connection point 8B is
It can be expressed by Equation 4.

[0027]

[Equation 4]

Here, in the above equations 3 and 4, Δ
V _CC is the fluctuation of the potential of the power supply line 3, ΔG _ND is the fluctuation of the potential of the ground line 4, and Z _C is the impedance represented by the equation 5.

[0029]

[Equation 5]

Here, in the above equation 5, f is the frequency of the external noise. According to the above equations 3 to 5, the first
And the filtering effect by the second resistor 10, 11 and the capacitor 2, deflection [Delta] V _B of the potential of the deflection [Delta] V _A and the internal ground line connection point 8B of the potential of the internal power line connecting points 8A due to external noise can be suppressed, a semiconductor It is possible to prevent malfunction of the capacitor 8 which is an internal circuit of the integrated circuit device body 1.

In the circuit of FIG. 2, the internal power supply line 12 connected to the comparator 8 which is weak against external noise.
The resistor 10 is inserted in the internal ground line 13 and the internal ground line 13 is not inserted in the internal ground line connected to the emitter of the transistor 9 which is strong against external noise. As described above, by not inserting the resistor for the filter into the internal ground line or the internal power line which is not affected by the external noise, the voltage applied to the transistor 9 is prevented from decreasing due to the voltage drop in the resistor. However, it is possible to effectively use the power supply voltage and at the same time reduce power loss. Furthermore, the comparator 8
Internal power line 12 and internal ground line 1 to
The power consumption of the comparator 8 is small, and the voltage drop due to the resistors 10 and 11 inserted in the internal power supply line 12 and the internal ground line 13 is small. Can be set to a large value, and fluctuations of the internal power supply line connecting portion 8A and the internal ground line connecting portion 8B with respect to external noise can be further reduced as compared with the first embodiment.

According to this embodiment, the internal power line 12
First resistor 10 and internal ground line 13 inserted in
The second resistor 11 inserted in the internal power line connection 8A and the internal ground line connection 8 of the comparator 8
The capacitor 2 connected between the first and second capacitor connection terminals 1D and 1E of the semiconductor integrated circuit device body 1 respectively drawn to B is connected to the power supply terminal 1A and the ground terminal 1B of the semiconductor integrated circuit device body 1, respectively. It functions as a noise filter for external noise on the connected external power supply line 3 and external ground line 4. As a result, the fluctuation of the potentials of the internal power line connection portion 8A and the internal ground line connection portion 8B of the comparator 8 of the semiconductor integrated circuit device body 1 due to external noise is suppressed, and the malfunction of the comparator 8 of the semiconductor integrated circuit device body 1 is prevented. can do.

Further, in this embodiment, since the first and second resistors are built in the semiconductor integrated circuit device body 1, the number of parts as a whole can be reduced.
Further, since the resistor for the filter is not inserted in the path of the internal ground line which reaches the transistor 9 which is strong against external noise, the first and second power lines for feeding the internal circuit which is strong against external noise are inserted. There is no useless voltage drop due to the resistance of, and the power supply voltage can be effectively used.

In this embodiment as well, it goes without saying that resistors for filters may be inserted in the power supply line 3 and the ground line 4.

[0035]

According to the semiconductor integrated circuit device of the first aspect, the capacitor connected between the power supply terminal and the ground terminal of the semiconductor integrated circuit device body, the first resistor inserted in the external power supply line, and the external ground. The second resistor inserted in the line can function as a filter for external noise on the external power supply line and the external ground line. As a result, fluctuations in the potentials of the power supply terminal and the ground terminal of the semiconductor integrated circuit device body due to external noise can be suppressed, and malfunction of the internal circuit of the semiconductor integrated circuit device body can be prevented.

According to another aspect of the semiconductor integrated circuit device of the present invention, the capacitor connected between the power supply terminal and the ground terminal of the semiconductor integrated circuit device body, the first resistor inserted in the internal power supply line, and the internal ground line are connected to each other. Second inserted
Of the semiconductor integrated circuit device main body can function as a filter for external noises on the external power supply line and the external ground line connected to the power supply terminal and the ground terminal of the semiconductor integrated circuit device body, respectively. As a result, it is possible to suppress fluctuations in the potential of the internal power supply line connection point and the internal ground line connection point of the internal circuit of the semiconductor integrated circuit device body due to external noise, and prevent malfunction of the internal circuit of the semiconductor integrated circuit device body. ..

According to the semiconductor integrated circuit device of the third aspect, only the capacitor connected between the power supply terminal and the ground terminal of the semiconductor integrated circuit device main body and the internal circuit vulnerable to external noise in the internal power supply line can be reached. A first resistor inserted in the path and a second resistor inserted in the path only to the internal circuit vulnerable to external noise in the internal ground line,
The semiconductor integrated circuit device main body can function as a filter for external noises on the external power supply line and the external ground line connected to the power supply terminal and the ground terminal, respectively. As a result, the fluctuation of the potential at the internal power supply line connection point and the internal ground line connection point of the internal circuit vulnerable to external noise among the plurality of internal circuits of the semiconductor integrated circuit device main body due to external noise is suppressed, and the semiconductor integrated circuit device main body is suppressed. The malfunction of the internal circuit of can be prevented.

Further, since the first and second resistors are not inserted in the paths to the internal circuit that is strong against external noise in the internal power supply line and the internal ground line, the internal circuit that is strong against external noise is provided. It is possible to prevent wasteful power loss due to the first and second resistors when the power is supplied.

[Brief description of drawings]

FIG. 1 is a circuit diagram showing a configuration of a semiconductor integrated circuit device according to a first embodiment of the present invention.

FIG. 2 is a circuit diagram showing a configuration of a semiconductor integrated circuit device according to a second embodiment of the present invention.

FIG. 3 is a circuit diagram showing a configuration of a conventional example of a semiconductor integrated circuit device.

[Explanation of symbols]

 1 Semiconductor Integrated Circuit Device Main Body 1A Power Supply Terminal 1B Ground Terminal 1C Output Terminal 1D Capacitor Connection Terminal 1E Capacitor Connection Terminal 2 Capacitor 3 Power Supply Line 4 Ground Line 5 External Output Line 6 First Resistor 7 Second Resistor 8 Comparator 8A Internal Power Supply Line connection part 8B Internal ground connection part 9 Transistor 10 First resistance 11 Second resistance 12 Internal power supply line 13 Internal ground line

Claims (3)

[Claims] 1. A semiconductor integrated circuit device body, a first resistor inserted in an external power supply line connected to a power supply terminal of the semiconductor integrated circuit device body, and a ground terminal of the semiconductor integrated circuit device body. The second resistor inserted in the external ground line is connected between the power supply terminal and the ground terminal of the semiconductor integrated circuit device body to connect the first resistor to the first resistor.
A semiconductor integrated circuit device comprising: and a capacitor that forms a noise filter with the second resistor. 2. A semiconductor integrated circuit device body, a first resistor inserted in an internal power supply line from a power supply terminal of the semiconductor integrated circuit device body to its internal circuit, and a ground terminal of the semiconductor integrated circuit device body. A second resistor inserted in an internal ground line leading to the internal circuit, and first and second capacitor connections of the semiconductor integrated circuit device main body which are respectively drawn into the internal power supply line connecting portion and the internal ground line connecting portion of the internal circuit. A semiconductor integrated circuit device comprising: a capacitor connected between terminals to form a noise filter with the first and second resistors. 3. A semiconductor integrated circuit device main body, and a first inserted into a path extending only to an internal circuit vulnerable to external noise in an internal power supply line extending from a power supply terminal of the semiconductor integrated circuit device main body to the plurality of internal circuits. Of the semiconductor integrated circuit device main body, a second resistor inserted in a path leading only to an internal circuit vulnerable to external noise in an internal ground line extending from the ground terminal of the semiconductor integrated circuit device main body to the plurality of internal circuits, and the external noise A semiconductor integrated circuit device comprising: a capacitor connected between first and second capacitor connection terminals of the semiconductor integrated circuit device body, which are respectively drawn into the internal power supply line connecting portion and the internal ground line connecting portion of the weak internal circuit.