JPH0528531Y2 - - Google Patents
Info
- Publication number
- JPH0528531Y2 JPH0528531Y2 JP16543285U JP16543285U JPH0528531Y2 JP H0528531 Y2 JPH0528531 Y2 JP H0528531Y2 JP 16543285 U JP16543285 U JP 16543285U JP 16543285 U JP16543285 U JP 16543285U JP H0528531 Y2 JPH0528531 Y2 JP H0528531Y2
- Authority
- JP
- Japan
- Prior art keywords
- charging
- discharge
- electrostatic discharge
- discharging
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 40
- 238000012360 testing method Methods 0.000 claims description 36
- 239000000523 sample Substances 0.000 claims description 31
- 238000007599 discharging Methods 0.000 claims description 27
- 239000004020 conductor Substances 0.000 claims description 22
- 239000012212 insulator Substances 0.000 claims description 7
- 238000009413 insulation Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 9
- 238000003780 insertion Methods 0.000 description 9
- 230000037431 insertion Effects 0.000 description 9
- 230000005672 electromagnetic field Effects 0.000 description 4
- 238000009434 installation Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16543285U JPH0528531Y2 (enrdf_load_stackoverflow) | 1985-10-28 | 1985-10-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16543285U JPH0528531Y2 (enrdf_load_stackoverflow) | 1985-10-28 | 1985-10-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6273273U JPS6273273U (enrdf_load_stackoverflow) | 1987-05-11 |
| JPH0528531Y2 true JPH0528531Y2 (enrdf_load_stackoverflow) | 1993-07-22 |
Family
ID=31095467
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16543285U Expired - Lifetime JPH0528531Y2 (enrdf_load_stackoverflow) | 1985-10-28 | 1985-10-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0528531Y2 (enrdf_load_stackoverflow) |
-
1985
- 1985-10-28 JP JP16543285U patent/JPH0528531Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6273273U (enrdf_load_stackoverflow) | 1987-05-11 |
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