JPH0527198B2 - - Google Patents

Info

Publication number
JPH0527198B2
JPH0527198B2 JP60044322A JP4432285A JPH0527198B2 JP H0527198 B2 JPH0527198 B2 JP H0527198B2 JP 60044322 A JP60044322 A JP 60044322A JP 4432285 A JP4432285 A JP 4432285A JP H0527198 B2 JPH0527198 B2 JP H0527198B2
Authority
JP
Japan
Prior art keywords
transistor
npn transistor
column line
output terminal
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60044322A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61204898A (ja
Inventor
Koichi Yoshii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP60044322A priority Critical patent/JPS61204898A/ja
Publication of JPS61204898A publication Critical patent/JPS61204898A/ja
Publication of JPH0527198B2 publication Critical patent/JPH0527198B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP60044322A 1985-03-06 1985-03-06 プログラム可能な読出し専用半導体記憶装置の検査方法 Granted JPS61204898A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60044322A JPS61204898A (ja) 1985-03-06 1985-03-06 プログラム可能な読出し専用半導体記憶装置の検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60044322A JPS61204898A (ja) 1985-03-06 1985-03-06 プログラム可能な読出し専用半導体記憶装置の検査方法

Publications (2)

Publication Number Publication Date
JPS61204898A JPS61204898A (ja) 1986-09-10
JPH0527198B2 true JPH0527198B2 (enExample) 1993-04-20

Family

ID=12688254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60044322A Granted JPS61204898A (ja) 1985-03-06 1985-03-06 プログラム可能な読出し専用半導体記憶装置の検査方法

Country Status (1)

Country Link
JP (1) JPS61204898A (enExample)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57191900A (en) * 1981-05-22 1982-11-25 Hitachi Ltd Method for junction destructive prom test

Also Published As

Publication number Publication date
JPS61204898A (ja) 1986-09-10

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