JPH05248847A - Measuring machine - Google Patents

Measuring machine

Info

Publication number
JPH05248847A
JPH05248847A JP5074892A JP5074892A JPH05248847A JP H05248847 A JPH05248847 A JP H05248847A JP 5074892 A JP5074892 A JP 5074892A JP 5074892 A JP5074892 A JP 5074892A JP H05248847 A JPH05248847 A JP H05248847A
Authority
JP
Japan
Prior art keywords
probe shaft
probe
measured
touch signal
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5074892A
Other languages
Japanese (ja)
Inventor
Kunitoshi Nishimura
国俊 西村
Hideo Morita
英夫 森田
Kenji Abiko
賢二 安孫子
Yasuhiro Ichiba
安博 市場
Kazuyoshi Okada
和義 岡田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Original Assignee
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp, Mitsutoyo Kiko Co Ltd filed Critical Mitutoyo Corp
Priority to JP5074892A priority Critical patent/JPH05248847A/en
Publication of JPH05248847A publication Critical patent/JPH05248847A/en
Pending legal-status Critical Current

Links

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PURPOSE:To obtain a measuring machine, which guarantees the highly accurate measurement by enhancing the returning reproducibility of a probe shaft to the neutral position. CONSTITUTION:A shaking mechanism 11, which applies the mechanical vibration to a probe shaft 3, and a control device, which actuates the shaking mechanism 11 immediately before the contact of the probe shaft 3 and a material to be measured, are provided. When the probe shaft 3 and the material to be measured are moved in the mutually opposite directions, the mechanical vibration can be applied to the probe shaft 3 with the shaking mechanism 11 immediately before the next contact of the probe shaft 3 and the material to be measured even if the probe shaft 3 is not returned to the neutral position owing to the frictional force between each contactor shaft 4 and an electric contact mechanism 6 and the like. Therefore, the probe shaft can be positively returned to the neutral position by the mechanical vibration.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、被測定物との接触状態
を電気的に検出するタッチ信号プローブを用いた測定機
に関する。例えば、タッチ信号プローブを用いた三次元
測定機などに利用できる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring instrument using a touch signal probe for electrically detecting a contact state with an object to be measured. For example, it can be used for a coordinate measuring machine using a touch signal probe.

【0002】[0002]

【背景技術】例えば、三次元測定機では、プローブと定
盤上に載置された被測定物とを三次元方向へ相対移動さ
せ、プローブが被測定物に接触した瞬間を捉え、この瞬
間を電気的トリガとして各送り軸方向の座標値を読み取
ることから、プローブと被測定物との接触状態を電気的
に検出しタッチ信号として出力できるタッチ信号プロー
ブが広く用いられている。
BACKGROUND ART For example, in a coordinate measuring machine, a probe and an object to be measured placed on a surface plate are relatively moved in a three-dimensional direction, and a moment when the probe comes into contact with the object to be measured is captured. A touch signal probe is widely used that can electrically detect the contact state between the probe and the object to be measured and output it as a touch signal because the coordinate value in each feed axis direction is read as an electrical trigger.

【0003】従来、三次元測定機などに広く用いられて
いるタッチ信号プローブは、図8に示す如く、シャンク
1Bを有するケース本体1に、接触球2を有するプロー
ブ軸3を支持し、このプローブ軸3の上端に中立軸線L
(一般にはシャンク1Bの軸線と同じ)を中心とする同
一円周上の120度間隔位置に中立軸線Lに対して直交
する接触子軸4A,4B,4Cを放射状に有する支持盤
5を設ける一方、ケース本体1内の底壁1Aに前記各接
触子軸4A,4B,4Cを前記円周上の両側からテーパ
状に挟む一対の導電性ピンからなる電気接点機構6A,
6B,6Cを設け、かつ、これらの電気接点機構6A,
6B,6Cに各接触子軸4A,4B,4Cが接触するよ
うに前記支持盤5を中立軸線L方向へ付勢するコイルば
ね7を設けた構造である。
As shown in FIG. 8, a touch signal probe which has been widely used in a conventional coordinate measuring machine has a case body 1 having a shank 1B and a probe shaft 3 having a contact ball 2 supported on the case body 1. Neutral axis L at the top of shaft 3
A support plate 5 having contactor shafts 4A, 4B, 4C that are orthogonal to the neutral axis L radially is provided at 120 degree intervals on the same circumference centered on (generally the same as the axis of the shank 1B). , An electrical contact mechanism 6A composed of a pair of conductive pins for sandwiching the contactor shafts 4A, 4B, 4C in a tapered shape from both sides on the circumference on a bottom wall 1A in the case body 1.
6B and 6C are provided, and these electrical contact mechanisms 6A,
6B, 6C is provided with a coil spring 7 for urging the support board 5 in the direction of the neutral axis L so that the contactor shafts 4A, 4B, 4C come into contact with each other.

【0004】従って、プローブ軸3は、3本の接触子軸
4A,4B,4C、これと接する電気接点機構6A,6
B,6Cおよび付勢部材であるコイルばね7により、ケ
ース本体1の中立位置(中立軸線L上の定位置)に保持
されているとともに、中立位置に対して変位可能かつ復
帰可能に支持されている。つまり、中立軸線L方向へ変
位可能かつその中立軸線Lに対して傾斜可能に支持され
ているとともに、中立位置に復帰可能に支持されてい
る。ここに、接触子軸4A,4B,4C、これと接する
電気接点機構6A,6B,6Cおよびコイルばね7によ
り、逃げ機構を有する三点支持機構8が形成されてい
る。また、接触子軸4A,4B,4Cおよびこれと接す
る電気接点機構6A,6B,6Cにより、プローブ軸3
と被測定物との接触状態を電気的に検出する検出手段9
が形成されている。
Therefore, the probe shaft 3 includes three contactor shafts 4A, 4B and 4C and electric contact mechanisms 6A and 6 which are in contact with the contactor shafts 4A, 4B and 4C.
B, 6C and a coil spring 7 as an urging member hold the case main body 1 at a neutral position (a fixed position on the neutral axis L) and are supported so as to be displaceable and returnable with respect to the neutral position. There is. That is, it is supported so as to be displaceable in the direction of the neutral axis L and tiltable with respect to the neutral axis L, and to be capable of returning to the neutral position. Here, the contactor shafts 4A, 4B, 4C, the electric contact mechanisms 6A, 6B, 6C in contact with the contactor shafts 4A, 4B, 4C, and the coil spring 7 form a three-point support mechanism 8 having an escape mechanism. Further, the probe shaft 3 is provided by the contactor shafts 4A, 4B, 4C and the electric contact mechanisms 6A, 6B, 6C in contact therewith.
Detecting means 9 for electrically detecting the contact state between the object and the object to be measured
Are formed.

【0005】いま、タッチ信号プローブと被測定物との
相対移動によってプローブ軸3の接触球2が被測定物に
接触したのち更に同方向へ僅か相対移動すると、プロー
ブ軸3は、被測定物との接触方向によって中立軸線L方
向へ変位または中立軸線Lに対して傾斜される。する
と、いずれかの接触子軸4A,4B,4Cが対応する電
気接点機構6A,6B,6Cから離れ、その電気接点機
構6A,6B,6Cが開かれる結果、タッチ信号が出力
される。これにより、タッチ信号が出力された時点の各
軸方向の座標値が読み取られ、その座標値を基に被測定
物の寸法や形状が求められる。
Now, when the contact ball 2 of the probe shaft 3 comes into contact with the object to be measured by the relative movement of the touch signal probe and the object to be measured, and then further moves slightly in the same direction, the probe shaft 3 moves to the object to be measured. Depending on the contact direction of the above, it is displaced in the direction of the neutral axis L or tilted with respect to the neutral axis L. Then, one of the contactor shafts 4A, 4B, 4C is separated from the corresponding electric contact mechanism 6A, 6B, 6C, and the electric contact mechanism 6A, 6B, 6C is opened, and as a result, a touch signal is output. As a result, the coordinate value in each axial direction at the time when the touch signal is output is read, and the size and shape of the object to be measured are obtained based on the coordinate value.

【0006】[0006]

【発明が解決しようとする課題】従来のタッチ信号プロ
ーブの構造では、タッチ信号プローブと被測定物とが接
触した状態から次の測定に際して、タッチ信号プローブ
と被測定物とが離れる方向へ相対移動すると、プローブ
軸3はコイルばね7の作用により中立位置に復帰される
ものと考えられる。つまり、コイルばね7の作用によ
り、接触子軸4A,4B,4Cが電気接点機構6A,6
B,6Cの安定位置に復帰されるものと考えられる。
In the structure of the conventional touch signal probe, the touch signal probe and the object to be measured move relative to each other in the direction away from the state where the touch signal probe and the object to be measured are in contact with each other in the next measurement. Then, it is considered that the probe shaft 3 is returned to the neutral position by the action of the coil spring 7. That is, due to the action of the coil spring 7, the contactor shafts 4A, 4B and 4C are connected to the electric contact mechanisms 6A and 6A.
It is considered that the stable positions of B and 6C are restored.

【0007】しかし、これは、接触子軸4A,4B,4
Cと電気接点機構6A,6B,6Cとの間の摩擦力が零
の場合であって、実際には接触子軸4A,4B,4Cと
電気接点機構6A,6B,6Cとの間の摩擦力が複雑に
作用しているため、接触子軸4A,4B,4Cが電気接
点機構6A,6B,6Cの安定位置に復帰できない場合
が生じる。つまり、接触子軸4A,4B,4Cが電気接
点機構6A,6B,6Cの安定位置の手前で静止してし
まう場合が生じる。
However, this is because the contactor shafts 4A, 4B, 4
When the frictional force between C and the electric contact point mechanism 6A, 6B, 6C is zero, the frictional force between the contactor shaft 4A, 4B, 4C and the electric contact point mechanism 6A, 6B, 6C is actually. , The contactor shafts 4A, 4B, 4C may not be able to return to the stable positions of the electric contact mechanisms 6A, 6B, 6C. In other words, the contactor shafts 4A, 4B, 4C may come to rest before the stable position of the electric contact mechanisms 6A, 6B, 6C.

【0008】いま、各電気接点機構6(6A,6B,6
C)と接触子軸4(4A,4B,4C)との間における
摩擦力をミクロ的に見れば、図9に示すようなばねモデ
ルで近似できる。摩擦力の作用の仕方をばねモデルで示
すと、図10(A)(B)(C)のように、各種の態様
が考えられる(これ以外にも種々の態様が存在す
る。)。このようなばねモデルから明らかなように、電
気接点の閉じる方向によって、静止状態における摩擦力
の作用状態が異なるため、中立位置への復帰再現性が悪
化するという欠点がある。
Now, each electric contact mechanism 6 (6A, 6B, 6
When the frictional force between C) and the contactor shaft 4 (4A, 4B, 4C) is viewed microscopically, it can be approximated by a spring model as shown in FIG. When the manner of the action of the frictional force is shown by a spring model, various modes are conceivable as shown in FIGS. 10A, 10B, and 10C (there are various modes other than this). As is apparent from such a spring model, the action state of the frictional force in the static state varies depending on the closing direction of the electrical contact, and thus there is a drawback that the reproducibility of returning to the neutral position deteriorates.

【0009】そのため、各接触子軸4A,4B,4Cと
各電気接点機構6A,6B,6Cとの間の接触表面を精
密仕上げしてその間の摩擦力を減らす、あるいは、潤滑
剤により接触子軸4A,4B,4Cと電気接点機構6
A,6B,6Cとの間の摩擦力を減らす工夫が考えられ
るが、いずれにしても、摩擦力が零にできるものではな
いから、抜本的な解決策とは言えない。
Therefore, the contact surface between each contactor shaft 4A, 4B, 4C and each electric contact mechanism 6A, 6B, 6C is precisely finished to reduce the frictional force therebetween, or the contactor shaft is lubricated. 4A, 4B, 4C and electrical contact mechanism 6
A method of reducing the frictional force between A, 6B, and 6C can be considered, but in any case, since the frictional force cannot be reduced to zero, it cannot be said to be a drastic solution.

【0010】ここに、本発明の目的は、このような従来
の問題を解消し、タッチ信号プローブのプローブ軸を中
立位置に確実に復帰させることができ、中立位置への復
帰再現性を高めて高精度測定を保障する測定機を提供す
ることにある。
It is an object of the present invention to solve such a conventional problem and to reliably return the probe shaft of the touch signal probe to the neutral position, thereby improving the reproducibility of returning to the neutral position. It is to provide a measuring machine that guarantees high-precision measurement.

【0011】[0011]

【課題を解決するための手段】そのため、本発明の測定
機は、ケース本体、プローブ軸、このプローブ軸を前記
ケース本体の中立位置に保持するとともにそのプローブ
軸を中立位置に対して変位可能かつ復帰可能に支持する
付勢部材を含む支持機構および前記プローブ軸と被測定
物との接触状態を電気的に検出する検出手段を含むタッ
チ信号プローブを有し、このタッチ信号プローブと被測
定物とを相対移動させながら前記プローブ軸と被測定物
とを接触させ、前記検出手段からのタッチ信号に基づい
て前記相対移動方向の変位量を読み取り、この値から被
測定物の寸法や形状などを測定する測定機において、前
記プローブ軸に機械的振動を加える加振機構を設けると
ともに、前記相対移動方向の変位量を読み取った後前記
プローブ軸と被測定物とが次に接触するまでの間に前記
加振機構を1回または2回以上作動させる手段を設け
た、ことを特徴とする。
Therefore, the measuring machine of the present invention is capable of holding the case body, the probe shaft, the probe shaft in the neutral position of the case body, and displace the probe shaft with respect to the neutral position. The touch signal probe includes a support mechanism including a biasing member that supports the return target and a detection unit that electrically detects a contact state between the probe shaft and the object to be measured, and the touch signal probe and the object to be measured. The probe shaft and the object to be measured are brought into contact with each other while being relatively moved, and the displacement amount in the relative movement direction is read based on the touch signal from the detection means, and the size or shape of the object to be measured is measured from this value. In the measuring machine, a vibrating mechanism for applying mechanical vibration to the probe shaft is provided, and the probe shaft and the measured object are read after reading the displacement amount in the relative movement direction. Provided a means for the operating the vibration mechanism one or more times until the object is then contacted, characterized in that.

【0012】[0012]

【作用】測定に当たって、タッチ信号プローブと被測定
物とを相対移動させながらプローブ軸と被測定物とを接
触させると、両者の接触状態が検出手段によって電気的
に検出される。すると、その時点における相対移動方向
の変位量が読み取られる。このとき、プローブ軸は中立
位置に対して変位され、プローブの破損が防止される。
こののち、タッチ信号プローブと被測定物とを離れる方
向へ相対移動させると、プローブ軸は付勢部材の作用に
より中立位置に復帰される。このとき、摩擦力などによ
ってプローブ軸が中立位置に正確に復帰されなかったと
しても、プローブ軸と被測定物とが次に接触するまでの
間に加振機構が1回または2回以上作動され、その結
果、加振機構によって機械的振動がプローブ軸に加えら
れるから、その機械的振動によってプローブ軸を中立位
置に確実に復帰させることができる。
In the measurement, when the probe shaft and the object to be measured are brought into contact with each other while the touch signal probe and the object to be measured are relatively moved, the contact state of both is electrically detected by the detecting means. Then, the amount of displacement in the relative movement direction at that time is read. At this time, the probe shaft is displaced with respect to the neutral position, and damage to the probe is prevented.
After that, when the touch signal probe and the object to be measured are relatively moved in the direction of leaving, the probe shaft is returned to the neutral position by the action of the biasing member. At this time, even if the probe shaft is not accurately returned to the neutral position due to frictional force or the like, the vibration mechanism is operated once or twice or more before the probe shaft and the object to be measured come into contact with each other next time. As a result, since mechanical vibration is applied to the probe shaft by the vibration mechanism, the probe shaft can be reliably returned to the neutral position by the mechanical vibration.

【0013】[0013]

【実施例】以下、本発明の測定機について好適な実施例
を挙げ、添付図面を参照しながら詳細に説明する。な
お、以下の図の説明に当たって、前述した図8と同一な
構成要件については、同一符号を付し、その説明を省略
もしくは簡略化する。
The preferred embodiments of the measuring machine of the present invention will now be described in detail with reference to the accompanying drawings. In the following description of the drawings, the same components as those in FIG. 8 described above will be designated by the same reference numerals, and the description thereof will be omitted or simplified.

【0014】第1実施例 第1実施例を図1〜図4に示す。図1において、基台5
1の上には被測定物(図示省略)を載置するテーブル5
2が設けられている。テーブル52には、門形コラム5
3が前後方向(Y軸方向)へ、また、門形コラム53の
水平ビーム54に沿ってスライダ55が左右方向(X軸
方向)へ、更に、スライダ55にZ軸スピンドル56が
上下方向(Z軸方向)へ、それぞれ移動可能に設けられ
ている。Z軸スピンドル56の下端には、タッチ信号ブ
ローブ57が設けられている。つまり、タッチ信号プロ
ーブ57と被測定物とが、三次元方向へ相対移動可能に
構成されている。
First Embodiment A first embodiment is shown in FIGS. In FIG. 1, the base 5
A table 5 on which an object to be measured (not shown) is placed
Two are provided. Table 52 has a column 5
3 in the front-rear direction (Y-axis direction), the slider 55 in the left-right direction (X-axis direction) along the horizontal beam 54 of the gate-shaped column 53, and the Z-axis spindle 56 in the slider 55 in the vertical direction (Z-axis direction). Each of them is movable in the axial direction). A touch signal probe 57 is provided at the lower end of the Z-axis spindle 56. That is, the touch signal probe 57 and the object to be measured are configured to be relatively movable in the three-dimensional direction.

【0015】タッチ信号プローブ57には、図2に示す
如く、前記ケース本体1の底壁1A上において、支持盤
5の邪魔にならない位置に前記プローブ軸3に機械的振
動を加える加振機構11が設けられている。加振機構1
1は、図3に示す如く、前記ケース本体1の底壁1A上
に下端が固定された積層圧電素子12と、この積層圧電
素子12の上端面に設けられた重錘13とから構成され
ている。
As shown in FIG. 2, the touch signal probe 57 has a vibrating mechanism 11 for applying mechanical vibration to the probe shaft 3 on a bottom wall 1A of the case body 1 at a position where it does not interfere with the support board 5. Is provided. Excitation mechanism 1
As shown in FIG. 3, 1 is composed of a laminated piezoelectric element 12 whose lower end is fixed on the bottom wall 1A of the case body 1, and a weight 13 provided on the upper end surface of the laminated piezoelectric element 12. There is.

【0016】図4は制御回路を示している。同図におい
て、制御装置61には、前記タッチ信号プローブ57の
ほかに、前記スライダ55、門形コラム53およびZ軸
スピンドル56をそれぞれ各軸方向へ移動させるX軸駆
動系62X、Y軸駆動系62YおよびZ軸駆動系62Z
がそれぞれ接続されているとともに、前記スライダ5
5、門形コラム53およびZ軸スピンドル56のそれぞ
れ各軸方向への移動変位量を検出するX軸変位計63
X、Y軸変位計63YおよびZ軸変位計63Zがそれぞ
れ接続されている。
FIG. 4 shows a control circuit. In the figure, the control device 61 includes, in addition to the touch signal probe 57, an X-axis drive system 62X and a Y-axis drive system that move the slider 55, the gate column 53, and the Z-axis spindle 56 in respective axial directions. 62Y and Z-axis drive system 62Z
Are connected to each other, and the slider 5
5, X-axis displacement meter 63 for detecting the displacement of each of the columnar column 53 and the Z-axis spindle 56 in the respective axial directions.
An X, Y-axis displacement meter 63Y and a Z-axis displacement meter 63Z are connected to each other.

【0017】制御装置61は、予め設定されたプログラ
ムに従って、X軸駆動系62X、Y軸駆動系62Yおよ
びZ軸駆動系62Zを駆動させながらタッチ信号プロー
ブ57のプローブ軸3と被測定物とを接触させる。この
とき、タッチ信号プローブ57のプローブ軸3と被測定
物とが接触する直前に作動信号をタッチ信号プローブ5
7の加振機構11に与えてそれを1回または数回作動さ
せる。その後、タッチ信号プローブ57からタッチ信号
が出力された時点において、各変位計63X,63Y,
63Yの値を読み取り、これらの値から被測定物の寸法
や形状を求める。ここに、制御装置61は、変位量を読
み取った後前記プローブ軸3と被測定物とが次に接触す
るまでの間に前記加振機構11を1回または2回以上作
動させる手段を構成している。
The control device 61 drives the X-axis drive system 62X, the Y-axis drive system 62Y, and the Z-axis drive system 62Z according to a preset program to drive the probe shaft 3 of the touch signal probe 57 and the object to be measured. Contact. At this time, the operation signal is sent to the touch signal probe 5 immediately before the probe shaft 3 of the touch signal probe 57 comes into contact with the object to be measured.
7 is applied to the vibrating mechanism 11 to operate it once or several times. After that, at the time when the touch signal is output from the touch signal probe 57, the displacement meters 63X, 63Y,
The value of 63Y is read, and the size and shape of the object to be measured are obtained from these values. Here, the control device 61 constitutes means for operating the vibrating mechanism 11 once or twice or more until the probe shaft 3 and the object to be measured next contact after reading the displacement amount. ing.

【0018】そこで、上記三次元測定機による測定方法
について説明する。まず、三次元測定機のZ軸スピンド
ル56の下端にケース本体1のシャンク1Bを取り付け
た状態において、予め設定されたプログラムに従って、
各駆動系62X,62Y,62Zが駆動され、タッチ信
号プローブ57が三次元方向へ移動される。プローブ軸
3の接触球2が被測定物と接触すると、プローブ軸3
は、被測定物との接触方向によって中立軸線Lに対して
傾斜または中立軸線L方向へ変位される結果、いずれか
の接触子軸4A,4B,4Cが対応する電気接点機構6
A,6B,6Cから離れる。すると、いずれかの電気接
点機構6A,6B,6Cが開かれタッチ信号が出力され
るから、そのタッチ信号が出力された時点における各変
位計63X,63Y,63Zの値が読み取られる。
Therefore, a measuring method by the above-described coordinate measuring machine will be described. First, with the shank 1B of the case body 1 attached to the lower end of the Z-axis spindle 56 of the coordinate measuring machine, according to a preset program,
The drive systems 62X, 62Y, 62Z are driven, and the touch signal probe 57 is moved in the three-dimensional direction. When the contact ball 2 of the probe shaft 3 comes into contact with the object to be measured, the probe shaft 3
Is inclined with respect to the neutral axis L or displaced in the direction of the neutral axis L depending on the contact direction with the object to be measured, and as a result, any one of the contactor shafts 4A, 4B, 4C corresponds to the electrical contact mechanism 6
Move away from A, 6B and 6C. Then, any one of the electrical contact mechanisms 6A, 6B, 6C is opened and the touch signal is output, so that the values of the displacement meters 63X, 63Y, 63Z at the time when the touch signal is output are read.

【0019】その後、タッチ信号プローブ57が被測定
物に対して離れ、次に接触する直前に加振機構11が1
回または数回作動される。つまり、積層圧電素子12に
インパルス信号が1回または数回印加される。すると、
積層圧電素子12が軸方向へ変位するので、それによる
重錘13の振動がケース本体1の底壁1Aを介して電気
接点機構6A,6B,6Cおよびプローブ軸3に伝達さ
れる。
After that, the touch signal probe 57 is separated from the object to be measured, and immediately before the touch signal probe 57 comes into contact with the object to be measured, the vibrating mechanism 11 moves to
Operated once or several times. That is, the impulse signal is applied to the laminated piezoelectric element 12 once or several times. Then,
Since the laminated piezoelectric element 12 is displaced in the axial direction, the vibration of the weight 13 caused thereby is transmitted to the electrical contact mechanisms 6A, 6B, 6C and the probe shaft 3 via the bottom wall 1A of the case body 1.

【0020】そのため、タッチ信号プローブ57が被測
定物と接触した状態から次の測定に際して離れる方向へ
相対移動したとき、コイルばね7の作用だけでは、プロ
ーブ軸3の接触子軸4A,4B,4Cが電気接点機構6
A,6B,6Cの安定位置に復帰できない状態にあって
も、タッチ信号プローブ57と被測定物とが次に接触す
る時点では、加振機構11による機械的振動によって、
プローブ軸3の接触子軸4A,4B,4Cを電気接点機
構6A,6B,6Cの安定位置に確実に復帰させること
ができる。
Therefore, when the touch signal probe 57 relatively moves from the state of being in contact with the object to be measured to the direction of leaving for the next measurement, only the action of the coil spring 7 causes the contactor shafts 4A, 4B, 4C of the probe shaft 3 to move. Is an electrical contact mechanism 6
Even when the stable position of A, 6B, and 6C cannot be restored, at the time when the touch signal probe 57 and the object to be measured next come into contact with each other, mechanical vibration by the vibrating mechanism 11 causes
The contactor shafts 4A, 4B, 4C of the probe shaft 3 can be reliably returned to the stable positions of the electric contact mechanisms 6A, 6B, 6C.

【0021】従って、このような実施例によれば、プロ
ーブ軸3に機械的振動を加える加振機構11を設けたの
で、タッチ信号プローブ57が被測定物と接触した状態
から次の測定に際して離れる方向へ相対移動したとき、
コイルばね7の作用だけでは、プローブ軸3の接触子軸
4A,4B,4Cが電気接点機構6A,6B,6Cの安
定位置に復帰できない状態にあっても、加振機構11に
よる機械的振動によって、プローブ軸3の接触子軸4
A,4B,4Cを電気接点機構6A,6B,6Cの安定
位置に確実に復帰させることができるから、プローブ軸
3の中立位置への復帰再現性を高めることができる。
Therefore, according to such an embodiment, since the vibrating mechanism 11 for applying mechanical vibration is provided on the probe shaft 3, the touch signal probe 57 is separated from the state in which the touch signal probe 57 is in contact with the object to be measured in the next measurement. When moving relative to the direction,
Even if the contactor shafts 4A, 4B, 4C of the probe shaft 3 cannot be returned to the stable positions of the electric contact mechanisms 6A, 6B, 6C only by the action of the coil spring 7, the mechanical vibration by the vibrating mechanism 11 causes , Contactor shaft 4 of probe shaft 3
Since the A, 4B and 4C can be reliably returned to the stable positions of the electric contact mechanisms 6A, 6B and 6C, the reproducibility of returning the probe shaft 3 to the neutral position can be improved.

【0022】また、加振機構11を積層圧電素子12と
重錘13とから構成したので、積層圧電素子12に電圧
を印加すれば機械的変位が生じ、それによって重錘13
が振動するので、プローブ軸3に加える機械的振動を瞬
時に発生させることができる。しかも、全体としても小
型、簡易に構成することができるから、ケース本体1を
従来より大きくしなくてもそのケース本体1内に収納す
ることができ、更に、既存のタッチ信号プローブを変更
することなく、そのケース本体1内に加振機構11を収
納して本実施例のタッチ信号プローブ57を構成するこ
ともできる。
Further, since the vibrating mechanism 11 is composed of the laminated piezoelectric element 12 and the weight 13, mechanical displacement occurs when a voltage is applied to the laminated piezoelectric element 12, whereby the weight 13 is caused.
Vibrates, it is possible to instantly generate mechanical vibration applied to the probe shaft 3. Moreover, since the overall size and size can be reduced, the case body 1 can be housed in the case body 1 without making the case body 1 larger than before, and the existing touch signal probe can be changed. Alternatively, the vibration mechanism 11 may be housed in the case body 1 to configure the touch signal probe 57 of this embodiment.

【0023】また、測定に際して、タッチ信号プローブ
57と被測定物とが離れた後、次に接触する直前に加振
機構11を1回または数回作動させるようにしたので、
仮に、タッチ信号プローブ57と被測定物とが離れて次
に接触するまでの相対移動中に接触子軸4A,4B,4
Cが電気接点機構6A,6B,6Cの安定位置からずれ
てしまった場合でも、タッチ信号プローブ57と被測定
物とが次に接触する時点では、加振機構11による機械
的振動によって、プローブ軸3の接触子軸4A,4B,
4Cを電気接点機構6A,6B,6Cの安定位置に復帰
させることができる。
Further, in the measurement, the vibrating mechanism 11 is operated once or several times immediately after the touch signal probe 57 and the object to be measured are separated from each other, and immediately before the next contact.
If the touch signal probe 57 and the object to be measured are moved relative to each other until they come into contact with each other next, the contactor shafts 4A, 4B, 4
Even when C is displaced from the stable position of the electrical contact mechanisms 6A, 6B, 6C, when the touch signal probe 57 and the object to be measured next come into contact with each other, the mechanical vibration of the vibrating mechanism 11 causes the probe axis. 3 contactor shafts 4A, 4B,
4C can be returned to the stable position of the electrical contact mechanisms 6A, 6B, 6C.

【0024】第2実施例 第2実施例を図5に示す。本実施例で用いるタッチ信号
プローブ57は、第1実施例と比べ、前記加振機構11
がプローブ軸3の支持盤5上に取り付けられている点が
異なるが、作用的には同じである。ただ、プローブ軸3
の負荷を増やさない点では第1実施例の方が好ましい。
なお、三次元測定機の機械的構成および制御回路につい
ては、第1実施例と同じである。
Second Embodiment A second embodiment is shown in FIG. The touch signal probe 57 used in this embodiment is different from that of the first embodiment in that the vibrating mechanism 11 is used.
Are mounted on the support board 5 of the probe shaft 3, but are functionally the same. However, the probe axis 3
The first embodiment is preferable in terms of not increasing the load.
The mechanical structure and control circuit of the coordinate measuring machine are the same as in the first embodiment.

【0025】第3実施例 第3実施例を図6および図7に示す。本実施例で用いる
タッチ信号プローブ57では、プローブ軸3の途中にそ
れと同軸上に積層圧電素子12が設けられている。ここ
で、積層圧電素子12は、加振機構11を構成するが、
このほか、プローブ軸3と被測定物との接触状態の検出
手段9も構成している。この場合、図7に示すように、
積層圧電素子12にリレー21の一方のリレー接点21
Aを介して積層圧電素子12にインパルス信号または正
弦波信号を印加する駆動回路22を接続するとともに、
前記リレー21の他方のリレー接点21Bに増幅回路2
3を介して接触信号検出回路24を接続する。なお、こ
こでは、前記接触子軸4A,4B,4Cおよびこれと接
する電気接点機構6A,6B,6Cは、単に、逃げ機構
を有する支持機構8を構成するのみである。
Third Embodiment A third embodiment is shown in FIGS. 6 and 7. In the touch signal probe 57 used in the present embodiment, the laminated piezoelectric element 12 is provided midway along the probe shaft 3 coaxially therewith. Here, the laminated piezoelectric element 12 constitutes the vibration mechanism 11,
In addition, it also constitutes detection means 9 for detecting the contact state between the probe shaft 3 and the object to be measured. In this case, as shown in FIG.
One of the relay contacts 21 of the relay 21 is attached to the laminated piezoelectric element 12.
A drive circuit 22 for applying an impulse signal or a sine wave signal to the laminated piezoelectric element 12 is connected via A, and
The amplifier circuit 2 is connected to the other relay contact 21B of the relay 21.
The contact signal detection circuit 24 is connected via 3. In this case, the contactor shafts 4A, 4B, 4C and the electric contact mechanisms 6A, 6B, 6C in contact with the contactor shafts 4A, 4B, 4C merely constitute a support mechanism 8 having an escape mechanism.

【0026】このようにすれば、リレー21の切り換え
によって、積層圧電素子12にインパルス信号または正
弦波信号を印加して機械的振動を発生させることができ
るとともに、プローブ軸3と被測定物との接触によって
積層圧電素子12に発生した電圧を増幅回路23を介し
て接触信号検出回路24で検出することができる。従っ
て、第1実施例で述べた効果に加え、圧電変換素子12
のみによって、機械的振動をプローブ軸3に加えること
ができるとともに、プローブ軸3と被測定物との接触状
態を電気的に検出することができるという効果がある。
In this way, by switching the relay 21, it is possible to apply an impulse signal or a sine wave signal to the laminated piezoelectric element 12 to generate mechanical vibrations, and at the same time, the probe shaft 3 and the object to be measured are separated. The voltage generated in the laminated piezoelectric element 12 by the contact can be detected by the contact signal detection circuit 24 via the amplifier circuit 23. Therefore, in addition to the effect described in the first embodiment, the piezoelectric conversion element 12
Only by this, mechanical vibration can be applied to the probe shaft 3 and the contact state between the probe shaft 3 and the object to be measured can be electrically detected.

【0027】以上、本発明について好適な実施例を挙げ
て説明したが、本発明は、これらの実施例に限られもの
でなく、本発明の要旨を逸脱しない範囲において種々の
改良並びに設計の変更が可能である。例えば、加振機構
11としては、上記実施例で述べた積層圧電素子12の
みからなる構成、あるいは、積層圧電素子12と重錘1
3とからなる構成に限らず、モータ、ソレノイドコイル
などの電磁アクチュエータ、空気を利用したアクチュエ
ータなど振動を発生できるものであればいずれでもよ
い。
Although the present invention has been described with reference to the preferred embodiments, the present invention is not limited to these embodiments, and various improvements and design changes can be made without departing from the gist of the present invention. Is possible. For example, as the vibrating mechanism 11, the structure including only the laminated piezoelectric element 12 described in the above embodiment, or the laminated piezoelectric element 12 and the weight 1 is used.
The configuration is not limited to 3, and any motor such as a motor, an electromagnetic actuator such as a solenoid coil, or an actuator using air may be used as long as it can generate vibration.

【0028】また、加振機構11を作動させるタイミン
グは、次の測定に際してプローブ軸3と被測定物とが接
触する直前に限らず、測定後から次の測定に際してプロ
ーブ軸3と被測定物とが接触するまでの間であればいつ
でもよい。更に、作動回数についても、任意でよい。
The timing of activating the vibrating mechanism 11 is not limited to just before the probe shaft 3 and the object to be measured come into contact with each other during the next measurement. It can be any time until the contact. Furthermore, the number of operations may be arbitrary.

【0029】また、支持機構8については、上記実施例
で述べた三点支持機構8の構造に限らず、タッチ信号プ
ローブを用いる測定機の形式に応じて適宜選択すればよ
い。例えば、ハイトゲージなどの測定機に用いるタッチ
信号プローブの場合では、ケース本体に対してプローブ
軸を回動自在に支持し、そのブローブ軸を中立位置に保
持するとともに、プローブ軸を回動支点を中心として回
動変位可能かつ中立位置に復帰可能に支持する支持構造
でもよい。つまり、2方向タッチ信号プローブの構造で
もよい。
Further, the support mechanism 8 is not limited to the structure of the three-point support mechanism 8 described in the above embodiment, but may be appropriately selected according to the type of the measuring machine using the touch signal probe. For example, in the case of a touch signal probe used in a measuring instrument such as a height gauge, the probe shaft is rotatably supported with respect to the main body of the case, the probe shaft is held in a neutral position, and the probe shaft is centered around a rotation fulcrum. Alternatively, a supporting structure that is supported so as to be pivotally displaceable and capable of returning to the neutral position may be used. That is, the structure of a two-way touch signal probe may be used.

【0030】また、検出手段9についても、上記実施例
で述べた接触子軸4A,4B,4Cおよびこれと接する
電気接点機構6A,6B,6Cからなる構成、あるい
は、積層圧電素子12の構成に限らず、プローブ軸と被
測定物とが接触したときにのみ閉じる閉ループ回路を構
成し、この回路が閉じたときにタッチ信号を発するよう
にしてもよい。
Further, the detecting means 9 is also composed of the contactor shafts 4A, 4B, 4C and the electric contact mechanisms 6A, 6B, 6C in contact with the contactor shafts 4A, 4B, 4C described in the above embodiment, or the laminated piezoelectric element 12. Alternatively, a closed loop circuit may be configured to be closed only when the probe shaft and the object to be measured contact each other, and the touch signal may be issued when the circuit is closed.

【0031】また、上記実施例では、予め設定されたプ
ログラムに従ってタッチ信号プローブ57が三次元方向
へ自動的に移動する構造の三次元測定機を対象とした
が、本発明の測定機は、これに限定されるものではな
い。タッチ信号プローブと被測定物とを、手動で、一軸
方向、あるいは、二軸方向へ相対移動可能に構成した測
定機などにも適用できる。例えば、ハイトゲージなどに
も適用できる。この場合、測定値の読み取り後プローブ
軸3と被測定物とが次に接触するまでの間に前記加振機
構11を1回または2回以上作動させる手段としては、
手動式スイッチで構成すればよい。
In the above embodiment, the coordinate measuring machine having the structure in which the touch signal probe 57 automatically moves in the three-dimensional direction according to the preset program is targeted. It is not limited to. The touch signal probe and the object to be measured can be manually applied to a measuring machine configured to be relatively movable in one axis direction or two axis directions. For example, it can be applied to a height gauge or the like. In this case, as means for operating the vibrating mechanism 11 once or twice or more until the probe shaft 3 and the object to be measured next contact after reading the measured value,
It may be configured with a manual switch.

【0032】[0032]

【発明の効果】以上の通り、本発明の測定機によれば、
プローブ軸を中立位置に確実に復帰させることができ、
プローブ軸の中立位置への復帰再現性を高めて高精度測
定を保障できるという効果が期待できる。
As described above, according to the measuring machine of the present invention,
You can surely return the probe shaft to the neutral position,
It is expected that the reproducibility of returning the probe shaft to the neutral position can be improved and high-precision measurement can be guaranteed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例を示す斜視図である。FIG. 1 is a perspective view showing a first embodiment of the present invention.

【図2】図1に示すタッチ信号プローブの一部を切り欠
いた斜視図である。
FIG. 2 is a perspective view in which a part of the touch signal probe shown in FIG. 1 is cut away.

【図3】図2の加振機構を示す正面図である。FIG. 3 is a front view showing the vibration mechanism of FIG.

【図4】図1の測定機の制御回路を示すブロック図であ
る。
4 is a block diagram showing a control circuit of the measuring machine of FIG. 1. FIG.

【図5】本発明の第2実施例で用いるタッチ信号プロー
ブを示す一部を切り欠いた斜視図である。
FIG. 5 is a partially cutaway perspective view showing a touch signal probe used in a second embodiment of the present invention.

【図6】本発明の第3実施例で用いるタッチ信号プロー
ブの要部を示す正面図である。
FIG. 6 is a front view showing a main part of a touch signal probe used in a third embodiment of the present invention.

【図7】図6の実施例における積層圧電素子の駆動回路
を示す図である。
FIG. 7 is a diagram showing a drive circuit for a laminated piezoelectric element in the embodiment of FIG.

【図8】従来のタッチ信号プローブを示す一部を切り欠
いた斜視図である。
FIG. 8 is a partially cutaway perspective view showing a conventional touch signal probe.

【図9】図8の電気接点機構付近における摩擦力をばね
モデルで近似させた図である。
9 is a diagram in which a frictional force in the vicinity of the electric contact mechanism of FIG. 8 is approximated by a spring model.

【図10】図9のばねモデルによって摩擦力が作用する
仕方を例示した図である。
10 is a view exemplifying how a frictional force acts by the spring model of FIG.

【符号の説明】[Explanation of symbols]

1 ケース本体 3 プローブ軸 4A,4B,4C 接触子軸 6A,6B,6C 電気接点機構 7 コイルばね(付勢部材) 8 支持機構 9 検出手段 11 加振機構 12 圧電変換素子 13 重錘 57 タッチ信号プローブ 61 制御装置 1 case body 3 probe shaft 4A, 4B, 4C contactor shaft 6A, 6B, 6C electrical contact mechanism 7 coil spring (biasing member) 8 support mechanism 9 detection means 11 vibration mechanism 12 piezoelectric transducer element 13 weight 57 touch signal Probe 61 controller

───────────────────────────────────────────────────── フロントページの続き (72)発明者 市場 安博 神奈川県川崎市高津区坂戸165番地 株式 会社ミツトヨ開発研究所内 (72)発明者 岡田 和義 神奈川県川崎市高津区坂戸165番地 株式 会社ミツトヨ開発研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Market Aki 165 Sakado, Takatsu-ku, Kawasaki City, Kanagawa Prefecture Mitutoyo R & D Co., Ltd. In-house

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】ケース本体、プローブ軸、このプローブ軸
を前記ケース本体の中立位置に保持するとともにそのプ
ローブ軸を中立位置に対して変位可能かつ復帰可能に支
持する付勢部材を含む支持機構および前記プローブ軸と
被測定物との接触状態を電気的に検出する検出手段を含
むタッチ信号プローブを有し、このタッチ信号プローブ
と被測定物とを相対移動させながら前記プローブ軸と被
測定物とを接触させ、前記検出手段からのタッチ信号に
基づいて前記相対移動方向の変位量を読み取り、この値
から被測定物の寸法や形状などを測定する測定機におい
て、前記プローブ軸に機械的振動を加える加振機構を設
けるとともに、前記相対移動方向の変位量を読み取った
後前記プローブ軸と被測定物とが次に接触するまでの間
に前記加振機構を1回または2回以上作動させる手段を
設けた、ことを特徴とする測定機。
1. A support mechanism including a case body, a probe shaft, and a biasing member for holding the probe shaft in a neutral position of the case body and supporting the probe shaft so as to be displaceable and returnable to the neutral position. There is a touch signal probe including a detection unit that electrically detects a contact state between the probe shaft and the object to be measured, and the probe shaft and the object to be measured while relatively moving the touch signal probe and the object to be measured. To read the amount of displacement in the relative movement direction based on the touch signal from the detection means, in the measuring machine for measuring the size and shape of the object to be measured from this value, mechanical vibration to the probe shaft A vibrating mechanism for adding is provided, and the vibrating mechanism is activated until the probe shaft and the object to be measured next contact after reading the displacement amount in the relative movement direction. It provided with means for actuating times or more than once, measuring, characterized in that.
JP5074892A 1992-03-09 1992-03-09 Measuring machine Pending JPH05248847A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5074892A JPH05248847A (en) 1992-03-09 1992-03-09 Measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5074892A JPH05248847A (en) 1992-03-09 1992-03-09 Measuring machine

Publications (1)

Publication Number Publication Date
JPH05248847A true JPH05248847A (en) 1993-09-28

Family

ID=12867460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5074892A Pending JPH05248847A (en) 1992-03-09 1992-03-09 Measuring machine

Country Status (1)

Country Link
JP (1) JPH05248847A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6675637B2 (en) 2001-10-10 2004-01-13 Mitutoyo Corporation Touch sensor
JP2006112861A (en) * 2004-10-13 2006-04-27 Mitsutoyo Corp Three-dimensions coordinate measuring system and part program used for same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0158109B2 (en) * 1986-05-07 1989-12-08 Shinano Riken Kk

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0158109B2 (en) * 1986-05-07 1989-12-08 Shinano Riken Kk

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6675637B2 (en) 2001-10-10 2004-01-13 Mitutoyo Corporation Touch sensor
JP2006112861A (en) * 2004-10-13 2006-04-27 Mitsutoyo Corp Three-dimensions coordinate measuring system and part program used for same

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