JPH09138191A - Method and apparatus for determining reference position in micro indentation hardness tester - Google Patents

Method and apparatus for determining reference position in micro indentation hardness tester

Info

Publication number
JPH09138191A
JPH09138191A JP31954495A JP31954495A JPH09138191A JP H09138191 A JPH09138191 A JP H09138191A JP 31954495 A JP31954495 A JP 31954495A JP 31954495 A JP31954495 A JP 31954495A JP H09138191 A JPH09138191 A JP H09138191A
Authority
JP
Japan
Prior art keywords
indenter
lever
contactor
tip
electric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31954495A
Other languages
Japanese (ja)
Other versions
JP3631310B2 (en
Inventor
Hirotaka Hayashi
浩孝 林
Masaharu Tsujii
正治 辻井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akashi Corp
Original Assignee
Akashi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akashi Corp filed Critical Akashi Corp
Priority to JP31954495A priority Critical patent/JP3631310B2/en
Publication of JPH09138191A publication Critical patent/JPH09138191A/en
Application granted granted Critical
Publication of JP3631310B2 publication Critical patent/JP3631310B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0286Miniature specimen; Testing on microregions of a specimen

Abstract

PROBLEM TO BE SOLVED: To obtain a micro indentation hardness tester in which the reference position is set automatically for a presser and a contactor. SOLUTION: Electrode plates are applied to the opposing faces of a contact lever 4 and a presser lever 2 to form first and second capacitors. A CPU 31 receives the capacitance from each capacitor and produces a control current for elongating/contracting a PZT (laminated piezoelectric actuator) 30. Consequently, the contact lever 4 is turned about a shaft 5 such that the capacitance is equalized for both capacitors thus realizing automatic setting of reference position for the presser and a contactor.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、微小押し込み式硬
さ試験機に関し、特にその基準位置の確定方法および確
定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a micro indentation hardness tester, and more particularly to a method and device for determining a reference position of the hardness tester.

【0002】[0002]

【従来の技術】従来、押し込み荷重が1gf以下の微小荷
重による硬さ試験機が、例えば半導体関係で成膜製品の
表面層の材料試験に用いられている。そして、このよう
な試験機として、特開昭63−223539号公報に記
載されているようなものが知られており、これを図3〜
10により説明すると、符号1は圧子を示しており、この
圧子1は圧子レバー2の先端に固着して保持されてい
る。
2. Description of the Related Art Conventionally, a hardness tester with a minute load with an indentation load of 1 gf or less has been used for a material test of a surface layer of a film-formed product in relation to semiconductors. As such a testing machine, one described in JP-A-63-223539 is known, which is shown in FIG.
Describing with reference numeral 10, reference numeral 1 indicates an indenter, and the indenter 1 is fixedly held to the tip of the indenter lever 2.

【0003】符号3は接触子を示していて、この接触子
3は接触子レバー4の先端に固着して保持され、圧子レ
バー2と接触子レバー4とは、同一の軸5の軸線上にあ
る圧子レバー十字ばね6および接触子レバーばね7によ
って軸支されている。圧子1と接触子3とは、圧子レバ
ー2と接触子レバー4の先端部で圧子レバー2,接触子
レバー4の十字ばね6,7を中心とする円弧上を、試料
40の表面に垂直な軸線Bに沿って往復動するようになっ
ており、圧子1の周辺部で接触子3が往復動する。
Reference numeral 3 denotes a contactor, which is fixedly held at the tip of a contactor lever 4, and the indenter lever 2 and the contactor lever 4 are on the same axis of the shaft 5. It is pivotally supported by an indenter lever cross spring 6 and a contactor lever spring 7. The indenter 1 and the contactor 3 are the tip of the indenter lever 2 and the contactor lever 4 on the circular arc centered on the cross springs 6 and 7 of the indenter lever 2 and the contactor lever 4, respectively.
It is adapted to reciprocate along an axis B perpendicular to the surface of 40, and the contactor 3 reciprocates around the indenter 1.

【0004】十字ばね6,7は図4,5に詳細を示すよ
うに、円弧状の固定部8は基台10に固定されており、そ
れに対向して円弧状の揺動部9が設けられる。固定部8
と揺動部9とは、ばね体11によって結ばれており、ばね
体11は2個のばね体が図4の側面図において十字形を形
成するよう取付けられている。またばね体11は図5に示
すように、2つのばねによって構成されて固定部8と揺
動部9とを結んでいるが、2つのばねは互いに接触せず
独立に作動する。揺動部9は圧子レバー2,接触子レバ
ー4に固着し、ばね体11の側面図における交点は、十字
ばね6,7の軸5の上にあり、かつ十字ばね6,7の軸
は圧子レバー2,接触子レバー4の中心軸線C上にある
ように構成される。
As shown in detail in FIGS. 4 and 5, the cross springs 6 and 7 have an arcuate fixing portion 8 fixed to a base 10, and an arcuate swinging portion 9 is provided opposite to the fixing portion 8. . Fixed part 8
The rocking portion 9 and the swinging portion 9 are connected by a spring body 11, and the two spring bodies 11 are attached so as to form a cross shape in the side view of FIG. Further, as shown in FIG. 5, the spring body 11 is composed of two springs and connects the fixed portion 8 and the swinging portion 9, but the two springs do not contact each other and operate independently. The swinging portion 9 is fixed to the indenter lever 2 and the contactor lever 4, the intersection of the spring body 11 in the side view is on the axis 5 of the cross springs 6 and 7, and the axes of the cross springs 6 and 7 are the indenters. It is configured to be on the central axis C of the lever 2 and the contactor lever 4.

【0005】そして圧子レバー2と接触子レバー4と
は、十字ばね6,7を交点として静的に釣合いを取るよ
うになっている。圧子レバー2および接触子レバー4は
後述のように圧子および接触子を試料に押圧するもので
あるから、剛性が高い方が望ましいが、揺動の影響を少
なくし、圧子1の移動速度を変化させる必要があるた
め、軽量で、十字ばね6,7を中心とする慣性モーメン
トが小さいことが必要であり、軽量,高剛性の構造とす
る。
The indenter lever 2 and the contact lever 4 are statically balanced with the cross springs 6 and 7 as intersections. Since the indenter lever 2 and the contactor lever 4 press the indenter and the contactor against the sample as described later, it is preferable that the rigidity is high, but the influence of the swing is reduced and the moving speed of the indenter 1 is changed. Therefore, it is necessary to be lightweight and to have a small moment of inertia about the cross springs 6 and 7, which results in a lightweight and highly rigid structure.

【0006】そして圧子レバー2,接触子レバー4の十
字ばね6,7は図6に示すように、圧子レバー2の十字
ばね6は1個取付けられ、接触子レバー4の十字ばね7
は、圧子レバー2の十字ばね6を中心としてその両側に
取付けられる。このようにして圧子レバー2は、両端で
接合して一体となった2本の接触子レバー4の間に挟ま
れ、しかも圧子レバー2と接触子レバー4とは接触せ
ず、独立に移動するようになっている。そして接触子レ
バー4の先端部では圧子レバー2を取囲むようにして接
触子3を保持し、圧子1は接触子3にあけられた孔を貫
通して上下するようになっている。また圧子レバー2と
接触子レバー4の他端部には、圧子レバー2,接触子レ
バー4を駆動するための負荷装置21,24が取付けられて
いる。
As shown in FIG. 6, one cross spring 6 of the indenter lever 2 is attached to the cross springs 6 and 7 of the indenter lever 2 and the contact lever 4, and the cross spring 7 of the contact lever 4 is attached.
Are attached to both sides of the cross spring 6 of the indenter lever 2 as a center. In this way, the indenter lever 2 is sandwiched between the two contactor levers 4 which are joined and integrated at both ends, and the indenter lever 2 and the contactor lever 4 do not contact but move independently. It is like this. The tip of the contactor lever 4 holds the contactor 3 so as to surround the indenter lever 2, and the indenter 1 passes through a hole formed in the contactor 3 and moves up and down. Further, load devices 21 and 24 for driving the indenter lever 2 and the contactor lever 4 are attached to the other ends of the indenter lever 2 and the contactor lever 4.

【0007】圧子レバー2と接触子レバー4の先端部の
詳細は図7に示すように、圧子1は圧子レバー2の先端
部の下面に固着され、圧子レバー2の先端部の上面には
コ字状の電気絶縁体12が固着されている。接触子レバー
4の先端部は図8に示すように、接触子レバー4の先端
部下面に、圧子1の周辺を同心円状に取囲むようにして
接触子3が固着しており、圧子1は接触子3を貫通して
往復動する。接触子レバー4の先端部上面には電気絶縁
板13が固着され、電気絶縁板13は圧子レバー2の電気絶
縁体12のコ字状の中に嵌入するようになっている。電気
絶縁体12のコ字状内面と、電気絶縁板13の外面との互い
に相対する水平面の面上とには、1平方センチメートル
あるいはそれ以上の電極板が貼着されている。圧子レバ
ー2に固着した電気絶縁体12には電極板14,16が、接触
子レバー4に固着した電気絶縁板13には電極板16,17が
固着され、電極板14,15および15,17は、圧子1と接触
子3との基準位置では、両者共約50μmの微小間隔で相
対する。
As shown in FIG. 7 for details of the tips of the indenter lever 2 and the contact lever 4, the indenter 1 is fixed to the lower surface of the tip of the indenter lever 2, and the upper surface of the tip of the indenter lever 2 is A letter-shaped electric insulator 12 is fixed. As shown in FIG. 8, the tip of the contact lever 4 has a contact 3 fixed to the lower surface of the tip of the contact lever 4 so as to concentrically surround the indenter 1. Reciprocate through 3. An electric insulating plate 13 is fixed to the upper surface of the tip of the contact lever 4, and the electric insulating plate 13 is fitted into the U-shape of the electric insulator 12 of the indenter lever 2. An electrode plate of 1 cm 2 or more is attached to the U-shaped inner surface of the electric insulator 12 and the outer surfaces of the electric insulating plate 13 on the surfaces of the horizontal surfaces facing each other. Electrode plates 14 and 16 are fixed to the electric insulator 12 fixed to the indenter lever 2, and electrode plates 16 and 17 are fixed to the electric insulating plate 13 fixed to the contact lever 4, and electrode plates 14, 15 and 15, 17 are fixed. At the reference position of the indenter 1 and the contactor 3, both face each other with a minute interval of about 50 μm.

【0008】電極板14,16および15,17は電気的コンデ
ンサを形成し、圧子1と接触子3との相対変位が、電極
板14,16によって形成される第1コンデンサ18と、電極
板15,17によって形成される第2コンデンサ19との電気
容量の差に比例する。よって公知の電気容量変化検出用
発振器および増幅器を用いて、圧子1と接触子3との相
対変化を取出すことができ、これによって圧子変位計20
が構成される。
The electrode plates 14, 16 and 15, 17 form an electric capacitor, and the relative displacement between the indenter 1 and the contactor 3 is the first capacitor 18 formed by the electrode plates 14, 16 and the electrode plate 15. , 17 in proportion to the difference in electric capacity between the second capacitor 19 and the second capacitor 19. Therefore, the relative change between the indenter 1 and the contactor 3 can be obtained by using the known oscillator and amplifier for detecting the capacitance change.
Is configured.

【0009】圧子レバー2の十字ばね6を中心として圧
子1の反対側には、負荷装置21が取付けられ、負荷装置
21は駆動コイル22と永久磁石23とからなり、駆動コイル
22に電流を流すことにより圧子レバー2は十字ばね6を
支点として圧子1を駆動し、駆動コイル22の電流に比例
した所定の荷重を圧子1に与える。接触子レバー4の十
字ばね7の反対側にも負荷装置24が取付けられ、負荷装
置24は駆動コイル25と永久磁石26とからなり、駆動コイ
ル25に電流を流すことにより接触子レバー4は十字ばね
7を支点として接触子3を駆動し、駆動コイル25の電流
に比例した所定の荷重を接触子3に与える。
A load device 21 is mounted on the opposite side of the indenter 1 with the cross spring 6 of the indenter lever 2 as the center.
Reference numeral 21 is a drive coil 22 and a permanent magnet 23.
When the current is applied to the indenter 22, the indenter lever 2 drives the indenter 1 with the cross spring 6 as a fulcrum, and applies a predetermined load proportional to the current of the drive coil 22 to the indenter 1. A load device 24 is also mounted on the opposite side of the contact lever 4 from the cross spring 7, and the load device 24 is composed of a drive coil 25 and a permanent magnet 26. By passing an electric current through the drive coil 25, the contact lever 4 crosses. The contactor 3 is driven using the spring 7 as a fulcrum, and a predetermined load proportional to the current of the drive coil 25 is applied to the contactor 3.

【0010】しかしながら駆動コイル22によって与えら
れる駆動力は、圧子レバー2が傾斜するとき、十字ばね
6のばねが撓むばね力として一部が消費され、圧子1を
駆動する駆動力は、駆動コイルの電流によって与えられ
る力から十字ばね6のばね力を差引いたものとなるの
で、十字ばねのばね力を算定し、駆動力からこのばね力
を差引き、圧子1が試料40を押圧する力を求める必要が
ある。これは変位計20の出力を利用し次のようにする。
すなわち接触子3を試料40に押圧した後、変位計20が零
になるまで圧子1の駆動力を増加し、その点の駆動力を
基準点として予め検定した十字ばね6のばね定数と変位
計20の出力とを掛算し、前記駆動力から差引けば、圧子
1と試料間に生じる真の押圧力を求めることができる。
However, the driving force provided by the drive coil 22 is partially consumed as a spring force for bending the spring of the cross spring 6 when the indenter lever 2 tilts, and the driving force for driving the indenter 1 is Since the spring force of the cross spring 6 is subtracted from the force given by the current of, the spring force of the cross spring is calculated, and this spring force is subtracted from the driving force to determine the force with which the indenter 1 presses the sample 40. Need to ask. This uses the output of the displacement meter 20 and is as follows.
That is, after the contactor 3 is pressed against the sample 40, the driving force of the indenter 1 is increased until the displacement gauge 20 becomes zero, and the driving force at that point is used as a reference point to verify the spring constant of the cross spring 6 and the displacement gauge. The true pressing force generated between the indenter 1 and the sample can be obtained by multiplying the output of 20 and subtracting from the driving force.

【0011】この微小領域強度試験装置によって測定を
行なうには、試料40を微動台41を含む試料台44に載置
し、顕微鏡43の下に置く。微動台41を上下して調整し焦
点を合わせると、試料40の表面の上下位置は、試料移動
機構45によって試料台44を圧子1の直下に移動させたと
き、ちょうど測定すべき上下位置となるようになってい
る。また顕微鏡43の直下の位置に試料40が置かれている
状態で、微動台41を水平方向に動かし、試料表面の測定
すべき位置を顕微鏡43の視野の中央にくるように調整す
る。そうすると試料台44を試料移動機構45によって圧子
1の直下に移動させたとき、顕微鏡43の視野の中央にあ
った試料40の表面の位置が、圧子1の先端に当接する位
置となる。このとき圧子1と接触子3はまだ作動してい
ないから、圧子1と試料40の表面との距離は1mm内外の
決まった値になるように予め顕微鏡43と圧子1の位置を
セットしておく。なお顕微鏡43は試料の位置決めに用い
るだけでなく、圧子1を試料40に圧入した後、再び試料
移動機構45によって顕微鏡43の下に移動させ、圧痕の大
きさ形状等を測定するために用いることもできる。
In order to carry out the measurement with this micro-region strength testing apparatus, the sample 40 is placed on the sample stage 44 including the fine movement stage 41 and placed under the microscope 43. When the fine movement table 41 is adjusted up and down to adjust the focus, the vertical position of the surface of the sample 40 becomes the vertical position just to be measured when the sample table 44 is moved right below the indenter 1 by the sample moving mechanism 45. It is like this. Further, while the sample 40 is placed at the position directly below the microscope 43, the fine movement table 41 is moved horizontally to adjust the position of the sample surface to be measured to the center of the visual field of the microscope 43. Then, when the sample table 44 is moved right below the indenter 1 by the sample moving mechanism 45, the position of the surface of the sample 40 in the center of the field of view of the microscope 43 becomes the position of contacting the tip of the indenter 1. At this time, since the indenter 1 and the contactor 3 have not been activated yet, the positions of the microscope 43 and the indenter 1 are set in advance so that the distance between the indenter 1 and the surface of the sample 40 becomes a fixed value within 1 mm. . The microscope 43 should be used not only for positioning the sample, but also for pressing the indenter 1 into the sample 40 and then moving it again below the microscope 43 by the sample moving mechanism 45 to measure the size and shape of the indentation. You can also

【0012】次に圧子1によって試料40を押圧し、測定
を行なう場合について述べる。まず接触子レバー4の駆
動コイル25に直流電流を与えると、接触子レバー4は十
字ばね7を支点として回転し、接触子3を下方に下げて
試料40の表面を押圧する。この場合の押圧力は0.05N
(ニュートン)程度であって、駆動コイル25に流す電流
を変化させて押圧力を調整する。この状態では圧子レバ
ー2には何ら力は与えられないから、図8に示すよう
に、接触子レバー4とともに接触子レバー4に固着して
いる電気絶縁板13が下方に下がり、電気絶縁板13の電極
16と圧子レバー2に固着している電気絶縁体12の電極14
とが接触し、圧子レバー2も接触子レバー4とともに下
方に押し下げられる。
Next, the case where the sample 40 is pressed by the indenter 1 to perform measurement will be described. First, when a direct current is applied to the drive coil 25 of the contact lever 4, the contact lever 4 rotates about the cross spring 7 as a fulcrum, lowers the contact 3 downward, and presses the surface of the sample 40. The pressing force in this case is 0.05N
The pressure is about (Newton), and the pressing force is adjusted by changing the current flowing through the drive coil 25. Since no force is applied to the indenter lever 2 in this state, as shown in FIG. 8, the electrical insulating plate 13 fixed to the contactor lever 4 together with the contactor lever 4 is lowered and the electrical insulating plate 13 is moved downward. Electrodes
16 and electrode 14 of electrical insulator 12 fixed to indenter lever 2
And the indenter lever 2 are pushed down together with the contactor lever 4.

【0013】次に圧子レバー2によって圧子1を駆動す
るのであるが、圧子1を駆動する力は精密に制御されて
いなければならないので、前述のように圧子1の変位計
20によって十字ばね6のばね力を補償する。すなわち図
10に示すように、圧子レバー2の駆動信号50は駆動増幅
器51によって増幅され、電流値52となって駆動コイル22
を駆動するが、電流値52と、変位計20とによって検出さ
れる十字ばね6のばね力に相当する電流値53との差を比
較器34によって求め、圧子1が試料40を押圧する荷重の
みを信号35として取り出すようにしている。
Next, the indenter 1 is driven by the indenter lever 2. Since the force for driving the indenter 1 must be precisely controlled, as described above, the displacement gauge of the indenter 1 is measured.
20 compensates the spring force of the cross spring 6. Ie figure
As shown in FIG. 10, the drive signal 50 of the indenter lever 2 is amplified by the drive amplifier 51 and becomes a current value 52, which is the drive coil 22.
The difference between the current value 52 and the current value 53 corresponding to the spring force of the cross spring 6 detected by the displacement meter 20 is obtained by the comparator 34, and only the load with which the indenter 1 presses the sample 40 is driven. Is taken out as the signal 35.

【0014】[0014]

【発明が解決しようとする課題】ところで、微小押し込
み式硬さ試験機では、試験に先立って圧子1と接触子3
との基準位置の設定を行なう必要があり、この基準位置
の設定を、上述の従来のものでは、次のようにして行な
っている。まず圧子レバー2の駆動コイル22に直流電流
を与え、圧子レバー2を十字ばね6を支点として回転さ
せて圧子1を下方に下げる力を与える。すると電極板1
4,16が接触していたものが離れる。そこで圧子変位計2
0の電極板14,16によって形成される第1コンデンサ18
と電極板15,17によって形成される第2コンデンサ19と
の電気容量が等しくなるように圧子変位計20の出力を見
ながら駆動電流値32の値を調整する。それによって第
1,第2のコンデンサ18,19の電極板の距離が共に50μ
mとなってこの位置が圧子1と接触子3の基準位置とな
る。
By the way, in the indentation hardness tester, the indenter 1 and the contactor 3 are tested prior to the test.
It is necessary to set the reference positions for and, and in the above-mentioned conventional device, the reference position is set as follows. First, a direct current is applied to the drive coil 22 of the indenter lever 2, and the indenter lever 2 is rotated about the cross spring 6 as a fulcrum to apply a force to lower the indenter 1 downward. Then the electrode plate 1
The objects that 4 and 16 were in contact with are separated. So indenter displacement meter 2
First capacitor 18 formed by 0 electrode plates 14, 16
The drive current value 32 is adjusted while observing the output of the indenter displacement meter 20 so that the electric capacities of the second capacitor 19 formed by the electrode plates 15 and 17 become equal. As a result, the distance between the electrode plates of the first and second capacitors 18 and 19 is both 50 μm.
This position becomes m and becomes the reference position for the indenter 1 and the contactor 3.

【0015】ところで、上記基準位置の設定は、上述の
とおり圧子変位計20の出力を見ながら、第1コンデンサ
の電気容量と第2コンデンサの電気容量とが等しくなる
ように、駆動コイル22の駆動電流値32の値を調整すると
いう微調整作業であるため、その操作には熟練を要する
ほか、調整に長時間を要するという問題点がある。本発
明は、このような問題点の解決をはかった、微小押し込
み式硬さ試験機における基準位置確定方法および装置を
提供することを目的とする。
By the way, the reference position is set by driving the driving coil 22 while observing the output of the indenter displacement gauge 20 as described above so that the electric capacitances of the first capacitor and the second capacitor become equal. Since this is a fine adjustment work of adjusting the value of the current value 32, there is a problem that the operation requires skill and a long time is required for the adjustment. It is an object of the present invention to provide a method and apparatus for determining a reference position in a micro push-in type hardness tester, which solves the above problems.

【0016】[0016]

【課題を解決するための手段】このため、本発明の微小
押し込み式硬さ試験機における基準位置確定方法は、軸
により機枠に対して回動可能に支持されるとともに先端
部に圧子を設けられた圧子レバーと、上記軸により機枠
に対して回動可能に支持されるとともに先端部に上記圧
子の貫通可能な中央貫通孔を有する接触子を設けられた
接触子レバーと、上記圧子レバーの先端部に設けられた
コ字状電気絶縁体と、同コ字状電気絶縁体のコ字状の中
に嵌入するように上記接触子レバーの先端部に取り付け
られた電気絶縁板と、上記のコ字状電気絶縁体と電気絶
縁板との互いに対向する2個所にそれぞれ取り付けられ
た電極板により構成される第1および第2コンデンサと
をそなえた微小押し込み式硬さ試験機において、上記圧
子と接触子との基準位置を設定するに際し、上記第1お
よび第2コンデンサの電気容量が等しくなるように上記
接触子レバーを回動させて課題解決の手段としている。
Therefore, in the method for determining the reference position in the micro push-in hardness tester of the present invention, the indenter is provided at the tip end while being rotatably supported by the shaft with respect to the machine frame. An indenter lever, a contact lever rotatably supported by the shaft with respect to the machine frame, and a tip provided with a contact having a central through hole through which the indenter can penetrate, and the indenter lever A U-shaped electrical insulator provided at the tip of the contact lever, an electrical insulating plate attached to the tip of the contact lever so as to be fitted into the U-shape of the U-shaped electrical insulator, and The indenter of the micro indentation type hardness tester provided with the first and second capacitors respectively constituted by electrode plates respectively attached to two U-shaped electric insulators and two electric insulating plates facing each other. And the base of the contact Position upon setting the, and the capacitance of the first and second capacitors is rotated the contact lever to equal a means of solving the problems.

【0017】また本発明の微小押し込み式硬さ試験機に
おける基準位置確定装置は、軸により機枠に対して回動
可能に支持されるとともに先端部に圧子を設けられた圧
子レバーと、上記軸により機枠に対して回動可能に支持
されるとともに先端部に上記圧子の貫通可能な中央貫通
孔を有する接触子を設けられた接触子レバーと、上記圧
子レバーの先端部に設けられたコ字状電気絶縁体と、同
コ字状電気絶縁体のコ字状の中に嵌入するように上記接
触子レバーの先端部に取り付けられた電気絶縁板と、上
記のコ字状電気絶縁体と電気絶縁板との互いに対向する
2個所にそれぞれ取り付けられた電極板により構成され
る第1および第2コンデンサとをそなえた微小押し込み
式硬さ試験機において、上記接触子と機枠との間にPZ
Tを介装し、同PZTを伸縮させるべくPZT制御電流
を供給する電流制御回路を設け、同電流制御回路に上記
第1および第2コンデンサの各電気容量を入力するよう
に構成して課題解決の手段としている。
The reference position determining device in the micro indentation hardness tester of the present invention includes an indenter lever rotatably supported by a shaft with respect to the machine frame and having an indenter at its tip, and the shaft. And a contact lever that is rotatably supported by the machine frame and has a contact having a central through hole through which the indenter can penetrate, and a coil provided at the tip of the indenter. A U-shaped electric insulator, an electric insulating plate attached to the tip of the contact lever so as to be inserted into the U-shaped electric insulator, and the U-shaped electric insulator. A micro indentation type hardness tester equipped with first and second capacitors each composed of an electrode plate attached to an electrically insulating plate at two locations opposed to each other, and between the contact and the machine frame. PZ
A problem is solved by providing a current control circuit for supplying a PZT control current through T to expand and contract the PZT and inputting each electric capacitance of the first and second capacitors to the current control circuit. Is used as a means.

【0018】[0018]

【発明の実施の形態】以下、図面により本発明の一実施
形態としての微小押し込み式硬さ試験機における基準位
置確定方法および装置について説明すると、図1はその
要部を示した側面図、図2は図1のA矢部の拡大図であ
る。なお図1,2中図3〜10と同じ符号は同一の部材を
示している。
BEST MODE FOR CARRYING OUT THE INVENTION Referring to the drawings, a reference position determining method and device in a micro-pushing hardness tester as one embodiment of the present invention will be described below. FIG. 1 is a side view showing the main parts thereof, and FIG. 2 is an enlarged view of arrow A in FIG. The same reference numerals as those in FIGS. 3 to 10 in FIGS. 1 and 2 denote the same members.

【0019】この実施形態の微小押し込み式硬さ試験機
も、上述の従来のものと同じ構成をそなえている。すな
わち圧子1を保持する圧子レバー2と、接触子3を保持
する接触子レバー4とをそなえ、圧子1は圧子レバー2
の先端部の下面に固着され、圧子レバー2の先端部の上
面にはコ字状の電気絶縁体12が固着されている。接触
子レバー4の先端部は図8に示すように、接触子レバー
4の先端部下面に、圧子1の周辺を同心円状に取囲むよ
うにして接触子3が固着しており、圧子1は接触子3を
貫通して往復動する。接触子レバー4の先端部上面には
電気絶縁板13が固着され、電気絶縁板13は圧子レバー2
の電気絶縁体12のコ字状の中に嵌入するようになってい
る。電気絶縁体12のコ字状内面と、電気絶縁板13の外面
との互いに相対する水平面の面上には、1平方センチメ
ートルあるいはそれ以上の電極板が貼着されている。圧
子レバー2に固着した電気絶縁体12には電極板14,15
が、接触子レバー4に固着した電気絶縁板13には電極板
16,17が固着され、電極板14,16および15,17は圧子1
と接触子3との基準位置では、両者共50μmの微小間隔
で相対する。電極板14,16および15,17は電気的コンデ
ンサを形成し、圧子1と接触子3との相対変位が、電極
板14,16によって形成される第1コンデンサ18と、電極
板15,17によって形成される第2コンデンサ19との電気
容量の差に比較する。よって公知の電気容量変化検出用
発振器および増幅器を用いて、圧子1と接触子3との相
対変位を取り出すことができ、これによって圧子変位計
20が構成される。なおこのようにして構成された圧子変
位計20は、変位の測定が必要な圧子1について、その直
近位置で検出が行なわれるので、圧子レバー2の剛性や
その他の機械的な誤差の影響を受けにくいという点でも
優れたものである。
The micro indentation hardness tester of this embodiment also has the same construction as the conventional one described above. That is, an indenter lever 2 holding an indenter 1 and a contactor lever 4 holding a contactor 3 are provided.
Is fixed to the lower surface of the tip of the indenter lever 2, and a U-shaped electric insulator 12 is fixed to the upper surface of the tip of the indenter lever 2. As shown in FIG. 8, the tip of the contact lever 4 has a contact 3 fixed to the lower surface of the tip of the contact lever 4 so as to concentrically surround the indenter 1. Reciprocate through 3. An electric insulating plate 13 is fixed to the upper surface of the tip of the contact lever 4, and the electric insulating plate 13 is attached to the indenter lever 2.
The electric insulator 12 is fitted into the U-shape. An electrode plate of 1 square centimeter or more is attached on the surfaces of the U-shaped inner surface of the electric insulator 12 and the outer surface of the electric insulating plate 13 which are opposite to each other in a horizontal plane. The electric insulator 12 fixed to the indenter lever 2 has electrode plates 14 and 15
However, the electrical insulation plate 13 fixed to the contact lever 4 has an electrode plate.
16 and 17 are fixed, and electrode plates 14, 16 and 15, 17 are indenter 1
At the reference position between the contactor 3 and the contactor 3, both face each other with a minute interval of 50 μm. The electrode plates 14, 16 and 15, 17 form an electric capacitor, and the relative displacement between the indenter 1 and the contactor 3 is caused by the first capacitor 18 formed by the electrode plates 14, 16 and the electrode plates 15, 17. It is compared with the difference in electric capacity between the formed second capacitor 19. Therefore, it is possible to take out the relative displacement between the indenter 1 and the contactor 3 by using the known oscillator and amplifier for detecting the capacitance change.
20 are configured. Since the indenter displacement gauge 20 configured in this way detects the indenter 1 whose displacement needs to be measured at the position closest thereto, it is affected by the rigidity of the indenter lever 2 and other mechanical errors. It is also excellent in that it is difficult.

【0020】さらに、両レバーの回動により圧子1と接
触子3とを試料(表面)40に対して垂直な軸線に沿って
往復動可能に支持する支持装置(従来装置における軸線
5上の十字ばね6,13)、圧子レバー2と接触子レバー
4とを回動させた後、圧子1を試料40に圧入させる圧子
レバー負荷装置21,接触子レバー負荷装置24なども設け
られている。そして、圧子1と接触子3との基準位置を
設定するために、次のような手段が付加されている。す
なわち、図1に示すように、軸5に接近した位置の接触
子レバー4と機枠10との間に、PZT(積層型圧電アク
チュエータ)30が介装され、PZT30に制御電流を付与
するCPU31,A/D変換器32,増幅器33からなるPZ
T制御器34が接続されいる。
Further, a supporting device for reciprocatingly supporting the indenter 1 and the contactor 3 along the axis perpendicular to the sample (surface) 40 by rotating both levers (a cross on the axis 5 in the conventional apparatus). There are also provided an indenter lever load device 21, a contact lever load device 24, and the like for rotating the springs 6, 13), the indenter lever 2 and the contactor lever 4, and then press-fitting the indenter 1 into the sample 40. Then, in order to set the reference positions of the indenter 1 and the contactor 3, the following means are added. That is, as shown in FIG. 1, a PZT (multilayer piezoelectric actuator) 30 is interposed between the contact lever 4 and the machine frame 10 in a position close to the shaft 5, and a CPU 31 that gives a control current to the PZT 30. , PZ consisting of A / D converter 32 and amplifier 33
The T controller 34 is connected.

【0021】CPU31には、第1コンデンサ18および第
2コンデンサ19の各電気容量が入力されており、両コン
デンサの電気容量を等しくするように、PZT30に制御
電流が供給される。PZT30はこの制御電流の供給を受
けて伸縮して接触子レバー4を軸5を中心に回動させ、
接触子レバー4の先端部における圧子レバー2との間の
寸法d1,d2,すなわち両コンデンサの電気容量が等し
くなる位置に、接触子レバー4を移動させる。これによ
り圧子1と接触子3とを基準位置に自動的に設定するこ
とができる。
The electric capacities of the first capacitor 18 and the second capacitor 19 are input to the CPU 31, and a control current is supplied to the PZT 30 so that the electric capacities of both capacitors become equal. The PZT 30 receives the control current and expands and contracts to rotate the contact lever 4 around the shaft 5,
The contact lever 4 is moved to the position where the dimensions d 1 and d 2 between the tip of the contact lever 4 and the indenter lever 2, that is, the electric capacities of both capacitors are equal. Thereby, the indenter 1 and the contactor 3 can be automatically set to the reference position.

【0022】[0022]

【発明の効果】以上詳述したように、本発明の微小押し
込み式硬さ試験機における基準位置確定方法および装置
によれば、圧子と接触子との基準位置の設定を自動化す
ることができ、操作の容易性の向上と、基準位置設定時
間の短縮化とをはかることができる。
As described in detail above, according to the reference position determining method and apparatus in the micro-indentation hardness tester of the present invention, the setting of the reference position between the indenter and the contact can be automated. It is possible to improve the ease of operation and shorten the reference position setting time.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態としての微小押し込み式硬
さ試験機における基準位置確定装置の側面図。
FIG. 1 is a side view of a reference position determination device in a micro-push hardness tester as an embodiment of the present invention.

【図2】図1のA矢部の拡大図。FIG. 2 is an enlarged view of an arrow A portion of FIG.

【図3】従来の微小押し込み式硬さ試験機の模式斜視
図。
FIG. 3 is a schematic perspective view of a conventional micro indentation hardness tester.

【図4】同十字ばねの正面図。FIG. 4 is a front view of the cross spring.

【図5】同十字ばねの側面図。FIG. 5 is a side view of the cross spring.

【図6】同圧子レバーと接触子レバーの平面図。FIG. 6 is a plan view of the indenter lever and the contactor lever.

【図7】同圧子レバーと接触子レバーとの先端部拡大
図。
FIG. 7 is an enlarged view of tips of the indenter lever and the contact lever.

【図8】同圧子レバー先端が図7の状態になる前に接触
子レバーのみが作動した状態を示す図7と同様の拡大
図。
8 is an enlarged view similar to FIG. 7, showing a state in which only the contact lever is operated before the tip of the indenter lever is brought into the state of FIG. 7.

【図9】試料台と圧子および顕微鏡の側面図。FIG. 9 is a side view of a sample stage, an indenter, and a microscope.

【図10】同圧子レバー駆動装置の制御系のブロック図。FIG. 10 is a block diagram of a control system of the indenter lever driving device.

【符号の説明】[Explanation of symbols]

1 圧子 2 圧子レバー 3 接触子 4 接触子レバー 5 軸 6,7 十字ばね 10 基台 11 ばね体 12 コ字状電気絶縁体 13 電気絶縁板 14,15,16,17 電極板 18 第1コンデンサ 19 第2コンデンサ 20 圧子変位計 21 圧子レバーの負荷装置 22 駆動コイル 23 永久磁石 24 接触子レバーの負荷装置 25 駆動コイル 26 永久磁石 30 PZT(積層型圧電アクチュエータ) 31 CPU 32 A/D変換器 34 PZT制御器 40 試料 1 indenter 2 indenter lever 3 contactor 4 contactor lever 5 axis 6,7 cross spring 10 base 11 spring body 12 U-shaped electrical insulator 13 electrical insulating plate 14, 15, 16, 17 electrode plate 18 first capacitor 19 Second condenser 20 Indenter displacement gauge 21 Indenter lever load device 22 Driving coil 23 Permanent magnet 24 Contactor lever load device 25 Driving coil 26 Permanent magnet 30 PZT (multilayer piezoelectric actuator) 31 CPU 32 A / D converter 34 PZT Controller 40 samples

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 軸により機枠に対して回動可能に支持さ
れるとともに先端部に圧子を設けられた圧子レバーと、 上記軸により機枠に対して回動可能に支持されるととも
に先端部に上記圧子の貫通可能な中央貫通孔を有する接
触子を設けられた接触子レバーと、 上記圧子レバーの先端部に設けられたコ字状電気絶縁体
と、同コ字状電気絶縁体のコ字状の中に嵌入するように
上記接触子レバーの先端部に取り付けられた電気絶縁板
と、 上記のコ字状電気絶縁体と電気絶縁板との互いに対向す
る2個所にそれぞれ取り付けられた電極板により構成さ
れる第1および第2コンデンサとをそなえた微小押し込
み式硬さ試験機において、 上記圧子と接触子との基準位置を設定するに際し、 上記第1および第2コンデンサの電気容量が等しくなる
ように上記接触子レバーを回動させるようにしたことを
特徴とする、微小押し込み式硬さ試験機における基準位
置確定方法。
1. An indenter lever rotatably supported by a shaft with respect to a machine frame and provided with an indenter at its tip, and a tip rotatably supported by the shaft with respect to the machine frame. A contact lever provided with a contact having a central through hole through which the indenter can penetrate, a U-shaped electrical insulator provided at the tip of the indenter lever, and a U-shaped electrical insulator An electric insulating plate attached to the tip of the contact lever so as to be fitted in a U-shape, and electrodes attached to the U-shaped electric insulator and the electric insulating plate, which are opposed to each other at two points respectively. In a micro indentation hardness tester equipped with a first and a second capacitor composed of plates, when setting the reference positions of the indenter and the contactor, the electric capacities of the first and second capacitors are made equal. To be on Characterized in that the contact lever to rotate, the reference position determination method in a micro indentation type hardness tester.
【請求項2】 微小押し込み式硬さ試験機において、 軸により機枠に対して回動可能に支持されるとともに先
端部に圧子を設けられた圧子レバーと、 上記軸により機枠に対して回動可能に支持されるととも
に先端部に上記圧子の貫通可能な中央貫通孔を有する接
触子を設けられた接触子レバーと、 上記圧子レバーの先端部に設けられたコ字状電気絶縁体
と、同コ字状電気絶縁体のコ字状の中に嵌入するように
上記接触子レバーの先端部に取り付けられた電気絶縁板
と、 上記のコ字状電気絶縁体と電気絶縁板との互いに対向す
る2個所にそれぞれ取り付けられた電極板により構成さ
れる第1および第2コンデンサとをそなえ、 上記接触子と機枠との間にPZTが介装され、 同PZTを伸縮させるべくPZT制御電流を供給する電
流制御回路が設けられ同電流制御回路に上記第1および
第2コンデンサの各電気容量がそれぞれ入力されるよう
に構成されていることを特徴とする、微小押し込み式硬
さ試験機における基準位置確定装置。
2. A micro-push-type hardness tester, wherein an indenter lever rotatably supported by a shaft with respect to the machine frame and provided with an indenter at a tip end thereof is rotated by the shaft with respect to the machine frame. A contactor lever movably supported and having a contactor having a central through hole through which the indenter can penetrate at the tip, and a U-shaped electrical insulator provided at the tip of the indenter lever, An electric insulating plate attached to the tip of the contact lever so as to fit into the U-shaped electric insulator, and the U-shaped electric insulator and the electric insulating plate facing each other. The PZT is provided between the contactor and the machine frame, and the PZT control current is applied to expand and contract the PZT. Supply current control circuit A reference position determination device in a micro-push-type hardness tester, wherein each of the electric capacities of the first and second capacitors is input to the provided current control circuit.
JP31954495A 1995-11-14 1995-11-14 Reference position determination device for micro-indentation hardness tester Expired - Fee Related JP3631310B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31954495A JP3631310B2 (en) 1995-11-14 1995-11-14 Reference position determination device for micro-indentation hardness tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31954495A JP3631310B2 (en) 1995-11-14 1995-11-14 Reference position determination device for micro-indentation hardness tester

Publications (2)

Publication Number Publication Date
JPH09138191A true JPH09138191A (en) 1997-05-27
JP3631310B2 JP3631310B2 (en) 2005-03-23

Family

ID=18111445

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31954495A Expired - Fee Related JP3631310B2 (en) 1995-11-14 1995-11-14 Reference position determination device for micro-indentation hardness tester

Country Status (1)

Country Link
JP (1) JP3631310B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009156688A (en) * 2007-12-26 2009-07-16 Mitsutoyo Corp Indentation testing instrument and indentation testing method
JP2010048750A (en) * 2008-08-25 2010-03-04 Mitsutoyo Corp Indentation depth measuring mechanism and material testing machine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009156688A (en) * 2007-12-26 2009-07-16 Mitsutoyo Corp Indentation testing instrument and indentation testing method
JP2010048750A (en) * 2008-08-25 2010-03-04 Mitsutoyo Corp Indentation depth measuring mechanism and material testing machine

Also Published As

Publication number Publication date
JP3631310B2 (en) 2005-03-23

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