JPH05246780A - Production of resin-impregnated chip-type electronics parts - Google Patents

Production of resin-impregnated chip-type electronics parts

Info

Publication number
JPH05246780A
JPH05246780A JP9393192A JP9393192A JPH05246780A JP H05246780 A JPH05246780 A JP H05246780A JP 9393192 A JP9393192 A JP 9393192A JP 9393192 A JP9393192 A JP 9393192A JP H05246780 A JPH05246780 A JP H05246780A
Authority
JP
Japan
Prior art keywords
resin
soln
chip
impregnation
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP9393192A
Other languages
Japanese (ja)
Inventor
Yutaka Irisawa
裕 入沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiyo Yuden Co Ltd
Original Assignee
Taiyo Yuden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiyo Yuden Co Ltd filed Critical Taiyo Yuden Co Ltd
Priority to JP9393192A priority Critical patent/JPH05246780A/en
Publication of JPH05246780A publication Critical patent/JPH05246780A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/009After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/45Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
    • C04B41/46Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with organic materials
    • C04B41/48Macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2111/00Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
    • C04B2111/00241Physical properties of the materials not provided for elsewhere in C04B2111/00
    • C04B2111/00405Materials with a gradually increasing or decreasing concentration of ingredients or property from one layer to another
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2111/00Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
    • C04B2111/00474Uses not provided for elsewhere in C04B2111/00
    • C04B2111/00844Uses not provided for elsewhere in C04B2111/00 for electronic applications

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To eliminate appearance defects due to resin and to sufficiently hold the amt. of the impregnated resin by successively impregnating by using resin solns. whose concn is stepwise decreased in the process of resin-impregnating a chip-type electronic parts body. CONSTITUTION:A chip-type electronic parts body (e.g. laminated capacitor body) is put into a resin soln. The resin soln. is prepared by mixing a silicon resin (e.g. polymethylsiloxane) and toluene with 3:7 weight ratio. The container of the resin soln. is housed in a sealing chamber which can be evacuated. Then the sealing chamber is evacuated to -600 to -700mmHg reduced pressure and held for about one minute to perform first impregnation. Then the inner pressure of the sealing chamber is made to normal pressure and the raw body in the soln. is taken out. Next, the raw body is put in a resin soln. of silicon resin and toluene with 1:9 weight ratio and treated for second impregnation in the same way as in the first stage. Then third impregnation is performed with a resin soln. having silicon resin to toluene ratio of 1:19. After impregnation, the raw body is taken out from the soln., naturally dried at room temp., and then cured at about 150 deg.C for about 2 hours.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、セラミックコンデンサ
等の樹脂含浸型チップ状電子部品の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing resin-impregnated chip-shaped electronic parts such as ceramic capacitors.

【0002】[0002]

【従来の技術】積層セラミックコンデンサやチップ状抵
抗器等のチップ状の電子部品は、プリント基板に搭載さ
れる電子部品として多く生産されている。積層セラミッ
クコンデンサは、金属酸化物からなるセラミック材料の
グリーンシートの複数枚のそれぞれに内部電極塗膜をそ
れぞれの端部が互い違いに逆の方向に導出されるように
形成し、これら内部電極塗膜を形成したグリーンシート
を積層して焼成することよりコンデンサ素体を形成し、
その両端に端子電極を形成したものである。また、チッ
プ抵抗器は、セラミック素地の上に金属膜等の抵抗体膜
を形成し、その表面に保護塗膜を形成して得られる抵抗
器素体の両端に端子電極を形成したものである。
2. Description of the Related Art Chip-shaped electronic parts such as multilayer ceramic capacitors and chip-shaped resistors are often produced as electronic parts to be mounted on a printed circuit board. A monolithic ceramic capacitor is formed by forming internal electrode coatings on each of a plurality of green sheets of ceramic material made of metal oxide such that the ends of the respective green sheets are alternately drawn out in opposite directions. The green sheet on which is formed is laminated and fired to form a capacitor body,
The terminal electrodes are formed on both ends thereof. The chip resistor is a resistor body obtained by forming a resistor film such as a metal film on a ceramic body and forming a protective coating film on the surface thereof, and forming terminal electrodes at both ends of the resistor body. ..

【0003】これらの積層セラミックコンデンサ、チッ
プ抵抗器のみならずその他のチップ状電子部品は、端子
電極を形成する前の例えばコンデンサ素体、セラミック
素地のような電子部品素体は、これらがセラミックグリ
ーンシートの焼成体からなる場合にはその製造過程で脱
バインダー処理を行なってバインダーを加熱除去するの
で、その抜けたあとが残る。この抜けたあとが比較的多
いポーラスな電子部品素体は耐湿性が低いので、この耐
湿性を向上させるために、樹脂を含浸させることがあ
る。その含浸方法としては樹脂を溶剤に溶かした一定濃
度の樹脂溶液に電子部品素体を投入し、全体を減圧す
る。これにより電子部品素体中の細孔の空気が除かれ、
その後に樹脂溶液が侵入することになる。
Not only these monolithic ceramic capacitors and chip resistors but also other chip-shaped electronic components, such as a capacitor element body before forming a terminal electrode, and an electronic component element body such as a ceramic material, are ceramic green. When the sheet is made of a fired body, the binder is removed by heating in the manufacturing process, so that the binder remains. Since the porous electronic component element body having a relatively large number of removed portions has low moisture resistance, it may be impregnated with a resin in order to improve the moisture resistance. As the impregnation method, the electronic component element body is put into a resin solution having a constant concentration in which a resin is dissolved in a solvent, and the whole is depressurized. This removes air from the pores in the electronic component body,
After that, the resin solution enters.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、電子部
品素体に樹脂を含浸させた後乾燥させ、さらに熱硬化を
行ってみると、電子部品素体の内部に侵入し切れない樹
脂がその表面に付着していることがある。その付着量の
多い電子部品素体を用いて製品のチップ状電子部品を製
造しても外観不良となるので、製品の歩留まりが低下す
る。この外観不良を減らすために、電子部品素体に樹脂
を含浸させた後乾燥することなく溶剤で洗浄することも
できるが、内部に含浸された樹脂の一部が溶剤中に溶け
出してしまい、本来の目的である耐湿性が得られない。
However, when the electronic component element body is impregnated with resin, dried, and then heat-cured, a resin that cannot completely penetrate into the electronic component element body is formed on the surface thereof. It may adhere. Even if a chip-shaped electronic component of a product is manufactured by using the electronic component base body having a large amount of the adhered amount, the appearance becomes defective, so that the yield of the product is reduced. In order to reduce this appearance defect, the electronic component body can be washed with a solvent without being dried after being impregnated with a resin, but a part of the resin impregnated inside dissolves in the solvent, The original purpose, moisture resistance, cannot be obtained.

【0006】本発明の目的は、樹脂の含浸が十分に行わ
れかつ表面に樹脂の付着のないチップ状電子部品の製造
方法を提供することにある。
An object of the present invention is to provide a method for manufacturing a chip-shaped electronic component in which the resin is sufficiently impregnated and the surface is free of the resin.

【0007】[0007]

【課題を解決するための手段】本発明は、上記課題を解
決するために、セラミック材料の焼成体からなるチップ
状電子部品素体に樹脂を含浸させる工程を有するチップ
状電子部品の製造方法において、チップ状電子部品素体
に樹脂を含浸させる工程は樹脂濃度を段階的に低下させ
た複数の樹脂溶液を順次用いる樹脂含浸型チップ状電子
部品の製造方法を提供するものである。
In order to solve the above problems, the present invention provides a method for manufacturing a chip-shaped electronic component, which comprises a step of impregnating a resin into a chip-shaped electronic component body made of a fired body of a ceramic material. The step of impregnating a chip-shaped electronic component body with a resin provides a method for manufacturing a resin-impregnated chip-shaped electronic component that sequentially uses a plurality of resin solutions in which the resin concentration is gradually reduced.

【0008】[0008]

【作用】樹脂濃度が段階的に低下した複数の樹脂溶液を
順次用いてチップ状電子部品素体に樹脂を含浸させたの
で、最終的に用いられる樹脂溶液の濃度を低くすれば、
はじめの含浸でチップ状電子部品素体表面に樹脂溶液が
付着してもこれは洗い流され、最終的に付着する樹脂量
は少なくなるので外観不良とならない。また、チップ状
電子部品素体の内部に含浸された樹脂も溶剤に対するよ
りは樹脂溶液に対する溶解性が低いから含浸の樹脂量も
十分にできる。
[Function] Since the chip-shaped electronic component element body is impregnated with resin by sequentially using a plurality of resin solutions in which the resin concentration is gradually decreased, if the concentration of the resin solution finally used is lowered,
Even if the resin solution adheres to the surface of the chip-shaped electronic component element body by the first impregnation, this is washed away, and the amount of resin finally adhered decreases, so that the appearance does not deteriorate. Further, since the resin impregnated inside the chip-shaped electronic component body has a lower solubility in the resin solution than in the solvent, the amount of the impregnated resin can be sufficient.

【0009】[0009]

【実施例】次に本発明の実施例を説明する。 実施例1 金属酸化物等のセラミック材料とバインダー等からなる
セラミックスラリーをポリエチレンテレフタレート(P
ETフィルム)等の平坦面に塗布する方法によりセラミ
ックグリーンシートを複数枚作製し、これにPdの粉
末、バインダー等からなる電極材料ペーストを塗布して
内部電極塗膜を一定間隔毎に多数形成する。そしてこれ
らの内部電極塗膜を形成したグリーンシートをセラミッ
クグリーンシートが内部電極塗膜の間に挟まれるように
順次重ね、ついで重ねた各内部電極毎に切断する。この
際、内部電極塗膜はその一端部のみを交互に反対側の端
面に導出するようにする。このようにして得られた直方
体の個別積層体を焼成して長さ1.6mm、幅0.8m
mのチップ状電子部品素体としての積層コンデンサ素体
を作製し、これを試験片とした。
EXAMPLES Next, examples of the present invention will be described. Example 1 A ceramic slurry composed of a ceramic material such as a metal oxide and a binder was mixed with polyethylene terephthalate (P
A plurality of ceramic green sheets are prepared by a method of coating on a flat surface such as an ET film), and an electrode material paste made of Pd powder, a binder, etc. is applied to this to form a large number of internal electrode coating films at regular intervals. . Then, the green sheets on which the internal electrode coating films are formed are sequentially stacked so that the ceramic green sheets are sandwiched between the internal electrode coating films, and then the stacked internal electrodes are cut. At this time, only one end of the coating film of the internal electrode is alternately led out to the opposite end face. The individual rectangular parallelepiped laminate thus obtained is fired to obtain a length of 1.6 mm and a width of 0.8 m.
A multilayer capacitor element body as a chip-shaped electronic component element body of m was prepared and used as a test piece.

【0010】この試験片をシリコン樹脂(ポリメチルシ
ロキサン)とトルエンを重量比3:7で混合した樹脂溶
液中に投入し、その容器を減圧可能な密閉容器(例えば
真空脱泡器)に収容し、−600〜−700mmHgの
減圧度で約1分間保持して第1回目の含浸を行う。つい
で、密閉容器の中を常圧にもどしてから溶液中の試験片
を取り出し、上記シリコン樹脂とトルエンを重量比1:
9で混合した樹脂溶液に投入し、以下上記と同様にして
第2回目の含浸を行う。同様にして上記シリコン樹脂と
トルエンを重量比1:19で混合した樹脂溶液を用いて
第3回目の含浸を行う。この3回目の含浸を行った試験
片を溶液中から取り出し、室温で1時間放置することに
より自然乾燥を行なう。その後、150℃の乾燥器の中
で2時間樹脂の硬化を行う。
This test piece was put into a resin solution in which a silicon resin (polymethylsiloxane) and toluene were mixed at a weight ratio of 3: 7, and the container was placed in a depressurizable closed container (for example, a vacuum defoamer). , -600 to -700 mmHg, the first impregnation is performed by holding the pressure reduction degree for about 1 minute. Then, the pressure inside the closed container was returned to normal pressure, the test piece in the solution was taken out, and the silicone resin and toluene were mixed in a weight ratio of 1:
It is added to the resin solution mixed in 9, and the second impregnation is performed in the same manner as described above. Similarly, the third impregnation is performed using a resin solution in which the above silicon resin and toluene are mixed at a weight ratio of 1:19. The test piece impregnated for the third time is taken out of the solution and left to stand at room temperature for 1 hour to be naturally dried. Then, the resin is cured in a dryer at 150 ° C. for 2 hours.

【0011】実施例2 実施例1において、第2回目の含浸を行った後自然乾燥
を行ない、150℃で2時間硬化させた試験片を作製し
た。
Example 2 In Example 1, a test piece was prepared by carrying out the second impregnation, followed by natural drying and curing at 150 ° C. for 2 hours.

【0012】実施例1、2の試験片をそれぞれ1000
個(1%未満の不良率を求める最低数)を作製し、表面
に樹脂が付着し外観不良と判断された個数を数え、その
全体に対する割合の外観不良率(%)を調べた結果を表
1に示す。また、それぞれの試験片についてその両端に
Ag−Pd(7:3)及びバインダーを含有する電極材
料ペーストを浸漬法により付着させ、乾燥し、焼付けて
端子電極を形成したチップ状積層コンデンサを作製し、
品質係数Qの劣化(耐湿性)があるかどうかを調べた結
果を表1に示す。なお、その試験は試験片を60℃、9
5%相対湿度下に500時間保持したものについて行っ
た。
Each of the test pieces of Examples 1 and 2 was 1000
The number of pieces (minimum number required to obtain a defective rate of less than 1%) was prepared, the number of pieces judged to have a defective appearance due to the resin adhering to the surface was counted, and the percentage of the defective appearance (%) to the whole was examined. Shown in 1. Further, for each test piece, an electrode material paste containing Ag-Pd (7: 3) and a binder was attached to both ends of each test piece by a dipping method, dried, and baked to produce a chip-shaped multilayer capacitor in which a terminal electrode was formed. ,
Table 1 shows the results obtained by examining whether or not the quality factor Q is deteriorated (moisture resistance). The test was conducted at 60 ° C for 9
The test was carried out for a sample kept at 5% relative humidity for 500 hours.

【0013】比較例1 実施例1において、第1回目の含浸を行ったのち、自然
乾燥を行ない、150℃で2時間硬化させた試験片を作
製し、実施例1と同様に外観不良率及び耐湿性を調べた
結果を表1に示す。 比較例2 実施例1において、第1回目の含浸を行ったのち、樹脂
溶液から取り出した試験片を超音波洗浄器を用いてトル
エンで30秒洗浄し、実施例1の場合と同様に乾燥・硬
化させた試験片について実施例1と同様に外観不良率及
び耐湿性を調べた結果を表1に示す。 比較例3 実施例1の第3回目の含浸を行ったときに用いた樹脂溶
液を実施例1の3回のそれぞれに用いた以外は実施例1
と同様に3回の含浸を行った試験片について耐湿性を調
べた結果を表2に示す。 比較例4 実施例1の当初の試験片(含浸を行う前のもの)につい
て耐湿性を調べた結果を表2に示す。
Comparative Example 1 In Example 1, a test piece was prepared by performing the first impregnation, followed by natural drying, and curing at 150 ° C. for 2 hours. The results of examining the moisture resistance are shown in Table 1. Comparative Example 2 In Example 1, after the first impregnation, the test piece taken out from the resin solution was washed with toluene for 30 seconds using an ultrasonic cleaner, and dried in the same manner as in Example 1. Table 1 shows the results of examining the defective appearance rate and the moisture resistance of the cured test pieces in the same manner as in Example 1. Comparative Example 3 Example 1 except that the resin solution used when performing the third impregnation of Example 1 was used for each of the three times of Example 1.
Table 2 shows the results of examining the moisture resistance of the test piece impregnated three times in the same manner as in. Comparative Example 4 Table 2 shows the results of examining the moisture resistance of the initial test piece of Example 1 (before impregnation).

【0014】[0014]

【発明の効果】本発明によれば、段階的に樹脂濃度の低
くなる複数の樹脂溶液を順次用いてチップ状電子部品素
体に含浸させたので、その表面に樹脂が付着しても順次
薄い樹脂溶液に洗われ、最終的に樹脂が残ったとしても
極く少ないので外観不良となることがないとともに、は
じめに含浸された樹脂も単なる溶剤よりは樹脂溶液に対
する方が溶け出しにくいので含浸樹脂量も十分に保持す
ることができる。
According to the present invention, since the chip-shaped electronic component element body is impregnated by successively using a plurality of resin solutions in which the resin concentration gradually decreases, even if the resin adheres to the surface of the element-shaped electronic component element, the resin solution becomes thinner. Even if there is little resin left after being washed with the resin solution, the appearance is not bad, and the resin impregnated at the beginning is less likely to dissolve into the resin solution than a simple solvent. Can also hold well.

【表1】 [Table 1]

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 セラミック材料の焼成体からなるチップ
状電子部品素体に樹脂を含浸させる工程を有するチップ
状電子部品の製造方法において、チップ状電子部品素体
に樹脂を含浸させる工程は樹脂濃度を段階的に低下させ
た複数の樹脂溶液を順次用いる樹脂含浸型チップ状電子
部品の製造方法。
1. In a method for manufacturing a chip-shaped electronic component having a step of impregnating a chip-shaped electronic component element body made of a fired body of a ceramic material with resin, the step of impregnating the chip-shaped electronic component element body with resin A method of manufacturing a resin-impregnated chip-shaped electronic component, which sequentially uses a plurality of resin solutions whose levels are gradually reduced.
JP9393192A 1992-03-02 1992-03-02 Production of resin-impregnated chip-type electronics parts Withdrawn JPH05246780A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9393192A JPH05246780A (en) 1992-03-02 1992-03-02 Production of resin-impregnated chip-type electronics parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9393192A JPH05246780A (en) 1992-03-02 1992-03-02 Production of resin-impregnated chip-type electronics parts

Publications (1)

Publication Number Publication Date
JPH05246780A true JPH05246780A (en) 1993-09-24

Family

ID=14096183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9393192A Withdrawn JPH05246780A (en) 1992-03-02 1992-03-02 Production of resin-impregnated chip-type electronics parts

Country Status (1)

Country Link
JP (1) JPH05246780A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8009012B2 (en) 2007-07-24 2011-08-30 Tdk Corporation Stacked electronic part and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8009012B2 (en) 2007-07-24 2011-08-30 Tdk Corporation Stacked electronic part and method of manufacturing the same

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