JPH0522174B2 - - Google Patents
Info
- Publication number
- JPH0522174B2 JPH0522174B2 JP58038623A JP3862383A JPH0522174B2 JP H0522174 B2 JPH0522174 B2 JP H0522174B2 JP 58038623 A JP58038623 A JP 58038623A JP 3862383 A JP3862383 A JP 3862383A JP H0522174 B2 JPH0522174 B2 JP H0522174B2
- Authority
- JP
- Japan
- Prior art keywords
- ring
- image
- coordinates
- diffraction
- uxy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58038623A JPS59163549A (ja) | 1983-03-09 | 1983-03-09 | 電子線回折像の自動分析方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58038623A JPS59163549A (ja) | 1983-03-09 | 1983-03-09 | 電子線回折像の自動分析方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59163549A JPS59163549A (ja) | 1984-09-14 |
| JPH0522174B2 true JPH0522174B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-03-26 |
Family
ID=12530362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58038623A Granted JPS59163549A (ja) | 1983-03-09 | 1983-03-09 | 電子線回折像の自動分析方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59163549A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004264260A (ja) * | 2003-03-04 | 2004-09-24 | Kyocera Corp | 電子回折パターンの解析方法及び解析装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5838622A (ja) * | 1981-04-20 | 1983-03-07 | Keiichiro Yamazaki | 手摺等における中空縦枠と横枠の連結方法 |
| JPS5838624A (ja) * | 1981-09-01 | 1983-03-07 | Yamada Dobby Co Ltd | トランスフア−フイ−ド装置におけるクラツチ装置 |
-
1983
- 1983-03-09 JP JP58038623A patent/JPS59163549A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004264260A (ja) * | 2003-03-04 | 2004-09-24 | Kyocera Corp | 電子回折パターンの解析方法及び解析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59163549A (ja) | 1984-09-14 |