JPH05206681A - Mounting apparatus for electronic component - Google Patents

Mounting apparatus for electronic component

Info

Publication number
JPH05206681A
JPH05206681A JP4013804A JP1380492A JPH05206681A JP H05206681 A JPH05206681 A JP H05206681A JP 4013804 A JP4013804 A JP 4013804A JP 1380492 A JP1380492 A JP 1380492A JP H05206681 A JPH05206681 A JP H05206681A
Authority
JP
Japan
Prior art keywords
electronic component
nozzle
chip
light
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4013804A
Other languages
Japanese (ja)
Other versions
JP3077348B2 (en
Inventor
Daizo Nakahara
大三 中原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP04013804A priority Critical patent/JP3077348B2/en
Publication of JPH05206681A publication Critical patent/JPH05206681A/en
Application granted granted Critical
Publication of JP3077348B2 publication Critical patent/JP3077348B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To provide an electronic component mounting apparatus which has a recognizing means which facilitates detection of the position discrepancy of a large size electronic component by a camera. CONSTITUTION:A recognizing means 9 which recognizes an electronic component P attracted by the nozzle 4 of a transfer head 3 is composed of a camera 13 which observes the attracted electronic component P from below, a light source 11 which applies light from below, a light diffusing plate 14 and a means 17-21 which brings the light diffusing plate 14 to and from a position above the electronic components P attracted by the nozzle 4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電子部品実装装置に係
り、殊にカメラにより大形の電子部品の位置ずれを認識
するための光学系の構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic component mounting apparatus, and more particularly to a structure of an optical system for recognizing a positional deviation of a large electronic component by a camera.

【0002】[0002]

【従来の技術】ICやLSIなどの電子部品(以下チッ
プともいう)を基板に搭載する電子部品実装装置とし
て、移載ヘッドをXYテーブルによりXY方向に移動さ
せながら、パーツフィーダのチップを移載ヘッドのノズ
ルに吸着してピックアップし、カメラなどの認識部によ
りこのチップのリードの位置ずれを認識した後、この位
置ずれを補正して基板に移送搭載するようにしたものが
広く実施されている。
2. Description of the Related Art As an electronic component mounting apparatus for mounting an electronic component such as an IC or an LSI (hereinafter also referred to as a chip) on a substrate, a transfer head is moved in an XY direction by an XY table while transferring a chip of a parts feeder. It is widely practiced to pick up by picking up by picking up the liquid from a nozzle of a head, recognizing the positional deviation of the lead of this chip by a recognition unit such as a camera, and then correcting the positional deviation and transferring and mounting it on a substrate. ..

【0003】図5は従来手段の電子部品実装装置の斜視
図である。101はトレイフィーダ、102はXYテー
ブル103に設けられた移載ヘッドであり、トレイフィ
ーダ101上でノズル104を昇降させてチップPをピ
ックアップし、認識部105上に移動してチップPのリ
ードLのXYθ方向の位置ずれを検出した後、この位置
ずれを補正して、位置決め部106に位置決めされた基
板Sに移送搭載する。
FIG. 5 is a perspective view of a conventional electronic component mounting apparatus. Reference numeral 101 is a tray feeder, and 102 is a transfer head provided on the XY table 103. The nozzle 104 is moved up and down on the tray feeder 101 to pick up the chip P, and the chip P is moved to the recognition unit 105 to lead L of the chip P. After detecting the positional deviation in the XYθ directions, the positional deviation is corrected and transferred and mounted on the substrate S positioned by the positioning unit 106.

【0004】次に認識部105を説明する。107はケ
ースであり、ノズル104に吸着されたチップPを観察
するカメラ108が設けられている。109はケースに
設けられた透明ステージであり、その周囲には、リング
状の光源110が設けられている。111は光源110
から照射された照明光を散乱させる乳白色の円板状の光
拡散板であり、ノズル104に装着されている。移載ヘ
ッド102がステージ109の上方に達すると、光源1
10から照射された照明光は、光拡散板111によって
チップPの上方で散乱され、これによりチップPのシル
エットをカメラ108により明瞭に観察して、チップP
のリードLの位置ずれが検出される。
Next, the recognition unit 105 will be described. Reference numeral 107 denotes a case, which is provided with a camera 108 for observing the chip P adsorbed by the nozzle 104. A transparent stage 109 is provided in the case, and a ring-shaped light source 110 is provided around the transparent stage. 111 is a light source 110
It is a milky white disc-shaped light diffusing plate that scatters the illumination light emitted from, and is attached to the nozzle 104. When the transfer head 102 reaches above the stage 109, the light source 1
The illumination light emitted from 10 is scattered above the chip P by the light diffusion plate 111, whereby the silhouette of the chip P is clearly observed by the camera 108, and the chip P
The misalignment of the lead L is detected.

【0005】[0005]

【発明が解決しようとする課題】ところが、従来手段で
は、チップPが光拡散板111より大きい場合には、チ
ップPのリードLは光拡散板111からはみ出してしま
うため、リードLを明瞭に観察できないという問題点が
あった。このような大形のチップとしては、例えばQF
Pやコネクタなどがある。このような問題点を解決する
ための手段として、光拡散板111を大形化することが
考えられるが、移載ヘッド102の配置設計上、光拡散
板111の大形化にも限界がある。
However, in the conventional means, when the chip P is larger than the light diffusion plate 111, the lead L of the chip P protrudes from the light diffusion plate 111, so that the lead L is clearly observed. There was a problem that I could not. As such a large chip, for example, QF
There are P and connectors. As a means for solving such a problem, it is conceivable to enlarge the light diffusion plate 111, but there is a limit to the enlargement of the light diffusion plate 111 due to the layout design of the transfer head 102. ..

【0006】そこで本発明は、カメラにより大形の電子
部品の位置ずれを認識することができる認識手段を備え
た電子部品実装装置を提供することを目的とする。
Therefore, an object of the present invention is to provide an electronic component mounting apparatus provided with a recognition means capable of recognizing a positional deviation of a large electronic component by a camera.

【0007】[0007]

【課題を解決するための手段】このために本発明は、電
子部品の認識手段を、ノズルに吸着された電子部品を下
方から観察するカメラと、下方から光を照射する光源
と、光拡散板と、この光拡散板をノズルに吸着された電
子部品の上方に出し入れする出し入れ手段とから構成し
たものである。
To this end, the present invention provides, as means for recognizing an electronic component, a camera for observing the electronic component adsorbed by a nozzle from below, a light source for irradiating light from below, and a light diffusion plate. And a means for putting in and taking out the light diffusing plate above and below the electronic component sucked by the nozzle.

【0008】[0008]

【作用】上記構成において、ノズルに電子部品が吸着さ
れた移載ヘッドが、カメラの観察位置に移動してきたな
らば、出し入れ手段により光拡散板をこの電子部品の一
辺の上方に突出させ、且つ光源を点灯して、この一辺か
ら延出されたリードの位置ずれを検出する。次いでXY
テーブルを駆動して電子部品をX方向やY方向に移動さ
せて、他の辺を光拡散板の直下に位置させ、その辺のリ
ードの位置ずれを検出する。以下同様にして、さらに他
の辺のリードの位置ずれを検出する。この場合、光拡散
板が電子部品の移動の障害になるときは、出し入れ手段
を駆動して、光拡散板を退避させる。このようにしてリ
ードの位置ずれを検出したならば、この位置ずれを補正
したうえで、チップを基板に搭載する。このように本手
段は、電子部品を光拡散板に対してX方向やY方向に移
動させながら、各辺のリードの位置ずれを検出できるの
で、大形の電子部品の各辺から延出するリードの位置ず
れを検出できる。
In the above structure, when the transfer head in which the electronic component is sucked by the nozzle moves to the observation position of the camera, the light diffusing plate is made to project above one side of the electronic component by the take-in / out means, and The light source is turned on to detect the positional deviation of the leads extended from this side. Then XY
The table is driven to move the electronic component in the X direction or the Y direction, the other side is positioned directly below the light diffusion plate, and the positional deviation of the lead on the side is detected. Similarly, the positional deviation of the leads on other sides is detected in the same manner. In this case, when the light diffusing plate interferes with the movement of the electronic component, the loading / unloading means is driven to retract the light diffusing plate. When the positional deviation of the leads is detected in this manner, the positional deviation is corrected and then the chip is mounted on the substrate. In this way, the present means can detect the positional deviation of the leads on each side while moving the electronic component in the X direction and the Y direction with respect to the light diffusion plate, and thus extends from each side of the large electronic component. Positional deviation of leads can be detected.

【0009】[0009]

【実施例】次に、図面を参照しながら本発明の実施例を
説明する。図1は電子部品実装装置の平面図である。1
はXテーブル、2はYテーブルであり、移載ヘッド3が
装着されている。4はこの移載ヘッド3に装着されたノ
ズルである。Sは基板であり、搬送路5上に設けられた
位置決め部6にクランプされて位置決めされている。7
はチップPの供給部であり、QFPやSOPのようなリ
ード付の大形のチップPが収納されたトレイフィーダ8
が配備されている。トレイフィーダ8上でノズル4を昇
降させてチップPをピックアップし、XYテーブル1,
2を駆動して基板Sに移送搭載する。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a plan view of the electronic component mounting apparatus. 1
Is an X table, 2 is a Y table, and the transfer head 3 is attached to the table. Reference numeral 4 denotes a nozzle mounted on the transfer head 3. A substrate S is clamped and positioned by a positioning unit 6 provided on the transport path 5. 7
Is a supply unit for the chips P, and is a tray feeder 8 in which large-sized chips P with leads such as QFP and SOP are stored.
Has been deployed. The nozzles 4 are moved up and down on the tray feeder 8 to pick up the chips P, and the XY table 1,
2 is driven and transferred and mounted on the substrate S.

【0010】図1および図2において、9は認識手段で
あって、ケース10と、このケース10の上面の透明ス
テージ16を取り囲むように設けられて、上方に光を照
射するリング状の光源11と、このケース10の側方に
設けられて、ノズル4に吸着されたチップPを下方から
観察するCCDカメラ13が設けられている。ケース1
0の側部上面には、光源11から照射された照明光を散
乱させる長板状の光拡散板14が配備されている。この
光拡散板14は、例えば乳白色のアクリル板などが使用
される。
In FIGS. 1 and 2, reference numeral 9 denotes a recognition means, which is provided so as to surround the case 10 and the transparent stage 16 on the upper surface of the case 10, and which is a ring-shaped light source 11 for radiating light upward. A CCD camera 13 is provided on the side of the case 10 for observing the chip P adsorbed by the nozzle 4 from below. Case 1
A long plate-shaped light diffusion plate 14 that scatters the illumination light emitted from the light source 11 is provided on the upper surface of the side portion of 0. As the light diffusion plate 14, for example, a milky white acrylic plate or the like is used.

【0011】17は光拡散板14の取付ブラケットであ
り、その下部にはY方向に延びたガイドレール18上を
摺動するスライダ19が設けられている。このガイドレ
ール18の側方にはシリンダ20が設けられ、ロッド2
1の先端部が取付ブラケット17に連結されている。シ
リンダ20のロッド21が突没すると、ガイドレール1
8に沿ってスライダ19が摺動し、光拡散板14が透明
ステージ16上に出し入れされる。すなわち上記構成部
品17〜21は、光拡散板14を透明ステージ16上に
出し入れさせる出し入れ手段を構成している。
Reference numeral 17 denotes a mounting bracket for the light diffusing plate 14, and a slider 19 which slides on a guide rail 18 extending in the Y direction is provided below the mounting bracket. A cylinder 20 is provided on the side of the guide rail 18, and
The tip portion of 1 is connected to the mounting bracket 17. When the rod 21 of the cylinder 20 is projected and retracted, the guide rail 1
The slider 19 slides along the line 8, and the light diffusion plate 14 is put in and taken out on the transparent stage 16. That is, the above-mentioned components 17 to 21 compose a loading / unloading means for loading / unloading the light diffusion plate 14 onto / from the transparent stage 16.

【0012】本装置は上記のような構成より成り、次に
動作を説明する。図1においてノズル4によりピックア
ップされたチップPは、XYテーブル1,2の駆動によ
り透明ステージ16上に移送され、透明ステージ16上
の直上のa位置(図3参照)で停止する。図3におい
て、シリンダ20の駆動により光拡散板14が鎖線位置
から実線位置まで突出し、チップPの一辺の上方を覆
う。ここで、その一辺の側端部のリードL1をカメラ1
3により観察し、XYθ方向の位置ずれを検出する(図
4も参照)。
This apparatus has the above-mentioned structure, and its operation will be described below. In FIG. 1, the chip P picked up by the nozzle 4 is transferred onto the transparent stage 16 by driving the XY tables 1 and 2, and stops at a position (see FIG. 3) immediately above the transparent stage 16. In FIG. 3, when the cylinder 20 is driven, the light diffusion plate 14 projects from the chain line position to the solid line position and covers one side of the chip P. Here, the lead L1 at the side end of the one side is connected to the camera 1
The observation is made by No. 3 and the positional deviation in the XYθ directions is detected (see also FIG. 4).

【0013】次いで、光拡散板14を突出させたまま、
チップPをY1方向に移送してb位置で停止させ、この
一辺の他端部のリードL2を観察する。次いでチップP
をX1方向に移送してc位置で停止させ、チップPの他
辺の上方を光拡散板14により覆い、この他辺の側端部
のリードL3を観察する。ここで、チップPのX1方向
への移送時に、光拡散板14がノズル4の移動の障害に
なるならば、シリンダ20を駆動して、光拡散板14を
鎖線位置に一時退避させる。次にチップPをY2方向に
移送してd位置で停止させ、この辺の他端部のリードL
4を観察する。このように、チップPを透明ステージ1
6の上方でXY方向に移動させれば、チップPの4辺か
ら延出するリードLの上方に光拡散板14を位置させて
各々のリードL1〜L4を明瞭に観察し、その位置ずれ
を精密に検出できる。殊に本実施例では、チップPを上
記のようなXY方向に移動させながら、すべてのリード
L1〜L4はカメラ13の光心付近の狭いエリアA(図
3参照)内で観察されることとなり、レンズの歪みなど
に起因する光学的な誤差を極力小さくすることができ
る。
Next, with the light diffusion plate 14 protruding,
The chip P is moved in the Y1 direction and stopped at the position b, and the lead L2 at the other end of this side is observed. Then chip P
Are moved in the X1 direction and stopped at the position c, the upper side of the other side of the chip P is covered with the light diffusion plate 14, and the lead L3 at the side end portion of the other side is observed. If the light diffusion plate 14 interferes with the movement of the nozzle 4 when the chip P is moved in the X1 direction, the cylinder 20 is driven to temporarily retract the light diffusion plate 14 to the chain line position. Next, the chip P is transferred in the Y2 direction and stopped at the d position, and the lead L at the other end of this side is
Observe 4. In this way, the chip P is attached to the transparent stage 1
6 is moved in the XY direction above 6, the light diffusion plate 14 is positioned above the leads L extending from the four sides of the chip P, and the leads L1 to L4 are clearly observed, and the positional deviation is detected. Can be detected accurately. Particularly, in this embodiment, all the leads L1 to L4 are observed in the narrow area A (see FIG. 3) near the optical center of the camera 13 while moving the chip P in the XY directions as described above. It is possible to minimize an optical error caused by lens distortion or the like.

【0014】以上のようにしてリードLの位置ずれの検
出が終了したならば、このチップPは、位置ずれを補正
したうえで、XYテーブル1,2の駆動により基板Sに
移送搭載され、またチップPの搭載が終了した基板Sは
コンベア5により後処理工程へ送られる。なおXY方向
の位置ずれは、XYテーブル1,2の移動ストロークを
補正することにより補正し、またθ方向の位置ずれはノ
ズル4を回転させることにより補正する。
When the detection of the positional deviation of the lead L is completed as described above, the positional deviation of the chip P is corrected, and then the chip P is transferred and mounted on the substrate S by driving the XY tables 1 and 2. The substrate S on which the chips P have been mounted is sent to the post-processing step by the conveyor 5. The positional deviation in the XY directions is corrected by correcting the moving strokes of the XY tables 1 and 2, and the positional deviation in the θ directions is corrected by rotating the nozzle 4.

【0015】本発明は上記実施例に限定されないのであ
って、例えばノズルに従来手段の円板状の光拡散板を設
けることにより、小形のチップは従来手段の光拡散板に
より観察し、また大形のチップは本手段の光拡散板14
により観察してもよい。
The present invention is not limited to the above embodiment. For example, by providing the nozzle with a disk-shaped light diffusing plate of the conventional means, a small chip can be observed by the light diffusing plate of the conventional means, and a large chip can be used. The shaped chip is the light diffusing plate 14 of this means.
You may observe by.

【0016】また上記実施例では、各辺の側端部のリー
ドL1〜L4を観察したが、どのリードLを観察して位
置ずれを検出するかは任意であって、例えば各辺につい
て、より多数本のリードLを観察して各々の位置ずれを
検出し、その平均値を求めるようにしてもよい。
Further, in the above embodiment, the leads L1 to L4 at the side end portions of each side were observed, but it is arbitrary which lead L is observed to detect the positional deviation. It is also possible to observe a large number of leads L and detect the respective positional deviations, and obtain the average value thereof.

【0017】[0017]

【発明の効果】以上説明したように本発明によれば、電
子部品の認識手段を、ノズルに吸着された電子部品を下
方から観察するカメラと、この電子部品に向かって下方
から光を照射する光源と、光拡散板と、この光拡散板を
ノズルに吸着された電子部品の上方に出し入れする出し
入れ手段とから構成しているので、電子部品の各辺から
延出するリードの上方に光拡散板を位置させてリードを
明瞭に観察し、その位置ずれを精密に検出することがで
き、従って移載ヘッド側に大形の光拡散板を設ける必要
がなく、殊に大形の電子部品の観察手段として有利であ
る。
As described above, according to the present invention, the camera for recognizing the electronic component is a camera for observing the electronic component sucked by the nozzle from below, and the electronic component is irradiated with light from below. Since it is composed of a light source, a light diffusing plate, and a loading / unloading means for loading / unloading the light diffusing plate above and below the electronic component attracted to the nozzle, the light diffusing is performed above the leads extending from each side of the electronic component. It is possible to position the plate clearly and observe the leads clearly, and to accurately detect the positional deviation.Therefore, it is not necessary to provide a large light diffusing plate on the transfer head side, especially for large electronic parts. It is advantageous as an observation means.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る電子部品実装装置の平面図FIG. 1 is a plan view of an electronic component mounting apparatus according to the present invention.

【図2】本発明に係る電子部品実装装置の斜視図FIG. 2 is a perspective view of an electronic component mounting apparatus according to the present invention.

【図3】同カメラによる電子部品のリードの観察中の平
面図
FIG. 3 is a plan view of an electronic component lead observed by the same camera.

【図4】同カメラによる電子部品のリードの観察中の側
面図
FIG. 4 is a side view during observation of leads of electronic components by the camera.

【図5】従来手段に係るカメラによる電子部品のリード
の観察中の斜視図
FIG. 5 is a perspective view during observation of leads of an electronic component by a camera according to a conventional means.

【符号の説明】[Explanation of symbols]

1 Xテーブル 2 Yテーブル 3 移載ヘッド 4 ノズル 6 位置決め部 7 電子部品の供給部 9 認識手段 11 光源 13 カメラ 14 光拡散板 20 出し入れ手段 P 電子部品 S 基板 DESCRIPTION OF SYMBOLS 1 X table 2 Y table 3 Transfer head 4 Nozzle 6 Positioning part 7 Electronic component supply part 9 Recognition means 11 Light source 13 Camera 14 Light diffuser 20 Ejecting / removing means P Electronic component S Substrate

フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H05K 13/08 B 8315−4E Continuation of the front page (51) Int.Cl. 5 Identification number Office reference number FI technical display location H05K 13/08 B 8315-4E

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】基板の位置決め部と、電子部品の供給部
と、移載ヘッドのノズルに吸着された電子部品を観察す
る認識手段と、上記移載ヘッドをXY方向に移動させる
XYテーブルとを備えた電子部品実装装置において、上
記認識手段が、上記ノズルに吸着された電子部品を下方
から観察するカメラと、下方から光を照射する光源と、
光拡散板と、この光拡散板を上記ノズルに吸着された電
子部品の上方に出し入れする出し入れ手段とから成るこ
とを特徴とする電子部品実装装置。
1. A substrate positioning unit, an electronic component supply unit, a recognition unit for observing an electronic component sucked by a nozzle of a transfer head, and an XY table for moving the transfer head in XY directions. In the electronic component mounting apparatus provided with, the recognition means, a camera for observing the electronic component attracted to the nozzle from below, a light source for irradiating light from below,
An electronic component mounting apparatus comprising: a light diffusing plate; and a loading / unloading means for loading / unloading the light diffusing plate above and above the electronic component sucked by the nozzle.
JP04013804A 1992-01-29 1992-01-29 Electronic component mounting apparatus and electronic component mounting method Expired - Fee Related JP3077348B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04013804A JP3077348B2 (en) 1992-01-29 1992-01-29 Electronic component mounting apparatus and electronic component mounting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04013804A JP3077348B2 (en) 1992-01-29 1992-01-29 Electronic component mounting apparatus and electronic component mounting method

Publications (2)

Publication Number Publication Date
JPH05206681A true JPH05206681A (en) 1993-08-13
JP3077348B2 JP3077348B2 (en) 2000-08-14

Family

ID=11843453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04013804A Expired - Fee Related JP3077348B2 (en) 1992-01-29 1992-01-29 Electronic component mounting apparatus and electronic component mounting method

Country Status (1)

Country Link
JP (1) JP3077348B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007078635A (en) * 2005-09-16 2007-03-29 Mitsutoyo Corp Calibration fixture, and offset calculation method of image measuring machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007078635A (en) * 2005-09-16 2007-03-29 Mitsutoyo Corp Calibration fixture, and offset calculation method of image measuring machine

Also Published As

Publication number Publication date
JP3077348B2 (en) 2000-08-14

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