JPH0520428A - Measurement method for silicon crushing rate of high silicon alluminium bore surface - Google Patents

Abstract

PURPOSE:To execute measurement by means of considerably adjusting it to the manufacture even if a large amount of cylinder blocks are manufactured by preventing the occurrence of a measurement error by means of objectively measuring rate and automatically measuring the crushing rate. CONSTITUTION:At the time of measuring the crushing rate of proeutectic silicon appearing on the bore surface 1a of the high silicon aluminum cylinder block, an optical magnifying glass 2 picks up the image of the bore surface 1a by a video camera 3. The image signal of the video camera 3 is image-processed in an image processor 4 and the total number of proeutectic silicon particles in the image processor 4 and the total number of proeutectic silicon particles in the image is counted. Then, it is judged that respective proeutectic silicon particles in the image are crushed or not, and the number of the crushed particles is counted. The number of the crushed particles is divided by the total number of the particles so as to calculate crushing rate of proeutectic silicon.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a crushing rate measuring method suitable for use in inspecting the crushing rate of primary silicon appearing on the bore surface of a high silicon aluminum cylinder block.

[0002]

2. Description of the Related Art It is generally known that primary crystal silicon is exposed on the surface of a bore of a high silicon aluminum cylinder block to prevent piston seizure. Since it is necessary to expose a large area, it is necessary that the crushing rate of the primary crystal silicon on the surface of the bore before the surface corrosion treatment is low. For this reason, normally, the crushing rate of primary crystal silicon is inspected for the bore surface after machining, but when performing such an inspection, conventionally, an inspector visually observes an enlarged image of the bore surface with a microscope, The crushing rate was measured by comparing with the limit sample.

[0003]

However, in such a conventional visual sensory test, an objective measurement cannot be made,
There is a problem that the crushing rate measurement is likely to be in error due to different measurement results when different inspectors are used, and further, it is not suitable for mass production because the measurement cannot be automated.

[0004]

SUMMARY OF THE INVENTION It is an object of the present invention to provide a crushing rate measuring method that advantageously solves the above problems, and a method of measuring the silicon crushing rate on the surface of a high silicon aluminum bore according to the present invention. When measuring the crushing rate of primary crystal silicon appearing on the bore surface of a high silicon aluminum cylinder block, the image of the bore surface is magnified with an optical magnifying glass and captured by a video camera, which outputs it. The image signal to be image-processed, the total number of primary crystal silicon particles appearing in the image is counted, and the image signal is image-processed so that each primary crystal silicon particle appearing in the image is crushed. After determining whether or not, the number of crushed primary crystal silicon particles is counted, and the number of crushed primary crystal silicon particles is divided by the number of all primary crystal silicon particles It is characterized in that to calculate the 砕率.

According to the present invention, when judging the fracture of each primary crystal silicon particle, the image signal is binarized and masked to measure the total area of each primary crystal silicon particle appearing in the image. Then, the image signal is subjected to binarization processing after mask processing and grayscale image processing, and the area of the crushed portion of each primary crystal silicon particle appearing in the image is measured, and the crushed portion is the primary crystal silicon particle. It may be determined that the primary crystal silicon particles are crushed when the area of the crushed portion is equal to or more than a predetermined ratio with respect to the total area of the primary crystal silicon particles.

[0006]

According to this method, the crushing rate of the primary crystal silicon is calculated from the total number of primary crystal silicon particles and the number of crushed primary crystal silicon particles, which are respectively obtained by image processing of the image signal showing the enlarged image of the bore surface. Therefore, it is possible to objectively measure the crushing rate and prevent the occurrence of a measurement error. Further, it is possible to automate the crushing rate measurement and adapt the measurement to mass production.

The image signal is subjected to binarization processing, mask processing and grayscale image processing to obtain the ratio of the area of the crushed portion to the total area of each primary crystal silicon particle and the state of the crushed portion, and the crushing is performed based on them. If the judgment is made, the crushing judgment of each primary crystal silicon particle can be made objectively and easily.

[0008]

Embodiments of the present invention will be described in detail below with reference to the drawings. FIG. 1 is a configuration diagram showing a measuring device used in an embodiment of a method for measuring the silicon crushing rate of the surface of a high silicon aluminum bore of the present invention, in which 1 is a high silicon aluminum cylinder block to be inspected and 2 is a normal one. 3 is an ordinary CCD camera as a video camera in which an optical system is connected to the optical magnifying glass 2, and 4 is an ordinary image processing device for processing an image signal output from the CCD camera 3. 5 is an ordinary image output device for displaying an image processed by the image processing device 4 on a CRT, and 6
Are printers for printing out the measurement results obtained by the image processing device 4 by image processing and calculation.
Here, the crushing rate of the primary crystal silicon appearing on the bore surface 1a of the high silicon aluminum cylinder block 1 is measured by using such a measuring device as follows.

That is, in this embodiment, as shown in FIG. 1, the optical magnifying glass 2 is inserted into the bore of the high silicon aluminum cylinder block 1 after, for example, honing, and the bore surface 1a of the bore 1a is inserted. An image processing apparatus outputs an image signal showing an image as shown in FIGS. 2 (a) and 3 (a), which is output by the CCD camera 3 by capturing an image of a predetermined range appropriately magnified by the magnifying glass 2. Enter in 4. In the figure, a white portion 7 indicates an aluminum alloy portion, and a black portion 8 indicates primary crystal silicon particles deposited therein.

However, the image processing device 4 here is
First, the input image signal is binarized by using an appropriate threshold value so that only the primary crystal silicon particles 8 become a bright portion as shown in FIG. 2B, and the binarized image is obtained. By labeling each primary crystal silicon particle 8 appearing in the image so that they can be distinguished from each other, and by the number of the identification labels, all primary crystal silicon particles 8 in the image can be identified. The number N of particles is counted.

Next, the image processing apparatus 4 obtains the total area A of each of the primary crystal silicon particles 8 having the identification label by subjecting the labeled image to a feature point extraction process, and subsequently, FIG. As shown in FIG. 2, a mask pattern is created for each primary crystal silicon particle 8 and the image before binarization is masked using the mask pattern to obtain each primary crystal as shown in FIG. A grayscale image of the silicon particles 8 is created, and thereafter, the grayscale image of each particle 8 is binarized, and the crushing portion 9 which is a portion that appears to be dark in the grayscale image is converted into a grayscale image as shown in FIG. The area B of the crushed portion 9 in each primary crystal silicon particle 8 is obtained by clarifying as a dark portion and subjecting the binarized image to feature point extraction processing, and further, the binarized image is subjected to diffusion processing, thereby Apparently expanded damage Part 9 to check whether to divide the particles 8 across its particles 8.

After performing such processing, the image processing apparatus 4
Is the crushed area ratio C, which is the ratio of the area B of the crushed portion 9 to the previously obtained total area A of the particle 8 for each primary crystal silicon particle 8 with the identification label, according to the following equation. C = (B / A) × 100 For example, when the crushed area ratio C of the crushed portion 9 exceeds 20% like the particle 8 shown in FIG. 8 is judged to be crushed. Further, in the image processing device 4, for each primary crystal silicon particle 8 to which the identification label is attached, the crushing portion 9 is the particle 8 as a result of the diffusion processing.
Even if the crushed area ratio C is 20% or less, the primary crystal divided by the crushed portion 9 crosses even if the crushed area ratio C is 20% or less. It is determined that the silicon particles 8 are crushed.

Thereafter, the image processing device 4 counts the number M of the primary crystal silicon particles 8 judged to be crushed by the number of the identification labels, and then the number M of the crushed primary crystal silicon M, The primary crystal silicon crushing rate R, which is the ratio to the total primary crystal silicon particle number N obtained earlier, is calculated by the following equation, and R = (M / N) × 100. If the crushing rate R is less than or equal to the pass / fail judgment value as compared with the value, it is determined as pass, and if it exceeds the pass / fail determination value, it is determined as fail. 5
Is displayed by the printer 6 and is printed by the printer 6, and the image in each image processing stage is also output by the image output device 5 as required.
To display.

As described above, according to the crushing rate measuring method of this embodiment, the number N of all primary crystal silicon particles and the number of crushed silicon particles obtained by image-processing the image signal showing the enlarged image of the bore surface 1a, respectively. Since the crushing rate R of the primary crystal silicon is calculated from the number M of primary crystal silicon particles, it is possible to objectively measure the crushing rate and prevent the occurrence of measurement error, and the crushing rate measurement is automatically performed. Therefore, even when the cylinder block 1 is mass-produced, the measurement can be performed sufficiently in time for the production.

Further, according to the above-described embodiment, the image signal is subjected to the binarization process, the mask process and the grayscale image process to obtain the ratio C of the area B of the crushing portion 9 to the total area A of each primary crystal silicon particle 8 and the crushing. Since the state of the portion 9 is obtained and whether or not the primary crystal grains 8 are crushed is determined based on them, the crushing determination of each primary crystal silicon particle 8 can be performed objectively and easily.

Although the present invention has been described above based on the illustrated example, the present invention is not limited to the above example. For example, as in the above example, the image of the surface of the cylinder bore is directly enlarged to form a CCD.
Instead of taking a picture with a camera, a microscopic picture of the surface of the cylinder bore may be taken once and then taken with a CCD camera. The video camera may be other than the CCD camera of the above example as long as it captures an object and outputs a signal indicating the image.

[0017]

As described above, according to the crush rate measuring method of the present invention, it is possible to objectively measure the crush rate and prevent the occurrence of a measurement error. Further, the crush rate measurement can be automated, The measurement can be adapted for mass production.

The image signal is subjected to binarization processing, mask processing and grayscale image processing to obtain the ratio of the area of the crushed portion to the total area of each primary crystal silicon particle and the state of the crushed portion, and the crushing is performed based on them. If the judgment is made, the crushing judgment of each primary crystal silicon particle can be made objectively and easily.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing a measuring device used in an embodiment of a method for measuring a silicon crushing rate on a surface of a high silicon aluminum bore according to the present invention.

FIGS. 2A to 2E are explanatory views showing bore surface images at each stage of image processing in the method of the above embodiment.

FIGS. 3 (a) and 3 (b) are explanatory views illustrating primary crystal silicon particles determined to be crushed, respectively.

[Explanation of symbols]

1 High silicon aluminum cylinder block 1a bore surface 2 optical magnifying glass 3 CCD camera 4 Image processing device 5 Image output device 6 printer 7 Aluminum alloy part 8 Primary crystal silicon particles 9 crushing section

Claims (2)

[Claims] 1. When measuring the crushing rate of primary crystal silicon appearing on the bore surface of a high silicon aluminum cylinder block, the image of the bore surface is magnified by an optical magnifying glass and imaged by a video camera. Image processing the image signal output from the camera,
The total number of primary crystal silicon particles appearing in the image is counted, and the image signal is subjected to image processing to determine whether each primary crystal silicon particle appearing in the image is crushed and then crushed. Counting the number of primary crystal silicon particles, and dividing the number of primary crystal silicon particles being crushed by the total number of primary crystal silicon particles to calculate the crushing rate of primary crystal silicon, high silicon Method for measuring the crushing rate of silicon on the surface of aluminum bores. 2. When determining the crushing of each primary crystal silicon particle, the image signal is binarized and masked to measure the total area of each primary crystal silicon particle appearing in the image, The image signal is subjected to binarization processing after mask processing and grayscale image processing, the area of the crushed portion of each primary crystal silicon particle appearing in the image is measured, and the crushed portion crosses the primary crystal silicon particles. The primary crystal silicon particles are determined to be crushed when the area of the crushed portion is equal to or more than a predetermined ratio with respect to the total area of the primary crystal silicon particles. Method for measuring the crushing rate of silicon on the surface of high silicon aluminum bores.