JPH05182900A - Method and apparatus for cooling of substrate - Google Patents

Method and apparatus for cooling of substrate

Info

Publication number
JPH05182900A
JPH05182900A JP3360171A JP36017191A JPH05182900A JP H05182900 A JPH05182900 A JP H05182900A JP 3360171 A JP3360171 A JP 3360171A JP 36017191 A JP36017191 A JP 36017191A JP H05182900 A JPH05182900 A JP H05182900A
Authority
JP
Japan
Prior art keywords
substrate
cooling
plate
cooling plate
substrate cooling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3360171A
Other languages
Japanese (ja)
Other versions
JP2584927B2 (en
Inventor
Hidekazu Wada
英一 和田
Kazunari Tanabe
一成 田邊
Kenji Fukuda
健児 福田
Kenichi Morishita
賢一 森下
Masaaki Hirata
正明 平田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP3360171A priority Critical patent/JP2584927B2/en
Publication of JPH05182900A publication Critical patent/JPH05182900A/en
Application granted granted Critical
Publication of JP2584927B2 publication Critical patent/JP2584927B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To cool a substrate as quickly as possible without generating a strain caused by a cooling operation. CONSTITUTION:A substrate W which has been conveyed onto a plate 5a for substrate cooling use is held by substrate raising and lowering pins 42 in their raised position; it is maintained and cooled in a position a prescribed distance above the surface of the plate 5a for substrate cooling use; after that, the substrate raising and lowering pins 42 are lowered by using a sixth air cylinder 47; the substrate W is lowered and placed on the plate 5a for substrate cooling use; the substrate W is vacuum-sucked by a suction operation from a suction hole; it is brought into close contact with the surface of the plate 5a for substrate cooling use. Thereby, the substrate W is cooled quickly.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体基板やフォトマ
スク用のガラス基板やプリント配線基板等の基板にフォ
トレジストを塗布して乾燥し、所定のパターンを焼き付
けてエッチングする工程において、フォトレジストの塗
布に先立って、基板を洗浄して加熱乾燥により表面の水
分を完全に除去し、これを室温にまで冷却するなどのた
めに、基板を基板冷却用プレートの表面に載置して直接
的に面接触させて基板を冷却する基板冷却方法、およ
び、基板を表面に載置して直接的に面接触させて冷却す
る基板冷却用プレートと、その基板冷却用プレートの表
面に分散形成されて載置した基板を真空吸着する吸着孔
と、基板を基板冷却用プレート上に搬送する基板搬送手
段とを備えた基板冷却装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoresist in a step of applying a photoresist to a substrate such as a semiconductor substrate, a glass substrate for a photomask, a printed wiring board, etc., drying, and baking a predetermined pattern for etching. Prior to the coating, the substrate is cleaned by heating and drying to completely remove surface moisture, and the substrate is placed on the surface of the substrate cooling plate directly to cool it to room temperature. A substrate cooling method for cooling a substrate by bringing it into surface contact with a substrate, and a substrate cooling plate for placing the substrate on the surface and directly bringing it into surface contact for cooling; The present invention relates to a substrate cooling device provided with a suction hole for vacuum-sucking a placed substrate and a substrate transporting device for transporting the substrate onto a substrate cooling plate.

【0002】[0002]

【従来の技術】上述のような基板を冷却する技術として
は、従来、特開昭59−48925号公報に開示されて
いるものがあった。この従来例によれば、冷水または塩
化カルシューム溶液等の冷媒を流すことによって冷却す
る冷却板を設け、その冷却板上に、加熱乾燥処理後の基
板を載置して真空吸着し、基板を冷却板の表面に直接的
に接触させて冷却し、これにより、基板を常温などの所
定温度まで急速に冷却し、乾燥時間に対して冷却に時間
がかかり過ぎることを回避し、生産効率を向上できるよ
うに構成している。
2. Description of the Related Art As a technique for cooling a substrate as described above, there has been a technique disclosed in Japanese Patent Laid-Open No. 59-48925. According to this conventional example, a cooling plate that cools by flowing a coolant such as cold water or calcium chloride solution is provided, and the substrate after the heat-drying process is placed on the cooling plate and vacuum-adsorbed to cool the substrate. It cools by directly contacting the surface of the plate, which allows the substrate to be rapidly cooled to a predetermined temperature such as room temperature, avoiding too long cooling for the drying time, and improving the production efficiency. Is configured as follows.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、従来例
では、加熱乾燥処理後の基板の温度(例えば、 200℃)
と冷却板の表面温度との間での温度差が大きく、そのよ
うな温度差の大きい状態で基板を冷却板上に載置する
と、冷却板に接触した基板の下面側の方で接触しない上
面側よりも大きな収縮力が働いて温度差によるひずみを
生じ、薄い基板の一部が凸状に撓み、冷却板の表面から
離れた状態になって均一に冷却できない欠点があった。
However, in the conventional example, the temperature of the substrate after the heat-drying treatment (for example, 200 ° C.)
Temperature difference between the cooling plate and the surface temperature of the cooling plate is large, and when the substrate is placed on the cooling plate with such a large temperature difference, the lower surface side of the substrate that comes into contact with the cooling plate does not come into contact with the upper surface. There is a drawback that a contraction force larger than that on the side acts to generate a strain due to a temperature difference, a part of the thin substrate is bent in a convex shape, and the thin substrate is separated from the surface of the cooling plate and cannot be cooled uniformly.

【0004】また、上述のようにひずみが生じる結果、
冷却処理後に基板搬送手段により取り出して搬送すると
きに、搬送不良を生じる虞があった。
Further, as a result of the distortion as described above,
When the substrate is taken out and carried by the substrate carrying means after the cooling processing, there is a possibility that a carrying failure may occur.

【0005】本発明は、このような事情に鑑みてなされ
たものであって、請求項1に係る発明の基板冷却方法
は、冷却に起因するひずみを発生せずに、基板を極力急
速に冷却できるようにすることを目的とし、そして、請
求項2に係る発明の基板冷却装置は、請求項1に係る発
明の基板冷却方法を好適に実施できる装置を提供するこ
とを目的とし、更に、請求項3に係る発明の基板冷却装
置は、設置スペースを小さくできるとともに、冷却処理
を効率良く行うことができるようにすることを目的とす
る。
The present invention has been made in view of the above circumstances, and the substrate cooling method according to the first aspect of the present invention cools the substrate as rapidly as possible without generating distortion due to cooling. It is an object of the present invention to provide a substrate cooling apparatus of the invention according to claim 2, and an object of the invention is to provide an apparatus capable of suitably implementing the substrate cooling method of the invention according to claim 1. An object of the substrate cooling device of the invention according to item 3 is to make it possible to reduce the installation space and efficiently perform cooling processing.

【0006】[0006]

【課題を解決するための手段】請求項1に係る発明の基
板冷却方法は、上述のような目的を達成するために、基
板を基板冷却用プレートの表面に載置して直接的に面接
触させて基板を冷却する基板冷却方法において、基板冷
却用プレートの表面への載置に先立って、基板を基板冷
却用プレートの上方に保持した状態で所定時間冷却する
ことを特徴としている。
In order to achieve the above-mentioned object, the substrate cooling method of the invention according to claim 1 places the substrate on the surface of the substrate cooling plate and directly makes surface contact. In the substrate cooling method of cooling the substrate by the above, the substrate is cooled for a predetermined time while being held above the substrate cooling plate prior to being placed on the surface of the substrate cooling plate.

【0007】そして、請求項2に係る発明の基板冷却装
置は、上述のような目的を達成するために、基板を表面
に載置して直接的に面接触させて冷却する基板冷却用プ
レートと、その基板冷却用プレートの表面に分散形成さ
れて載置した基板を真空吸着する吸着孔と、基板を基板
冷却用プレート上に搬送する基板搬送手段とを備えた基
板冷却装置において、基板冷却用プレート上の基板を、
基板冷却用プレートに載置して冷却する位置と、それよ
りも所定距離浮上させて冷却する位置とにわたって昇降
する基板昇降手段を備えて構成する。
In order to achieve the above-mentioned object, the substrate cooling apparatus according to the second aspect of the present invention includes a substrate cooling plate for placing a substrate on a surface and directly bringing the substrate into surface contact with the plate for cooling. In a substrate cooling device provided with a suction hole for vacuum-sucking a substrate which is dispersedly formed on the surface of the substrate cooling plate and placed thereon, and a substrate transfer means for transferring the substrate onto the substrate cooling plate, The substrate on the plate,
It comprises substrate elevating means for elevating and lowering between a position where it is placed on the substrate cooling plate and cooled, and a position where it is floated a predetermined distance above it and cooled.

【0008】また、請求項3に係る発明の基板冷却装置
は、上述のような目的を達成するために、請求項2に記
載の基板冷却用プレートの複数個を上下方向に多段に設
け、基板搬送手段を昇降する昇降手段を具備して構成す
る。
In order to achieve the above-mentioned object, a substrate cooling device according to a third aspect of the present invention is provided with a plurality of substrate cooling plates according to the second aspect in a multi-step manner in the vertical direction. An elevating means for elevating the conveying means is provided.

【0009】[0009]

【作用】請求項1に係る発明の基板冷却方法の構成によ
れば、加熱乾燥後などの高温の基板を基板冷却用プレー
トの表面から離した状態で冷却し、基板全体の温度を低
下させてから基板冷却用プレートの表面に直接的に面接
触させ、基板の上面と下面との温度差が小さい状態で基
板を急速に冷却することができる。
According to the structure of the substrate cooling method of the first aspect of the present invention, the temperature of the whole substrate is lowered by cooling the high temperature substrate after being heated and dried away from the surface of the substrate cooling plate. The surface of the substrate can be directly brought into contact with the surface of the substrate cooling plate to rapidly cool the substrate in a state where the temperature difference between the upper surface and the lower surface of the substrate is small.

【0010】また、請求項2に係る発明の基板冷却装置
の構成によれば、基板冷却用プレート上に搬送された基
板を、基板冷却用プレートの表面から所定距離浮上させ
た位置に維持させて冷却し、しかる後に、基板昇降手段
により基板を下降して基板冷却用プレート上に載置する
とともに吸着孔からの吸引により基板を真空吸着して基
板冷却用プレートの表面に密接し、基板を急速に冷却す
ることができる。
According to the structure of the substrate cooling device of the second aspect of the present invention, the substrate conveyed onto the substrate cooling plate is maintained at a position where it is levitated by a predetermined distance from the surface of the substrate cooling plate. After cooling, the substrate is lowered by the substrate elevating means and placed on the substrate cooling plate, and the substrate is vacuum sucked by suction from the suction holes to bring the substrate into close contact with the surface of the substrate cooling plate, thereby rapidly moving the substrate. Can be cooled to.

【0011】また、請求項3に係る発明の基板冷却装置
の構成によれば、昇降手段によって基板搬送手段を昇降
することにより、多段の基板冷却用プレートに基板を搬
送し、例えば、加熱乾燥などの前処理よりも冷却処理に
多くの時間がかかるような場合でも、その時間差を吸収
することができる。
According to the structure of the substrate cooling device of the third aspect of the invention, the substrate is conveyed to the multi-stage substrate cooling plate by elevating the substrate conveying means by the elevating means, for example, heating and drying. Even when the cooling process takes more time than the pre-treatment, the time difference can be absorbed.

【0012】[0012]

【実施例】次に、本発明の実施例を図面に基づいて詳細
に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0013】図1は、本発明に係る基板冷却装置の実施
例を示す側面図、図2は、図1の平面図であり、これら
の図において、1は入口コンベア、2は出口コンベアを
それぞれ示し、入口コンベア1を挟んで、第1および第
2の基板搬送手段3a,3bが設けられ、一方、出口コ
ンベア2を挟んで、第1および第2の基板搬出手段4
a,4bが設けられている。
FIG. 1 is a side view showing an embodiment of a substrate cooling apparatus according to the present invention, and FIG. 2 is a plan view of FIG. 1, in which 1 is an inlet conveyor and 2 is an outlet conveyor. As shown, first and second substrate transfer means 3a and 3b are provided on both sides of the entrance conveyor 1, while first and second substrate unloading means 4 are on the other side of the exit conveyor 2.
a and 4b are provided.

【0014】第1および第2の基板搬送手段3a,3b
それぞれと、第1および第2の基板搬出手段4a,4b
それぞれとの間には、上下方向3段に第1および第2の
基板冷却用プレート5a…,5b…が設けられている。
First and second substrate transfer means 3a, 3b
Respectively, first and second substrate unloading means 4a, 4b
Between them, first and second substrate cooling plates 5a ..., 5b ... Are provided in three stages in the vertical direction.

【0015】入口コンベア1および出口コンベア2それ
ぞれは、コンベア駆動用電動モータ6によって駆動回転
されるローラ7…を並設して構成され、そして、中央箇
所に、基板昇降ピン8…が設けられるとともに、それら
の基板昇降ピン8…が第1のエアーシリンダ9によって
駆動昇降するように構成されている。
Each of the inlet conveyor 1 and the outlet conveyor 2 is constructed by arranging rollers 7 driven and rotated by an electric motor 6 for driving the conveyor in parallel, and at the central portion thereof, substrate elevating pins 8 are provided. , The substrate elevating pins 8 ... Are configured to be driven up and down by the first air cylinder 9.

【0016】前記第1および第2の基板搬送手段3a,
3b、ならびに、第1および第2の基板搬出手段4a,
4bそれぞれは、水平移動手段10によって水平移動可
能に支柱11を設け、その支柱11に支持台12を設け
るとともに、支持台12に、鉛直方向の軸芯周りで回転
可能に基板支持アーム13を設けて構成されている。そ
して、前記支持台12は、支柱11に昇降手段14を介
して昇降可能に設けられている。
The first and second substrate transfer means 3a,
3b, and first and second substrate unloading means 4a,
Each of the columns 4b is provided with a column 11 which can be horizontally moved by the horizontal moving means 10, a support table 12 is provided on the column 11, and a substrate support arm 13 is provided on the support table 12 so as to be rotatable around an axis in the vertical direction. Is configured. Further, the support base 12 is provided on the column 11 so as to be able to move up and down via the elevating means 14.

【0017】前記水平移動手段10は、図3の平面図、
および、図4の断面図に示すように、一対の固定ガイド
レール15,15それぞれに、支柱11の下部に設けた
係合部材16を外嵌するとともに、支柱11と固定側と
にわたってロッドレスシリンダ17を連動連結して構成
されている。図1において、10aはショックアブゾー
バーを示している。
The horizontal moving means 10 is a plan view of FIG.
As shown in the cross-sectional view of FIG. 4, the pair of fixed guide rails 15 and 15 are each fitted with an engaging member 16 provided at the lower portion of the support column 11, and the rodless cylinder extends over the support column 11 and the fixed side. 17 are linked and connected. In FIG. 1, 10a indicates a shock absorber.

【0018】図5の一部切欠側面図、および、図6の図
5を下側から見た平面図に示すように、基板支持アーム
13を取り付けた支軸18が支持台12に回転可能に設
けられ、その支軸18の下部に一体回転可能に連結され
たアーム19に第3のエアーシリンダ20が連動連結さ
れ、基板支持アーム13を90°前後の範囲で駆動回転
し、入口コンベア1または出口コンベア2側を向いた姿
勢と、第1の基板冷却用プレート5aまたは第2の基板
冷却用プレート5b側を向いた姿勢とに姿勢変更できる
ように構成されている。図中19aはショックアブソー
バーを示している。
As shown in the partially cut-away side view of FIG. 5 and the plan view of FIG. 5 viewed from below, the support shaft 18 with the substrate support arm 13 attached thereto is rotatable on the support base 12. A third air cylinder 20 is interlockingly connected to an arm 19 which is provided and is integrally rotatably connected to the lower portion of the support shaft 18, and the substrate support arm 13 is driven to rotate in the range of about 90 ° to rotate the entrance conveyor 1 or The posture can be changed between the posture facing the exit conveyor 2 side and the posture facing the first substrate cooling plate 5a or the second substrate cooling plate 5b side. Reference numeral 19a in the figure denotes a shock absorber.

【0019】昇降手段14は、図7の正面図、および、
図8の断面図に示すように、取付プレート21に第4の
エアーシリンダ22と第5のエアーシリンダ23とが取
り付けられ、その第4のエアーシリンダ22のシリンダ
ロッドの先端が支柱11の下部に連結され、一方、第5
のエアーシリンダ23の先端が支持台12に連結され、
そして、支柱11に一対の固定ガイドレール24,24
が設けられるとともに、両固定ガイドレール24,24
それぞれに、支持台12に設けた係合部材25が外嵌さ
れ、第4および第5のエアーシリンダ22,23を短縮
した状態、第4のエアーシリンダ22のみを伸長した状
態、ならびに、第4および第5のエアーシリンダ22,
23を伸長した状態それぞれに切換えることにより、第
1および第2の基板冷却用プレート5a…,5b…それ
ぞれの最下部のもの、中段のもの、および、最上部のも
のそれぞれに対応した位置に基板支持アーム13を昇降
変位するように構成されている。
The elevating means 14 is a front view of FIG. 7 and
As shown in the cross-sectional view of FIG. 8, a fourth air cylinder 22 and a fifth air cylinder 23 are attached to a mounting plate 21, and the tip of the cylinder rod of the fourth air cylinder 22 is located at the bottom of the column 11. Connected, while the fifth
The tip of the air cylinder 23 is connected to the support base 12,
Then, a pair of fixed guide rails 24, 24 is attached to the pillar 11.
Is provided, and both fixed guide rails 24, 24 are provided.
An engaging member 25 provided on the support base 12 is externally fitted to each of them, and the fourth and fifth air cylinders 22 and 23 are shortened, only the fourth air cylinder 22 is extended, and the fourth air cylinder 22 is extended. And a fifth air cylinder 22,
By switching 23 to the extended state, the substrate is placed at a position corresponding to the lowermost one, the middle one, and the uppermost one of the first and second substrate cooling plates 5a ..., 5b. The support arm 13 is configured to be displaced up and down.

【0020】上記構成により、入口コンベア1によって
所定箇所まで搬入した基板Wを基板昇降ピン8により上
昇させ、その基板Wの下方に、第1または第2の基板搬
送手段3a,3bの基板支持アーム13を変位し、その
後に基板Wを基板昇降ピン8により下降させて基板支持
アーム13側に移載する。そして、基板支持アーム13
を90°回転してから、その位置であるいは昇降手段14
により上昇して所定段の第1または第2の基板冷却用プ
レート5a,5bを選択し、その状態で水平移動手段1
0により水平方向に移動して、選択した第1または第2
の基板冷却用プレート5a,5bの基板上下ピン42
(図10参照)上に受け渡す。後述する基板Wの冷却を
行った後には、第1または第2の基板搬出手段4a,4
bにより、前述した第1または第2の基板搬送手段3
a,3bの動作と逆の動作により、基板支持アーム13
に載置した基板Wを出口コンベア2まで搬送し、その基
板Wを出口コンベア2の基板昇降ピン8上に移載し、基
板支持アーム13を退避させてから基板昇降ピン8を下
降して出口コンベア2上に載置させ、その出口コンベア
2によって搬出する。
With the above-described structure, the substrate W carried to the predetermined location by the entrance conveyor 1 is raised by the substrate lifting pins 8, and below the substrate W, the substrate supporting arm of the first or second substrate carrying means 3a, 3b. 13 is displaced, and then the substrate W is moved down by the substrate elevating pins 8 and transferred to the substrate support arm 13 side. Then, the substrate support arm 13
90 ° and then at that position or ascending / descending means 14
Is moved up to select the first or second substrate cooling plate 5a, 5b in a predetermined stage, and in that state, the horizontal moving means 1 is used.
0 to move horizontally to select the first or second selected
Substrate upper and lower pins 42 of the substrate cooling plates 5a and 5b
(See FIG. 10) Hand over. After cooling the substrate W described later, the first or second substrate unloading means 4a, 4
b, the above-mentioned first or second substrate transfer means 3
By the operation opposite to the operations of a and 3b, the substrate support arm 13
The substrate W placed on the substrate is conveyed to the exit conveyor 2, the substrate W is transferred onto the substrate lifting pins 8 of the exit conveyor 2, the substrate support arm 13 is retracted, and then the substrate lifting pins 8 are lowered to exit. It is placed on the conveyor 2 and carried out by the exit conveyor 2.

【0021】第1および第2の基板冷却用プレート5a
…,5b…それぞれを収容したプレートハウジング26
は、図9の要部の一部切欠正面図、図10の一部切欠平
面図、図11の断面図、および、図12の要部の平面図
(これらの図では第1の基板冷却用プレート5aで説明
する)に示すように、プレート支持枠27にスライドレ
ール28,28を介して引き出し可能に設けられ、図1
3の一部省略正面図に示すように、プレートハウジング
26…を引き出して第1の基板冷却用プレート5a…そ
れぞれを個別に保守点検できるように構成されている。
図中29は引き出し用把手を示している。
First and second substrate cooling plates 5a
..., 5b ... Plate housing 26 accommodating each
9 is a partially cutaway front view of the main part of FIG. 9, a partially cutaway plan view of FIG. 10, a cross-sectional view of FIG. 11, and a plan view of the main part of FIG. 12 (for the first substrate cooling in these drawings). As will be described with reference to the plate 5a), the plate support frame 27 is provided so as to be able to be pulled out via slide rails 28, 28.
As shown in the partially omitted front view of FIG. 3, the plate housings 26 ... Are drawn out so that the first substrate cooling plates 5a.
Reference numeral 29 in the drawing indicates a pulling handle.

【0022】図3に示すように、プレートハウジング2
6…それぞれの引き出し方向に直交する両側面それぞれ
に、基板Wを出し入れする開口30が形成され、かつ、
図9に示すように、プレートハウジング26の天井部
に、乾燥した清浄空気を噴出供給するエア噴出孔31…
が形成されるとともに、それらのエア噴出孔31…に連
通する給気口32に対応するように、プレート支持枠2
7にエア供給管33が設けられ、プレートハウジング2
6を押し込むに伴って自ずと給気口32がエア供給管3
3に連通接続されるように構成されている。
As shown in FIG. 3, the plate housing 2
6 ... An opening 30 for taking in and out the substrate W is formed on each of both side surfaces orthogonal to the respective drawing directions, and
As shown in FIG. 9, the air ejection holes 31 for supplying dry clean air to the ceiling portion of the plate housing 26.
Of the plate support frame 2 so as to correspond to the air supply ports 32 communicating with the air ejection holes 31 ...
7, an air supply pipe 33 is provided, and the plate housing 2
As the 6 is pushed in, the air supply port 32 is automatically moved to the air supply pipe 3
3 is connected to communicate.

【0023】第1の基板冷却用プレート5aのプレート
載置面側に吸着孔34…が形成されるとともに、吸着孔
34…を互いに連通接続する連通穴35が形成され、更
に、連通穴35の所定箇所に、真空ポンプ(図示せず)
などに接続された吸気管36が接続され、基板Wを真空
吸着によって保持するように構成されている。
Adsorption holes 34 ... Are formed on the plate mounting surface side of the first substrate cooling plate 5a, and communication holes 35 are formed to connect the adsorption holes 34 ... to each other. Vacuum pump (not shown) at a specified location
The suction pipe 36 connected to the above is connected and configured to hold the substrate W by vacuum suction.

【0024】また、第1の基板冷却用プレート5a内に
は、図10に示すように、冷却用の冷媒としての冷却水
を流すジグザグ状の冷却水流路37が形成され、その冷
却水流路37の一端側の給水口38にプレート側給水管
39が接続されるとともに、そのプレート側給水管39
の先端に対応するように、プレート支持枠27に給水管
40が設けられ、プレートハウジング26を押し込むに
伴って自ずとプレート側給水管39が給水管40に連通
接続されるように構成されている。一方、冷却水流路3
7の他端側の排水口41に、図示しないが、プレート側
排水管が接続されるとともに、そのプレート側排水管の
先端に対応するように、プレート支持枠27に排水管が
設けられ、プレートハウジング26を押し込むに伴って
自ずとプレート側排水管が排水管に連通接続されるよう
に構成されている。
In the first substrate cooling plate 5a, as shown in FIG. 10, a zigzag-shaped cooling water passage 37 for flowing cooling water as a cooling medium is formed, and the cooling water passage 37 is formed. The plate side water supply pipe 39 is connected to the water supply port 38 on one end side of the
A water supply pipe 40 is provided in the plate support frame 27 so as to correspond to the tip of the plate support frame 27, and the plate side water supply pipe 39 is naturally connected to the water supply pipe 40 as the plate housing 26 is pushed in. On the other hand, the cooling water flow path 3
Although not shown, the plate side drain pipe is connected to the drain port 41 on the other end side of the plate 7, and the plate support frame 27 is provided with the drain pipe so as to correspond to the tip of the plate side drain pipe. As the housing 26 is pushed in, the plate side drain pipe is automatically connected to the drain pipe.

【0025】第1の基板冷却用プレート5aの中央側の
所定の4箇所を貫通して昇降可能に基板上下ピン42が
設けられ、基板上下ピン42…が第1のピン支持体43
に一体的に取り付けられるとともに、その第1のピン支
持体43に第2のピン支持体44が取り付けられ、図1
1に示すように、第2のピン支持体44に一体的に取り
付けられた一対のガイドロッド45,45それぞれがガ
イド筒46に摺動可能に内嵌されるとともに、第2のピ
ン支持体44に第6のエアーシリンダ47が連動連結さ
れ、第6のエアーシリンダ47の伸縮により、基板上下
ピン42を、第1の基板冷却用プレート5aの基板載置
面よりも浮上した予冷位置と、内部に入り込んで基板W
を基板載置面に直接接触する急冷位置とに昇降できるよ
うに構成されている。図中48…は、第1の基板冷却用
プレート5aに接触してその温度を測定する熱電対、5
8は、第1の基板冷却用プレート5a上の基板Wの有無
を検知するための光ファイバーを示している。上記基板
上下ピン42…と、それに連動連結されて基板Wを駆動
昇降する第6のエアーシリンダ47とから成る構成をし
て基板昇降手段と称する。
Substrate upper and lower pins 42 are provided so as to be capable of moving up and down through predetermined four places on the center side of the first substrate cooling plate 5a, and the substrate upper and lower pins 42 ... Are the first pin supports 43.
Is integrally attached to the first pin support 43, and the second pin support 44 is attached to the first pin support 43.
As shown in FIG. 1, the pair of guide rods 45, 45 integrally attached to the second pin support body 44 are slidably fitted in the guide cylinder 46, respectively, and the second pin support body 44 is The sixth air cylinder 47 is interlocked and connected, and the expansion and contraction of the sixth air cylinder 47 causes the substrate upper and lower pins 42 to float above the substrate mounting surface of the first substrate cooling plate 5a and the pre-cooling position. Board W
Is configured to be moved up and down to a quenching position where it directly contacts the substrate mounting surface. Reference numeral 48 in the figure denotes a thermocouple 5 for measuring the temperature of the first substrate cooling plate 5a by contacting it.
Reference numeral 8 denotes an optical fiber for detecting the presence or absence of the substrate W on the first substrate cooling plate 5a. The substrate up-and-down pins 42 ... And the sixth air cylinder 47 which is linked to the pins and drives and moves up and down the substrate W are referred to as substrate elevating means.

【0026】次に、上記基板冷却装置を用いて行う基板
冷却方法を説明する。図14は、本発明に係る基板冷却
方法を説明する要部の一部切欠正面図であり、入口コン
ベア1から第1の基板搬送手段3aによって搬送され、
かつ、基板支持アーム13によってプレートハウジング
26内に導入された基板Wを、図14の(a)に示すよ
うに、第1の基板冷却用プレート5aの上方の予冷位置
に上昇された基板上下ピン42…上に載置保持し、その
状態を維持して、エア噴出孔31…から冷却用空気をプ
レートハウジング26内に供給することにより所定時間
予冷する。なお、基板Wの冷却温度が室温程度である場
合には、予冷に際して冷却用空気を供給せず雰囲気温度
にて予冷することもできる。
Next, a substrate cooling method using the substrate cooling device will be described. FIG. 14 is a partially cutaway front view of an essential part for explaining the substrate cooling method according to the present invention, in which the substrate is conveyed from the inlet conveyor 1 by the first substrate conveying means 3a.
In addition, as shown in (a) of FIG. 14, the substrate W introduced into the plate housing 26 by the substrate support arm 13 is lifted to the pre-cooling position above the first substrate cooling plate 5a to lift the substrate upper and lower pins. 42 is mounted on the plate housing 26 and maintained in that state, and cooling air is supplied into the plate housing 26 from the air ejection holes 31 to precool for a predetermined time. When the cooling temperature of the substrate W is about room temperature, it is also possible to precool the substrate W at the ambient temperature without supplying cooling air.

【0027】しかる後に、図14の(b)に示すよう
に、基板上下ピン42…を下降し、基板Wを第1の基板
冷却用プレート5aの上面に直接的に面接触させ、熱電
対48…による測定温度が設定温度になるまで冷却す
る。このとき、吸着孔34…(図9参照)を通じての真
空吸引によって基板Wを第1の基板冷却用プレート5a
の上面に吸着保持して密接させる。なお、熱電対48…
による測温を基板Wに直接接触させずに第1の基板冷却
用プレート5aを介して行うのは、このような直接接触
によるパーティクル等の汚染物質の基板Wへの付着を避
ける目的と、熱伝導によって第1の基板冷却用プレート
5aの測温を行うことで基板Wの温度検知が実用上差し
支えなく達成できるからである。
Thereafter, as shown in FIG. 14B, the substrate upper and lower pins 42 are lowered to bring the substrate W into direct surface contact with the upper surface of the first substrate cooling plate 5a, and the thermocouple 48. Cool until the temperature measured by ... reaches the set temperature. At this time, the substrate W is transferred to the first substrate cooling plate 5a by vacuum suction through the suction holes 34 (see FIG. 9).
Adsorbed and held on the upper surface of the intimate contact. The thermocouple 48 ...
The temperature is measured by the first substrate cooling plate 5a without directly contacting the substrate W with the purpose of avoiding adherence of contaminants such as particles to the substrate W due to such direct contact. This is because the temperature of the substrate W can be detected practically without any problem by measuring the temperature of the first substrate cooling plate 5a by conduction.

【0028】冷却終了後には、基板上下ピン42…を上
昇し、第1の基板搬出手段4aの基板支持アーム13を
基板Wの下方に変位してから、基板上下ピン42…を下
降することにより基板支持アーム13に基板Wを受け渡
し、第1の基板搬出手段4aから出口コンベア2を経て
搬出する。
After the cooling is completed, the substrate up / down pins 42 ... Are raised to displace the substrate support arm 13 of the first substrate unloading means 4a below the substrate W, and then the substrate up / down pins 42 ... The substrate W is transferred to the substrate support arm 13 and is unloaded from the first substrate unloading means 4a via the exit conveyor 2.

【0029】この冷却方法は、第2の基板搬出手段3
b、第2の基板冷却用プレート5bおよび第2の基板搬
出手段4bを用いて行う場合も同じである。
This cooling method is performed by the second substrate unloading means 3
The same applies to the case of using b, the second substrate cooling plate 5b, and the second substrate unloading means 4b.

【0030】上記実施例では、2列の第1および第2の
基板搬送手段3a,3b、第1および第2の基板冷却用
プレート5a,5b、ならびに、第1および第2の基板
搬出手段4a,4bに対して、入口コンベア1と出口コ
ンベア2それぞれを共用しており、この構成により、装
置スペースを小さくできるとともに構成を簡単にできる
という利点を有しているが、本発明としては、単に1列
に構成するものでも良い。
In the above embodiment, two rows of first and second substrate transfer means 3a and 3b, first and second substrate cooling plates 5a and 5b, and first and second substrate unloading means 4a are provided. , 4b share the inlet conveyor 1 and the outlet conveyor 2 respectively, and this configuration has the advantage that the device space can be reduced and the configuration can be simplified. It may be configured in one row.

【0031】また、上記実施例では、第1および第2の
基板冷却用プレート5a,5bから基板Wを取り出すの
に、専用の第1および第2の基板搬出手段4a,4bを
設けているが、第1および第2の基板搬送手段3a,3
bによって基板Wの取り出しをも行うように構成するも
のでも良い。
Further, in the above embodiment, the first and second substrate unloading means 4a and 4b dedicated for taking out the substrate W from the first and second substrate cooling plates 5a and 5b are provided. , First and second substrate transfer means 3a, 3
The substrate W may be taken out by b.

【0032】また、制御手段(図示せず)によって、各
基板冷却用プレートへ供給した基板Wの順序を記憶して
おき、その記憶された順序に従って冷却済み基板Wを基
板冷却用プレートから順次排出するように構成しても良
い。
Further, the control means (not shown) stores the order of the substrates W supplied to the respective substrate cooling plates, and the cooled substrates W are sequentially discharged from the substrate cooling plates in the stored order. It may be configured to do so.

【0033】[0033]

【発明の効果】請求項1に係る発明の基板冷却方法によ
れば、予め基板全体の温度を低下させてから基板冷却用
プレートの表面に直接的に面接触させて冷却するから、
その面接触による急速冷却に際して、基板の上面と下面
との温度差を小さくでき、温度差に起因する基板のひず
み発生を防止しながら基板を極力急速に冷却できるよう
になった。
According to the substrate cooling method of the first aspect of the present invention, the temperature of the entire substrate is lowered in advance, and then the surface is directly brought into contact with the surface of the substrate cooling plate for cooling.
During the rapid cooling due to the surface contact, the temperature difference between the upper surface and the lower surface of the substrate can be reduced, and the substrate can be cooled as quickly as possible while preventing distortion of the substrate due to the temperature difference.

【0034】また、請求項2に係る発明の基板冷却装置
によれば、基板冷却用プレート上に搬送された基板を、
基板冷却用プレートの表面から所定距離浮上させた位置
と基板冷却用プレートの表面に面接触させた位置とに基
板昇降手段によって変位するとともに、それぞれの位置
に維持して冷却し、しかも、基板冷却用プレートの表面
に面接触させた状態では真空吸着によって基板を基板冷
却用プレートの表面に密接するから、上述した請求項1
に係る発明の基板冷却方法を好適に実施できる装置を提
供できるようになった。
Further, according to the substrate cooling device of the second aspect of the present invention, the substrate conveyed onto the substrate cooling plate is
The substrate is moved up and down by a predetermined distance from the surface of the substrate cooling plate and the position of surface contact with the surface of the substrate cooling plate is displaced by the substrate elevating means, and the substrate is cooled while being maintained at each position. The substrate is brought into close contact with the surface of the substrate cooling plate by vacuum suction in the state of being in surface contact with the surface of the substrate cooling plate.
It is now possible to provide an apparatus capable of suitably implementing the substrate cooling method of the invention according to the above.

【0035】請求項3に係る発明の基板冷却装置によれ
ば、多段の基板冷却用プレートで複数個の基板を冷却処
理し、加熱乾燥などの前処理よりも冷却処理に多くの時
間がかかるような場合でも、その時間差を吸収できるか
ら、設置スペースを小さくできるとともに、冷却処理を
効率良く行うことができるようになった。。
According to the substrate cooling device of the third aspect of the present invention, the cooling treatment of a plurality of substrates by the multi-stage substrate cooling plate requires more time than the pretreatment such as heating and drying. Even in such a case, since the time difference can be absorbed, the installation space can be reduced and the cooling process can be efficiently performed. .

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る基板冷却装置の実施例を示す側面
図である。
FIG. 1 is a side view showing an embodiment of a substrate cooling device according to the present invention.

【図2】図1の平面図である。FIG. 2 is a plan view of FIG.

【図3】水平移動手段の構成を示す平面図である。FIG. 3 is a plan view showing a configuration of horizontal moving means.

【図4】水平移動手段の構成を示す断面図である。FIG. 4 is a cross-sectional view showing a configuration of horizontal moving means.

【図5】基板支持アームの回転構成を示す一部切欠側面
図である。
FIG. 5 is a partially cutaway side view showing a rotation structure of a substrate support arm.

【図6】図5の下側から見た平面図である。FIG. 6 is a plan view seen from the lower side of FIG.

【図7】昇降手段の構成を示す正面図である。FIG. 7 is a front view showing a configuration of a lifting means.

【図8】昇降手段の構成を示す断面図である。FIG. 8 is a cross-sectional view showing a configuration of a lifting means.

【図9】基板冷却用プレートの構成を示す一部切欠側面
図である。
FIG. 9 is a partially cutaway side view showing a configuration of a substrate cooling plate.

【図10】図9の平面図である。FIG. 10 is a plan view of FIG.

【図11】図10の断面図である。11 is a cross-sectional view of FIG.

【図12】要部の平面図である。FIG. 12 is a plan view of a main part.

【図13】一部省略正面図である。FIG. 13 is a partially omitted front view.

【図14】本発明に係る基板冷却方法を説明する要部の
一部切欠正面図である。
FIG. 14 is a partially cutaway front view of an essential part for explaining the substrate cooling method according to the present invention.

【符号の説明】[Explanation of symbols]

3a…第1の基板搬送手段 3b…第2の基板搬送手段 5a…第1の基板冷却用プレート 5b…第2の基板冷却用プレート 14…昇降手段 34…吸着孔 42…基板昇降手段を構成する基板上下ピン 47…基板昇降手段を構成する第6のエアーシリンダ W…基板 3a ... 1st board | substrate carrying means 3b ... 2nd board | substrate carrying means 5a ... 1st board | substrate cooling plate 5b ... 2nd board | substrate cooling plate 14 ... Elevating means 34 ... Adsorption hole 42 ... Comprising board elevating means. Substrate up / down pins 47 ... Sixth air cylinder W ... Substrate elevating means

───────────────────────────────────────────────────── フロントページの続き (72)発明者 福田 健児 滋賀県彦根市高宮町480番地の1 大日本 スクリーン製造株式会社彦根地区事業所内 (72)発明者 森下 賢一 滋賀県彦根市高宮町480番地の1 大日本 スクリーン製造株式会社彦根地区事業所内 (72)発明者 平田 正明 滋賀県彦根市高宮町480番地の1 大日本 スクリーン製造株式会社彦根地区事業所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Kenji Fukuda Inventor Kenji Fukuda 1 at 480 Takamiya-cho, Hikone City, Shiga Dai Nippon Screen Mfg. Co., Ltd. Hikone District Office (72) Inventor Kenichi Morishita At 480 Takamiya-cho, Hikone City, Shiga Prefecture 1 Dainippon Screen Mfg. Co., Ltd. Hikone District Office (72) Inventor Masaaki Hirata 1 480 Takamiyacho, Hikone City, Shiga Prefecture 1 Dainippon Screen Mfg. Co., Ltd. Hikone District Office

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 基板を基板冷却用プレートの表面に載置
して直接的に面接触させて基板を冷却する基板冷却方法
において、 前記基板冷却用プレートの表面への載置に先立って、前
記基板を前記基板冷却用プレートの上方に保持した状態
で所定時間冷却することを特徴とする基板冷却方法。
1. A substrate cooling method for cooling a substrate by placing the substrate on the surface of a substrate cooling plate and directly contacting the surface of the substrate cooling plate, the method comprising the steps of: A method of cooling a substrate, characterized in that the substrate is cooled for a predetermined time while being held above the substrate cooling plate.
【請求項2】 基板を表面に載置して直接的に面接触さ
せて冷却する基板冷却用プレートと、 その基板冷却用プレートの表面に分散形成されて載置し
た基板を真空吸着する吸着孔と、 前記基板を前記基板冷却用プレート上に搬送する基板搬
送手段と、 を備えた基板冷却装置において、 前記基板冷却用プレート上の基板を、前記基板冷却用プ
レートに載置して冷却する位置と、それよりも所定距離
浮上させて冷却する位置とにわたって昇降する基板昇降
手段を備えたことを特徴とする基板冷却装置。
2. A substrate cooling plate for placing a substrate on a surface and directly bringing the substrate into surface contact to cool it, and a suction hole for vacuum-adsorbing the substrate that is dispersedly formed on the surface of the substrate cooling plate and placed thereon. A substrate transporting device that transports the substrate onto the substrate cooling plate, and a position for mounting the substrate on the substrate cooling plate and cooling the substrate on the substrate cooling plate. And a substrate elevating means which elevates and lowers over a position where it is levitated by a predetermined distance and cooled.
【請求項3】 請求項2に記載の基板冷却用プレートの
複数個を上下方向に多段に設け、前記基板搬送手段を昇
降する昇降手段を具備した基板冷却装置。
3. A substrate cooling apparatus comprising a plurality of substrate cooling plates according to claim 2, which are vertically arranged in multiple stages, and provided with an elevating means for elevating said substrate carrying means.
JP3360171A 1991-12-27 1991-12-27 Substrate cooling method and substrate cooling device Expired - Lifetime JP2584927B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3360171A JP2584927B2 (en) 1991-12-27 1991-12-27 Substrate cooling method and substrate cooling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3360171A JP2584927B2 (en) 1991-12-27 1991-12-27 Substrate cooling method and substrate cooling device

Publications (2)

Publication Number Publication Date
JPH05182900A true JPH05182900A (en) 1993-07-23
JP2584927B2 JP2584927B2 (en) 1997-02-26

Family

ID=18468220

Family Applications (1)

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Country Status (1)

Country Link
JP (1) JP2584927B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105655271A (en) * 2014-11-11 2016-06-08 沈阳新松机器人自动化股份有限公司 Semiconductor cooling apparatus applied to high-vacuum environment
JP2017027968A (en) * 2015-07-15 2017-02-02 東京エレクトロン株式会社 Substrate processing apparatus, substrate processing method, and recording medium

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JPH01216531A (en) * 1988-02-25 1989-08-30 Sigma Gijutsu Kogyo Kk Cooling method for resist-coated substrate
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