JPH05172898A - Module structure equipped wirh extension function for electrical part testing and measuring device - Google Patents

Abstract

PURPOSE:To carry out the additional installation of extension modules instantly without installing an error correcting circuit on the extension module, obviating the need of the correction work due to the additional installation of the extension module in the measured data analysis. CONSTITUTION:A fundamental module bmk is constituted of an error correcting circuit 11, signal analyzing/generating circuit 13, and a selector 12 which is interposed between the circuits 12 and 13 and arbitrarily selects the connection between the error correcting circuit, signal analyzing/generating circuit, and an extension buss expbus in each signal line or signal line group linek. While, an extension module emk; is constituted of a signal analyzing/generating circuit 14 and a selector 15 which is interposed between expbus and the signal analyzing/generating circuit and arbitrarily selects the connection between both to a prescribed signal line or signal line group of expbus. emk' can receive and transmit signals to a host side buss through the error correcting circuit 11 by properly setting the selectors 12 and 15.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention provides an electrical component test / expansion module which can easily add an expansion module, does not require an error correction circuit in the expansion module, and can eliminate or simplify correction accompanying expansion module expansion. The present invention relates to a module structure with an expanded function of a measuring device.

[0002]

2. Description of the Related Art For example, in an electrical test / measurement device for an electronic component of a per-pin configuration having a test function for each measurement pin such as an IC tester, various test signals to be given to a test target are generated, Various signal processing units for analyzing the response signal of are modularized. As described above, by modularizing each signal processing unit, it is possible to easily configure the test according to the type of the object to be tested, the measurement content, and the like, and it is possible to efficiently perform the maintenance management of the entire test system.

By the way, conventionally, in the above-mentioned test / measurement apparatus, in order to expand the processing function for an object to be tested, a new module in which the functions of all the measurement pins are recreated is used. A method such as providing a selector in the signal path of the basic module) and switching the signal line to either the basic module or the extension module by the selector is adopted. However, in the method of exchanging the above-mentioned module, since the number of pins of the IC tester having the per-pin configuration reaches 100 or more, the number of modules to be exchanged increases and the cost required for function expansion becomes very high. is there. In the method (1), for example, a selector is provided between the signal cables drawn from the test head to the host side, and the selector selects either the basic module or the expansion module.

FIG. 3 shows an example of the expansion of the above-mentioned expansion modules by using the basic modules bm ₀ , bm ₁ , bm ₂ ,
The extension module em is added to the module group consisting of ... In the figure, the signal analysis generation circuit 1 of each basic module bm ₀ , bm ₁ , ...
7 exchanges signals with the host side via the error correction circuit 16. Further, the selector 18 is connected in the middle of the path of the signal line groups lin ₀ , lin ₁ , ... That compose the cable, and the selector 18 is connected to the basic modules bm ₀ , bm ₁ ,.
Switching the connection with. In this case, the expansion module em includes an error correction circuit 2 for correcting variations in the cable length and the like before the signal analysis / generation circuit 19.
0 must be set. A selector 21 is provided in the expansion module em of FIG. 3, and the selector 21 selects any one of the signal line groups lin ₀ , lin ₁ , ...

However, in the module structure shown in FIG. 3, when an extension module is to be added, it takes a long time to cut the cable, attach the selector 18, and connect the extension cable. For this reason, there is no choice but to suspend the tester during this period, which causes a problem that the operating efficiency of the IC tester is reduced. Further, since the selectors will be inserted later into the existing signal paths lin ₀ , lin ₁ , ..., Due to the difference in the signal paths before and after the expansion module em is added, the basic module bm ₀ ,
There is an inconvenience that an error occurs in the measurement results and the like at bm ₁ , ... And the data correction work (usually not an easy work) must be spent a long time during the analysis of the measurement data.

[0006]

SUMMARY OF THE INVENTION The present invention has been proposed in order to solve the above problems, and it is possible to add an expansion module immediately, without providing an error correction circuit in the expansion module, and An object of the present invention is to provide a module structure with an expansion function that can eliminate or facilitate correction work accompanying expansion module expansion when measuring measurement data.

[0007]

SUMMARY OF THE INVENTION The module structure with extended function of the present invention is
At least one basic module connected to the host side bus and at least one expansion module connected to an expansion bus provided separately from the host side bus, the basic module being connected to the host side bus. An error correction circuit to be connected, a signal processing unit (which does not necessarily have a built-in microprocessor), and the error correction circuit, the signal processing unit, and the expansion bus intervening between the error correction circuit and the signal processing unit. Means for arbitrarily switching the connection between the signal lines or each signal line group.

Further, the extension module has a signal processing section and means interposed between the signal processing section and the extension bus for arbitrarily switching the connection between the signal line and the signal line group. It is also characterized in that

As described above, conventionally, when switching between the basic module and the expansion module, the selector is provided closer to the host side bus than the error correction circuit as shown in FIG. 3, and the selector switches the host side bus. , The module is switched so as to connect to either the basic module or the expansion module. On the other hand, in the present invention, the selector is interposed between the error correction circuit and the signal processing unit in the basic module, and the selector provides a predetermined distance between the error correction circuit, the signal processing unit and the expansion bus. The switching operation is performed for each signal line or each signal line group so that they are connected in combination. For example, the signal line group of the expansion bus is formed corresponding to each signal line group of the basic module (for example, the same signal line group as the number of basic modules is formed), and the selector of a certain basic module is When the connection between the host side bus and the expansion bus side is selected, the signal group related to the selection of the expansion bus can exchange signals with the host side bus via the error correction circuit of the basic module. ..

On the other hand, the expansion module is connected to a predetermined signal group of the expansion bus, so that the expansion module is connected to any of the signal line groups of the expansion bus. In this case, the expansion module can be connected to a specific signal line group, but normally a selector is provided in the expansion module so that an arbitrary signal line can be selected from a plurality of expansion bus signal line groups. Constitute. It is arbitrary as to which signal line group of the expansion bus can be switched by the selector provided in this expansion module. For example, there are 10 signal line groups of the expansion bus, and two expansion modules can be connected to the expansion bus. (If the expansion module has two sockets on the expansion bus)
Expansion module can be arbitrarily and selectively connected to one of the signal groups of the 1st to 5th expansion buses, and the second expansion module can be connected to one of the signal groups of the 6th to 10th expansion buses. It is also possible to connect to.

By configuring the selectors of the basic module and the expansion module as described above, the expansion module exchanges signals with the host side via the expansion bus, the selector of the predetermined basic module, and the error compensation circuit. This can be done (in this case, the selector of the basic module selects the connection between the error correction circuit and the expansion bus side). Here, since the expansion module can use the error correction circuit of the basic module, the expansion module does not need its own error correction circuit. The signal processing unit of the basic module can also exchange signals with an arbitrary expansion module via the expansion bus (in this case, the selector of the basic module connects the signal processing unit and the expansion bus). Is selected).

In the above connection, when the selector of the basic module selects the connection between the error correction circuit or the signal processing section and the expansion bus, the secreter is connected to a specific signal line group of the expansion bus. The selector of the basic module may be configured such that the selector selects an arbitrary signal line group from the plurality of signal line groups of the expansion bus. In this case, the selectors of the two basic modules select the connection between the respective signal processing units and the same signal line group of the expansion bus,
It is also possible for the signal processing units of these basic modules to exchange signals.

The expansion bus of the present invention is usually patterned on a circuit board on which the basic module and the expansion module are mounted. The length of the expansion bus is sufficiently shorter than the distance from each module to the test object,
No error correction circuit is provided in the expansion module. Also, the above-mentioned basic modules via the expansion bus,
Alternatively, even when signals are exchanged between the basic module and the extension module, it is not necessary to correct the error based on the signal line length because the extension bus is short.

Normally, the correction parameter of the error correction circuit is selected when the selector makes a selection such that the host side bus and the signal processing section of the basic module are connected and when the selector makes the host side bus. And when selecting so that the signal processing unit of the expansion module is connected,
Different parameter values can be set. further,
Whether or not an expansion module is added,
There is no change in the signal path of the selector of the basic module (in the past, as already mentioned, the signal path is changed by inserting the selector), so even if an expansion module is added (or added Even if the expansion module is removed), it is not necessary to change the error correction circuit or to perform processing such as correction calculation on the measurement data. In the present invention, it is needless to say that not all of the basic modules mounted on the test / measurement device need to have the above configuration, and only some of the modules may form the module structure.

The outline of the operation of the present invention will be described below. First, when the expansion module is added and the measurement is performed, the expansion module is installed in the slot provided in the expansion bus. Then, the selector of the basic module which is not used in the measurement is switched to the expansion bus side by the signal from the host side bus. As a result, the signal line or signal line group of the host side bus is connected to the predetermined signal line or signal line group of the expansion bus via the error correction circuit and the selector. The signal processing unit of the expansion module is connected to the signal line or the signal line group of the expansion bus. Here, the selector of the extension module is
The same signal line or signal line group as the predetermined signal line or signal line group of the expansion bus selected by the selector of the basic module is selected. As a result, the expansion module can exchange signals with the host-side bus via the expansion bus, the selector of the basic module, and the error correction circuit. Further, for example, two basic modules can exchange signals between the two modules by selecting a common signal line or signal line group of the expansion bus.

[0016]

1 is an explanatory diagram showing an embodiment in which the module structure of the present invention is applied to a tester for a digital or analog IC. In the figure, the basic modules bm _k (k = 0, 1, 2, ...) Respectively include an error correction circuit 11, a selector 12, and a signal processing section (in the figure, a signal analysis / generation circuit 13). These basic modules bm _k are mounted in a socket provided on a circuit board (backplane) (not shown). The error correction circuit 11 shown in the figure corrects the time error mainly due to the difference in the length of the signal line.

In FIG. 1, each n-bit signal line group lin of the host side (also the side under test) bus
_k (k = 0, 1, 2, ...) is the basic module bm
It is connected to each _k error correction circuit 11. Where k
= 0,1,2, a, ..., each lin _k is composed from the n signal lines. Note that n is not necessarily the same in each line group, but here, for convenience of explanation, the same reference numeral “n” is used. In addition, the error correction circuit 11
The selector 12 is interposed between the signal analysis / generation circuit 13 and the signal. The selector 12 is connected to the expansion bus expbus formed on the circuit board, the error correction circuit 12, an arbitrary connection between the signal analyzing / generating circuit 13 and the expansion bus expbus each other signal line groups lin _k units You can switch. Further, in this embodiment, Expbus is formed by a set of signal line group corresponding to each signal line group lin _k.

In FIG. 1, this extension module em
₀ and em ₁ are a signal processing unit (indicated by a signal analysis / generation circuit 14 in the figure), a signal analysis / generation circuit 14, exp.
Each of the n'bit signal line groups (n 'is not necessarily the same) from the expansion bus expbus and the expansion bus signal line group blin _m (m = 0, 1). , 2, ...)
Are connected to the signal analysis / generation circuit 14. Here, each blin _m constitutes a signal line group consisting of n ′ signal lines. The selector 15 is for signal analysis /
The connection between the generation circuit 14 and the expansion bus expbus can be arbitrarily switched for each signal line group blin _m . As the selectors 12 and 15, matrix selectors,
Various switching means such as multiplexers and switch elements can be used.

FIG. 2 is a partial circuit diagram of a module portion of an IC test apparatus using the module structure with extended function of FIG. In the figure, basic modules bm ₀ , bm ₁ ,
... (only bm ₁ and bm ₂ are shown) are connected to the expbus-side terminal group of each selector 12 to the expbus signal line groups blin ₀ , blin ₁ ,. On the other hand, the extension modules em ₀ , em ₁ , ... (b
Each of the selectors 15 provided in m ₀ and bm ₁ only) has a group of expbus signal lines blin ₀ and bl.
It is connected so that in ₁ ... Can be selected. Signal analysis that is not used in a test under test
The basic modules having the generating circuit 13 are bm ₁ and bm
_Assume that it is ₂ . Here, the extension modules em ₀ and em
₁ is used, selectors 15 of bm ₁ and bm ₂ are used.
Is a signal line group blin ₁ of the expansion bus expbus,
Select each connection to blin ₂ . In contrast,
The selector 15 of em ₀ selects blin ₁ and the selector 15 of em ₁ selects blin ₂ . By doing this, em
₀ and em ₁ can exchange signals with the host side (DUT side) bus via the selectors 12 of bm ₁ and bm ₂ and the error correction circuit 11. Moreover, extension em0, the selectors 15 of the em ₁ is, exp
Bus signal line group blin ₀ , blin ₁ , ...
Since an appropriate line group can be selected from among the above, the signal analysis / generation circuit 1 which is not used depending on the type of test and the like.
Signals can be exchanged with the host-side bus by using the error correction circuit 11 of the basic modules bm ₀ , bm ₁ , ...

[0020]

Since the present invention is constructed as described above,
The following effects can be achieved. (1) There is no need to perform work such as cutting cables, installing connectors, and installing sockets for expansion modules when adding, and simply install expansion modules into empty slots for expansion boards that are pre-installed on the backplane or the like. Since the mounting can be completed with just this, the operating efficiency of the test / measurement device will be greatly improved compared to the past. (2) Further, since the expansion bus need only be patterned on the backplane or the like, there is no inconvenience that the component cost and the construction cost are high unlike the conventional case. (3) Since the expansion module uses the error correction circuit provided in the basic module, the expansion module can be a simple circuit. (4) Even if an expansion module is added, a new selector or the like does not intervene in the signal path (that is, the basic module has a selector from the beginning). It is possible to avoid the conventional inconvenience that the signal path input to and output from the signal processing unit is changed and it takes a long time to correct the data. (5) Signal exchange between the basic and expansion modules
This can be done via the expansion bus instead of via the host side bus.

[Brief description of drawings]

FIG. 1 is an explanatory diagram showing an example of a module structure of the present invention.

FIG. 2 is an explanatory diagram for explaining the operation of the module structure shown in FIG.

FIG. 3 is an explanatory diagram showing a conventional module structure.

[Explanation of symbols]

bm ₀ , bm ₁ , ... Basic module em ₀ , em ₁ , ... Expansion module hstbus Host side bus expbus Expansion bus 11 Error correction circuit 12, 15 Selector 13, 14 Signal analysis / generation circuit

Claims (2)

[Claims] 1. A module structure comprising at least one basic module connected to a host-side bus and at least one expansion module connected to an expansion bus provided separately from the host-side bus. The basic module is interposed between an error correction circuit connected to the host-side bus, a signal processing unit, the error correction circuit and the signal processing unit, and is provided between the error correction circuit, the signal processing unit and the expansion bus. And a means for arbitrarily switching the connection of each of the signal lines or each of the signal line groups, and a module structure with an expanded function of an electric component test / measurement apparatus. 2. The expansion module has a signal processing unit, and a unit interposed between the signal processing unit and the expansion bus for arbitrarily switching connection between the two for each signal line or each signal line group. The module structure with an expanded function for an electric component test / measurement apparatus according to claim 1, wherein: