JPH05167650A - Osi conformance test system - Google Patents

Abstract

PURPOSE:To attain the embedding test independently of a profile of an application layer. CONSTITUTION:The OSI conformance test system implementing an embedding test to a mounted device to be tested in which a function up to an application layer is loaded is provided with an application layer test scenario storage section 102 storing a test scenario of an application layer protocol processing, a test scenario input section 104 receiving an embedded layer test scenario, and also with an embedded layer test scenario storage section 107 storing the received embedded layer test scenario, with a state transition table processing section 106 reflecting the stored embedded layer test scenario onto a protocol state transition table, and with an embedded layer protocol processing section 105 processing the protocol according to the stored test scenario and the reflected state transition table.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION The present invention relates to a device under test (IUT, Implementa) including an application layer.
OSI conformance test system for performing a buried layer test on a device under test.

[0002]

2. Description of the Related Art In a conventional OSI conformance test system, when an embedded layer test is carried out, a test scenario is developed for each test object corresponding to the profile of the application layer.

[0003]

SUMMARY OF THE INVENTION The conventional OSI described above.
The conformance test system has a drawback that a new test scenario has to be developed to test the same lower layer protocol each time a new application layer profile is added.

An object of the present invention is to provide an OSI conformance test system capable of performing a buried layer test independent of the profile of the application layer.

[0005]

The OSI conformance test system of the present invention is a test scenario of application layer protocol processing in an OSI conformance test system for performing an embedded layer test on a mounting under test mounted up to an application layer. , An application layer test scenario storage unit that stores the embedded layer test scenario, a test scenario input unit that inputs the embedded layer test scenario, an embedded layer test scenario storage unit that stores the input embedded layer test scenario, and the stored embedded A state transition table processing unit that reflects a layer test scenario in a protocol state transition table, and an embedded layer protocol processing unit that performs a protocol operation according to the stored test scenario and the reflected state transition table. And

[0006]

Function: The common test scenario is created and stored independently of the profile of the upper application layer.
Therefore, the protocol state transition table that reflects the test scenario and the protocol processing unit that operates according to the state transition table operate independently of the profile of the upper application layer.

[0007]

Embodiments of the present invention will now be described with reference to the drawings.

FIG. 1 is an overall configuration diagram of an embodiment of the present invention, and FIG. 2 is a diagram showing a correspondence relationship between a test scenario and a state transition table in this embodiment.

In this embodiment, an application layer test scenario storage unit 102 for storing a test scenario for an application layer protocol process, and an application layer protocol process 101 for reading and executing a test scenario stored in the application layer test scenario storage unit 102. A test scenario input interface unit 108 that captures an embedded layer test scenario from the outside, an embedded layer test scenario storage unit 107 that stores the captured embedded layer test scenario, and a test scenario input unit 104.
An embedded tester processing unit 103 having an embedded layer protocol processing unit 105 and a state transition table processing unit 106, a test log 109 for logging a service protocol issued when the protocol processing is executed, and an event of a lower layer. It comprises a lower layer protocol processing unit for receiving.

Next, the operation of this embodiment will be described.

In carrying out the embedded layer test, the application protocol processing section 101 reads a test scenario as an application layer from the application layer test scenario storage section 102 and executes it. The application layer protocol processing unit 101 executes the protocol processing and issues a service primitive to the embedded layer tester processing unit 103. Buried layer tester processing unit 103
Stores an embedded layer test scenario from the test scenario input interface unit 108 in advance, and stores the embedded layer test scenario in the embedded layer test scenario storage unit in the test scenario input unit 104. The state transition table processing unit 106 associates the test scenario information input from the embedded layer test scenario storage unit 107 with the state transition table of the embedded layer, and stores the fact in the state transition table when abnormal processing is included. To do.

Application layer protocol processing unit 10
The embedded layer protocol processing unit 105, to which the service primitive is issued by No. 1, obtains the relation information between the state transition table and the test scenario from the state transition processing unit 106, executes the protocol operation according to the information, and the lower layer A service primitive is issued to the protocol processing unit 110. At this time, the service primitive issued to the test log 109 is logged.

As shown in FIG. 2, the state transition processing unit 106 is based on the time transition 202 on the tester side in the test scenario 201 indicating that a round trip is made between the time transition 202 on the tester side and the time transition 203 on the IUT side. , Test scenario information is set in the corresponding matrix intersections in the state transition table, and the difference information (setting of abnormal parameters, ignoring service primitives, etc.) of the original protocol processing capital is set to the embedded layer protocol processing unit 105. provide.

The embedded layer protocol processing section 105 performs embedded layer tester processing according to the information. Similarly for the event received from the lower layer protocol processing unit 110,
The embedded tester process is executed based on the difference information from the state transition table processing unit 106.

[0015]

As described above, according to the present invention, the embedded layer test that does not depend on the profile of the application layer can reduce the burden on the tester and improve the efficiency of the test. .

[Brief description of drawings]

FIG. 1 is an overall configuration diagram of an embodiment of the present invention.

FIG. 2 is a diagram showing a correspondence relationship between a test scenario and a state transition table in this embodiment.

[Explanation of symbols]

 101 Application Layer Protocol Processing Unit 102 Application Layer Test Scenario Storage Unit 103 Embedded Tester Processing Unit 104 Test Scenario Input Unit 105 Embedded Layer Protocol Processing Unit 106 State Transition Processing Unit 107 Embedded Layer Test Scenario Storage Unit 108 Test Scenario Input Interface Unit 109 Test log 110 Lower layer protocol processing unit 201 Test scenario 202 Time transition on tester side 203 Time transition on IUT side 220 State transition table

Claims (1)

[Claims] 1. An OSI conformance test system for performing an embedded layer test on an implementation under test mounted up to an application layer, an application layer test scenario storage unit for storing a test scenario of an application layer protocol process, and an embedded layer. A test scenario input section for inputting a test scenario, an embedded layer test scenario storage section for storing the input embedded layer test scenario, and a state transition for reflecting the stored embedded layer test scenario in the state transition table of the protocol An OSI conformance test system, comprising: a table processing unit; and an embedded layer protocol processing unit that performs a protocol operation according to the stored test scenario and the reflected state transition table.