JPH05148627A - Sputtering apparatus - Google Patents

Sputtering apparatus

Info

Publication number
JPH05148627A
JPH05148627A JP31455491A JP31455491A JPH05148627A JP H05148627 A JPH05148627 A JP H05148627A JP 31455491 A JP31455491 A JP 31455491A JP 31455491 A JP31455491 A JP 31455491A JP H05148627 A JPH05148627 A JP H05148627A
Authority
JP
Japan
Prior art keywords
cathode
sputtering
gas
vacuum chamber
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31455491A
Other languages
Japanese (ja)
Inventor
Osamu Takahashi
理 高橋
Kazuhiko Hamashima
一彦 浜島
Toru Ii
亨 伊井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Shinku Co Ltd
Original Assignee
Showa Shinku Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Shinku Co Ltd filed Critical Showa Shinku Co Ltd
Priority to JP31455491A priority Critical patent/JPH05148627A/en
Publication of JPH05148627A publication Critical patent/JPH05148627A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To provide a sputtering apparatus free from the need of consideration to the positional relationship between a sputtering cathode and a gas introducing port of a sputtering apparatus and easily capable of designing, manufacturing and maintaining the apparatus. CONSTITUTION:In an apparatus in which a vacuum chamber 1 is provided with a gas introducing port 8 for introducing a gas into its inside and a sputtering cathode 6 fitted with a target 5 opposite to a substrate in the relevant vacuum chamber, the sputtering cathode 6 is provided with the gas introducing port 8. In this way, the consideration to the relative positional relationship between the gas introducing port 8 and the cathode 6 for making the film thickness distribution and film quality certain is made needless, the designing and manufacturing of the apparatus are made easy, its readjustment after maintenance and inspection is also made needless and its treatment is made easy.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、基板に薄膜を形成する
スパッタリング装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering apparatus for forming a thin film on a substrate.

【0002】[0002]

【従来の技術】従来のスパッタリング装置は、例えば図
1に示すように、真空排気口aを備えた真空室b内に、
基板cを取付けた基板電極dと、該基板cに対向するタ
ーゲットeを取付けたスパッタリングカソードfを設
け、該基板cとスパッタリングカソードfとの間の空間
の側方にスパッタガスや反応ガスを導入するためのガス
導入口gを設けた構成を備え、該カソードfには、例え
ば図2のように、冷却媒体が循環する空間hとカソード
本体がスパッタされることを防止するためのシールドi
が設けられる。jはカソードfへ直流或いは高周波電力
を供給するスパッタ電源を示す。
2. Description of the Related Art A conventional sputtering apparatus, for example, as shown in FIG. 1, has a vacuum chamber b provided with a vacuum exhaust port a.
A substrate electrode d to which the substrate c is attached and a sputtering cathode f to which a target e facing the substrate c is attached are provided, and a sputtering gas or a reaction gas is introduced to the side of the space between the substrate c and the sputtering cathode f. The cathode f is provided with a gas inlet g for preventing the space h in which the cooling medium circulates and the shield i for preventing the cathode body from being sputtered, as shown in FIG.
Is provided. Reference numeral j denotes a sputtering power source for supplying direct current or high frequency power to the cathode f.

【0003】スパッタリング作動は、該真空室b内を1
- 3〜10- 7Torrの高真空に排気したのち真空室
bの室壁に設けたガス導入口gからArなどの不活性ガ
スを導入し、スパッタ電源jからカソードfへ電力を供
給することにより行なわれ、該ターゲットeの近傍のグ
ロー放電で発生する陽イオンがスパッタしたターゲット
eの材料が薄膜状に基板cに堆積する。
In the sputtering operation, the inside of the vacuum chamber b is set to 1
0 - 3 ~10 - 7 Torr for introducing an inert gas such as Ar from the gas inlet g provided in the chamber wall of the vacuum chamber b After evacuated to a high vacuum, supplies power from the sputtering power source j to the cathode f Then, the material of the target e sputtered with cations generated by glow discharge near the target e is deposited in a thin film on the substrate c.

【0004】[0004]

【発明が解決しようとする課題】上記のように、従来の
スパッタリング装置は、スパッタリングカソードfとガ
ス導入口gとが全く別個の箇所に設けられているため、
装置の設計・製作に於いては、導入されたガスがターゲ
ットeの前方になるべく均一に分布するようにカソード
fと導入口gの位置関係を考慮しなければならず、この
考慮に欠けると基板cに形成される膜厚の分布状態が悪
くなり、化合物薄膜を形成する場合には膜質が均一にな
らなくなる不都合があった。また、カソード及びガス導
入口を保守点検のために解体した場合、両者の位置関係
を微細に再調整する必要があり、保守点検が煩わしかっ
た。
As described above, in the conventional sputtering apparatus, since the sputtering cathode f and the gas introduction port g are provided at completely different places,
In designing and manufacturing the apparatus, the positional relationship between the cathode f and the inlet g must be taken into consideration so that the introduced gas is distributed as evenly as possible in front of the target e. The distribution of the film thickness formed in c deteriorates, and when forming a compound thin film, the film quality is not uniform. Further, when the cathode and the gas inlet are disassembled for maintenance and inspection, it is necessary to readjust the positional relationship between them, which makes maintenance and inspection troublesome.

【0005】本発明は、カソードとガス導入口の位置関
係に対する考慮が不要で装置の設計・製作及び保守の容
易なスパッタリング装置を提供することを目的とするも
のである。
It is an object of the present invention to provide a sputtering apparatus that does not require consideration of the positional relationship between the cathode and the gas inlet and is easy to design, manufacture and maintain.

【0006】[0006]

【課題を解決するための手段】本発明では、真空室に、
その内部へガスを導入するガス導入口と、該真空室内の
基板に対向するターゲットを取付けたスパッタリングカ
ソードとを設けるようにしたものに於いて、該ガス導入
口を該スパッタリングカソードに設けることにより、上
記の目的を達成するようにした。
In the present invention, a vacuum chamber is provided with
A gas inlet for introducing gas into the inside thereof, and a sputtering cathode having a target facing the substrate in the vacuum chamber are provided, and by providing the gas inlet in the sputtering cathode, The above-mentioned purpose is achieved.

【0007】[0007]

【作用】該真空室内を10- 3〜10- 7Torrの高真
空に排気したのちスパッタリングカソードに設けたガス
導入口からArなどの不活性ガスを導入し、スパッタ電
源からカソードへ電力を供給して基板に成膜を施すこと
は従来の装置と特に異ならないが、本発明の装置ではカ
ソードにガス導入口を設けるようにしたので、カソード
とガス導入口の相対的位置関係が一定になり、真空室の
規模や内部構造が変わっても常に一定量のガスをターゲ
ットの前面へ流せ、その位置関係に考慮が要らず専用の
ガス導入口を設ける必要がないので設計・製作が容易に
なる。また、カソードやガス導入口を保守のために解体
しても両者の位置関係は一定しており、再調整の必要も
ない。
[Action] The vacuum chamber 10 - 3 ~10 - 7 Torr for introducing an inert gas such as Ar from the gas inlet port formed in a sputtering cathode After evacuated to a high vacuum, the power supply from the sputtering power source to the cathode Although the film formation on the substrate is not particularly different from the conventional apparatus, since the apparatus of the present invention is provided with the gas inlet port in the cathode, the relative positional relationship between the cathode and the gas inlet becomes constant, Even if the scale or internal structure of the vacuum chamber changes, a certain amount of gas can always flow to the front surface of the target, and there is no need to consider the positional relationship and there is no need to provide a dedicated gas inlet, which facilitates design and manufacturing. Further, even if the cathode and the gas inlet are dismantled for maintenance, the positional relationship between the two is constant and there is no need for readjustment.

【0008】[0008]

【実施例】本発明の実施例を図面に基づき説明すると、
図3に於いて、符号1は真空排気口2を備えた真空室を
示し、該真空室1内には基板3を取付けた基板電極4が
アースして設けられ、該基板3に対向する位置にターゲ
ット5を取付けたスパッタリングカソード6が設けられ
る。7は該カソード6に直流或いは高周波電力を供給す
るスパッタ電源である。こうした構成は従来のスパッタ
リング装置と特に変わりがないが、本発明に於いてはス
パッタガスや反応性ガスを導入するガス導入口8を該カ
ソード6に一体に設け、真空室1の大きさやその内部に
シャッターや搬送手段等が設けられて内部構造が変わる
ことがあっても、カソード6とガス導入口8との相対的
位置関係が一定に得られるようにした。該カソード6の
詳細な一例は図4に示す如くであり、カソード6の内部
に磁石9と冷却媒体が流通する空間10を設け、ターゲ
ット5の周囲にカソード6の本体がスパッタされること
を防止するシールド11を設けるようにし、ガス導入口
8は該カソード6の周辺部を貫通してターゲット5の前
面に図5に示すように沿わせたガスを供給する配管12
を設け、その側部に多数の孔を形成してガス導入口8に
構成した。この実施例の場合のスパッタリング作動は従
来のものと同様であり、真空室1内を10- 3〜10- 7
Torrの高真空に排気したのち該カソード6に設けた
ガス導入口5からArなどの不活性ガスを導入し、もし
必要ならば反応性ガスを該不活性ガスに混入して導入
し、スパッタ電源7からカソード6へ電力を供給すると
基板3にターゲット5の材料から成る膜が形成される。
本発明に於いては、ガス導入口3がカソード6に設けた
ので、両者の位置関係は一定になり、真空室の容積が大
小してもまた内部にシャッターや基板搬送装置などの各
種の機構が設けられても構造等に左右されることなく一
定量のガスをターゲット6の前面へ流せて膜厚分布や膜
質に変化を来すことがなく、両者をを保守のために解体
しても位置関係は一定で再調整の必要がなく、解体の前
後で変わりなく一定の成膜を行なえる。
Embodiments of the present invention will be described with reference to the drawings.
In FIG. 3, reference numeral 1 denotes a vacuum chamber provided with a vacuum exhaust port 2. In the vacuum chamber 1, a substrate electrode 4 having a substrate 3 attached thereto is grounded, and a position facing the substrate 3 is provided. A sputtering cathode 6 having a target 5 attached thereto is provided. A sputtering power source 7 supplies DC or high frequency power to the cathode 6. Although such a structure is not particularly different from that of the conventional sputtering apparatus, in the present invention, the gas inlet 8 for introducing the sputtering gas or the reactive gas is provided integrally with the cathode 6, and the size of the vacuum chamber 1 and the inside thereof are provided. Even if the internal structure is changed due to the provision of a shutter, a conveying means, etc., the relative positional relationship between the cathode 6 and the gas introduction port 8 can be kept constant. A detailed example of the cathode 6 is as shown in FIG. 4, and a space in which the magnet 9 and the cooling medium flow is provided inside the cathode 6 to prevent the main body of the cathode 6 from being sputtered around the target 5. A pipe 12 for supplying a gas is provided so that the gas introduction port 8 penetrates the peripheral portion of the cathode 6 and runs along the front surface of the target 5 as shown in FIG.
Is provided, and a large number of holes are formed on the side thereof to form the gas introduction port 8. Sputtering working in the case of this embodiment is similar to that of the prior art, the vacuum chamber 1 10 - 3-10 - 7
After evacuating to a high vacuum of Torr, an inert gas such as Ar is introduced from the gas introduction port 5 provided in the cathode 6, and if necessary, a reactive gas is mixed with the inert gas and introduced. When power is supplied from 7 to the cathode 6, a film made of the material of the target 5 is formed on the substrate 3.
In the present invention, since the gas inlet 3 is provided in the cathode 6, the positional relationship between the two is constant, and even if the volume of the vacuum chamber is large or small, various mechanisms such as a shutter and a substrate transfer device are provided inside. Even if the above is provided, a certain amount of gas is allowed to flow to the front surface of the target 6 without being affected by the structure and the like, and the film thickness distribution and film quality are not changed, and even if both are disassembled for maintenance. The positional relationship is constant, there is no need to readjust, and constant film formation can be performed before and after disassembly.

【0009】[0009]

【発明の効果】以上のように本発明では、スパッタリン
グ装置の真空室に設けられるガス導入口をスパッタリン
グカソードと一体に設けたので、膜厚分布や膜質を一定
にするための該ガス導入口と該カソードの相対的位置関
係の考慮が不要で装置の設計・製作が容易になり、保守
点検後の再調整も不要になって取扱いが容易になる等の
効果がある。
As described above, according to the present invention, since the gas inlet provided in the vacuum chamber of the sputtering apparatus is provided integrally with the sputtering cathode, the gas inlet for keeping the film thickness distribution and film quality constant is provided. Since there is no need to consider the relative positional relationship of the cathodes, the device can be easily designed and manufactured, and readjustment after maintenance and inspection is also unnecessary, which is advantageous in handling.

【図面の簡単な説明】[Brief description of drawings]

【図1】 従来例の截断側面図FIG. 1 is a cutaway side view of a conventional example.

【図2】 従来のスパッタリングカソードの截断側面図FIG. 2 is a cutaway side view of a conventional sputtering cathode.

【図3】 本発明の実施例の截断側面図FIG. 3 is a cutaway side view of an embodiment of the present invention.

【図4】 図3の要部の拡大断面図FIG. 4 is an enlarged cross-sectional view of the main part of FIG.

【図5】 図4の截断平面図5 is a cutaway plan view of FIG.

【符号の説明】[Explanation of symbols]

1 真空室 3 基板 4
基板電極 5 ターゲット 6 スパッタリングカソード 8 ガス導入口 12 配管
1 Vacuum chamber 3 Substrate 4
Substrate electrode 5 Target 6 Sputtering cathode 8 Gas inlet 12 Pipe

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 真空室に、その内部へガスを導入するガ
ス導入口と、該真空室内の基板に対向するターゲットを
取付けたスパッタリングカソードとを設けるようにした
ものに於いて、該ガス導入口を該スパッタリングカソー
ドに設けたことを特徴とするスパッタリング装置。
1. A gas chamber having a gas inlet for introducing gas into the vacuum chamber and a sputtering cathode having a target facing a substrate in the vacuum chamber. A sputtering apparatus comprising: a sputtering cathode.
【請求項2】 上記ガス導入口は、上記スパッタリング
カソードの周辺部を貫通してターゲットの前面へガスを
供給する配管で構成したことを特徴とする請求項1に記
載のスパッタリング装置。
2. The sputtering apparatus according to claim 1, wherein the gas inlet is constituted by a pipe that penetrates a peripheral portion of the sputtering cathode and supplies gas to the front surface of the target.
JP31455491A 1991-11-28 1991-11-28 Sputtering apparatus Pending JPH05148627A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31455491A JPH05148627A (en) 1991-11-28 1991-11-28 Sputtering apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31455491A JPH05148627A (en) 1991-11-28 1991-11-28 Sputtering apparatus

Publications (1)

Publication Number Publication Date
JPH05148627A true JPH05148627A (en) 1993-06-15

Family

ID=18054687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31455491A Pending JPH05148627A (en) 1991-11-28 1991-11-28 Sputtering apparatus

Country Status (1)

Country Link
JP (1) JPH05148627A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100602838B1 (en) * 1998-07-31 2006-07-19 어플라이드 필름스 게엠베하 운트 컴퍼니 카게 Device for coating panel-shaped substrates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100602838B1 (en) * 1998-07-31 2006-07-19 어플라이드 필름스 게엠베하 운트 컴퍼니 카게 Device for coating panel-shaped substrates

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