JPH05133978A - Probe pin for electrically inspecting printed wiring board - Google Patents

Probe pin for electrically inspecting printed wiring board

Info

Publication number
JPH05133978A
JPH05133978A JP29696691A JP29696691A JPH05133978A JP H05133978 A JPH05133978 A JP H05133978A JP 29696691 A JP29696691 A JP 29696691A JP 29696691 A JP29696691 A JP 29696691A JP H05133978 A JPH05133978 A JP H05133978A
Authority
JP
Japan
Prior art keywords
hole
wiring board
printed wiring
probe pin
solder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP29696691A
Other languages
Japanese (ja)
Inventor
Kiyotaka Sugimoto
清孝 杉本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP29696691A priority Critical patent/JPH05133978A/en
Publication of JPH05133978A publication Critical patent/JPH05133978A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To surely detect a disconnecting fault in the through hole of a printed wiring board even when the through hole gets clogged with solder at the time of performing electrical inspection on the wiring board for checking the continuity, propriety of insulation, etc., of the circuit pattern of the printed wiring board. CONSTITUTION:Only the front end section of a probe pin 10 to be brought into contact with the through holes, etc., of printed wiring boards is selectively coated with a hard insulator 10b. At the time of inspecting a through hole which gets clogged with solder, the insulator at the front end of the pin 1 is brought into contact with the solder clogging the hole so as to produce insufficient continuity.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント配線板の電気
的検査用プローブピンに係り、特にプリント配線板の回
路パターンの導通の検査、または絶縁良否の判定を行う
ために、検査用測定子として表面実装用パッドやスルー
ホールなどに接触させるプローブピンに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe pin for electrical inspection of a printed wiring board, and more particularly to an inspection probe for inspecting the continuity of a circuit pattern of the printed wiring board or judging the quality of insulation. As for the probe pin to be brought into contact with the surface mounting pad or through hole.

【0002】[0002]

【従来の技術】近年、機器の高機能化や小型化および低
コスト化などの要請に応じて、フラットパッケージタイ
プ、あるいはチップタイプなどの電子部品を、プリント
配線板の主面に搭載し、その主面に形成されている導体
パターンの所定のパッドに接続する表面実装方式が行わ
れている。
2. Description of the Related Art In recent years, electronic parts such as flat package type or chip type have been mounted on the main surface of a printed wiring board in response to demands for higher performance, smaller size and lower cost of equipment. A surface mounting method is used in which the conductor pattern is connected to a predetermined pad of a conductor pattern formed on the main surface.

【0003】上記した表面実装用のプリント配線板の電
気的検査は、一般に次のように行われている。すなわ
ち、たとえば図5に側面的に示すように、導電性金属に
てほぼ円錐形状に形成されたプローブピン1を使用し、
これをプリント配線板の所要の表面実装用パッドに当て
る。また、図6に断面的に示すように、2本のプローブ
ピン1を、プリント配線板2の層間導通用または部品実
装用などのスルーホール3内にそれぞれ両側から挿入
し、各プローブピン1の外周面をそれぞれスルーホール
3内壁面の導体層4に接触させる。そして、これらのプ
ローブピン1の間に適当な電圧を印加することによっ
て、パッドおよびスルーホール3ごとの導通の有無を検
査し、回路の導通検査および絶縁の良否判定を行ってい
る。
The electrical inspection of the above-mentioned printed wiring board for surface mounting is generally performed as follows. That is, for example, as shown in a side view in FIG. 5, using a probe pin 1 formed of a conductive metal in a substantially conical shape,
This is applied to the required surface mounting pad of the printed wiring board. Further, as shown in a sectional view in FIG. 6, the two probe pins 1 are inserted into the through holes 3 of the printed wiring board 2 for interlayer conduction or component mounting from both sides, respectively, and The outer peripheral surface is brought into contact with the conductor layer 4 on the inner wall surface of the through hole 3, respectively. By applying an appropriate voltage between the probe pins 1, the pads and the through holes 3 are inspected for electrical continuity, and circuit continuity inspection and insulation pass / fail judgment are performed.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記プ
ローブピン1を用いた従来の検査方法では、図7に断面
的に示すように、スルーホール3内の導体層4に断線不
良が生じており、かつ孔内に半田5が詰まっている場合
には、孔詰まりした半田5によってプローブピン1間の
導通が図れるため、断線不良の検出が不可能であった。
However, in the conventional inspection method using the probe pin 1, the conductor layer 4 in the through hole 3 has a disconnection defect as shown in a sectional view in FIG. In addition, when the solder 5 is clogged in the hole, conduction between the probe pins 1 can be achieved by the clogged solder 5, so that it is impossible to detect a disconnection defect.

【0005】また、プリント配線板2の製造の際には、
最終加工工程の一つであるソルダーコーティング後、部
品実装用などのスルーホール3の半田5孔詰まりを、以
下に示すようなホールチェッカーにより検査し摘出排除
している。すなわち、図8に断面的に示すように、たと
えば蛍光灯6から発する光7が、スルーホール3内を通
過する光量を、たとえばCCDセンサー8により感知
し、孔数を計測検出するとともに、検出孔数の大小によ
り、孔明きの良否を判定するように構成されたホールチ
ェッカー9により、半田5孔詰まりの有無が検査されて
いる。しかし、このようなホールチェッカー9は、プリ
ント配線板2上に発生するプレス加工時の端面ばり、ご
みなどにより誤動作することがあるため、検査精度が必
ずしも高くなく、半田5孔詰まりのあるプリント配線板
2が摘出されずに電気的検査工程へ流入し、前記問題点
が生じる原因となっていた。
When manufacturing the printed wiring board 2,
After solder coating, which is one of the final processing steps, clogging of the solder 5 holes in the through holes 3 for mounting components is inspected and removed by a hole checker as described below. That is, as shown in a sectional view in FIG. 8, for example, the amount of light 7 emitted from the fluorescent lamp 6 that passes through the through hole 3 is sensed by, for example, the CCD sensor 8, and the number of holes is measured and detected. The presence or absence of clogging of the solder 5 holes is inspected by the hole checker 9 configured to judge the quality of the holes depending on the number of holes. However, such a hole checker 9 may malfunction due to an end face burr or dust generated on the printed wiring board 2 during press working. Therefore, the inspection accuracy is not always high, and the printed wiring with the clogging of the solder 5 holes is not necessarily required. The plate 2 was not extracted and flowed into the electrical inspection process, which was a cause of the above problems.

【0006】本発明はこのような問題を解決するために
なされたもので、プリント配線板の電気的検査におい
て、スルーホールの断線不良を確実に検出することがで
きるプローブピンの提供を目的とする。
The present invention has been made to solve such a problem, and an object of the present invention is to provide a probe pin capable of reliably detecting a disconnection defect of a through hole in an electrical inspection of a printed wiring board. ..

【0007】[0007]

【課題を解決するための手段】本発明に係るプリント配
線板の電気的検査用プローブピンは、プリント配線板の
主面に形成された表面実装用パッドあるいはスルーホー
ルに接触させて電気的な検査を行うためほぼ円錐状に形
成された導電性金属製プローブピンにおいて、前記プロ
ーブピン先端部を硬質の絶縁体により選択的に被覆した
ことを特徴とする。
A probe pin for electrical inspection of a printed wiring board according to the present invention is brought into contact with a surface mounting pad or a through hole formed on a main surface of the printed wiring board for electrical inspection. In order to perform the above, the conductive metal probe pin formed in a substantially conical shape is characterized in that the tip end portion of the probe pin is selectively covered with a hard insulator.

【0008】[0008]

【作用】本発明に係るプローブピンによれば、先端部の
表面が硬質の絶縁体により被覆されているので、これ
を、プリント配線板の表面実装用パッドあるいはスルー
ホールに接触させ電気的検査を行う測定子として使用し
た場合、半田孔詰まりしているスルーホールにおいて
は、先端部の絶縁体が孔内に詰まった半田に接触するた
め、プローブピン間の導通が検出されず不良と判定され
る。
According to the probe pin of the present invention, since the surface of the tip end portion is covered with a hard insulator, the probe pin is brought into contact with the surface mounting pad or through hole of the printed wiring board for electrical inspection. When used as a probe, in a through hole with a clogged solder hole, the insulator at the tip comes into contact with the solder clogged in the hole, so conduction between probe pins is not detected and it is determined to be defective. ..

【0009】このようにスルーホールに半田孔詰まりが
ある場合は、全て導通不良と判定され摘出されるので、
プリント配線板の孔内断線の不良を誤って見逃すことが
なく、半田詰まりのあるプリント配線板を確実に検出す
ることができる。
If the through holes are clogged with solder holes as described above, all of them are determined to be defective in conduction and are extracted.
It is possible to reliably detect a printed wiring board with solder clogging without erroneously overlooking a defect in the hole in the printed wiring board.

【0010】[0010]

【実施例】以下、図1〜図4を参照して本発明の実施例
を説明する。
Embodiments of the present invention will be described below with reference to FIGS.

【0011】図1は本発明に係る電気的検査用プローブ
ピンの一構造例を一部切欠して断面的に示したもので、
このプローブピン10は、銅などの導電金属にてほぼ円錐
状に形成された本体部10a と、この本体部10a の先端部
外周を被覆して設けられたテフロン(フッ素樹脂)など
の絶縁被覆層10b とから構成されている。
FIG. 1 is a partially cutaway sectional view showing an example of the structure of an electrical test probe pin according to the present invention.
The probe pin 10 includes a main body 10a formed of a conductive metal such as copper in a substantially conical shape, and an insulating coating layer such as Teflon (fluororesin) provided to cover the outer circumference of the tip of the main body 10a. It consists of 10b and.

【0012】このような構造のプローブピン10を使用
し、図2に断面的に示すようにプリント配線板2の電気
的検査を行う場合、スルホール3内導体層4の断線があ
り、かつ半田5孔詰まりを起こしたスルーホール3にお
いては、スルホール3内に詰まった半田5にプローブピ
ン10先端部のテフロンなどの絶縁被覆層10b が接触する
ため、電気的検査結果は導通不良、すなわち断線とな
る。
When the probe pin 10 having such a structure is used and the printed wiring board 2 is electrically inspected as shown in a sectional view in FIG. 2, there is a break in the conductor layer 4 in the through hole 3 and the solder 5 is present. In the through hole 3 in which the hole is clogged, the insulating coating layer 10b such as Teflon at the tip of the probe pin 10 comes into contact with the solder 5 that is clogged in the through hole 3, so that the electrical inspection result is poor continuity, that is, disconnection. ..

【0013】また図3に断面的に示すように、前記構成
のプローブピン10を、半田5孔詰まりおよびスルホール
内導電層4の断線も無い正常なスルーホール3に挿入し
た場合には、導電金属からなるピン本体部10a がスルー
ホール3内壁面の導体層4に接触するので、正常な導通
が検出される。
Further, as shown in a sectional view in FIG. 3, when the probe pin 10 having the above-mentioned structure is inserted into a normal through hole 3 in which the solder 5 hole is not clogged and the conductive layer 4 in the through hole is not broken, a conductive metal is used. Since the pin main body portion 10a made of (3) contacts the conductor layer 4 on the inner wall surface of the through hole 3, normal conduction is detected.

【0014】このように、本発明に係るプローブピン10
によれば、従来は検出が不可能であった半田5孔詰まり
がある場合のスルーホール3内断線を、容易にかつ確実
に検出することができる。また、プレス加工時に生じる
プリント配線板2の端面ばり、ごみなどにより、ホール
チェッカーに誤動作を生じ、これにより半田5孔詰まり
のあるプリント配線板2が電気的検査工程に混入したと
きも、孔詰まりを生じたスルーホールを確実に検出し不
良品として摘出排除することができる。
Thus, the probe pin 10 according to the present invention
According to this, it is possible to easily and surely detect the disconnection in the through hole 3 in the case where there is clogging of the solder 5 hole, which cannot be detected conventionally. Also, when the printed wiring board 2 is pressed at the end, the hole checker malfunctions due to dust or the like on the end surface of the printed wiring board 2. When the printed wiring board 2 having the solder 5 hole clogging is mixed in the electrical inspection process, the hole clogging occurs. It is possible to reliably detect the through hole in which the defect occurs and remove it as a defective product.

【0015】図4は本発明に係るプローブピンの他の構
成例を一部切欠して断面的に示したもので、導電金属に
てほぼ円錐状に形成された本体部10a の先端部に、硬質
ガラスからなる絶縁部10b が接着・埋め込まれた構造を
成している。しかして、前記構成例の場合と同様に、従
来検出不可能であった半田5孔詰まりがある場合のスル
ーホール3内断線も、確実に検出することができる。
FIG. 4 is a cross-sectional view showing another example of the structure of the probe pin according to the present invention with a part thereof cut away. At the tip of the main body 10a formed of conductive metal in a substantially conical shape, It has a structure in which an insulating portion 10b made of hard glass is bonded and embedded. Therefore, as in the case of the above-described configuration example, it is possible to reliably detect the disconnection in the through hole 3 when there is clogging of the solder 5 hole, which cannot be detected conventionally.

【0016】[0016]

【発明の効果】以上説明したように本発明の電気的検査
用プローブピンによれば、プリント配線板に半田孔詰ま
りがある場合でも、スルーホール内導体層の断線不良な
どを正確に検出し摘出排除することができる。また、半
田孔詰まりがあるプリント配線板が光学的チェック工程
で摘出されず電気的検査工程へ混入した場合にも、この
ような不具合を容易に検出し摘出することができる。
As described above, according to the probe pin for electrical inspection of the present invention, even when the printed wiring board has a clogging of the solder hole, the disconnection defect of the conductor layer in the through hole is accurately detected and extracted. Can be eliminated. In addition, even when a printed wiring board having a clogged solder hole is included in the electrical inspection process without being extracted in the optical check process, such a defect can be easily detected and extracted.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る電気的検査用プローブピンの一構
造例を示す一部切欠断面図。
FIG. 1 is a partially cutaway cross-sectional view showing a structural example of a probe pin for electrical inspection according to the present invention.

【図2】本発明に係る電気的検査用プローブピンを孔内
断線不良がありかつ半田孔詰まりとなっているプリント
配線板のスルーホールに接触させた状態を示す断面図。
FIG. 2 is a cross-sectional view showing a state in which the probe pin for electrical inspection according to the present invention is brought into contact with a through hole of a printed wiring board having a defective hole disconnection and a clogged solder hole.

【図3】本発明に係る電気的検査用プローブピンを正常
なプリント配線板のスルーホールに接触させた状態を示
す断面図。
FIG. 3 is a cross-sectional view showing a state in which the probe pin for electrical inspection according to the present invention is brought into contact with a through hole of a normal printed wiring board.

【図4】本発明に係る電気的検査用プローブピンの他の
構造例を示す一部切欠断面図。
FIG. 4 is a partially cutaway sectional view showing another structural example of the probe pin for electrical inspection according to the present invention.

【図5】従来の電気的検査用プローブピンの構造を示す
側面図。
FIG. 5 is a side view showing a structure of a conventional probe pin for electrical inspection.

【図6】従来のプローブピンを正常なプリント配線板の
スルーホールに接触させた状態を示す断面図。
FIG. 6 is a cross-sectional view showing a state in which a conventional probe pin is brought into contact with a through hole of a normal printed wiring board.

【図7】従来のプローブピンを孔内断線不良がありかつ
半田孔詰まりのあるプリント配線板のスルーホールに接
触させた状態を示す断面図。
FIG. 7 is a cross-sectional view showing a state in which a conventional probe pin is brought into contact with a through hole of a printed wiring board having a defective hole disconnection and a clogged solder hole.

【図8】プリンと配線板のホールチェッカーのハードウ
ェアの概略構成を示す側面図。
FIG. 8 is a side view showing a schematic configuration of hardware of a hole checker for a pudding and a wiring board.

【符号の説明】[Explanation of symbols]

1、10…プローブピン 2…プリント配線板 3…
スルホール 4…スルホール内壁面の導体層 5…
半田 6…蛍光灯 7…光 8…CCDセンサ
9…ホールチェッカー 10a …プローブピン本体部
10b …絶縁被覆層
1, 10 ... Probe pins 2 ... Printed wiring board 3 ...
Through hole 4 ... Conductor layer on inner wall surface of through hole 5 ...
Solder 6 ... Fluorescent lamp 7 ... Light 8 ... CCD sensor
9 ... Hole checker 10a ... Probe pin body
10b… Insulation coating layer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 プリント配線板の主面に形成された表面
実装用パッドあるいはスルーホールに接触させて電気的
な検査を行うためほぼ円錐状に形成された導電性金属製
プローブピンにおいて、 前記プローブピン先端部を硬質の絶縁体により選択的に
被覆したことを特徴とするプリント配線板の電気的検査
用プローブピン。
1. A conductive metal probe pin formed in a substantially conical shape for contacting a surface mounting pad or a through hole formed on a main surface of a printed wiring board to perform an electrical inspection. A probe pin for electrical inspection of a printed wiring board, characterized in that the tip of the pin is selectively covered with a hard insulator.
JP29696691A 1991-11-13 1991-11-13 Probe pin for electrically inspecting printed wiring board Withdrawn JPH05133978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29696691A JPH05133978A (en) 1991-11-13 1991-11-13 Probe pin for electrically inspecting printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29696691A JPH05133978A (en) 1991-11-13 1991-11-13 Probe pin for electrically inspecting printed wiring board

Publications (1)

Publication Number Publication Date
JPH05133978A true JPH05133978A (en) 1993-05-28

Family

ID=17840508

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29696691A Withdrawn JPH05133978A (en) 1991-11-13 1991-11-13 Probe pin for electrically inspecting printed wiring board

Country Status (1)

Country Link
JP (1) JPH05133978A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050123309A (en) * 2004-06-24 2005-12-29 주식회사 새한마이크로텍 Probe pin for examining semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050123309A (en) * 2004-06-24 2005-12-29 주식회사 새한마이크로텍 Probe pin for examining semiconductor device

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Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990204