JPH05121389A - Solvent cleaning device - Google Patents

Solvent cleaning device

Info

Publication number
JPH05121389A
JPH05121389A JP31167091A JP31167091A JPH05121389A JP H05121389 A JPH05121389 A JP H05121389A JP 31167091 A JP31167091 A JP 31167091A JP 31167091 A JP31167091 A JP 31167091A JP H05121389 A JPH05121389 A JP H05121389A
Authority
JP
Japan
Prior art keywords
solvent
vapor
ch2cl2
substrate
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31167091A
Other languages
Japanese (ja)
Inventor
Makoto Saito
誠 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP31167091A priority Critical patent/JPH05121389A/en
Publication of JPH05121389A publication Critical patent/JPH05121389A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent generation of a stain due to absorption of moisture to an Al base or a dew-condensation at the time of degreasing and cleaning the base with a solvent having a low boiling point and high latent heat of vaporization, such as CH2Cl2, etc. CONSTITUTION:Dry gas is blown to the top of a free board 10. As the gas, dry air or vapor of CH2Cl2 is employed, and an absolute humidity is decreased to 0.0O9kg/kg or less. In the case of the vapor of the CH2Cl2, an atmosphere on the board 10 is heated, and an evaporating speed decreasing effect of the CH2Cl2 can be also utilized.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の利用分野】この発明は、感光ドラムのAlやガ
ラスの基体、磁気ディスクのAl基板、レーザービーム
プリンターのポリゴンミラーのAl基体、あるいはIC
ウェハー等を洗浄するための、溶媒洗浄装置に関する。
この発明は特に、洗浄後の基体やウェハー等への水分の
吸着や結露による、特性劣化の防止に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an Al or glass substrate for a photosensitive drum, an Al substrate for a magnetic disk, an Al substrate for a polygon mirror of a laser beam printer, or an IC.
The present invention relates to a solvent cleaning device for cleaning wafers and the like.
The present invention particularly relates to prevention of characteristic deterioration due to moisture adsorption or dew condensation on a substrate or wafer after cleaning.

【0002】[0002]

【従来技術】感光ドラムのAl基体やガラス基体、ある
いは前記の磁気ディスク基板やICウェハー等は、加工
後に溶媒で洗浄し、脱脂や加工屑の除去等を行ってい
る。従来から用いられてきた溶媒は、C2F3Cl3等の
フレオン系溶媒や、CH3CCl3等のハロン系溶媒であ
る。これらの溶媒は、高沸点で蒸発潜熱が小さいため、
溶媒の液面(フリーボード)からの被洗浄物の引き上げ
後の、水分の付着等は問題にならない。しかしC2F3C
l3はオゾン層の破壊が特に問題となる物質であり、C
H3CCl3もオゾン層破壊が問題となり、使用を控える
べき物質である。このためこれらの溶媒を、他の溶媒で
代替する必要がある。
2. Description of the Related Art An Al substrate or a glass substrate of a photosensitive drum, or the above-mentioned magnetic disk substrate, IC wafer or the like is washed with a solvent after processing to degrease and remove processing chips. Conventionally used solvents are freon solvents such as C2F3Cl3 and halon solvents such as CH3CCl3. Since these solvents have high boiling points and low latent heat of vaporization,
Adhesion of water does not pose a problem after the object to be cleaned has been lifted from the surface of the solvent (freeboard). But C2F3C
l3 is a substance for which the destruction of the ozone layer is a particular problem.
H3CCl3 is also a substance that should not be used because ozone depletion becomes a problem. Therefore, it is necessary to replace these solvents with other solvents.

【0003】これらの溶媒に代えて注目されているの
は、CH2Cl2である。例えばCH2Cl2とCH3CC
l3とのオゾン破壊係数を比較すると、CH2Cl2で
0.03、CH3CCl3で0.13であり、CH2Cl2
はCH3CCl3の1/4以下のオゾン破壊係数となる。
CH2Cl2 is attracting attention as an alternative to these solvents. For example CH2Cl2 and CH3CC
Comparing the ozone depletion potential with that of L3, it was 0.03 for CH2Cl2 and 0.13 for CH3CCl3.
Has an ozone depletion potential less than 1/4 that of CH3CCl3.

【0004】しかしながら、発明者はCH2Cl2では低
沸点で蒸発潜熱が大きいため、洗浄後の基体等に水分が
吸着あるいは結露し、以降の工程に悪影響をもたらすこ
とを見い出した。例えば感光ドラムのAlやガラスの基
体では、水分の吸着や結露により表面にしみが生じ、こ
のしみは感光層の成膜欠陥の原因となり、画像欠陥を引
き起こす。このようなしみは、洗浄後の基体の引き上げ
時に生じ、洗浄槽のフリーボード上の水蒸気の吸着や結
露により生じたものである。またしみの問題は、金属基
体、例えば感光ドラムのAl基体の場合に特に深刻で、
これはAlの熱伝導率が高く、比熱が小さいため、フリ
ーボードから引き上げた後の溶媒の乾燥工程での冷却が
著しいためである。
However, the inventor has found that CH2Cl2 has a low boiling point and a large latent heat of vaporization, so that water is adsorbed or condensed on the substrate after washing, which adversely affects the subsequent steps. For example, in the case of an Al or glass substrate of the photosensitive drum, a spot is generated on the surface due to adsorption of moisture or dew condensation, and this spot causes a film formation defect of the photosensitive layer and causes an image defect. Such stains are generated when the substrate is pulled up after cleaning, and are caused by adsorption of water vapor or dew condensation on the freeboard of the cleaning tank. The stain problem is particularly serious in the case of a metal substrate, for example, an Al substrate of a photosensitive drum,
This is because the thermal conductivity of Al is high and the specific heat is small, so that the cooling of the solvent after it is pulled up from the freeboard in the drying step is remarkable.

【0005】CH3CCl3でしみが発生せず、CH2C
l2で発生するのは、低沸点で高蒸発潜熱なためであ
る。CH2Cl2の沸点は39.75℃で蒸発潜熱は7
8.7cal/g、CH3CCl3では沸点が74.0
℃、蒸発潜熱が56.7cal/gである。CH2Cl2
中で被洗浄物を洗浄し引き上げると、低沸点なため溶媒
の蒸発速度が大きく、蒸発潜熱が大きいため被洗浄物か
ら奪いさる熱量が大きい。このため被洗浄物のAl基体
等は急激に冷却され、水分の吸着や結露等が生じる。
CH3CCl3 does not cause stains, and CH2C
It is generated at 12 because it has a low boiling point and high latent heat of vaporization. The boiling point of CH2Cl2 is 39.75 ° C and the latent heat of vaporization is 7.
8.7 cal / g, CH3CCl3 has a boiling point of 74.0
C., latent heat of vaporization is 56.7 cal / g. CH2Cl2
When the object to be cleaned is washed and pulled up therein, the evaporation rate of the solvent is high because of the low boiling point, and the latent heat of evaporation is large, so the amount of heat taken from the object to be cleaned is large. For this reason, the Al substrate or the like of the object to be cleaned is rapidly cooled, and water adsorption or dew condensation occurs.

【0006】フリーボードからの引き上げ時に、被洗浄
物を加温する装置として、図3のように、洗浄槽2の溶
媒4をヒータ6で沸騰させ、フリーボード上に溶媒蒸気
の層を形成するものが知られている。しかしながら発明
者の実験によると、この装置では、感光ドラムのAl基
体へのしみの発生を防止するに充分ではなかった。これ
はCH2Cl2が低沸点で高蒸発潜熱なため、しみの発生
を防止するに充分な溶媒蒸気層を形成するには、洗浄槽
2のCH2Cl2溶媒4を激しく沸騰させねばならず、本
来の脱脂洗浄装置として不適当なものとなってしまうた
めである。例えば溶媒4を激しく沸騰させると、Al基
体8が転動し、基体8は泡で包まれてしまう。またCH
2Cl2は低沸点なため蒸気温度が低く、フリーボード上
部の雰囲気の加温効果も小さい。
As a device for heating an object to be cleaned when it is pulled up from the freeboard, as shown in FIG. 3, the solvent 4 in the cleaning tank 2 is boiled by a heater 6 to form a layer of solvent vapor on the freeboard. Things are known. However, according to the experiments conducted by the inventor, this device was not sufficient to prevent the occurrence of stains on the Al substrate of the photosensitive drum. This is because CH2Cl2 has a low boiling point and high latent heat of vaporization, so in order to form a solvent vapor layer sufficient to prevent the generation of stains, the CH2Cl2 solvent 4 in the cleaning tank 2 must be vigorously boiled and the original degreasing cleaning is performed. This is because the device becomes unsuitable. For example, when the solvent 4 is vigorously boiled, the Al base 8 rolls and the base 8 is wrapped with bubbles. Also CH
Since 2Cl2 has a low boiling point, the vapor temperature is low and the effect of heating the atmosphere above the freeboard is small.

【0007】[0007]

【発明の課題】この発明の課題は、低沸点で高蒸発潜熱
の溶媒により洗浄を行う際に、フリーボードからの引き
上げ時の被洗浄物への水分の吸着や結露を防止すること
にある。
SUMMARY OF THE INVENTION It is an object of the present invention to prevent water from adsorbing or condensing on an object to be cleaned when it is pulled up from a freeboard when cleaning with a solvent having a low boiling point and a high latent heat of vaporization.

【0008】[0008]

【発明の構成】この発明は、被洗浄物を洗浄するための
溶媒が入れられた洗浄槽の上部に、溶媒蒸気回収用の冷
却器を設けた溶媒洗浄装置において、洗浄槽の溶媒の液
面と前記冷却器との間に、乾燥ガスを吹き込むための、
乾燥ガス吹き込み手段を設けたことを特徴とする。
According to the present invention, in a solvent cleaning apparatus having a cooler for recovering solvent vapor provided above a cleaning tank containing a solvent for cleaning an object to be cleaned, the liquid level of the solvent in the cleaning tank is And for blowing a dry gas between the cooler and
It is characterized in that a dry gas blowing means is provided.

【0009】ここに用いる低沸点・高蒸発潜熱の溶媒と
しては、CH2Cl2の他に、CH3COCH3(沸点5
6.5℃,蒸発潜熱125cal/g)等がある。また
乾燥ガスとしては、溶媒自体の蒸気や、乾燥空気、乾燥
窒素等を用いる。この内で好ましいものは、回収が容易
な溶媒自体の蒸気と、安価な乾燥空気である。フリーボ
ードの上部の被洗浄物の乾燥空間に持ち込む雰囲気の絶
対湿度は、好ましくは0.009kg/kg以下とし、
更に好ましくは0.008kg/kg以下、最も好まし
くは0.007kg/kg以下とする。0.009kg
/kgの絶対湿度は、洗浄槽のCH2Cl2溶媒を沸点に
保った際に、感光ドラムのAl基体にしみが生じない条
件である。
As the solvent having a low boiling point and a high latent heat of vaporization used here, in addition to CH2Cl2, CH3COCH3 (boiling point 5
6.5 ° C., latent heat of vaporization 125 cal / g), etc. As the dry gas, vapor of the solvent itself, dry air, dry nitrogen or the like is used. Among these, the vapor of the solvent itself, which is easily recovered, and the inexpensive dry air are preferable. The absolute humidity of the atmosphere brought into the drying space of the object to be cleaned above the freeboard is preferably 0.009 kg / kg or less,
It is more preferably 0.008 kg / kg or less, and most preferably 0.007 kg / kg or less. 0.009 kg
The absolute humidity of / kg is a condition under which the Al substrate of the photosensitive drum is not stained when the CH2Cl2 solvent in the cleaning tank is kept at the boiling point.

【0010】ここで乾燥空間に持ち込む雰囲気とは、洗
浄槽の上部から入り込む周囲の空気と、吹き込んだ乾燥
ガスを、その混合比で平均化したものである。乾燥空間
に持ち込む雰囲気との概念は、乾燥空間の雰囲気から、
洗浄槽から蒸発した溶媒蒸気を除いたものである。なお
溶媒自体の蒸気を乾燥ガスとして吹き込む場合には、吹
き込んだ溶媒蒸気は乾燥空間に持ち込んだ雰囲気に含め
て考える。この概念は、周囲から入り込んでくる水蒸気
を含んだ空気に対し、どの程度に乾燥ガスを吹き込み、
周囲の空気を乾燥ガスでどの程度の絶対湿度まで乾燥さ
せるかを意味する。なおこの明細書では便宜上、絶対湿
度として洗浄槽から蒸発した溶媒蒸気を除いて、周囲の
空気と吹き込んだ乾燥ガスの2つのみを考慮した絶対湿
度を使用することがある。この絶対湿度は、溶媒蒸気の
蒸発が激しい場合には、乾燥空間での実際の絶対湿度よ
りも大きく現れる。しかし通常の洗浄のように、溶媒を
20℃程度の低温で使用する場合には、溶媒蒸気の蒸気
圧は低く、周囲空気と吹き込んだ乾燥ガスのみを考慮し
た絶対湿度と、実際の絶対湿度との差は小さくなる。
Here, the atmosphere brought into the dry space is an average of the ambient air entering from the upper part of the cleaning tank and the dry gas blown in at the mixing ratio. The concept of the atmosphere to bring into the dry space, from the atmosphere of the dry space,
The cleaning tank is obtained by removing the evaporated solvent vapor. When the vapor of the solvent itself is blown as the dry gas, the blown solvent vapor is considered to be included in the atmosphere brought into the drying space. This concept is how much dry gas is blown to the air containing water vapor coming from the surroundings,
It means how much absolute humidity the ambient air is dried with. It should be noted that in this specification, as an absolute humidity, the absolute humidity in which only two of the ambient air and the blown dry gas are taken into consideration may be used as the absolute humidity, excluding the solvent vapor evaporated from the cleaning tank. This absolute humidity appears larger than the actual absolute humidity in the dry space when the evaporation of the solvent vapor is intense. However, when the solvent is used at a low temperature of about 20 ° C. as in normal cleaning, the vapor pressure of the solvent vapor is low, and the absolute humidity considering only the ambient air and the dry gas blown in and the actual absolute humidity are The difference between is small.

【0011】[0011]

【発明の作用】この発明では、フリーボード上の被洗浄
物の乾燥空間に乾燥ガスを吹き込み、絶対湿度を低下さ
せて、水分の吸着や結露を防止する。乾燥ガスとして溶
媒自体の蒸気を用いる場合には、雰囲気中の溶媒蒸気の
濃度を高め被洗浄物からの溶媒の蒸発速度を低下させる
と共に、溶媒蒸気からの熱で雰囲気を加温し被洗浄物の
冷却を防止するとの効果もある。
According to the present invention, the dry gas is blown into the drying space of the object to be cleaned on the freeboard to reduce the absolute humidity, thereby preventing adsorption of water and dew condensation. When the vapor of the solvent itself is used as the dry gas, the concentration of the solvent vapor in the atmosphere is increased to reduce the evaporation rate of the solvent from the object to be cleaned, and the atmosphere from the solvent vapor is heated to heat the object to be cleaned. It also has the effect of preventing cooling.

【0012】[0012]

【実施例】図1に、溶媒蒸気の吹き込みを用いた実施例
を示す。図において、2は洗浄槽、4はCH2Cl2等の
低沸点高蒸発潜熱の溶媒、6はヒータ、8は被洗浄物の
感光ドラムのAl基体である。ここでは感光ドラムのA
l基体の精密鏡面加工後の脱脂洗浄を例に示すが、ガラ
ス感光ドラムの脱脂洗浄や、磁気ディスクのAl基板、
レーザービームプリンターのポリゴンミラーのAl基体
等の洗浄でも同様である。またこの発明は、ICウェハ
ーの洗浄にも用いることができる。これらの内で特に重
要なのは、熱伝導率が高く熱容量が小さいため冷却速度
が高く、フリーボードからの引き上げ時の結露や水分吸
着が特に深刻となる金属基体を被洗浄物とする場合で、
電子部品の場合には主としてAl基体である。
EXAMPLE FIG. 1 shows an example using the blowing of solvent vapor. In the figure, 2 is a cleaning tank, 4 is a solvent with a low boiling point and high latent heat of vaporization such as CH2Cl2, 6 is a heater, and 8 is an Al substrate of the photosensitive drum of the object to be cleaned. Here, A of the photosensitive drum
l Degreasing cleaning after precision mirror surface processing of a substrate is shown as an example, but degreasing cleaning of a glass photosensitive drum, an Al substrate of a magnetic disk,
The same applies to cleaning the Al substrate of the polygon mirror of the laser beam printer. The present invention can also be used for cleaning IC wafers. Of these, particularly important is the case where a metal substrate, which has a high thermal conductivity and a small heat capacity, has a high cooling rate, and in which dew condensation and moisture adsorption during pulling up from the freeboard become particularly serious, as the object to be cleaned,
In the case of electronic parts, it is mainly an Al substrate.

【0013】10は溶媒4の液面(フリーボード)で、
12はフリーボード10上の溶媒蒸気層、14は溶媒蒸
気を冷却し回収するための冷却コイルで冷却器の例であ
る。16は熱交換器、18は溶媒回収パイプ、20は回
収した溶媒から水を分離するための水分分離器、22は
溶媒蒸気の発生器で、24はそのヒータ、26は溶媒蒸
気の吹き込みパイプで、フリーボード10と冷却コイル
14の間の高さに、吹き込み口28を設ける。30は洗
浄用の超音波振動子である。32,34はヒータ6,2
4の電源、36は超音波振動子30の駆動回路である。
10 is the liquid surface (freeboard) of the solvent 4,
Reference numeral 12 is a solvent vapor layer on the freeboard 10, and 14 is a cooling coil for cooling and collecting the solvent vapor, which is an example of a cooler. 16 is a heat exchanger, 18 is a solvent recovery pipe, 20 is a water separator for separating water from the recovered solvent, 22 is a solvent vapor generator, 24 is its heater, and 26 is a solvent vapor blowing pipe. A blowing port 28 is provided at a height between the freeboard 10 and the cooling coil 14. Reference numeral 30 is an ultrasonic transducer for cleaning. 32 and 34 are heaters 6 and 2
A power source 4 and a drive circuit 36 for the ultrasonic transducer 30.

【0014】実施例の作用を説明する。Al基体8は沸
点あるいは沸点未満の温度に保たれた溶媒4中に浸され
て、超音波振動子30からの超音波で洗浄され、鏡面加
工時に付着した油等を脱脂される。実施例では鏡面加工
後の脱脂洗浄に溶媒洗浄装置を用いるが、他の工程での
洗浄に用いても良い。洗浄後の基体8をフリーボード1
0から溶媒蒸気層12へと引き上げると、基体8に付着
した溶媒が蒸発する。ここでCH2Cl2は低沸点(沸点
約40℃)のため、蒸発速度が大きい。またCH2Cl2
は高蒸発潜熱(78.7cal/g)なため、蒸発によ
り奪われる熱量が大きい。このためCH2Cl2等の低沸
点高蒸発潜熱の溶媒4を用いると、基体8は急速に冷却
される。基体8をAl等の金属とすると、熱伝導率が高
く、熱容量が小さいため、溶媒の蒸発による冷却の効果
は更に著しくなる。
The operation of the embodiment will be described. The Al substrate 8 is dipped in the solvent 4 kept at a boiling point or a temperature lower than the boiling point, washed with ultrasonic waves from the ultrasonic oscillator 30, and degreased of oil and the like adhering during mirror finishing. In the embodiment, a solvent cleaning device is used for degreasing cleaning after mirror finishing, but it may be used for cleaning in other steps. Freeboard 1 after cleaning substrate 8
When the solvent vapor layer 12 is pulled up from 0, the solvent attached to the substrate 8 is evaporated. Since CH2Cl2 has a low boiling point (boiling point of about 40 ° C.), the evaporation rate is high. Also CH2Cl2
Has a high latent heat of vaporization (78.7 cal / g), so a large amount of heat is lost by vaporization. Therefore, when the solvent 4 having a low boiling point and high latent heat of vaporization such as CH2Cl2 is used, the substrate 8 is rapidly cooled. When the substrate 8 is made of a metal such as Al, the thermal conductivity is high and the heat capacity is small, so that the effect of cooling by evaporation of the solvent becomes more remarkable.

【0015】基体8への結露や水分吸着を防止するた
め、吹き出し口28から加温した溶媒蒸気を吹き込み、
溶媒蒸気層12中の絶対湿度を低下させる。吹き込んだ
溶媒蒸気と混入した周囲空気の混合気での絶対湿度は、
好ましくは0.009kg/kg以下、より好ましくは
0.008kg/kg以下、更に好ましくは0.007
kg/kg以下とする。次に溶媒蒸気の吹き込みによ
り、蒸気層12中での溶媒蒸気濃度を増加させ、基体8
からの溶媒の蒸発速度を低下させる。また溶媒蒸気の温
度は沸点(40℃)程度とし、溶媒蒸気層12の雰囲気
温度を高め、基体8の冷却を防止する。なお吹き出し口
28の付近にヒータを設け、沸点以上に溶媒蒸気を加熱
して吹き込んでも良い。溶媒蒸気の吹き込みにより、絶
対湿度の低下、蒸発速度の低下、雰囲気の加温の3つの
効果が得られ、これらによって基体8への水分の付着
(結露や吸着)を防止する。
In order to prevent dew condensation and water adsorption on the substrate 8, a heated solvent vapor is blown from the outlet 28,
The absolute humidity in the solvent vapor layer 12 is reduced. Absolute humidity in the mixture of the blown solvent vapor and the mixed ambient air is
It is preferably 0.009 kg / kg or less, more preferably 0.008 kg / kg or less, and further preferably 0.007.
Kg / kg or less. Next, the solvent vapor concentration in the vapor layer 12 is increased by blowing in the solvent vapor, and the substrate 8
Reduce the evaporation rate of the solvent from. The temperature of the solvent vapor is set to about the boiling point (40 ° C.) to raise the ambient temperature of the solvent vapor layer 12 and prevent the substrate 8 from being cooled. A heater may be provided near the outlet 28 to heat the solvent vapor to a temperature equal to or higher than the boiling point and blow the solvent vapor. The blowing of the solvent vapor has three effects of lowering the absolute humidity, lowering the evaporation rate, and warming the atmosphere, thereby preventing moisture (condensation or adsorption) from adhering to the substrate 8.

【0016】蒸気層12中の溶媒蒸気を冷却コイル14
で冷却し、溶媒を溶媒回収パイプ18から回収し、水分
分離器20で水分を分離して再生する。この結果、吹き
込んだ溶媒蒸気が失われることは無い。
The solvent vapor in the vapor layer 12 is cooled by the cooling coil 14.
The solvent is recovered from the solvent recovery pipe 18, and the water is separated and regenerated by the water separator 20. As a result, the injected solvent vapor is not lost.

【0017】図2に、溶媒蒸気に替えて、乾燥空気を吹
き込むようにした実施例を示す。この実施例は、特に断
わらない限り図1の実施例と同様で、図において40は
コンプレッサー等の乾燥空気源で、乾燥空気ボンベや乾
燥窒素ボンベ、乾燥CO2ボンベ等を用いても良い。こ
の実施例では、コンプレッサー40で周囲の空気を圧縮
して除湿し、吹き込み口28から乾燥空気を吹き込む。
そして蒸気層12に入り込む周囲空気と吹き込んだ乾燥
空気の混合気での絶対湿度を、0.009kg/kg以
下に低下させ、引き上げ時の基体8への水分の吸着や結
露を防止する。コンプレッサーを用いる場合には、圧縮
発熱により乾燥空気は数十度程度に加熱され、蒸気層1
2の雰囲気温度を高めて、基体8への水分の吸着や結露
を更に防止することができる。もちろんこれ以外の場合
にも、乾燥空気を加熱して吹き出し口28から供給し、
蒸気層12の気温を高めても良い。
FIG. 2 shows an embodiment in which dry air is blown in instead of the solvent vapor. This embodiment is the same as the embodiment of FIG. 1 unless otherwise specified. In the figure, reference numeral 40 denotes a dry air source such as a compressor, and a dry air cylinder, a dry nitrogen cylinder, a dry CO2 cylinder or the like may be used. In this embodiment, the compressor 40 compresses ambient air to dehumidify it, and blows dry air through the blow-in port 28.
Then, the absolute humidity in the air-fuel mixture of the ambient air entering the vapor layer 12 and the blown dry air is reduced to 0.009 kg / kg or less to prevent adsorption of water or dew condensation on the substrate 8 during pulling. When a compressor is used, the heat of compression heats the dry air to several tens of degrees, and the vapor layer 1
It is possible to further prevent the adsorption of moisture on the substrate 8 and the dew condensation by raising the ambient temperature of 2. Of course, in other cases as well, dry air is heated and supplied from the outlet 28,
The temperature of the vapor layer 12 may be raised.

【0018】図1,図2の実施例に付いて、試験例を示
す。30Litterの洗浄槽2にCH2Cl2溶媒4を加え、
直径108mm,長さ358mm,肉厚5mmの感光ド
ラム用Al基体8を浸して、2分間超音波洗浄した。C
H2Cl2溶媒4の液温は、ヒータ6で調整した。超音波
洗浄後に、基体8を8mm/秒の速度で引き上げ、基体
8の表面のしみの発生の有無を観察した。なお周囲の空
気は、温度20℃相対湿度57%であった。
A test example will be described with reference to the embodiments shown in FIGS. CH2Cl2 solvent 4 is added to the washing tank 2 of 30 Litter,
An Al substrate 8 for a photosensitive drum having a diameter of 108 mm, a length of 358 mm and a wall thickness of 5 mm was dipped and ultrasonically cleaned for 2 minutes. C
The liquid temperature of the H2Cl2 solvent 4 was adjusted by the heater 6. After ultrasonic cleaning, the substrate 8 was pulled up at a speed of 8 mm / sec, and it was observed whether or not stains were generated on the surface of the substrate 8. The ambient air had a temperature of 20 ° C. and a relative humidity of 57%.

【0019】図1の実施例では、フリーボード10と冷
却コイル14との間の高さに、4箇所にCH2Cl2蒸気
の吹き込み口(直径1/2インチ)を設けた。溶媒蒸気
は、蒸気発生器22に15LitterのCH2Cl2溶媒を加
え、ヒータ24で750Wの電力を加えて沸騰させて発
生させた。溶媒蒸気を加えない他は同様の比較例と共
に、洗浄槽2での液温としみの発生との関係を表1に示
す。
In the embodiment shown in FIG. 1, at the height between the freeboard 10 and the cooling coil 14, CH2Cl2 vapor blowing ports (diameter 1/2 inch) are provided at four positions. The solvent vapor was generated by adding 15 Litter of CH2Cl2 solvent to the vapor generator 22 and boiling it by applying 750 W of electric power with the heater 24. Table 1 shows the relationship between the liquid temperature in the cleaning tank 2 and the occurrence of stains, together with the same comparative example except that no solvent vapor was added.

【0020】[0020]

【表1】 表1 液温としみの発生の有無 洗浄槽でのCH2Cl2の液温(℃)と評価 25 28 32 36 沸点 実施例(溶媒蒸気を供給) ○ ○ ○ ○ ○ 比較例(溶媒蒸気供給無し) × × × × △ * 評価は、基体8へのしみの発生無し: ○ 基体8の表面積の1/4以下の面積でしみが発生:△ 基体8の表面積の1/4以上の面積でしみが発生:×の
3段階評価で示す。
[Table 1] Table 1 Liquid temperature and presence / absence of spots CH2Cl2 liquid temperature (° C) in the cleaning tank and evaluation 25 28 32 36 Boiling point Example (solvent vapor supply) ○ ○ ○ ○ ○ Comparative example (solvent vapor supply) No) × × × × Δ * Evaluation is that no stain is generated on the substrate 8: ○ Stain is generated in an area of 1/4 or less of the surface area of the substrate 8: Δ In area of 1/4 or more of the surface area of the substrate 8 Staining: Indicated by a three-level evaluation of ×.

【0021】この表で液温が沸点の場合が図3の従来例
に対応し、図3の従来例では極端に沸騰を激しくしない
限り、しみの発生の防止には不十分であることが分か
る。また実施例では、任意の液温でしみが発生せず、完
全にしみの発生を防止し得ることがわかる。
It can be seen from the table that the case where the liquid temperature is the boiling point corresponds to the conventional example of FIG. 3, and the conventional example of FIG. 3 is not sufficient to prevent the generation of stains unless the boiling is extremely violent. .. Further, in the examples, it is understood that the stain does not occur at an arbitrary liquid temperature, and the stain can be completely prevented.

【0022】表2に、図2の実施例での試験結果を示
す。この試験例では、16℃の乾燥空気(露点11.5
℃以下)を、4つの吹き込み口28から、0〜6m3
時間の流量で吹き込み、吹き込んだ乾燥空気と蒸気層1
2の上部から入り込む周囲空気の合計に対する、絶対湿
度を0.0065kg/kg〜0.014kg/kgの
範囲で変化させて、しみの発生の有無を観察した。他の
試験条件は、蒸気の場合と同様である。また洗浄槽2の
液温は沸点とした。結果を表2に示す。周囲空気の絶対
湿度を吹き込んだ乾燥空気で、0.009kg/kg以
下とすることにより、沸点のCH2Cl2溶媒4でのしみ
の発生を防止でき、0.008kg/kg以下とするこ
とにより28℃のCH2Cl2溶媒4でのしみを防止で
き、0.007kg/kg以下とすることにより20.
5℃のCH2Cl2溶媒4でのしみを防止できる。0.0
09kg/kg以下とは、温湿度に換算すると21℃
58%以下に相当し、0.008kg/kg以下とは1
9℃ 58%に相当し、0.007kg/kg以下とは
18℃ 55%に相当する。
Table 2 shows the test results for the embodiment of FIG. In this test example, 16 ° C. dry air (dew point 11.5
0 ° C or less) from 0 to 6 m 3 /
Dry air and vapor layer 1 blown in at a flow rate of time
Absolute humidity was changed in the range of 0.0065 kg / kg to 0.014 kg / kg with respect to the total amount of ambient air entering from the upper part of No. 2, and the presence or absence of stains was observed. Other test conditions are the same as for steam. The liquid temperature of the cleaning tank 2 was set to the boiling point. The results are shown in Table 2. By using dry air in which the absolute humidity of the ambient air is blown to 0.009 kg / kg or less, it is possible to prevent the generation of stains in the boiling point CH2Cl2 solvent 4, and by setting it to 0.008 kg / kg or less, the temperature of 28 ° C Staining with CH2Cl2 solvent 4 can be prevented, and by adjusting the amount to 0.007 kg / kg or less, 20.
Staining with CH2Cl2 solvent 4 at 5 ° C can be prevented. 0.0
09 kg / kg or less means 21 ° C when converted into temperature and humidity
58% or less, 0.008 kg / kg or less is 1
9 ° C. corresponds to 58%, and 0.007 kg / kg or less corresponds to 18 ° C. 55%.

【0023】[0023]

【表2】 表2 液温としみの発生の有無 絶対湿度(Kg/Kg) 評価 対応温湿度条件 実施例 0.0065 ○ 16℃ 58% 0.0070 ○ 18℃ 55% 0.0080 ○ 19℃ 58% 0.0085 ○ 20℃ 58% 0.0090 ○ 21℃ 58% 比較例 0.0095 × 22℃ 57% 0.014 × 24℃ 74% * 評価は、基体8へのしみの発生無し:○ 基体8にしみが発生: × の2段階評価で示す。 * 絶対湿度は、溶媒蒸気を除き、吹き込んだ乾燥ガス
と周囲から入り込んだ周囲空気について考え、周囲空気
/乾燥空気の混合気の絶対湿度を現す。 * 対応温湿度条件は、吹き込んだ乾燥空気と周囲の空
気の混合気の絶対湿度を、温湿度条件に換算して表示し
た。例えば20℃ 58%の表示は、蒸気層12の気体
から溶媒蒸気を除いて考え、周囲から入り込んだ空気と
吹き込んだ乾燥空気のみについて絶対湿度を求め、これ
を典型的な温湿度に換算したものである。
[Table 2] Table 2 Liquid Temperature and Presence of Stain Absolute Humidity (Kg / Kg) Evaluation Corresponding Temperature and Humidity Conditions Example 0.0065 ○ 16 ° C 58% 0.0070 ○ 18 ° C 55% 0.0080 ○ 19 ° C 58 % 0.0085 ○ 20 ° C. 58% 0.0090 ○ 21 ° C. 58% Comparative example 0.0095 × 22 ° C. 57% 0.014 × 24 ° C. 74% * Evaluation shows no stain on the substrate 8: ○ substrate 8: Staining occurs: It is shown by a two-level evaluation of x. * Absolute humidity indicates the absolute humidity of the ambient air / dry air mixture, considering the dry gas blown in and the ambient air drawn in from the surroundings, excluding solvent vapor. * Corresponding temperature / humidity conditions are expressed by converting the absolute humidity of the mixture of blown dry air and ambient air into temperature / humidity conditions. For example, the display of 20 ° C. 58% is obtained by excluding the solvent vapor from the gas in the vapor layer 12 and obtaining the absolute humidity only for the air that has entered from the surroundings and the dry air that has been blown in and converted this to a typical temperature and humidity. Is.

【0024】[0024]

【発明の効果】以上に示したようにこの発明では、洗浄
槽上部の溶媒蒸気中に、乾燥空気や溶媒蒸気そのもの等
の乾燥ガスを吹き込み、絶対湿度を低下させることによ
り、被洗浄部への水分の吸着や結露を防止する。これに
よってCH2Cl2等の低沸点高蒸発潜熱の溶媒の使用を
可能にし、オゾン層への影響を防止する。被洗浄物の種
類は任意であるが、後工程で精密な成膜が必要で、しみ
の発生が成膜欠陥に結び付く感光ドラム基体の洗浄に特
に有効である。感光ドラムの基体の洗浄でも、基体の熱
伝導率が高く熱容量が小さいAl基体の洗浄に、特に有
効である。
As described above, according to the present invention, a dry gas such as dry air or the solvent vapor itself is blown into the solvent vapor in the upper portion of the cleaning tank to reduce the absolute humidity, so that the portion to be cleaned is cleaned. Prevents adsorption of water and condensation. This makes it possible to use a solvent having a low boiling point and a high latent heat of vaporization such as CH2Cl2 and prevent the influence on the ozone layer. Although the type of the object to be cleaned is arbitrary, it is particularly effective for cleaning the photosensitive drum substrate in which precise film formation is required in the post-process, and the generation of stains leads to film formation defects. Even the cleaning of the base of the photosensitive drum is particularly effective for cleaning the Al base having a high thermal conductivity and a small heat capacity.

【図面の簡単な説明】[Brief description of drawings]

【図1】 溶媒蒸気の吹き込みを用いた、実施例の溶媒
洗浄装置を示す図
FIG. 1 is a diagram showing a solvent cleaning apparatus of an embodiment using blowing of a solvent vapor.

【図2】 乾燥空気の吹き込みを用いた、実施例の溶媒
洗浄装置を示す図
FIG. 2 is a diagram showing a solvent cleaning apparatus of an embodiment using a blowing of dry air.

【図3】 洗浄槽の溶媒を激しく沸騰させ、被洗浄物を
加温するようにした従来例の溶媒洗浄装置を示す図
FIG. 3 is a diagram showing a conventional solvent cleaning apparatus in which a solvent in a cleaning tank is vigorously boiled to heat an object to be cleaned.

【符号の説明】[Explanation of symbols]

2 洗浄槽 4 溶媒 6 ヒータ 8 感光ドラムのAl基体 10 フリーボード 12 蒸気層 14 冷却コイル 20 水分分離器 22 蒸気発生器 26 溶媒蒸気パイプ 28 吹き込み口 40 乾燥空気源 2 Cleaning Tank 4 Solvent 6 Heater 8 Photosensitive Drum Al Substrate 10 Freeboard 12 Vapor Layer 14 Cooling Coil 20 Moisture Separator 22 Steam Generator 26 Solvent Vapor Pipe 28 Inlet 40 Dry Air Source

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/304 341 V 8831−4M ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Internal reference number FI Technical indication H01L 21/304 341 V 8831-4M

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 被洗浄物を洗浄するための溶媒が入れら
れた洗浄槽の上部に、溶媒蒸気回収用の冷却器を設けた
溶媒洗浄装置において、 洗浄槽の溶媒の液面と前記冷却器との間に、乾燥ガスを
吹き込むための、乾燥ガス吹き込み手段を設けたことを
特徴とする、溶媒洗浄装置。
1. A solvent cleaning apparatus having a cooler for recovering solvent vapor provided above a cleaning tank containing a solvent for cleaning an object to be cleaned, wherein the liquid level of the solvent in the cleaning tank and the cooler. A solvent cleaning device, characterized in that a dry gas blowing means for blowing a dry gas is provided between the cleaning device and the cleaning device.
JP31167091A 1991-10-29 1991-10-29 Solvent cleaning device Pending JPH05121389A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31167091A JPH05121389A (en) 1991-10-29 1991-10-29 Solvent cleaning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31167091A JPH05121389A (en) 1991-10-29 1991-10-29 Solvent cleaning device

Publications (1)

Publication Number Publication Date
JPH05121389A true JPH05121389A (en) 1993-05-18

Family

ID=18020068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31167091A Pending JPH05121389A (en) 1991-10-29 1991-10-29 Solvent cleaning device

Country Status (1)

Country Link
JP (1) JPH05121389A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5759425A (en) * 1995-09-06 1998-06-02 Kawasaki Jukogyo Kabushiki Kaisha Honeycomb core degreasing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5759425A (en) * 1995-09-06 1998-06-02 Kawasaki Jukogyo Kabushiki Kaisha Honeycomb core degreasing method

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