JPH05113470A - Short-circuit testing device for breaker - Google Patents

Short-circuit testing device for breaker

Info

Publication number
JPH05113470A
JPH05113470A JP27282591A JP27282591A JPH05113470A JP H05113470 A JPH05113470 A JP H05113470A JP 27282591 A JP27282591 A JP 27282591A JP 27282591 A JP27282591 A JP 27282591A JP H05113470 A JPH05113470 A JP H05113470A
Authority
JP
Japan
Prior art keywords
circuit
current
current source
test
breaker
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP27282591A
Other languages
Japanese (ja)
Inventor
Takao Asakura
孝夫 朝倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP27282591A priority Critical patent/JPH05113470A/en
Publication of JPH05113470A publication Critical patent/JPH05113470A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To obtain the titled device capable of carrying out the cutoff test of an asymmetrical alternating current. CONSTITUTION:The first and second current source capacitors Ci1 and Ci2, and the first and second current source reactors Li1 and Li2 are provided in a current source circuit 1. The first resonance circuit is constituted of the capacitor Ci1 and the reactor Li1, and the second resonance circuit by the capacitor Ci2 and the reactor Li2. The resonant frequency of the first circuit is set about two times of one of the second circuit, their frequencies are used as test frequencies, and the oscillating currents of the first and second circuits are superposed and supplied to a breaker Sp to be tested.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、遮断器の合成短絡試験
を行う遮断器用短絡試験装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a short circuit tester for a circuit breaker which conducts a synthetic short circuit test on the circuit breaker.

【0002】[0002]

【従来の技術】JEC−2300に規定されている合成短絡
試験法では、供試遮断器に短絡電流を供給する電流源回
路と、過渡回復電圧及び回復電圧を供給する電圧源回路
とを設け、電流源回路を供試遮断器に接続して該遮断器
に短絡電流を流した後、短絡電流の零点直前で供試遮断
器に電圧源回路を接続して電流源回路からの短絡電流に
電圧源回路からの電流を重畳する。
2. Description of the Related Art In the synthetic short circuit test method specified in JEC-2300, a current source circuit for supplying a short circuit current to a circuit breaker under test and a voltage source circuit for supplying a transient recovery voltage and a recovery voltage are provided. After connecting the current source circuit to the circuit breaker under test and passing a short-circuit current through the circuit breaker, connect the voltage source circuit to the circuit breaker under test immediately before the zero point of the short-circuit current, and change the short-circuit current from the current source circuit to the voltage. Superimpose the current from the source circuit.

【0003】合成短絡試験法に用いる試験装置として、
図4に示す装置が知られている。同図においてEi は高
圧直流電源からなる電流源充電器で、この充電器の出力
電圧はスイッチS1 ,S1'を介して電流源コンデンサC
i に印加されている。コンデンサCi の一端は接地さ
れ、コンデンサCi の非接地側の端子にスイッチS2 と
保護遮断器BSと投入スイッチMSとを介して電流源リ
アクトルLiの一端が接続されている。リアクトルLi
の他端は補助遮断器Sn の一端に接続され、補助遮断器
Sn の他端と接地間に供試遮断器Sp が接続されてい
る。リアクトルLiと補助遮断器Sn との接続点と接地
間にアーク延長装置Pa が接続されている。Ev は高圧
直流電源からなる電圧源充電器で、この充電器の出力電
圧はスイッチS3 ,S3'を介して電圧源コンデンサCv
に印加されている。電圧源コンデンサCv の一端はトリ
ガ電極gを備えた放電ギャップG1 を介して接地され、
電圧源コンデンサCv の他端は放電ギャップG2 を介し
て電圧源リアクトルLv の一端に接続されている。リア
クトルLv の他端は供試遮断器Sp の非接地側の端子に
接続され、リアクトルLv の他端と接地間に過渡回復電
圧調整用抵抗Re と過渡回復電圧調整用コンデンサCe
との直列回路が接続されている。供試遮断器を流れる短
絡電流を検出する変流器CTが設けられ、この変流器C
Tの出力は電流の零点を検出する電流零点検出器DET
に供給されている。電流零点検出器DETは、電流の零
点を検出したときにトリガ電圧を発生するようになって
おり、このトリガ電圧がトリガ電極gに供給されてい
る。
As a test device used in the synthetic short-circuit test method,
The device shown in FIG. 4 is known. In the figure, Ei is a current source charger consisting of a high-voltage DC power source, and the output voltage of this charger is the current source capacitor C via the switches S1 and S1 '.
applied to i. One end of the capacitor Ci is grounded, and one end of the current source reactor Li is connected to the non-grounded terminal of the capacitor Ci via the switch S2, the protective breaker BS and the closing switch MS. Reactor Li
The other end of is connected to one end of the auxiliary circuit breaker Sn, and the test circuit breaker Sp is connected between the other end of the auxiliary circuit breaker Sn and the ground. An arc extender Pa is connected between the connection point between the reactor Li and the auxiliary circuit breaker Sn and the ground. Ev is a voltage source charger composed of a high-voltage DC power source, and the output voltage of this charger is the voltage source capacitor Cv via the switches S3 and S3 '.
Is being applied to. One end of the voltage source capacitor Cv is grounded via a discharge gap G1 having a trigger electrode g,
The other end of the voltage source capacitor Cv is connected to one end of the voltage source reactor Lv via the discharge gap G2. The other end of the reactor Lv is connected to the non-grounded side terminal of the test circuit breaker Sp, and the transient recovery voltage adjusting resistor Re and the transient recovery voltage adjusting capacitor Ce are connected between the other end of the reactor Lv and the ground.
And a series circuit with is connected. A current transformer CT for detecting a short circuit current flowing through the circuit breaker under test is provided.
The output of T is a current zero detector DET for detecting the current zero.
Is being supplied to. The current zero detector DET is adapted to generate a trigger voltage when the zero of the current is detected, and this trigger voltage is supplied to the trigger electrode g.

【0004】この例では、電流源充電器Ei と、スイッ
チS1 ,S1'と、電流源コンデンサCi と、スイッチS
2 と、保護遮断器BSと、投入スイッチMSと、電流源
リアクトルLi と補助遮断器Sn とにより電流源回路1
が構成されている。また電圧源充電器Ev と、スイッチ
S3 ,S3'と、放電ギャップG1 及びG2 と、抵抗Re
及びコンデンサCe とにより、電圧源回路2が構成され
ている。
In this example, the current source charger Ei, the switches S1 and S1 ', the current source capacitor Ci, and the switch S1.
2, the protection circuit breaker BS, the closing switch MS, the current source reactor Li and the auxiliary circuit breaker Sn.
Is configured. Also, the voltage source charger Ev, the switches S3 and S3 ', the discharge gaps G1 and G2, and the resistor Re
The voltage source circuit 2 is composed of the capacitor Ce and the capacitor Ce.

【0005】電流源コンデンサCi と電流源リアクトル
Li とにより構成される直列共振回路の共振周波数は商
用周波数(50Hz または60Hz )に設定されてい
る。同様に、電圧源コンデンサCv と電圧源リアクトル
Lv とにより構成される直列共振回路の共振周波数も商
用周波数に設定されている。
The resonance frequency of the series resonance circuit composed of the current source capacitor Ci and the current source reactor Li is set to the commercial frequency (50 Hz or 60 Hz). Similarly, the resonance frequency of the series resonance circuit constituted by the voltage source capacitor Cv and the voltage source reactor Lv is also set to the commercial frequency.

【0006】上記の短絡試験装置を用いて遮断器の試験
を行う際には、先ずスイッチS1 ,S1'を一定時間閉じ
て電流源コンデンサCi を充電する。次いでスイッチS
3 ,S3'を一定時間閉じて、電圧源コンデンサCv を充
電する。
When the circuit breaker is tested by using the above short circuit tester, the switches S1 and S1 'are first closed for a certain period of time to charge the current source capacitor Ci. Then switch S
3 and S3 'are closed for a certain period of time to charge the voltage source capacitor Cv.

【0007】コンデンサCi ,Cvの充電が完了した
後、保護遮断器BS及び補助遮断器Sn を閉じ、投入ス
イッチMSに投入指令を与える。図5(A)に示すよう
に、時刻to で投入スイッチMSが閉じると電流源コン
デンサCi がリアクトルLi と供試遮断器Sp とを通し
て放電を開始する。このときコンデンサCi とリアクト
ルLi とからなる共振回路に共振が生じ、図5(A)に
示すように、供試遮断器Sp に商用周波数で減衰振動す
る放電電流Iが流れる。この放電電流が流れた後、時刻
t1 (開極時刻)で供試遮断器Sp を開く。遮断器Sp
が遮断に成功する場合には、開極時刻t1 の直後に現れ
る電流の零点またはその後の電流の零点t2 で電流が遮
断される。
After the charging of the capacitors Ci and Cv is completed, the protective breaker BS and the auxiliary breaker Sn are closed, and a closing command is given to the closing switch MS. As shown in FIG. 5A, when the closing switch MS is closed at time to, the current source capacitor Ci starts discharging through the reactor Li and the test breaker Sp. At this time, resonance occurs in the resonance circuit composed of the capacitor Ci and the reactor Li, and as shown in FIG. 5 (A), the discharge current I that attenuates and oscillates at the commercial frequency flows through the test breaker Sp. After this discharge current flows, the test breaker Sp is opened at time t1 (opening time). Circuit breaker Sp
If the current is cut off successfully, the current is cut off at the current zero point appearing immediately after the opening time t1 or at the current zero point t2.

【0008】トリガ装置DETは変流器CTの出力から
供試遮断器を流れる電流の零点の直前の位置を検出し
て、検出した電流零点の直前位置でトリガ電極gにパル
ス状のトリガ電圧を与える。トリガ電極gにトリガ電圧
が与えられると、放電ギャップG1 に放電が生じ、放電
ギャップG1 に放電が生じると放電ギャップG2 にも放
電が生じる。これにより電圧源コンデンサCvがリアク
トルLv に接続され、コンデンサCv からリアクトルL
v を通して供試遮断器Sp に電流が流れる。この電流が
遮断されると、供試遮断器Sp の各相の極間に過渡回復
電圧及び回復電圧が印加される。
The trigger device DET detects the position immediately before the zero point of the current flowing through the circuit breaker from the output of the current transformer CT, and applies a pulsed trigger voltage to the trigger electrode g at the position immediately before the detected current zero point. give. When a trigger voltage is applied to the trigger electrode g, a discharge is generated in the discharge gap G1 and a discharge is generated in the discharge gap G1. As a result, the voltage source capacitor Cv is connected to the reactor Lv, and the capacitor Cv is connected to the reactor Lv.
A current flows through the test breaker Sp through v. When this current is cut off, the transient recovery voltage and the recovery voltage are applied between the poles of each phase of the test breaker Sp.

【0009】アーク延長装置Pa は、変流器CTの出力
から電流の零点が検出されたときに供試遮断器Sp の極
間のアークを延長するためのパルス電圧を出力する。
The arc extender Pa outputs a pulse voltage for extending the arc between the poles of the circuit breaker Sp under test when a current zero is detected from the output of the current transformer CT.

【0010】[0010]

【発明が解決しようとする課題】従来の短絡試験装置で
は、図5(A)に示すような対称電流Iの遮断試験しか
行うことができず、図5(B)に示す非対称電流I´を
遮断するメジャーループ遮断や図5(C)に示す非対称
電流I″を遮断するマイナーループ遮断のような非対称
交流電流の遮断試験は行うことができなかった。
The conventional short-circuit test device can only perform the breaking test of the symmetrical current I as shown in FIG. 5 (A), and the asymmetrical current I'shown in FIG. 5 (B). Asymmetrical AC current interruption tests such as a major loop interruption for interruption and a minor loop interruption for asymmetrical current I ″ shown in FIG. 5C could not be conducted.

【0011】本発明の目的は、非対称交流電流の遮断試
験をも行うことができるようにした遮断器用短絡試験装
置を提供することにある。
An object of the present invention is to provide a short-circuit test device for a circuit breaker, which can also perform a breaking test of an asymmetrical alternating current.

【0012】[0012]

【課題を解決するための手段】本発明は、供試遮断器に
合成短絡試験試験用の短絡電流を与える電流源回路と、
供試遮断器に合成短絡試験用の過渡回復電圧及び回復電
圧を与える電圧源回路とを備えた遮断器用短絡試験装置
に係わるものである。
The present invention provides a current source circuit for supplying a short circuit current for a synthetic short circuit test to a circuit breaker under test,
The present invention relates to a short circuit tester for a circuit breaker, which comprises a circuit breaker under test and a voltage source circuit for supplying a transient recovery voltage and a recovery voltage for a composite short circuit test.

【0013】本発明においては、上記電流源回路に、第
1及び第2の電流源コンデンサと、第1及び第2の電流
源コンデンサに対してそれぞれ直列に接続されて該第1
及び第2の電流源コンデンサとともに第1及び第2の共
振回路を構成する第1及び第2のリアクトルとを設け
て、第1の共振回路の共振周波数を第2の共振回路の共
振周波数のほぼ2倍に設定し、第1及び第2の共振回路
の振動電流を重畳して供試遮断器に供給するようにし
た。
In the present invention, the first and second current source capacitors and the first and second current source capacitors are respectively connected in series to the current source circuit, and the first and second current source capacitors are connected in series.
And the first and second reactors forming the first and second resonance circuits together with the second current source capacitor, so that the resonance frequency of the first resonance circuit is substantially equal to the resonance frequency of the second resonance circuit. The oscillating currents of the first and second resonance circuits are superposed and supplied to the circuit breaker under test.

【0014】[0014]

【作用】上記のように電流源回路に第1及び第2の共振
回路を設けるとともに、第1の共振回路の共振周波数を
第2の共振回路の共振周波数のほぼ2倍に設定して試験
周波数とし、両共振回路を流れる振動電流を重畳して供
試遮断器に供給するようにすると、供試遮断器を流れる
電流を非対称な波形とすることができるため、非対称交
流電流の遮断試験を行うことができる。
As described above, the first and second resonance circuits are provided in the current source circuit, and the resonance frequency of the first resonance circuit is set to be approximately twice the resonance frequency of the second resonance circuit to set the test frequency. By superposing the oscillating current flowing through both resonance circuits and supplying it to the circuit breaker under test, the current flowing through the circuit breaker under test can be made to have an asymmetrical waveform, so an asymmetrical AC current breaking test is performed. be able to.

【0015】[0015]

【実施例】図1は本発明の実施例を示したもので、同図
において図5に示した従来の試験回路と同等の部分には
それぞれ同一の符号を付してある。本実施例において、
電圧源回路2の構成は図5に示した従来の試験装置と全
く同様である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an embodiment of the present invention. In FIG. 1, parts equivalent to those of the conventional test circuit shown in FIG. In this example,
The configuration of the voltage source circuit 2 is exactly the same as that of the conventional test device shown in FIG.

【0016】本発明においては、電流源回路1に、第1
の電流源コンデンサCi1と第2の電流源コンデンサCi2
とが設けられ、これらのコンデンサの一端は接地されて
いる。コンデンサCi1の非接地側の端子はスイッチS11
とダイオードD1 とを通して電流源充電器Ei の一端に
接続され、コンデンサCi2の非接地側端子はスイッチS
12とダイオードD2 とを通して電流源充電器Ei の一端
に接続されている。電流源充電器Ei の他端はスイッチ
S1'を通して接地されている。
In the present invention, the current source circuit 1 has a first
Current source capacitor Ci1 and second current source capacitor Ci2
Are provided, and one ends of these capacitors are grounded. The non-grounded terminal of the capacitor Ci1 is a switch S11.
Is connected to one end of the current source charger Ei through a diode D1 and a diode D1.
It is connected to one end of a current source charger Ei through 12 and a diode D2. The other end of the current source charger Ei is grounded through the switch S1 '.

【0017】第1の電流源コンデンサCi1の非接地側端
子はまた、スイッチS21を通して第1の電流源リアクト
ルLi1の一端に接続され、第2の電流源コンデンサCi2
の非接地側端子はスイッチS22を通して第2の電流源リ
アクトルLi2の一端に接続されている。第1及び第2の
電流源リアクトルLi1,Li2の他端は共通接続されて、
保護遮断器BSに接続されている。第1の電流源コンデ
ンサCi1と第1の電流源リアクトルLi1とにより第1の
共振回路が構成され、第2の電流源コンデンサCi2と第
2の電流源リアクトルLi2とにより第2の共振回路が構
成されている。第1の共振回路の共振周波数は第2の共
振回路の共振周波数の2倍に設定され、第1の共振回路
の振動電流と第2の共振回路の振動電流とを合成した結
果得られる振動電流の周波数が商用周波数に等しくなる
ようになっている。その他の点は図4に示した従来の試
験装置と同様である。
The non-grounded side terminal of the first current source capacitor Ci1 is also connected to one end of the first current source reactor Li1 through the switch S21, and the second current source capacitor Ci2.
The non-ground side terminal of is connected to one end of the second current source reactor Li2 through the switch S22. The other ends of the first and second current source reactors Li1 and Li2 are commonly connected,
It is connected to the protective circuit breaker BS. The first current source capacitor Ci1 and the first current source reactor Li1 form a first resonance circuit, and the second current source capacitor Ci2 and the second current source reactor Li2 form a second resonance circuit. Has been done. The resonance frequency of the first resonance circuit is set to twice the resonance frequency of the second resonance circuit, and the vibration current obtained as a result of combining the vibration current of the first resonance circuit and the vibration current of the second resonance circuit The frequency of is equal to the commercial frequency. Other points are the same as those of the conventional test apparatus shown in FIG.

【0018】上記の短絡試験装置を用いて遮断器の非対
称交流遮断試験を行う際には、先ずスイッチS11とS1'
とを一定時間閉じて第1の電流源コンデンサCi1を充電
する。次いでスイッチS12とS1'とを一定時間閉じて第
2の電流源コンデンサCi2を充電する。その後スイッチ
S3 ,S3'を一定時間閉じて、電圧源コンデンサCvを
充電する。
When performing the asymmetrical AC interruption test of the circuit breaker by using the above-mentioned short circuit test apparatus, first, the switches S11 and S1 '
And are closed for a certain period of time to charge the first current source capacitor Ci1. Then, the switches S12 and S1 'are closed for a certain period of time to charge the second current source capacitor Ci2. After that, the switches S3 and S3 'are closed for a certain period of time to charge the voltage source capacitor Cv.

【0019】コンデンサCi1,Ci2及びCvの充電が完
了した後、スイッチS21及びS22を閉じ、更に保護遮断
器BS及び補助遮断器Sn を閉じた後、投入スイッチM
Sに投入指令を与える。時刻to で投入スイッチMSが
閉じると第1の電流源コンデンサCi1がリアクトルLi1
と供試遮断器Sp とを通して放電し、第2の電源コンデ
ンサCi2がリアクトルLi2と共振遮断器Sp とを通して
放電する。このときコンデンサCi1とリアクトルLi2と
からなる第1の共振回路及びコンデンサCi2とリアクト
ルLi2とからなる第2の共振回路で共振が生じるため、
図3に示したように、第1の共振回路には振動電流i1が
流れ、第2の共振回路には振動電流i1の1/2の周波数
の振動電流i2が流れる。供試遮断器Sp にはこれらの電
流i1及びi2が重畳して流れるため、供試遮断器Sp に流
れる電流の波形は図3の電流i1+i2のように非対称な波
形となる。
After the charging of the capacitors Ci1, Ci2 and Cv is completed, the switches S21 and S22 are closed, and further the protective breaker BS and the auxiliary breaker Sn are closed, and then the closing switch M is closed.
Give a close command to S. When the closing switch MS is closed at time t0, the first current source capacitor Ci1 is connected to the reactor Li1.
And the circuit breaker Sp under test, and the second power supply capacitor Ci2 is discharged through the reactor Li2 and the resonance circuit breaker Sp. At this time, resonance occurs in the first resonance circuit formed of the capacitor Ci1 and the reactor Li2 and the second resonance circuit formed of the capacitor Ci2 and the reactor Li2.
As shown in FIG. 3, the oscillating current i1 flows through the first resonant circuit, and the oscillating current i2 having a frequency half that of the oscillating current i1 flows through the second resonant circuit. Since the currents i1 and i2 flow through the test circuit breaker Sp in a superimposed manner, the waveform of the current flowing through the test circuit breaker Sp has an asymmetrical waveform like the current i1 + i2 in FIG.

【0020】この様に、供試遮断器には非対称な波形の
交流電流が流れるため、この非対称電流の所定の波形の
部分を選んで試験を行うことにより、所定の非対称交流
電流の遮断試験を行うことができる。例えば図3の時刻
t1 ´で供試遮断器Sp に遮断指令を与えることによ
り、図5(B)のようなメジャーループ遮断試験を行う
ことができ、図3の時刻t1 ″で供試遮断器に遮断指令
を与えることにより、図5(C)のようなマイナールー
プ遮断試験を行うことができる。尚t2 ´はメジャール
ープ遮断に成功する場合の遮断完了時刻であり、t2 ″
はマイナーループ遮断に成功する場合の遮断完了時刻で
ある。電圧源回路2の動作は従来のものと同様であるの
で説明を省略する。
As described above, since an AC current having an asymmetrical waveform flows through the circuit breaker under test, a predetermined asymmetrical AC current interruption test can be performed by selecting a portion of the asymmetrical current having a predetermined waveform. It can be carried out. For example, by giving a breaking command to the test breaker Sp at time t1 'in FIG. 3, a major loop break test as shown in FIG. 5 (B) can be performed, and at time t1 "in FIG. 5C, it is possible to perform a minor loop break test, where t2 'is the cutoff completion time when the major loop cutoff is successful, and t2 ".
Is the cutoff completion time when the minor loop cutoff is successful. Since the operation of the voltage source circuit 2 is the same as the conventional one, the description thereof will be omitted.

【0021】上記の説明では、第1及び第2の電流源コ
ンデンサCi1及びCi2を順次充電するようにしたが、電
流源充電器Ei の容量が十分ある場合には、スイッチS
11及びS12を同時に閉じてコンデンサCi1及びCi2を同
時に充電するようにしてもよい。
In the above description, the first and second current source capacitors Ci1 and Ci2 are sequentially charged, but if the capacity of the current source charger Ei is sufficient, the switch S
11 and S12 may be closed at the same time to charge the capacitors Ci1 and Ci2 at the same time.

【0022】上記の実施例では、第1及び第2の電流源
コンデンサCi1及びCi2を同極性に充電したが、図2に
示すように、電流源充電器Ei と第1及び第2の電流源
コンデンサCi1及びCi2との間に切換スイッチSW1 ,
SW1 ´を設けて、第1及び第2の電流源コンデンサを
互いに逆極性に充電するようにしてもよい。
In the above embodiment, the first and second current source capacitors Ci1 and Ci2 are charged to the same polarity. However, as shown in FIG. 2, the current source charger Ei and the first and second current sources are connected to each other. A changeover switch SW1, between the capacitors Ci1 and Ci2,
SW1 'may be provided to charge the first and second current source capacitors in opposite polarities.

【0023】[0023]

【発明の効果】以上のように、本発明によれば、電流源
回路に第1及び第2の共振回路を設けるとともに、第1
の共振回路の共振周波数を第2の共振回路の共振周波数
のほぼ2倍に設定して試験周波数とし、両共振回路を流
れる振動電流を重畳して供試遮断器に供給するようにし
たので、供試遮断器を流れる電流を非対称な波形とする
ことができ、非対称交流電流の遮断試験を行うことがで
きる利点がある。
As described above, according to the present invention, the first and second resonant circuits are provided in the current source circuit and the first and second resonant circuits are provided.
Since the resonance frequency of the resonance circuit of 2 is set to be approximately twice the resonance frequency of the second resonance circuit as the test frequency, and the oscillating current flowing through both resonance circuits is superimposed and supplied to the circuit breaker under test, The current flowing through the circuit breaker under test has an asymmetrical waveform, which is advantageous in that a breaking test of an asymmetrical alternating current can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例を示す回路図である。FIG. 1 is a circuit diagram showing an embodiment of the present invention.

【図2】本発明の他の実施例の要部を示す回路図であ
る。
FIG. 2 is a circuit diagram showing a main part of another embodiment of the present invention.

【図3】図1の実施例で電流源回路に流れる電流の波形
を示す波形図である。
FIG. 3 is a waveform diagram showing a waveform of a current flowing through a current source circuit in the embodiment of FIG.

【図4】従来の試験回路の構成を示す回路図である。FIG. 4 is a circuit diagram showing a configuration of a conventional test circuit.

【図5】(A)ないし(C)はそれぞれ異なる遮断電流
波形を示した波形図である。
5A to 5C are waveform diagrams showing different breaking current waveforms.

【符号の説明】[Explanation of symbols]

1…電流源回路、2…電圧源回路、Ei …電流源充電
器、Ci1…第1の電流源コンデンサ、Ci2…第2の電流
源コンデンサ、Li1…第1の電流源リアクトル、Li2…
第2の電流源リアクトル、Sp …供試遮断器、Ev …電
圧源充電器、Cv…電圧源コンデンサ、Lv …電圧源リ
アクトル。
1 ... Current source circuit, 2 ... Voltage source circuit, Ei ... Current source charger, Ci1 ... First current source capacitor, Ci2 ... Second current source capacitor, Li1 ... First current source reactor, Li2 ...
Second current source reactor, Sp ... Test breaker, Ev ... Voltage source charger, Cv ... Voltage source capacitor, Lv ... Voltage source reactor.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】供試遮断器に合成短絡試験試験用の短絡電
流を与える電流源回路と、前記供試遮断器に合成短絡試
験用の過渡回復電圧及び回復電圧を与える電圧源回路と
を備えた遮断器用短絡試験装置において、 前記電流源回路は、第1及び第2の電流源コンデンサ
と、前記第1及び第2の電流源コンデンサに対してそれ
ぞれ直列に接続されて該第1及び第2の電流源コンデン
サとともに第1及び第2の共振回路を構成する第1及び
第2のリアクトルとを備えて、前記第1及び第2の共振
回路の振動電流を重畳させて前記供試遮断器に供給する
ように構成され、 前記第1の共振回路の共振周波数は第2の共振回路の共
振周波数のほぼ2倍に設定されていることを特徴とする
遮断器用短絡試験装置。
1. A current source circuit for supplying a short circuit current for a composite short circuit test to the circuit breaker under test, and a voltage source circuit for supplying a transient recovery voltage and a recovery voltage for a composite short circuit test to the circuit breaker under test. In the short circuit tester for circuit breaker, the current source circuit is connected in series to the first and second current source capacitors and the first and second current source capacitors, and the first and second current source capacitors are connected in series. And a first and a second reactor forming a first and a second resonance circuit together with the current source capacitor, and superimposing an oscillating current of the first and the second resonance circuit on the test breaker. A short circuit tester for a circuit breaker, characterized in that the resonance frequency of the first resonance circuit is set to be approximately twice the resonance frequency of the second resonance circuit.
JP27282591A 1991-10-21 1991-10-21 Short-circuit testing device for breaker Withdrawn JPH05113470A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27282591A JPH05113470A (en) 1991-10-21 1991-10-21 Short-circuit testing device for breaker

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27282591A JPH05113470A (en) 1991-10-21 1991-10-21 Short-circuit testing device for breaker

Publications (1)

Publication Number Publication Date
JPH05113470A true JPH05113470A (en) 1993-05-07

Family

ID=17519292

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27282591A Withdrawn JPH05113470A (en) 1991-10-21 1991-10-21 Short-circuit testing device for breaker

Country Status (1)

Country Link
JP (1) JPH05113470A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011066678A1 (en) * 2009-12-04 2011-06-09 中国电力科学研究院 Fault current experiment detection device for direct current transmission converter valve
WO2011072431A1 (en) * 2009-12-14 2011-06-23 中国电力科学研究院 Multi-injection test method for high voltage thyristor valve
WO2013107105A1 (en) * 2012-01-20 2013-07-25 荣信电力电子股份有限公司 Experimental station for detecting thyristor valve assembly
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WO2016009081A1 (en) * 2014-07-18 2016-01-21 Alstom Technology Ltd Synthetic test circuit
WO2016026913A1 (en) * 2014-08-19 2016-02-25 Alstom Technology Ltd Synthetic test circuit
WO2016034523A1 (en) * 2014-09-02 2016-03-10 Alstom Technology Ltd Synthetic test circuit
WO2016046047A1 (en) * 2014-09-22 2016-03-31 Alstom Technology Ltd Synthetic test circuit
CN114062908A (en) * 2020-08-06 2022-02-18 浙江绍兴苏泊尔生活电器有限公司 Relay state detection method, device and equipment for electromagnetic heating appliance

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011066678A1 (en) * 2009-12-04 2011-06-09 中国电力科学研究院 Fault current experiment detection device for direct current transmission converter valve
WO2011072431A1 (en) * 2009-12-14 2011-06-23 中国电力科学研究院 Multi-injection test method for high voltage thyristor valve
WO2013107105A1 (en) * 2012-01-20 2013-07-25 荣信电力电子股份有限公司 Experimental station for detecting thyristor valve assembly
EP2975420A1 (en) * 2014-07-18 2016-01-20 Alstom Technology Ltd Synthetic test circuit
WO2016009081A1 (en) * 2014-07-18 2016-01-21 Alstom Technology Ltd Synthetic test circuit
WO2016026913A1 (en) * 2014-08-19 2016-02-25 Alstom Technology Ltd Synthetic test circuit
WO2016034523A1 (en) * 2014-09-02 2016-03-10 Alstom Technology Ltd Synthetic test circuit
WO2016046047A1 (en) * 2014-09-22 2016-03-31 Alstom Technology Ltd Synthetic test circuit
CN114062908A (en) * 2020-08-06 2022-02-18 浙江绍兴苏泊尔生活电器有限公司 Relay state detection method, device and equipment for electromagnetic heating appliance
CN114062908B (en) * 2020-08-06 2023-07-04 浙江绍兴苏泊尔生活电器有限公司 Relay state detection method, device and equipment of electromagnetic heating appliance

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Effective date: 19990107