JP2000304835A - Test device for circuit-breaker - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a test device capable of imitaing breaking phenomenon of a second phase and a third phase in a single body test of a circuit-breaker by a Weil synthetic test method. SOLUTION: In a Weil synthetic test device which supplies a short current to a sample circuit-breaker 6 from a current source circuit to apply a restoration voltage from a voltage source circuit when a current of the sample circuit- breaker is broken, a capacitor 21 is initially charged in a direct current charging device 22, a reactor 23 for generating a vibration current between the capacitor 21 and it is connected in series, and an auxiliary circuit-breaker 24 is turned on during a period of breaking current of a final half wave of the sample circuit-breaker. Consequently, a positive or negative vibration current of half cycle period generated in a series circuit of the capacitor 21 and the reactor 23 is superimposed on a breaking current of the sample circuit-breaker to obtain a breaking current wave shape imitating breaking current wave shapes IE, IR of a second phase and a third phase strictly.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test apparatus for performing a breaking test of a circuit breaker by a synthetic test (Weyl synthesis test, squeeze synthesis test) or a single-phase direct test.
The present invention relates to a test apparatus that simulates a phase and third phase current interruption phenomenon.

[0002]

2. Description of the Related Art As methods for testing the breaking performance of a circuit breaker, there are a Weyl synthesis test and a squeez synthesis test method. There is also a single-phase direct test method.

FIG. 5 shows a Weyl synthesis test circuit. The current source circuit is connected to the protective circuit breaker 2 from the short-circuit generator 1
A low-voltage large current is supplied to the test circuit breaker 6 through the reactor 3, the closing switch 4, and the auxiliary circuit breaker 5.

In a voltage source circuit (Weyl circuit), a capacitor 7 is charged in advance by a DC charging device 8 at a high voltage, and a trigger of a gap 9 causes a reactor 10 to
To supply a low current and a high voltage to the test circuit breaker 6 through
This voltage source circuit supplies the voltage source current to the test circuit breaker 6 immediately before the test circuit breaker 6 interrupts the current with the low voltage and large current from the current source circuit. A recovery voltage simulating an actual load is applied. Capacitor 11
The resistor 12 and the resistor 12 are for adjusting the peak time of the transient recovery voltage.

FIG. 6 shows a skits synthesis test circuit. The current source circuit is the same as the Weyl synthesis test circuit, and applies a recovery voltage waveform to the test circuit breaker 6 from the step-up transformer 13 via the resistor 14 to the voltage source circuit. The step-up transformer 13 is supplied with current from the current source circuit on the primary (low voltage) side, and generates a recovery voltage on the secondary (high voltage) side by interrupting the current of the circuit breaker 6 under test.

The single-phase direct test circuit is as shown in FIG. 7, and the current source circuit includes a capacitor 1 via a reactor 3.
5 and a current limiting resistor 16 are connected in parallel with the series circuit of the circuit breakers 5 and 6, and after supplying a low voltage and large current from the current source circuit to the circuit breaker 6, the reactor is cut off by the current cutoff of the circuit breaker 6. A high recovery voltage is applied to the circuit breaker 6 from the capacitor 15 by a resonance operation between the capacitor 3 and the capacitor 15.

[0007]

A circuit breaker is provided for each phase (three phases) in an actual power system. In this actual system, when a short circuit current flows through the circuit breaker of each phase due to the occurrence of an accident, the current is interrupted by the phenomenon shown in FIG. When one of the three-phase circuit breakers interrupts the current (interruption of the first phase), the power system becomes a single-phase circuit with the remaining two phases. At this time, the current IR short-circuit current of the breaker of the second and third phases are made at a higher frequency than the fundamental frequency (50H _Z or 60H _Z), the current IE becomes lower frequency
Is generated and the cutoff operation is performed.

[0008] In response to such a phenomenon, in the conventional test method, only the first phase interruption phenomenon was performed, and the second and third phase interruption phenomena were not confirmed. The reason for this is that the cutoff current and recovery voltage of the second and third phases are smaller than those of the first phase, so that the first phase cutoff condition is a more severe test. . Further, test equipment such as a Weyl synthesis test method has only a unit test function for testing one circuit breaker.

However, in the strict breaking performance test,
It is also desirable to test the interruption phenomena of the second and third phases and evaluate their interruption performance.

For this test, a test method is considered in which the voltage source circuit of the Weyl synthesis test facility is simply modified to generate a voltage 0.87 times the standard voltage of the first phase. However, in this test method, the cutoff waveforms of the second and third phases are different from the actual cutoff current waveforms IR and IE. The waveform in this test is as shown in FIG. 9, and the arc energy from opening of the circuit breaker to interruption is different from the actual three-phase direct test, and a strict interruption performance test could not be performed.

An object of the present invention is to provide a test apparatus capable of accurately simulating the interruption phenomenon of the second and third phases in a unit test of a circuit breaker by a Weyl synthesis test method or the like.

[0012]

According to the present invention, there is provided a circuit for superimposing a positive or negative half-period oscillating current on the last half-wave cut-off current period of a circuit breaker in a conventional Weyl synthesis test apparatus or the like. Is provided so that a simulated waveform of the second or third phase cutoff current waveform IE or IR of the power system is obtained as the current cutoff waveform of the circuit breaker under test, and has the following configuration.

A short-circuit current is supplied to the test circuit breaker, and a recovery voltage is applied when the current of the test circuit breaker is cut off to test the breaking performance of the test circuit breaker. In a single-phase direct test circuit breaker test equipment, a capacitor that is initially charged,
A reactor constituting a series circuit with the capacitor, an auxiliary circuit breaker capable of connecting the series circuit of the capacitor and the reactor in parallel to the circuit breaker, and the auxiliary circuit breaker during a final half-wave cut-off current period of the circuit breaker under test. And a control means for turning on the circuit breaker and superimposing a positive or negative half-period oscillating current generated in the series circuit of the capacitor and the reactor on a breaking current of the circuit breaker under test.

[0014]

FIG. 1 is a circuit diagram showing an embodiment of the present invention, in which the present invention is applied to a Weyl synthesis test circuit. 5 differs from FIG. 5 in that circuit elements 21 to 25 are provided.

The capacitor 21 is initially charged positively or negatively by the DC charging device 22. This capacitor 21
The reactor 23 connected in series with the capacitor 21 generates a half-wave oscillating current by resonance with the capacitor 21. This oscillating current is supplied to the series circuit of the circuit breaker 5 and the test circuit breaker 6 by closing (turning on) the auxiliary circuit breaker 24. The auxiliary circuit breaker 25 blocks the oscillating current from the capacitor 21 from flowing into the current source circuit.

In this embodiment, the polarity of the oscillating current I _CL generated from the capacitor 21 and the reactor 23 depends on the polarity when the current I _AG supplied from the current source circuit to the circuit breaker 6 is cut off, and the second polarity. Phase and third phase breaking current waveform I
Switching is performed according to the difference between R and IE to be simulated. This switching is performed by switching the charging direction of the capacitor 21 by the DC charging device 22.

In the control procedure according to the present embodiment, the auxiliary circuit breakers 5 and 25 are opened simultaneously with the opening of the test circuit breaker 6. The final half-wave period of the breaking current at this opening, the auxiliary circuit breaker 24 and closing, superimposing the oscillating current I _CL half-wave to the series circuit of the cross-sectional unit 6 and breaker 5 etc. If you try subjected from capacitor 21 side Let it. The frequency of the oscillating current _ICL is
And the time constant of the reactor 23. Further, the level of the oscillation current I _CL is determined by the charging voltage of the capacitor 21.

Here, the second and third phase cutoff current waveforms IE
Is simulated, the short-circuit current generated from the current source circuit is set to 0.87 times that in the case of the first phase simulation, and the oscillation current I _CL having the same polarity as the current I _AG is supplied from the capacitor 21 side.

The test current waveform at this time is shown in FIG.
As shown in FIG. 5, the cutoff current waveform IE having a frequency lower than the fundamental frequency can be simulated by superimposing the oscillation current _ICL . Then, when the test circuit breaker 6 is cut off, a Weyl circuit current can be supplied from the voltage source circuit.

Similarly, the second and third phase cut-off current waveforms IR
Is simulated, the short-circuit current generated from the current source circuit is set to be 0.87 times that in the case of the first phase simulation, and the oscillation current I _CL having the opposite polarity to the current I _AG is supplied from the capacitor 21 side.

The test current waveform at this time is shown in FIG.
The current IR becomes higher than the fundamental frequency due to the superimposition of the oscillating current _ICL .

Therefore, according to the present embodiment, the cutoff current waveforms IR and IE of the second and third phases generated in the circuit breaker provided in the actual power system are strictly simulated, and the arc energy is accurately approximated. Testing can be performed and the method of evaluating the circuit breaker can be improved.

FIG. 3 is a circuit diagram showing another embodiment of the present invention, in which the present invention is applied to a skies synthesis test circuit. 6 differs from FIG. 6 in that circuit elements 31 to 35 are provided.

In this embodiment, a capacitor 31, a DC charging device 32, a reactor 33, an auxiliary circuit breaker 34,
35 is the same circuit constant and oscillating current I _CL as in FIG.
Are determined, and the test circuit breaker 6 can perform a test simulating the second and third phase cutoff current waveforms IR or IE.

Similarly, FIG. 4 shows a case where the present invention is applied to a single-phase direct test circuit. A capacitor 41, a DC charging device 42, a reactor 43, and auxiliary circuit breakers 44 and 45 which are added to the conventional test circuit of FIG. polarity when the same circuit constant and oscillating current I _CL in FIG. 1 or FIG. 3, level, generation timing is determined, provided it can try second intercepted unit 6, simulating the breaking current waveform IR or IE phase 3 Can test.

[0026]

As described above, according to the present invention, by providing a circuit for superimposing a positive or negative half-period oscillating current during the last half-wave cut-off current period of the circuit breaker under test,
A waveform accurately simulating the second and third phase cutoff current waveforms IE or IR of the power system can be obtained as the current cutoff waveform of the circuit breaker under test. As a result, a test that accurately approximates the arc energy of the circuit breaker can be performed, and the evaluation method of the circuit breaker can be improved.

[Brief description of the drawings]

FIG. 1 is a Weyl synthesis test circuit diagram showing an embodiment of the present invention.

FIG. 2 is a composite waveform of second and third phase cutoff current waveforms IE and IR in the embodiment.

FIG. 3 is a circuit diagram of a skies synthesis test showing another embodiment of the present invention.

FIG. 4 is a single-phase direct test circuit diagram showing another embodiment of the present invention.

FIG. 5 is a conventional Weyl synthesis test circuit diagram.

FIG. 6 is a circuit diagram of a conventional skies synthesis test.

FIG. 7 is a conventional single-phase direct test circuit diagram.

FIG. 8 shows waveforms of second and third phase cutoff currents IE and IR in an actual power system.

FIG. 9 shows conventional test waveforms for the second and third phases.

[Explanation of symbols]

1 ... generator 5,24,25,34,35 ... auxiliary breaker 6 ... test etc. If you try sectional vessel 8,22,32,42 ... DC charging device 21, 31, 41 ... capacitor for generating an oscillating current I _CL 23, 33, 43 ... reactor for generating the oscillating current I _CL

Claims (1)

[Claims] 1. A Weyl synthesis test method or a squeezing synthesis test for supplying a short-circuit current to a circuit breaker under test, applying a recovery voltage when the circuit breaker current is cut off, and testing the breaking performance of the circuit breaker under test. In a circuit breaker or single-phase direct test circuit breaker test apparatus, a capacitor that is initially charged, a reactor that forms a series circuit with the capacitor, and a series circuit of the capacitor and the reactor can be connected in parallel to the circuit breaker under test. An auxiliary circuit breaker, and the auxiliary circuit breaker is turned on during a final half-wave cutoff current period of the test circuit breaker, and a positive or negative half cycle oscillating current generated in a series circuit of the capacitor and the reactor is supplied to the auxiliary circuit breaker. A control device for superimposing on a breaking current of a test circuit breaker.