JPH05108167A - Controller - Google Patents

Controller

Info

Publication number
JPH05108167A
JPH05108167A JP3266123A JP26612391A JPH05108167A JP H05108167 A JPH05108167 A JP H05108167A JP 3266123 A JP3266123 A JP 3266123A JP 26612391 A JP26612391 A JP 26612391A JP H05108167 A JPH05108167 A JP H05108167A
Authority
JP
Japan
Prior art keywords
abnormality
controller
gas
mass flow
flow rate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3266123A
Other languages
Japanese (ja)
Inventor
Yoshihiko Okamoto
佳彦 岡本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3266123A priority Critical patent/JPH05108167A/en
Publication of JPH05108167A publication Critical patent/JPH05108167A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To detect the abnormality of a fluid control means and a controller itself by monitoring the fluctuation state of operation for a prescribed period of time from the start of the control of a mass flow controller with a sequence controller and detecting the abnormality of the mass flow controller. CONSTITUTION:A sequence controller 1, in which a set value for a flowrate and the allowable range and monitoring time of the flowrate are set, monitors the fluctuation of a gas flowrate within the monitoring time set immediately after starting gas supply and detects the abnormality of gas flowrate. When a mass flow controller 2 is abnormal, a set flowrate range (set value + or -2%) is not reached within 15 seconds and the abnormality is detected by the sequence controller 1. The fluctuation which occurs at the early stage of the supply of gas is not judged as abnormality because it remains within 15 seconds the same as that in a normal case. That is, the abnormal operation caused by the abnormality of the fluid control means 18 detected but the abnormal operation caused the other factor is not detected.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明はガスなどの流量を制御
する制御装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a controller for controlling the flow rate of gas or the like.

【0002】[0002]

【従来の技術】図4は、従来のガス流量制御装置の構成
図である。1aはシーケンスコントローラであり、図5
に示すグラフのように、設定値及びその許容範囲(±2
%)とこの許容範囲から外れた状態を監視する監視時間
とを設定してあり、ガスの流量が設定値の許容範囲を外
れた状態で監視時間を越えた場合にガスの流量異常とし
て検出する。
2. Description of the Related Art FIG. 4 is a block diagram of a conventional gas flow rate control device. 1a is a sequence controller, which is shown in FIG.
As shown in the graph, the set value and its allowable range (± 2
%) And a monitoring time for monitoring a state outside this allowable range are set, and if the gas flow rate is outside the allowable range of the set value and exceeds the monitoring time, it is detected as an abnormal gas flow rate. ..

【0003】2はマスフローコントローラであり、精度
が±2%以内で応答時間が3秒以内の性能を持ち、最大
流量が10l/分で使用圧力範囲が0.5〜3.0kgf/
cm2の仕様を有し、シーケンスコントローラ1に設定さ
れた値にガスの流量を制御する。シーケンスコントロー
ラ1aは、マスフローコントローラ2にガスの流量と流
している時間を設定し、加えてマスフローコントローラ
の異常を検出する。
Reference numeral 2 is a mass flow controller having an accuracy within ± 2% and a response time within 3 seconds, a maximum flow rate of 10 l / min and a working pressure range of 0.5 to 3.0 kgf /.
It has a specification of cm 2 and controls the gas flow rate to a value set in the sequence controller 1. The sequence controller 1a sets the flow rate of the gas and the flowing time in the mass flow controller 2, and additionally detects an abnormality in the mass flow controller.

【0004】図6は図4に示した従来のガス流量制御装
置を使用した半導体製造装置のガス供給系の配管図であ
る。2a,2b,2cは3本のガスラインにそれぞれ設
けられた図4のマスフローコントローラ2と同一のマス
フローコントローラ、3はガス供給元の圧力を0.5kg
f/cm2に調整する減圧弁である。
FIG. 6 is a piping diagram of a gas supply system of a semiconductor manufacturing apparatus using the conventional gas flow rate control device shown in FIG. The mass flow controllers 2a, 2b, 2c are the same as the mass flow controller 2 of FIG. 4 provided in the three gas lines, respectively, and the pressure of the gas supply source is 0.5 kg.
It is a pressure reducing valve that is adjusted to f / cm 2 .

【0005】ガスが流れていない状態からマスフローコ
ントローラ2の最大流量である10l/分を流し始めた
ら、供給ガス圧が0.5kgf/cm2なので各マスフローコ
ントローラ2a,2b,2cにかかるガスの圧力は0.
5kgf/cm2以下になる。
When a maximum flow rate of 10 l / min of the mass flow controller 2 is started in a state where no gas is flowing, the gas pressure applied to each mass flow controller 2a, 2b, 2c is 0.5 kgf / cm 2 because the supply gas pressure is 0.5 kgf / cm 2. Is 0.
It will be less than 5 kgf / cm 2 .

【0006】このガス圧では、マスフローコントローラ
2の性能を保証する仕様値からはずれており、図7に示
すのようにガス流量が設定値の許容範囲内に安定するま
でに長い時間(10秒)がかかってしまう。
This gas pressure deviates from the specification value that guarantees the performance of the mass flow controller 2, and as shown in FIG. 7, it takes a long time (10 seconds) until the gas flow rate stabilizes within the allowable range of the set value. It will cost you.

【0007】ここで、シーケンスコントローラ1aの内
容が図7のようにマスフローコントローラ2の性能に合
わせて監視時間を3秒と設定してある場合、ガスの圧力
がマスフローコントローラ2の規格値(0.5kgf/c
m2)以下になったため流量が安定するまで3秒以上(1
0秒)かかっているので、シーケンスコントローラ1a
はこの状態を異常と判断する。
Here, when the content of the sequence controller 1a is set to a monitoring time of 3 seconds in accordance with the performance of the mass flow controller 2 as shown in FIG. 7, the gas pressure is the standard value (0. 5kgf / c
Since it has become less than m 2 ), it will take 3 seconds or more (1
0 seconds), so the sequence controller 1a
Judges this state to be abnormal.

【0008】この状態は初期の供給ガス圧力のふらつき
でありマスフローコントローラ2の異常ではない。従っ
てシーケンスコントローラ1aは、前記のような不具合
を避けるため、通常マスフローコントローラ2の性能も
考慮して図5に示すように設定値の許容範囲から外れた
流量値が1分以上継続した場合、これを異常とみなすよ
うにしている。
This state is an initial fluctuation of the supply gas pressure and is not an abnormality of the mass flow controller 2. Therefore, in order to avoid the above-mentioned inconvenience, the sequence controller 1a considers the performance of the normal mass flow controller 2 as shown in FIG. 5, and when the flow rate value outside the allowable range of the set value continues for 1 minute or more, Is considered abnormal.

【0009】[0009]

【発明が解決しようとする課題】従来の流量制御装置は
以上のように構成されいるので、供給ガス圧力のふらつ
きでなくマスフローコントローラ2自身が図8に示すよ
うに応答時間が初期性能を維持していたときより長くな
るような劣化をしていた場合、シーケンスコントローラ
1aはこの状態ををマスフローコントローラの異常とし
て検出できない。
Since the conventional flow control device is constructed as described above, the mass flow controller 2 itself maintains the initial performance as shown in FIG. 8 instead of the fluctuation of the supply gas pressure. If the deterioration is such that it becomes longer than it was, the sequence controller 1a cannot detect this state as an abnormality of the mass flow controller.

【0010】一方、シーケンスコントローラ1aの設定
のモニタ時間を短くするとマスフローコントローラ2の
異常でない供給ガス圧の変動等の他の異常を検出するよ
うになる。
On the other hand, if the monitoring time for setting the sequence controller 1a is shortened, other abnormalities such as fluctuations in the supply gas pressure that are not abnormal in the mass flow controller 2 will be detected.

【0011】この発明は上記のような問題点を解消する
ためになされたもので、流体制御手段自身の異常を検出
できる設定監視手段を有する制御装置を提供することを
目的とする。
The present invention has been made to solve the above problems, and an object thereof is to provide a control device having a setting monitoring means capable of detecting an abnormality in the fluid control means itself.

【0012】[0012]

【課題を解決するための手段】この発明の制御装置は、
ある動作の開始直後もしくは変更直後の一定時間その動
作を監視し、その状態が設定値と異なるとき異常とする
設定監視手段を有するようにしたものである。
The control device of the present invention comprises:
The operation is monitored for a certain period of time immediately after the start or change of the operation, and a setting monitoring unit is provided to make an abnormality when the state is different from the set value.

【0013】[0013]

【作用】流体制御手段の異常による動作の異常を検出
し、他の要因による動作の異常は検出しない。
The operation abnormality due to the abnormality of the fluid control means is detected, and the operation abnormality due to other factors is not detected.

【0014】[0014]

【実施例】以下本発明の1実施例を図を参照して説明す
る。図1は本発明の1実施例を示す流量制御装置の構成
図である。1は、図2に示すグラフのような流量の設定
値とその許容範囲(±2%)と監視時間を設定してある
シーケンスコントローラであり、ガス供給開始直後の設
定した監視時間内のガス流量変動を監視しガスの流量異
常を検出する。
An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram of a flow rate control device showing one embodiment of the present invention. Reference numeral 1 is a sequence controller in which a set value of flow rate as shown in the graph of FIG. 2, its allowable range (± 2%) and a monitoring time are set, and the gas flow rate within the set monitoring time immediately after starting the gas supply. The fluctuation is monitored to detect an abnormal gas flow rate.

【0015】2は、図4と同一のマスフローコントロー
ラである。マスフローコントローラ2が異常を来たして
いる場合は、図3に示すように正常な場合と異なり15
秒以内に設定流量範囲(設定値±2%)に到達せず、シ
ーケンスコントローラ1によって異常と判断される。
Reference numeral 2 is the same mass flow controller as in FIG. When the mass flow controller 2 is abnormal, it differs from the normal case as shown in FIG.
Within a second, the set flow rate range (set value ± 2%) is not reached, and the sequence controller 1 determines that there is an abnormality.

【0016】一方、ガスの供給初期に発生するふらつき
は、図3に示す正常な場合と同様に15秒以内に収まる
ので異常と判断されない。
On the other hand, the fluctuation that occurs at the initial stage of gas supply is within 15 seconds as in the normal case shown in FIG. 3, so it is not judged to be abnormal.

【0017】[0017]

【発明の効果】以上のように本発明によれば、設定監視
手段にて制御開始直後の動作不良を検出できるようにし
たので、装置の動作環境のふらつきなどの異常ではなく
流体制御手段の異常を検出できる。
As described above, according to the present invention, since the operation failure immediately after the start of control can be detected by the setting monitoring means, the abnormality of the fluid control means is not an abnormality such as the fluctuation of the operating environment of the apparatus. Can be detected.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の1実施例を示すガス流量制御装置の構
成図である。
FIG. 1 is a configuration diagram of a gas flow rate control device showing an embodiment of the present invention.

【図2】図1に示したガス流量制御装置の監視内容を示
した時間と流量の相関図である。
FIG. 2 is a correlation diagram of time and flow rate showing monitoring contents of the gas flow rate control device shown in FIG.

【図3】図1に示したガス流量制御装置の正常動作と異
常動作を示した時間と流量の相関図である。
FIG. 3 is a time-flow correlation diagram showing normal operation and abnormal operation of the gas flow rate control device shown in FIG.

【図4】従来のガス流量制御装置を示した構成図であ
る。
FIG. 4 is a configuration diagram showing a conventional gas flow rate control device.

【図5】図4に示したガス流量制御装置の監視内容を示
した時間と流量の相関図である。
5 is a correlation diagram of time and flow rate showing monitoring contents of the gas flow rate control device shown in FIG.

【図6】図4に示した従来のガス流量制御装置を使用し
た半導体製造装置のガス供給系の配管図である。
FIG. 6 is a piping diagram of a gas supply system of a semiconductor manufacturing apparatus using the conventional gas flow rate control device shown in FIG.

【図7】図6に示したガス供給系を用いてガス供給を行
なった場合の時間と流量の相関図である。
FIG. 7 is a correlation diagram of time and flow rate when gas is supplied using the gas supply system shown in FIG.

【図8】マスフローコントローラに異常があるときの時
間と流量の相関図である。
FIG. 8 is a correlation diagram of time and flow rate when there is an abnormality in the mass flow controller.

【符号の説明】[Explanation of symbols]

1 シーケンスコントローラ 2 マスフローコントローラ 1 Sequence controller 2 Mass flow controller

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 流体の体積流量を制御する流量制御手段
と、 前記流体制御手段の動作条件が設定してあり前記流体制
御手段の制御の動作開始直後の前記動作の変動を監視す
ることにより前記流体制御手段の異常を検出する設定監
視手段とから構成された制御装置。
1. A flow rate control means for controlling a volumetric flow rate of a fluid, and an operating condition of the fluid control means is set to monitor the fluctuation of the operation immediately after the control operation of the fluid control means is started. A control device comprising a setting monitoring means for detecting an abnormality in the fluid control means.
JP3266123A 1991-10-15 1991-10-15 Controller Pending JPH05108167A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3266123A JPH05108167A (en) 1991-10-15 1991-10-15 Controller

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3266123A JPH05108167A (en) 1991-10-15 1991-10-15 Controller

Publications (1)

Publication Number Publication Date
JPH05108167A true JPH05108167A (en) 1993-04-30

Family

ID=17426648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3266123A Pending JPH05108167A (en) 1991-10-15 1991-10-15 Controller

Country Status (1)

Country Link
JP (1) JPH05108167A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0784649A (en) * 1993-09-14 1995-03-31 Kitz Corp Flow rate control unit having both of constant flow rate function and variable flow rate function
US7108009B2 (en) 2002-11-15 2006-09-19 Renesas Technology Corp. Semiconductor manufacturing apparatus enabling inspection of mass flow controller maintaining connection thereto
JP2008091518A (en) * 2006-09-29 2008-04-17 Hitachi Kokusai Electric Inc Method for detecting abnormality
JP2010093047A (en) * 2008-10-08 2010-04-22 Ulvac Japan Ltd Management system of processing device
JP2013033967A (en) * 2012-08-09 2013-02-14 Hitachi Kokusai Electric Inc Substrate processing apparatus abnormality detection method and substrate processing apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0784649A (en) * 1993-09-14 1995-03-31 Kitz Corp Flow rate control unit having both of constant flow rate function and variable flow rate function
US7108009B2 (en) 2002-11-15 2006-09-19 Renesas Technology Corp. Semiconductor manufacturing apparatus enabling inspection of mass flow controller maintaining connection thereto
US7658204B2 (en) 2002-11-15 2010-02-09 Renesas Technology Corp. Semiconductor manufacturing apparatus enabling inspection of mass flow controller maintaining connection thereto
JP2008091518A (en) * 2006-09-29 2008-04-17 Hitachi Kokusai Electric Inc Method for detecting abnormality
JP2010093047A (en) * 2008-10-08 2010-04-22 Ulvac Japan Ltd Management system of processing device
JP2013033967A (en) * 2012-08-09 2013-02-14 Hitachi Kokusai Electric Inc Substrate processing apparatus abnormality detection method and substrate processing apparatus

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