JPH05106045A - Metallic acetyl acetonato-complex for forming oxide thin film - Google Patents

Metallic acetyl acetonato-complex for forming oxide thin film

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Publication number
JPH05106045A
JPH05106045A JP33296991A JP33296991A JPH05106045A JP H05106045 A JPH05106045 A JP H05106045A JP 33296991 A JP33296991 A JP 33296991A JP 33296991 A JP33296991 A JP 33296991A JP H05106045 A JPH05106045 A JP H05106045A
Authority
JP
Japan
Prior art keywords
thin film
acac
complex
oxide thin
adduct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33296991A
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Japanese (ja)
Other versions
JPH08975B2 (en
Inventor
Takashi Okazaki
高志 岡崎
Koichi Tokutome
功一 徳留
Takeaki Harada
武昭 原田
Yasunari Baba
康徳 馬場
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Tosoh Finechem Corp
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Tosoh Finechem Corp
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Priority to JP33296991A priority Critical patent/JPH08975B2/en
Publication of JPH05106045A publication Critical patent/JPH05106045A/en
Publication of JPH08975B2 publication Critical patent/JPH08975B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To develop a raw material which can form an oxide thin film with good reproducibility by a chemical vapor deposition method at a low temp. by combining a metallic complex contg. specific acetyl acetone and the adduct of an orthophenanthroline deriv., etc. CONSTITUTION:The metal acetyl acetonato [Ba(acac)2(phen)2]complex is produced by bringing the adduct of the orthophenanthroline deriv., etc., such as 1,10-phenanthroline [phen], or the adduct of a 2,2'-pyridyl deriv., such as 4,4'-dimethyl-2,2'-bipyridyl, into reaction with the bis-2,4-pentadionatobarium [Ba(acac)2] contg. the acetyl acetone expressed by general formula [I] (where M is a metal of (n) valency) as the orientation position. The oxide thin film is stably formed with the excellent reproducibility on a substrate by a vapor phase deposition method under a reduced pressure using such complex as the raw material and using the reaction with O2, water, NO, O3, etc., and He, Ar, etc., as a carrier gas.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、金属アセチルアセトナ
ト錯体の付加体からなり、気相堆積法等で用いられる酸
化物薄膜形成用金属錯体に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a metal complex for forming an oxide thin film, which is composed of an adduct of a metal acetylacetonato complex and is used in a vapor deposition method or the like.

【0002】[0002]

【従来の技術及び発明が解決しようとする課題】従来、
アルカリ土類金属のβ−ジケトン錯体について、Ino
rganicChemistry Vol.2No.
1,P.73,1963にその合成法及び精製法、また
Analitical Chemistry Vol.
42 No.14,P.1828,1970に熱重量減
少による気化特性等が報告されている。化学気相堆積法
でこれらの原料を使用する場合、気化温度が高いため配
管などを200℃以上に加熱しなければならないないな
どの問題があった。このために気化温度を低温化する事
が望まれていた。キャリヤーガス中にテトラヒドロフラ
ンもしくは1,4−ジオキサンを混合させ原料ガスの気
化温度を低温化する試みが1989年秋季第50回応用
物理学会学術講演会講演番号30a−M−2で報告され
ている。
2. Description of the Related Art Conventionally, the problems to be solved by the invention
Regarding β-diketone complexes of alkaline earth metals, Ino
organic Chemistry Vol. 2 No.
1, P. 73, 1963, the synthetic method and the purification method, and Analytical Chemistry Vol.
42 No. 14, P.I. In 1828 and 1970, vaporization characteristics and the like due to thermal weight reduction are reported. When these raw materials are used in the chemical vapor deposition method, there is a problem that the vaporization temperature is high and the piping and the like have to be heated to 200 ° C. or higher. For this reason, it has been desired to lower the vaporization temperature. An attempt to lower the vaporization temperature of a raw material gas by mixing tetrahydrofuran or 1,4-dioxane into a carrier gas has been reported in Autumn 1989, 50th Annual Meeting of the Society of Applied Physics, Lecture No. 30a-M-2.

【0003】また、EUROPEAN PATENT
APPLICATION90201485.1にアルカ
リ土類金属β−ジケトン錯体と中性酸素もしくは中性窒
素供与体配位子からなる揮発性金属錯体により原料ガス
の供給量が安定化されることが報告されている。しか
し、テトラヒドロフランをキャリアーガス中に混合させ
る方法は多量のテトラヒドロフランが薄膜製造時に存在
するためにこの分解物が不純物として取り込まれ易い。
また、M(DPM)−L{M=Ba,Sr,Ca,
Mg:L=アルコール,環状エーテル、非環状エーテ
ル,ケトン,ジアミン,アルデヒド,ピリジン,アミ
イ,イミン,ジイミン}は、気化するのに必要な200
℃以上の温度に加熱すると付加させていた配位子Lが解
離してしまい初期の気化特性が継続できないことが解っ
た。
In addition, EUROPEAN PATEN
It has been reported in APPLICATION 902014855.1 that the supply amount of the raw material gas is stabilized by a volatile metal complex composed of an alkaline earth metal β-diketone complex and a neutral oxygen or neutral nitrogen donor ligand. However, in the method in which tetrahydrofuran is mixed in the carrier gas, a large amount of tetrahydrofuran is present during the production of the thin film, and thus this decomposition product is easily incorporated as an impurity.
In addition, M (DPM) 2 −L 2 {M = Ba, Sr, Ca,
Mg: L = alcohol, cyclic ether, acyclic ether, ketone, diamine, aldehyde, pyridine, amii, imine, diimine} is required to vaporize 200
It was found that when heated to a temperature of ℃ or more, the added ligand L is dissociated and the initial vaporization characteristics cannot be continued.

【0004】本発明者は鋭意検討を行った結果、請求項
1にしめすアセチルアセトンを配位子とする金属錯体と
オルトフェナントロリン誘導体の付加体または2,2−
ビピリジル誘導体の付加体から成る化合物の気化温度が
著しく低温化でき、酸化物薄膜形成用の材料として有用
であることを見いだし本発明を完成するに至った。
As a result of extensive studies, the present inventor has found that an adduct of a metal complex having an acetylacetone ligand as a ligand and an orthophenanthroline derivative or 2,2-
We have found that the vaporization temperature of a compound consisting of an adduct of a bipyridyl derivative can be extremely lowered, and that it is useful as a material for forming an oxide thin film, and completed the present invention.

【0005】[0005]

【課題を解決するための手段】すなわち本発明は 一般式 (式中Mはn価の金属である。)で示されるアセチルア
セトンを配位子とする金属錯体とオルトフェナントロリ
ン誘導体の付加体または2,2′−ビピリジル誘導体の
付加体から成ることを特徴とする酸化物薄膜形成用金属
アセチルアセトナト錯体である。
That is, the present invention is based on the general formula (Wherein M is an n-valent metal) and a metal complex having acetylacetone as a ligand and an adduct of an orthophenanthroline derivative or an adduct of a 2,2′-bipyridyl derivative. It is a metal acetylacetonato complex for forming an oxide thin film.

【0006】[0006]

【作用】以下、本発明について更に詳しく説明する。本
発明は、アセチルアセトンを配位子とする金属錯体とオ
ルトフェナントロリン誘導体の付加体または2,2′−
ビピリジル誘導体の付加体から成る化合物であることを
最も重要な特徴とする。
The present invention will be described in more detail below. The present invention relates to an adduct of a metal complex having acetylacetone as a ligand and an orthophenanthroline derivative or 2,2'-
The most important feature is that the compound is an adduct of a bipyridyl derivative.

【0007】このように付加体としての金属アセチルア
セトナト錯体は、酸化物薄膜形成用原料として優れてい
る。従来のものに比べて気化温度が著しく低温化できて
おり例えばBa(DPM)(phen)が圧力15
Torr−Nキャリヤ流量20ml/min.の条件
で気化開始温度約200℃であるのに対してBa(ac
ac)(phen)は同条件で気化開始温度が約1
20℃であり約80℃の気化温度の低温化を実現し産業
上極めて有用である。
As described above, the metal acetylacetonato complex as an adduct is excellent as a raw material for forming an oxide thin film. The vaporization temperature is significantly lower than that of the conventional one. For example, Ba (DPM) 2 (phen) 2 has a pressure of 15
Torr-N 2 carrier flow rate 20 ml / min. The vaporization start temperature is about 200 ° C under the conditions of
ac) 2 (phen) 2 has a vaporization start temperature of about 1 under the same conditions.
It is 20 ° C., and the vaporization temperature is reduced to about 80 ° C., which is extremely useful industrially.

【0008】ここで,(1)式で示されるアセチルアセ
トンを配位子とする金属錯体を例示すれば、 ビス−2,4−ペンタンジオナトバリウム [Ba(acac)] ビス−2,4−ペンタンジオナトストロンチウム [Sr(acac)] ビス−2,4−ペンタンジオナトカルシウム [Ca(acac)] ビス−24−ペンタンジオナトマグネシウム [Mg(acac)] ビス−2,4−ペンタンジオナトカッパー [Cu(acac)] ビス−2,4−ペンタンジオナトニッケル [Ni(acac)] ビス−2,4−ペンタンジオナトリード [Pb(acac)] トリス−2,4−ペンタンジオナトビスマス [Bi(acac)] ビス−2,4−ペンタンジオナトシルバー [Ag(acac)] トリス−2,4−ペンタンジオナトインジウム [In(acac)] トリス−2,4−ペンタンジオナトランタニド [La(acac)] などが挙げられる。
An example of a metal complex represented by the formula (1) and having acetylacetone as a ligand is as follows: bis-2,4-pentanedionatobarium [Ba (acac) 2 ] bis-2,4- Pentanedionatostrontium [Sr (acac) 2 ] bis-2,4-pentanedionatocalcium [Ca (acac) 2 ] bis-24-pentanedionatemagnesium [Mg (acac) 2 ] bis-2,4-pentane Dionato copper [Cu (acac) 2 ] bis-2,4-pentanedionatnickel [Ni (acac) 2 ] bis-2,4-pentanedionatolead [Pb (acac) 2 ] Tris-2,4- Pentanedionat Bismuth [Bi (acac) 3 ] Bis-2,4-pentanedionato Silver [Ag (acac) 2 ] Lis-2,4-pentanedionato indium [In (acac) 3 ] Tris-2,4-pentanediononatrantanide [La (acac) 3 ] and the like can be mentioned.

【0009】オルトフェナントロリン誘導体としては、 1,10−フェナントロリン[phen] 4,7−ジメチル−1,10−フェナントロリン 4,7−ジフェニル−1,10−フェナントロリン 4,7−ジフェニル−2,9−ジメチル−1,10−フ
ェナントロリン などが挙げられる。
Examples of orthophenanthroline derivatives include 1,10-phenanthroline [phen] 4,7-dimethyl-1,10-phenanthroline 4,7-diphenyl-1,10-phenanthroline 4,7-diphenyl-2,9-dimethyl. -1,10-phenanthroline etc. are mentioned.

【0010】2,2′−ビピリジル誘導体としては、 2,2′−ビピリジル [bpy] 4,4′−ジメチル−2,2′−ビピリジル などが挙げられる。Examples of the 2,2'-bipyridyl derivative include 2,2'-bipyridyl [bpy] 4,4'-dimethyl-2,2'-bipyridyl.

【0011】気化特性は、熱天秤による熱重量減少で見
ることができる。熱重量減少とは真空15〜20tor
r付近で窒素キャリヤー約20ml/min.、5℃/
min.の一定昇温速度により室温から500℃に昇温
した際の重量減少の値である。 これにより気化開始温度が見ることができる。
The vaporization characteristics can be seen in the thermogravimetric reduction by a thermobalance. Thermal weight reduction means vacuum 15 to 20 torr
A nitrogen carrier of about 20 ml / min. 5 ° C /
min. Is the value of the weight reduction when the temperature is raised from room temperature to 500 ° C. at a constant heating rate. From this, the vaporization start temperature can be seen.

【0012】本発明の酸化物薄膜形成用金属錯体を使用
して薄膜を形成する場合、液相堆積法または気相堆積法
があるが、特に気相堆積法が好ましい。
When a thin film is formed using the metal complex for forming an oxide thin film of the present invention, there are a liquid phase deposition method and a vapor phase deposition method, and a vapor phase deposition method is particularly preferable.

【0013】本発明の酸化物酸化物薄膜形成用金属錯体
を使用して薄膜を形成する場合、加圧下または常圧下ま
たは減圧下が好ましい。
When a thin film is formed using the metal complex for forming an oxide oxide thin film of the present invention, it is preferably under pressure, under normal pressure or under reduced pressure.

【0014】本発明の酸化物薄膜形成用金属錯体を使用
して薄膜を形成する場合、同伴ガスはヘリウム、アルゴ
ン、窒素などがあり、反応ガスは、酸素、水、亜酸化窒
素、オゾンなどがある。
When a thin film is formed using the metal complex for forming an oxide thin film of the present invention, the entrained gas may be helium, argon, nitrogen, etc., and the reaction gas may be oxygen, water, nitrous oxide, ozone, etc. is there.

【0015】[0015]

【実施例】以下、本発明を詳細に説明するが、本発明は
これらの例によってなんら限定されるものではない。
The present invention will be described in detail below, but the present invention is not limited to these examples.

【0016】製造および実施例1 [Ba(acac)(phen)]の製造例 1.7gの水酸化バリウム8水和物を溶解させた水溶液
中に2.4gの1,10−フェナントロリン1水和物を
溶解させたエタノール溶液を室温で滴下し、撹拌混合し
た後acac1.37gを室温で滴下し、約1時間で反
応を終了させた。次に、この反応溶液に水を加え晶析、
漉過して目的化合物3.6gを得た。更に、この目的化
合物をエタノールを用いて再結晶精製を行い3.2gの
目的化合物を回収した。 元素分析:実測値(計算値)(%) C58.59(58.62);H4.97(4.8
8);N8.04(8.05);Ba19.73(1
9.73)
Preparation and Example 1 Preparation Example of [Ba (acac) 2 (phen) 2 ] 2.4 g of 1,10-phenanthroline 1 in an aqueous solution in which 1.7 g of barium hydroxide octahydrate was dissolved. The ethanol solution in which the hydrate was dissolved was added dropwise at room temperature, and after stirring and mixing, 1.37 g of acac was added dropwise at room temperature to complete the reaction in about 1 hour. Next, water was added to this reaction solution for crystallization,
It was filtered to obtain 3.6 g of the target compound. Furthermore, this target compound was purified by recrystallization using ethanol, and 3.2 g of the target compound was recovered. Elemental analysis: measured value (calculated value) (%) C58.59 (58.62); H4.97 (4.8)
8); N 8.04 (8.05); Ba 19.73 (1)
9.73)

【0017】図1(a)にBa(DPM)(phe
n)、図1(b)にBa(acac)(phen)
の熱重量減少を示す。Ba(DPM)(phen)
の気化開始温度は約200℃であり、Ba(aca
c)(phen)の気化開始温度は約120℃でB
a(DPM)(phen)対して80℃も低温化し
ている。産業上200℃以下での気化が実現できること
は極めて有用である。
In FIG. 1A, Ba (DPM) 2 (phe
n) 2 and Ba (acac) 2 (phen) in FIG. 1 (b).
2 shows a thermal weight loss of 2 . Ba (DPM) 2 (phen)
Vaporization start temperature of 2 is about 200 ℃, Ba (aca
c) The vaporization starting temperature of 2 (phen) 2 is about 120 ° C. and B
The temperature of a (DPM) 2 (phen) 2 is lowered by 80 ° C. It is extremely useful industrially to realize vaporization at 200 ° C or lower.

【0018】製造および実施例2 [Sr(acac)(phen)]2gの水酸化ス
トロンチウム8水和物を溶解させた水溶液と3.1gの
1,10−フェナントロリンを溶解させたメタノール溶
液を45℃で6時間撹拌混合した後、acac1.7g
室温で滴下し約3時間で反応を終了させた。次に、この
反応溶液からメタノールを減圧除去し晶析した後、漉過
して目的化合物4.7gを得た。更に、この目的化合物
をメタノールを用いて再結晶精製を行い4.2gの目的
化合物を回収した。 元素分析:実測値(計算値)(%) C63.08(63.13);H5.33(5.2
6);N8.64(8.67);Sr13.56(1
3.56)
Preparation and Example 2 [Sr (acac) 2 (phen) 2 ] An aqueous solution containing 2 g of strontium hydroxide octahydrate and a methanol solution containing 3.1 g of 1,10-phenanthroline were dissolved. After stirring and mixing at 45 ° C. for 6 hours, acac 1.7 g
The mixture was added dropwise at room temperature and the reaction was completed in about 3 hours. Next, methanol was removed from this reaction solution under reduced pressure for crystallization, and then filtration was performed to obtain 4.7 g of the target compound. Further, this target compound was purified by recrystallization using methanol to recover 4.2 g of the target compound. Elemental analysis: measured value (calculated value) (%) C63.08 (63.13); H5.33 (5.2)
6); N8.64 (8.67); Sr13.56 (1
3.56)

【0019】Sr(DPM)の気化開始温度は、約2
00℃でありSr(acac)(phen)の気化
開始温度は、約115℃であった。約85℃の気化開始
温度の低温化が実現できた。
The vaporization start temperature of Sr (DPM) 2 is about 2
It was 00 ° C., and the vaporization start temperature of Sr (acac) 2 (phen) 2 was about 115 ° C. The vaporization start temperature of about 85 ° C. could be lowered.

【0020】製造および実施例3 [Sr(acac)(bpy)]2.1gの水酸化ス
トロンチウム8水和物を溶解させた水溶液と1.6gの
2,2′−ビピリジルを溶解させたメタノール溶液を4
5℃で6時間撹拌混合した後、acac1.8g室温で
滴下し約3時間で反応を終了させた。次に、この反応溶
液からメタノールを減圧除去し晶析した後、漉過して目
的化合物3.3gを得た。更に、この目的化合物をメタ
ノールを用いて再結晶精製を行い2.9gの目的化合物
を回収した。 元素分析:実測値(計算値)(%) C54.24(54.30);H5.00(4.9
8);N6.31(6.33);Sr19.82(1
9.82)
Production and Example 3 [Sr (acac) 2 (bpy)] 2.1 g of an aqueous solution containing strontium hydroxide octahydrate dissolved therein and 1.6 g of methanol containing 2,2′-bipyridyl dissolved therein. 4 solutions
After stirring and mixing at 5 ° C. for 6 hours, 1.8 g of acac was added dropwise at room temperature to complete the reaction in about 3 hours. Next, methanol was removed from this reaction solution under reduced pressure for crystallization, and then filtration was performed to obtain 3.3 g of the target compound. Further, this target compound was recrystallized and purified using methanol to recover 2.9 g of the target compound. Elemental analysis: measured value (calculated value) (%) C54.24 (54.30); H5.00 (4.9)
8); N6.31 (6.33); Sr19.82 (1
9.82)

【0021】Sr(DPM)の気化開始温度は、約2
00℃でありSr(acac)(bpy)の気化開始
温度は、約110℃であった。約90℃の気化開始温度
の低温化が実現できた。
The vaporization start temperature of Sr (DPM) 2 is about 2
The temperature was 00 ° C., and the vaporization start temperature of Sr (acac) 2 (bpy) was about 110 ° C. The vaporization start temperature of about 90 ° C could be lowered.

【0022】製造および実施例4 [Cu(acac)(phen)]30gの酢酸銅1
水和物を溶解させた水溶液中に37.24gの1,10
−フェナントロリンを溶解したメタノール溶液を室温で
滴下し約1時間撹拌混合した後、この反応溶液中に3
3.4gのacacを滴下撹拌し約2時間で反応を終了
させた。次にこの反応溶液からメタノールを減圧除去し
晶析した後、漉過して目的化合物64gを得た。更に、
この目的化合物をメタノールを用いて再結晶精製を行い
60gの目的化合物を回収した。 元素分析:実測値(計算値)(%) C59.69(59.73);H5.49(5.4
3);N6.36(6.33)Ba14.38(14.
38)
Preparation and Example 4 [Cu (acac) 2 (phen)] 30 g of copper acetate 1
37.24 g of 1,10 in an aqueous solution of hydrate
-Methanol solution containing phenanthroline was added dropwise at room temperature, and the mixture was stirred and mixed for about 1 hour.
3.4 g of acac was added dropwise and stirred to complete the reaction in about 2 hours. Next, methanol was removed from this reaction solution under reduced pressure for crystallization, and then filtration was performed to obtain 64 g of the target compound. Furthermore,
The target compound was purified by recrystallization using methanol to recover 60 g of the target compound. Elemental analysis: measured value (calculated value) (%) C59.69 (59.73); H5.49 (5.4)
3); N6.36 (6.33) Ba14.38 (14.
38)

【0023】Cu(DPM)の気化開始温度は、約1
10℃でありCu(acac)(bpy)の気化開始
温度は、約50℃であった。約60℃の気化開始温度の
低温化が実現できた。
The vaporization starting temperature of Cu (DPM) 2 is about 1
The temperature was 10 ° C., and the vaporization start temperature of Cu (acac) 2 (bpy) was about 50 ° C. It was possible to lower the vaporization start temperature of about 60 ° C.

【0024】実験例1 有機金属化学気相堆積法(以下MOCVD法という)の
装置を用い、MgO基板を反応室で300℃に加熱して
アルゴンをキャリアーガスとしてBa(acac)
(phen)を気化させて導入した。さらにこの反応
室に同時に酸素を導入することで良好なBaO薄膜を形
成することが出来た。成膜速度は1〜10μm/hであ
った。
Experimental Example 1 Using a metal organic chemical vapor deposition (hereinafter referred to as MOCVD) apparatus, a MgO substrate was heated to 300 ° C. in a reaction chamber and argon was used as a carrier gas for Ba (acac) 2.
(Phen) 2 was vaporized and introduced. Further, by introducing oxygen into this reaction chamber at the same time, a good BaO thin film could be formed. The film forming rate was 1 to 10 μm / h.

【0025】 Ba(acac)(phen)容器温度;100〜130℃ キャリアーガス流量 ;150sccm 酸素ガス流量 ;200sccm *sccmとはStandard Cubic Cen
timeter perMinuteの略で0℃、1気
圧における1分間に流れるガスの容積(cm)であ
る。
Ba (acac) 2 (phen) 2 container temperature; 100 to 130 ° C. Carrier gas flow rate; 150 sccm Oxygen gas flow rate; 200 sccm * sccm is Standard Cubic Cen
It is an abbreviation for "timer per Minute" and is a volume (cm 3 ) of a gas flowing in 1 minute at 0 ° C. and 1 atm.

【0026】実験例2 MOCVD法用の装置を用い、MgO基板を750℃に
加熱してアルゴンをキャリアーガスとしてSr(aca
c)(phen) を気化させて導入した。こ
こで同時に酸素を導入することで良好なBaO薄膜を形
成することが出来た。成膜速度は1〜10μm/hであ
った。
Experimental Example 2 Using an apparatus for MOCVD, the MgO substrate was heated to 750 ° C. and argon was used as a carrier gas for Sr (aca).
c) 2 (phen) 2 was vaporized and introduced. Here, by introducing oxygen at the same time, a good BaO thin film could be formed. The film forming rate was 1 to 10 μm / h.

【0027】 Sr(acac)・(phen)容器温度; 90〜120℃ キャリアーガス流量 ;150sccmSr (acac) 2 (phen) 2 container temperature; 90 to 120 ° C. Carrier gas flow rate; 150 sccm

【0028】実験例3 MOCVD法用の装置を用い、SrTiO基板を反応
室で750℃に加熱してアルゴンガスをキャリアーガス
としてSr(acac)(bpy)を気化させて導入
した。ここで同時に酸素を導入することで良好なSrO
薄膜を形成することができた。
Experimental Example 3 Using an apparatus for MOCVD, a SrTiO 3 substrate was heated to 750 ° C. in a reaction chamber, and Sr (acac) 2 (bpy) was vaporized and introduced using argon gas as a carrier gas. By introducing oxygen at the same time, good SrO
A thin film could be formed.

【0029】成膜速度は3〜15μm/hであった。 Sr(acac)(bpy) 容器温度; 90〜120℃ キャリアーガス流量 ;150sccm 酸 素 流 量 ;200sccmThe film forming rate was 3 to 15 μm / h. Sr (acac) 2 (bpy) Container temperature; 90 to 120 ° C. Carrier gas flow rate; 150 sccm Oxygen flow rate; 200 sccm

【0030】実験例4 MOCVD法用の装置を用い、SrTiO基板を反応
室で800℃に加熱してアルゴンガスをキャリアーガス
としてCu(acac)(phen)を気化させて導
入した。ここで同時に水蒸気を導入することで良好なS
rO薄膜を形成することができた。成膜速度は5〜20
μm/hであった。
Experimental Example 4 Using an apparatus for MOCVD, a SrTiO 3 substrate was heated to 800 ° C. in a reaction chamber, and Cu (acac) 2 (phen) was vaporized and introduced using argon gas as a carrier gas. By introducing steam at the same time, good S
An rO thin film could be formed. Deposition rate is 5 to 20
It was μm / h.

【0031】 Cu(acac)(phen) )容器温度;50〜70℃ キャリアーガス流量 ;200sccm 水 蒸 気 流 量 ;150sccmCu (acac) 2 (phen)) container temperature; 50 to 70 ° C. carrier gas flow rate; 200 sccm water vapor flow rate; 150 sccm

【0032】[0032]

【発明の効果】本発明の酸化物薄膜形成用金属アセチル
アセトナト錯体を用いることにより、低温での酸化物薄
膜形成が可能となった。また、化学気相堆積法において
安定かつ再現性の高い酸化物薄膜形成が可能となり産業
上極めて有益である。
By using the metal acetylacetonato complex for forming an oxide thin film of the present invention, it becomes possible to form an oxide thin film at a low temperature. Further, it is possible to form a stable and highly reproducible oxide thin film by the chemical vapor deposition method, which is extremely useful in industry.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)は、従来のBa(DPM)(phe
n)の熱重量減少(%)を示し、(b)は、Ba(a
cac)(phen)の熱重量減少(%)を示す線
図である。
FIG. 1A shows a conventional Ba (DPM) 2 (phe).
n) 2 shows the thermogravimetric reduction (%), and (b) shows Ba (a
It is a diagram which shows the thermogravimetric reduction (%) of cac) 2 (phen) 2 .

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】−般式 (式中Mはn価の金属である)で示されるアセチルアセ
トンを配位子とする金属錯体とオルトフェナントロリン
誘導体の付加体または2,2′−ビピリジル誘導体の付
加体から成ることを特徴とする酸化物薄膜形成用金属ア
セチルアセトナト錯体。
1. General formula Oxidation comprising a metal complex represented by the formula (M is an n-valent metal) having acetylacetone as a ligand and an adduct of an orthophenanthroline derivative or an adduct of a 2,2′-bipyridyl derivative. Metal acetylacetonato complex for thin film formation.
JP33296991A 1991-10-17 1991-10-17 Metal acetylacetonato complex for oxide thin film formation Expired - Fee Related JPH08975B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33296991A JPH08975B2 (en) 1991-10-17 1991-10-17 Metal acetylacetonato complex for oxide thin film formation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33296991A JPH08975B2 (en) 1991-10-17 1991-10-17 Metal acetylacetonato complex for oxide thin film formation

Publications (2)

Publication Number Publication Date
JPH05106045A true JPH05106045A (en) 1993-04-27
JPH08975B2 JPH08975B2 (en) 1996-01-10

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ID=18260847

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JPH08975B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001039290A3 (en) * 1999-11-23 2001-11-22 Johnson Res & Dev Company Inc Method and apparatus for producing lithium based cathodes
JP2006063352A (en) * 2004-08-24 2006-03-09 Toyoshima Seisakusho:Kk Raw material solution for cvd used for producing lanthanoid-based metal-containing thin film and method for producing thin film using the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001039290A3 (en) * 1999-11-23 2001-11-22 Johnson Res & Dev Company Inc Method and apparatus for producing lithium based cathodes
JP2006063352A (en) * 2004-08-24 2006-03-09 Toyoshima Seisakusho:Kk Raw material solution for cvd used for producing lanthanoid-based metal-containing thin film and method for producing thin film using the same
JP4738775B2 (en) * 2004-08-24 2011-08-03 株式会社豊島製作所 Raw material solution for CVD used for manufacturing a lanthanide-based metal-containing thin film and a method for manufacturing a thin film using the same

Also Published As

Publication number Publication date
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