JPH0496078U - - Google Patents

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Publication number
JPH0496078U
JPH0496078U JP432591U JP432591U JPH0496078U JP H0496078 U JPH0496078 U JP H0496078U JP 432591 U JP432591 U JP 432591U JP 432591 U JP432591 U JP 432591U JP H0496078 U JPH0496078 U JP H0496078U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP432591U
Other languages
Japanese (ja)
Other versions
JP2584414Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP432591U priority Critical patent/JP2584414Y2/ja
Publication of JPH0496078U publication Critical patent/JPH0496078U/ja
Application granted granted Critical
Publication of JP2584414Y2 publication Critical patent/JP2584414Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP432591U 1991-01-17 1991-01-17 半導体素子用試験装置 Expired - Fee Related JP2584414Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Publications (2)

Publication Number Publication Date
JPH0496078U true JPH0496078U (cs) 1992-08-20
JP2584414Y2 JP2584414Y2 (ja) 1998-11-05

Family

ID=31734015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP432591U Expired - Fee Related JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Country Status (1)

Country Link
JP (1) JP2584414Y2 (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105170476A (zh) * 2014-06-23 2015-12-23 泰克元有限公司 测试分选机
CN114200275A (zh) * 2020-08-31 2022-03-18 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105170476A (zh) * 2014-06-23 2015-12-23 泰克元有限公司 测试分选机
JP2016008969A (ja) * 2014-06-23 2016-01-18 テクウィング カンパニー リミテッドＴｅｃｈｗｉｎｇ Ｃｏ．， Ｌｔｄ． テストハンドラー
CN114200275A (zh) * 2020-08-31 2022-03-18 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统
CN114200275B (zh) * 2020-08-31 2024-05-14 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统

Also Published As

Publication number Publication date
JP2584414Y2 (ja) 1998-11-05

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