JPH049547Y2 - - Google Patents

Info

Publication number
JPH049547Y2
JPH049547Y2 JP1986141373U JP14137386U JPH049547Y2 JP H049547 Y2 JPH049547 Y2 JP H049547Y2 JP 1986141373 U JP1986141373 U JP 1986141373U JP 14137386 U JP14137386 U JP 14137386U JP H049547 Y2 JPH049547 Y2 JP H049547Y2
Authority
JP
Japan
Prior art keywords
helmholtz coil
azimuth
under test
magnetic
device under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1986141373U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6348112U (cs
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986141373U priority Critical patent/JPH049547Y2/ja
Publication of JPS6348112U publication Critical patent/JPS6348112U/ja
Application granted granted Critical
Publication of JPH049547Y2 publication Critical patent/JPH049547Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Geophysics And Detection Of Objects (AREA)
JP1986141373U 1986-09-17 1986-09-17 Expired JPH049547Y2 (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986141373U JPH049547Y2 (cs) 1986-09-17 1986-09-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986141373U JPH049547Y2 (cs) 1986-09-17 1986-09-17

Publications (2)

Publication Number Publication Date
JPS6348112U JPS6348112U (cs) 1988-04-01
JPH049547Y2 true JPH049547Y2 (cs) 1992-03-10

Family

ID=31049092

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986141373U Expired JPH049547Y2 (cs) 1986-09-17 1986-09-17

Country Status (1)

Country Link
JP (1) JPH049547Y2 (cs)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0533519U (ja) * 1991-10-08 1993-04-30 テイーデイーケイ株式会社 高電圧コンデンサ及びマグネトロン
JP2580628Y2 (ja) * 1991-09-05 1998-09-10 ティーディーケイ株式会社 高電圧コンデンサ及びマグネトロン
KR101040146B1 (ko) * 2008-08-06 2011-06-09 주식회사 아모센스 지자기 센서의 축 틀어짐 검사장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979584A (cs) * 1972-12-07 1974-08-01
JPS5719474U (cs) * 1980-07-08 1982-02-01

Also Published As

Publication number Publication date
JPS6348112U (cs) 1988-04-01

Similar Documents

Publication Publication Date Title
CN104535941B (zh) 一种地磁环境下卫星磁测试外干扰磁场闭环控制方法
DE3882833D1 (de) Anordnung zur kontrolle und zur messung der isolierung eines elektrischen netzes.
US8680852B2 (en) Method and apparatus for phase sensitive detection of eddy current measurements
GB1582409A (en) Apparatus for obtaining a measure of the angular attitude of a body
CN107121655A (zh) 非屏蔽serf原子磁力仪磁场抵消线圈非正交角测量装置及测量方法
JPH08248106A (ja) 微弱磁界測定装置
CN110987000A (zh) 一种准确测量激光陀螺零偏磁场灵敏度的方法
JPH049547Y2 (cs)
JPH09243725A (ja) 磁気分布測定方法，磁気分布測定装置および磁気検出器板
JP2839340B2 (ja) 位置信号の校正装置
US7417424B2 (en) Magnetic-field-measuring device
CN110471123A (zh) 一种旋转加速度计重力梯度仪数据诊断及处理方法
JP2839341B2 (ja) 位置信号の校正装置
CN102445230A (zh) 相位差法测定双轴磁传感器正交度的方法及装置
JPH0425780A (ja) 超電導磁界測定装置
Thieben et al. Experimental parameter calibration of the scanner model for model-based MPI
JPH0778540B2 (ja) 位置局限が可能な磁気探知装置
RU2075759C1 (ru) Способ определения магнитных параметров на движущемся объекте
Van Loock et al. Microprocessor-controlled densitometer for electron diffraction
JPH09126780A (ja) 磁気方位センサ
CN117784259B (zh) 单分量磁场定位方法及定位系统
CN114487944B (zh) 零增益温漂直流磁场测量方法
JPH0358444B2 (cs)
CN119826679B (zh) 角位置测量方法及装置
Pasadas et al. Handheld instrument to detect defects in conductive plates with a planar probe