JPH048851B2 - - Google Patents

Info

Publication number
JPH048851B2
JPH048851B2 JP21998083A JP21998083A JPH048851B2 JP H048851 B2 JPH048851 B2 JP H048851B2 JP 21998083 A JP21998083 A JP 21998083A JP 21998083 A JP21998083 A JP 21998083A JP H048851 B2 JPH048851 B2 JP H048851B2
Authority
JP
Japan
Prior art keywords
magnetic
magnetic shield
head
electrode
magnetoresistive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP21998083A
Other languages
Japanese (ja)
Other versions
JPS60113313A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP21998083A priority Critical patent/JPS60113313A/en
Publication of JPS60113313A publication Critical patent/JPS60113313A/en
Publication of JPH048851B2 publication Critical patent/JPH048851B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures

Description

【発明の詳細な説明】 本発明は磁気記憶媒体に書き込まれた磁気的情
報を、いわゆる磁気抵抗効果を利用して読み出し
を行う強磁性磁気抵抗効果素子(以下、MR素子
と称す)を備えた磁気抵抗効果ヘツド(以下、
MRヘツドと称す)に関する。
[Detailed Description of the Invention] The present invention includes a ferromagnetic magnetoresistive element (hereinafter referred to as an MR element) that reads magnetic information written on a magnetic storage medium using a so-called magnetoresistive effect. magnetoresistive head (hereinafter referred to as
(referred to as MR head).

MRヘツドは、磁気記録における記録密度の向
上に大きく貢献する再生専用磁気ヘツドとして注
目されている。
MR heads are attracting attention as read-only magnetic heads that greatly contribute to improving recording density in magnetic recording.

一般に、高記録密度を達成するためには、磁気
記憶媒体上のトラツク走行方向の線密度の向上及
びトラツク密度の向上が必要となつている。従つ
て、これ等の磁気的に記録された情報を電気的な
信号に変換するMRヘツドは、トラツク走行方向
の分解能及びトラツク幅方向の分解能の向上が要
求される。
Generally, in order to achieve high recording density, it is necessary to improve the linear density in the track running direction on a magnetic storage medium and to improve the track density. Therefore, MR heads that convert magnetically recorded information into electrical signals are required to have improved resolution in the track running direction and in the track width direction.

上記、トラツク走行方向の高分解能特性を得る
ために、MR素子の上層及び下層に絶縁膜を介し
て、高透磁率磁性体からなる磁気シールド層を設
ける方法が用いられている。この種の磁気シール
ド層を設けたMRヘツドは、上層及び下層の磁気
シールド間距離即ち、ジヤツプ長を短くする程、
より高分解能特性が得られることから、上層及び
下層の磁気シールド間の絶縁膜は極力薄くされ
る。
In order to obtain the above-mentioned high-resolution characteristics in the track running direction, a method is used in which magnetic shield layers made of a high magnetic permeability magnetic material are provided on the upper and lower layers of the MR element with insulating films interposed therebetween. In an MR head equipped with this type of magnetic shield layer, the shorter the distance between the upper and lower magnetic shields, that is, the jump length,
Since higher resolution characteristics can be obtained, the insulating film between the upper and lower magnetic shields is made as thin as possible.

又、MR素子を用いて再生用磁気ヘツドを作製
する場合は、基板上にMRヘツドを作製後、目的
の大きさに基板を切断し、次に磁気記憶媒体(磁
気テープ、磁気デイスク等)に対面する浮場面を
目的の寸法まで研摩する。
In addition, when manufacturing a magnetic head for reproduction using an MR element, after manufacturing the MR head on a substrate, cut the substrate to the desired size, and then attach it to a magnetic storage medium (magnetic tape, magnetic disk, etc.). Polish the opposing floating surfaces to the desired dimensions.

しかし、前述した如く、MRヘツドの上層及び
下層の磁気シールド間の絶縁膜は高分解能特性を
達成するために出来る限り薄くしてあり、上記研
摩時にMR素子の電極(一般に、Au、Cu等の固
有抵抗の低い材料即ち、延性の大きい材料で形成
される)がだれ、磁気シールドと部分的に接触す
る危険があつた。この様な現象は磁気テープにお
いては、テープの走行中のヘツドとの摩擦、磁気
デイスクにおいてはコンタクト、スタート、スト
ツプ時のヘツドとの摩擦によつても発生する。上
記MR素子の電極と磁気シールドとの接触が生ず
れば、MR素子に供給するセンス電流が磁気シー
ルドにも分流するためMR素子の出力値が変動
し、不安定なものとなる。
However, as mentioned above, the insulating film between the upper and lower magnetic shields of the MR head is made as thin as possible in order to achieve high resolution characteristics, and during the polishing process, the MR element's electrode (generally made of Au, Cu, etc.) There was a risk that the material (made of a material with low resistivity, i.e., a highly ductile material) would sag and come into partial contact with the magnetic shield. Such a phenomenon occurs in a magnetic tape due to friction with the head while the tape is running, and in a magnetic disk due to friction with the head during contact, start, and stop. If contact occurs between the electrodes of the MR element and the magnetic shield, the sense current supplied to the MR element will also be shunted to the magnetic shield, causing the output value of the MR element to fluctuate and become unstable.

前記、従来の問題を解決するため、第1図に示
す様な電極構造を有するMRヘツドが開示されて
いる。第1図はMR素子4と電極9の位置関係を
示す平面図で、簡単のため磁気シールドは省略し
ている。第1図におけるMRヘツドはヘツド面を
目的寸法まで研摩する際、及び、磁気記憶媒体と
の摩擦の際に、電極9が直接、ヘツド面に露出し
ない構成となつているため、磁気シールドとの接
触を避けることができる。しかし、第1図の構成
では電極9を通じて供給されるセンス電流が、
MR素子の両端、即ち電極9の近傍で不均一な分
布を示し、この領域ではMR素子4の出力が低下
する恐れがあつた。特に、高トラツク密度に対応
するためトラツク幅Lを小さくすれば、センス電
流の分布は更に不均一になり、出力の低下は大き
くなるという問題があつた。
In order to solve the above-mentioned conventional problems, an MR head having an electrode structure as shown in FIG. 1 has been disclosed. FIG. 1 is a plan view showing the positional relationship between the MR element 4 and the electrodes 9, and the magnetic shield is omitted for simplicity. The MR head shown in Fig. 1 is constructed so that the electrode 9 is not directly exposed to the head surface when the head surface is polished to the target size or when it comes into contact with the magnetic storage medium, so that it is not directly exposed to the magnetic shield. Contact can be avoided. However, in the configuration of FIG. 1, the sense current supplied through the electrode 9 is
A non-uniform distribution was exhibited at both ends of the MR element, that is, in the vicinity of the electrode 9, and there was a possibility that the output of the MR element 4 would decrease in this region. In particular, if the track width L is made smaller in order to accommodate high track density, the distribution of the sense current becomes even more uneven, resulting in a problem that the output decreases significantly.

更に、MRヘツドの電極と磁気シールドの接触
は、前述した浮場面に露出した部分のみならず、
MRヘツドの内部でも生ずる。即ち、高分解能特
性を達成するため、上層及び下層の磁気シールド
間の絶縁膜の厚みを、MR素子の電極の厚みより
薄く形成された場合は、絶縁膜の電極部分におけ
るステツプカバレージが悪化し、この部分を通じ
て電極と磁気シールドの接触が生ずる。これ等の
現象は、MRヘツドの製作歩留を大きく低下させ
ていた。
Furthermore, the contact between the electrode of the MR head and the magnetic shield is not limited to the part exposed to the floating surface mentioned above.
It also occurs inside the MR head. That is, in order to achieve high resolution characteristics, if the thickness of the insulating film between the upper and lower magnetic shields is formed to be thinner than the electrode thickness of the MR element, the step coverage at the electrode portion of the insulating film will deteriorate; Contact between the electrode and the magnetic shield occurs through this portion. These phenomena have greatly reduced the manufacturing yield of MR heads.

本発明の目的は前記従来の電極の欠点を解決し
た磁気抵抗効果ヘツドを提供することである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a magnetoresistive head that overcomes the drawbacks of the conventional electrodes.

本発明は、強磁性薄膜より成る磁気抵抗効果素
子が所定の厚みを有する絶縁層を介して、高透磁
率磁性体から成る二つの磁気シールドによつては
さまれてなる磁気抵抗効果ヘツドにおいて、前記
磁気抵抗効果素子にセンス電流を供給するための
電極が前記磁気シールドで構成されていることを
特徴とする。
The present invention provides a magnetoresistive head in which a magnetoresistive element made of a ferromagnetic thin film is sandwiched between two magnetic shields made of a high permeability magnetic material via an insulating layer having a predetermined thickness. It is characterized in that an electrode for supplying a sense current to the magnetoresistive element is constituted by the magnetic shield.

以下、本発明の実施例を図面を用いて、詳細に
説明する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は本発明に係わるMRヘツドの一実施例
を示す概略斜視図である。
FIG. 2 is a schematic perspective view showing an embodiment of the MR head according to the present invention.

第2図において、MRヘツドのスライダとなる
べく基体1上にパーマロイ等の高透磁率磁性体で
かつ電気的導体である下層の磁気シールド2が形
成され、前記下層磁気シールド2の一部を露出し
て、SiO2、Al2O3等の絶縁層3が形成されてい
る。次いで、下層磁気シールド2の露出された領
域と接触する様に強磁性体からなる幅WのMR素
子(例えば、Fe−Ni合金、Ni−Co合金)4が薄
膜短冊状に形成されている。即ち、下層磁気シー
ルド2の露出された領域とMR素子4の接触〜領
域AはMR素子4の一つの電極を構成する。更
に、MR素子4及び下層磁気シールド2を被う様
にSiO2、Al2O3等の絶縁層5が形成され、絶縁層
5の一部は、接触領域AとLだけ離れた位置に、
MR素子4を露出させるために穴が形成されてい
る。次いで、絶縁層5の上にパーマロイ等の高透
磁率磁性体でかつ電気的導体である上層の磁気シ
ールド6が形成され、前記上層磁気シールドの一
部は絶縁層5の穴を通してMR素子4と接触して
いる。即ち、上層磁気シールド6とMR素子4の
接触領域Bは、MR素子4の他の電極を構成して
いる。又、下層磁気シールド2及び上層磁気シー
ルド8の一部は、電気端子7及び8が接続されて
おり、これ等の電気端子7及び8並びに下層磁気
シールド2及び上層磁気シールド8を経由して、
MR素子4にセンス電流を供給される。
In FIG. 2, a lower magnetic shield 2 made of a highly permeable magnetic material such as permalloy and an electrical conductor is formed on a base 1 to serve as a slider of an MR head, and a portion of the lower magnetic shield 2 is exposed. Then, an insulating layer 3 made of SiO 2 , Al 2 O 3 or the like is formed. Next, an MR element (for example, Fe--Ni alloy, Ni--Co alloy) 4 made of a ferromagnetic material and having a width of W is formed in the shape of a thin film strip so as to be in contact with the exposed region of the lower magnetic shield 2. That is, the exposed area of the lower magnetic shield 2 and the contact area A of the MR element 4 constitute one electrode of the MR element 4. Furthermore, an insulating layer 5 made of SiO 2 , Al 2 O 3 or the like is formed to cover the MR element 4 and the lower magnetic shield 2, and a portion of the insulating layer 5 is located at a distance of contact areas A and L.
A hole is formed to expose the MR element 4. Next, an upper magnetic shield 6 made of a high permeability magnetic material such as permalloy and an electrical conductor is formed on the insulating layer 5, and a part of the upper magnetic shield 6 is connected to the MR element 4 through the hole in the insulating layer 5. are in contact. That is, the contact area B between the upper magnetic shield 6 and the MR element 4 constitutes another electrode of the MR element 4. Further, electric terminals 7 and 8 are connected to a part of the lower magnetic shield 2 and the upper magnetic shield 8, and via these electric terminals 7 and 8, the lower magnetic shield 2, and the upper magnetic shield 8,
A sense current is supplied to the MR element 4.

上記説明において、下層磁気シールド2及び上
層磁気シールド8の電気抵抗はMR素子4の外部
から信号磁界を検出する領域(即ち、トラツク
幅)Lの電気抵抗の1/10以下に設定するのが望ま
しい。この様に上層磁気シールド2及び上層磁気
シールド8の電気抵抗を小さくすることにより、
上層及び下層磁気シールド8及び2の強磁性磁気
抵抗効果による信号検出を小さくすることができ
る。これは、上層下層磁気シールド2及び8の膜
厚をMR素子4の膜厚より充分大きく設定するか
面積を大きくすることにより、更に、磁気シール
ドを磁気抵抗効果の極めて小さい材料で構成する
ことにより容易に実現できる。特に、前述の、上
層及び下層磁気シールド2及び8の膜厚及び面積
を大きくすることは、MR素子4に不要な磁界が
印加されない様にする。磁気シールド本来の目的
からも極めて有効である。又、上層及び下層磁気
シールド2及び8の強磁性磁気抵抗効果を及び電
気抵抗を小さくするために、磁気シールド層の少
なくとも一部分に電気的良導体(例えば、Cu、
Au、Al等)を被着しても良い。
In the above description, the electrical resistance of the lower magnetic shield 2 and the upper magnetic shield 8 is desirably set to 1/10 or less of the electrical resistance of the area (i.e., track width) L where the signal magnetic field is detected from outside the MR element 4. . By reducing the electrical resistance of the upper magnetic shield 2 and the upper magnetic shield 8 in this way,
Signal detection due to the ferromagnetic magnetoresistive effect of the upper and lower magnetic shields 8 and 2 can be reduced. This can be achieved by setting the film thickness of the upper and lower magnetic shields 2 and 8 to be sufficiently larger than the film thickness of the MR element 4, or by increasing the area thereof, and by constructing the magnetic shield from a material with an extremely small magnetoresistive effect. It can be easily achieved. In particular, increasing the thickness and area of the upper and lower magnetic shields 2 and 8 described above prevents unnecessary magnetic fields from being applied to the MR element 4. It is extremely effective from the original purpose of magnetic shielding. In addition, in order to reduce the ferromagnetic magnetoresistive effect and electrical resistance of the upper and lower magnetic shields 2 and 8, at least a portion of the magnetic shield layer is coated with a good electrical conductor (for example, Cu,
Au, Al, etc.) may be coated.

以上、述べた様に、本発明では、磁気シールド
層がMR素子の電極を構成し、磁気シールドと
MR素子との間にAu、Cu等の延性の大きい材料
が含まれていないため、MRヘツドを目的の寸法
まで研摩する際及び磁気記憶媒体との摩擦の際に
又は、絶縁層のステツプカバレージの劣化による
MR素子と磁気シールドの接触が避けられるた
め、MRヘツドの出力変動が解消され、又、製作
歩留りも大きく向上される。更に、磁気シールド
とMR素子間絶縁層を極めて薄く形成でき高分解
能特性を有するMRヘツドを提供できる。
As described above, in the present invention, the magnetic shield layer constitutes the electrode of the MR element, and the magnetic shield layer constitutes the electrode of the MR element.
Since highly ductile materials such as Au and Cu are not included between the MR element and the MR element, it is difficult to polish the MR head to the desired dimensions, when there is friction with the magnetic storage medium, or when the step coverage of the insulating layer is due to deterioration
Since contact between the MR element and the magnetic shield is avoided, fluctuations in the output of the MR head are eliminated, and manufacturing yields are also greatly improved. Furthermore, the magnetic shield and the insulating layer between the MR elements can be formed extremely thin, and an MR head with high resolution characteristics can be provided.

更に、本発明では、MR素子の電極を構成する
上層及び下層磁気シールドとMR素子との接触領
域A及びBをMR素子の幅W全面に形成できるた
め、MR素子のトラツク幅Lが及び幅Wで均一な
分布を示すセンス電流を供給できる。従つて、高
トラツク密度に適したMRヘツドを提供できる。
Furthermore, in the present invention, since the contact areas A and B between the upper and lower magnetic shields constituting the electrodes of the MR element and the MR element can be formed over the entire width W of the MR element, the track width L of the MR element can be It is possible to supply a sense current with a uniform distribution. Therefore, an MR head suitable for high track density can be provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の磁気抵抗効果ヘツドを示す平面
図、第2図は本発明の実施例を示す概略斜視図で
ある。 1……基体、2……下層磁気シールド、4……
MR素子、6……上層磁気シールド。
FIG. 1 is a plan view showing a conventional magnetoresistive head, and FIG. 2 is a schematic perspective view showing an embodiment of the present invention. 1...Base body, 2...Lower magnetic shield, 4...
MR element, 6... upper layer magnetic shield.

Claims (1)

【特許請求の範囲】[Claims] 1 強磁性薄膜より成る磁気抵抗効果素子が所定
の厚みを有する絶縁層を介して、高透磁率磁性体
から成る二つの磁気シールドによつてはさまれて
なる磁気抵抗効果ヘツドにおいて、前記磁気抵抗
効果素子にセンス電流を供給するための電極が前
記磁気シールドで構成されていることを特徴とす
る磁気抵抗効果ヘツド。
1. In a magnetoresistive head in which a magnetoresistive element made of a ferromagnetic thin film is sandwiched between two magnetic shields made of a high permeability magnetic material via an insulating layer having a predetermined thickness, A magnetoresistive head characterized in that an electrode for supplying a sense current to an effect element is constituted by the magnetic shield.
JP21998083A 1983-11-22 1983-11-22 Magneto-resistance effect head Granted JPS60113313A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21998083A JPS60113313A (en) 1983-11-22 1983-11-22 Magneto-resistance effect head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21998083A JPS60113313A (en) 1983-11-22 1983-11-22 Magneto-resistance effect head

Publications (2)

Publication Number Publication Date
JPS60113313A JPS60113313A (en) 1985-06-19
JPH048851B2 true JPH048851B2 (en) 1992-02-18

Family

ID=16744035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21998083A Granted JPS60113313A (en) 1983-11-22 1983-11-22 Magneto-resistance effect head

Country Status (1)

Country Link
JP (1) JPS60113313A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11175920A (en) 1997-12-05 1999-07-02 Nec Corp Magneto-resistance effect type combined head and its manufacture
JP2000276716A (en) 1999-03-24 2000-10-06 Nec Corp Magnetoresistance effect type head, its manufacture and magnetic storage device

Also Published As

Publication number Publication date
JPS60113313A (en) 1985-06-19

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