JPH0484447A - Wire bonding device and manufacture of semiconductor device using the same - Google Patents

Wire bonding device and manufacture of semiconductor device using the same

Info

Publication number
JPH0484447A
JPH0484447A JP2200156A JP20015690A JPH0484447A JP H0484447 A JPH0484447 A JP H0484447A JP 2200156 A JP2200156 A JP 2200156A JP 20015690 A JP20015690 A JP 20015690A JP H0484447 A JPH0484447 A JP H0484447A
Authority
JP
Japan
Prior art keywords
wire
tension
contact
capillary
guide plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2200156A
Other languages
Japanese (ja)
Inventor
Yasufumi Nakasu
康文 中須
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2200156A priority Critical patent/JPH0484447A/en
Publication of JPH0484447A publication Critical patent/JPH0484447A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/786Means for supplying the connector to be connected in the bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/786Means for supplying the connector to be connected in the bonding apparatus
    • H01L2224/78621Holding means, e.g. wire clampers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/851Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To obtain a stable wire tension aligned in its flow by composing a tension applying mechanism of a nozzle directed toward the wire, one guide plate, and suitable number of contact rods in contact with the wire. CONSTITUTION:According to a tension applying mechanism 30 of this invention for applying a predetermined tension to a wire 1 at the time of wire bonding, a stable flow of gas from an injection hole 32 in a nozzle 31 along a guide plate 33 is obtained. Thus, the wire 1 is applied by the stable tension in the flowing direction (an arrow B) of the gas. Further, since the wire 1 is pressed by a contact rod 34 by the gas pressing force in a direction A, its position is stabilized. Accordingly, a predetermined wire tension is obtained. Since the wire 1 is brought into point contact with the rod 34, even if the plate 33 and the rod 34 are contaminated due to use of a long time, the wire tension scarcely becomes unstable because the contact area of the wire 1 with the contaminated part is small.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体装置の組立工程において使用するワ
イヤボンディング装置とこれを用いた半導体装置の製造
方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a wire bonding device used in a semiconductor device assembly process and a method of manufacturing a semiconductor device using the wire bonding device.

〔従来の技術〕[Conventional technology]

第4図は、例えば特公昭53−10425号公報に示さ
れた従来のワイヤボンディング装置を示す主要図であり
、第5図は、第4図のワイヤ張力付与機構を示す斜視図
である。
FIG. 4 is a main view showing a conventional wire bonding apparatus disclosed in, for example, Japanese Patent Publication No. 53-10425, and FIG. 5 is a perspective view showing the wire tensioning mechanism shown in FIG. 4.

第4図、第5図に示すように、ワイヤ1を巻き付けたス
プール2は、軸3に対して遊嵌され、この軸3内からス
プール2の接触内面に対して、エアーが噴き出されてい
る。また、エアーの噴出方向は軸3の半径方向に対して
傾けて噴出するため、スプール2には常に矢印4の方向
に回転力が加わっている。
As shown in FIGS. 4 and 5, the spool 2 around which the wire 1 is wound is loosely fitted onto the shaft 3, and air is blown out from inside the shaft 3 to the contacting inner surface of the spool 2. There is. Further, since the air is ejected in an inclined direction with respect to the radial direction of the shaft 3, a rotational force is always applied to the spool 2 in the direction of the arrow 4.

また、スプール2から解き出されたワイヤ1の下端部分
はリノグ状のガイド5を貫通し、筒状のキャピラリ6に
よって保持されている。また、ガイド5とキャピラリ6
との間にはクランパ7が配設され、必要時閉動作してワ
イヤ1を締付保持するようになっている。また、キャピ
ラリ6とスプール2との間のワイヤ1に対峙して張力付
与機構8が配設されている。この張力付与機構8は第5
図に示すように、気体を噴射する噴射孔9を先端部に有
するノズル10と、この、ノズル10の先端部に取り付
けられた2枚の平坦なガイド板11゜12とからなる。
Further, the lower end portion of the wire 1 unwound from the spool 2 passes through a linog-shaped guide 5 and is held by a cylindrical capillary 6. Also, guide 5 and capillary 6
A clamper 7 is disposed between the clamper 7 and the clamper 7, which is closed when necessary to tighten and hold the wire 1. Further, a tension applying mechanism 8 is disposed facing the wire 1 between the capillary 6 and the spool 2. This tension applying mechanism 8 is the fifth
As shown in the figure, it consists of a nozzle 10 having an injection hole 9 at its tip for injecting gas, and two flat guide plates 11 and 12 attached to the tip of the nozzle 10.

ガイド板11,12は互いに所定の間隔を有し、これら
ガイド板11p12によって形成される空隙13には前
記噴射孔9が臨んでいる。そして、この空隙13内にワ
イヤ1が通されている。
The guide plates 11 and 12 are spaced apart from each other by a predetermined distance, and the injection hole 9 faces the gap 13 formed by these guide plates 11p12. The wire 1 is passed through this gap 13.

次に、使用状態について説明すると、まず、キャピラリ
6の先@(下端)から突出するワイヤ1の先端部を1・
−チ電極14により放電加熱し、球状塊15化する、そ
の後、クランパ7を開動作させてワイヤ]を開放し、キ
ャピラリ6をタブ]6上のベレッ1−17の電極部、す
なわち第1ボンディング点18に下降させてボンディン
グを行う。
Next, to explain the usage condition, first, the tip of the wire 1 protruding from the tip @ (lower end) of the capillary 6 is
- The capillary 6 is heated by electric discharge to form a spherical lump 15 by the electrode 14, and then the clamper 7 is opened to release the wire, and the capillary 6 is connected to the electrode portion of the berets 1-17 on the tab 6, that is, the first bonding. Bonding is performed by lowering to point 18.

次に、キャピラリ6を上昇させるとともに、リド19上
に平面移動させ、再び下降させて第2ボンディング点2
0に圧着させる。その後、クラシバ7でワイヤ1を保持
した状態でクラレバ7とキャピラリ6を上昇させること
により、ワイヤ1を第2ボンディング点20の接合部近
傍から分断させる。この結果、第4図に示す鎖線のよう
にワイヤループ21が形成され、ワイヤボンディングが
行われる。
Next, the capillary 6 is raised and moved onto the lid 19, and lowered again to reach the second bonding point 2.
Press it to 0. Thereafter, the wire 1 is separated from the vicinity of the joint at the second bonding point 20 by raising the wire 1 with the wire 1 held by the wire 7 and the capillary 6. As a result, a wire loop 21 is formed as shown by the chain line in FIG. 4, and wire bonding is performed.

この際、ワイヤ1は張力付与機構8の噴射孔9から噴出
される気体の風圧によって吹き飛ばされるが、下端をク
ランパ7あるいは球状塊15によって保持された状態と
なるとともに、上端はスプール2の回転力で引き上げら
れろ状態となる。
At this time, the wire 1 is blown away by the wind pressure of the gas ejected from the injection hole 9 of the tension applying mechanism 8, but the lower end is held by the clamper 7 or the spherical mass 15, and the upper end is held by the rotational force of the spool 2. It becomes a state where it can be pulled up.

そこで、ワイヤ1は上端の支持力と風圧との間の均衡に
よって、第4図に示すように曲線を描くことになる。こ
のため、キャピラリ6が急下降した場合、ワイヤ1は第
4図に示す鎖線状曲線22に変化するが、前記の原理に
よって再びワイヤ1は元の状態に戻る。すなわち、ワイ
ヤ1の受ける風圧が大どなることによって、スプール2
の回転力に抗してワイヤ1は解き出される。この解き出
し動作は、キャピラリ6の急激な下降に対し十分に追随
できなくとも、ワイヤ1の曲線部の移動変形(鎖線状曲
線22)によって補われる結果、ワイヤ1に急激な張力
が生しることもない。
Therefore, the wire 1 draws a curve as shown in FIG. 4 due to the balance between the supporting force at the upper end and the wind pressure. Therefore, when the capillary 6 suddenly descends, the wire 1 changes to the chain line curve 22 shown in FIG. 4, but the wire 1 returns to its original state again according to the above-mentioned principle. That is, as the wind pressure applied to the wire 1 increases, the spool 2
The wire 1 is unraveled against the rotational force of. Even if this unraveling operation cannot sufficiently follow the rapid descent of the capillary 6, it is compensated for by the movement and deformation of the curved portion of the wire 1 (chain line curve 22), and as a result, no sudden tension is generated in the wire 1. .

また、気体の流れは一対のガイド板11.12によって
両側を保護されていることから、噴射孔9から遠くなっ
ても、流速が低下しない。このため、ワイヤ1には常に
一定の張力が作用する。このようにワイヤ1に一定の張
力(所望の張力)が作用ずろことから、第2ボンディン
グ寸前において、ワイヤループ形成時の必要長さ10よ
りも余分にキャピラリ6の先端から延びていたワイヤ長
さく6)が、前記張力によってキャピラリ6内に引き戻
される。したがって、ワイヤループ21がたるむことも
なく背の高い所望のループが形成される。
Further, since the gas flow is protected on both sides by the pair of guide plates 11 and 12, the flow velocity does not decrease even if the gas flow is far from the injection hole 9. Therefore, a constant tension is always applied to the wire 1. Since a constant tension (desired tension) is applied to the wire 1 in this way, the length of the wire extending from the tip of the capillary 6, which is longer than the required length 10 when forming the wire loop, is reduced just before the second bonding. 6) is pulled back into the capillary 6 by the tension. Therefore, a desired tall loop is formed without the wire loop 21 sagging.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来のワイヤボンディング装置は、以上のように構成さ
れているので、長期にわたり使用すると、噴射孔9から
噴出された気体により、ガイド板11,12内部が汚れ
、そのため、ワイヤ張力が変化し、ワイヤループ形状が
悪くなる。したがって、定期的なりリーニングが必要と
なるが、従来のワイヤボンディング装置ではガイド板1
1゜12内部の汚れの状態がわかりに<<、また、クリ
ーニングもガイド板11,12どうしの間隔が狭いため
、極めて困難であり、メンテナンス性が非常に悪い等の
問題点があった。
Since the conventional wire bonding apparatus is configured as described above, when it is used for a long period of time, the inside of the guide plates 11 and 12 becomes dirty due to the gas ejected from the injection hole 9, and therefore the wire tension changes and the wire The loop shape becomes poor. Therefore, periodic re-leaning is required, but in conventional wire bonding equipment, the guide plate 1
It is difficult to see the state of dirt inside the guide plates 11 and 12, and cleaning is extremely difficult due to the narrow spacing between the guide plates 11 and 12, resulting in problems such as very poor maintainability.

この発明は、上記のような問題点を解消するためになさ
れたもので、ガイド板の汚れの状態がわかりやすく、ク
リーニングも簡単であり、メンテナンス性が良いワイヤ
ボンディング装置とこれを用いた半導体装置の製造方法
を得ることを目的とする。
This invention was made to solve the above-mentioned problems, and provides a wire bonding device that makes it easy to see the state of dirt on the guide plate, is easy to clean, and has good maintainability, and a semiconductor device using the same. The purpose is to obtain a manufacturing method for.

〔課題を解決するための手段〕[Means to solve the problem]

コノ発明に係る請求項(1)に記載のワイヤボンディン
グ装置は、張力付与機構を、ワイヤに対して向けられた
ノズルと、このノズルから噴出されろ気体の流れの方向
に沿って設けた1枚のガイド板と、このガイド板に平行
に固定され、ワイヤと接触する適宜数の接触棒とで構成
したものである。
The wire bonding apparatus according to claim (1) of the invention includes a tension applying mechanism that includes a nozzle directed toward the wire and a single sheet provided along the flow direction of the gas ejected from the nozzle. It is composed of a guide plate and an appropriate number of contact rods that are fixed in parallel to the guide plate and make contact with the wire.

また、この発明の請求項(2)に記載のワイヤボンディ
ング方法は、請求項(1)に記載のワイヤボンディング
装置を用い、スプールから解き出されたワイヤをキャピ
ラリにより保持し、張力付与機構によってワイヤに張力
を与えながら、キャピラリの先端のワイヤを所定のボン
ディング位置にボンディングするものである。
Further, the wire bonding method according to claim (2) of the present invention uses the wire bonding apparatus according to claim (1), holds the wire unwound from the spool by a capillary, and uses a tension applying mechanism to hold the wire by a capillary. The wire at the tip of the capillary is bonded to a predetermined bonding position while applying tension to the capillary.

〔作用〕[Effect]

この発明の請求項(1)に記載の発明においては、1枚
のガイド板に沿って気体が流れるように張力付与機構を
構成し、これによってワイヤに張力を与えるように17
たことから、流れの整った安定したワイヤ張力が得られ
る。
In the invention described in claim (1) of the present invention, the tension applying mechanism is configured so that the gas flows along one guide plate, and the tension applying mechanism is configured such that the tension is applied to the wire.
As a result, stable wire tension with an even flow can be obtained.

また、請求項(2)に記載の発明においては、張力付与
機構によってワイヤに張力を与え、ボンディングを行う
ことから、所望のワイヤループ形状により、安定したワ
イヤボンデイノグが行われる、。
Further, in the invention as set forth in claim (2), since the tension applying mechanism applies tension to the wire and performs bonding, stable wire bonding can be performed with a desired wire loop shape.

〔実施例〕〔Example〕

第1図はこの発明の一実施例によるワイヤボンディング
装置を示す斜視図であり、第2図はワイヤと接触棒との
接触状態を示す正m1図である。また、第3図は気体の
流れの状態を示す側面図である。
FIG. 1 is a perspective view showing a wire bonding apparatus according to an embodiment of the present invention, and FIG. 2 is a front m1 view showing a state of contact between a wire and a contact rod. Moreover, FIG. 3 is a side view showing the state of gas flow.

第1図において、30はこの発明による張力付4a[で
、31はノズル、32は乙のノズル31に形成された噴
射孔、33は前記ノズル31の先端に取り付けられたガ
イド板で、この実施例では1枚のガイド板33で構成さ
れている。34は前記ガイド板33に沿って取り付けら
れた2本の接触棒であり、ワイヤ1と接触している。
In FIG. 1, 30 is a tensioner 4a according to the present invention, 31 is a nozzle, 32 is an injection hole formed in the nozzle 31, and 33 is a guide plate attached to the tip of the nozzle 31. In the example, it is composed of one guide plate 33. Two contact rods 34 are attached along the guide plate 33 and are in contact with the wire 1.

なお、その他は従来のワイヤボンデ・rング装置と同一
であるので、その説明は省略する。
Note that since the other parts are the same as the conventional wire bonding apparatus, the explanation thereof will be omitted.

また、ワイヤボンディング動作は、従来と同様に行われ
るので、その説明は省略するが、ワイヤボンディング時
に、ワイヤ1に所定の張力を与えるこの発明の張力付与
機構30によれば、第3図のようにノズル31内の噴射
孔32から、ガイド板33に沿って安定した気体の流れ
が得られるっそのため、ワイヤ1は気体の流れ方向(矢
印B)に安定した張力を与えられる。さらに、気体の押
圧力により、ワイヤ1は接触棒34にA方向に押え付け
られるので、その位置も安定する。従って、所定のワイ
ヤ張力が得られる。
Further, since the wire bonding operation is performed in the same manner as in the past, a description thereof will be omitted, but according to the tension applying mechanism 30 of the present invention that applies a predetermined tension to the wire 1 during wire bonding, as shown in FIG. Since a stable gas flow is obtained from the injection hole 32 in the nozzle 31 along the guide plate 33, the wire 1 is given a stable tension in the gas flow direction (arrow B). Further, since the wire 1 is pressed against the contact rod 34 in the direction A by the pressing force of the gas, its position is also stabilized. Therefore, a predetermined wire tension is obtained.

また、第3図に示したように、ワイヤ1と接触棒34と
は、点接触で接しているため、長時間の使用でガイド板
33および接触棒34が汚れても、その汚れの部分とワ
イヤ1との接触面積が小さいので、ワイヤ張力が不安定
になりにくい。
Furthermore, as shown in FIG. 3, since the wire 1 and the contact rod 34 are in point contact, even if the guide plate 33 and the contact rod 34 become dirty due to long-term use, the dirty parts Since the contact area with the wire 1 is small, the wire tension is less likely to become unstable.

なお、上記実施例では、接触棒34を2本設けたものを
示したが、その本数は、1本以上何本でもよく、上記実
施例と同様の効果を秦する。
In the above embodiment, two contact rods 34 are provided, but the number of contact rods 34 may be one or more, and the same effect as in the above embodiment can be obtained.

また、ガイド板33と接触棒34およびノズル31とを
別ピースにしたものを示したが、これらは全てまたは一
部を一体化したものでもよい。
Further, although the guide plate 33, the contact rod 34, and the nozzle 31 are shown as separate pieces, they may be all or partially integrated.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明の請求項(1)に記載の
発明は、張力付与機構を、ワイヤに対して向けられたノ
ズルと、乙のノズ/Lがら噴出される気体の流れの方向
に沿って設けた1枚のガイド板と、このガイド板に平行
に固定され、ワイヤと接触する適宜数の接触棒とで構成
したので、安定したワイヤ張力が得られるとともに、ガ
イド板および接触棒の汚れの状態が容易にわかり、その
クリーニングも簡単に行え、メンテナンス性が向上する
As explained above, the invention according to claim (1) of the present invention has a tension applying mechanism that is arranged in the direction of the flow of gas ejected from the nozzle directed toward the wire and the nozzle B/L. The structure consists of one guide plate installed along the guide plate and an appropriate number of contact rods that are fixed parallel to this guide plate and contact the wire, so that stable wire tension can be obtained and the tension of the guide plate and contact rods can be increased. The state of dirt can be easily seen, cleaning can be done easily, and maintenance efficiency is improved.

マタ、ワイヤヲ接触棒に点接触させるように構成したの
で、ガイド板および接触棒が汚れても、その接触面積が
小さいため、汚れが影響を及ぼしにくくなる効果が得ら
れる。
Since the wire is configured to make point contact with the contact rod, even if the guide plate and the contact rod become dirty, the contact area is small, so that the effect is obtained that the dirt hardly affects the guide plate and the contact rod.

また、請求項(2)に記載の発明は、請求項(1)に記
載のワイヤボンディング装置を用い、スプールから解き
出されたワイヤをキャピラリにより保持し、張力付与機
構によってワイヤに張力を与えながら、キャピラリの先
端のワイヤを所定のボンディング位置にボンディングす
るので、メンテナンス性がよく、ワイヤは張力付与機構
の接触棒と点接触となっているため、その汚れがワイヤ
張力に影響を及ぼすことがなくなり、例え汚れてもその
汚れを適宜クリーニングできる。したがって、高品質の
ワイヤボンディングが実現できる利点がある。
Further, the invention described in claim (2) uses the wire bonding apparatus described in claim (1), holds the wire uncoiled from the spool by a capillary, and applies tension to the wire by a tension applying mechanism. Since the wire at the tip of the capillary is bonded to a predetermined bonding position, maintenance is easy, and since the wire is in point contact with the contact rod of the tensioning mechanism, dirt will not affect the wire tension. Even if it gets dirty, the dirt can be cleaned appropriately. Therefore, there is an advantage that high quality wire bonding can be realized.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例によるワイヤポンディング
装置の張力付与機構を示す斜視図、第2図はワイヤと接
触棒との接触状態を示す正面図、第3図はこの発明によ
る張力付与機構の気体の流れを示す側面図、第4図は従
来のワイヤボンディング装置の概略構成を示す図、第5
図は従来のワイヤへの張力付与機構を示す斜視図である
。 図において、1はワイヤ、30は張力付与機構、31は
ノズル、32は噴射孔、33はガイド板、34は接触棒
である。 なお、各図中の同一符号は同一または相当部分を示す。 代理人 大 岩 増 雄   (外2名)第 図
FIG. 1 is a perspective view showing a tension applying mechanism of a wire bonding device according to an embodiment of the present invention, FIG. 2 is a front view showing a state of contact between a wire and a contact rod, and FIG. 3 is a tension applying mechanism according to the present invention. FIG. 4 is a side view showing the gas flow of the mechanism; FIG. 4 is a diagram showing a schematic configuration of a conventional wire bonding device;
The figure is a perspective view showing a conventional mechanism for applying tension to a wire. In the figure, 1 is a wire, 30 is a tension applying mechanism, 31 is a nozzle, 32 is an injection hole, 33 is a guide plate, and 34 is a contact rod. Note that the same reference numerals in each figure indicate the same or corresponding parts. Agent Masuo Oiwa (2 others) Fig.

Claims (2)

【特許請求の範囲】[Claims] (1)ワイヤ解き出し用のスプールと、このスプールか
ら下方にのびるワイヤを保持するキャピラリおよび前記
スプールとキャピラリとの間に延在するワイヤに気体を
吹き付ける張力付与機構とを備えたワイヤボンディング
装置において、前記張力付与機構を、前記ワイヤに対し
て向けられたノズルと、このノズルから噴出される気体
の流れの方向に沿って設けた1枚のガイド板と、このガ
イド板に平行に固定され、前記ワイヤと接触する適宜数
の接触棒とで構成したことを特徴とするワイヤボンディ
ング装置。
(1) In a wire bonding device that includes a spool for unwinding the wire, a capillary that holds the wire extending downward from the spool, and a tension applying mechanism that blows gas onto the wire extending between the spool and the capillary. , the tension applying mechanism is fixed to a nozzle directed toward the wire, a guide plate provided along the direction of the flow of gas ejected from the nozzle, and parallel to the guide plate, A wire bonding device comprising an appropriate number of contact rods that come into contact with the wire.
(2)請求項(1)に記載のワイヤボンディング装置を
用い、スプールから解き出されたワイヤをキャピラリに
より保持し、張力付与機構によって前記ワイヤに張力を
与えながら、前記キャピラリの先端のワイヤを所定のボ
ンディング位置にボンディングすることを特徴とする半
導体装置の製造方法。
(2) Using the wire bonding apparatus according to claim (1), the wire uncoiled from the spool is held by a capillary, and the wire at the tip of the capillary is held in a predetermined position while applying tension to the wire by a tension applying mechanism. A method for manufacturing a semiconductor device, characterized in that bonding is performed at a bonding position.
JP2200156A 1990-07-27 1990-07-27 Wire bonding device and manufacture of semiconductor device using the same Pending JPH0484447A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2200156A JPH0484447A (en) 1990-07-27 1990-07-27 Wire bonding device and manufacture of semiconductor device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2200156A JPH0484447A (en) 1990-07-27 1990-07-27 Wire bonding device and manufacture of semiconductor device using the same

Publications (1)

Publication Number Publication Date
JPH0484447A true JPH0484447A (en) 1992-03-17

Family

ID=16419723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2200156A Pending JPH0484447A (en) 1990-07-27 1990-07-27 Wire bonding device and manufacture of semiconductor device using the same

Country Status (1)

Country Link
JP (1) JPH0484447A (en)

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