JPH048434U - - Google Patents
Info
- Publication number
- JPH048434U JPH048434U JP4798290U JP4798290U JPH048434U JP H048434 U JPH048434 U JP H048434U JP 4798290 U JP4798290 U JP 4798290U JP 4798290 U JP4798290 U JP 4798290U JP H048434 U JPH048434 U JP H048434U
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- positioning
- hole
- needle stand
- areas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図ａは本考案のプローブカードの全体図。
第１図ｂ，ｃは本考案のプローブカードの断面図
。第２図は半導体装置のパツドプローブカードの
針の状況説明図。 １……針立て部孔、２……位置わ合せ用孔、３
……透明板、４……マーク、５……パターン、６
……半導体装置、７……パツド、８……位置合わ
せ用針。
第１図ｂ，ｃは本考案のプローブカードの断面図
。第２図は半導体装置のパツドプローブカードの
針の状況説明図。 １……針立て部孔、２……位置わ合せ用孔、３
……透明板、４……マーク、５……パターン、６
……半導体装置、７……パツド、８……位置合わ
せ用針。
Claims (1)
- 針立て部以外に位置合わせ用の孔が開いている
ことを特徴としたプローブカード。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4798290U JPH048434U (ja) | 1990-05-08 | 1990-05-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4798290U JPH048434U (ja) | 1990-05-08 | 1990-05-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH048434U true JPH048434U (ja) | 1992-01-27 |
Family
ID=31564394
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4798290U Pending JPH048434U (ja) | 1990-05-08 | 1990-05-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH048434U (ja) |
-
1990
- 1990-05-08 JP JP4798290U patent/JPH048434U/ja active Pending