JPH0479531B2 - - Google Patents

Info

Publication number
JPH0479531B2
JPH0479531B2 JP60015974A JP1597485A JPH0479531B2 JP H0479531 B2 JPH0479531 B2 JP H0479531B2 JP 60015974 A JP60015974 A JP 60015974A JP 1597485 A JP1597485 A JP 1597485A JP H0479531 B2 JPH0479531 B2 JP H0479531B2
Authority
JP
Japan
Prior art keywords
circuit
signal
waveform
level
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP60015974A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61173133A (ja
Inventor
Masamichi Tani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP60015974A priority Critical patent/JPS61173133A/ja
Publication of JPS61173133A publication Critical patent/JPS61173133A/ja
Publication of JPH0479531B2 publication Critical patent/JPH0479531B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP60015974A 1985-01-29 1985-01-29 粒子分析装置 Granted JPS61173133A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60015974A JPS61173133A (ja) 1985-01-29 1985-01-29 粒子分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60015974A JPS61173133A (ja) 1985-01-29 1985-01-29 粒子分析装置

Publications (2)

Publication Number Publication Date
JPS61173133A JPS61173133A (ja) 1986-08-04
JPH0479531B2 true JPH0479531B2 (https=) 1992-12-16

Family

ID=11903674

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60015974A Granted JPS61173133A (ja) 1985-01-29 1985-01-29 粒子分析装置

Country Status (1)

Country Link
JP (1) JPS61173133A (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0408216A3 (en) * 1989-07-11 1991-09-18 Hitachi, Ltd. Method for processing wafers and producing semiconductor devices and apparatus for producing the same
JP2845773B2 (ja) * 1995-04-27 1999-01-13 山形日本電気株式会社 常圧ｃｖｄ装置

Also Published As

Publication number Publication date
JPS61173133A (ja) 1986-08-04

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