JPH047805B2 - - Google Patents

Info

Publication number
JPH047805B2
JPH047805B2 JP59024163A JP2416384A JPH047805B2 JP H047805 B2 JPH047805 B2 JP H047805B2 JP 59024163 A JP59024163 A JP 59024163A JP 2416384 A JP2416384 A JP 2416384A JP H047805 B2 JPH047805 B2 JP H047805B2
Authority
JP
Japan
Prior art keywords
point
image
segment
images
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59024163A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60173403A (ja
Inventor
Yasuo Seki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP59024163A priority Critical patent/JPS60173403A/ja
Publication of JPS60173403A publication Critical patent/JPS60173403A/ja
Publication of JPH047805B2 publication Critical patent/JPH047805B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
JP59024163A 1984-02-10 1984-02-10 ステレオ画像の対応付け処理方法 Granted JPS60173403A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59024163A JPS60173403A (ja) 1984-02-10 1984-02-10 ステレオ画像の対応付け処理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59024163A JPS60173403A (ja) 1984-02-10 1984-02-10 ステレオ画像の対応付け処理方法

Publications (2)

Publication Number Publication Date
JPS60173403A JPS60173403A (ja) 1985-09-06
JPH047805B2 true JPH047805B2 (enrdf_load_stackoverflow) 1992-02-13

Family

ID=12130669

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59024163A Granted JPS60173403A (ja) 1984-02-10 1984-02-10 ステレオ画像の対応付け処理方法

Country Status (1)

Country Link
JP (1) JPS60173403A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658209B2 (ja) * 1985-03-13 1994-08-03 株式会社トプコン 座標測定方法及び装置
JP4892982B2 (ja) * 2006-01-12 2012-03-07 株式会社島津製作所 磁気マッピング装置
DE102010029091B4 (de) * 2009-05-21 2015-08-20 Koh Young Technology Inc. Formmessgerät und -verfahren

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5325744B2 (enrdf_load_stackoverflow) * 1973-06-30 1978-07-28
JPS5619168A (en) * 1979-07-26 1981-02-23 Fujitsu Ltd Graph processing system
JP3190222B2 (ja) * 1994-12-07 2001-07-23 小倉クラッチ株式会社 多板電磁ブレーキ

Also Published As

Publication number Publication date
JPS60173403A (ja) 1985-09-06

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