JPH0478013A - Thin film magnetic head - Google Patents
Thin film magnetic headInfo
- Publication number
- JPH0478013A JPH0478013A JP18258990A JP18258990A JPH0478013A JP H0478013 A JPH0478013 A JP H0478013A JP 18258990 A JP18258990 A JP 18258990A JP 18258990 A JP18258990 A JP 18258990A JP H0478013 A JPH0478013 A JP H0478013A
- Authority
- JP
- Japan
- Prior art keywords
- marker
- layer
- depth
- shape
- coil conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005291 magnetic effect Effects 0.000 title claims abstract description 92
- 239000010409 thin film Substances 0.000 title claims description 29
- 239000003550 marker Substances 0.000 claims abstract description 53
- 239000004020 conductor Substances 0.000 claims abstract description 32
- 238000001514 detection method Methods 0.000 claims abstract description 18
- 238000005530 etching Methods 0.000 abstract description 9
- 239000010410 layer Substances 0.000 description 79
- 238000005498 polishing Methods 0.000 description 7
- 239000012212 insulator Substances 0.000 description 6
- 238000000059 patterning Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 238000003754 machining Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005294 ferromagnetic effect Effects 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910000889 permalloy Inorganic materials 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229910000702 sendust Inorganic materials 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910000808 amorphous metal alloy Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000011895 specific detection Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Magnetic Heads (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、 P CM (Pulse Code M
odulation)記録再生装置等に用いられる薄膜
磁気ヘッドの磁気ギャップのデプス長を検出するための
デブスマカーの改良に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention is based on PCM (Pulse Code M
The present invention relates to an improvement of a depth marker for detecting the depth length of a magnetic gap of a thin film magnetic head used in a recording/reproducing device or the like.
本発明は、薄膜磁気ヘットの磁気ギャップのデプス長を
検出するに際し、特定形状の検出マカーを形成すること
により、薄膜磁気ヘッドの磁気ギャップのデプス長を精
度よく検出し、かつデプス長の制御が容易に行なえるよ
うにしたものである。When detecting the depth of the magnetic gap of a thin-film magnetic head, the present invention forms a detection marker of a specific shape to accurately detect the depth of the magnetic gap of the thin-film magnetic head and to control the depth. It is designed to be easy to do.
一般に、薄膜磁気ヘッドは、ヘッドを構成する下部磁性
体層とコイル導体層および上部磁性体層と、」−2下部
磁性体層とコイル導体層および」二部磁性体層を絶縁す
る絶縁体層かスパッタリング等の真空薄膜形成技術で形
成されるため、量産性に優れ、かつ特性の均一なヘッド
か得られると共に、フォトリソグラフィー技術でパター
ニングを行なっているため、狭トラツク、狭ギャップ等
の微小寸法化が容易である。このため、上記薄膜磁気ヘ
ッドは記録に関与する磁界が急峻となり、高記録密度の
記録が可能となると共に、高分解能ができ、さらに小型
化が可能である。In general, a thin film magnetic head consists of a lower magnetic layer, a coil conductor layer, and an upper magnetic layer that constitute the head, and an insulator layer that insulates the lower magnetic layer, coil conductor layer, and two magnetic layers. Since it is formed using vacuum thin film forming technology such as sputtering, it is excellent in mass production and can obtain a head with uniform characteristics.In addition, since patterning is performed using photolithography technology, it can be formed with minute dimensions such as narrow tracks and narrow gaps. It is easy to convert. Therefore, in the thin-film magnetic head, the magnetic field involved in recording becomes steep, making it possible to perform high-density recording, high resolution, and further miniaturization.
ところか、上記薄膜磁気ヘッドは、その構造上、コイル
導体層の巻き回数を増やすことが困難であり、従ってヘ
ッドの記録効率等を上げるためにデプス長を10μm程
度の極めて小さな値にせざるを得なくなっている。However, due to the structure of the thin film magnetic head mentioned above, it is difficult to increase the number of turns of the coil conductor layer, and therefore, in order to increase the recording efficiency of the head, the depth length must be set to an extremely small value of about 10 μm. It's gone.
従って、この種の薄膜磁気ヘッドにおいてはデプス長を
所定の値に精度良く制御することが重要である。Therefore, in this type of thin film magnetic head, it is important to accurately control the depth length to a predetermined value.
そこで従来は、薄膜磁気ヘッドに第4図に示したように
例えば直角二等辺三角形形状のデプス長を検出するマー
カー4′を形成しておき、磁気記録媒体対接面6でこの
マーカーの幅(j?)を測定しデプス長を換算すること
により、デプス長を制御する方法か採られている。Therefore, conventionally, as shown in FIG. 4, a marker 4' for detecting the depth length of a right-angled isosceles triangle is formed on a thin-film magnetic head, and the width of this marker ( A method has been adopted in which the depth length is controlled by measuring and converting the depth length.
上記マーカーはフォトリソグラフィー技術を用いて、磁
気ギャップ近傍部にコイル導体層を用いて形成する。The marker is formed using a coil conductor layer in the vicinity of the magnetic gap using photolithography technology.
しかし、第4図に示した直角二等辺三角形のような形状
ではレジストのパターニング精度および上記マーカーの
エツチングの精度等によって第5図に示したように破線
による理想状態から著しく変形してしまい、その結果、
磁気記録媒体対接面に表われるマーカーの幅に誤差を生
じ(ΔL十ΔL’)精度よくデプス長を検出することが
困難であるという問題があった。However, in a shape like the right-angled isosceles triangle shown in FIG. 4, the patterning accuracy of the resist and the etching accuracy of the marker described above can significantly deform the shape from the ideal state shown by the broken line as shown in FIG. result,
There is a problem in that an error occurs in the width of the marker appearing on the surface facing the magnetic recording medium (ΔL + ΔL'), making it difficult to accurately detect the depth length.
そこで1本発明は上記問題点を解決するために提案され
たものであって、レジストのパターニング精度およびパ
ターンエツチング精度等による誤差をなくシ、精度よく
デプス長を検出でき、かっデプス長の制御が容易な薄膜
磁気ヘッドを提供することを目的とする。Therefore, the present invention was proposed to solve the above-mentioned problems. It eliminates errors caused by resist patterning accuracy and pattern etching accuracy, detects depth length with high accuracy, and controls depth length. The purpose is to provide a simple thin film magnetic head.
本発明によれば次の薄膜磁気ヘッドにより上記目的を達
成することができる。According to the present invention, the above object can be achieved by the following thin film magnetic head.
下部磁性体層上に形成されるコイル導体層と上記下部磁
性体層との共働によって磁気回路を構成する上部磁性体
層と、上記下部磁性体層とコイル導体層および上部磁性
体層を絶縁する絶縁体層よりなる薄M&ti気ヘッドに
おいて、上記下部磁性体層上に上記コイル導体層と同一
層により、三角形の少なくとも一の頂点が円弧または直
線状に切除された多角形状の、磁気ギャップのデプス長
を検出するための検知マーカーが形成されている事を特
徴とする薄膜磁気ヘッド。The upper magnetic layer forms a magnetic circuit through the cooperation of the coil conductor layer formed on the lower magnetic layer and the lower magnetic layer, and the lower magnetic layer is insulated from the coil conductor layer and the upper magnetic layer. In a thin M&TI magnetic head made of an insulating layer, a magnetic gap having a polygonal shape in which at least one vertex of a triangle is cut into an arc or a straight line is formed on the lower magnetic layer by the same layer as the coil conductor layer. A thin film magnetic head characterized in that a detection marker for detecting depth length is formed.
C作用〕
このように、下部磁性体層上にコイル導体層と同一層で
、その形状か三角形の少なくとも一の頂点が円弧または
直線状に切除された多角形状の検知マーカーを形成する
ことによりレジストのパターニング精度およびパターン
エツチング精度等による誤差の影響がなくなり、精度の
よいデプス長の検出ができる。C action] In this way, by forming a polygonal detection marker on the lower magnetic layer in the same layer as the coil conductor layer, in which at least one vertex of the triangle is cut out into an arc or a straight line, the resist is removed. The influence of errors due to patterning accuracy, pattern etching accuracy, etc. is eliminated, and the depth length can be detected with high accuracy.
本発明の薄膜磁気ヘッドの態様としては1例えば次のも
のがあげられる。Examples of aspects of the thin film magnetic head of the present invention include the following.
下部磁性体層と絶縁層とコイル導体層と上部磁性体層と
を順次有し、前記下部磁性体と上部磁性体層間にヘッド
の記録媒体対接面に達する磁気ギャップ層を備え、前記
記録媒体対接面に達するデプスマーカーをヘッド表面に
形成して成り、前記デプスマーカーは、対接面から離隔
した側の2つのエツジが通常の三角形の頂角(例えば正
三角形では60度)より十分大きい(好ましくは内角9
0″以上である)4角以上の多角形であり、かつ底辺は
対接面に露出し、前記底辺の両隣の二辺は互いに非平行
とした薄膜磁気ヘッド。The recording medium has a lower magnetic layer, an insulating layer, a coil conductor layer, and an upper magnetic layer in this order, and a magnetic gap layer that reaches a recording medium contact surface of the head between the lower magnetic layer and the upper magnetic layer. A depth marker is formed on the head surface that reaches the contact surface, and the two edges of the depth marker on the side remote from the contact surface are sufficiently larger than the apex angle of a normal triangle (for example, 60 degrees for an equilateral triangle). (preferably interior angle 9
A thin-film magnetic head having a polygonal shape with four or more sides (of 0" or more), the base of which is exposed to the opposing surface, and the two sides on both sides of the base being non-parallel to each other.
また9本発明の薄膜磁気ヘッドは1次のような中間体を
経て得ることができる。即ち、下部磁性体層と絶縁層と
コイル導体層と上部磁性体層とを順次有し、前記下部磁
性体と上部磁性体層間に磁気ギャップ層を備え、ギャッ
プデプスを検出するためのデプスマーカーをヘッド中間
体表面に形成して成り、前記デプスマーカーは、ヘッド
の記録媒体対接面に対応するヘッド中間体の外縁から離
隔した側の2つのエツジが通常の三角形の頂角より十分
大きい(好ましくは内角90°以上である)4角以上の
多角形であり、対接面と連続して延長されたヘッド取代
部にデプスマーカー取代部を有し、デプスマーカー取代
部は、前記対接面と交叉する前記デプスマーカーの互い
に非平行な二辺の延長線を成す薄膜磁気ヘッド中間体。Further, the thin film magnetic head of the present invention can be obtained through a primary intermediate. That is, it has a lower magnetic layer, an insulating layer, a coil conductor layer, and an upper magnetic layer in this order, a magnetic gap layer between the lower magnetic layer and the upper magnetic layer, and a depth marker for detecting the gap depth. The depth marker is formed on the surface of the head intermediate body, and the two edges of the depth marker on the side remote from the outer edge of the head intermediate body corresponding to the recording medium contacting surface of the head are sufficiently larger (preferably) than the apex angle of a normal triangle. is a polygon with four or more angles (having an internal angle of 90° or more), and has a depth marker machining part in the head machining part that extends continuously from the contact surface, and the depth marker machining part has an inner angle of 90° or more. A thin film magnetic head intermediate body forming an extension of two mutually non-parallel sides of the depth marker that intersect with each other.
本発明の薄膜磁気ヘッドは2例えば次のようにして製造
できる。The thin film magnetic head of the present invention can be manufactured, for example, as follows.
下部磁性体層と絶縁層とコイル導体層と上部磁性体層と
を順次有し、前記下部磁性体と上部磁性体層間に磁気ギ
ャップ層を備え、ギャップデプスを検出するためのデプ
スマーカーをヘッド中間体表面に形成して成り、前記デ
プスマーカーは角形の少なくとも一つの頂点が切除され
た多角形状である薄膜磁気ヘッド中間体の外縁を、ギャ
ップ層後端縁のギャップデプスOを規定する基準位置に
対して所定量研摩加工して記録媒体対接面を形成する薄
膜磁気ヘッドの製造方法。A lower magnetic layer, an insulating layer, a coil conductor layer, and an upper magnetic layer are sequentially provided, a magnetic gap layer is provided between the lower magnetic layer and the upper magnetic layer, and a depth marker for detecting the gap depth is provided between the heads. The depth marker is formed on the body surface, and the depth marker positions the outer edge of the thin-film magnetic head intermediate body, which has a polygonal shape with at least one corner of the rectangle cut off, at a reference position that defines the gap depth O of the rear end edge of the gap layer. A method of manufacturing a thin film magnetic head in which a recording medium facing surface is formed by polishing the surface by a predetermined amount.
好ましくは、前記切除された頂点は、ヘッドの記録媒体
対接面に対応するヘッド中間体の閃縁から離隔した側に
位置し、切除された辺は通例直線とする(又はゆるやか
な円弧でもよい)。Preferably, the cut apex is located on a side remote from the flash edge of the head intermediate body corresponding to the recording medium contacting surface of the head, and the cut edge is usually a straight line (or may be a gentle arc). ).
好ましくは2前記記録媒体対接面と平行方向のデプスマ
ーカーの幅は、少なくとも該対接面と前記基準位置との
間の任意の面まで連続的に増加又は減少している。Preferably, the width of the depth marker in the direction parallel to the recording medium contact surface increases or decreases continuously up to at least an arbitrary plane between the contact surface and the reference position.
より好ましくは、研摩加工面に露出するマカ一端の幅を
測定して所定研摩量を定める。More preferably, the predetermined amount of polishing is determined by measuring the width of one end of the polishing surface exposed to the polished surface.
なお、デプスマーカーのエツジ角度は、隣りあう二辺及
びその延長線か互いに交わる角度をいう。従って、エツ
ジの形状か円弧状のものでも良い。Note that the edge angle of the depth marker refers to the angle at which two adjacent sides and their extensions intersect with each other. Therefore, it may be in the shape of an edge or an arc.
前記特定形状のデプスマーカー及びその取代部は、レジ
ストのバターニング精度及びパターンエツチング精度等
による誤差の影響を受けずに所望の位置に精度よく形成
できる。従って、前記薄膜磁気ヘッドの対接面に露出し
たデブスマ力一の底辺の長さを測定するだけで、磁気ギ
ヤツブデプス長を算出することかできる。The depth marker having the specific shape and its removal portion can be formed at a desired position with high precision without being affected by errors caused by resist patterning precision, pattern etching precision, and the like. Therefore, the depth length of the magnetic gear can be calculated by simply measuring the length of the base of the Debsmer's groove exposed on the contact surface of the thin film magnetic head.
前記薄膜磁気ヘッドの製造方法により、記録媒体対接面
と平行方向のデプスマーカーの幅が少なくとも該対接面
と前記基準位置との間の任意の面まで連続的に増加又は
減少しているものを製造した場合には、該デプスマーカ
ーの幅は、少なくとも該対接面と前記任意の面との間の
範囲でギャップデプスと一義的な対応関係にある。従っ
て、少なくとも前記範囲でデプスマーカーの幅を測定す
ることによりギャップデプスを算出することかできる。The width of the depth marker in the direction parallel to the recording medium contacting surface is continuously increased or decreased to at least an arbitrary plane between the contacting surface and the reference position, according to the manufacturing method of the thin film magnetic head. In the case where the width of the depth marker is manufactured, the width of the depth marker has a unique correspondence with the gap depth at least in the range between the contact surface and the arbitrary surface. Therefore, the gap depth can be calculated by measuring the width of the depth marker at least in the above range.
前記基準位置は、好ましくは直線又は平面にする。また
、該デプスマーカーの幅の制御によりギャップデプスを
制御して磁気ヘッドを製造できる。The reference position is preferably a straight line or a plane. Further, by controlling the width of the depth marker, a magnetic head can be manufactured by controlling the gap depth.
前記製造方法において、研摩加工面に露出するマーカ一
端の幅を測定して所定研摩量を定めることにより、記録
媒体対接面の厳密な研摩製作を可能とすると共に、その
自動化を容易に行なうことかできる。In the manufacturing method, by measuring the width of one end of the marker exposed on the polished surface to determine a predetermined amount of polishing, it is possible to precisely polish the recording medium contacting surface and to easily automate the process. I can do it.
〔実施例〕
以下1本発明の実施例について図面を参照しながら説明
する。[Example] An example of the present invention will be described below with reference to the drawings.
本発明の実施例の薄膜磁気ヘッドにおいては第1図およ
び第2図に示すように、下部磁性体層1の一平面上にフ
ロント・ギャップ部Gやリア・ギャップ部G′を除いて
5i02等よりなる第一絶縁体層2か形成されている。In the thin film magnetic head according to the embodiment of the present invention, as shown in FIGS. 1 and 2, a 5i02, etc. A first insulating layer 2 is formed.
上記下部磁性体層1としては、Mn−Znn系フシイ)
□、Ni−Zn系フェライト等の強磁性酸化物基板、ま
たはセラミック等の非磁性基板上にFe−Ni系合金(
パーマロイ)やFe−Aj7Si系合金(センダスト)
及びアモルファス合金等の強磁性金属材料を積層した複
合基板等が使用される。The lower magnetic layer 1 is made of Mn-Znn-based material)
□, Fe-Ni alloy (
Permalloy) and Fe-Aj7Si alloy (Sendust)
A composite substrate in which ferromagnetic metal materials such as amorphous alloys are laminated is used.
また、上記第一絶縁体層2上にはCuあるいはAj>等
の金属導体層よりなる第一フィル導体層3が所定の間隔
をもって渦巻状(本実施例では3ターン)にパターンエ
ツチングされている。Further, on the first insulating layer 2, a first fill conductor layer 3 made of a metal conductor layer such as Cu or Aj> is pattern-etched in a spiral shape (three turns in this example) at predetermined intervals. .
ここで2本実施例においては上記第一コイル導体層3の
パターンエツチング時に磁気ギャップ近傍にデプス長を
検出するための検知マーカー4も同時に形成されている
。In these two embodiments, a detection marker 4 for detecting the depth length is also formed in the vicinity of the magnetic gap at the same time as the pattern etching of the first coil conductor layer 3.
さらに、上記第一コイル導体層3を被覆するように第二
絶縁体層5か被覆形成\れ、上記第一コイル導体層3と
同一巻方向を有し、上記第二絶縁体層5に形成されたコ
イルコンタクト窓部7を介して、上記第一コイル導体層
3と電気的に接続される渦巻状(本実施例では2ターン
)の第二コイル導体層8が形成されている。Furthermore, a second insulator layer 5 is formed to cover the first coil conductor layer 3, and has the same winding direction as the first coil conductor layer 3, and is formed on the second insulator layer 5. A spiral-shaped (two turns in this embodiment) second coil conductor layer 8 is formed to be electrically connected to the first coil conductor layer 3 through the coil contact window 7 .
上記コイル導体層3,8としてはスパイラル多層型に限
らず、ヘリカル型等いかなる巻線構造であってもよい。The coil conductor layers 3 and 8 are not limited to a spiral multilayer type, but may have any type of winding structure such as a helical type.
また この第二コイル導体層8上には第三絶縁体層9が
形成され、さらに、フロントギャップ部には3i02等
よりなるギャップスペーサ−10や上記第三絶縁体層9
を肢覆するようにパーマロイやセンダストおよびアモル
ファス合金等の強磁性金属材料よりなる上部磁性体層1
1が所定のトラック幅となるように形成されている。Further, a third insulating layer 9 is formed on the second coil conductor layer 8, and furthermore, a gap spacer 10 made of 3i02 or the like and the third insulating layer 9 are formed in the front gap portion.
The upper magnetic layer 1 is made of a ferromagnetic metal material such as permalloy, sendust, or amorphous alloy.
1 has a predetermined track width.
このように形成された。上記コイル導体層3゜8に駆動
電流を供給することにより、上記下部磁性体層1と上部
磁性体層11との共働・により磁気回路を構成し、記録
・再生が行なえるように構成されている。This is how it was formed. By supplying a driving current to the coil conductor layer 3.8, the lower magnetic layer 1 and the upper magnetic layer 11 cooperate to form a magnetic circuit, so that recording and reproduction can be performed. ing.
さらに1図示していないが上記上部磁性体層11等を覆
うように、5i02等よりなる保護層か形成され、平坦
化された後1ガラス等の接着剤を介してセラミック等の
非磁性材よりなる保護板が融着接合されている。Furthermore, although not shown in the figure, a protective layer made of 5i02 or the like is formed to cover the upper magnetic layer 11, etc., and after being flattened, it is coated with a non-magnetic material such as ceramic through an adhesive such as glass. A protective plate is fusion-bonded.
このように構成される薄膜磁気ヘッドにおいては9例え
ば、形状が五角形のマーカーを設けることにより研磨加
工による磁気ギャップのデプス長の加工精度が大幅に向
上する。In the thin film magnetic head constructed in this way, for example, by providing a pentagonal marker, the processing accuracy of the depth length of the magnetic gap by polishing can be greatly improved.
以下1本実施例の薄膜磁気ヘッドに形成される検知マー
カー4について詳述する。The detection marker 4 formed on the thin film magnetic head of this embodiment will be described in detail below.
第3図に本実施例の検知マーカーの拡大平面図を示す。FIG. 3 shows an enlarged plan view of the detection marker of this embodiment.
第3図のマーカー4は直角二等辺三角形ABCのうちで
頂点BおよびCを含む直角二等辺三角形BDEとCGF
とを除いた形となっており、この結果、マーカー形状は
3つの直角を有する五角形ADHFGとなっている。Marker 4 in Figure 3 is right-angled isosceles triangles BDE and CGF that include vertices B and C of right-angled isosceles triangle ABC.
As a result, the marker shape is a pentagon ADHFG with three right angles.
上記マーカー4のうち、線分GFは磁気ギヤ・ンプの後
端縁(la)(デプス長り、−0)よりももっとコイル
導体層3,8側に近い配置、すなわち、デプス長DP−
Oのラインは上記マーカー4のうち、AGあるいはFE
を横切る任意の位置に形成される。Of the markers 4, the line segment GF is located closer to the coil conductor layers 3 and 8 than the rear edge (la) (depth length, -0) of the magnetic gear amplifier, that is, the depth length DP-
The O line is AG or FE of the markers 4 above.
formed at any position across the
上記マーカー形状においてデプス長(D、)を検出する
には磁気記録媒体対接面6からテープラップ等のラッピ
ング手段によりY方向に順次加工を行ない、磁気記録媒
体対接面6′に表われた検知マーカー幅をLとするとこ
の時のデプス長DPは、D、−L−Lo−χとなる。(
Lo :デプス長り、−0から線分GFまでの距離、
χ:線分CGの長さ)
すなわち、上記マーカー4の形状の様に鋭角形状部分を
作らない事により、マーカー形成のためにフォトレジス
トに熱処理をしたとしても、フォトレジストパターンの
寸法変化がないため、その後のパターンエツチングによ
る誤差もまったくなくなり、高精度にデプス長が検出で
きる。In order to detect the depth length (D, ) in the above marker shape, processing is performed sequentially in the Y direction from the magnetic recording medium contacting surface 6 using a wrapping means such as tape wrap, so that the depth length (D, ) appearing on the magnetic recording medium contacting surface 6' is If the detection marker width is L, the depth length DP at this time is D, -L-Lo-χ. (
Lo: Depth length, distance from -0 to line segment GF,
(χ: length of line segment CG) In other words, by not creating an acute-angled portion like the shape of marker 4 above, there is no dimensional change in the photoresist pattern even if the photoresist is heat-treated to form the marker. Therefore, errors caused by subsequent pattern etching are completely eliminated, and the depth length can be detected with high accuracy.
ここで、上記マーカー4のなかで線分DEの長さ領域に
おいては、Y方向に研磨加工を施こしてもX方向の線分
の長さが変わらずデプス長が判定できないが、線分EF
の長さをある程度長くとつておく事および線分DEの長
さを上記マーカー4のパターンが変形しない程度にでき
るだけ短かくしておくことにより、実際のデプス長の算
出には何ら問題がない。Here, in the length region of the line segment DE in the marker 4, even if polishing is performed in the Y direction, the length of the line segment in the X direction does not change and the depth length cannot be determined.
There is no problem in calculating the actual depth length by keeping the length of the line segment DE long to a certain extent and by keeping the length of the line segment DE as short as possible to the extent that the pattern of the marker 4 is not deformed.
ここで 線分DEの長さは3μm以上あれば検知マーカ
ーパターンの変形が押えられることがわれわれの実験に
より判明した。これは線分GFについても同様であるこ
とは勿論である。Our experiments have shown that if the length of the line segment DE is 3 μm or more, deformation of the detection marker pattern can be suppressed. Of course, this also applies to the line segment GF.
なお1本発明は上記実施例に限定されるものではなく9
例えば第6図に示すように直角二等辺三角形のうちで頂
点AとBおよびCを含む直角二等辺三角形ADEとBF
GおよびCHIを除いた形状、第7図に示すように直角
二等辺三角形ADEとBFGおよびCHIと長方形JK
LMを除いたような形状であり、磁気ギャップのデプス
長がDP−L−L、−χで算出できるものは好ましい。Note that the present invention is not limited to the above embodiments.9
For example, as shown in Figure 6, right isosceles triangles ADE and BF that include vertices A, B, and C are
The shape excluding G and CHI, as shown in Figure 7, isosceles right triangle ADE, BFG, CHI and rectangle JK.
It is preferable that the shape is such that LM is removed, and the depth length of the magnetic gap can be calculated by DP-LL, -χ.
また実施例では直角二等辺三角形の角を切断した形状の
ものについて述べたが、三角形の角を切断した形状のも
のであれば良い事は勿論である。また、第8図に示すよ
うにデプス長かり、−172L−Lo −y (y :
点Aと線分DEとの距離)で算…できるような形状でも
良いことは勿論である。Further, in the embodiment, a shape having a shape of a right isosceles triangle having its corners cut off has been described, but it goes without saying that any shape having a shape of a triangle having its corners cut off may be used. In addition, as shown in Fig. 8, the depth is long, -172L-Lo -y (y:
Of course, a shape that can be calculated by the distance between point A and line segment DE may also be used.
ところで2本実施例では検知マーカー4を第一コイル導
体層3と同時に形成したか第二コイル導体層8と同時に
形成してもよいことは勿論である。By the way, in this embodiment, the detection marker 4 may be formed at the same time as the first coil conductor layer 3 or the second coil conductor layer 8, of course.
また2本実施例では検知マーカー4を2ケ形成している
がどちらか1ケでも同様の効果を奏することは勿論であ
る。Further, although two detection markers 4 are formed in this embodiment, it goes without saying that the same effect can be achieved with just one of them.
さらに、上記説明はすべてコイル導体層か二層の場合に
ついて示したか単層コイル導体層についても同様である
ことはいうまでもない。Further, although all the above explanations have been made regarding the case of a coil conductor layer or two layers, it goes without saying that the same applies to a single layer coil conductor layer.
以上の説明から明らかなように本発明の薄膜磁気ヘッド
においては磁気ギャップのデプス長を検出する際に検知
マーカーのパターンエツチングによる形状変化がない特
定の検知マーカーを用いることにより、デプス長の検出
精度が向上する。As is clear from the above explanation, in the thin film magnetic head of the present invention, when detecting the depth length of the magnetic gap, by using a specific detection marker whose shape does not change due to pattern etching of the detection marker, the detection accuracy of the depth can be improved. will improve.
第1図は本発明に係る薄膜磁気ヘットの一例を示す概略
的な平面図2第2図は第1図のa−a線における断面図
、第3図及び第6〜8図は本発明の実施例の検知マーカ
ーを拡大して示すぎ[4面図、第4図は従来例を示す薄
膜磁気ヘットを小ず概略的な平面図、第5図は従来例の
検知マーカーを拡大して示す平面図である。
1・・下部磁性体層
1a・・・磁気ギャップ後端縁
(デプス長り、=O)
2・・・第一絶縁体層 3・第一コイル導体層4・・
・検知マーカー 5・第二絶縁体層6.6′・・・磁
気記録媒体対接面
7・・・コイル・コンタクト窓部
8・・・第二コイル導体層
9・・第三絶縁体層
10・・・ギャップ・スペーサ
11・・上部磁性体層
X・・・磁気記録媒体対接面方向
Y・・・研磨加工方向
第1図FIG. 1 is a schematic plan view showing an example of a thin film magnetic head according to the present invention. FIG. 2 is a sectional view taken along line a-a in FIG. 1, and FIGS. The detection marker of the embodiment is shown too enlarged. FIG. 1. Lower magnetic layer 1a... Rear edge of magnetic gap (depth length, = O) 2. First insulator layer 3. First coil conductor layer 4.
・Detection marker 5・Second insulator layer 6.6'...Magnetic recording medium facing surface 7...Coil contact window section 8...Second coil conductor layer 9...Third insulator layer 10 ... Gap spacer 11 ... Upper magnetic layer X ... Magnetic recording medium facing direction Y ... Polishing direction Fig. 1
Claims (1)
磁性体層との共働によって磁気回路を構成する上部磁性
体層と、上記下部磁性体層とコイル導体層および上部磁
性体層を絶縁する絶縁体層よりなる薄膜磁気ヘッドにお
いて、上記下部磁性体層上に上記コイル導体層と同一層
により、三角形の少なくとも一の頂点が円弧または直線
状に切除された多角形状の、磁気ギャップのデプス長を
検出するための検知マーカーが形成されている事を特徴
とする薄膜磁気ヘッド。The upper magnetic layer forms a magnetic circuit through the cooperation of the coil conductor layer formed on the lower magnetic layer and the lower magnetic layer, and the lower magnetic layer is insulated from the coil conductor layer and the upper magnetic layer. In a thin film magnetic head comprising an insulating layer, the same layer as the coil conductor layer is placed on the lower magnetic layer to form a polygonal magnetic gap having at least one vertex of a triangle cut into an arc or a straight line. A thin film magnetic head characterized in that a detection marker for detecting the length is formed.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2182589A JP2825946B2 (en) | 1990-07-12 | 1990-07-12 | Thin film magnetic head |
US07/713,221 US5331495A (en) | 1990-06-11 | 1991-06-11 | Thin film magnetic head and methods for producing same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2182589A JP2825946B2 (en) | 1990-07-12 | 1990-07-12 | Thin film magnetic head |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0478013A true JPH0478013A (en) | 1992-03-12 |
JP2825946B2 JP2825946B2 (en) | 1998-11-18 |
Family
ID=16120936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2182589A Expired - Fee Related JP2825946B2 (en) | 1990-06-11 | 1990-07-12 | Thin film magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2825946B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7610673B2 (en) | 2004-04-05 | 2009-11-03 | Tdk Corporation | Method of manufacturing a vertical recording magnetic head |
US8149540B2 (en) | 2006-11-02 | 2012-04-03 | Tdk Corporation | Magnetic head structure with diagonal of rectangular-shaped height monitor extending along track width direction |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53142214A (en) * | 1977-05-18 | 1978-12-11 | Fujitsu Ltd | Manufacture of magnetic head |
JPS58177517A (en) * | 1982-04-09 | 1983-10-18 | Trio Kenwood Corp | Manufacture of thin-film magnetic head |
JPS6235133U (en) * | 1985-08-21 | 1987-03-02 | ||
JPS62219215A (en) * | 1986-03-19 | 1987-09-26 | Hitachi Ltd | Thin film magnetic head and its production |
-
1990
- 1990-07-12 JP JP2182589A patent/JP2825946B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53142214A (en) * | 1977-05-18 | 1978-12-11 | Fujitsu Ltd | Manufacture of magnetic head |
JPS58177517A (en) * | 1982-04-09 | 1983-10-18 | Trio Kenwood Corp | Manufacture of thin-film magnetic head |
JPS6235133U (en) * | 1985-08-21 | 1987-03-02 | ||
JPS62219215A (en) * | 1986-03-19 | 1987-09-26 | Hitachi Ltd | Thin film magnetic head and its production |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7610673B2 (en) | 2004-04-05 | 2009-11-03 | Tdk Corporation | Method of manufacturing a vertical recording magnetic head |
US8149540B2 (en) | 2006-11-02 | 2012-04-03 | Tdk Corporation | Magnetic head structure with diagonal of rectangular-shaped height monitor extending along track width direction |
Also Published As
Publication number | Publication date |
---|---|
JP2825946B2 (en) | 1998-11-18 |
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