JPH0474438U - - Google Patents

Info

Publication number
JPH0474438U
JPH0474438U JP11812990U JP11812990U JPH0474438U JP H0474438 U JPH0474438 U JP H0474438U JP 11812990 U JP11812990 U JP 11812990U JP 11812990 U JP11812990 U JP 11812990U JP H0474438 U JPH0474438 U JP H0474438U
Authority
JP
Japan
Prior art keywords
evaluation
basic element
product circuit
measured
aluminum wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11812990U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11812990U priority Critical patent/JPH0474438U/ja
Publication of JPH0474438U publication Critical patent/JPH0474438U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP11812990U 1990-11-09 1990-11-09 Pending JPH0474438U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11812990U JPH0474438U (enrdf_load_stackoverflow) 1990-11-09 1990-11-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11812990U JPH0474438U (enrdf_load_stackoverflow) 1990-11-09 1990-11-09

Publications (1)

Publication Number Publication Date
JPH0474438U true JPH0474438U (enrdf_load_stackoverflow) 1992-06-30

Family

ID=31866038

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11812990U Pending JPH0474438U (enrdf_load_stackoverflow) 1990-11-09 1990-11-09

Country Status (1)

Country Link
JP (1) JPH0474438U (enrdf_load_stackoverflow)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119748A (ja) * 1983-12-01 1985-06-27 Toshiba Corp マスタスライスウエ−ハのテスト方法
JPS6175543A (ja) * 1984-09-21 1986-04-17 Nec Corp 集積回路の形成方法
JPS6484637A (en) * 1987-09-28 1989-03-29 Nec Corp Master slice type semiconductor device
JPH02166748A (ja) * 1988-12-20 1990-06-27 Nec Ic Microcomput Syst Ltd 温度検査回路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119748A (ja) * 1983-12-01 1985-06-27 Toshiba Corp マスタスライスウエ−ハのテスト方法
JPS6175543A (ja) * 1984-09-21 1986-04-17 Nec Corp 集積回路の形成方法
JPS6484637A (en) * 1987-09-28 1989-03-29 Nec Corp Master slice type semiconductor device
JPH02166748A (ja) * 1988-12-20 1990-06-27 Nec Ic Microcomput Syst Ltd 温度検査回路

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