JPH0474438U - - Google Patents
Info
- Publication number
- JPH0474438U JPH0474438U JP11812990U JP11812990U JPH0474438U JP H0474438 U JPH0474438 U JP H0474438U JP 11812990 U JP11812990 U JP 11812990U JP 11812990 U JP11812990 U JP 11812990U JP H0474438 U JPH0474438 U JP H0474438U
- Authority
- JP
- Japan
- Prior art keywords
- evaluation
- basic element
- product circuit
- measured
- aluminum wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 238000000605 extraction Methods 0.000 claims description 2
- 238000009792 diffusion process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11812990U JPH0474438U (enrdf_load_stackoverflow) | 1990-11-09 | 1990-11-09 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11812990U JPH0474438U (enrdf_load_stackoverflow) | 1990-11-09 | 1990-11-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0474438U true JPH0474438U (enrdf_load_stackoverflow) | 1992-06-30 |
Family
ID=31866038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11812990U Pending JPH0474438U (enrdf_load_stackoverflow) | 1990-11-09 | 1990-11-09 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0474438U (enrdf_load_stackoverflow) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60119748A (ja) * | 1983-12-01 | 1985-06-27 | Toshiba Corp | マスタスライスウエ−ハのテスト方法 |
JPS6175543A (ja) * | 1984-09-21 | 1986-04-17 | Nec Corp | 集積回路の形成方法 |
JPS6484637A (en) * | 1987-09-28 | 1989-03-29 | Nec Corp | Master slice type semiconductor device |
JPH02166748A (ja) * | 1988-12-20 | 1990-06-27 | Nec Ic Microcomput Syst Ltd | 温度検査回路 |
-
1990
- 1990-11-09 JP JP11812990U patent/JPH0474438U/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60119748A (ja) * | 1983-12-01 | 1985-06-27 | Toshiba Corp | マスタスライスウエ−ハのテスト方法 |
JPS6175543A (ja) * | 1984-09-21 | 1986-04-17 | Nec Corp | 集積回路の形成方法 |
JPS6484637A (en) * | 1987-09-28 | 1989-03-29 | Nec Corp | Master slice type semiconductor device |
JPH02166748A (ja) * | 1988-12-20 | 1990-06-27 | Nec Ic Microcomput Syst Ltd | 温度検査回路 |